JPH11274189A - Method and apparatus for sealing mounted electronic component unit - Google Patents
Method and apparatus for sealing mounted electronic component unitInfo
- Publication number
- JPH11274189A JPH11274189A JP10075670A JP7567098A JPH11274189A JP H11274189 A JPH11274189 A JP H11274189A JP 10075670 A JP10075670 A JP 10075670A JP 7567098 A JP7567098 A JP 7567098A JP H11274189 A JPH11274189 A JP H11274189A
- Authority
- JP
- Japan
- Prior art keywords
- resin
- electronic component
- pressure
- gap
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/91—Methods for connecting semiconductor or solid state bodies including different methods provided for in two or more of groups H01L2224/80 - H01L2224/90
- H01L2224/92—Specific sequence of method steps
- H01L2224/921—Connecting a surface with connectors of different types
- H01L2224/9212—Sequential connecting processes
- H01L2224/92122—Sequential connecting processes the first connecting process involving a bump connector
- H01L2224/92125—Sequential connecting processes the first connecting process involving a bump connector the second connecting process involving a layer connector
Landscapes
- Wire Bonding (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、電子部品実装体の
封止方法および封止装置に関し、特に、樹脂の充填速度
の均一化を図るのに有効な電子部品実装体の封止方法お
よび封止装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and a device for sealing an electronic component mounted body, and more particularly to a method and a device for sealing an electronic component mounted body which are effective for making the filling speed of resin uniform. It relates to a stop device.
【0002】[0002]
【従来の技術】バンプを介して半導体チップを基板に実
装するフリップチップ実装では、半導体チップを基板に
実装した後、当該半導体チップと当該基板との間隙を樹
脂で封止して、実装の信頼性を高めている。2. Description of the Related Art In flip-chip mounting in which a semiconductor chip is mounted on a substrate via bumps, a semiconductor chip is mounted on a substrate, and a gap between the semiconductor chip and the substrate is sealed with a resin to improve the reliability of mounting. Is increasing the character.
【0003】従来、この樹脂で封止する方法として、以
下のようなものが知られている。Conventionally, the following method is known as a method of sealing with this resin.
【0004】第1の方法は、実装された半導体チップの
一側面に樹脂を塗布し、当該塗布した樹脂を加熱しつつ
毛細管現象によって半導体チップと基板の間隙に浸透さ
せる方法である。The first method is a method in which a resin is applied to one side surface of a mounted semiconductor chip, and the applied resin is heated and penetrated into a gap between the semiconductor chip and the substrate by a capillary phenomenon.
【0005】第2の方法は、特開平8−241900、
特開平8−264587、特開平8−306717号公
報に記載されているように、半導体チップの実装体をチ
ャンバー内に収容し、減圧下で第1の方法と同様に樹脂
を浸透させるものである。[0005] The second method is disclosed in Japanese Patent Application Laid-Open No. 8-241900,
As described in JP-A-8-264587 and JP-A-8-306717, a semiconductor chip mounting body is housed in a chamber, and resin is permeated under reduced pressure in the same manner as in the first method. .
【0006】第3の方法は、特開平3−222338、
特開平7−130794、特開平7−226420、特
開平8−189129、実開平3−81632号公報に
記載されているように、基板の半導体チップ実装面内に
貫通孔を形成し、当該貫通孔から減圧するものである。A third method is disclosed in Japanese Unexamined Patent Publication (Kokai) No. 3-222338,
As described in JP-A-7-130794, JP-A-7-226420, JP-A-8-189129, and JP-A-3-81632, a through hole is formed in a semiconductor chip mounting surface of a substrate, and the through hole is formed. To reduce the pressure.
【0007】[0007]
【発明が解決しようとする課題】しかし、上記第1の方
法では、充填に長時間を要し、また、樹脂の流れる速度
が場所によって異なるという問題点がある。このように
樹脂の流れる速度が場所によって不均一になると、気泡
の発生やフィラーの偏在が発生し、信頼性が低下する。However, the first method has a problem that a long time is required for filling and that the flow speed of the resin varies depending on the location. When the flow speed of the resin becomes non-uniform depending on the location, generation of bubbles and uneven distribution of the filler occur, and the reliability decreases.
【0008】また、上記第2の方法では、上記第1の方
法に比べて充填時間は多少短くなるが、樹脂の流れる速
度は、上記第1の方法と同様に不均一となる。In the second method, the filling time is slightly shorter than in the first method, but the flow speed of the resin becomes non-uniform as in the first method.
【0009】また、上記第3の方法では、基板に貫通孔
という余分な構成を設けなければならない。In the third method, an extra structure called a through hole must be provided in the substrate.
【0010】そこで、本発明は、樹脂の充填速度の均一
化を図るのに有効な電子部品実装体の封止方法および封
止装置を提供することを目的とする。Accordingly, an object of the present invention is to provide a method and an apparatus for sealing an electronic component mounted body which are effective for making the filling speed of a resin uniform.
【0011】[0011]
【課題を解決するための手段】上記目的を達成するた
め、請求項1記載の発明は、底面に外部電極(20)を
有する電子部品(16)が基板(22)上に実装された
電子部品実装体の封止方法において、前記電子部品(1
6)の一の側面に樹脂を塗布する樹脂塗布工程(S1
0)と、前記樹脂塗布工程(S10)で塗布された樹脂
を加熱する樹脂加熱工程(S12)と、前記電子部品
(16)の他の側面から該電子部品(16)と前記基板
(22)との間隙を減圧し、前記樹脂加熱工程(S1
2)で加熱された樹脂を吸引する間隙減圧工程(S1
4)と、前記電子部品(16)と前記基板(22)との
間隙を前記間隙減圧工程(S14)によって吸引された
樹脂で充填する樹脂充填工程(S16)とを含むことを
特徴とする。According to a first aspect of the present invention, there is provided an electronic component in which an electronic component (16) having an external electrode (20) on a bottom surface is mounted on a substrate (22). In the method of sealing a mounted body, the electronic component (1
6) A resin application step of applying resin to one side surface (S1)
0), a resin heating step (S12) of heating the resin applied in the resin application step (S10), and the electronic component (16) and the substrate (22) from other sides of the electronic component (16). Is reduced, and the resin heating step (S1
The gap depressurizing step (S1) for sucking the resin heated in 2)
4) and a resin filling step (S16) of filling the gap between the electronic component (16) and the substrate (22) with the resin sucked in the gap depressurizing step (S14).
【0012】また、請求項2記載の発明は、請求項1記
載の発明において、前記他の側面は、前記一の側面と対
向する面を含むことを特徴とする。Further, the invention according to claim 2 is characterized in that, in the invention according to claim 1, the other side surface includes a surface facing the one side surface.
【0013】また、請求項3記載の発明は、請求項2記
載の発明において、前記他の側面は、前記一の側面と隣
接する面をさらに含み、前記間隙減圧工程(S14)
は、前記一の側面と対向する面から減圧する圧力と別の
圧力で前記一の側面と隣接する面から減圧することを特
徴とする。According to a third aspect of the present invention, in the second aspect of the invention, the other side surface further includes a surface adjacent to the one side surface, and the gap depressurizing step (S14)
Is characterized in that pressure is reduced from a surface adjacent to the one side surface at a pressure different from a pressure facing the one side surface and another pressure.
【0014】また、請求項4記載の発明は、請求項1乃
至請求項3のいずれかに記載の発明において、前記樹脂
塗布工程(S10)は、複数の電子部品(16)の一の
側面に樹脂を塗布し、前記間隙減圧工程(S14)は、
前記複数の電子部品(16)の他の側面から該複数の電
子部品(16)と前記基板(22)との間隙を同時に減
圧することを特徴とする。According to a fourth aspect of the present invention, in the first aspect of the present invention, the resin coating step (S10) is performed on one side of the plurality of electronic components (16). A resin is applied, and the gap depressurizing step (S14) includes:
The gap between the plurality of electronic components (16) and the substrate (22) is simultaneously reduced from another side surface of the plurality of electronic components (16).
【0015】また、請求項5記載の発明は、請求項1乃
至請求項4のいずれかに記載の発明において、前記樹脂
充填工程(S16)は、前記間隙減圧工程(S14)で
減圧する圧力を前記樹脂の充填状態に応じて変化させる
ことを特徴とする。According to a fifth aspect of the present invention, in the first aspect of the present invention, in the resin filling step (S16), the pressure reduced in the gap depressurizing step (S14) is reduced. It is characterized by being changed according to the filling state of the resin.
【0016】また、請求項6記載の発明は、底面に外部
電極(20)を有する電子部品(16)が基板(22)
上に実装された電子部品実装体を封止する電子部品実装
体封止装置において、前記電子部品(16)の一の側面
に樹脂を塗布する樹脂塗布手段(10)と、前記樹脂塗
布手段(10)で塗布された樹脂を加熱する樹脂加熱手
段(14)と、前記電子部品(16)の他の側面から該
電子部品(16)と前記基板(22)との間隙を減圧
し、前記樹脂加熱手段(14)が加熱した樹脂を吸引す
る間隙減圧手段(12)とを具備することを特徴とす
る。According to a sixth aspect of the present invention, the electronic component (16) having the external electrode (20) on the bottom surface is a substrate (22).
In an electronic component package sealing device for sealing an electronic component package mounted thereon, a resin application unit (10) for applying a resin to one side surface of the electronic component (16); (10) a resin heating means (14) for heating the resin applied, and the other side of the electronic component (16) reducing the pressure between the electronic component (16) and the substrate (22) by reducing the pressure. The heating means (14) is provided with a gap decompression means (12) for sucking the heated resin.
【0017】また、請求項7記載の発明は、請求項6記
載の発明において、前記他の側面は、前記一の側面と対
向する面を含むことを特徴とする。According to a seventh aspect of the present invention, in the sixth aspect of the invention, the other side surface includes a surface facing the one side surface.
【0018】また、請求項8記載の発明は、請求項7記
載の発明において、前記他の側面は、前記一の側面と隣
接する面をさらに含み、前記間隙減圧手段(12)は、
前記一の側面と対向する面から減圧する第1の減圧手段
(24)と、前記一の側面と隣接する面から減圧する第
2の減圧手段(26)とを具備することを特徴とする。According to an eighth aspect of the present invention, in the seventh aspect of the invention, the other side surface further includes a surface adjacent to the one side surface, and the gap decompression means (12) is
A first pressure reducing means (24) for reducing pressure from a surface facing the one side surface, and a second pressure reducing means (26) for reducing pressure from a surface adjacent to the one side surface.
【0019】また、請求項9記載の発明は、請求項6乃
至請求項8のいずれかに記載の発明において、前記樹脂
塗布手段(10)は、複数の電子部品(16)の一の側
面に樹脂を塗布し、前記間隙減圧手段(12)は、前記
複数の電子部品(16)の他の側面から該複数の電子部
品(16)と前記基板(22)との間隙を同時に減圧す
る複数減圧手段(28)を具備することを特徴とする。According to a ninth aspect of the present invention, in any one of the sixth to eighth aspects, the resin coating means (10) is provided on one side of the plurality of electronic components (16). A resin is applied, and the gap decompressing means (12) simultaneously decompresses a gap between the plurality of electronic components (16) and the substrate (22) from another side surface of the plurality of electronic components (16). Means (28).
【0020】また、請求項10記載の発明は、請求項6
乃至請求項9のいずれかに記載の発明において、前記間
隙減圧手段(12)は、前記減圧する圧力を可変する圧
力可変手段(30)をさらに具備することを特徴とす
る。The invention according to claim 10 is the same as the invention according to claim 6.
The invention according to any one of claims 9 to 9, wherein the gap pressure reducing means (12) further includes a pressure varying means (30) for varying the pressure to be reduced.
【0021】[0021]
【発明の実施の形態】以下、本発明の実施の形態を添付
図面を参照して詳細に説明する。Embodiments of the present invention will be described below in detail with reference to the accompanying drawings.
【0022】(発明の概要)図1は、本発明の第1の実
施形態に係る実装体の封止工程の実行手順を示す工程図
である。本発明は、同図に示すように、まず、基板に実
装された電子部品の一側面に樹脂を塗布する樹脂塗布工
程S10を実行し、その後、当該塗布した樹脂を加熱す
る樹脂加熱工程S12を実行し、その後、前記樹脂を塗
布した面以外の他の側面から前記電子部品と前記基板と
の間隙を減圧する間隙減圧工程S14を実行し、その
後、前記減圧によって吸引された樹脂で前記間隙を充填
する樹脂充填工程S16を実行することにより、前述し
た課題を解決するものである。(Summary of the Invention) FIG. 1 is a process diagram showing an execution procedure of a sealing process of a package according to a first embodiment of the present invention. As shown in the figure, the present invention first performs a resin application step S10 of applying a resin to one side surface of an electronic component mounted on a board, and then performs a resin heating step S12 of heating the applied resin. And then performing a gap depressurizing step S14 of reducing the gap between the electronic component and the substrate from another side other than the surface on which the resin is applied, and thereafter, the gap is reduced by the resin sucked by the reduced pressure. The problem described above is solved by executing the resin filling step S16 for filling.
【0023】以下、本発明の内容をさらに詳細に説明す
る。Hereinafter, the contents of the present invention will be described in more detail.
【0024】(第1の実施形態)以下、図1を使用して
本発明の第1の実施形態を説明する。(First Embodiment) A first embodiment of the present invention will be described below with reference to FIG.
【0025】樹脂塗布工程S10は、電子部品の実装体
に樹脂を塗布する工程である。当該工程で塗布される樹
脂は、粘度の低い状態で電子部品の一側面に塗布され
る。ここでいう一側面とは、少なくとも一側面であれば
よく、当該樹脂を二以上の側面に塗布してもよい。この
とき塗布される樹脂は、電子部品と基板の間隙の容積以
上の量で塗布される。The resin application step S10 is a step of applying a resin to the electronic component mounted body. The resin applied in this step is applied to one side of the electronic component in a state of low viscosity. The term “one side face” as used herein means at least one side face, and the resin may be applied to two or more side faces. The resin applied at this time is applied in an amount equal to or larger than the volume of the gap between the electronic component and the substrate.
【0026】樹脂加熱工程S12は、前記樹脂塗布工程
S10で塗布された樹脂を加熱する工程であり、当該樹
脂をヒーターやホットプレートにより加熱し、その粘度
を下げる。この時、樹脂の温度が当該樹脂の硬化温度に
達しないように注意する。The resin heating step S12 is a step of heating the resin applied in the resin applying step S10. The resin is heated by a heater or a hot plate to reduce the viscosity. At this time, care is taken that the temperature of the resin does not reach the curing temperature of the resin.
【0027】間隙減圧工程S14は、前記樹脂塗布工程
S10によって樹脂が塗布された面以外の面から、電子
部品と基板の間隙を減圧する工程である。当該工程は、
アスピレータや真空ポンプ等の吸引手段によって行わ
れ、当該間隙を集中的に減圧するため、吸引手段に接続
されたチューブやガスホースを当該間隙に近接させた
り、後述の実施例で示すような減圧治具を使用する。上
記吸引手段を作動させて間隙の気相を引くと、電子部品
の側面に塗布された樹脂が吸引方向に引き寄せられる。
このとき、樹脂を吸引する力は、電子部品と基板との間
隙の寸法や樹脂充填領域に存在する配線パターンの状態
に応じて調整する。The gap depressurizing step S14 is a step of depressurizing the gap between the electronic component and the substrate from a surface other than the surface on which the resin is applied in the resin applying step S10. The process is
This is performed by suction means such as an aspirator or a vacuum pump, and in order to concentrate the pressure in the gap, a tube or a gas hose connected to the suction means may be brought close to the gap, or a decompression jig as shown in an embodiment described later. Use When the suction means is operated to pull the gas phase in the gap, the resin applied to the side surface of the electronic component is drawn in the suction direction.
At this time, the force for sucking the resin is adjusted according to the size of the gap between the electronic component and the substrate and the state of the wiring pattern existing in the resin-filled region.
【0028】望ましくは、樹脂が塗布された面と対向す
る面から減圧する。また、さらに望ましくは、当該対向
する面に加え、樹脂が塗布された面と隣接する面からも
減圧する。このとき、前記対向する面と前記隣接する面
とで減圧する圧力を変化させる。例えば、樹脂が塗布さ
れた面から最も遠い面である前記対向する面を大きめの
圧力で減圧し、前記隣接する面を小さめの圧力で減圧す
る。これにより、樹脂が均一に充填されてゆく。また、
間隙の形状が一定ではなく、特に狭く入り組んだ部分が
ある場合には、当該狭く入り組んだ部分に最も近い側面
から大きめの圧力で減圧する。Preferably, the pressure is reduced from the surface opposite to the surface on which the resin is applied. More preferably, the pressure is reduced not only from the opposite surface but also from the surface adjacent to the surface on which the resin is applied. At this time, the pressure for reducing the pressure between the opposed surface and the adjacent surface is changed. For example, the opposite surface, which is the surface farthest from the surface on which the resin is applied, is depressurized with a higher pressure, and the adjacent surface is depressurized with a lower pressure. Thereby, the resin is uniformly filled. Also,
When the shape of the gap is not constant, and particularly when there is a narrow convoluted portion, the pressure is reduced with a larger pressure from the side closest to the narrow convoluted portion.
【0029】この間隙減圧工程S14では、複数の実装
体を同時に減圧してもよい。これは、同一の基板上に実
装された複数の電子部品を対象とするものでも、複数の
基板のそれぞれに実装された電子部品を対象とするもの
であってもよい。In the gap depressurizing step S14, a plurality of mounted bodies may be depressurized simultaneously. This may be for a plurality of electronic components mounted on the same substrate, or may be for an electronic component mounted on each of the plurality of substrates.
【0030】樹脂充填工程S16は、電子部品と基板と
の間隙を上記間隙減圧工程S14によって吸引された樹
脂で充填する工程である。この樹脂充填工程S16で
は、減圧時間等を計測して樹脂の充填状態を制御し、当
該間隙が完全にモールドされるまで間隙減圧工程S14
による減圧を繰り返す。このとき必要であれば、間隙減
圧工程S14で減圧される圧力を変化させる。この圧力
の変化は、予めプログラミングされたアルゴリズムに従
って行われるものであってもよい。The resin filling step S16 is a step of filling the gap between the electronic component and the substrate with the resin sucked in the gap depressurizing step S14. In the resin filling step S16, the resin filling state is controlled by measuring the pressure reduction time and the like, and the gap pressure reduction step S14 is performed until the gap is completely molded.
Is repeated. At this time, if necessary, the pressure reduced in the gap depressurizing step S14 is changed. This change in pressure may be made according to a pre-programmed algorithm.
【0031】このように、本発明の第1の実施形態によ
れば、電子部品と基板との間隙が集中的に減圧されるた
め、樹脂の充填速度を向上させることができる。As described above, according to the first embodiment of the present invention, since the gap between the electronic component and the substrate is intensively reduced, the filling speed of the resin can be improved.
【0032】特に、樹脂が塗布された面と対向する面か
ら減圧することにより、塗布された位置から最も遠い位
置に向かって充填速度が大きくなるため、充填速度の均
一化が図られる。In particular, when the pressure is reduced from the surface opposite to the surface on which the resin is applied, the filling speed increases toward the position farthest from the position where the resin is applied, so that the filling speed is made uniform.
【0033】また、間隙の形状に応じて複数の面から異
なる圧力で減圧することにより、充填速度の均一化がよ
り図られる。By reducing the pressure from a plurality of surfaces at different pressures according to the shape of the gap, the filling speed can be made more uniform.
【0034】また、複数の実装体を同時に減圧すること
により、処理の効率化が図られる。Further, by reducing the pressure of a plurality of mounting bodies at the same time, the processing efficiency can be improved.
【0035】また、充填状態に応じて圧力を変化させる
ことにより、より確実な封止状態を形成することが可能
となる。Further, by changing the pressure according to the filling state, a more reliable sealed state can be formed.
【0036】(第2の実施形態)図2は、本発明の第2
の実施形態に係る電子部品実装体の封止装置の構成を示
す概念図である。以下、この第2の実施形態の構成を各
ブロックごとに説明する。同図において、電子部品1
6、外部電極20、樹脂18および基板22はそれらの
構造を側面から示し、樹脂塗布手段10、間隙減圧手段
12および樹脂加熱手段14はブロックで示す。(Second Embodiment) FIG. 2 shows a second embodiment of the present invention.
It is a key map showing the composition of the sealing device of the electronic parts mounting body concerning the embodiment. Hereinafter, the configuration of the second embodiment will be described for each block. In FIG.
6, the external electrode 20, the resin 18, and the substrate 22 show their structures from the side, and the resin applying means 10, the gap reducing means 12, and the resin heating means 14 are shown by blocks.
【0037】電子部品16は、底面に外部電極20が形
成されたデバイスであり、フリップチップやボールグリ
ッドアレイ等の半導体装置の他、表面実装型の各種電子
部品が該当する。The electronic component 16 is a device having an external electrode 20 formed on the bottom surface, and includes various surface-mounted electronic components in addition to a semiconductor device such as a flip chip or a ball grid array.
【0038】外部電極20は、電子部品16を基板22
上の配線パターンに接続する導電媒体であり、金属製の
バンプや半田ボール、あるいは、電子部品16のパッケ
ージ底面から露出するリードフレーム等の電子部品16
に一体形成されたものの他、導電ペーストやクリーム半
田等の導電部材が該当する。The external electrode 20 connects the electronic component 16 to the substrate 22
A conductive medium connected to the upper wiring pattern, such as a metal bump or a solder ball, or an electronic component 16 such as a lead frame exposed from the package bottom surface of the electronic component 16.
In addition, a conductive member such as a conductive paste or a cream solder is applicable.
【0039】樹脂18は、電子部品16と基板22との
間隙を充填する原料であり、エポキシ樹脂やエラストマ
ー等の熱硬化性のものや熱可塑性のものが用いられる。
この樹脂18にはフィラー等の無機材料が混入される場
合もある。The resin 18 is a raw material for filling the gap between the electronic component 16 and the substrate 22, and is made of a thermosetting material such as an epoxy resin or an elastomer, or a thermoplastic material.
The resin 18 may be mixed with an inorganic material such as a filler.
【0040】基板22は、電子部品16が実装される配
線板であり、セラミックやガラスエポキシ等で形成され
る。この基板22には、必要に応じて、樹脂18の充填
速度をなるべく均一化させるべく、その表面をソルダー
レジストで被覆したり、電子部品16の下部に位置する
配線パターンを樹脂の浸透方向に沿って配線する等の工
夫が施される。The substrate 22 is a wiring board on which the electronic components 16 are mounted, and is made of ceramic, glass epoxy, or the like. If necessary, the surface of the substrate 22 may be coated with a solder resist to make the filling speed of the resin 18 as uniform as possible. Ingenious measures such as wiring are performed.
【0041】樹脂塗布手段10は、電子部品16の側面
に樹脂18を塗布する手段であり、ディスペンサによる
注入やスキージによる摺動塗布等が該当する。この樹脂
塗布手段10は、樹脂18と電子部品16をなるべく密
着させた状態で塗布できる手段であることが好ましい。The resin applying means 10 is a means for applying the resin 18 to the side surface of the electronic component 16, and corresponds to injection using a dispenser, sliding application using a squeegee, or the like. The resin applying means 10 is preferably a means capable of applying the resin 18 and the electronic component 16 in a state in which they are in close contact with each other as much as possible.
【0042】樹脂加熱手段14は、樹脂18に熱を供給
する手段であり、照射熱によって樹脂18を直接加熱す
るものやヒーターやホットプレート等によって基板22
ごと加熱するものが該当する。この樹脂加熱手段14
は、電子部品16の側面に塗布された樹脂18を当該樹
脂18の硬化温度以下の温度であって、当該樹脂の粘度
が下がる温度に加熱する。The resin heating means 14 is a means for supplying heat to the resin 18. The resin heating means 14 directly heats the resin 18 by irradiation heat, or the substrate 22 by a heater or a hot plate.
Those that are heated every time correspond. This resin heating means 14
Heats the resin 18 applied to the side surface of the electronic component 16 to a temperature lower than the curing temperature of the resin 18 and lowering the viscosity of the resin.
【0043】間隙減圧手段12は、電子部品16と基板
22の間隙を減圧する手段であり、当該間隙付近に配設
されたガスホースやチューブ等の通気路がアスピレータ
や真空ポンプ等の吸引装置に接続されて構成される。こ
の間隙減圧手段12は、同図に示すように、樹脂18が
塗布された面と対向する面から吸引されるように構成す
ることが好ましい。The gap decompression means 12 is a means for decompressing the gap between the electronic component 16 and the substrate 22, and a gas passage or a tube provided near the gap is connected to a suction device such as an aspirator or a vacuum pump. It is composed. It is preferable that the gap decompression means 12 is configured to be sucked from a surface opposite to the surface on which the resin 18 is applied, as shown in FIG.
【0044】上記のように構成される本発明の第2の実
施形態によれば、電子部品16と基板22との間隙が減
圧されるため、樹脂18の充填速度の均一化が図られ
る。According to the second embodiment of the present invention configured as described above, since the gap between the electronic component 16 and the substrate 22 is reduced, the filling speed of the resin 18 can be made uniform.
【0045】(第3の実施形態)図3は、本発明の第3
の実施形態に係る電子部品実装体の封止装置の構成を示
す概念図である。同図に示す封止装置は、前述した第2
の実施形態に係る封止装置の構成に加え、第1の減圧手
段24と第2の減圧手段26が設けられたものである。(Third Embodiment) FIG. 3 shows a third embodiment of the present invention.
It is a key map showing the composition of the sealing device of the electronic parts mounting body concerning the embodiment. The sealing device shown in FIG.
In addition to the configuration of the sealing device according to the embodiment, a first decompression unit 24 and a second decompression unit 26 are provided.
【0046】第1の減圧手段24は、図3に示すよう
に、樹脂18の塗布された側面と対向する面から電子部
品16と基板22の間隙を吸引し減圧する手段であり、
第2の減圧手段26は、樹脂18の塗布された側面と隣
接する面から電子部品16と基板22の間隙を吸引し減
圧する手段である。これらの減圧手段はともに、図2に
示す間隙減圧手段12と同様に構成される。As shown in FIG. 3, the first decompression means 24 is means for sucking a gap between the electronic component 16 and the substrate 22 from a surface opposite to the side surface on which the resin 18 is applied, and decompressing.
The second decompression unit 26 is a unit that suctions a gap between the electronic component 16 and the substrate 22 from a surface adjacent to the side surface on which the resin 18 is applied, and decompresses. Both of these pressure reducing means are configured similarly to the gap pressure reducing means 12 shown in FIG.
【0047】望ましくは、当該各減圧手段の吸引力を樹
脂が塗布された位置までの距離に応じて決定する。例え
ば、樹脂18から最も離れた位置から吸引する第1の減
圧手段24の吸引力を第2の減圧手段26の吸引力より
大きく構成し、充填速度の均一化を図る。Preferably, the suction force of each of the pressure reducing means is determined according to the distance to the position where the resin is applied. For example, the suction force of the first decompression means 24 for sucking from the position farthest from the resin 18 is configured to be larger than the suction force of the second decompression means 26, and the filling speed is made uniform.
【0048】上記のように構成される本発明の第3の実
施形態によれば、電子部品16と基板22との間隙が多
方向から吸引されるため、充填速度の均一化がより図ら
れる。According to the third embodiment of the present invention configured as described above, since the gap between the electronic component 16 and the substrate 22 is sucked from multiple directions, the filling speed can be made more uniform.
【0049】(第4の実施形態)図4は、本発明の第4
の実施形態に係る電子部品実装体の封止装置の構成を示
す概念図である。この第4の実施形態に係る封止装置
は、前述した第2の実施形態に係る封止装置の構成に加
え、複数減圧手段28が設けられたものである。(Fourth Embodiment) FIG. 4 shows a fourth embodiment of the present invention.
It is a key map showing the composition of the sealing device of the electronic parts mounting body concerning the embodiment. The sealing device according to the fourth embodiment is provided with a plurality of pressure reducing means 28 in addition to the configuration of the sealing device according to the second embodiment described above.
【0050】この複数減圧手段28は、図4に示すよう
に、複数の実装体の間隙を吸引し減圧するものであり、
図2に示す間隙減圧手段12と同様に構成される。図4
では、2つの実装体の間隙を吸引し減圧する例を示して
いるが、この複数減圧手段28は、同一の基板22上に
実装された複数の電子部品16の間隙を吸引するもので
あってもよい。尚、この第4の実施形態では、同図に示
すように、樹脂塗布手段10および樹脂加熱手段14も
複数の実装体に作用する。As shown in FIG. 4, the plurality of pressure reducing means 28 is for suctioning a gap between the plurality of mounting bodies and reducing the pressure.
The structure is the same as that of the gap pressure reducing means 12 shown in FIG. FIG.
In this example, an example is shown in which the gap between the two mounting bodies is sucked to reduce the pressure. However, the multiple pressure reducing means 28 sucks the gap between the plurality of electronic components 16 mounted on the same substrate 22. Is also good. In the fourth embodiment, as shown in the figure, the resin applying means 10 and the resin heating means 14 also act on a plurality of mounting bodies.
【0051】上記のように構成される本発明の第4の実
施形態によれば、複数の実装体が同時に処理されるた
め、充填効率の向上が図られる。According to the fourth embodiment of the present invention configured as described above, since a plurality of mounting bodies are processed simultaneously, the filling efficiency is improved.
【0052】(第5の実施形態)図5は、本発明の第5
の実施形態に係る電子部品実装体の封止装置の構成を示
す概念図である。この第5の実施形態に係る封止装置
は、前述した第2の実施形態に係る封止装置の構成に加
え、圧力可変手段30が設けられたものである。(Fifth Embodiment) FIG. 5 shows a fifth embodiment of the present invention.
It is a key map showing the composition of the sealing device of the electronic parts mounting body concerning the embodiment. The sealing device according to the fifth embodiment has a configuration in which a pressure varying unit 30 is provided in addition to the configuration of the sealing device according to the second embodiment described above.
【0053】この圧力可変手段30は、間隙減圧手段1
2の吸引力を制御する手段であり、同図に示すように、
間隙減圧手段12に制御信号を出力する。この制御信号
は、間隙減圧手段12の吸引力を指定する信号であり、
圧力可変手段30は、樹脂18の充填状況に応じて制御
信号を変化させる。The pressure varying means 30 is provided with the gap reducing means 1
2 is a means for controlling the suction force, as shown in FIG.
A control signal is output to the gap pressure reducing means 12. This control signal is a signal for designating the suction force of the gap pressure reducing means 12,
The pressure changing means 30 changes the control signal according to the filling state of the resin 18.
【0054】圧力可変手段30による圧力の変化は、樹
脂の充填状態をモニタしながらフィードバック的に行う
ものでも、所定のアルゴリズムに従って変化させるもの
であってもよい。例えば、時間の経過とともに吸引力を
弱くしてゆくアルゴリズムをプログラムとして記述し、
圧力可変手段30に記憶させておくような手段が考えら
れる。このようなアルゴリズムを組む場合には、予め実
験によって、好ましい充填状態が得られた変化プロファ
イルを調査し、該プロファイルをプログラミングするこ
とが好ましい。The pressure change by the pressure changing means 30 may be performed in a feedback manner while monitoring the state of filling of the resin, or may be changed according to a predetermined algorithm. For example, an algorithm that weakens the suction force over time is described as a program,
Means that are stored in the pressure varying means 30 are conceivable. When such an algorithm is formed, it is preferable to previously study a change profile in which a preferable filling state is obtained by experiment and to program the profile.
【0055】上記のように構成される本発明の第5の実
施形態によれば、樹脂の充填状態に応じて吸引力が制御
されるため、より好ましい充填状態を得ることができ
る。According to the fifth embodiment of the present invention configured as described above, the suction force is controlled according to the filling state of the resin, so that a more preferable filling state can be obtained.
【0056】[0056]
【実施例】(第1の実施例)図6は、本発明の第1の実
施例に係る電子部品実装体の封止装置の構造を示す上面
図である。同図に示すように、第1の実施例に係る封止
装置では、ディスペンサ32が基板22上に実装された
電子部品16の左側面上方に配設され、このディスペン
サ32によって電子部品16の左側面に樹脂18が塗布
される。FIG. 6 is a top view showing the structure of a device for sealing an electronic component package according to a first embodiment of the present invention. As shown in the figure, in the sealing device according to the first embodiment, a dispenser 32 is disposed above the left side surface of the electronic component 16 mounted on the substrate 22, and the dispenser 32 causes the dispenser 32 to move to the left side of the electronic component 16. A resin 18 is applied to the surface.
【0057】一方、電子部品16の右側面には、減圧治
具34が当接される。この減圧治具の内部には、電子部
品16と基板22との間隙を真空ポンプ40に連通させ
る連通孔36が形成されている。この連通孔36と真空
ポンプ40は管状の通気路38によって接続されてい
る。連通孔36の開口長さは、同図に示すように、電子
部品16の側面の長さと略同等に形成することが好まし
い。On the other hand, a decompression jig 34 is in contact with the right side surface of the electronic component 16. Inside the decompression jig, there is formed a communication hole 36 that allows the gap between the electronic component 16 and the substrate 22 to communicate with the vacuum pump 40. The communication hole 36 and the vacuum pump 40 are connected by a tubular air passage 38. The opening length of the communication hole 36 is preferably formed to be substantially equal to the side length of the electronic component 16 as shown in FIG.
【0058】減圧治具34の当接面には、気密性を良く
するために、ゴム等の弾性体で形成されたシール部材が
形成されており、該シール部材が電子部品16の側面と
密着する構造となっている。A sealing member made of an elastic material such as rubber is formed on the contact surface of the decompression jig 34 to improve airtightness, and the sealing member is in close contact with the side surface of the electronic component 16. It has a structure to do.
【0059】さらに、同図に示す封止装置には、封止対
象となる実装体を載置するためのステージ42が設けら
れている。Further, the sealing device shown in the figure is provided with a stage 42 on which a package to be sealed is placed.
【0060】図7は、図6に示す電子部品実装体の封止
装置の構造を示す側面図である。同図に示すように、電
子部品16の底面には、部品側電極パッド44が形成さ
れており、基板22の上面には、基板側電極パッド48
が形成されている。そして、当該各電極パッドの間に
は、導電性のバンプ46が介在し、電子部品16と基板
22とが電気的に接続される。FIG. 7 is a side view showing the structure of the device for sealing the electronic component package shown in FIG. As shown in the drawing, a component-side electrode pad 44 is formed on the bottom surface of the electronic component 16, and a substrate-side electrode pad 48 is formed on the upper surface of the substrate 22.
Are formed. The conductive bumps 46 are interposed between the respective electrode pads, and the electronic component 16 and the substrate 22 are electrically connected.
【0061】減圧治具34は、電子部品16の実装高さ
よりも高く形成され、かつ、当該減圧治具34の内部に
形成される連通孔36の開口高さは、電子部品16と基
板22の間隙よりも高く形成される。The decompression jig 34 is formed higher than the mounting height of the electronic component 16, and the opening height of the communication hole 36 formed inside the decompression jig 34 is determined by the electronic component 16 and the substrate 22. It is formed higher than the gap.
【0062】ステージ42には、樹脂18を加熱するた
めのヒーター50が埋め込まれており、該ヒーター50
が発した熱は、ステージ42の筐体を通じて基板22に
伝わり、樹脂18に供給される。A heater 50 for heating the resin 18 is embedded in the stage 42.
Is transmitted to the substrate 22 through the housing of the stage 42 and supplied to the resin 18.
【0063】以下、上記のように構成される封止装置の
動作を説明する。Hereinafter, the operation of the sealing device configured as described above will be described.
【0064】まず、ディスペンサ32によって樹脂18
を電子部品16の側面に塗布する。その後、ヒーター5
0を作動させて、当該塗布された樹脂18を加熱し、該
樹脂18の粘度を低下させる。First, the resin 18 is dispensed by the dispenser 32.
Is applied to the side surface of the electronic component 16. After that, heater 5
By operating 0, the applied resin 18 is heated to lower the viscosity of the resin 18.
【0065】次に、真空ポンプ40を作動させて間隙を
吸引し、当該間隙に樹脂18を浸透させる。樹脂18が
完全に間隙に浸透したら、真空ポンプ40を停止させて
樹脂を加熱硬化し、樹脂封止された実装体を得る。Next, the vacuum pump 40 is operated to suck the gap, and the resin 18 penetrates into the gap. When the resin 18 has completely penetrated into the gap, the vacuum pump 40 is stopped, and the resin is heated and cured to obtain a resin-sealed package.
【0066】(第2の実施例)図8は、本発明の第2の
実施例に係る電子部品実装体の封止装置の構造を示す上
面図である。同図に示す封止装置は、3つの側面から電
子部品16と基板22との間隙を減圧するものである。(Second Embodiment) FIG. 8 is a top view showing the structure of a device for sealing an electronic component package according to a second embodiment of the present invention. The sealing device shown in the figure reduces the gap between the electronic component 16 and the substrate 22 from three sides.
【0067】この封止装置では、減圧治具34が樹脂の
塗布面以外の面を囲む形状で形成され、当該各側面に接
する3つの連通孔36がその内部に設けられる。そし
て、当該3つの連通孔36は、通気路38を介して、そ
れぞれ真空ポンプA40a、真空ポンプB40bおよび
真空ポンプC40cに接続される。当該各真空ポンプ
は、それぞれ独立に作動し、独自の圧力で間隙を吸引す
る。この吸引する圧力は、真空ポンプA40aが最も強
く、真空ポンプB40bと真空ポンプC40cが同一と
なるように設定されている。その他の構成は、前述した
第1の実施例で示すものと同じである。In this sealing device, the decompression jig 34 is formed so as to surround a surface other than the surface on which the resin is applied, and three communication holes 36 contacting the respective side surfaces are provided therein. The three communication holes 36 are connected to a vacuum pump A 40a, a vacuum pump B 40b, and a vacuum pump C 40c, respectively, via a ventilation path 38. Each of the vacuum pumps operates independently and sucks the gap with a unique pressure. The suction pressure is set so that the vacuum pump A40a is the strongest and the vacuum pump B40b and the vacuum pump C40c are the same. Other configurations are the same as those described in the first embodiment.
【0068】以下、上記のように構成される封止装置の
動作を説明する。Hereinafter, the operation of the sealing device configured as described above will be described.
【0069】まず、ディスペンサ32によって樹脂18
を電子部品16の側面に塗布する。その後、ヒーター5
0を作動させて、当該塗布された樹脂18を加熱し、該
樹脂18の粘度を低下させる。First, the resin 18 is dispensed by the dispenser 32.
Is applied to the side surface of the electronic component 16. After that, heater 5
By operating 0, the applied resin 18 is heated to lower the viscosity of the resin 18.
【0070】次に、真空ポンプA40a、真空ポンプB
40bおよび真空ポンプ40Cを同時に作動させて間隙
を3方から吸引し、当該間隙に樹脂18を浸透させる。
樹脂18が完全に間隙に浸透したら、真空ポンプA40
a、真空ポンプB40bおよび真空ポンプC40cを停
止させて樹脂を加熱硬化し、樹脂封止された実装体を得
る。Next, the vacuum pump A 40a and the vacuum pump B
The gap is sucked from three directions by operating the vacuum pump 40C and the vacuum pump 40C at the same time, and the resin 18 penetrates into the gap.
When the resin 18 has completely penetrated the gap, the vacuum pump A40
a, The vacuum pump B40b and the vacuum pump C40c are stopped, and the resin is heated and cured to obtain a resin-sealed package.
【0071】(第3の実施例)図9は、本発明の第3の
実施例に係る電子部品実装体の封止装置の構造を示す上
面図である。同図に示す封止装置は、複数の電子部品1
6が同時に処理されるように構成されたものである。(Third Embodiment) FIG. 9 is a top view showing the structure of a device for sealing an electronic component package according to a third embodiment of the present invention. The sealing device shown in FIG.
6 are configured to be processed simultaneously.
【0072】この第3の実施例に係る封止装置では、減
圧治具34が電子部品A16a、電子部品B16b、電
子部品C16cおよび電子部品D16dの樹脂の塗布面
以外の面を囲む形状で形成され、各電子部品16の樹脂
塗布面と隣接する面に通じる連通孔A36aと、樹脂塗
布面と対向する面に通じる連通孔B36bが同図に示す
ような経路で配管される。In the sealing device according to the third embodiment, the decompression jig 34 is formed in a shape surrounding the surfaces of the electronic components A16a, B16b, C16c and D16d other than the resin-coated surface. A communication hole A36a communicating with a surface adjacent to the resin application surface of each electronic component 16 and a communication hole B36b communicating with a surface opposite to the resin application surface are provided in a path as shown in FIG.
【0073】連通孔A36aには、通気路A38aを介
して真空ポンプA40aが接続され、連通孔B36bに
は、通気路B38bを介して真空ポンプB40bが接続
されている。この真空ポンプA40aと真空ポンプB4
0bは、それぞれ独立に作動し、独自の圧力で間隙を吸
引する。この吸引する圧力は、真空ポンプA40aの方
が強くなるように設定されている。ここで、真空ポンプ
B40bは2つの側面から吸引するように構成されてい
るため、真空ポンプA40aよりも負荷が大きくなる場
合がある。このような場合には、真空ポンプB40bの
圧力が大きくなるように設定する。その他の構成は、前
述した第1の実施例で示すものと同じである。The communication hole A36a is connected to a vacuum pump A40a via a ventilation path A38a, and the communication hole B36b is connected to a vacuum pump B40b via a ventilation path B38b. The vacuum pump A40a and the vacuum pump B4
0b each operate independently and draw the gap with its own pressure. The suction pressure is set so that the vacuum pump A40a becomes stronger. Here, since the vacuum pump B40b is configured to suction from two side surfaces, the load may be larger than that of the vacuum pump A40a. In such a case, the pressure of the vacuum pump B40b is set to increase. Other configurations are the same as those described in the first embodiment.
【0074】以下、上記のように構成される封止装置の
動作を説明する。Hereinafter, the operation of the sealing device configured as described above will be described.
【0075】まず、ディスペンサ32によって樹脂18
を電子部品A16a、電子部品B16b、電子部品C1
6cおよび電子部品D16dの側面にそれぞれ塗布す
る。その後、ヒーター50を作動させて、当該塗布され
た樹脂18を加熱し、該樹脂18の粘度を低下させる。First, the resin 18 is dispensed by the dispenser 32.
The electronic component A16a, the electronic component B16b, and the electronic component C1
6c and the side surface of the electronic component D16d. Thereafter, the heater 50 is operated to heat the applied resin 18, and the viscosity of the resin 18 is reduced.
【0076】次に、真空ポンプA40aおよび真空ポン
プB40b作動させて間隙を3方から吸引し、当該間隙
に樹脂18を浸透させる。樹脂18が完全に間隙に浸透
したら、真空ポンプA40aおよび真空ポンプB40b
を停止させて樹脂を加熱硬化し、樹脂封止された実装体
を得る。Next, the vacuum pump A 40a and the vacuum pump B 40b are operated to suck the gap from three directions, and the resin 18 is made to permeate the gap. When the resin 18 has completely penetrated the gap, the vacuum pump A 40a and the vacuum pump B 40b
Is stopped and the resin is cured by heating to obtain a resin-sealed package.
【0077】尚、上記電子部品としては、半導体チップ
の他、同様の封止形態をとるBGA(ボールグリッドア
レイ)、CSP(チップサイズパッケージ)等が対象と
なる。The above-mentioned electronic components include not only semiconductor chips, but also BGAs (ball grid arrays), CSPs (chip size packages), and the like, which take the same sealing form.
【0078】[0078]
【発明の効果】以上説明したように、本発明によれば、
樹脂の充填速度の均一化を図るのに有効な電子部品実装
体の封止方法および封止装置を提供することができる。As described above, according to the present invention,
It is possible to provide a sealing method and a sealing device for an electronic component mounted body that are effective for making the filling speed of the resin uniform.
【0079】また、本発明の第1の実施形態によれば、
電子部品と基板との間隙が集中的に減圧されるため、樹
脂の充填速度を向上させることができる。According to the first embodiment of the present invention,
Since the gap between the electronic component and the substrate is intensively reduced in pressure, the filling speed of the resin can be improved.
【0080】特に、樹脂が塗布された面と対向する面か
ら減圧することにより、塗布された位置から最も遠い位
置に向かって充填速度が大きくなるため、充填速度の均
一化が図られる。In particular, when the pressure is reduced from the surface opposite to the surface on which the resin is applied, the filling speed increases toward the position farthest from the position where the resin is applied, so that the filling speed is made uniform.
【0081】また、間隙の形状に応じて複数の面から異
なる圧力で減圧することにより、充填速度の均一化がよ
り図られる。Further, by reducing the pressure at different pressures from a plurality of surfaces in accordance with the shape of the gap, the filling speed can be made more uniform.
【0082】また、複数の実装体を同時に減圧すること
により、処理の効率化が図られる。Further, by reducing the pressure of a plurality of mounted bodies at the same time, the processing efficiency can be improved.
【0083】また、充填状態に応じて圧力を変化させる
ことにより、より確実な封止状態を形成することが可能
となる。Further, by changing the pressure in accordance with the filling state, it is possible to form a more reliable sealing state.
【0084】また、本発明の第2の実施形態によれば、
電子部品16と基板22との間隙が減圧されるため、樹
脂18の充填速度の均一化が図られる。According to the second embodiment of the present invention,
Since the gap between the electronic component 16 and the substrate 22 is reduced, the filling speed of the resin 18 can be made uniform.
【0085】また、本発明の第3の実施形態によれば、
電子部品16と基板22との間隙が多方向から吸引され
るため、充填速度の均一化がより図られる。According to the third embodiment of the present invention,
Since the gap between the electronic component 16 and the substrate 22 is sucked from multiple directions, the filling speed can be made more uniform.
【0086】また、本発明の第4の実施形態によれば、
複数の実装体が同時に処理されるため、充填効率の向上
が図られる。According to the fourth embodiment of the present invention,
Since a plurality of mounting bodies are processed at the same time, the filling efficiency is improved.
【0087】また、本発明の第5の実施形態によれば、
樹脂の充填状態に応じて吸引力が制御されるため、より
好ましい充填状態を得ることができる。According to the fifth embodiment of the present invention,
Since the suction force is controlled according to the filling state of the resin, a more preferable filling state can be obtained.
【図1】本発明の第1の実施形態に係る実装体の封止工
程の実行手順を示す工程図である。FIG. 1 is a process diagram showing an execution procedure of a sealing process of a package according to a first embodiment of the present invention.
【図2】本発明の第2の実施形態に係る電子部品実装体
の封止装置の構成を示す概念図である。FIG. 2 is a conceptual diagram showing a configuration of a sealing device for an electronic component mounted body according to a second embodiment of the present invention.
【図3】本発明の第3の実施形態に係る電子部品実装体
の封止装置の構成を示す概念図である。FIG. 3 is a conceptual diagram showing a configuration of a sealing device for an electronic component mounted body according to a third embodiment of the present invention.
【図4】本発明の第4の実施形態に係る電子部品実装体
の封止装置の構成を示す概念図である。FIG. 4 is a conceptual diagram illustrating a configuration of a sealing device for an electronic component mounted body according to a fourth embodiment of the present invention.
【図5】本発明の第5の実施形態に係る電子部品実装体
の封止装置の構成を示す概念図である。FIG. 5 is a conceptual diagram illustrating a configuration of a sealing device for an electronic component mounted body according to a fifth embodiment of the present invention.
【図6】本発明の第1の実施例に係る電子部品実装体の
封止装置の構造を示す上面図である。FIG. 6 is a top view showing the structure of the sealing device for an electronic component mounted body according to the first embodiment of the present invention.
【図7】図6に示す電子部品実装体の封止装置の構造を
示す側面図である。FIG. 7 is a side view showing the structure of the sealing device for the electronic component package shown in FIG. 6;
【図8】本発明の第2の実施例に係る電子部品実装体の
封止装置の構造を示す上面図である。FIG. 8 is a top view showing a structure of a sealing device for an electronic component package according to a second embodiment of the present invention.
【図9】本発明の第3の実施例に係る電子部品実装体の
封止装置の構造を示す上面図である。FIG. 9 is a top view showing the structure of a device for sealing an electronic component mounted body according to a third embodiment of the present invention.
S10…樹脂塗布工程、S12…樹脂加熱工程、S14
…間隙減圧工程、S16…樹脂充填工程、10…樹脂塗
布手段、12…間隙減圧手段、14…樹脂加熱手段、1
6…電子部品、16a…電子部品A、16b…電子部品
B、16c…電子部品C、16d…電子部品D、18…
樹脂、20…外部電極、22…基板、24…第1の減圧
手段、26…第2の減圧手段、28…複数減圧手段、3
0…圧力可変手段、32…ディスペンサ、34…減圧治
具、36…連通孔、36a…連通孔A、36b…連通孔
B、38…通気路、38a…通気路A、38b…通気路
B、40…真空ポンプ、40a…真空ポンプA、40b
…真空ポンプB、40c…真空ポンプC、42…ステー
ジ、44…部品側電極パッド、46…バンプ、48…基
板側電極パッド、50…ヒーターS10: Resin coating step, S12: Resin heating step, S14
... gap depressurizing step, S16 ... resin filling step, 10 ... resin applying means, 12 ... gap depressurizing means, 14 ... resin heating means, 1
6 ... Electronic component, 16a ... Electronic component A, 16b ... Electronic component B, 16c ... Electronic component C, 16d ... Electronic component D, 18 ...
Resin, 20 external electrodes, 22 substrate, 24 first pressure reducing means, 26 second pressure reducing means, 28 multiple pressure reducing means, 3
0: Pressure varying means, 32: Dispenser, 34: Decompression jig, 36: Communication hole, 36a: Communication hole A, 36b: Communication hole B, 38: Ventilation path, 38a: Ventilation path A, 38b: Ventilation path B, 40: vacuum pump, 40a: vacuum pump A, 40b
... Vacuum pump B, 40c ... Vacuum pump C, 42 ... Stage, 44 ... Part-side electrode pad, 46 ... Bump, 48 ... Board-side electrode pad, 50 ... Heater
Claims (10)
品(16)が基板(22)上に実装された電子部品実装
体の封止方法において、 前記電子部品(16)の一の側面に樹脂を塗布する樹脂
塗布工程(S10)と、 前記樹脂塗布工程(S10)で塗布された樹脂を加熱す
る樹脂加熱工程(S12)と、 前記電子部品(16)の他の側面から該電子部品(1
6)と前記基板(22)との間隙を減圧し、前記樹脂加
熱工程(S12)で加熱された樹脂を吸引する間隙減圧
工程(S14)と、 前記電子部品(16)と前記基板(22)との間隙を前
記間隙減圧工程(S14)によって吸引された樹脂で充
填する樹脂充填工程(S16)とを含むことを特徴とす
る電子部品実装体の封止方法。1. A method for sealing an electronic component mounted body in which an electronic component (16) having an external electrode (20) on a bottom surface is mounted on a substrate (22), wherein one side surface of the electronic component (16) is provided. A resin application step (S10) of applying a resin; a resin heating step (S12) of heating the resin applied in the resin application step (S10); and a second side of the electronic component (16). 1
6) a pressure reduction step (S14) for reducing the pressure between the substrate and the substrate (22) and sucking the resin heated in the resin heating step (S12); and the electronic component (16) and the substrate (22). A resin filling step (S16) of filling the gap with the resin sucked in the gap depressurizing step (S14).
項1記載の電子部品実装体の封止方法。2. The method according to claim 1, wherein the other side surface includes a surface facing the one side surface.
で前記一の側面と隣接する面から減圧することを特徴と
する請求項2記載の電子部品実装体の封止方法。3. The other side surface further includes a surface adjacent to the one side surface, and the gap depressurizing step (S14) includes the step of reducing the pressure from a surface facing the one side surface by another pressure. The method according to claim 2, wherein the pressure is reduced from a surface adjacent to the one side surface.
子部品(16)と前記基板(22)との間隙を同時に減
圧することを特徴とする請求項1乃至請求項3のいずれ
かに記載の電子部品実装体の封止方法。4. The resin applying step (S10) includes applying a resin to one side surface of the plurality of electronic components (16), and the gap depressurizing step (S14) includes adding a resin to the other side of the plurality of electronic components (16). 4. The method according to claim 1, wherein the gap between the plurality of electronic components (16) and the substrate (22) is simultaneously reduced in pressure from the side surface. .
の充填状態に応じて変化させることを特徴とする請求項
1乃至請求項4のいずれかに記載の電子部品実装体の封
止方法。5. The resin filling step (S16), wherein a pressure to be reduced in the gap depressurizing step (S14) is changed according to a filling state of the resin. The method for sealing an electronic component mounted body according to any one of the above.
品(16)が基板(22)上に実装された電子部品実装
体を封止する電子部品実装体封止装置において、 前記電子部品(16)の一の側面に樹脂を塗布する樹脂
塗布手段(10)と、 前記樹脂塗布手段(10)で塗布された樹脂を加熱する
樹脂加熱手段(14)と、 前記電子部品(16)の他の側面から該電子部品(1
6)と前記基板(22)との間隙を減圧し、前記樹脂加
熱手段(14)が加熱した樹脂を吸引する間隙減圧手段
(12)とを具備することを特徴とする電子部品実装体
封止装置。6. An electronic component package sealing device for sealing an electronic component package in which an electronic component (16) having an external electrode (20) on a bottom surface is mounted on a substrate (22). 16) a resin application unit (10) for applying a resin to one side surface, a resin heating unit (14) for heating the resin applied by the resin application unit (10), and the electronic component (16). From the side of the electronic component (1)
6) Sealing an electronic component mounted body, comprising: a pressure reducing means (12) for reducing the pressure between the substrate and the substrate (22) and sucking the resin heated by the resin heating means (14). apparatus.
項6記載の電子部品実装体封止装置。7. The device according to claim 6, wherein the other side surface includes a surface facing the one side surface.
(24)と、 前記一の側面と隣接する面から減圧する第2の減圧手段
(26)とを具備することを特徴とする請求項7記載の
電子部品実装体封止装置。8. The other side surface further includes a surface adjacent to the one side surface, and the gap decompression unit (12) includes a first decompression unit (24) for decompressing a pressure from a surface facing the one side surface. The electronic device package sealing device according to claim 7, further comprising: a second pressure reducing means (26) for reducing pressure from a surface adjacent to the one side surface.
子部品(16)と前記基板(22)との間隙を同時に減
圧する複数減圧手段(28)を具備することを特徴とす
る請求項6乃至請求項8のいずれかに記載の電子部品実
装体の封止方法。9. The resin application means (10) applies a resin to one side surface of a plurality of electronic components (16), and the gap decompression means (12) controls the other of the plurality of electronic components (16). 9. A plurality of decompression means (28) for simultaneously depressurizing a gap between the plurality of electronic components (16) and the substrate (22) from the side surface of the device. Method for sealing electronic component mounted bodies.
らに具備することを特徴とする請求項6乃至請求項9の
いずれかに記載の電子部品実装体封止装置。10. The electronic device according to claim 6, wherein the gap depressurizing means further includes a pressure varying means for varying the pressure for reducing the pressure. Component mounting device sealing device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10075670A JPH11274189A (en) | 1998-03-24 | 1998-03-24 | Method and apparatus for sealing mounted electronic component unit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10075670A JPH11274189A (en) | 1998-03-24 | 1998-03-24 | Method and apparatus for sealing mounted electronic component unit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH11274189A true JPH11274189A (en) | 1999-10-08 |
Family
ID=13582879
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10075670A Pending JPH11274189A (en) | 1998-03-24 | 1998-03-24 | Method and apparatus for sealing mounted electronic component unit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH11274189A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008192947A (en) * | 2007-02-07 | 2008-08-21 | Apic Yamada Corp | Resin sealing apparatus and resin sealing method |
-
1998
- 1998-03-24 JP JP10075670A patent/JPH11274189A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008192947A (en) * | 2007-02-07 | 2008-08-21 | Apic Yamada Corp | Resin sealing apparatus and resin sealing method |
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