JPH11337492A - Lcd inspecting apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To enhance inspection accuracy and operation efficiency by providing an LCD inspecting apparatus capable of preventing the fluctuations in defect limit level due to the deterioration and damage of a defect limit sample and unnecessary for mounting the defect limit sample on the apparatus at each time when the defect limit sample is confirmed. SOLUTION: An imaging means 31 taking the display image of the LCD panel 23 on a stage 25 is provided and an operation part for operating monitor display image on the basis of the imaging data from the imaging means 31 is provided. A monitor 35 displaying an image on the basis of the monitor display data from the operation part is provided and a memory means storing the monitor display data is provided. A first changeover means for changing over the sending destination of the operation part to either one of the monitor 35 and the memory means and a second changeover means changing over the sending destination of the monitor display data to the monitor 35 to either one of the operation part and the memory means is provided and a changeover data input means 37 changing over the first and second changeover means is provided.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

TECHNICAL FIELD The present invention relates to a product (Liquid Cry
The present invention relates to an LCD inspection apparatus used for a sensory inspection in which an operator visually compares a stal display (LCD) with a defect limit sample for selection.

[0002]

2. Description of the Related Art One of image quality inspection methods for LCD panels is as follows.
There is a sensory inspection method in which an operator visually compares a defect limit sample with an LCD inspection object (inspection object) as a product and performs selection. In this sensory inspection method, an LCD inspection device is used.

As shown in FIG. 3, a conventional LCD inspection apparatus 1 has a transparent stage 5 on which an object 3 is placed and set.
And an LC for driving the test object 3 set on the stage 5
A D driving device 7, a backlight 9 arranged on the lower surface side of the stage 5 to irradiate the inspection object 3 with transmitted light,
Imaging means (CCD camera) for photographing the image displayed on the screen
And a monitor 13 for displaying an image captured by the CCD camera 11 as main components.

Further, as a defect limit sample, an actual LCD panel (actual product) generated due to production variations is used.

[0005] As an inspection procedure, first, an operator sets a defect limit sample to be checked on the stage 5 before starting the inspection work or during the inspection. A drive signal is sent from the LCD drive device 7 to display an image on the defect limit sample. A display image of the defect limit sample is photographed by the CCD camera 11 and displayed on the monitor 13. The operator visually recognizes and recognizes the defect limit level of the defect limit sample displayed on the monitor 13. When the confirmation and recognition are completed, the defect limit sample is removed from the stage 5. Subsequently, the test object 3 is set on the stage 5 and the same image displayed on the defect limit sample is displayed by the LCD driving device 7. The operator visually checks the image displayed on the inspection object 3 with the monitor 13, compares the image with the previously recognized defect limit level, and sorts the inspection object 3.

[0006] The defect limit sample serves as a standard for determining the image quality of the LCD. For each type of defect (stain, unevenness, streak, pixel defect, etc.) that occurs due to variations in production, one type of product is used. More than one. As shown in FIG. 4, in the defect limit sample, a limit level L which causes a problem in image quality is determined from among variations in production quality, and an LCD panel of that level is used.

[0007]

However, in the above-described inspection method, since the defect limit sample as an actual product is used for a long period of time, the defect limit sample may be deteriorated or damaged. If the defect limit sample is deteriorated or damaged, it is necessary to search for a new defect limit sample of the same level as before, but since the sample decision is made visually by the inspector, exactly the same defect limit sample as before is required. It was difficult to find. For this reason, an error G (see FIG. 4) appears in the defect level.
Was likely to occur. In addition, each time a defect limit sample is checked for the comparison judgment, the defect limit sample must be set on the stage. In addition to being a factor that causes breakage and the like, it is also a factor that reduces the workability of the inspection. The present invention has been made in view of the above circumstances, and it is possible to prevent the deterioration of the defect limit sample and the fluctuation of the defect limit level due to breakage, and it is not necessary to attach the defect limit sample to the apparatus every time the defect limit sample is confirmed. It is an object of the present invention to provide an LCD inspection apparatus to improve inspection accuracy and work efficiency.

[0008]

In order to achieve the above object, an LCD inspection apparatus according to the present invention comprises: an image pickup means for picking up a display image of an LCD panel arranged on a stage; and an image pickup means for picking up an image from the image pickup means. A computing unit that computes monitor display information based on the information; a monitor that displays a display image on an LCD panel based on the monitor display information from the computing unit; a storage unit that stores the monitor display information; First switching means for switching the destination of the monitor display information to either the monitor or the storage means,
Second switching means for switching the source of the monitor display information to the monitor to one of the arithmetic unit and the storage means, and switching for switching between the first switching means and the second switching means. Switching information input means for inputting information.

In this LCD inspection apparatus, when inspecting an LCD panel as an object to be inspected, the imaging information from the imaging means is converted into monitor display information by an arithmetic unit and sent to a monitor. Thereby, the display image of the test object on the stage is displayed on the monitor. The operator performs a selection by visually checking the display image displayed on the monitor. on the other hand,
When a comparison with the defect limit sample becomes necessary, the first switching unit and the second switching unit are switched by the switching information input unit. Thereby, the desired defect limit sample stored in the storage means is output to the monitor. The operator observes the defect limit sample displayed on the monitor, recognizes the defect limit level, and determines the quality of the inspection object.

[0010]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred embodiments of an LCD inspection apparatus according to the present invention will be described below in detail with reference to the drawings. FIG. 1 is a block diagram showing a schematic configuration of an LCD inspection apparatus according to the present invention, and FIG. 2 is a block diagram showing a main configuration of the computer shown in FIG.

The LCD inspection apparatus 21 according to the present embodiment comprises:
A transparent stage 25 on which an LCD panel 23 as a sample to be inspected or a defect limit sample is placed and set;
LCD driving device 2 that drives test object 23 set in
7 and an LCD panel 2 disposed on the lower side of the stage 25.
3, a backlight 29 for irradiating transmitted light, an imaging means (CCD camera) 31 for photographing an image displayed on the LCD panel 23, an LCD driving device 27, a CCD camera 31
And a control device (for example, a computer) 33 for transmitting and receiving information signals to and from these, and a monitor 35 and switching information input means (for example, a mouse) 37 connected to the computer 33 as main components. It has as.

As shown in FIG. 2, the computer 33 comprises:
A calculating unit 39 for calculating monitor display information based on image pickup information from the CCD camera 31; a storage unit (for example, a hard disk) 41 for storing the monitor display information; A first switching unit 43 for switching to either one of them, and a second switching unit 45 for switching the source of the monitor display information to the monitor 35 to either the computing unit 39 or the storage unit 41 are provided.

The first switching means 43 and the second switching means 45
The switching operation can be performed by the above-described mouse 37 connected to the computer 33.

The LCD driving device 27 has a pattern generator and a timing generator. When receiving the drive command from the computer 33, the LCD drive device 27 drives the LCD panel 23 via the pattern generator and the timing generator. The LCD panel 23 has an arbitrary video pattern (full screen black, gray, red,
Green or blue). As a result, the light from the backlight 29 is transmitted or blocked by the LCD panel 23, and a desired image is displayed on the LCD panel 23.

The LCD inspection apparatus 21 constructed as described above
The procedure for creating a data file of a defect limit sample will be described. To create a data file of a defect limit sample, first, an LCD serving as a defect limit sample
The panel 23 is set and a predetermined image is displayed. The display of the predetermined image is performed by sending a display instruction of the predetermined image from the computer 33 to the LCD driving device 27.

Next, a display image displayed on the LCD panel 23, which is a defect limit sample, is photographed by the CCD camera 31. The computer 33 is operated by the arithmetic unit 39.
Based on the imaging information from the CCD camera 31, monitor display information is calculated. At this time, the first switching unit 43 is set so that the destination of the monitor display information is the storage unit 41 side (the y side in FIG. 2).

Therefore, the imaging information obtained by imaging the defect limit sample is stored in the storage means 41 as monitor display information. The monitor display information includes information search names (for example, file names A, B,
C,...).

Next, the procedure of the inspection method using the LCD inspection apparatus 21 in which the defect limit sample is converted into a data file and stored will be described. Usually the product LC
When inspecting the D panel 23, both the first switching means 43 and the second switching means 45 are set to the x side. That is, CCD
The imaging information from the camera 31 is converted into monitor display information by the arithmetic section 39 and sent to the monitor 35. As a result, the LCD panel 23 as the object to be inspected on the stage 25 is
Is displayed on the monitor 35. The operator visually checks the display image displayed on the monitor 35 and performs sorting.

When the display image of the inspection object is displayed on the monitor 35 and the comparison with the defect limit sample becomes necessary, the second switching means 45 is switched to the y side by operating the mouse 37. Thus, the desired defect limit sample stored in the storage unit 41 is output to the monitor 35. The operation of selecting a desired defect limit sample can be performed by, for example, selecting a desired defect limit sample from a list of defect limit samples displayed on the display device 33a of the computer 33.

The operator visually observes the defect limit sample displayed on the monitor 35, recognizes the defect limit level, and judges the quality of the inspection object.

As described above, the above-described LCD inspection apparatus 21
Stores the defect limit sample in the storage unit 41 of the computer 33.
Then, it was stored as image data. As a result, deterioration and breakage due to long-term use of the actual product are eliminated, and determination using the same defect limit sample can be made semipermanently.

Further, unlike the conventional case where the LCD inspection apparatus 21 stores a defect limit sample as an actual product, the LCD inspection apparatus 21 stores information on the defect limit sample in a data file. This eliminates the need for the operator to move the defect limit sample into and out of the storage location during the operation. In addition, by operating the computer 33,
A defect limit sample can be displayed on the monitor 35.
As a result, the work efficiency of the inspection can be greatly improved.

Further, since the defect limit sample is converted into signal information, by transferring this signal information via a communication line or the like, the same defect limit sample can be easily and instantly shared even in a remote place. Will be able to

In the above embodiment, the operation unit 39,
The first switching means 43, the first switching means 43
3, the LCD inspection apparatus according to the present invention does not use the computer 33,
Each of these components may be configured as a single device.

[0025]

As described in detail above, the LCD inspection apparatus according to the present invention comprises an image pickup means for picking up a display image on an LCD panel, and a calculation section for calculating monitor display information based on image pickup information from the image pickup means. And a monitor for displaying a display image on the LCD panel based on the monitor display information, and a storage unit for storing the monitor display information as main components.
The defect limit sample was stored as image data in the storage means. As a result, deterioration and damage due to use of the actual product are eliminated. As a result, the standard of the defect limit sample does not change, the accuracy of the selection standard is improved, and the product quality can be stabilized. Further, since the information of the defect limit sample is stored in the form of a data file, there is no need to insert and remove the defect limit sample, and the defect limit sample can be easily displayed on the monitor. As a result, the work efficiency of the inspection can be greatly improved.

[Brief description of the drawings]

FIG. 1 is a block diagram showing a schematic configuration of an LCD inspection device according to the present invention.

FIG. 2 is a block diagram illustrating a main configuration of the computer illustrated in FIG. 1;

FIG. 3 is a block diagram showing a schematic configuration of a conventional LCD inspection apparatus.

FIG. 4 is an explanatory diagram showing an error range of a defect limit sample.

[Explanation of symbols]

21 LCD inspection apparatus, 23 LCD panel, 25 stage, 31 CCD camera (imaging means), 35 monitor, 37 mouse (switching information input means), 39 arithmetic unit, 41 storage means, 43 First switching means, 45 ... second switching means

Claims (1)

[Claims] 1. An image pickup means for photographing a display image of an LCD panel arranged on a stage, a calculation unit for calculating monitor display information based on image pickup information from the image pickup means, and a monitor unit for calculating monitor display information from the calculation unit. A monitor for displaying a display image on an LCD panel based on the information; a storage unit for storing the monitor display information; and a first unit for switching a destination of the monitor display information from the arithmetic unit to either the monitor or the storage unit. Switching means; second switching means for switching the source of the monitor display information to the monitor to one of the arithmetic unit or the storage means; and switching operation between the first switching means and the second switching means. And a switching information input means for inputting switching information for causing the LCD to be inspected.