JP2006194657A - Pseudo defective image creation method and device using it - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a pseudo defective image creation method capable of extracting easily a part having a brightness difference, and a device using it. <P>SOLUTION: This pseudo defective image creation method for creating simultatively a limit sample used for a defect inspection device for extracting a brightness irregular defect in an image device and determining its quality is described as follows; a brightness value of each pixel in a brightness irregular defect part is calculated and substituted by using a brightness value of a surrounding pixel not in the brightness irregular defect part, based on existing image data; a brightness value of one pixel in the brightness irregular defect part is calculated and substituted by using a brightness value of its peripheral pixel, to thereby determine a brightness irregularity removal image; a brightness irregularity removal part is subtracted from the existing image data to determine the brightness difference; a processing treatment is applied to the brightness difference; and the brightness difference subjected to the processing treatment is stuck successively onto an optional image, to thereby create the pseudo defective image. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to a pseudo defect image creation method for artificially creating a limit sample used in a defect inspection apparatus that extracts a nonuniformity defect of a brightness of an image device and judges pass / fail, and an apparatus using the pseudo defect image creation method. The present invention relates to a pseudo defect image generation method and an apparatus using the same.

  In imaging devices such as display devices such as liquid crystal displays, CCD (Charge-Coupled Devices) image sensors, and CMOS (Complementary Metal-Oxide Semiconductor) image sensors, material non-uniformity that occurs in the manufacturing process. Local brightness unevenness defects occur due to scratches, dirt, etc., and an image device having the brightness unevenness defect exceeding a certain limit is excluded as a defective product.

  For this reason, an inspection apparatus is operating that extracts the luminance unevenness defect by calculating the image data of the image device and determines whether the image device is necessary. Prior art documents related to conventional image device inspection apparatuses and the like include the following.

Japanese Patent Laid-Open No. 06-201516 Japanese Unexamined Patent Publication No. 07-098574 JP-A-10-148619 Japanese Patent Laid-Open No. 11-183321 JP 2000-215310 A JP 2001-305075 A

  FIG. 11 is a configuration block diagram showing an example of such a conventional image device inspection apparatus. In FIG. 11, 1 is an image capturing means such as a camera, 2 is an image acquiring means for acquiring and storing image data from the image capturing means 1, 3 is an arithmetic control means such as a CPU (Central Processing Unit), and 4 is a CRT (Cathode). Display means such as a ray tube (LCD) or LCD (Liquid Crystal Display), 5 is a pattern generating means for generating an inspection pattern, and 6 is an image device such as a liquid crystal display to be inspected.

  The image data that is the output of the image capturing means 1 is connected to the image acquisition means 2, and the output of the image acquisition means 2 is connected to the calculation control means 3. A display signal and a control signal from the arithmetic control unit 4 are connected to the display unit 4 and the pattern generation unit 5, respectively, and an output of the pattern generation unit 5 is connected to the image device 6.

  Here, the operation of the conventional example shown in FIG. 11 will be briefly described. The arithmetic control unit 3 controls the pattern generating unit 5 to generate an inspection pattern and display the generated inspection pattern on the image device 6.

  On the other hand, the image capturing unit 1 captures the inspection pattern displayed on the image device 6 and outputs the captured image data to the image acquisition unit 2. The image acquisition means 2 accumulates the input image data and outputs it to the arithmetic control means 3.

  The arithmetic control means 3 performs processing such as filtering processing and labeling processing on the acquired image data, and then compares it with a limit sample of luminance unevenness defect (at the boundary between the non-defective product level and the defective product level). Then, the quality of the image device 6 to be inspected is judged and the judgment result is appropriately displayed on the display means 4.

  However, the luminance unevenness defect generated in the image device 6 has various conditions such as the size, shape, position, and background, and such various luminance unevenness defects are accurately detected by an inspection apparatus as shown in FIG. In order to achieve this, it is necessary to collect a large number of brightness unevenness defect limit samples and set them in the inspection device. However, collecting the brightness unevenness defect limit samples is very complicated, and the actual brightness unevenness defect has occurred. Often, it is not sufficient to collect the limit sample.

  For this reason, based on the actually collected image data of the uneven brightness defect, the arithmetic control means 3 or the like calculates a pseudo defect image in which various conditions such as size, shape, position, and background are appropriately changed, and calculates the pseudo defect image. May be used as the limit sample of the brightness unevenness defect to compensate for the lack of the limit sample of the brightness unevenness defect.

  FIG. 12 is a flowchart for explaining a method for generating such a pseudo defect image. In “S001” in FIG. 12, the arithmetic control means 3 determines whether or not a pseudo defect image is to be created. If it is determined that a pseudo defect image is to be generated, the arithmetic control means in “S002” in FIG. 3 indicates a luminance unevenness defect portion of the existing image data stored in the image acquisition means 2 or the like (not necessarily limited samples, which may be non-defective samples or defective samples). A designated screen is displayed on the display means 4.

  When the luminance unevenness defect portion is designated by the user's operation, the calculation control means 3 cuts out the luminance unevenness defect portion in “S003” in FIG. 12 and the calculation control means 3 cuts out the luminance in “S004” in FIG. A pseudo defect image is generated by pasting a nonuniformity defect portion on an arbitrary image.

  However, in the conventional method for generating a pseudo defect image as shown in FIG. 12, when a luminance unevenness defect portion is simply cut out from existing image data, it becomes an absolute value of luminance, not a luminance difference, and includes a background portion. Therefore, there is a problem that the boundary becomes discontinuous when pasted on an arbitrary image as it is.

  For example, FIG. 13 is an explanatory view showing the relationship between image data and pixel information for explaining the situation of such a defect, and a pseudo defect image based on existing image data as shown by “PD01” in FIG. When the pixel information of one column on the line indicated by “LN01” in FIG. 13 is graphed, a characteristic curve as indicated by “CH01” in FIG. 13 is obtained.

  When the region indicated by “RG01” in FIG. 13 is designated as a luminance unevenness defect portion, it is cut out as indicated by “CH02” in FIG. 13, in other words, the background portion indicated by “BG01” in FIG. Since it is cut out at the same time, the cut-out luminance unevenness defective portion indicated by “CH02” in FIG. 13 includes a background portion indicated by “BG02” in FIG. For this reason, if the absolute value of the luminance is pasted on an arbitrary image as it is, the boundary becomes discontinuous.

On the other hand, as a method of cutting out only the luminance difference portion instead of the absolute value of the luminance in this way, an image in which the luminance unevenness defect is eliminated by the smoothing filter processing is generated, and the image subjected to the filtering processing from the original image data is generated. Although it is possible to subtract, there is a problem that it is generally not easy to design a smoothing filter that eliminates the uneven brightness defect.
Therefore, the problem to be solved by the present invention is to realize a pseudo defect image creation method and an apparatus using the same, which can easily extract a luminance difference portion.

In order to achieve such a problem, the invention according to claim 1 of the present invention is:
A pseudo-defect image creation method for pseudo-creating a limit sample used in a defect inspection apparatus that extracts a luminance unevenness defect of an image device and determines whether it is good or bad,
Based on the existing image data, the luminance value of each pixel of the luminance unevenness defect portion is calculated and replaced using the luminance value of the pixel that is not the surrounding luminance unevenness defect portion, and the luminance value of one pixel of the luminance unevenness defect portion is replaced. A luminance unevenness-removed image is obtained by calculating and replacing using the luminance values of surrounding pixels, and a luminance difference is obtained by subtracting the luminance unevenness-removed portion from the existing image data, and the luminance difference is processed. By performing the processing and generating the pseudo defect image by sequentially pasting the processed luminance difference to an arbitrary image, it is possible to compensate for the lack of the limit sample of the luminance unevenness defect.

The invention according to claim 2
A pseudo-defect image creation method for pseudo-creating a limit sample used in a defect inspection apparatus that extracts a luminance unevenness defect of an image device and determines whether it is good or bad,
Based on the existing image data, the luminance value of each pixel of the luminance unevenness defect portion is calculated and replaced using the luminance value of the pixel that is not the surrounding luminance unevenness defect portion, and the luminance value of one pixel of the luminance unevenness defect portion is replaced. A luminance unevenness-removed image is obtained by substituting with the average value of the luminance values of surrounding pixels, a luminance difference is obtained by subtracting the luminance unevenness-removed portion from the existing image data, and a processing process is performed on the luminance difference. By generating the pseudo defect image by sequentially pasting the processed and processed luminance difference to an arbitrary image, it is possible to compensate for the lack of the limit sample of the luminance unevenness defect.

The invention described in claim 3
A pseudo defect image creating method according to claim 1 or claim 2,
The luminance value of one pixel of the luminance unevenness defect portion,
((βZr + αZl) / (α + β) + (γZt + δZb) / (δ + γ))
Distance to the pixel that is not the right luminance unevenness defect part: α
The distance to the pixel that is not the left luminance unevenness defect part: β
Distance to the pixel that is not the lower luminance unevenness defective part: γ
Distance to the pixel that is not the upper luminance unevenness defect portion: δ
Luminance value of a pixel not on the right side of the luminance unevenness defect portion: Zr
Luminance value of a pixel that is not a left luminance unevenness defect portion: Zl
Luminance value of a pixel that is not a lower luminance unevenness defect portion: Zt
Luminance value of a pixel that is not the upper luminance unevenness defect portion: Zb
By substituting and calculating in step (2), it is possible to compensate for the lack of the limit sample of the luminance unevenness defect.

The invention according to claim 4
In a pseudo defect image creation device that artificially creates a limit sample used in a defect inspection device that extracts a luminance unevenness defect of an image device and determines whether it is good or bad,
The storage means for storing the existing image data, the input means for designating the luminance unevenness defect portion, the luminance value of each pixel of the luminance unevenness defect portion designated based on the existing image data, Calculates and replaces the brightness value of a pixel that is not a luminance unevenness defect portion, and calculates and replaces the brightness value of one pixel of the brightness unevenness defect portion using the brightness value of surrounding pixels. And subtracting the luminance unevenness removal portion from the existing image data to obtain a luminance difference, performing a processing process on the luminance difference, and sequentially pasting the processed luminance difference on an arbitrary image And a display means for displaying a screen for designating the luminance unevenness defect part under the control of the arithmetic control means. It is possible to compensate for.

The invention according to claim 5
In a pseudo defect image creation device that artificially creates a limit sample used in a defect inspection device that extracts a luminance unevenness defect of an image device and determines whether it is good or bad,
The storage means for storing the existing image data, the input means for designating the luminance unevenness defect portion, the luminance value of each pixel of the luminance unevenness defect portion designated based on the existing image data, Calculate and replace using the brightness value of the pixel that is not the uneven brightness defect part, and replace the brightness value of one pixel of the uneven brightness defect part with the average value of the brightness values of the surrounding pixels to obtain the uneven brightness removal image. , Subtracting the luminance unevenness removal portion from the existing image data to obtain a luminance difference, performing processing on the luminance difference, and sequentially pasting the processed luminance difference to an arbitrary image Computation control means for generating a defect image, and display means for displaying a screen for designating the luminance unevenness defect portion under the control of the arithmetic control means are provided to compensate for the lack of the limit sample of the brightness unevenness defect. It is possible.

The invention described in claim 6
A pseudo defect image creating method according to claim 4 or claim 5,
The arithmetic control means is
The luminance value of one pixel of the luminance unevenness defect portion,
((βZr + αZl) / (α + β) + (γZt + δZb) / (δ + γ))
Distance to the pixel that is not the right luminance unevenness defect part: α
The distance to the pixel that is not the left luminance unevenness defect part: β
Distance to the pixel that is not the lower luminance unevenness defective part: γ
Distance to the pixel that is not the upper luminance unevenness defect portion: δ
Luminance value of a pixel not on the right side of the luminance unevenness defect portion: Zr
Luminance value of a pixel that is not a left luminance unevenness defect portion: Zl
Luminance value of a pixel that is not a lower luminance unevenness defect portion: Zt
Luminance value of a pixel that is not the upper luminance unevenness defect portion: Zb
By substituting and calculating in step (2), it is possible to compensate for the lack of the limit sample of the luminance unevenness defect.

The invention described in claim 7
A pseudo defect image creating method according to claim 4 or claim 5,
The storage means
By using a hard disk, a RAM, or a flash memory, it is possible to make up for a shortage of limit samples of luminance unevenness defects.

The invention described in claim 8
A pseudo defect image creating method according to claim 4 or claim 5,
The storage means
By using a flexible disk, a USB memory, or a memory card, it is possible to make up for a lack of limit samples of luminance unevenness defects.

The invention according to claim 9
A pseudo defect image creating method according to claim 4 or claim 5,
By applying it to an image device inspection apparatus, it is possible to easily generate pseudo defect images having different sizes, shapes, positions, backgrounds, contrasts, and the like, so that the inspection of the image device is also facilitated.

The present invention has the following effects.
According to the first, second, third, fourth, fifth, sixth and seventh and eighth aspects of the present invention, the luminance value of each pixel of the luminance unevenness defect portion is calculated based on the existing image data. A luminance unevenness-removed image is obtained by substituting the luminance value of one pixel with the average value of the luminance values of the eight neighboring pixels. The luminance difference portion can be easily extracted by subtracting from the existing image data to obtain the luminance difference (luminance unevenness defect portion not including the background portion: hereinafter, simply the luminance unevenness defect portion (luminance difference)). It becomes possible.

  Further, processing is appropriately performed on the luminance unevenness defect portion (luminance difference), and the size unevenness defect portion (luminance difference) is generated by changing the size, shape, position, background, contrast, etc., and the pseudo defect image is generated. Thus, the shortage of the limit sample of the luminance unevenness defect can be compensated.

  In addition, according to the invention of claim 9, it is applied to the inspection device for an image device, specifically, the operation control means constituting the inspection device for the image device is provided with the function of the pseudo defect image creation device. Since it is possible to easily generate pseudo-fault images having different sizes, shapes, positions, backgrounds, contrasts, and the like, it is also easy to inspect image devices.

  Hereinafter, the present invention will be described in detail with reference to the drawings. FIG. 1 is a block diagram showing the configuration of an embodiment of a pseudo defect image creating apparatus according to the present invention.

  In FIG. 1, reference numeral 7 denotes a hard disk in which existing image data is stored, storage means such as a RAM (Random Access Memory) or flash memory, 8 denotes arithmetic control means such as a CPU, 9 denotes display means such as a CRT or LCD, 10 Are input means such as a keyboard and a pointing device. Reference numerals 7, 8, 9 and 10 constitute a pseudo defect image creating apparatus 50.

  The output of the storage means 7 is connected to the calculation control means 8, and the display signal from the calculation control means 8 is connected to the display means 9. The output of the input means 10 is connected to the calculation control means 8.

  Here, the operation of the embodiment shown in FIG. 1 will be described with reference to FIGS. 2, 3, 4, 5, 6, 7, 8, 9 and 10. FIG. 2 is a flowchart for explaining the operation of the pseudo defect image creating apparatus 50, FIG. 3 is an explanatory view showing an example of a display screen displayed on the display means 9 for designating a luminance unevenness defect portion, and FIGS. 6 and 7 are explanatory diagrams showing image data in the process of image processing, FIGS. 8 and 9 are explanatory diagrams showing the process of creating a luminance unevenness-removed image, and FIG. 10 shows the relationship between image data and pixel information. It is explanatory drawing.

  In “S101” in FIG. 2, the pseudo defect image creating apparatus 50, specifically, the arithmetic control unit 8 determines whether or not to create a pseudo defect image, and if it is determined to generate a pseudo defect image. 2, the calculation control means 8 in the “S102” in FIG. 2, the existing image data stored in the storage means 7 (not necessarily limited to the limit sample, whether it is a good product sample or a defective product sample). The display unit 9 displays a screen for designating a luminance unevenness defect portion.

  For example, the arithmetic control unit 8 displays on the display unit 9 a screen for designating a luminance unevenness defect portion as indicated by “DS11” in FIG.

  More specifically, first, the arithmetic control unit 8 reads the existing image data stored in the storage unit 9 and performs image processing for enhancing the luminance unevenness defect as it is, Image data such as “PD21” in FIG. 4 or “PD31” in FIG. 5 is generated and displayed on the display means 9.

  Secondly, the arithmetic control means 8 performs a binarization process on the image data as indicated by “PD21” in FIG. 4 or “PD31” in FIG. 5, and as indicated by “PD41” in FIG. Simple image data is generated and displayed on the display means 9. Here, the binarization process is a process in which a pixel whose luminance value is greater than or equal to a threshold value is “1” and a pixel whose luminance value is less than the threshold value is “0”.

  Third, the arithmetic control unit 8 performs noise removal processing on the image data as indicated by PD41 in FIG. 6 to generate image data as indicated by “PD51” in FIG. Display.

  Here, the noise removal processing means that if there is a pixel having a value of “0” in a region where there are many pixels having a value of “1”, the value of the pixel is set to “1”. When there is a pixel having a value of “1” in an area where there are many pixels having a “0”, the value of the pixel is set to “0”.

  Then, a pixel region having a value “1” shown in “DP51” in FIG. 7 corresponds to a luminance unevenness defect portion.

  Incidentally, when various parameters such as “image processing”, “binarization processing”, and “noise removal processing” are changed, the arithmetic control means 8 performs various processing on the image data again, and FIGS. The image data (unprocessed, in the middle of processing, or image data of the final processing result) as shown in FIG.

  As described above, the user operates the display screen indicated by “DS11” in FIG. 3 using the input means 10 to change various parameters of “image processing”, “binarization processing”, and “noise removal processing”. Whether the luminance unevenness defective part is well designated by checking the re-display of the image data (unprocessed, in the middle of processing, or the image data of the final processing result) as shown in FIGS. It is possible to specify an area while interactively confirming.

  When the luminance unevenness defect portion is designated by the user's operation using the input means 10 on the screen as shown in “DS11” in FIG. 3, the arithmetic control means 8 in FIG. The brightness difference is obtained by cutting and removing the background portion.

  For example, the arithmetic control unit 8 creates a brightness unevenness-removed image from the cut-out brightness unevenness defect portion by the following procedure, and subtracts the brightness unevenness-removed image from the cut-out brightness unevenness defect portion to obtain the brightness difference.

  First, the arithmetic control means 8 calculates the luminance value of each pixel of the luminance unevenness defect portion using the luminance value of the pixel that is not the surrounding luminance unevenness defect portion.

For example, in FIG. 8, the distance to the pixel that is not the luminance unevenness defect portion on the right side of the drawing is “α”, the distance to the pixel that is not the luminance unevenness defect portion on the left side of the drawing is “β”, Is “γ”, the distance to the pixel that is not the luminance unevenness defect portion on the upper side of the drawing is “δ”, the luminance value of the pixel that is not the luminance unevenness defect portion on the right side of the drawing is “Zr”, and the pixel that is not the luminance unevenness defect portion on the left side of the drawing When the luminance value of the pixel that is not the luminance unevenness defect portion on the lower side of the drawing is “Zt” and the luminance value of the pixel that is not the luminance unevenness defect portion on the upper side of the drawing is “Zb”, The luminance value of one pixel is “Z”
Z = ((βZr + αZl) / (α + β) + (γZt + δZb) / (δ + γ)) (1)
Thus, the luminance value of each pixel in the luminance unevenness defect portion is sequentially replaced using the equation (1).

  Secondly, the arithmetic control means 8 further calculates the luminance value of each pixel as the average value of the luminance values of the surrounding eight pixels with respect to the luminance unevenness defect portion sequentially replaced using the equation (1). Replace to make it smoother.

  For example, the luminance value of one pixel of the uneven luminance defect portion indicated by “Z” in FIG. 9 is represented by “1”, “2”, “3”, “4”, “5”, “6”, “ The average value of the luminance values of the surrounding pixels as indicated by 7 "and" 8 "is replaced.

  Incidentally, since such second processing is performed for all the pixels in the luminance unevenness defect portion, the luminance values of the eight neighboring pixels also change sequentially, so that the second processing is performed. By repeating the above, the state becomes closer to equilibrium.

  Finally, the arithmetic control unit 8 subtracts the luminance unevenness-removed image obtained as described above from the cut-out luminance unevenness portion, thereby obtaining a luminance difference (brightness unevenness defect portion not including the background portion: hereinafter, simply luminance unevenness. It is expressed as a defective part (luminance difference).

  For example, when a pseudo defect image is generated based on the existing image data as indicated by “PD61” in FIG. 10, if the pixel information of one column on the line indicated by “LN61” in FIG. 10 is graphed, “CH61” in FIG. It becomes a characteristic curve as shown in.

  When the region indicated by “RG61” in FIG. 10 is designated as a luminance unevenness defect portion, it is cut out as indicated by “CH62” in FIG. 10, and from the regions indicated by “RG62” and “RG63” in FIG. Obviously, since the background portion indicated by “BG61” in FIG. 10 is removed, the luminance unevenness defect portion (luminance difference) indicated by “CH62” in FIG. Even if the defective portion (luminance difference) is pasted on an arbitrary image as it is, it is possible to prevent the boundary from becoming discontinuous.

  In “S104” in FIG. 2, the arithmetic control unit 8 appropriately performs processing such as size conversion, contrast conversion, color conversion, radian conversion, position conversion, or rotation conversion on the luminance unevenness defect portion (luminance difference). And a plurality of luminance unevenness defect portions (luminance differences) are generated by changing the size, shape, position, background, contrast, and the like.

  Finally, in “S105” in FIG. 2, the arithmetic control unit 8 generates a plurality of pseudo defect images by sequentially pasting a plurality of generated luminance unevenness defect portions (luminance differences) having different various conditions to an arbitrary image. .

  As a result, based on the existing image data, the luminance value of each pixel of the luminance unevenness defect portion is calculated and replaced using the luminance value of the pixel that is not the surrounding luminance unevenness defect portion. A luminance unevenness-removed image is obtained by replacing the luminance value of the pixel with the average value of the luminance values of the surrounding eight pixels, and subtracted from the existing image data to obtain a luminance difference (luminance unevenness defect portion not including the background portion: Hereinafter, it is possible to easily extract the luminance difference portion by simply obtaining the luminance unevenness defect portion (luminance difference).

  In addition, processing such as size conversion, contrast conversion, color conversion, radian conversion, position conversion, or rotation conversion is appropriately performed on the luminance unevenness defect portion (luminance difference), and the size, shape, position, background, By generating a brightness unevenness defect portion (brightness difference) by changing contrast or the like and generating a pseudo defect image, it is possible to compensate for a lack of limit samples of the brightness unevenness defect.

  In the embodiment shown in FIG. 1, a hard disk, a RAM, a flash memory, etc. are illustrated as the storage means 7, but removable external storage means such as a flexible disk, a USB (Universal Serial Bus) memory, a memory card, etc. Of course, it doesn't matter.

  In the embodiment shown in FIG. 1, the luminance unevenness-removed image is obtained by replacing the luminance value of one pixel of the luminance unevenness defective portion with the average value of the luminance values of the eight neighboring pixels. The number of pixels is not limited to “8”, and the number of peripheral pixels may be appropriately selected so as to be closer to equilibrium.

  In the embodiment shown in FIG. 1, the pseudo defect image creating apparatus 50 operates as a single unit. However, the pseudo defect image creating apparatus 50 is applied to an image device inspection apparatus. By providing the function of the image creating apparatus 50, it is possible to easily generate pseudo-defect images having different sizes, shapes, positions, backgrounds, contrasts, and the like, so that the inspection of the image device is also facilitated.

  Of course, the pseudo defect image creation apparatus 50 may create the pseudo defect image in a database and introduce the database into the image device inspection apparatus.

1 is a block diagram illustrating a configuration of a pseudo defect image creating apparatus according to an embodiment of the present invention. It is a flowchart explaining operation | movement of a pseudo defect image creation apparatus. It is explanatory drawing which shows an example of a display screen. It is explanatory drawing which shows the image data of the process of an image process. It is explanatory drawing which shows the image data of the process of an image process. It is explanatory drawing which shows the image data of the process of an image process. It is explanatory drawing which shows the image data of the process of an image process. It is explanatory drawing which shows the creation process of a brightness nonuniformity removal image. It is explanatory drawing which shows the creation process of a brightness nonuniformity removal image. It is explanatory drawing which shows the relationship between image data and pixel information. It is a configuration block diagram showing an example of a conventional image device inspection apparatus. It is a flowchart explaining the production | generation method of a pseudo defect image. It is explanatory drawing which shows the relationship between image data and pixel information.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Image photographing means 2 Image acquisition means 3, 8 Arithmetic control means 4, 9 Display means 5 Pattern generating means 6 Image device 7 Storage means 10 Input means 50 Pseudo defect image creation apparatus

Claims (9)

A pseudo-defect image creation method for pseudo-creating a limit sample used in a defect inspection apparatus that extracts a luminance unevenness defect of an image device and determines whether it is good or bad,
Based on the existing image data, the luminance value of each pixel of the uneven luminance defect portion is calculated and replaced using the luminance value of the pixel that is not the surrounding uneven luminance defect portion,
Calculate the brightness value of one pixel of the uneven brightness defect part using the brightness value of the surrounding pixels to obtain a brightness unevenness-removed image,
Subtract the luminance unevenness removal portion from the existing image data to obtain a luminance difference,
Processing the brightness difference,
A pseudo defect image creating method, wherein a pseudo defect image is generated by sequentially pasting the processed luminance difference to an arbitrary image. A pseudo-defect image creation method for pseudo-creating a limit sample used in a defect inspection apparatus that extracts a luminance unevenness defect of an image device and determines whether it is good or bad,
Based on the existing image data, the luminance value of each pixel of the uneven luminance defect portion is calculated and replaced using the luminance value of the pixel that is not the surrounding uneven luminance defect portion,
Replace the luminance value of one pixel of the luminance unevenness defective part with the average value of the luminance values of the surrounding pixels to obtain a luminance unevenness removed image,
Subtract the luminance unevenness removal portion from the existing image data to obtain a luminance difference,
Processing the brightness difference,
A pseudo defect image creating method, wherein a pseudo defect image is generated by sequentially pasting the processed luminance difference to an arbitrary image. The luminance value of one pixel of the luminance unevenness defect portion,
((βZr + αZl) / (α + β) + (γZt + δZb) / (δ + γ))
Distance to the pixel that is not the right luminance unevenness defect part: α
The distance to the pixel that is not the left luminance unevenness defect part: β
Distance to the pixel that is not the lower luminance unevenness defective part: γ
Distance to the pixel that is not the upper luminance unevenness defect portion: δ
Luminance value of a pixel not on the right side of the luminance unevenness defect portion: Zr
Luminance value of a pixel that is not a left luminance unevenness defect portion: Zl
Luminance value of a pixel that is not a lower luminance unevenness defect portion: Zt
Luminance value of a pixel that is not the upper luminance unevenness defect portion: Zb
The pseudo defect image creating method according to claim 1, wherein the pseudo defect image creating method calculates and replaces the calculated value. In a pseudo defect image creation device that artificially creates a limit sample used in a defect inspection device that extracts a luminance unevenness defect of an image device and determines whether it is good or bad,
Storage means for storing existing image data;
Input means for designating the uneven brightness defect portion;
The brightness value of each pixel of the brightness unevenness defect portion designated based on the existing image data is calculated and replaced using the brightness value of a pixel that is not the surrounding brightness unevenness defect portion, and The luminance value of the pixel is calculated using the luminance values of the surrounding pixels and replaced to obtain a luminance unevenness-removed image, the luminance unevenness-removed portion is subtracted from the existing image data to obtain a luminance difference, and the luminance An arithmetic control unit that performs processing on the difference and generates a pseudo defect image by sequentially pasting the processed luminance difference to an arbitrary image;
A pseudo defect image creating apparatus comprising: a display unit configured to display a screen for designating the luminance unevenness defect part under the control of the arithmetic control unit. In a pseudo defect image creation device that artificially creates a limit sample used in a defect inspection device that extracts a luminance unevenness defect of an image device and determines whether it is good or bad,
Storage means for storing existing image data;
Input means for designating the uneven brightness defect portion;
The brightness value of each pixel of the brightness unevenness defect portion designated based on the existing image data is calculated and replaced using the brightness value of a pixel that is not the surrounding brightness unevenness defect portion, and The brightness unevenness-removed image is obtained by replacing the brightness value of the pixel with the average value of the brightness values of the surrounding pixels, the brightness unevenness-removed portion is subtracted from the existing image data, and the brightness difference is obtained. An arithmetic control unit that performs processing on the image and generates a pseudo defect image by sequentially pasting the processed luminance difference to an arbitrary image;
A pseudo defect image creating apparatus comprising: a display unit configured to display a screen for designating the luminance unevenness defect part under the control of the arithmetic control unit. The arithmetic control means is
The luminance value of one pixel of the luminance unevenness defect portion,
((βZr + αZl) / (α + β) + (γZt + δZb) / (δ + γ))
Distance to the pixel that is not the right luminance unevenness defect part: α
The distance to the pixel that is not the left luminance unevenness defect part: β
Distance to the pixel that is not the lower luminance unevenness defective part: γ
Distance to the pixel that is not the upper luminance unevenness defect portion: δ
Luminance value of a pixel not on the right side of the luminance unevenness defect portion: Zr
Luminance value of a pixel that is not a left luminance unevenness defect portion: Zl
Luminance value of a pixel that is not a lower luminance unevenness defect portion: Zt
Luminance value of a pixel that is not the upper luminance unevenness defect portion: Zb
6. The pseudo defect image creating apparatus according to claim 4 or 5, wherein the pseudo defect image creating apparatus calculates and replaces the same. The storage means
6. The pseudo defect image creating apparatus according to claim 4, wherein the pseudo defect image creating apparatus is a hard disk, a RAM, or a flash memory. The storage means
6. The pseudo defect image creating apparatus according to claim 4, wherein the pseudo defect image creating apparatus is a flexible disk, a USB memory, or a memory card. 6. The pseudo defect image creating apparatus according to claim 4, wherein the pseudo defect image creating apparatus is applied to an image device inspection apparatus.