JPH11316195A5 - - Google Patents

Info

Publication number
JPH11316195A5
JPH11316195A5 JP1998120965A JP12096598A JPH11316195A5 JP H11316195 A5 JPH11316195 A5 JP H11316195A5 JP 1998120965 A JP1998120965 A JP 1998120965A JP 12096598 A JP12096598 A JP 12096598A JP H11316195 A5 JPH11316195 A5 JP H11316195A5
Authority
JP
Japan
Prior art keywords
transparent plate
defect
determining
detection device
sensor camera
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP1998120965A
Other languages
English (en)
Japanese (ja)
Other versions
JPH11316195A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP12096598A priority Critical patent/JPH11316195A/ja
Priority claimed from JP12096598A external-priority patent/JPH11316195A/ja
Publication of JPH11316195A publication Critical patent/JPH11316195A/ja
Publication of JPH11316195A5 publication Critical patent/JPH11316195A5/ja
Withdrawn legal-status Critical Current

Links

JP12096598A 1998-04-30 1998-04-30 透明板の表面欠陥検出装置 Withdrawn JPH11316195A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12096598A JPH11316195A (ja) 1998-04-30 1998-04-30 透明板の表面欠陥検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12096598A JPH11316195A (ja) 1998-04-30 1998-04-30 透明板の表面欠陥検出装置

Publications (2)

Publication Number Publication Date
JPH11316195A JPH11316195A (ja) 1999-11-16
JPH11316195A5 true JPH11316195A5 (enExample) 2005-09-22

Family

ID=14799401

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12096598A Withdrawn JPH11316195A (ja) 1998-04-30 1998-04-30 透明板の表面欠陥検出装置

Country Status (1)

Country Link
JP (1) JPH11316195A (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4599477B2 (ja) * 2004-01-30 2010-12-15 株式会社パル技研 欠点検出装置用高照度照明装置および欠点検出装置
US20060092276A1 (en) * 2004-10-28 2006-05-04 Ariglio James A Inspection system and method for identifying surface and body defects in a glass sheet
JP2010048745A (ja) * 2008-08-25 2010-03-04 Asahi Glass Co Ltd 欠陥検査システムおよび欠陥検査方法
JP5596925B2 (ja) * 2009-01-20 2014-09-24 株式会社山梨技術工房 異物検査装置及び検査方法
TWI485392B (zh) * 2010-02-08 2015-05-21 Ygk Corp Foreign body inspection device and inspection method
JP2015515631A (ja) * 2012-04-23 2015-05-28 サン−ゴバン グラス フランスＳａｉｎｔ−Ｇｏｂａｉｎ Ｇｌａｓｓ Ｆｒａｎｃｅ プレストレス板ガラスの気泡構造を測定するための方法および装置
KR20160047360A (ko) * 2014-10-22 2016-05-02 동우 화인켐 주식회사 결함 검출 시스템 및 방법
FR3075375A1 (fr) * 2017-12-19 2019-06-21 Saint-Gobain Glass France Systeme d’inspection a nettoyage ameliore
KR102162693B1 (ko) * 2018-12-14 2020-10-07 동우 화인켐 주식회사 결함 검출 시스템 및 방법
JP7358937B2 (ja) * 2019-11-25 2023-10-11 株式会社Ihi 異物検出装置および異物検出方法
JP7148181B1 (ja) * 2021-07-13 2022-10-05 株式会社メック 検査治具及び検査方法
CN120142329A (zh) * 2025-03-17 2025-06-13 佛山市敏博电子有限公司 含视窗的控制面板的自动检测工艺

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