JPH11251341A - Resin coating device - Google Patents

Resin coating device

Info

Publication number
JPH11251341A
JPH11251341A JP4657298A JP4657298A JPH11251341A JP H11251341 A JPH11251341 A JP H11251341A JP 4657298 A JP4657298 A JP 4657298A JP 4657298 A JP4657298 A JP 4657298A JP H11251341 A JPH11251341 A JP H11251341A
Authority
JP
Japan
Prior art keywords
resin
tape
window
mask
resin coating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4657298A
Other languages
Japanese (ja)
Inventor
Kazuhisa Kobayashi
和久 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Semiconductor Manufacturing Co Ltd
Kansai Nippon Electric Co Ltd
Original Assignee
Renesas Semiconductor Manufacturing Co Ltd
Kansai Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Semiconductor Manufacturing Co Ltd, Kansai Nippon Electric Co Ltd filed Critical Renesas Semiconductor Manufacturing Co Ltd
Priority to JP4657298A priority Critical patent/JPH11251341A/en
Publication of JPH11251341A publication Critical patent/JPH11251341A/en
Pending legal-status Critical Current

Links

Landscapes

  • Screen Printers (AREA)
  • Printing Plates And Materials Therefor (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide the electronic component of excellent moisture resistance and high reliability capable of resin coating without the dispersion of the thickness of a void and resin. SOLUTION: This resin coating device is provided with a tape supporting part 7 for supporting a tape member 3 for which a rectangular resin coating scheduled part 1b is arrayed with a prescribed interval with the short diameter in a longitudinal direction, a mask 11 arranged on the tape supporting part 7 for covering the area including the resin coating scheduled part 1b of the tape member 3 and opening a rectangular coating window 11a corresponding to the resin coating scheduled part, and a squeegee 9 made to cross the coating window from an outer part position in the long diameter direction of the coating window 11a on the mask 11 for supplying fluidized resin 5 from the coating window 11a to the resin coating scheduled part 1b of the tape member 3. The opposing surface in the long diameter direction of the coating window 11a of the mask 11 is opened upwards.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明はスクリーン印刷方式
の樹脂被覆装置に関する。
The present invention relates to a screen printing type resin coating apparatus.

【0002】[0002]

【従来の技術】薄形、小形の電子部品としてTAB式半
導体装置が一般的に用いられている。この一例を図2か
ら説明する。図において、1は両側に沿って送り用の孔
1aを一定間隔で穿設し巾方向中間で長手方向に所定の
間隔で矩形状の透孔1bを穿設した長尺の絶縁テープ、
2は絶縁テープ1に積層した導電箔をエッチングして形
成した導電パターンで、前記透孔1b内に延びるインナ
リード2aを含む。この絶縁テープ1と導電パターン2
の積層体でTABテープ3を構成している。インナリー
ド2aは、例えば液晶表示装置駆動用半導体装置の場
合、入力側と出力側に分けてそれぞれを透孔1bの長径
方向に配列して互いに対向配置し、入力側と出力側のそ
れぞれのリードの本数が大幅に異なる場合には、本数が
多い方のリード間隔を密にし、必要に応じてその一部を
短径方向に配列している。4はTABテープ3の透孔1
a内に配置された半導体ペレット4で、その電極4aと
インナリード2aとは重合され、熱圧着等の手段により
電気的に接続されている。5は透孔1b内で半導体ペレ
ット4の表面と電極4aとインナリード2aの接続部と
を被覆し保護する樹脂を示す。このTAB式半導体装置
中間構体はTABテープ3を所定の形状に切断して個々
の電子部品に分離し用いられる。このTAB式半導体装
置6の電極4aとインナリード2aの電気的接続部分を
含む半導体ペレット4の表面を外力や腐食性のガスから
保護するための樹脂5の塗布作業を図3及び図4から説
明する。図において図2と同一物には同一符号を示し重
複する説明を省略する。図中、7は中間構体6のTAB
テープ(テープ部材)3をガイドし所定位置で位置決め
するテープ支持部、8はTABテープ3の透孔1b(樹
脂被覆予定部)に対応して塗布窓8aを形成しテープ支
持部7上方で上下動して位置決めされたTABテープ3
を覆うマスク、9は樹脂供給ノズル(図示せず)からマ
スク8上に供給された流動樹脂5を押してマスク8上を
移動させるスキージを示す。マスク8の厚さや透孔1b
に対する塗布窓8aの開口径は、塗布する樹脂量や塗布
状態を決定する。またマスク8には、複数の透孔1bに
対応して複数の塗布窓8aを形成、各塗布窓8aに対応
してスキージ9をTABテープ8の巾方向に移動可能に
配置して作業効率を向上させている。この結果、図5に
示すように、透孔1bから半導体ペレット4上に供給さ
れた樹脂5は半導体ペレット4の表面、電極4aとイン
ナリード2aの接続部を含み、TABテープ3の表裏両
面の透孔1b周縁部を被覆して、電子部品の信頼性を向
上させている。
2. Description of the Related Art TAB semiconductor devices are generally used as thin and small electronic components. This example will be described with reference to FIG. In the figure, 1 is a long insulating tape in which feed holes 1a are formed at regular intervals along both sides, and rectangular through holes 1b are formed at predetermined intervals in the longitudinal direction at the middle in the width direction;
Reference numeral 2 denotes a conductive pattern formed by etching a conductive foil laminated on the insulating tape 1, and includes an inner lead 2a extending into the through hole 1b. The insulating tape 1 and the conductive pattern 2
Constitute a TAB tape 3. For example, in the case of a semiconductor device for driving a liquid crystal display device, the inner leads 2a are divided into an input side and an output side, and are arranged in the longitudinal direction of the through hole 1b so as to be opposed to each other. In the case where the number is significantly different, the lead interval of the larger number is made closer, and a part thereof is arranged in the minor axis direction as necessary. 4 is a through hole 1 of the TAB tape 3
The electrode 4a and the inner lead 2a are superimposed on the semiconductor pellet 4 disposed in a and are electrically connected by means such as thermocompression bonding. Reference numeral 5 denotes a resin that covers and protects the surface of the semiconductor pellet 4 and the connection between the electrode 4a and the inner lead 2a in the through hole 1b. The TAB type semiconductor device intermediate structure is used by cutting the TAB tape 3 into a predetermined shape and separating it into individual electronic components. The operation of applying the resin 5 for protecting the surface of the semiconductor pellet 4 including the electrical connection between the electrode 4a of the TAB type semiconductor device 6 and the inner lead 2a from external force or corrosive gas will be described with reference to FIGS. I do. In the figure, the same components as those in FIG. 2 are denoted by the same reference numerals, and redundant description will be omitted. In the figure, 7 is the TAB of the intermediate structure 6
A tape supporting portion 8 that guides the tape (tape member) 3 and positions it at a predetermined position, and 8 forms an application window 8a corresponding to the through-hole 1b (the portion to be coated with resin) of the TAB tape 3 and moves vertically above the tape supporting portion 7. TAB tape 3 moved and positioned
Reference numeral 9 denotes a squeegee that moves on the mask 8 by pressing the flowing resin 5 supplied onto the mask 8 from a resin supply nozzle (not shown). Thickness of mask 8 and through hole 1b
The opening diameter of the application window 8a determines the amount of resin to be applied and the application state. Further, a plurality of application windows 8a are formed in the mask 8 corresponding to the plurality of through holes 1b, and a squeegee 9 is disposed so as to be movable in the width direction of the TAB tape 8 corresponding to each of the application windows 8a, thereby improving work efficiency. Have improved. As a result, as shown in FIG. 5, the resin 5 supplied onto the semiconductor pellet 4 from the through hole 1b includes the surface of the semiconductor pellet 4, the connection portion between the electrode 4a and the inner lead 2a, The periphery of the through hole 1b is covered to improve the reliability of the electronic component.

【0003】[0003]

【発明が解決しようとする課題】ところで、半導体ペレ
ット4が液晶表示装置の駆動用の半導体ペレットのよう
に、外形寸法が20mm×1.5mmと細長い場合、透
孔1bはこれより0.5mm程度大きく形成されるが、
これに樹脂被覆すると図6に示すように透孔1b内で樹
脂5の一部に空洞5aができたり、この空洞が外表面に
露呈して樹脂の厚みが局部的に薄くなり、防湿性が低下
するという問題があった。この空洞が生じる原因とし
て、スキージ9の傾斜面で樹脂5を押圧し移動させる際
に、この傾斜面と接触する樹脂5には図7に示すように
移動方向の力fが作用し、スキージ9と直交する方向の
力f1とスキージ9の面に沿う上向きの力f2に分けら
れるが、塗布窓8aの内壁に沿って樹脂5を押し込む方
向の力成分は小さく、むしろ力f1、f2は塗布窓8a
の内壁から樹脂を剥離させるように作用するためと考え
られる。またマスク8上に樹脂5を供給してスキージ9
で押すときに、図8に示すようにスキージ9と樹脂5の
間に空気10が閉じ込められ、この空気10がスキージ
9からの前方への押圧力と樹脂5から後方への押圧力に
より圧縮され、マスク8の塗布窓8a位置で先行して供
給された樹脂5に圧縮された空気10がかぶさって局部
的に強く樹脂を押し下げることも空洞が生じる原因と考
えられる。この状態をさらに観察すると、インナリード
2aの中間を屈曲させて、リード基部と遊端との間に段
差を形成することにより、マスク8の下面とリードとの
間に空隙が形成されている場合には、空洞の発生が顕著
であった。このような空洞や樹脂の厚みのばらつきは電
子部品の耐湿性を低下させ信頼性を低下させるため改善
が望まれていた。
In the case where the semiconductor pellet 4 has a slender outer dimension of 20 mm.times.1.5 mm like a semiconductor pellet for driving a liquid crystal display device, the through hole 1b has a length of about 0.5 mm. Largely formed,
When this is coated with a resin, as shown in FIG. 6, a cavity 5a is formed in a part of the resin 5 in the through hole 1b, or this cavity is exposed on the outer surface, and the thickness of the resin is locally reduced, so that the moisture resistance is reduced. There was a problem of lowering. As a cause of this cavity, when the resin 5 is pressed and moved on the inclined surface of the squeegee 9, a force f in the moving direction acts on the resin 5 in contact with the inclined surface as shown in FIG. Is divided into a force f1 in a direction orthogonal to the direction of the arrow and an upward force f2 along the surface of the squeegee 9. The force component in the direction of pushing the resin 5 along the inner wall of the application window 8a is small. 8a
It is considered that the resin acts to peel off the resin from the inner wall. Further, the resin 5 is supplied onto the mask 8 so that the squeegee 9
8, the air 10 is confined between the squeegee 9 and the resin 5 as shown in FIG. 8, and the air 10 is compressed by the forward pressing force from the squeegee 9 and the backward pressing force from the resin 5. Also, it is considered that the compressed air 10 covers the resin 5 previously supplied at the position of the application window 8a of the mask 8 and strongly presses down the resin locally, which is also considered to be a cause of the cavity. Further observation of this state reveals that a gap is formed between the lower surface of the mask 8 and the lead by bending the middle of the inner lead 2a to form a step between the lead base and the free end. , The occurrence of cavities was remarkable. Such a variation in the thickness of the cavity and the resin lowers the moisture resistance of the electronic component and lowers the reliability.

【0004】[0004]

【課題を解決するための手段】本発明は上記課題の解決
を目的として提案されたもので、矩形状の樹脂被覆予定
部をその短径を長手方向に所定の間隔で配列したテープ
部材を支持するテープ支持部と、テープ支持部上に配置
されてテープ部材の樹脂被覆予定部を含む領域を覆いか
つ樹脂被覆予定部に対応して矩形状の塗布窓を開口させ
たマスクと、マスク上を塗布窓の長径方向の外方位置か
ら塗布窓を横切って摺動し流動化した樹脂を塗布窓から
テープ部材の樹脂被覆予定部に供給するスキージとを備
えた樹脂被覆装置において、上記マスクの塗布窓の長径
方向の対向面を上方に向かって拡開させたことを特徴と
する樹脂被覆装置を提供する。
SUMMARY OF THE INVENTION The present invention has been proposed for solving the above-mentioned problems, and has a rectangular resin coating portion which supports a tape member having its short diameter arranged at predetermined intervals in the longitudinal direction. A tape support portion, a mask disposed on the tape support portion, covering a region including the resin coating planned portion of the tape member, and opening a rectangular application window corresponding to the resin coating planned portion; A squeegee for sliding the fluidized resin slidably across the application window from an outer position in the major axis direction of the application window and supplying the fluidized resin from the application window to the resin coating scheduled portion of the tape member; A resin coating apparatus characterized in that an opposing surface in the major axis direction of a window is expanded upward.

【0005】[0005]

【発明の実施の形態】本発明による樹脂被覆装置は、矩
形状の塗布窓を形成したマスク上で、スキージを塗布窓
の長径方向に横切って移動させ樹脂を塗布窓に供給する
装置であって、マスクに形成した塗布窓の長径方向の対
向面を上方に向かって拡開させたことを特徴とするが、
テープ部材として、矩形状の透孔を有する絶縁テープに
前記透孔内に延在するインナリードを含む導電パターン
を形成したTABテープの前記透孔内に配置した半導体
ペレットとインナリードとを電気的に接続したTAB式
半導体装置中間構体に適用できる。この場合、テープ部
材のインナリードが、透孔の長径方向には密に、短径方
向には粗に形成されて、インナリード基部と遊端との間
に段差が形成され、マスクの塗布窓の少なくとも長径が
TABテープの透孔より径小に形成され、塗布窓の長径
方向の対向面と隣接する下面とインナリードとの間に間
隙が形成されものではきわめて有効である。また、マス
ク塗布窓の長径方向の対向面を上方に向かって拡開させ
るにはテーパ面としたり、凸湾曲面とすることができ
る。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A resin coating apparatus according to the present invention is an apparatus for supplying a resin to a coating window by moving a squeegee across a longitudinal direction of a coating window on a mask having a rectangular coating window. Characterized in that the opposite surface of the coating window formed in the mask in the longitudinal direction is expanded upward.
As a tape member, a semiconductor pellet and an inner lead disposed in the through hole of a TAB tape in which a conductive pattern including an inner lead extending into the through hole is formed on an insulating tape having a rectangular through hole are electrically connected. Can be applied to an intermediate structure of a TAB type semiconductor device connected to a semiconductor device. In this case, the inner lead of the tape member is formed densely in the major axis direction of the through hole and coarsely formed in the minor axis direction, so that a step is formed between the inner lead base and the free end, and the coating window of the mask is formed. This is extremely effective when at least the major axis is formed to be smaller in diameter than the through hole of the TAB tape, and a gap is formed between the inner lead and the lower surface adjacent to the major surface of the application window in the longitudinal direction. In addition, a tapered surface or a convex curved surface can be used to expand the facing surface in the major diameter direction of the mask application window upward.

【0006】[0006]

【実施例】以下に本発明の実施例を図1から説明する。
図において、図2乃至図4と同一物には同一符号を付し
重複する説明を省略する。本発明による樹脂被覆装置は
符号11を付したマスクに特徴がある。即ちこのマスク
11は塗布窓11aの内周の内、スキージ9が移動する
方向の対向内面を上方に向かって拡開するようにテーパ
面11bとしたことのみである。このテーパ面11bの
傾斜角度は、この面を含む平面Pに対してスキージ9と
直交する面Qが上から交差するように形成する。このよ
うにテーパ面11bを形成することによりスキージ9に
よって押されて移動する樹脂5には、スキージ9と直交
する方向(平面Q方向)の力f1がかかり、テーパ面1
1b上に密接しながら移動して透孔1bに近づき半導体
ペレット4の表面を覆う。そのため塗布窓11aの内周
には樹脂5を通してスキージ9による圧力が連続してか
かり空洞を生じることはない。また、仮にスキージ9と
樹脂5の間に空気を巻き込んでいると、この空気にはス
キージ9からの押圧力と同時に樹脂5から押し戻される
圧力を受けて圧縮されているが、この空気がテーパ面1
1b部分に達しスキージ9から離れると、スキージ9か
らの押圧力が及ばなくなり樹脂5を透孔1b方向に押し
込んで膨張し押圧力が急激に低下する。この空気の膨張
による圧力は沿面距離が長いテーパ面11bによって遮
断されマスク11より下方には及ばない。そのため、透
孔1b内に空洞が形成されることはなく良好な樹脂被覆
ができる。また、このマスク11を用いた樹脂塗布装置
では、特にインナリード2aの基部と遊端との間で段差
があってマスク11の下面とインナリード2aとの間に
空隙が形成されるような場合でも、樹脂5は力f1を受
けて塗布窓11aのテーパ面11b上を密接して移動す
るため、テーパ面11bからインナリード2a上に移動
した樹脂5にも力f1が作用し、樹脂5はインナリード
2a上で押し拡げられ空隙部分に十分な樹脂を送り込む
ことができ、さらに塗布窓11a全面から透孔1b全面
に押し込まれた樹脂により空隙部分は樹脂が充実しイン
ナリードの基部側を完全に樹脂被覆して空洞の発生をな
くすことができる。本発明は上記実施例にのみ限定され
るものではなく、例えばテープ部材はTAB半導体装置
の中間構体だけでなく、矩形状の樹脂被覆予定部を有す
るテープ部材であれは本発明を適用することかできる。
また上記実施例ではマスク11の塗布窓11aにテーパ
面11bを形成したが、このテーパ面は放電加工、エッ
チングなどで形成することができ、このような加工技術
によりテーパ面だけでなく、凸湾曲面や階段状に形成す
ることもできる。また階段状の塗布窓を形成する場合に
は、径大の塗布窓を形成したマスクに、径小の矩形状平
板を貼り付けても良い。
FIG. 1 shows an embodiment of the present invention.
In the drawings, the same components as those in FIGS. 2 to 4 are denoted by the same reference numerals, and redundant description will be omitted. The resin coating apparatus according to the present invention is characterized by a mask denoted by reference numeral 11. In other words, the mask 11 has only a tapered surface 11b so that the inner surface of the coating window 11a facing the direction in which the squeegee 9 moves moves toward the upper side. The inclination angle of the tapered surface 11b is formed such that a surface Q orthogonal to the squeegee 9 intersects a plane P including the surface from above. By forming the tapered surface 11b in this way, a force f1 in a direction (plane Q direction) orthogonal to the squeegee 9 is applied to the resin 5 which is pushed and moved by the squeegee 9, and
1b while closely moving and approaching the through hole 1b to cover the surface of the semiconductor pellet 4. Therefore, the pressure from the squeegee 9 is continuously applied to the inner periphery of the application window 11a through the resin 5 and no cavity is formed. Also, if air is entrapped between the squeegee 9 and the resin 5, the air is compressed by receiving the pressure from the squeegee 9 and the pressure pushed back from the resin 5 at the same time. 1
When the squeegee 9 is separated from the squeegee 9 and reaches the portion 1b, the pressing force from the squeegee 9 does not reach and the resin 5 is pushed in the direction of the through-hole 1b to expand and the pressing force drops rapidly. The pressure due to the expansion of the air is blocked by the tapered surface 11b having a long creepage distance and does not reach below the mask 11. Therefore, no cavity is formed in the through hole 1b, and good resin coating can be performed. Further, in the resin coating apparatus using the mask 11, especially when there is a step between the base portion and the free end of the inner lead 2a and a gap is formed between the lower surface of the mask 11 and the inner lead 2a. However, since the resin 5 receives the force f1 and moves closely on the tapered surface 11b of the application window 11a, the force f1 also acts on the resin 5 moved from the tapered surface 11b to the inner lead 2a, and the resin 5 Sufficient resin can be fed into the gap by being spread on the inner lead 2a, and the resin is pushed into the entire surface of the through hole 1b from the entire surface of the application window 11a. Can be eliminated by coating with a resin. The present invention is not limited only to the above-described embodiment. For example, the present invention is applicable to a tape member not only for an intermediate structure of a TAB semiconductor device but also for a tape member having a rectangular resin coating scheduled portion. it can.
Further, in the above embodiment, the tapered surface 11b is formed in the application window 11a of the mask 11, but this tapered surface can be formed by electric discharge machining, etching, or the like. It can also be formed in a plane or step shape. In the case of forming a step-shaped coating window, a small-diameter rectangular flat plate may be attached to a mask having a large-diameter coating window.

【0007】[0007]

【発明の効果】以上のように本発明によれば、空洞や樹
脂の厚みのばらつきのない樹脂被覆が可能で、耐湿性が
良好で信頼性の高い電子部品を実現できる。
As described above, according to the present invention, it is possible to realize a highly reliable electronic component which can be coated with a resin without variation in the thickness of the cavity and the resin, and has a good moisture resistance.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の実施例を示す要部側断面図FIG. 1 is a sectional side view of a main part showing an embodiment of the present invention.

【図2】 テープ部材としてのTAB式半導体装置の中
間構体を示す要部斜視図
FIG. 2 is a perspective view of a main part showing an intermediate structure of a TAB type semiconductor device as a tape member.

【図3】 図2テープ部材に樹脂被覆する装置の正面図FIG. 3 is a front view of an apparatus for coating the tape member with a resin;

【図4】 図3装置の側断面図FIG. 4 is a side sectional view of the apparatus of FIG. 3;

【図5】 図3装置により樹脂被覆されたテープ部材の
側断面図
5 is a side sectional view of a tape member coated with resin by the apparatus in FIG. 3;

【図6】 図3装置による課題を説明するためのテープ
部材の側断面図
FIG. 6 is a side sectional view of a tape member for explaining a problem caused by the apparatus in FIG. 3;

【図7】 スキージで押される樹脂にかかる力について
説明する要部側断面図
FIG. 7 is a sectional side view of a main part for explaining a force applied to a resin pressed by a squeegee

【図8】 図3装置の他の課題を示す要部側断面図8 is a sectional side view of a main part showing another problem of the apparatus in FIG. 3;

【符号の説明】[Explanation of symbols]

1b 樹脂被覆予定部(透孔) 3 テープ部材(TABテープ) 7 テープ支持部 9 スキージ 11 マスク 11a 塗布窓 1b Resin coating planned portion (through hole) 3 Tape member (TAB tape) 7 Tape support portion 9 Squeegee 11 Mask 11a Application window

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】矩形状の樹脂被覆予定部をその短径を長手
方向に所定の間隔で配列したテープ部材を支持するテー
プ支持部と、テープ支持部上に配置されてテープ部材の
樹脂被覆予定部を含む領域を覆いかつ樹脂被覆予定部に
対応して矩形状の塗布窓を開口させたマスクと、マスク
上で塗布窓の長径方向の外方位置から塗布窓を横切り流
動化した樹脂を塗布窓からテープ部材の樹脂被覆予定部
に供給するスキージとを備えた樹脂被覆装置において、 上記マスクの塗布窓の長径方向の対向面を上方に向かっ
て拡開させたことを特徴とする樹脂被覆装置。
1. A tape supporting portion for supporting a tape member having a rectangular portion to be covered with a resin and a short diameter of which is arranged at predetermined intervals in a longitudinal direction, and a resin covering portion to be disposed on the tape supporting portion to cover the tape member. A mask that covers the area including the part and has a rectangular application window opened corresponding to the part to be coated with resin, and applies the fluidized resin across the application window from the outside of the application window in the major axis direction on the mask What is claimed is: 1. A resin coating apparatus comprising: a squeegee for supplying a resin coating portion of a tape member from a window; wherein a long-diameter facing surface of the coating window of the mask is expanded upward. .
【請求項2】テープ部材が、矩形状の透孔を有する絶縁
テープに前記透孔内に延在するインナリードを含む導電
パターンを形成したTABテープの前記透孔内に配置し
た半導体ペレットとインナリードとを電気的に接続した
TAB式半導体装置中間構体であることを特徴とする請
求項1に記載の樹脂被覆装置。
2. A semiconductor pellet and an inner member disposed in a through hole of a TAB tape in which a tape member is formed on an insulating tape having a rectangular through hole and a conductive pattern including inner leads extending into the through hole. The resin coating apparatus according to claim 1, wherein the resin coating apparatus is a TAB type semiconductor device intermediate structure electrically connected to a lead.
【請求項3】テープ部材のインナリードが、透孔の長径
方向には密に、短径方向には粗に形成されて、インナリ
ード基部と遊端との間に段差が形成され、マスクの塗布
窓の少なくとも長径がTABテープの透孔より径小に形
成され、塗布窓の長径方向の対向面と隣接する下面とイ
ンナリードとの間に間隙が形成されたことを特徴とする
請求項2に記載の樹脂被覆装置。
3. The inner lead of the tape member is formed densely in the major axis direction of the through hole and coarsely formed in the minor axis direction, so that a step is formed between the inner lead base and the free end. 3. The coating window according to claim 2, wherein at least the longer diameter of the coating window is formed smaller than the diameter of the through hole of the TAB tape, and a gap is formed between the inner lead and the lower surface adjacent to the long diameter facing surface of the coating window. The resin coating device according to item 1.
【請求項4】マスク塗布窓の長径方向の対向面をテーパ
面としたことを特徴とする請求項1に記載の樹脂被覆装
置。
4. The resin coating apparatus according to claim 1, wherein a surface facing the major axis direction of the mask application window is a tapered surface.
【請求項5】マスク塗布窓の長径方向の対向面を凸湾曲
面としたことを特徴とする請求項1に記載の樹脂被覆装
置。
5. The resin coating apparatus according to claim 1, wherein the surface facing the major axis direction of the mask application window is a convex curved surface.
JP4657298A 1998-02-27 1998-02-27 Resin coating device Pending JPH11251341A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4657298A JPH11251341A (en) 1998-02-27 1998-02-27 Resin coating device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4657298A JPH11251341A (en) 1998-02-27 1998-02-27 Resin coating device

Publications (1)

Publication Number Publication Date
JPH11251341A true JPH11251341A (en) 1999-09-17

Family

ID=12751039

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4657298A Pending JPH11251341A (en) 1998-02-27 1998-02-27 Resin coating device

Country Status (1)

Country Link
JP (1) JPH11251341A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6576178B2 (en) 1999-12-22 2003-06-10 Nec Compound Semiconductor Devices, Ltd. Resin sealing apparatus and resin sealing method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6576178B2 (en) 1999-12-22 2003-06-10 Nec Compound Semiconductor Devices, Ltd. Resin sealing apparatus and resin sealing method

Similar Documents

Publication Publication Date Title
CN101689535B (en) Semiconductor device and its manufacturing method, and display and its manufacturing method
US5893623A (en) Structure and method for mounting semiconductor devices, and liquid crystal display
US6650020B2 (en) Resin-sealed semiconductor device
KR100317756B1 (en) Ball contact part of flip chip device
JPH08293529A (en) Semiconductor device, manufacture thereof and electronic device using thereof
US6465876B1 (en) Semiconductor device and lead frame therefor
JPH11251341A (en) Resin coating device
JP3915287B2 (en) Method for manufacturing electrostatic actuator
US7169639B2 (en) Semiconductor device manufacturing method
JP2816084B2 (en) Solder coating method, semiconductor device manufacturing method, and squeegee
US20240157700A1 (en) Discharge unit, liquid discharge head, and manufacturing method of discharge unit
JP4508277B2 (en) Manufacturing method of ceramic multilayer substrate
JPH10341068A (en) Printed wiring board and method for mounting electronic parts
EP0622845A2 (en) Apparatus and method for tape automated bonding beam lead insulation
JPH05218130A (en) Tab type semiconductor device and manufacturing device therefor
JP2812806B2 (en) Package for integrated circuit with test pad
JP3539475B2 (en) Ink jet recording head and flexible cable connection method
JP3343062B2 (en) Partial plating equipment
CN113692114A (en) Circuit board and manufacturing method thereof
JPH07161771A (en) Film carrier, electronic part and mold releasing paper peeling method
JPH1041344A (en) Tape carrier for semiconductor devices
JPH0883798A (en) Bump electrode forming method and filament member for forming the electrode
JP2003303918A (en) Semiconductor device and wiring plate used for the same, and manufacturing method of the semiconductor device
CN111787692A (en) Ink-jet chip packaging structure
JPS6092638A (en) Supporter for mounting electric circuit device

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20041217

RD02 Notification of acceptance of power of attorney

Effective date: 20050118

Free format text: JAPANESE INTERMEDIATE CODE: A7422

A711 Notification of change in applicant

Effective date: 20050511

Free format text: JAPANESE INTERMEDIATE CODE: A711

A977 Report on retrieval

Effective date: 20070115

Free format text: JAPANESE INTERMEDIATE CODE: A971007

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20070123

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20070522