JPH11237642A - Active matrix type liquid crystal display device - Google Patents
Active matrix type liquid crystal display deviceInfo
- Publication number
- JPH11237642A JPH11237642A JP3857998A JP3857998A JPH11237642A JP H11237642 A JPH11237642 A JP H11237642A JP 3857998 A JP3857998 A JP 3857998A JP 3857998 A JP3857998 A JP 3857998A JP H11237642 A JPH11237642 A JP H11237642A
- Authority
- JP
- Japan
- Prior art keywords
- liquid crystal
- crystal display
- wiring
- signal input
- display device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、液晶表示装置に関
するものであり、特に薄膜トランジスタ(以下、TFT
と表記する)等のスイッチング素子を用いたアクティブ
マトリクス型液晶表示装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal display device, and more particularly, to a thin film transistor (hereinafter referred to as a TFT).
The present invention relates to an active matrix type liquid crystal display device using a switching element such as
【0002】[0002]
【従来の技術】液晶表示装置は、表示電極を形成した一
対の基板間に液晶を挟み、この表示電極間に電気信号を
加えることで外部から入射する光を変調して情報を表示
するものである。この液晶表示装置は、CRTに比べて
薄い、軽量および低消費電力等の利点を有し、OA機器
またはAV機器等の分野で実用化が進んでいる。中で
も、TFT等のスイッチング素子を用いたアクティブマ
トリクス型液晶表示装置の需要は年々高まっており、ア
クティブマトリクス型液晶表示装置の製造歩留まりの向
上および出荷前の表示品位検査の正確性が要求されてい
る。2. Description of the Related Art A liquid crystal display device displays information by interposing liquid crystal between a pair of substrates on which display electrodes are formed, and modulating light incident from the outside by applying an electric signal between the display electrodes. is there. This liquid crystal display device has advantages such as thinness, light weight, and low power consumption as compared with a CRT, and is being put to practical use in the field of OA equipment or AV equipment. Among them, the demand for an active matrix type liquid crystal display device using a switching element such as a TFT is increasing year by year, and there is a demand for an improvement in the production yield of the active matrix type liquid crystal display device and accuracy of display quality inspection before shipment. .
【0003】液晶表示装置で表示を行うために、液晶表
示パネルの信号入力端子部と、液晶表示パネルを駆動さ
せるためのICを搭載したTCP(Tape Carr
ier Package)とを電気的に接続することで
制御を行っている。図6に示すように、液晶表示パネル
の信号入力端子部の導電性材料からなる配線2と、TC
Pのベースフィルム10上の導電性材料からなる配線9
との電気的な接続は、異方性導電膜(以下、ACF(A
nisotropic ConductiveFil
m)と表記する)中の導電粒子11を介して行われる。
ACFは、ハンダあるいはニッケル等の金属粒子、また
は金属メッキしたプラスチックボール等からなる導電粒
子11を接着剤12中に分散した透明性を有する厚さ1
5〜30μmのフィルムである。In order to display on a liquid crystal display device, a signal input terminal of the liquid crystal display panel and a TCP (Tape Carr) equipped with an IC for driving the liquid crystal display panel are mounted.
The control is performed by electrically connecting the IC card to an E.I. As shown in FIG. 6, a wiring 2 made of a conductive material for a signal input terminal of a liquid crystal display panel and a TC
Wiring 9 made of conductive material on P base film 10
Is electrically connected to an anisotropic conductive film (hereinafter referred to as ACF (A
nisotropic ConductiveFil
m)) through the conductive particles 11.
The ACF has a thickness 1 having transparency in which conductive particles 11 made of metal particles such as solder or nickel or metal-plated plastic balls are dispersed in an adhesive 12.
5-30 μm film.
【0004】液晶表示パネルの信号入力端子部は、図7
に示すように、基板1上に形成されているTFTのゲー
トラインまたはソースラインが延在されて配線2が形成
され、配線2上に絶縁膜4が積層され、配線2上の絶縁
膜4はエッチング等によって除去され、配線2上に電極
材料3が形成されることによって形成されている。The signal input terminal of the liquid crystal display panel is shown in FIG.
As shown in FIG. 1, the wiring 2 is formed by extending the gate line or source line of the TFT formed on the substrate 1, the insulating film 4 is laminated on the wiring 2, and the insulating film 4 on the wiring 2 is It is formed by removing the electrode material 3 on the wiring 2 by etching or the like.
【0005】[0005]
【発明が解決しようとする課題】しかしながら、図7に
示すように、エッチング時に配線2の両端部に絶縁膜4
が残ることがあり、この場合には電極材料3の両端部が
盛り上がってしまう。このような状態になると、液晶表
示パネルにTCPを実装する際に、電極材料3の両端部
の盛り上がりのために電極材料3とTCPとの接合面が
安定しないので、駆動信号が入力されてもTFTが動作
せずに輝線が発生する等の接続不良となる場合がある。However, as shown in FIG. 7, an insulating film 4 is formed on both ends of the wiring 2 during etching.
May remain, and in this case, both end portions of the electrode material 3 are raised. In such a state, when the TCP is mounted on the liquid crystal display panel, the bonding surface between the electrode material 3 and the TCP is not stable due to the swelling of both ends of the electrode material 3, so that even if a driving signal is input, In some cases, connection failure such as generation of a bright line without operation of the TFT occurs.
【0006】また、液晶表示パネルの表示品位検査の際
には、図8に示すように、保持ブロック14に取り付け
られたプローブピン13を電極材料3にコンタクトさせ
るが、電極材料3の両端部の盛り上がりにコンタクトす
るとプローブピン13が摩耗し、プローブピン13と電
極材料3との接触面が安定しなくなり、プローブピン1
3から駆動信号が入力されてもTFTが動作せずに輝線
が発生する等のコンタクト不良となって、検査良品率が
悪くなる。Further, at the time of display quality inspection of the liquid crystal display panel, as shown in FIG. 8, a probe pin 13 attached to a holding block 14 is brought into contact with the electrode material 3. When the protruding contact is made, the probe pin 13 is worn, and the contact surface between the probe pin 13 and the electrode material 3 becomes unstable.
Even if a drive signal is input from 3, the TFT does not operate and a contact failure such as generation of a bright line occurs, and the non-defective product rate deteriorates.
【0007】さらに、液晶を配向させるための配向膜に
ラビング等の配向処理を施す際に、液晶表示パネルの信
号入力端子部に配向膜が付着する場合がある。この場
合、図9(a)に示すように、電極材料3の両端部の盛
り上がり近傍に配向膜15が溜まり、プローブピン13
による検査の際に、図9(b)に示すように、プローブ
ピン13の先端部に配向膜15が付着する。配向膜15
は絶縁性であるため、プローブピン13の先端部に付着
しているとコンタクト不良となって、検査良品率が悪く
なる。Further, when the alignment film for aligning the liquid crystal is subjected to an alignment treatment such as rubbing, the alignment film may adhere to the signal input terminal of the liquid crystal display panel. In this case, as shown in FIG. 9A, the alignment film 15 accumulates near the bulges at both ends of the electrode material 3, and the probe pins 13
9B, the alignment film 15 adheres to the tip of the probe pin 13 as shown in FIG. Alignment film 15
Is insulative, and if it adheres to the tip of the probe pin 13, it causes a contact failure and lowers the non-defective test rate.
【0008】本発明は、以上のような従来の問題点に鑑
みなされたものであって、液晶表示パネルとTCPとの
接続不良および液晶表示パネル検査時のコンタクト不良
を低減することができるアクティブマトリクス型液晶表
示装置を提供することを目的としている。SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned conventional problems, and is an active matrix capable of reducing a connection failure between a liquid crystal display panel and a TCP and a contact failure at the time of inspection of a liquid crystal display panel. It is intended to provide a liquid crystal display device of the type.
【0009】[0009]
【課題を解決するための手段】前述した目的を達成する
ために、本発明の請求項1記載のアクティブマトリクス
型液晶表示装置は、薄膜トランジスタのゲートラインま
たはソースラインが延在されて配線が形成され、前記配
線上に絶縁膜が積層されるとともに、前記絶縁膜の駆動
回路を電気的に接続する接合面を除く箇所にコンタクト
ホールが設けられ、前記コンタクトホールを含む前記配
線の上方に位置する前記絶縁膜上に電極材料が形成され
ている信号入力端子部を有することを特徴としている。According to a first aspect of the present invention, there is provided an active matrix type liquid crystal display device in which a gate line or a source line of a thin film transistor is extended to form a wiring. An insulating film is laminated on the wiring, and a contact hole is provided at a position other than a bonding surface of the insulating film for electrically connecting a drive circuit, and the contact hole is provided above the wiring including the contact hole. It has a signal input terminal portion in which an electrode material is formed on an insulating film.
【0010】請求項2記載のアクティブマトリクス型液
晶表示装置は、請求項1記載のアクティブマトリクス型
液晶表示装置において、前記コンタクトホールは、表示
品位検査の際にプローブピンをコンタクトさせない箇所
に設けられていることを特徴としている。According to a second aspect of the present invention, there is provided an active matrix type liquid crystal display device according to the first aspect, wherein the contact hole is provided at a position where a probe pin is not contacted during a display quality inspection. It is characterized by having.
【0011】本発明のアクティブマトリクス型液晶表示
装置によれば、薄膜トランジスタのゲートラインまたは
ソースラインが延在されて配線が形成され、配線上に絶
縁膜が積層されるとともに、絶縁膜の駆動回路を電気的
に接続する接合面を除く箇所にコンタクトホールが設け
られ、コンタクトホールを含む配線の上方に位置する絶
縁膜上に電極材料が形成されている信号入力端子部を有
することにより、信号入力端子部の表面となる電極材料
が駆動回路との接合面において平坦な状態となるため、
電極材料とTCP等の駆動回路との接合面を安定な状態
で保つことができ、駆動信号が入力されても薄膜トラン
ジスタが動作せずに輝線が発生する等の接続不良を低減
することができる。According to the active matrix type liquid crystal display device of the present invention, a wiring is formed by extending a gate line or a source line of a thin film transistor, an insulating film is laminated on the wiring, and a driving circuit for the insulating film is formed. A contact hole is provided in a portion except for a joint surface for electrical connection, and a signal input terminal portion is provided in which an electrode material is formed on an insulating film located above a wiring including the contact hole. Because the electrode material that becomes the surface of the part becomes flat on the joint surface with the drive circuit,
The bonding surface between the electrode material and the driving circuit such as TCP can be kept in a stable state, and the connection failure such as the generation of a bright line without operating the thin film transistor even when the driving signal is input can be reduced.
【0012】また、コンタクトホールは、表示品位検査
の際にプローブピンをコンタクトさせない箇所に設けら
れていることにより、プローブピンを電極材料にコンタ
クトさせて検査する際に、プローブピンが摩耗すること
を低減することができ、プローブピンと電極材料との接
触面を安定な状態で保つことができるため、プローブピ
ンから駆動信号が入力されても薄膜トランジスタが動作
せずに輝線が発生する等のコンタクト不良を低減するこ
とができる。さらに、液晶を配向させるための配向膜に
ラビング等の配向処理を施す際に、電極材料上に配向膜
が溜まることがなく、プローブピンによる検査の際に、
プローブピンの先端部に配向膜が付着することがないた
め、絶縁性の配向膜がプローブピンの先端部に付着して
発生するコンタクト不良を低減することができる。Further, since the contact hole is provided at a place where the probe pin is not contacted during the display quality inspection, it is possible to prevent the probe pin from being worn when the probe pin is brought into contact with the electrode material and inspected. Since the contact surface between the probe pin and the electrode material can be maintained in a stable state, even if a driving signal is input from the probe pin, the thin film transistor does not operate and a contact failure such as a bright line is generated. Can be reduced. Furthermore, when performing an alignment treatment such as rubbing on the alignment film for aligning the liquid crystal, the alignment film does not accumulate on the electrode material.
Since the alignment film does not adhere to the tip of the probe pin, it is possible to reduce the contact failure that occurs when the insulating alignment film adheres to the tip of the probe pin.
【0013】[0013]
【発明の実施の形態】図1乃至図5を用いて、本発明の
実施の形態について説明する。図1は本発明に係わる液
晶表示装置の信号入力端子部を示す平面図、図2は図1
のA−A線における断面図、図3は図2を側面から見た
場合を示す説明図、図4はプローブピンによる検査を示
す説明図、図5は液晶表示パネルの信号入力端子部とT
CPとの接続部を示す説明図である。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described with reference to FIGS. FIG. 1 is a plan view showing a signal input terminal portion of a liquid crystal display device according to the present invention, and FIG.
3 is an explanatory view showing the case where FIG. 2 is viewed from the side, FIG. 4 is an explanatory view showing inspection using a probe pin, and FIG. 5 is a signal input terminal portion of a liquid crystal display panel and T
It is explanatory drawing which shows the connection part with CP.
【0014】図1および図2に示すように、液晶表示パ
ネル5を構成している一方の基板1に信号入力端子6が
形成されている。信号入力端子6は、Ta、Cr、Al
またはTi等からなるTFTのゲートラインまたはソー
スラインを延在して配線2を形成し、配線2上にSiN
X等の絶縁膜4を積層して、絶縁膜4の一部にエッチン
グ等によってコンタクトホール7を形成し、コンタクト
ホール7を含む絶縁膜4上にITO等の電極材料3を形
成することによって形成される。As shown in FIGS. 1 and 2, a signal input terminal 6 is formed on one substrate 1 constituting the liquid crystal display panel 5. The signal input terminal 6 is made of Ta, Cr, Al
Alternatively, a wiring 2 is formed by extending a gate line or a source line of a TFT made of Ti or the like, and SiN is formed on the wiring 2.
An insulating film 4 such as X is laminated, a contact hole 7 is formed in a part of the insulating film 4 by etching or the like, and an electrode material 3 such as ITO is formed on the insulating film 4 including the contact hole 7. Is done.
【0015】コンタクトホール7は、TCPを圧着する
際の接合面8を除く箇所で、かつ表示品位検査の際にプ
ローブピンをコンタクトさせない箇所に設ける。The contact hole 7 is provided at a position other than the bonding surface 8 when the TCP is crimped, and at a position where the probe pin is not brought into contact during the display quality inspection.
【0016】信号入力端子6を側面から見れば、図3に
示すように、最上層の電極材料3の表面が平坦な状態と
なっている。When the signal input terminal 6 is viewed from the side, as shown in FIG. 3, the surface of the uppermost electrode material 3 is flat.
【0017】このため、図4に示すように、保持ブロッ
ク14に取り付けられたプローブピン13を電極材料3
にコンタクトさせて検査する際に、プローブピン13が
摩耗することを低減することができ、プローブピン13
と電極材料3との接触面を安定な状態で保つことができ
るため、プローブピン13から駆動信号が入力されても
TFTが動作せずに輝線が発生する等のコンタクト不良
を低減して、検査良品率を向上させることができる。Therefore, as shown in FIG. 4, the probe pin 13 attached to the holding block 14 is
When the probe pin 13 is inspected by contacting the probe pin 13, wear of the probe pin 13 can be reduced.
Since the contact surface between the electrode and the electrode material 3 can be maintained in a stable state, even if a driving signal is input from the probe pin 13, the TFT does not operate and a contact failure such as generation of a bright line is reduced, and inspection is performed. The non-defective rate can be improved.
【0018】さらに、液晶を配向させるための配向膜に
ラビング等の配向処理を施す際に、電極材料3上に配向
膜が溜まりことがなく、プローブピン13による検査の
際に、プローブピン13の先端部に配向膜が付着するこ
とがないため、絶縁性の配向膜がプローブピン13の先
端部に付着して発生するコンタクト不良を低減し、検査
良品率を向上させることができる。Further, when the alignment film for aligning the liquid crystal is subjected to an alignment treatment such as rubbing, the alignment film does not accumulate on the electrode material 3, and the inspection with the probe pin 13 causes the alignment of the probe pin 13. Since the alignment film does not adhere to the distal end portion, it is possible to reduce the contact failure that occurs when the insulating alignment film adheres to the distal end portion of the probe pin 13 and improve the non-defective product rate.
【0019】また、図5に示すように、電極材料3とT
CPのベースフィルム10上の導電性材料からなる配線
9とを、ハンダあるいはニッケル等の金属粒子、または
金属メッキしたプラスチックボール等からなる導電粒子
11を接着剤12中に分散した透明性を有する厚さ15
〜30μmのフィルムからなるACFを用いて圧着する
際には、電極材料3とTCPの配線9との接合面を安定
な状態で保つことができるため、駆動信号が入力されて
もTFTが動作せずに輝線が発生する等の接続不良を低
減して、液晶表示装置の良品率を向上させることができ
る。As shown in FIG. 5, the electrode material 3 and T
The wiring 9 made of a conductive material on the base film 10 of the CP is made of a metal particle such as solder or nickel, or a conductive particle 11 made of a metal-plated plastic ball or the like dispersed in an adhesive 12. 15
When pressure bonding is performed using an ACF made of a film having a thickness of about 30 μm, the bonding surface between the electrode material 3 and the TCP wiring 9 can be maintained in a stable state, so that the TFT operates even when a drive signal is input. In addition, it is possible to reduce poor connection such as generation of bright lines, and to improve the non-defective rate of the liquid crystal display device.
【0020】[0020]
【発明の効果】以上の説明のように、本発明のアクティ
ブマトリクス型液晶表示装置によれば、薄膜トランジス
タのゲートラインまたはソースラインが延在されて配線
が形成され、配線上に絶縁膜が積層されるとともに、絶
縁膜の駆動回路を電気的に接続する接合面を除く箇所に
コンタクトホールが設けられ、コンタクトホールを含む
配線の上方に位置する絶縁膜上に電極材料が形成されて
いる信号入力端子部を有することにより、信号入力端子
部の表面となる電極材料が駆動回路との接合面において
平坦な状態となるため、電極材料とTCP等の駆動回路
との接合面を安定な状態で保つことができ、駆動信号が
入力されても薄膜トランジスタが動作せずに輝線が発生
する等の接続不良を低減して、液晶表示装置の良品率を
向上させることができる。As described above, according to the active matrix type liquid crystal display device of the present invention, a wiring is formed by extending a gate line or a source line of a thin film transistor, and an insulating film is laminated on the wiring. A signal input terminal in which a contact hole is provided in a portion other than a bonding surface of the insulating film for electrically connecting a drive circuit, and an electrode material is formed on the insulating film located above the wiring including the contact hole. By having the portion, the electrode material serving as the surface of the signal input terminal portion becomes flat at the joint surface with the drive circuit, so that the joint surface between the electrode material and the drive circuit such as TCP is kept in a stable state. It is possible to improve the yield of liquid crystal display devices by reducing connection failures such as the occurrence of bright lines without operating the thin film transistor even when a drive signal is input. Kill.
【0021】また、コンタクトホールは、表示品位検査
の際にプローブピンをコンタクトさせない箇所に設けら
れていることにより、プローブピンを電極材料にコンタ
クトさせて検査する際に、プローブピンが摩耗すること
を低減することができ、プローブピンと電極材料との接
触面を安定な状態で保つことができるため、プローブピ
ンから駆動信号が入力されても薄膜トランジスタが動作
せずに輝線が発生する等のコンタクト不良を低減して、
検査良品率を向上させることができる。さらに、液晶を
配向させるための配向膜にラビング等の配向処理を施す
際に、電極材料上に配向膜が溜まりことがなく、プロー
ブピンによる検査の際に、プローブピンの先端部に配向
膜が付着することがないため、絶縁性の配向膜がプロー
ブピンの先端部に付着して発生するコンタクト不良を低
減し、検査良品率を向上させることができる。Further, since the contact hole is provided at a position where the probe pin is not contacted during the display quality inspection, it is possible to prevent the probe pin from being worn when the probe pin is brought into contact with the electrode material and inspected. Since the contact surface between the probe pin and the electrode material can be maintained in a stable state, even if a driving signal is input from the probe pin, the thin film transistor does not operate and a contact failure such as a bright line is generated. Reduce
The inspection non-defective rate can be improved. Furthermore, when performing an alignment treatment such as rubbing on the alignment film for aligning the liquid crystal, the alignment film does not accumulate on the electrode material. Since there is no sticking, it is possible to reduce the contact failure caused by the insulating alignment film sticking to the tip of the probe pin, and to improve the non-defective product rate.
【図1】本発明に係わる液晶表示装置の信号入力端子部
を示す平面図である。FIG. 1 is a plan view showing a signal input terminal portion of a liquid crystal display device according to the present invention.
【図2】図1のA−A線における断面図である。FIG. 2 is a sectional view taken along line AA of FIG.
【図3】図2を側面から見た場合を示す説明図である。FIG. 3 is an explanatory diagram showing a case where FIG. 2 is viewed from a side.
【図4】プローブピンによる検査を示す説明図である。FIG. 4 is an explanatory diagram showing an inspection using a probe pin.
【図5】液晶表示パネルの信号入力端子部とTCPとの
接続部を示す説明図である。FIG. 5 is an explanatory diagram showing a connection portion between a signal input terminal portion and a TCP of the liquid crystal display panel.
【図6】従来の液晶表示パネルの信号入力端子部とTC
Pとの接続部を示す説明図である。FIG. 6 shows a signal input terminal portion and a TC of a conventional liquid crystal display panel.
It is explanatory drawing which shows the connection part with P.
【図7】従来の液晶表示パネルの信号入力端子部を示す
説明図である。FIG. 7 is an explanatory diagram showing a signal input terminal portion of a conventional liquid crystal display panel.
【図8】従来のプローブピンによる検査を示す説明図で
ある。FIG. 8 is an explanatory view showing an inspection using a conventional probe pin.
【図9】(a)および(b)はプローブピンの先端部に
配向膜が付着する様子を示す説明図である。FIGS. 9A and 9B are explanatory views showing a state in which an alignment film adheres to the tip of a probe pin.
1 基板 2 配線 3 電極材料 4 絶縁膜 5 液晶表示パネル 6 信号入力端子 7 コンタクトホール 8 TCPを圧着する際の接合面 9 TCPの配線 10 TCPのベースフィルム 11 ACFの導電粒子 12 ACFの接着剤 13 プローブピン 14 保持ブロック 15 配向膜 DESCRIPTION OF SYMBOLS 1 Substrate 2 Wiring 3 Electrode material 4 Insulating film 5 Liquid crystal display panel 6 Signal input terminal 7 Contact hole 8 Joining surface at the time of press-fitting TCP 9 TCP wiring 10 TCP base film 11 ACF conductive particles 12 ACF adhesive 13 Probe pin 14 Holding block 15 Alignment film
Claims (2)
ソースラインが延在されて配線が形成され、前記配線上
に絶縁膜が積層されるとともに、前記絶縁膜の駆動回路
を電気的に接続する接合面を除く箇所にコンタクトホー
ルが設けられ、前記コンタクトホールを含む前記配線の
上方に位置する前記絶縁膜上に電極材料が形成されてい
る信号入力端子部を有することを特徴とするアクティブ
マトリクス型液晶表示装置。1. A wiring is formed by extending a gate line or a source line of a thin film transistor, an insulating film is laminated on the wiring, and a junction surface of the insulating film for electrically connecting a driving circuit is excluded. An active matrix type liquid crystal display device, comprising: a signal input terminal portion in which a contact hole is provided at a location and an electrode material is formed on the insulating film located above the wiring including the contact hole.
の際にプローブピンをコンタクトさせない箇所に設けら
れていることを特徴とする請求項1記載のアクティブマ
トリクス型液晶表示装置。2. The active matrix type liquid crystal display device according to claim 1, wherein said contact hole is provided at a position where a probe pin is not contacted during a display quality inspection.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3857998A JPH11237642A (en) | 1998-02-20 | 1998-02-20 | Active matrix type liquid crystal display device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3857998A JPH11237642A (en) | 1998-02-20 | 1998-02-20 | Active matrix type liquid crystal display device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH11237642A true JPH11237642A (en) | 1999-08-31 |
Family
ID=12529214
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3857998A Pending JPH11237642A (en) | 1998-02-20 | 1998-02-20 | Active matrix type liquid crystal display device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH11237642A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001195005A (en) * | 2000-01-12 | 2001-07-19 | Advanced Display Inc | Display device and method for manufacturing display device |
JP2004006314A (en) * | 2002-04-18 | 2004-01-08 | Seiko Epson Corp | Electro-optic device,its manufacturing method,and electronic apparatus |
WO2006073010A1 (en) * | 2005-01-07 | 2006-07-13 | Sharp Kabushiki Kaisha | Display device, display device board, display device manufacturing method, display device board manufacturing method, inspection signal inputting device board and inspection signal inputting device provided with the inspection signal inputting device board |
JP2006208677A (en) * | 2005-01-27 | 2006-08-10 | Sony Corp | Liquid crystal display device |
JP2013048109A (en) * | 2002-04-18 | 2013-03-07 | Seiko Epson Corp | Electro-optical device and electronic apparatus |
-
1998
- 1998-02-20 JP JP3857998A patent/JPH11237642A/en active Pending
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001195005A (en) * | 2000-01-12 | 2001-07-19 | Advanced Display Inc | Display device and method for manufacturing display device |
JP2004006314A (en) * | 2002-04-18 | 2004-01-08 | Seiko Epson Corp | Electro-optic device,its manufacturing method,and electronic apparatus |
JP4720069B2 (en) * | 2002-04-18 | 2011-07-13 | セイコーエプソン株式会社 | Electro-optical device and electronic apparatus |
US8253320B2 (en) | 2002-04-18 | 2012-08-28 | Seiko Epson Corporation | Method of manufacturing an electric optical device in which external connection terminals are formed |
US8339030B2 (en) | 2002-04-18 | 2012-12-25 | Seiko Epson Corporation | Method of manufacturing an electric optical device in which external connection terminals are formed |
JP2013048109A (en) * | 2002-04-18 | 2013-03-07 | Seiko Epson Corp | Electro-optical device and electronic apparatus |
US8796913B2 (en) | 2002-04-18 | 2014-08-05 | Seiko Epson Corporation | Method of manufacturing an electric optical device in which external connection terminals are formed |
WO2006073010A1 (en) * | 2005-01-07 | 2006-07-13 | Sharp Kabushiki Kaisha | Display device, display device board, display device manufacturing method, display device board manufacturing method, inspection signal inputting device board and inspection signal inputting device provided with the inspection signal inputting device board |
JP2006208677A (en) * | 2005-01-27 | 2006-08-10 | Sony Corp | Liquid crystal display device |
JP4645206B2 (en) * | 2005-01-27 | 2011-03-09 | ソニー株式会社 | Liquid crystal display device |
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