JPH1140700A - Wiring board, its manufacture, and manufacture of connecting body - Google Patents

Wiring board, its manufacture, and manufacture of connecting body

Info

Publication number
JPH1140700A
JPH1140700A JP19698197A JP19698197A JPH1140700A JP H1140700 A JPH1140700 A JP H1140700A JP 19698197 A JP19698197 A JP 19698197A JP 19698197 A JP19698197 A JP 19698197A JP H1140700 A JPH1140700 A JP H1140700A
Authority
JP
Japan
Prior art keywords
wiring board
pin
solder
tip
connection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19698197A
Other languages
Japanese (ja)
Other versions
JP3088092B2 (en
Inventor
Hajime Saiki
一 斉木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Niterra Co Ltd
Original Assignee
NGK Spark Plug Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NGK Spark Plug Co Ltd filed Critical NGK Spark Plug Co Ltd
Priority to JP19698197A priority Critical patent/JP3088092B2/en
Publication of JPH1140700A publication Critical patent/JPH1140700A/en
Application granted granted Critical
Publication of JP3088092B2 publication Critical patent/JP3088092B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3421Leaded components
    • H05K3/3426Leaded components characterised by the leads
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3457Solder materials or compositions; Methods of application thereof
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3457Solder materials or compositions; Methods of application thereof
    • H05K3/3463Solder compositions in relation to features of the printed circuit board or the mounting process

Abstract

PROBLEM TO BE SOLVED: To make the positions of wring boards to be corrected naturally even when a little positional deviation exists between the wring boards when the wiring boards are connected to each other, by butting the front ends of the pins of one wiring board against the connecting pads of the other wiring board, and soldering the front ends to the pads. SOLUTION: In the main body 1 of a multilayered wiring board and a wiring board 10 having pins 7 which are fixed to many pin fixing pads 3 formed on the main surface of the main body 1 and formed in a grid-like state with silver solder 8, large-diameter sections composed of high-temperature solder balls 6 are formed at the front ends of the pins 7. The wiring board 10 is connected to a printed wiring board 20 on which connecting pads 23 are formed at the positions corresponding to the pins 7 fixed to the upper surface of the main body 21 of the wiring board 20 with solder 26. When the wiring board 10 is connected to the wiring board 20, the position of the wiring board 10 is automatically adjusted by the surface tension of the molten solder 26, and the pins 7 are positioned to nearly the centers of the connecting pads 23.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、ピンを他の配線基
板に突き当てつつ半田付けによって接続するための配線
基板、その製造方法、およびこの配線基板と他の配線基
板とを接続した接続体の製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring board for connecting pins by soldering while abutting a pin against another wiring board, a method of manufacturing the same, and a connector connecting the wiring board and another wiring board. And a method for producing the same.

【0002】[0002]

【従来の技術】配線基板を他の配線基板に接続するため
に設ける端子としては、リードやピン、あるいはボール
状端子等が知られており、配線基板本体にピンを格子状
に設けた配線基板はPGA型配線基板と、ボール状端子
を格子状に設けた配線基板はBGA型配線基板と呼ばれ
ることもある。
2. Description of the Related Art As terminals provided for connecting a wiring board to another wiring board, leads, pins, ball-shaped terminals and the like are known, and a wiring board in which pins are provided in a wiring board body in a lattice shape. Is a PGA type wiring board, and a wiring board in which ball-shaped terminals are provided in a lattice shape is sometimes called a BGA type wiring board.

【0003】なお、PGA型配線基板には、図7、8に
示すように、ピン105の先端を他の配線基板120に
設けた接続用パッド123に突き当てつつ半田付けする
ことで両者を接続するものもあり、このようなタイプの
配線基板100はバットジョイントPGA型配線基板と
呼ばれることもある。図7に示すように、この配線基板
100には、図中下方の主面101aに多数のピン固着
用パッド103が格子状に形成されており、このピン固
着用パッド103にはネイルヘッド状(釘頭状)のピン
105が銀ロウ108でロウ付されている。また、図中
上方の面101bには、集積回路チップ111と接続す
るためのチップ接続用パッド109が多数形成されてい
る。このチップ接続用パッド109と集積回路チップ1
11に設けられたチップパッド113とは、チップ接続
用半田115を介してフリップチップ接続されている。
[0003] As shown in FIGS. 7 and 8, the ends of the pins 105 are soldered to the PGA type wiring board while being abutted against connection pads 123 provided on another wiring board 120, thereby connecting the two. Such a type of wiring board 100 is sometimes called a butt joint PGA type wiring board. As shown in FIG. 7, on the wiring substrate 100, a large number of pin fixing pads 103 are formed in a grid pattern on the lower main surface 101a in the figure, and the pin fixing pads 103 have a nail head shape ( A pin 105 having a nail head shape is soldered with a silver solder 108. Further, a large number of chip connection pads 109 for connecting to the integrated circuit chip 111 are formed on the upper surface 101b in the figure. The chip connecting pad 109 and the integrated circuit chip 1
The chip pad 113 provided on the chip 11 is flip-chip connected via a chip connection solder 115.

【0004】また、他の配線基板本体121の接続面1
21a(図中上面)には、各ピン105に対応した位置
に接続用パッド123が形成されており、その上面に
は、半田ペースト125が塗布されている。この接続用
パッド123に各ピン105の先端(図中下方先端)を
位置合わせしつつ突き当て、その後、半田ペースト12
5を溶融させると、図8に示すように、ピン105の先
端と接続用パッド123とがピン接続用半田126によ
り半田付けされ、配線基板100と他の配線基板120
とが接続されたこととなる。
Further, the connection surface 1 of another wiring board main body 121
A connection pad 123 is formed at a position corresponding to each pin 105 on the upper surface 21a (the upper surface in the figure), and a solder paste 125 is applied on the upper surface thereof. The ends (lower ends in the figure) of the pins 105 are brought into contact with the connection pads 123 while aligning them, and then the solder paste 12
8, the tip of the pin 105 and the connection pad 123 are soldered by the pin connection solder 126, as shown in FIG.
Are connected.

【0005】[0005]

【発明が解決しようとする課題】しかも、このバットジ
ョイントPGA型配線基板100においては、この配線
基板本体101と他の配線基板本体121との間がピン
105の長さ分だけ間隔を空けて接続される。従って、
この配線基板本体101と他の配線基板本体121の材
質とが異なるために両者間に熱膨張差が発生するなど、
両者間で相対的に変位が生じる場合に、両者間にあるピ
ン105が屈曲して熱膨張差等の変位を吸収するため、
ピン105が破断したり、ピン105と接続パッド12
3との接続部で接続が外れる等の不具合を生じにくい。
このため、信頼性の高い接続が可能となる。
Further, in the butt joint PGA type wiring board 100, the wiring board main body 101 and the other wiring board main body 121 are connected with an interval corresponding to the length of the pin 105. Is done. Therefore,
Since the material of the wiring board main body 101 and the material of the other wiring board main body 121 are different, a difference in thermal expansion is generated between the two.
When a relative displacement occurs between the two, the pin 105 between the two is bent to absorb a displacement such as a difference in thermal expansion,
The pin 105 may be broken, or the pin 105 and the connection pad 12 may be broken.
Inconveniences such as disconnection at the connection portion with 3 are less likely to occur.
For this reason, a highly reliable connection becomes possible.

【0006】しかし、このようなバットジョイントPG
A型配線基板100においては、図9に示すように、配
線基板100と他の配線基板120との接続において、
位置ずれを生じやすい問題があった。即ち、両者の接続
では、各接続パッド123に対して各ピン105の位
置、従って配線基板本体101の位置を正確に位置決め
して接続する必要があった。両者の位置がずれた状態で
位置合わせ(突き当て)されると、図9に示すように、
各ピン105が接続パッド123に対して横方向にずれ
たままで接続されてしまうことがあるからである。更
に、正確に位置決めしても、その後のハンドリング時
や、ベルト炉内を移動させてハンダペーストを溶融させ
る工程中に、衝撃等を受けて位置ずれが生じる場合もあ
る。
However, such a butt joint PG
In the A-type wiring board 100, as shown in FIG. 9, in connection between the wiring board 100 and another wiring board 120,
There has been a problem that displacement is likely to occur. That is, in the connection between the two, it is necessary to accurately position and connect the position of each pin 105 with respect to each connection pad 123, that is, the position of the wiring board main body 101. When they are aligned (butted) in a state where both positions are shifted, as shown in FIG.
This is because each pin 105 may be connected to the connection pad 123 while being shifted in the horizontal direction. Further, even if the positioning is performed accurately, there may be a case where a displacement occurs due to an impact or the like during the subsequent handling or during the process of moving the inside of the belt furnace to melt the solder paste.

【0007】このように、接続パッド123に対してピ
ン105の位置がずれていると、温度変化により配線基
板本体101と他の配線基板本体121との間に熱膨張
差が発生した場合などにおいて、ピンに横方向の応力が
掛かり、ピン105が接続パッド123から外れやすく
なるなど、接続信頼性が低下することとなる。また、位
置ずれが極端に大きくなってピン105がパッド123
の外縁よりも外にでてしまう場合には、隣接する接続パ
ッド123との絶縁距離が小さくなって絶縁抵抗が低く
なる等の不具合を生じたり、ピン105と接続パッド1
23とが接続していないものがでてくることも考えられ
る。
As described above, if the position of the pin 105 is shifted with respect to the connection pad 123, a difference in thermal expansion between the wiring board main body 101 and the other wiring board main body 121 due to a temperature change may occur. In addition, a lateral stress is applied to the pin, and the pin 105 is easily detached from the connection pad 123, so that the connection reliability is reduced. Further, the displacement becomes extremely large, and the pin 105
Of the connection pad 123, the insulation distance between the connection pad 123 and the insulation resistance is reduced.
It is also conceivable that some of them are not connected to the device 23.

【0008】本発明は、かかる問題点に鑑みてなされた
ものであって、配線基板に突設したピンを用いて配線基
板と他の配線基板とを接続するときに、多少の位置ずれ
があっても、自然に両者の位置が修正されて接続される
ようにされた配線基板とすることを目的とする。さら
に、その配線基板の製造方法、およびこの配線基板と他
の配線基板との接続体の製造方法を提供することを目的
とする。
The present invention has been made in view of such a problem, and when connecting a wiring board to another wiring board using pins protruding from the wiring board, there is a slight displacement. Even so, it is an object of the present invention to provide a wiring board in which both positions are naturally corrected and connected. It is another object of the present invention to provide a method for manufacturing the wiring board and a method for manufacturing a connection body between the wiring board and another wiring board.

【0009】[0009]

【課題を解決するための手段および効果】しかし、その
解決手段は、少なくとも1つの主面を有する配線基板本
体と該主面から突設された多数のピンとを有し、該ピン
の先端を他の配線基板に形成された接続用パッドに突き
当てつつピン接続用半田を用いて半田付けして他の配線
基板と接続するための配線基板であって、上記ピンは、
その先端に上記ピン接続用半田の半田付け時に溶融しな
い材質からなる径大部を備えることを特徴とする配線基
板を要旨とする。
However, the solution is to provide a wiring board body having at least one main surface and a large number of pins protruding from the main surface. A wiring board for connecting to another wiring board by soldering using pin connection solder while abutting a connection pad formed on the wiring board of the above, wherein the pins are
The gist of the present invention is to provide a wiring board having a large-diameter portion made of a material that does not melt at the time of soldering the pin connection solder at the tip thereof.

【0010】ここで、配線基板本体としては、片面ある
いは両面に配線を有するもののほか、内部にも配線や各
層の配線間を接続するビアやスルーホールを有する多層
配線基板や、両面間をビアやスルーホールで接続するも
の等が挙げられる。また、その材質も、アルミナ、Al
N、ガラスセラミック等のセラミックや、エポキシ樹
脂、BT樹脂、ポリイミド樹脂等の樹脂、ガラス−エポ
キシ樹脂、ガラス−BT樹脂等の複合材料や、セラミッ
クと樹脂との複合材料、あるいはアルミナ等のセラミッ
ク製基板やガラス−BT樹脂複合材料基板の上に樹脂で
絶縁層を形成したものなどでもよい。また、配線基板本
体には、集積回路チップ、半導体素子、コンデンサ、抵
抗等の電子部品を搭載するためのものが挙げられるが、
その他、2つの配線基板の間を中継するための中継用配
線基板(中継基板)であってもよい。
[0010] Here, the wiring board main body has wiring on one side or both sides, a multilayer wiring board having vias and through holes for connecting the wiring and the wiring of each layer, and a via between the both sides. A connection through a through hole and the like can be given. The material is also alumina, Al
N, ceramic such as glass ceramic, resin such as epoxy resin, BT resin, polyimide resin, composite material such as glass-epoxy resin, glass-BT resin, composite material of ceramic and resin, or ceramic such as alumina A material in which an insulating layer is formed with a resin on a substrate or a glass-BT resin composite material substrate may be used. In addition, the wiring board body may be for mounting electronic components such as an integrated circuit chip, a semiconductor element, a capacitor, and a resistor.
In addition, a relay wiring board (relay board) for relaying between two wiring boards may be used.

【0011】また、ピンは、配線基板の主面から突設さ
れていればよく、例えば、主面に設けたパッドにロウ付
け固着したものが挙げられるが、その他、配線基板本体
の内層あるいは配線基板本体の主面の裏面からピンを貫
挿して主面側にピンを突設してもよい。ピン材質は、配
線基板本体の材質等を勘案して適宜選択すればよいが、
例えば、42アロイ(42%Ni-Fe合金)やコバール(Fe-N
i-Co合金)あるいは銅合金等が選択できる。また、耐食
性や半田付け性等を考慮し、ピンには、これらの材質か
らなるピン本体にメッキ等によりNiやAu等の被膜を
形成することもある。
The pins only need to protrude from the main surface of the wiring board. For example, the pins may be fixed by brazing to pads provided on the main surface. The pins may be inserted through the back surface of the main surface of the substrate body and the pins may be protruded from the main surface. The pin material may be appropriately selected in consideration of the material of the wiring board body, etc.
For example, 42 alloy (42% Ni-Fe alloy) and Kovar (Fe-N
i-Co alloy) or a copper alloy can be selected. In addition, in consideration of corrosion resistance, solderability, and the like, a pin may be formed with a coating of Ni, Au, or the like on a pin body made of these materials by plating or the like.

【0012】また、他の配線基板も、片面あるいは両面
に配線を有するもののほか、内部にも配線や各層の配線
間を接続するビアやスルーホールを有する多層配線基板
や、両面間をビアやスルーホールで接続するもの等が挙
げられる。また、その材質も、アルミナ、AlN、ガラ
スセラミック等のセラミックや、エポキシ樹脂、BT樹
脂、ポリイミド樹脂等の樹脂、ガラス−エポキシ樹脂、
ガラス−BT樹脂等の複合材料や、セラミックと樹脂と
の複合材料、あるいはアルミナ等のセラミック製基板や
ガラス−BT樹脂複合材料基板の上に樹脂で絶縁層を形
成したものなどでもよい。
In addition to other wiring boards having wiring on one side or both sides, there are also multilayer wiring boards having vias and through holes for connecting wiring and wiring between layers, and vias and through holes between both sides. A connection through a hall and the like can be given. The material is also ceramics such as alumina, AlN, glass ceramic, epoxy resin, BT resin, resin such as polyimide resin, glass-epoxy resin,
A composite material such as glass-BT resin, a composite material of ceramic and resin, or a ceramic substrate such as alumina or a glass-BT resin composite material substrate on which an insulating layer is formed with resin may be used.

【0013】上記手段によれば、他の配線基板に突き当
てるピン先端にが径大部を備えるので、ピン接続用半田
を用いて他の配線基板の接続パッドとこの径大部とを半
田付けするときに、半田の接続(接触)面積が大きくな
る。このとき、ピンと接続用パッドに位置がずれている
と、溶融した半田の表面積を小さくしようとする表面張
力により、各々ピンに対して略各パッドの中心に位置さ
せようとする力が働くので、この力が重なり合って(総
合されて)配線基板を移動させる力となる。即ち、配線
基板本体と他の配線基板本体との位置が多少ずれた状態
で接続作業を開始した場合でも、溶融した半田の表面張
力により、正しい位置関係になるように自然に配線基板
または他の配線基板が相対的に移動するセルフアライメ
ント効果を生じ、確実に両者を接続することができる。
このため、本発明の配線基板と他の配線基板との接続時
には、両者の位置あわせを比較的ラフに行っても確実に
両者を接続することができる。また、半田ペーストの溶
融中に衝撃等によって位置ずれを生じても、自動的に位
置ずれが修復される。
According to the above-mentioned means, since the tip end of the pin which abuts against another wiring board has a large-diameter portion, the connection pad of the other wiring board and this large-diameter portion are soldered using the solder for pin connection. In this case, the connection (contact) area of the solder increases. At this time, if the positions of the pins and the connection pads are misaligned, a force is exerted on each of the pins so as to position the pins approximately at the center of each of the pads, due to surface tension that attempts to reduce the surface area of the molten solder. These forces overlap (combined) to provide a force for moving the wiring board. That is, even when the connection work is started in a state where the position of the wiring board main body and the position of the other wiring board main body are slightly deviated, the wiring board or other wiring is naturally formed so as to have a correct positional relationship by the surface tension of the molten solder. A self-alignment effect in which the wiring board relatively moves is generated, and the two can be reliably connected.
Therefore, when the wiring board of the present invention is connected to another wiring board, the two can be reliably connected even if the positioning of the two is relatively rough. Further, even if a displacement occurs due to an impact or the like during melting of the solder paste, the displacement is automatically repaired.

【0014】そのうえ、配線基板本体と他の配線基板本
体の間は、径の小さいピンで接続されているので、両者
間に生ずる熱膨張差などによる変位は、ピンの屈曲で吸
収される。しかも、ピンは先端において径大とされてい
るので、半田との接続面積が増えるので、より確実に半
田とピンとが接続でき、接続信頼性をさらに向上させる
ことができる。
In addition, since the wiring board main body and the other wiring board main body are connected by a pin having a small diameter, displacement caused by a difference in thermal expansion between the two is absorbed by bending of the pin. In addition, since the diameter of the pin is large at the tip, the connection area with the solder increases, so that the solder and the pin can be more reliably connected and the connection reliability can be further improved.

【0015】さらに、前記目的を達成するために請求項
2に記載の解決手段は、前記径大部は、前記ピン接続用
半田よりも融点の高い半田からなることを特徴とする請
求項1に記載の配線基板を要旨とする。
Further, in order to achieve the above object, according to a second aspect of the present invention, the large diameter portion is made of a solder having a melting point higher than that of the pin connection solder. The wiring board described above is the gist.

【0016】この手段によれば、ピン接続用半田を溶融
させてピンと接続用パッドとを半田付けする際に、径大
部が溶融することはないので、ピン接続用半田が溶融し
たときに表面張力により配線基板と他の配線基板とを正
しい位置で接続させることができる。また、径大部が半
田からなるので、ピン接続用半田とよく濡れて一体化す
るため、ピン先端の径大部とピン接続用半田とが強固に
接続され、より接続信頼性を向上することができる。
According to this means, when the pin connection solder is melted to solder the pin and the connection pad, the large diameter portion does not melt, so that when the pin connection solder melts, The wiring board can be connected to another wiring board at a correct position by the tension. In addition, since the large-diameter portion is made of solder, the large-diameter portion at the tip of the pin and the pin-connection solder are firmly connected to each other so that the pin-connection solder is well wetted and integrated, thereby further improving connection reliability. Can be.

【0017】さらに、前記目的を達成するために請求項
3に記載の解決手段は、前記ピンのうちピン先端の径大
部に隣接して半田流れ防止部を形成してなる請求項2に
記載の配線基板を要旨とする。
Further, in order to achieve the above object, according to a third aspect of the present invention, there is provided a fixing device according to the second aspect, wherein a solder flow preventing portion is formed adjacent to a large-diameter portion at the tip of the pin. The gist of the wiring board is as follows.

【0018】この手段によれば、径大部に隣接して半田
流れ防止部を形成しているので、半田によって径大部を
形成するときにピン先端から配線基板本体側に半田が流
れ拡がることがない。従って、ピン先端の径大部の半田
量が一定となるため、径大部の寸法が一定となり、他の
配線基板との接続時に各ピンにかかる表面張力も均一と
なって、位置ずれをより確実に解消できる。また、他の
配線基板との接続時にピン接続用半田も径大部を越えて
配線基板本体側に拡がることがなく、各ピンとパッドと
の接続にあずかるピン接続用半田の量も一定とすること
ができるので、この点からも各ピンにかかる表面張力も
均一となって、位置ずれをより確実に解消できる。
According to this means, since the solder flow preventing portion is formed adjacent to the large-diameter portion, when the large-diameter portion is formed by solder, the solder flows from the tip of the pin to the wiring board body side and spreads. There is no. Therefore, since the amount of solder at the large diameter portion at the tip of the pin is constant, the dimension of the large diameter portion is constant, and the surface tension applied to each pin during connection with another wiring board is also uniform, thereby reducing the displacement. It can be surely eliminated. Also, when connecting to another wiring board, the solder for pin connection does not exceed the large diameter part and does not spread to the wiring board body side, and the amount of solder for pin connection that is involved in the connection between each pin and the pad should be constant. Therefore, the surface tension applied to each pin is also uniform from this point, and the displacement can be more reliably eliminated.

【0019】さらに、前記目的を達成するために請求項
4に記載の解決手段は、前記半田流れ防止部として、前
記ピン先端の径大部に隣接するピン周面を、半田不濡れ
面としてなることを特徴とする請求項3に記載の配線基
板を要旨とする。
Further, in order to achieve the above object, a solution according to a fourth aspect of the present invention is to provide the solder flow preventing portion, wherein a pin peripheral surface adjacent to a large diameter portion of the pin tip is a solder non-wetting surface. The gist is the wiring board according to claim 3.

【0020】ここで、半田不濡れ面とは、ピン先端の径
大部を構成する半田およびピン接続用半田に濡れないよ
うな材質で形成され、あるいはこれらの半田に濡れない
処理がなされた面をいい、具体的には、例えば、熱酸化
処理等によって形成された酸化ニッケル層、黒染めニッ
ケル層、クロムメッキ層等によって形成される面が挙げ
られる。
Here, the solder non-wetting surface is a surface which is formed of a material which does not wet the solder constituting the large diameter portion at the tip of the pin and the solder for connecting the pin, or has been treated so as not to wet these solders. Specifically, for example, a surface formed by a nickel oxide layer, a blackened nickel layer, a chromium plating layer, or the like formed by a thermal oxidation treatment or the like can be given.

【0021】この手段によれば、径大部形成時に半田不
濡れ面により確実に半田が配線基板本体側に拡がるのを
防止できるので、径大部の形状を一定とすることができ
る。また、他の配線基板との接続時にピン接続用半田が
径大部を越えて配線基板本体側に拡がることも防止でき
る。
According to this means, it is possible to reliably prevent the solder from spreading to the wiring board body side due to the solder non-wetting surface when forming the large-diameter portion, so that the shape of the large-diameter portion can be made constant. In addition, it is possible to prevent the solder for pin connection from spreading beyond the large-diameter portion to the wiring board main body side during connection with another wiring board.

【0022】さらに、前記目的を達成するために請求項
5に記載の解決手段は、前記半田流れ防止部として、前
記ピン先端の径大部に隣接するピン周面に、半田不濡れ
材を形成してなることを特徴とする請求項3に記載の配
線基板を要旨とする。
According to a fifth aspect of the present invention, in order to achieve the above object, a solder non-wetting material is formed on the peripheral surface of the pin adjacent to the large diameter portion at the tip of the pin as the solder flow preventing portion. The gist of the invention is a wiring board according to claim 3.

【0023】ここで、半田不濡れ材とは、ピン先端の径
大部を構成する半田およびピン接続用半田に濡れないよ
うな材質をいい、具体的には、例えば、エポキシ樹脂
系、アクリル樹脂系等のソルダーレジストなどの半田を
はじく樹脂や、ガラス等が挙げられる。
Here, the solder non-wetting material refers to a material which does not wet the solder constituting the large diameter portion at the tip of the pin and the solder for connecting the pin. Specifically, for example, epoxy resin, acrylic resin A resin such as a solder resist such as a solder resist which repels solder, glass and the like can be used.

【0024】この手段によれば、径大部形成時に半田不
濡れ材により確実に半田が配線基板本体側に拡がるのを
防止できるので、径大部の形状を一定とすることができ
る。また、他の配線基板との接続時にピン接続用半田が
径大部を越えて配線基板本体側に拡がることも防止でき
る。
According to this means, it is possible to reliably prevent the solder from spreading to the wiring board main body side by the solder non-wetting material at the time of forming the large diameter portion, so that the shape of the large diameter portion can be made constant. In addition, it is possible to prevent the solder for pin connection from spreading beyond the large-diameter portion to the wiring board main body side during connection with another wiring board.

【0025】さらに、前記目的を達成するために請求項
6に記載の解決手段は、前記半田流れ防止部として、前
記ピン先端の径大部に隣接して、ピン本体の材質からな
る鍔部を備えることを特徴とする請求項3に記載の配線
基板を要旨とする。
According to a sixth aspect of the present invention, in order to achieve the above object, a brim portion made of a material of a pin body is provided as the solder flow preventing portion adjacent to a large-diameter portion at the tip of the pin. The gist of the invention is a wiring board according to claim 3.

【0026】ここで鍔部とは、ピン本体の通常の径より
も径方向に大きな寸法とされた部分を指し、具体的に
は、先端部分の径が大きくされたネイルヘッド(釘頭)
状や、先端よりやや配線基板本体側の一部の径が大きく
された形状などがある。また、鍔部の平面形状は、円板
(円柱)状が適当であるが、その他、四角、六角あるい
は、十字状などでもよい。
The term "flange" as used herein refers to a portion of the pin body having a larger diameter in the radial direction than the normal diameter of the pin body.
Shape, or a shape in which the diameter of a part of the wiring board body side is slightly larger than the tip. The planar shape of the flange is suitably a disk (column), but may be a square, hexagon, cross, or the like.

【0027】この手段によれば、径大部形成時にピン先
端から配線基板本体側に半田が拡がろうとしても、鍔部
の面積が大きいため、半田が基板本体側に拡がりにくく
なる。したがって、鍔部により確実に半田が拡がるのが
防止できるので、径大部の形状を一定とすることができ
る。また、他の配線基板との接続時にピン接続用半田が
径大部を越えて配線基板本体側に拡がることも防止でき
る。その上、配線基板に固着する前にピンに鍔部を設け
る加工を施しておけばよいので、半田不濡れ面や半田不
濡れ材を固着後のピンに形成する必要がなく、確実かつ
容易に形成できる。
According to this means, even when the solder tends to spread from the tip of the pin to the wiring board body at the time of forming the large-diameter portion, the solder is hard to spread to the board body because the area of the flange is large. Therefore, the spread of the solder can be reliably prevented by the flange portion, so that the shape of the large-diameter portion can be made constant. In addition, it is possible to prevent the solder for pin connection from spreading beyond the large-diameter portion to the wiring board main body side during connection with another wiring board. In addition, since it is sufficient that the pin is provided with a flange portion before being fixed to the wiring board, there is no need to form a solder non-wetting surface or a solder non-wetting material on the pin after fixing, and it is possible to reliably and easily Can be formed.

【0028】さらに、前記目的を達成するために請求項
7に記載の解決手段は、前記ピンは、ピン本体自身の先
端が径大とされたピンであることを特徴とする請求項1
に記載の配線基板を要旨とする。
According to a seventh aspect of the present invention, in order to achieve the above object, the pin is a pin having a pin body having a tip with a large diameter.
The gist is the wiring board described in.

【0029】この手段によれば、ピン先端の径大部は、
ピン本体自身の先端が径大とされたものであるため、ピ
ンを配線基板本体に突設した後に、ピン先端部に径大部
を形成する必要がない。従って、安価な配線基板とする
ことができる。また、径大部がピン本体と同じ材料であ
るので、ピンとパッドの接続時の半田付け温度が多少高
くなったとしても、ピン本体自身が溶融することはな
い。従って、半田付け温度の厳密にコントロールしなく
とも、確実に接続することができる。
According to this means, the large diameter portion at the tip of the pin is
Since the tip of the pin body itself has a large diameter, it is not necessary to form a large diameter portion at the tip of the pin after projecting the pin from the wiring board body. Therefore, an inexpensive wiring board can be obtained. Further, since the large diameter portion is made of the same material as the pin main body, even if the soldering temperature at the time of connection between the pin and the pad is slightly increased, the pin main body itself does not melt. Therefore, even if the soldering temperature is not strictly controlled, the connection can be surely made.

【0030】さらに、前記目的を達成するために請求項
8に記載の解決手段は、前記ピンの径大部の最大径は、
該ピンと接続するために前記他の配線基板に形成された
接続パッドの径の0.7〜1.4倍の大きさにされてい
ることを特徴とする請求項1〜7のいずれかに記載の配
線基板を要旨とする。
Further, in order to achieve the above object, a solution according to claim 8 is that the maximum diameter of the large diameter portion of the pin is:
8. The semiconductor device according to claim 1, wherein a diameter of the connection pad formed on said another wiring board is 0.7 to 1.4 times as large as that of said connection pad for connection with said pin. The gist of the wiring board is as follows.

【0031】配線基板と他の配線基板とが相対的に移動
するセルフアライメント効果は、溶融したピン接続用半
田の表面張力に起因して生ずるため、径大部の径と接続
パッドの径とがほぼ同寸の時にその効果が大きくなり、
一方が小さい場合には効果が小さくなると考えられる。
即ち、径大部の径がパッドの径の0.7倍より小さい
と、面積で比較すると径大部の断面積が接続パッドの断
面積の約1/2となり、半田付けの時にピンとパッドの
間に生じる表面張力が小さく、ずれを自動的に解消する
セルフアライメント効果が期待しにくくなる。同様に、
径大部の径がパッドの径の1.4倍より大きい場合も、
径大部の断面積が接続パッドの面積の約2倍となり、両
者間に働く表面張力が小さくなりセルフアライメント効
果が期待しにくくなる。従って、上記手段によれば、セ
ルフアライメント効果が十分得られる。なお、に径大部
の径が大きくなりすぎると、ピン間の距離が小さくなる
ので絶縁距離が小さくなり好ましくないので、更にパッ
ド間の距離を勘案して径大部の径を選択すると良い。
Since the self-alignment effect in which the wiring board and the other wiring board relatively move is caused by the surface tension of the molten solder for pin connection, the diameter of the large-diameter portion and the diameter of the connection pad become large. The effect increases when they are approximately the same size,
If one is small, the effect is considered to be small.
That is, when the diameter of the large diameter portion is smaller than 0.7 times the diameter of the pad, the cross-sectional area of the large diameter portion becomes approximately 1/2 of the cross-sectional area of the connection pad when compared with the area. The surface tension generated therebetween is small, and it is difficult to expect a self-alignment effect of automatically eliminating the displacement. Similarly,
When the diameter of the large diameter part is larger than 1.4 times the diameter of the pad,
The cross-sectional area of the large-diameter portion is about twice the area of the connection pad, the surface tension acting between them becomes small, and the self-alignment effect is hardly expected. Therefore, according to the above means, the self-alignment effect can be sufficiently obtained. If the diameter of the large-diameter portion is too large, the distance between the pins becomes small and the insulation distance becomes short, which is not preferable. Therefore, the diameter of the large-diameter portion is preferably selected in consideration of the distance between the pads.

【0032】さらに、前記目的を達成するために請求項
9に記載の解決手段は、少なくとも1つの主面を有する
配線基板本体と該主面から突設された多数のピンとを有
し、該ピンの先端にピン接続用半田の半田付け時に溶融
しない材質からなる径大部を備える配線基板の製造方法
であって、上記ピン接続用半田よりも融点の高い半田を
溶着して上記ピンの先端に径大部を形成する工程を有す
ることを特徴とする配線基板の製造方法を要旨とする。
According to another aspect of the present invention, there is provided a wiring board body having at least one main surface and a plurality of pins projecting from the main surface. A method of manufacturing a wiring board comprising a large-diameter portion made of a material that does not melt during soldering of the pin connection solder at the tip of the pin, wherein a solder having a higher melting point than the pin connection solder is welded to the tip of the pin. A gist of the present invention is a method for manufacturing a wiring board, which includes a step of forming a large-diameter portion.

【0033】この手段によれば、半田をピン先端に溶着
するので、径大部を容易に形成することができる。ま
た、径大部が半田であるので、ピン接続用半田によく濡
れるため、径大部をピン接続用半田で確実に接続でき
る。
According to this means, since the solder is welded to the tip of the pin, the large diameter portion can be easily formed. In addition, since the large-diameter portion is solder, it is well wetted by the pin connection solder, so that the large-diameter portion can be reliably connected by the pin connection solder.

【0034】さらに、前記目的を達成するために請求項
10に記載の解決手段は、前記半田を溶着して径大部を
形成する工程の前に、前記ピン先端の径大部に隣接する
ピン周面に、半田不濡れ面を形成する工程を有すること
を特徴とする請求項9に記載の配線基板の製造方法を要
旨とする。
Further, in order to achieve the above object, a solution according to a tenth aspect of the present invention resides in that, prior to the step of forming the large-diameter portion by welding the solder, a pin adjacent to the large-diameter portion at the tip of the pin is formed. The gist of the present invention is a method of manufacturing a wiring board according to claim 9, further comprising a step of forming a solder non-wetting surface on the peripheral surface.

【0035】この手段によれば、半田をピン先端に溶着
するのに先立って、半田不濡れ面を隣接する配線基板本
体側のピン周面に形成するので、半田をピン先端に溶着
するときに、半田が配線基板本体側(根本側)に濡れ拡
がるのを防止できる。従って、径大部の形状を一定化す
ることができる。
According to this means, before the solder is welded to the tip of the pin, the solder non-wetting surface is formed on the peripheral surface of the pin on the side of the adjacent wiring board body. Therefore, when the solder is welded to the tip of the pin. In addition, it is possible to prevent the solder from spreading to the wiring board body side (root side). Therefore, the shape of the large diameter portion can be made constant.

【0036】さらに、前記目的を達成するために請求項
11に記載の解決手段は、前記半田を溶着して径大部を
形成する工程の前に、前記ピン先端の径大部に隣接する
ピン周面に、半田不濡れ材を形成して工程を有すること
を特徴とする請求項9に記載の配線基板の製造方法を要
旨とする。
Further, in order to achieve the above-mentioned object, a solution according to claim 11 is a method of forming a large-diameter portion of a pin adjacent to a large-diameter portion of the pin before the step of welding the solder to form the large-diameter portion. The gist of the present invention is a method of manufacturing a wiring board according to claim 9, further comprising a step of forming a solder non-wetting material on the peripheral surface.

【0037】この手段によれば、半田をピン先端に溶着
するのに先立って、半田不濡れ材を隣接する配線基板本
体側のピン周面に形成するので、半田をピン先端に溶着
するときに、半田が配線基板本体側(根本側)に濡れ拡
がるのを防止できる。従って、径大部の形状を一定化す
ることができる。
According to this means, the solder non-wetting material is formed on the adjacent pin peripheral surface of the wiring board body before the solder is welded to the pin tip, so that when the solder is welded to the pin tip. In addition, it is possible to prevent the solder from spreading to the wiring board body side (root side). Therefore, the shape of the large diameter portion can be made constant.

【0038】さらに、前記目的を達成するために請求項
12に記載の解決手段は、前記半田を溶着して径大部を
形成する工程の前に、先端または先端近傍に鍔部を有す
るピン本体を前記配線基板本体の主面に突設する工程を
有することを特徴とする請求項9に記載の配線基板の製
造方法を要旨とする。
Further, in order to achieve the above object, a solution according to claim 12 is to provide a pin body having a flange at or near the tip before the step of welding the solder to form a large diameter portion. The method of manufacturing a wiring board according to claim 9, further comprising a step of projecting the main board from the main surface of the wiring board body.

【0039】この手段によれば、半田をピン先端に溶着
するのに先立って、先端または先端近傍に鍔部を有する
ピン本体を配線基板本体に突設するので、ピン先端に半
田を溶着して径大部を形成するときに、半田が配線基板
本体側(根本側)に濡れ拡がるのを防止できる。従っ
て、径大部の形状を一定化することができる。また、鍔
部を有するピン本体を配線基板本体に突設すれば足りる
ので、このような配線基板は容易に形成できる。
According to this means, prior to welding the solder to the tip of the pin, the pin body having a flange at or near the tip is protruded from the wiring board body, so that the solder is welded to the tip of the pin. When forming the large-diameter portion, it is possible to prevent the solder from spreading to the wiring board body side (root side). Therefore, the shape of the large diameter portion can be made constant. Further, since it is sufficient that the pin main body having the flange is protruded from the wiring board main body, such a wiring board can be easily formed.

【0040】さらに、前記目的を達成するために請求項
13に記載の解決手段は、少なくとも1つの主面を有す
る配線基板本体と該主面から突設されその先端にピン接
続用半田の半田付け時に溶融しない材質からなる径大部
を備えた多数のピンとを有する配線基板と、他の配線基
板とを、上記ピンの先端を該他の配線基板に形成した接
続用パッドに突き当てつつ上記ピン接続用半田を用いて
接続する接続体の製造方法を要旨とする。
According to another aspect of the present invention, there is provided a wiring board body having at least one main surface and a pin connection solder protruding from the main surface. A wiring board having a large number of pins having a large diameter portion made of a material that does not melt at the same time, and another wiring board, wherein the pins are formed by abutting the tips of the pins against connection pads formed on the other wiring board. The gist is a method for manufacturing a connection body to be connected using connection solder.

【0041】この手段によれば、径大部を備えたピン先
端を他の配線基板の接続用パッドに突き当てつつピン接
続用半田を用いて接続するので、配線基板と他の配線基
板との間には、溶融したピン接続用半田の表面張力によ
る力が働く。このため、各ピンが各パッドの略中央に来
るように、自動的に配線基板同士が相対的に移動するセ
ルフアライメント効果を得ることができる。従って、配
線基板と他の配線基板の位置が多少ずれていても、正し
い位置に自動的に移動するので、両者に位置合わせを高
精度に行う必要がなく、接続作業が容易にできる。
According to this means, the pins having the large-diameter portions are connected by using the pin connection solder while abutting the ends of the pins against the connection pads of the other wiring board. Between them, a force due to the surface tension of the molten solder for pin connection acts. Therefore, it is possible to obtain a self-alignment effect in which the wiring boards are automatically moved relative to each other so that each pin is substantially at the center of each pad. Therefore, even if the positions of the wiring board and the other wiring boards are slightly displaced, the wiring boards are automatically moved to the correct positions, so that there is no need to perform high-accuracy positioning of the two and the connection work can be facilitated.

【0042】[0042]

【発明の実施の形態】本発明の実施の形態を図面を、参
照しつつ説明する。 (実施例1)図1は実施例1にかかる配線基板10の縦
断面図である。多層配線基板本体1はアルミナセラミッ
クからなり、この主面(図中下面)1aには、タングス
テンからなるピン固着用パッド3(直径860μm)が
多数格子状に形成されている。このパッド3にはAg−
Cu共晶銀ロウ8を介して42アロイ(42%Ni-Fe合金)
製のピン本体5が固着されている。このピン本体5は、
いわゆるネイルヘッド型のピンであり、ピン全長3.0
mm、ピン径0.3mm、頭部径0.45mmである。
また、このピン本体5の先端(図中下端部)には、直径
約890μmの高温半田球6(98Pb-2Sn、融点322
℃)が溶着されて、先端に径大部を有するピン7を構成
している。また、このピン本体5の先端(下端)から
0.8mm上方には、半田が濡れないように酸化処理さ
れた酸化ニッケル露出面(半田不濡れ面)5iがピン本
体5の周囲に軸方向幅1.0mmにわたって形成されて
いる。
Embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a longitudinal sectional view of a wiring board 10 according to a first embodiment. The multilayer wiring board main body 1 is made of alumina ceramic, and a large number of pin fixing pads 3 (860 μm in diameter) made of tungsten are formed on the main surface (lower surface in the figure) 1a. This pad 3 has Ag-
42 alloy (42% Ni-Fe alloy) via Cu eutectic silver braze 8
Pin body 5 is fixedly mounted. This pin body 5
It is a so-called nail head type pin with a total pin length of 3.0.
mm, the pin diameter is 0.3 mm, and the head diameter is 0.45 mm.
Also, a high-temperature solder ball 6 (98Pb-2Sn, melting point 322) having a diameter of about 890 μm
° C) is welded to form a pin 7 having a large diameter portion at the tip. A nickel oxide exposed surface (solder non-wetting surface) 5i, which is oxidized so as not to wet the solder, is provided 0.8 mm above the tip (lower end) of the pin body 5 around the pin body 5 in the axial direction. It is formed over 1.0 mm.

【0043】一方、多層配線基板本体1の裏面(図中上
面)1bの中央付近には、モリブデンからなり、後述す
る集積回路チップ11を接続するためのチップ接続用パ
ッド9(直径125μm)が多数格子状に形成されてい
る。このチップ接続用パッド9とピン固着用パッド3と
は、多層配線基板本体1内で、図示しない配線により接
続されている。なお、後述するように、パッド3、銀ロ
ウ8および半田不濡れ面5aより多層配線基板本体1側
のピン本体5表面には、ニッケルメッキおよび金メッキ
が施されている。また、チップ接続用パッド9の表面に
も、ニッケルメッキおよび金メッキが施されている。
On the other hand, near the center of the back surface (upper surface in the figure) 1b of the multilayer wiring board main body 1, a large number of chip connection pads 9 (125 μm in diameter) made of molybdenum for connecting an integrated circuit chip 11 to be described later. It is formed in a lattice shape. The chip connection pads 9 and the pin fixing pads 3 are connected to each other by wiring (not shown) in the multilayer wiring board main body 1. As described later, nickel plating and gold plating are applied to the surface of the pin body 5 on the side of the multilayer wiring board body 1 from the pad 3, the silver solder 8, and the solder non-wetting surface 5a. The surface of the chip connection pad 9 is also plated with nickel and gold.

【0044】ついで、図2に示すように、集積回路チッ
プ11のチップパッド13と多層配線基板本体1のチッ
プ接続用パッド9とを、高温半田(90Pb-10Sn、融点3
01℃)15を介してフリップチップ接続する。なお、
このとき、高温半田球6は、溶融しない温度を選択して
チップパッド13とチップ接続用パッド9とを接続す
る。
Then, as shown in FIG. 2, the chip pads 13 of the integrated circuit chip 11 and the chip connection pads 9 of the multilayer wiring board main body 1 are connected to a high-temperature solder (90 Pb-10Sn, melting point 3).
(01 ° C.) 15 for flip-chip connection. In addition,
At this time, the chip ball 13 and the chip connection pad 9 are connected by selecting a temperature at which the high-temperature solder ball 6 does not melt.

【0045】その後、この配線基板10を、プリント配
線板20に接続する。このプリント配線板20は、ガラ
ス−エポキシ樹脂複合材料(JIS:FR-4)からなるプリン
ト配線板本体21と、このプリント配線板本体21の接
続面21a(図中上面)にピン7の先端を突き当てて接
続するためのCu製接続パッド(直径720μm)23
が、ピン固着用パッド3およびピン7にそれぞれ対応す
る位置に形成されている。また、接続パッド23上に
は、Pb−Sn共晶半田ペースト(37Pb-63Sn、融点1
83℃)25がそれぞれスクリーン印刷によって塗布さ
れている。
Thereafter, the wiring board 10 is connected to the printed wiring board 20. The printed wiring board 20 has a printed wiring board main body 21 made of a glass-epoxy resin composite material (JIS: FR-4), and a tip end of the pin 7 on a connection surface 21a (upper surface in the drawing) of the printed wiring board main body 21. Cu connection pad (720 μm diameter) 23 for abutting connection
Are formed at positions corresponding to the pin fixing pad 3 and the pin 7, respectively. On the connection pad 23, a Pb-Sn eutectic solder paste (37Pb-63Sn, melting point 1
83 ° C.) 25 are each applied by screen printing.

【0046】この接続パッド23上に高温半田球6がそ
れぞれ位置するように配線基板10を位置合わせして重
ねた後に、最高温度220℃の赤外線リフロー炉に投入
し、半田ペースト25を溶融させ、図3に示すように、
ピン7の先端に形成された高温半田球6と接続用パッド
23とを共晶半田26によって接続させる。このとき、
溶融した共晶半田26は、高温半田球6とパッド23と
の間で両者を濡らすと共に、表面張力によってできるだ
け表面積が小さくなる方向に力を発生する。
After the wiring boards 10 are aligned and superimposed so that the high-temperature solder balls 6 are respectively positioned on the connection pads 23, the wiring boards 10 are put into an infrared reflow furnace at a maximum temperature of 220 ° C., and the solder paste 25 is melted. As shown in FIG.
The high-temperature solder balls 6 formed at the tips of the pins 7 and the connection pads 23 are connected by eutectic solder 26. At this time,
The molten eutectic solder 26 wets the space between the high-temperature solder ball 6 and the pad 23 and generates a force in a direction in which the surface area is reduced as much as possible by the surface tension.

【0047】もし、いずれの高温半田球6(従ってピン
本体5の軸線)もパッド23の中心から一定方向にずれ
た位置にあった場合には、表面張力によって発生する力
が重なって、全体として配線基板10を移動させる力と
なる。この力により、配線基板10が移動し、結局各接
続パッド23の略中心に高温半田ボール6(ピン本体
5)が位置するように自動的に調整されることになる。
即ち、たとえ接続(半田溶融)前に、配線基板10とプ
リント配線板20との相互の位置が多少ずれていたとし
ても、セルフアライメント効果により、自動的に位置が
調整されるので、多少の位置ずれを許容するラフな位置
合わせで足りることとなる。
If any of the high-temperature solder balls 6 (accordingly, the axis of the pin main body 5) is located at a position deviated from the center of the pad 23 in a certain direction, the forces generated by the surface tension overlap, and as a whole, This is a force for moving the wiring board 10. With this force, the wiring board 10 moves, and eventually, the adjustment is automatically performed so that the high-temperature solder ball 6 (pin body 5) is located substantially at the center of each connection pad 23.
That is, even if the mutual position between the wiring board 10 and the printed wiring board 20 is slightly shifted before the connection (solder melting), the position is automatically adjusted by the self-alignment effect. Rough positioning allowing deviation is sufficient.

【0048】ところで、上記例においては、高温半田球
6の径(ピン先端の径大部の径)を890μmとし、接
続用パッド23の径(720μm)の1.24倍とし
た。セルフアライメント効果は、溶融したピン接続用半
田の表面張力に起因して生ずるため、径大部の径と接続
パッドの径とがほぼ同寸の時には、わずかなずれでも表
面積の変化率が大きくなるので、位置を修正しようとす
る力が大きく働く。逆にいずれか一方が小さい場合には
表面積の変化率が小さくなるので、働く力が小さくなる
と考えられる。即ち、例えば、接続用パッド23の径7
20μmに対して、径大部の径を500μm〜1010
μm(パッドの径の0.7倍〜1.4倍の範囲)とする
と、セルフアライメント効果が十分に得られる。
In the above example, the diameter of the high-temperature solder ball 6 (the diameter of the large diameter portion at the tip of the pin) was 890 μm, which was 1.24 times the diameter (720 μm) of the connection pad 23. Since the self-alignment effect is caused by the surface tension of the molten solder for pin connection, when the diameter of the large-diameter portion and the diameter of the connection pad are almost the same, the rate of change in the surface area increases even with a slight deviation. Therefore, the force for correcting the position works greatly. Conversely, when either one is small, the rate of change of the surface area is small, and it is considered that the working force is small. That is, for example, the diameter 7 of the connection pad 23
The diameter of the large diameter portion is set to 500 μm to 1010
When the thickness is set to μm (the range of 0.7 to 1.4 times the pad diameter), a sufficient self-alignment effect can be obtained.

【0049】なお、本例において用いたアルミナセラミ
ックからなる多層配線基板本体1の熱膨張率は約8×1
-6であり、ガラス−エポキシ樹脂複合材料からなるプ
リント配線板本体21の熱膨張率(横方向)は約15×
10-6である。従って、これらが高温あるいは低温に曝
された場合には、両者の間で熱膨張差が発生する。この
ような場合には、ピン本体5が屈曲して熱膨張差を吸収
するので、応力の発生が抑制され、2つの配線基板の間
の接続信頼性は高い。しかも、ピン本体105を直接パ
ッド123に半田付けした場合(従来例、図8参照)の
ピン本体105と半田126との接続面積に比較して、
高温半田球6と共晶半田26との接続面積は大きいの
で、より強固に接続される。さらに、本例においては、
径大部に高温半田球6を用いている。この高温半田球6
と共晶半田26とは親和性が高く、共晶半田26を溶融
したときに高温半田球6の表面が一部溶解するため、両
者間はいっそう強固に接続することができ、接続信頼性
をさらに向上することができる。
The coefficient of thermal expansion of the multilayer wiring board body 1 made of alumina ceramic used in this example is about 8 × 1.
0 -6, glass - thermal expansion coefficient of the printed circuit board body 21 made of an epoxy resin composite material (transverse direction) is approximately 15 ×
10 -6 . Therefore, when these are exposed to a high or low temperature, a thermal expansion difference occurs between the two. In such a case, since the pin body 5 is bent to absorb the difference in thermal expansion, the generation of stress is suppressed, and the connection reliability between the two wiring boards is high. Moreover, compared to the connection area between the pin body 105 and the solder 126 when the pin body 105 is directly soldered to the pad 123 (conventional example, see FIG. 8).
Since the connection area between the high-temperature solder ball 6 and the eutectic solder 26 is large, the connection is made stronger. Further, in this example,
A high-temperature solder ball 6 is used for the large diameter portion. This high temperature solder ball 6
Has high affinity with the eutectic solder 26, and when the eutectic solder 26 is melted, a part of the surface of the high-temperature solder ball 6 is melted, so that the two can be connected more firmly and the connection reliability is improved. It can be further improved.

【0050】ついで、本実施例の配線基板10の製造方
法について、図4を参照しつつ説明する。図4は、図1
に示した配線基板10のうち、ピン7近傍の製造工程を
説明するための説明図である。まず、ネイルヘッド状に
成型された42アロイ製ピン本体5を用意する(図4
(a))。多層配線基板本体1のピン固着用パッド3上に
予め無電解ニッケルメッキ層3f(厚さ1.2μm)を
形成しておき、このピン固着用パッド3上にピン本体5
をAg-Cu共晶銀ロウ8によりロウ付けする(図4(b))。
ついで、ピン本体5および銀ロウ8、ピン固着用パッド
3上に無電解ニッケルメッキ層5g(厚さ2.5μmMi
n)を形成する(図4(c))。
Next, a method for manufacturing the wiring board 10 of this embodiment will be described with reference to FIG. FIG.
FIG. 9 is an explanatory diagram for describing a manufacturing process near the pin 7 in the wiring board 10 shown in FIG. First, a 42-alloy pin body 5 molded into a nail head shape is prepared (FIG. 4).
(a)). An electroless nickel plating layer 3f (1.2 μm thick) is previously formed on the pin fixing pad 3 of the multilayer wiring board main body 1, and the pin main body 5 is formed on the pin fixing pad 3.
Is brazed with an Ag-Cu eutectic silver braze 8 (FIG. 4 (b)).
Then, an electroless nickel plating layer 5 g (2.5 μm thick) was formed on the pin body 5, the silver solder 8, and the pad fixing pad 3.
n) (FIG. 4 (c)).

【0051】その後、ピン本体5先端より0.8mm引
き下がった位置(図中上側)に、メッキレジストRをピ
ン周方向に塗布し乾燥する(図4(d))。さらに、無電
解金メッキ層5h、5h’(厚さ0.1〜0.5μm)
を形成しメッキレジストRを除去する(図4(e))。す
ると、レジストRのあった部分のみ下地のニッケルメッ
キ層5gが露出した露出部Sが形成される。ついで、こ
の多層配線基板本体1を温度450℃の大気雰囲気炉中
に5分間投入する。すると、金メッキ層5h、5h’に
覆われた部分はこの金メッキ層5h、5h’によって保
護されるが、露出部Sにおいては、ニッケルメッキ層5
gが熱酸化されて、酸化ニッケル層5iとなる(図4
(f))。この酸化ニッケル層5iは、安定で、半田に濡
れない性質を有する。また、熱処理によって酸化させる
ので、確実に酸化ニッケル層が形成でき、しかも、酸化
ニッケル層は剥がれる等の変化が少ないので安定して確
実に半田をはじくことができる。
Thereafter, a plating resist R is applied in the circumferential direction of the pin at a position (upper side in the figure) 0.8 mm below the tip of the pin body 5 and dried (FIG. 4D). Further, the electroless gold plating layers 5h, 5h '(thickness: 0.1 to 0.5 [mu] m)
Is formed, and the plating resist R is removed (FIG. 4E). Then, an exposed portion S is formed in which the underlying nickel plating layer 5g is exposed only in the portion where the resist R was present. Next, the multilayer wiring board main body 1 is put into an atmosphere furnace at a temperature of 450 ° C. for 5 minutes. Then, the portions covered with the gold plating layers 5h and 5h 'are protected by the gold plating layers 5h and 5h'.
g is thermally oxidized to form a nickel oxide layer 5i (FIG. 4).
(f)). The nickel oxide layer 5i is stable and does not wet with solder. Further, since the nickel oxide layer is oxidized by the heat treatment, the nickel oxide layer can be surely formed, and the nickel oxide layer has little change such as peeling, so that the solder can be stably and reliably repelled.

【0052】ついで、例えば、耐熱性があり半田に濡れ
ない性質のアルミナセラミック製の不濡れ板B上に各ピ
ン本体5に対応する配置で高温半田ペースト(98Pb-2S
n)6aを塗布しておく。その上に、ピン本体5の先端
部が対応するように多層配線基板本体1を位置決めして
ピン本体5の先端部をペースト6aに接触させる(図4
(g))。その後、360℃のリフロー炉中に投入し、高
温半田ペースト6aを溶融させ、ピン本体5の先端部に
高温半田球6を形成する(図4(h))。このとき、酸化
ニッケル層5iは溶融した高温半田に濡れないため、高
温半田がピン根本側(多層配線基板本体1側)に向かっ
て流れることなく、先端部で略球状となる。なお、先端
部の金メッキ層5h’は、高温半田球6に溶食されその
中に拡散してしまうので、高温半田球6とニッケルメッ
キ層5gとが直接接続していると考えられる。以上のよ
うにすることで、ピン本体5の先端部に高温半田球6か
らなる径大部を有するピン7を備える配線基板10が形
成できる。なお、不濡れ板Bとしては、アルミナセラミ
ックや窒化珪素等のセラミックのほか、カーボン(黒
鉛)やステンレス等を用いることもできる。
Next, for example, a high-temperature solder paste (98Pb-2S) is disposed on a non-wetting plate B made of alumina ceramic having heat resistance and not wettable by solder in a position corresponding to each pin body 5.
n) Apply 6a. On top of that, the multilayer wiring board main body 1 is positioned so that the front end of the pin main body 5 corresponds, and the front end of the pin main body 5 is brought into contact with the paste 6a (FIG. 4).
(g)). Thereafter, the high-temperature solder paste 6a is put into a 360 ° C. reflow furnace to melt the high-temperature solder paste 6a, thereby forming a high-temperature solder ball 6 at the tip of the pin body 5 (FIG. 4 (h)). At this time, since the nickel oxide layer 5i does not wet with the molten high-temperature solder, the high-temperature solder does not flow toward the pin root side (the multilayer wiring board main body 1 side), but has a substantially spherical shape at the tip. Since the gold plating layer 5h 'at the tip is eroded by the high-temperature solder balls 6 and diffused therein, it is considered that the high-temperature solder balls 6 and the nickel plating layer 5g are directly connected. By doing as described above, the wiring board 10 including the pin 7 having the large-diameter portion formed of the high-temperature solder ball 6 at the tip of the pin main body 5 can be formed. In addition, as the non-wetting plate B, carbon (graphite), stainless steel, or the like can be used in addition to ceramics such as alumina ceramic and silicon nitride.

【0053】(実施例2)上記実施例1においては、ピ
ン本体5の途中部分に半田不濡れ面として酸化ニッケル
層5iを形成した例を示したが、本例では、露出部Sに
ニッケル黒染め処理液を作用させて露出部Sのニッケル
を黒染め処理する。黒染め処理されたニッケル層5j
は、酸化ニッケル層5iと同様に溶融した半田に濡れな
い性質を有するので、図5(a)に示すように実施例1と
同様にして高温半田球6を形成することができる。本例
によれば、熱酸化という高温処理が不要となる。
(Embodiment 2) In Embodiment 1, the nickel oxide layer 5i is formed as a solder non-wetting surface in the middle of the pin body 5, but in this embodiment, the nickel black layer is formed on the exposed portion S. The dyeing treatment liquid is acted on to blacken the nickel in the exposed portion S. Black-dyed nickel layer 5j
Has the property of not getting wet with the molten solder similarly to the nickel oxide layer 5i, so that the high-temperature solder balls 6 can be formed in the same manner as in the first embodiment as shown in FIG. According to this example, a high temperature treatment called thermal oxidation is not required.

【0054】(実施例3)また、上記実施例1において
は、ピン本体5の途中部分にニッケルメッキ層5gの露
出部Sを形成し、熱酸化して酸化ニッケル層5iとして
例を示した。しかし、本例においては、図5(b)に示す
ように、露出部を形成することなく全体に金メッキ層5
hを形成し、その後ピンの途中部にエポキシ樹脂系ソル
ダーレジストSRをリング状に塗布し乾燥し、その後実
施例1と同様にして高温半田球6を形成する。この場合
も、ソルダーレジストSRによって溶融した高温半田が
ピン根本側に流れることが防止されるので、一定形状の
高温半田球6が形成できる。なお、ソルダーレジストS
Rの代わりに、ガラスペーストを塗布し焼成してガラス
層を形成しても同様に高温半田球6を形成することがで
きる。
Third Embodiment In the first embodiment, the exposed portion S of the nickel plating layer 5g is formed at an intermediate portion of the pin body 5 and thermally oxidized to form the nickel oxide layer 5i. However, in this example, as shown in FIG. 5B, the entire gold plating layer 5 was formed without forming an exposed portion.
Then, an epoxy resin-based solder resist SR is applied in the form of a ring in the middle of the pin and dried, and then a high-temperature solder ball 6 is formed in the same manner as in the first embodiment. Also in this case, the high-temperature solder melted by the solder resist SR is prevented from flowing to the pin root side, so that a high-temperature solder ball 6 having a fixed shape can be formed. The solder resist S
Instead of R, a high-temperature solder ball 6 can be formed similarly by forming a glass layer by applying and firing a glass paste.

【0055】(実施例4)上記実施例1〜3において
は、高温半田がピン根本側に流れないように半田をはじ
く性質のものを形成したが、本例においては、図5(c)
に示すように、ピン先端近傍に径方向に膨出した鍔部5
sを有するピン本体5’を用い、ピン先端部に高温半田
球6を形成する。本例においては、図5(d)に示すよう
に、鍔部5s(鍔部径0.45mm、厚さ0.2mm)
を有するピン本体5’を予め形成しておき、このピン本
体5’を実施例1と同様にパッド3に銀ロウ付けし、ニ
ッケルメッキ及び金メッキを施す。ただし、実施例1と
異なりレジストRで露出部Sを形成したり、露出部Sを
熱酸化することは行わない。図5(d)に示すように、こ
のピン本体5’の先端を不濡れ板B上に塗布した高温半
田ペースト6aに位置決めし、図5(e)に示すように、
ピン本体5’先端をペースト6aに接触させる。
(Embodiment 4) In the above-mentioned embodiments 1 to 3, a solder repelling property was formed so that the high-temperature solder did not flow to the pin root side. In this embodiment, FIG.
As shown in the figure, a flange portion 5 bulging in the radial direction near the tip of the pin.
A high-temperature solder ball 6 is formed at the tip of the pin by using the pin body 5 ′ having s. In this example, as shown in FIG. 5D, a flange 5s (a flange diameter of 0.45 mm and a thickness of 0.2 mm)
Is formed in advance, and the pin body 5 'is silver-brazed to the pad 3 and nickel-plated and gold-plated as in the first embodiment. However, unlike the first embodiment, the exposed portion S is not formed with the resist R or the exposed portion S is not thermally oxidized. As shown in FIG. 5 (d), the tip of the pin body 5 ′ is positioned on the high-temperature solder paste 6a applied on the non-wetting plate B, and as shown in FIG. 5 (e).
The tip of the pin body 5 'is brought into contact with the paste 6a.

【0056】このまま高温半田ペースト6aを溶融させ
てピン本体5’先端に高温半田を溶着させるのである
が、本例においては、鍔部5sがあるため、溶融した高
温半田がピン根本側に流れる(濡れ拡がる)ことが防止
される。鍔部5sにより高温半田と接触している面積が
大きくなるので、表面張力により濡れ拡がりが抑制され
るためと考えられる。このようにして、ピン本体5’先
端部に高温半田球6を形成することができる(図5
(c))。本例においては、熱酸化やレジスト塗布等の各
ピン本体に対する処理が不要となり、このような形状の
ピン本体を予め形成しておくだけで足りるので、容易に
形成することができる。
The high-temperature solder paste 6a is melted as it is, and the high-temperature solder is welded to the tip of the pin body 5 '. In this example, the molten high-temperature solder flows toward the pin root because of the flange 5s. (Wet spreading) is prevented. It is considered that the area in contact with the high-temperature solder is increased by the flange portion 5s, so that the surface tension suppresses the spread of wetness. Thus, the high-temperature solder ball 6 can be formed at the tip of the pin body 5 '(FIG. 5).
(c)). In the present embodiment, it is not necessary to perform a process for each pin body such as thermal oxidation or resist coating, and it is sufficient to form a pin body having such a shape in advance, so that the pin body can be easily formed.

【0057】(実施例5)上記実施例4においては、ピ
ン本体5’の先端近傍に鍔部5sがあるものを用いた
が、本例では先端部が径方向に膨出した鍔部5sを構成
するピン本体5’を用いる。即ち、本例では、ピン本体
5’の先端部が釘頭状となったものを用いる。なお、実
施例4と同様に不濡れ板B上に塗布した高温半田ペース
ト6aで高温半田球6を形成してもよいが、本例では、
図5(f)に示すように、ピン本体5’の先端の鍔部5s
に図示しない半田フラックスで高温半田ボール6’を粘
着させ、その後高温半田ボール6’を溶融させて鍔部5
sの先端側に溶着させる例を示す。これにより、図5
(c)(破線部をのぞく)と同様にピン本体5’先端部に
高温半田球6を形成することができる。
(Embodiment 5) In Embodiment 4 described above, a pin body 5 'having a flange 5s near the front end is used. In this embodiment, the flange 5s whose front end bulges in the radial direction is used. The constituent pin body 5 'is used. That is, in this example, a pin body 5 'having a tip end shaped like a nail head is used. The high-temperature solder balls 6 may be formed with the high-temperature solder paste 6a applied on the non-wetting plate B as in the fourth embodiment.
As shown in FIG. 5 (f), a flange 5s at the tip of the pin body 5 '
The high-temperature solder ball 6 'is adhered with a solder flux not shown in FIG.
An example of welding on the tip side of s is shown. As a result, FIG.
As in (c) (except for the broken line), the high-temperature solder ball 6 can be formed at the tip of the pin body 5 '.

【0058】(実施例6)上記実施例1〜5において
は、ピン本体5、5’の先端に高温半田球6を形成し
て、ピン先端に径大部を設けた例を示した。本実施例に
おいては、図5(g)に示すように、ピン本体5”の先端
自身を球状の径大部5tとしたものを用い、実施例1と
同様に、配線基板本体1に銀ロウ付けした後、ニッケル
メッキ、金メッキを施す。ただし、実施例1と異なりレ
ジストRで露出部Sを形成したり、露出部Sを熱酸化す
ることは行わない。また、高温半田ペースト6aにより
高温半田球6を形成することも行わない。このようにす
ると、レジストRの塗布や熱酸化、あるいは高温半田ペ
ースト6aの塗布や溶融等の工程が不要であり、従来の
PGA型配線基板の製造と同様にして本例の配線基板を
製造することができる。従って、新たな設備や工程が不
要で、安価な配線基板とすることができる。本例の配線
基板によっても、径大部がピン先端に形成されているの
で、セルフアライメント効果を得ることができ、その上
ピン接続用半田との接続面積が増加するため、接続強度
も向上させることができる。なお、ピン先端部の形状
は、球状(図5(g))のほか、半球状(図5(h))、円柱
状(図5(i))等、適宜選択して用いることができる。
(Embodiment 6) In the above embodiments 1 to 5, the high temperature solder balls 6 are formed at the tips of the pin bodies 5 and 5 ', and the large diameter portion is provided at the tip of the pin. In the present embodiment, as shown in FIG. 5 (g), a pin body 5 "having a spherical tip 5t at the tip itself is used. After the plating, nickel plating and gold plating are performed, except that the exposed portion S is not formed with the resist R or the exposed portion S is thermally oxidized unlike the first embodiment. Also, the formation of the sphere 6 is not performed, so that steps such as application of the resist R, thermal oxidation, and application and melting of the high-temperature solder paste 6a are not required, and are the same as those in the manufacture of the conventional PGA type wiring board. Therefore, it is possible to manufacture the wiring board of the present embodiment without using any new facilities or processes, and to provide an inexpensive wiring board. Because the cell is formed The alignment effect can be obtained, and the connection area with the solder for pin connection increases, so that the connection strength can be improved.The shape of the pin tip is spherical (FIG. 5 (g)). In addition, a hemisphere (FIG. 5 (h)), a columnar shape (FIG. 5 (i)), or the like can be appropriately selected and used.

【0059】(実施例7)上記実施例においては、配線
基板1の上面1b上に集積回路チップ11を搭載した例
を示したが、その他、トランジスタ等の半導体素子やコ
ンデンサ、抵抗等を搭載させることもできる。更に、図
6に示すように、集積回路チップ51等の電子部品を搭
載した配線基板(上部配線基板)41とプリント配線板
60との間に介在させる中継用配線基板(中継基板)7
0に本発明を適用しても良い。本実施例の中継基板70
においては、配線基板本体(中継基板本体)71の下面
71aには、実施例1と同様にピン固着用パッド73を
介してピン77が接続されている。また、上面71bに
は、配線基板41と接続するための上部配線接続用パッ
ド79が形成され、図示しないビアまたは内部配線によ
ってピン固着用パッド73とパッド79が結線されてい
る。
(Embodiment 7) In the above embodiment, an example in which the integrated circuit chip 11 is mounted on the upper surface 1b of the wiring board 1 has been described. In addition, semiconductor elements such as transistors, capacitors, resistors and the like are mounted. You can also. Further, as shown in FIG. 6, a relay wiring board (relay board) 7 interposed between a printed circuit board 60 and a printed circuit board (upper circuit board) 41 on which electronic components such as an integrated circuit chip 51 are mounted.
The present invention may be applied to 0. Relay board 70 of this embodiment
In the embodiment, a pin 77 is connected to a lower surface 71a of a wiring board main body (relay board main body) 71 via a pin fixing pad 73 as in the first embodiment. An upper wiring connection pad 79 for connecting to the wiring board 41 is formed on the upper surface 71b, and the pin fixing pad 73 and the pad 79 are connected by a via or an internal wiring (not shown).

【0060】配線基板41は、その上面41bに形成さ
れたチップ用パッド49を介して集積回路チップ51を
フリップチップ接続によって搭載しており、その下面4
1aには、中継基板本体71の上部配線基板接続用パッ
ド79に対応した位置に中継基板接続用パッド43が形
成されている。この中継基板接続用パッド43と上部配
線基板接続用パッド79とは、高温半田(95Pb−5
Sn)45によって接続されている。また、プリント配
線板60は、実施例1で使用したのものと同様なもので
あり、上面61a上に形成された接続用パッド63とピ
ン77の先端の径大部をなす高温半田球76とが共晶半
田66で接続されている。
The wiring substrate 41 has an integrated circuit chip 51 mounted thereon by flip-chip connection via a chip pad 49 formed on the upper surface 41b.
In 1a, a relay board connection pad 43 is formed at a position corresponding to the upper wiring board connection pad 79 of the relay board main body 71. The pad 43 for connecting the relay board and the pad 79 for connecting the upper wiring board are connected to a high-temperature solder (95Pb-5).
Sn) 45. The printed wiring board 60 is the same as that used in the first embodiment, and includes a connection pad 63 formed on the upper surface 61a and a high-temperature solder ball 76 forming a large diameter portion at the tip of the pin 77. Are connected by eutectic solder 66.

【0061】例えば、プリント配線板本体61がガラス
−エポキシ樹脂複合材料等の比較的熱膨張率の大きい材
質からなり、配線基板41がアルミナ等の比較的熱膨張
率の小さいセラミック等の材質からなる場合、両者を直
接半田を介して接続すると、温度変化によって熱膨張差
を生ずる。このため、加熱と冷却を繰り返すと半田が破
断する等の不具合を起こすことがある。このような場合
に、配線基板41と同様な材質(同様な熱膨張率を持つ
材質)からなる中継基板本体71を用いた中継基板70
を両者の間に介在させると、配線基板41と中継基板本
体71との間にはほとんど熱膨張差は発生せず、中継基
板本体71とプリント配線板本体61との間の熱膨張差
は、ピン77の変形によって吸収される。従って、高い
信頼性で配線基板41とプリント配線板60とを接続す
ることができる。即ち、中継基板に本発明を適用する
と、異なる熱膨張率を有する2つの配線基板の間に中継
基板を介在させることによって、高い信頼性を得て、2
つの配線基板間の接続ができる。
For example, the printed wiring board main body 61 is made of a material having a relatively large coefficient of thermal expansion such as a glass-epoxy resin composite material, and the wiring board 41 is made of a material such as ceramics having a relatively small coefficient of thermal expansion such as alumina. In this case, if both are connected directly via solder, a difference in thermal expansion occurs due to a temperature change. For this reason, when heating and cooling are repeated, a problem such as breakage of the solder may occur. In such a case, the relay board 70 using the relay board main body 71 made of the same material as the wiring board 41 (a material having a similar coefficient of thermal expansion)
Interposed between them, there is almost no difference in thermal expansion between the wiring board 41 and the relay board main body 71, and the difference in thermal expansion between the relay board main body 71 and the printed wiring board main body 61 is It is absorbed by the deformation of the pin 77. Therefore, the wiring board 41 and the printed wiring board 60 can be connected with high reliability. That is, when the present invention is applied to a relay board, a high reliability is obtained by interposing the relay board between two wiring boards having different coefficients of thermal expansion.
Connection between two wiring boards.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の配線基板を示す縦断面図である。FIG. 1 is a longitudinal sectional view showing a wiring board of the present invention.

【図2】集積回路チップを接続した本発明の配線基板
を、他の配線基板に接続する様子を示す説明図である。
FIG. 2 is an explanatory diagram showing a state in which a wiring board of the present invention to which an integrated circuit chip is connected is connected to another wiring board.

【図3】集積回路チップを接続した本発明の配線基板
を、他の配線基板に接続した状態を示す説明図である。
FIG. 3 is an explanatory view showing a state in which a wiring board of the present invention to which an integrated circuit chip is connected is connected to another wiring board;

【図4】実施例1にかかる配線基板において、ピン近傍
の部分の製造工程を示す説明図である。
FIG. 4 is an explanatory diagram illustrating a manufacturing process of a portion near a pin in the wiring board according to the first embodiment;

【図5】実施例2〜6にかかる配線基板のピン状態およ
び製造方法を示す説明図である。
FIG. 5 is an explanatory diagram illustrating a pin state and a manufacturing method of a wiring board according to Examples 2 to 6;

【図6】実施例7にかかり、本発明の配線基板を中継基
板として用いて、集積回路チップを搭載した配線基板と
プリント板とを接続した状態を示す説明図である。
FIG. 6 is an explanatory diagram showing a state where a wiring board on which an integrated circuit chip is mounted and a printed board are connected using the wiring board of the present invention as a relay board according to the seventh embodiment.

【図7】従来のバットジョイントPGA型配線基板を他
の配線基板に接続する様子を示す説明図である。
FIG. 7 is an explanatory view showing how a conventional butt joint PGA type wiring board is connected to another wiring board.

【図8】従来のバットジョイントPGA型配線基板を他
の配線基板に接続した状態を示す説明図である。
FIG. 8 is an explanatory view showing a state in which a conventional butt joint PGA type wiring board is connected to another wiring board.

【図9】従来のバットジョイントPGA型配線基板が他
の配線基板に対してずれた状態で接続された様子を示す
説明図である。
FIG. 9 is an explanatory view showing a state in which a conventional butt joint PGA type wiring board is connected to another wiring board in a shifted state.

【符号の説明】[Explanation of symbols]

1 多層配線基板本体 3 ピン固着用パッド 5、5’、5” ピン本体 6 高温半田球(径大部) 5t 径大部 7 ピン 8 銀ロウ 9 チップ接続用パッド 10 配線基板 11 集積回路チップ 13 チップパッド 20 プリント配線板 21 プリント配線板本体 23 接続用パッド 26 ピン接続用半田(共晶半田) DESCRIPTION OF SYMBOLS 1 Multilayer wiring board main body 3 Pin fixing pad 5, 5 ', 5 "pin main body 6 High-temperature solder ball (large diameter part) 5t Large diameter part 7 pin 8 Silver solder 9 Chip connection pad 10 Wiring board 11 Integrated circuit chip 13 Chip pad 20 Printed wiring board 21 Printed wiring board main body 23 Connection pad 26 Pin connection solder (eutectic solder)

Claims (13)

【特許請求の範囲】[Claims] 【請求項1】 少なくとも1つの主面を有する配線基板
本体と該主面から突設された多数のピンとを有し、該ピ
ンの先端を他の配線基板に形成された接続用パッドに突
き当てつつピン接続用半田を用いて半田付けして他の配
線基板と接続するための配線基板であって、 上記ピンは、その先端に上記ピン接続用半田の半田付け
時に溶融しない材質からなる径大部を備えることを特徴
とする配線基板。
1. A wiring board main body having at least one main surface and a number of pins projecting from the main surface, and the tips of the pins abut against connection pads formed on another wiring substrate. A wiring board for connecting to another wiring board by soldering while using a pin connection solder, wherein the pin has a large diameter made of a material that does not melt at the tip thereof when the pin connection solder is soldered. A wiring board, comprising a part.
【請求項2】 前記径大部は、前記ピン接続用半田より
も融点の高い半田からなることを特徴とする請求項1に
記載の配線基板。
2. The wiring board according to claim 1, wherein the large-diameter portion is made of solder having a melting point higher than that of the pin connection solder.
【請求項3】 前記ピンのうちピン先端の径大部に隣接
して半田流れ防止部を形成してなる請求項2に記載の配
線基板。
3. The wiring board according to claim 2, wherein a solder flow preventing portion is formed adjacent to a large-diameter portion at the tip of the pin.
【請求項4】 前記半田流れ防止部として、前記ピン先
端の径大部に隣接するピン周面を、半田不濡れ面として
なることを特徴とする請求項3に記載の配線基板。
4. The wiring board according to claim 3, wherein, as the solder flow preventing portion, a pin peripheral surface adjacent to a large-diameter portion at the tip of the pin serves as a solder non-wetting surface.
【請求項5】 前記半田流れ防止部として、前記ピン先
端の径大部に隣接するピン周面に、半田不濡れ材を形成
してなることを特徴とする請求項3に記載の配線基板。
5. The wiring board according to claim 3, wherein the solder flow preventing portion is formed by forming a solder non-wetting material on a peripheral surface of the pin adjacent to a large diameter portion at the tip of the pin.
【請求項6】 前記半田流れ防止部として、前記ピン先
端の径大部に隣接して、ピン本体の材質からなる鍔部を
備えることを特徴とする請求項3に記載の配線基板。
6. The wiring board according to claim 3, further comprising a flange portion made of a material of a pin body, adjacent to the large diameter portion at the tip of the pin, as the solder flow preventing portion.
【請求項7】 前記ピンは、ピン本体自身の先端が径大
とされたピンであることを特徴とする請求項1に記載の
配線基板。
7. The wiring board according to claim 1, wherein the pin is a pin whose tip has a large diameter.
【請求項8】 前記ピンの径大部の最大径は、該ピンと
接続するために前記他の配線基板に形成された接続パッ
ドの径の0.7〜1.4倍の大きさにされていることを
特徴とする請求項1〜7のいずれかに記載の配線基板。
8. The maximum diameter of the large diameter portion of the pin is set to be 0.7 to 1.4 times the diameter of a connection pad formed on the another wiring board for connection with the pin. The wiring board according to any one of claims 1 to 7, wherein
【請求項9】 少なくとも1つの主面を有する配線基板
本体と該主面から突設された多数のピンとを有し、該ピ
ンの先端にピン接続用半田の半田付け時に溶融しない材
質からなる径大部を備える配線基板の製造方法であっ
て、上記ピン接続用半田よりも融点の高い半田を溶着し
て上記ピンの先端に径大部を形成する工程を有すること
を特徴とする配線基板の製造方法。
9. A wiring board body having at least one main surface and a number of pins protruding from the main surface, the diameter of which is made of a material that does not melt when soldering a pin connection solder to a tip of the pin. A method of manufacturing a wiring board comprising a large part, comprising a step of forming a large diameter part at the tip of the pin by welding a solder having a higher melting point than the solder for pin connection. Production method.
【請求項10】 前記半田を溶着して径大部を形成する
工程の前に、前記ピン先端の径大部に隣接するピン周面
に、半田不濡れ面を形成する工程を有することを特徴と
する請求項9に記載の配線基板の製造方法。
10. The method according to claim 1, further comprising, before the step of forming the large diameter portion by welding the solder, forming a solder non-wetting surface on a peripheral surface of the pin adjacent to the large diameter portion at the tip of the pin. The method for manufacturing a wiring board according to claim 9.
【請求項11】 前記半田を溶着して径大部を形成する
工程の前に、前記ピン先端の径大部に隣接するピン周面
に、半田不濡れ材を形成して工程を有することを特徴と
する請求項9に記載の配線基板の製造方法。
11. A method for forming a non-wetting material on a peripheral surface of a pin adjacent to a large-diameter portion at the tip of the pin before the step of forming a large-diameter portion by welding the solder. The method for manufacturing a wiring board according to claim 9.
【請求項12】 前記半田を溶着して径大部を形成する
工程の前に、先端または先端近傍に鍔部を有するピン本
体を前記配線基板本体の主面に突設する工程を有するこ
とを特徴とする請求項9に記載の配線基板の製造方法。
12. The method according to claim 12, further comprising, before the step of forming the large-diameter portion by welding the solder, a step of projecting a pin body having a flange at or near the tip from the main surface of the wiring board body. The method for manufacturing a wiring board according to claim 9.
【請求項13】 少なくとも1つの主面を有する配線基
板本体と該主面から突設されその先端にピン接続用半田
の半田付け時に溶融しない材質からなる径大部を備えた
多数のピンとを有する配線基板と、他の配線基板とを、
上記ピンの先端を該他の配線基板に形成した接続用パッ
ドに突き当てつつ上記ピン接続用半田を用いて接続する
接続体の製造方法。
13. A wiring board body having at least one main surface, and a plurality of pins protruding from the main surface and having a large-diameter portion made of a material that does not melt at the end of the wiring substrate when soldering the pin connection solder. Wiring board and other wiring board,
A method of manufacturing a connector, wherein the pins are connected by using the pin connection solder while abutting the tips of the pins against connection pads formed on the other wiring board.
JP19698197A 1997-07-23 1997-07-23 Wiring board, method of manufacturing wiring board, and method of manufacturing connector Expired - Fee Related JP3088092B2 (en)

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WO2006115204A1 (en) * 2005-04-22 2006-11-02 Hamamatsu Photonics K.K. Photodetection unit, photodetector, and x-ray computed tomography apparatus
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KR100328463B1 (en) * 2000-02-28 2002-03-16 이상환 Method of repairing rambus memories and solder film for bga
JP2002100848A (en) * 2000-09-22 2002-04-05 Toshiba Corp Ceramic circuit board with terminal
WO2006115204A1 (en) * 2005-04-22 2006-11-02 Hamamatsu Photonics K.K. Photodetection unit, photodetector, and x-ray computed tomography apparatus
US7783000B2 (en) 2005-04-22 2010-08-24 Hamamatsu Photonics K.K. Photodetection unit, photodetector, and x-ray computed tomography apparatus
US8000437B2 (en) 2005-04-22 2011-08-16 Hamamatsu Photonics K.K. Photodetection unit, photodetector, and x-ray computed tomography apparatus
JP2011151180A (en) * 2010-01-21 2011-08-04 Shinko Electric Ind Co Ltd Wiring board with lead pin
WO2014203798A1 (en) * 2013-06-19 2014-12-24 富士電機株式会社 Semiconductor device
JPWO2014203798A1 (en) * 2013-06-19 2017-02-23 富士電機株式会社 Semiconductor device
US9991220B2 (en) 2013-06-19 2018-06-05 Fuji Electric Co., Ltd. Semiconductor device
JP2019160851A (en) * 2018-03-08 2019-09-19 日本特殊陶業株式会社 Wiring board and manufacturing method thereof

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