JPH11216337A - Filter device for treatment liquid feeder - Google Patents
Filter device for treatment liquid feederInfo
- Publication number
- JPH11216337A JPH11216337A JP3383298A JP3383298A JPH11216337A JP H11216337 A JPH11216337 A JP H11216337A JP 3383298 A JP3383298 A JP 3383298A JP 3383298 A JP3383298 A JP 3383298A JP H11216337 A JPH11216337 A JP H11216337A
- Authority
- JP
- Japan
- Prior art keywords
- processing liquid
- gas
- particle removing
- removing member
- closed container
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Separation Using Semi-Permeable Membranes (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】この発明は、半導体ウエハ、
液晶表示装置用ガラス基板、フォトマスク用ガラス基
板、光ディスク用基板などの各種基板の表面に現像液、
フォトレジスト液、ポリイミド樹脂、SOG(シリカ系
被膜形成材)液等の塗布液、純水等の洗浄液などの処理
液を供給して現像、塗布、洗浄などの所定の処理を施す
基板処理装置に使用され、その基板処理装置へ処理液を
供給する処理液供給装置の処理液供給配管に介在して配
設されるフィルタ装置に関する。[0001] The present invention relates to a semiconductor wafer,
Developing solution on the surface of various substrates such as glass substrates for liquid crystal display devices, glass substrates for photomasks, and substrates for optical disks.
Supplying a processing liquid such as a coating liquid such as a photoresist liquid, a polyimide resin, and an SOG (silica-based film forming material) liquid, and a cleaning liquid such as pure water to a substrate processing apparatus that performs predetermined processing such as development, coating, and cleaning. The present invention relates to a filter device that is used and is disposed in a processing liquid supply pipe of a processing liquid supply device that supplies a processing liquid to the substrate processing apparatus.
【0002】[0002]
【従来の技術】基板処理装置、例えば基板回転式現像装
置では、半導体ウエハ等の基板を水平姿勢に保持して鉛
直軸回りに回転させながら、その基板表面に被着形成さ
れた露光済みのフォトレジスト膜を現像処理する場合
に、現像液を貯留している現像液タンクから現像液供給
配管を通して吐出ノズルへ現像液を圧送し、吐出ノズル
の吐出口から基板の表面へ現像液を供給するようにして
いる。そして、この際、基板の表面へ供給される現像液
にパーティクルが含まれていると、現像むら等の不都合
を生じるので、現像液供給配管には、通常、現像液に含
まれているパーティクルを除去して現像液を清浄にする
ために、パーティクル除去部材を内蔵したフィルタ装置
が介在して配設されている。2. Description of the Related Art In a substrate processing apparatus, for example, a substrate rotary developing apparatus, an exposed photo-resist formed on a substrate surface while holding a substrate such as a semiconductor wafer in a horizontal position and rotating it around a vertical axis. When developing the resist film, the developing solution is supplied from the developing solution tank storing the developing solution to the discharging nozzle through the developing solution supply pipe to the discharging nozzle, and the developing solution is supplied from the discharging port of the discharging nozzle to the surface of the substrate. I have to. At this time, if particles are contained in the developing solution supplied to the surface of the substrate, inconveniences such as uneven development occur, so that particles contained in the developing solution are usually supplied to the developing solution supply pipe. In order to remove and clean the developer, a filter device having a built-in particle removing member is interposed.
【0003】ところが、現像液中には、現像液タンクか
ら現像液供給配管を通して現像液を圧送する際のエアー
噛みに起因する気泡や、最初から溶け込んでいる極く微
細な気泡が存在している場合がある。このように気体が
溶存している現像液をそのまま吐出ノズルから基板の表
面へ供給すると、現像液中の気体が基板上のフォトレジ
スト膜面に気泡として付着することになる。この結果、
気泡の付着部位における現像処理が阻害され、現像不良
を起こすことになる。これと同様の問題は、基板現像装
置に限らず各種の基板処理装置においても起こる。例え
ば、基板塗布装置では、基板の表面へ供給されたフォト
レジスト液に気泡が含まれていると、その塗布部位の膜
厚が極端に薄くなり、あるいは全くフォトレジスト液の
無い部位(いわゆるピンホール)を生じて、塗布不良を
起こすことになる。特に、近年における半導体プロセス
では益々微細化が進んでいるため、現像液やフォトレジ
スト液などの処理液に気体が溶存していると、それによ
る悪影響は非常に大きなものとなる。However, in the developing solution, there are bubbles caused by air entrainment when the developing solution is pressure-fed from a developing solution tank through a developing solution supply pipe, and extremely fine bubbles dissolved from the beginning. There are cases. When the developing solution in which the gas is dissolved is supplied to the surface of the substrate from the discharge nozzle as it is, the gas in the developing solution adheres to the surface of the photoresist film on the substrate as bubbles. As a result,
The development processing at the site where the air bubbles are attached is hindered, resulting in poor development. A similar problem occurs not only in the substrate developing apparatus but also in various substrate processing apparatuses. For example, in a substrate coating apparatus, if bubbles are contained in the photoresist liquid supplied to the surface of the substrate, the film thickness of the applied part becomes extremely thin, or a part without any photoresist liquid (a so-called pinhole). ) To cause poor coating. Particularly, in recent years, semiconductor devices have been increasingly miniaturized. Therefore, if a gas is dissolved in a processing solution such as a developing solution or a photoresist solution, the adverse effect caused by the gas is very large.
【0004】そこで、処理液に気体が溶存することによ
って引き起こされる処理不良を無くすために、フィルタ
装置の他に、気体のみを透過させる気体透過作用を有す
る気体透過膜材(気体交換膜材、気体浸透膜材あるいは
脱気膜材とも呼ばれる)によって通気路が形成された気
体透過部材(脱気モジュール)を内蔵した脱気装置を、
処理液タンクから基板処理装置の吐出ノズルへ至る処理
液供給配管に介在させて配設するようにしている。そし
て、気体透過部材の通気路を真空ポンプなどに流路接続
して通気路内を減圧し、脱気装置内を処理液が通過する
際に、気体透過膜材を通して処理液中の気体を通気路内
へ移行させて、処理液中から気体を除去するようにして
いる。Therefore, in order to eliminate processing defects caused by the gas being dissolved in the processing liquid, in addition to the filter device, a gas permeable membrane material (gas exchange membrane material, gas A deaerator with a built-in gas permeable member (deaeration module) in which an air passage is formed by a permeable membrane material or a deaeration membrane material,
The processing liquid supply pipe from the processing liquid tank to the discharge nozzle of the substrate processing apparatus is interposed. Then, the ventilation path of the gas permeable member is connected to a vacuum pump or the like to reduce the pressure in the ventilation path, and when the processing liquid passes through the deaerator, the gas in the processing liquid is passed through the gas permeable membrane material. The gas is removed from the processing liquid by moving to the inside of the passage.
【0005】また、基板洗浄装置のように純水を使用す
る装置では、純水は比抵抗値が極めて大きく帯電し易い
ため、例えば、純水を洗浄液として基板の表面へ供給し
た際に、静電破壊により、基板上に形成された回路パタ
ーンなどにダメージを与えることがある。そこで、この
ような不具合が生じないように、純水の比抵抗値を下げ
て帯電が起こりにくくした上で、純水を基板表面へ供給
する、といったことが行われている。すなわち、純水中
に誘電率の高い気体、例えば二酸化炭素を溶存させるこ
とにより、純水の比抵抗値を下げるようにしている。そ
して、二酸化炭素を純水中に溶存させるために、上記し
たような気体透過部材を内蔵した気体溶存装置を使用
し、気体透過部材の通気路を炭酸ガスボンベなどに流路
接続して通気路内へ二酸化炭素を供給し、気体溶存装置
内を純水が通過する際に、気体透過膜材を通して二酸化
炭素を純水中へ移行させるようにしている。In an apparatus that uses pure water, such as a substrate cleaning apparatus, since pure water has a very large specific resistance and is easily charged, for example, when pure water is supplied as a cleaning liquid to the surface of a substrate, the pure water becomes static. The electrical breakdown may damage a circuit pattern formed on the substrate. Therefore, in order to prevent such a problem from occurring, the specific resistance value of pure water is reduced to make it difficult to cause charging, and then pure water is supplied to the substrate surface. That is, the specific resistance of pure water is reduced by dissolving a gas having a high dielectric constant, for example, carbon dioxide, in pure water. Then, in order to dissolve carbon dioxide in pure water, a gas dissolving device having a gas permeable member as described above is used, and a gas passage of the gas permeable member is connected to a carbon dioxide gas cylinder or the like to form a gas passage. When pure water passes through the gas dissolving apparatus, carbon dioxide is transferred to pure water through a gas permeable membrane material.
【0006】[0006]
【発明が解決しようとする課題】ところで、既設の基板
処理システムに、上記したような脱気装置や気体溶存装
置を追加して取り付けるためには、その取付けのための
スペースを必要とする。しかしながら、通常は、システ
ム内に余分なスペースはほとんど無く、このため、追加
の装置の取付け作業が非常に困難となり、あるいはその
取付けを全く行うことができない、といった問題点があ
る。また、脱気装置や気体溶存装置の取付けを行うこと
ができたとしても、配管の取回しが複雑になったり、ま
た、同一機種の装置であっても他の装置とは配管経路が
違ったものになって互換性が無くなる、といった問題点
がある。By the way, in order to additionally mount the above-described degassing device or gas dissolving device on an existing substrate processing system, a space for the mounting is required. However, there is usually a problem in that there is little extra space in the system, which makes it very difficult to install additional devices or that the installation cannot be performed at all. Also, even if a degassing device or gas-dissolving device can be installed, the piping management becomes complicated, and even if the device is of the same model, the piping route is different from that of other devices. There is a problem that it becomes incompatible and loses compatibility.
【0007】また、脱気装置や気体溶存装置を含めた基
板処理システムを新規に設計する場合にも、フィルタ装
置の他に脱気装置や気体溶存装置の取付けのためのスペ
ースを確保する必要があって、システム全体のスペース
が大きくなり、また、装置の製造コストも高くなる、と
いった問題点がある。[0007] Also, when a new substrate processing system including a deaerator and a gas dissolving device is newly designed, it is necessary to secure a space for mounting the deaerator and the gas dissolving device in addition to the filter device. Therefore, there is a problem that the space of the whole system becomes large and the manufacturing cost of the device becomes high.
【0008】この発明は、以上のような事情に鑑みてな
されたものであり、既設の基板処理システムの処理液供
給装置の処理液供給配管にも、脱気機能や気体溶存機能
を有する部材を容易に取り付けることができるととも
に、装置間の互換性を保つことができ、また、パーティ
クル除去機能の他に脱気機能や気体溶存機能を有する処
理液供給装置を新規に設置する場合には、装置の小型化
および低コスト化を図ることができる処理液供給装置用
フィルタ装置を提供することを目的とする。The present invention has been made in view of the above circumstances, and a member having a deaeration function and a gas dissolving function is also provided in a processing liquid supply pipe of a processing liquid supply device of an existing substrate processing system. It can be easily installed, can maintain compatibility between devices, and if a new processing liquid supply device that has a degassing function and a gas dissolving function in addition to the particle removal function is installed, It is an object of the present invention to provide a filter device for a processing liquid supply device, which can reduce the size and cost of a filter.
【0009】[0009]
【課題を解決するための手段】この発明では、基板処理
装置へ処理液を供給する処理液供給装置の処理液供給配
管に介在して配設された処理液供給装置用フィルタ装置
において、処理液に含まれているパーティクルを除去す
るパーティクル除去作用と、処理液中に溶存している気
体を除去する脱気作用あるいは処理液中に気体を溶存さ
せる気体溶存作用との両方の作用を有する部材を用いる
ことにより、上記目的を達成した。すなわち、請求項1
に係る発明は、処理液流入口および処理液流出口ならび
に通気口を有する密閉容器の内部に、その内部を流路的
に処理液流入側と処理液流出側とに仕切るように、気体
のみを透過させる気体透過膜材によって形成された多数
の細管状エレメントで構成されたパーティクル除去部材
を配設し、そのパーティクル除去部材を構成する多数の
細管状エレメントの少なくともその一方の端部を前記密
閉容器の通気口に連通させたことを特徴とする。According to the present invention, there is provided a filter apparatus for a processing liquid supply device disposed between processing liquid supply pipes of a processing liquid supply apparatus for supplying a processing liquid to a substrate processing apparatus. A member having both a particle removing action of removing particles contained in a gas and a degassing action of removing gas dissolved in the processing liquid or a gas dissolving action of dissolving gas in the processing liquid. The use has achieved the above object. That is, claim 1
The invention according to the present invention, in a closed container having a processing liquid inlet, a processing liquid outlet, and a vent, only a gas is used to partition the inside into a processing liquid inflow side and a processing liquid outflow side in a flow path. A closed vessel is provided with a particle removing member composed of a large number of small tubular elements formed by a gas permeable membrane material to be permeated, and at least one end of the large number of small tubular elements constituting the particle removing member is closed. Characterized in that it is communicated with the vent hole.
【0010】請求項2に係る発明は、請求項1に記載の
フィルタ装置において、密閉容器の通気口を減圧手段に
流路接続したことを特徴とする。According to a second aspect of the present invention, in the filter device according to the first aspect, a vent of the closed container is connected to a flow path of the pressure reducing means.
【0011】請求項3に係る発明は、請求項1に記載の
フィルタ装置において、密閉容器の通気口を気体供給手
段に流路接続したことを特徴とする。According to a third aspect of the present invention, in the filter device according to the first aspect, a vent of the closed container is connected to the gas supply means in a flow path.
【0012】請求項4に係る発明は、請求項1ないし請
求項3のいずれかに記載のフィルタ装置において、パー
ティクル除去部材を円筒状に形成し、その円筒状のパー
ティクル除去部材の一端側を閉塞部材によって液密に閉
塞するとともに、円筒状のパーティクル除去部材を、そ
の中空部と密閉容器の処理液流入口または処理液流出口
とが連通するように密閉容器の内部に配設し、パーティ
クル除去部材を構成する多数の細管状エレメントのそれ
ぞれを、パーティクル除去部材の一端側から他端側へ向
くように配置して、多数の細管状エレメントのそれぞれ
の一端側を気体閉塞部材によって気密に閉塞するととも
にそれぞれの他端側を前記密閉容器の通気口に連通させ
たことを特徴とする。According to a fourth aspect of the present invention, in the filter device according to any one of the first to third aspects, the particle removing member is formed in a cylindrical shape, and one end side of the cylindrical particle removing member is closed. The member is liquid-tightly closed and a cylindrical particle removing member is disposed inside the closed container so that the hollow portion thereof communicates with the processing liquid inlet or the processing liquid outlet of the closed container to remove particles. Each of the multiple small tubular elements constituting the member is arranged so as to face from one end of the particle removing member to the other end, and one end of each of the multiple small tubular elements is hermetically closed by the gas closing member. And the other end side is communicated with a vent of the closed container.
【0013】請求項1に係る発明のフィルタ装置におい
ては、処理液供給配管内から処理液流入口を通って密閉
容器内へ流入した処理液は、密閉容器の内部に配設され
たパーティクル除去部材を透過して、その際にパーティ
クルが除去され、パーティクルが除去された処理液は、
密閉容器内から処理液流出口を通って流出し、処理液供
給配管を通って基板処理装置へ供給される。そして、こ
の装置では、パーティクル除去部材が、気体のみを透過
させる気体透過膜材によって形成された多数の細管状エ
レメントで構成されているため、処理液は、パーティク
ル除去部材を透過する際に、細管状エレメントを形成し
ている気体透過膜材を通して処理液中の気体が、密閉容
器の通気口に連通した細管状エレメント内部へ移行し
て、処理液中から気体が除去され、あるいは、細管状エ
レメント内部から気体透過膜材を通して気体が処理液中
へ移行して、処理液中に気体が溶存させられる。In the filter device according to the first aspect of the present invention, the processing liquid flowing into the closed container from the processing liquid supply pipe through the processing liquid inflow port is provided with a particle removing member disposed inside the closed container. Through which the particles are removed and the processing liquid from which the particles have been removed,
The liquid flows out of the closed vessel through the processing liquid outlet, and is supplied to the substrate processing apparatus through the processing liquid supply pipe. In this apparatus, since the particle removing member is composed of a large number of small tubular elements formed of a gas-permeable membrane material that allows only gas to pass through, the processing liquid passes through the small tubular member when passing through the particle removing member. The gas in the processing liquid moves through the gas permeable membrane material forming the tubular element into the inside of the tubular element that communicates with the vent of the closed vessel, and the gas is removed from the processing liquid, or the tubular element The gas moves from inside into the processing liquid through the gas permeable membrane material, and the gas is dissolved in the processing liquid.
【0014】請求項2に係る発明のフィルタ装置では、
密閉容器の通気口に連通した多数の細管状エレメントの
内部が減圧手段によって減圧されることにより、多数の
細管状エレメントで構成されたパーティクル除去部材を
処理液が透過する際に、処理液中に溶存している気体が
気体透過膜材を通して細管状エレメント内部へ移行し
て、処理液中から気体が除去されることになる。In the filter device according to the second aspect of the present invention,
When the inside of a large number of the thin tubular elements communicating with the vents of the closed container is depressurized by the decompression means, when the processing liquid permeates the particle removing member constituted by the many thin tubular elements, The dissolved gas moves into the inside of the tubular element through the gas permeable membrane material, and the gas is removed from the processing liquid.
【0015】請求項3に係る発明のフィルタ装置では、
気体供給手段から気体、例えば二酸化炭素が、密閉容器
の通気口に連通した多数の細管状エレメントの内部へ供
給されることにより、多数の細管状エレメントで構成さ
れたパーティクル除去部材を処理液が透過する際に、細
管状エレメント内部の二酸化炭素が気体透過膜材を通し
て処理液、例えば純水中へ移行して、純水中に二酸化炭
素が溶存させられることになる。In the filter device according to the third aspect of the present invention,
Gas, for example, carbon dioxide, is supplied from the gas supply means to the inside of a large number of small tubular elements communicating with the vents of the closed vessel, so that the processing liquid permeates the particle removing member composed of the large number of small tubular elements. In doing so, the carbon dioxide inside the tubular element moves through the gas permeable membrane material to a treatment liquid, for example, pure water, and carbon dioxide is dissolved in the pure water.
【0016】請求項4に係る発明のフィルタ装置では、
処理液は、処理液供給配管内から処理液流入口を通っ
て、密閉容器の内部に配設され一端側が閉塞部材によっ
て閉塞された円筒状のパーティクル除去部材の中空部内
へ流入し、その中空部内から、多数の細管状エレメント
で構成されたパーティクル除去部材を透過して、密閉容
器の内面とパーティクル除去部材の外周面とで形成され
た液流路内へ流入し、その液流路内から密閉容器の処理
液流出口を通って処理液供給配管内へ流出する。あるい
は、処理液は、処理液供給配管内から処理液流入口を通
って、密閉容器の内面と密閉容器の内部に配設され一端
側が閉塞部材によって閉塞された円筒状のパーティクル
除去部材の外周面とで形成された液流路内へ流入し、そ
の液流路内から、多数の細管状エレメントで構成された
パーティクル除去部材を透過して、パーティクル除去部
材の中空部内へ流入し、その中空部内から密閉容器の処
理液流出口を通って処理液供給配管内へ流出する。ま
た、パーティクル除去部材を構成する多数の細管状エレ
メントはそれぞれ、パーティクル除去部材の一端側から
他端側へ向くように配置され、一端側が気体閉塞部材に
よって気密に閉塞されており、他端側が密閉容器の通気
口に連通していることにより、細管状エレメント内部が
減圧され、あるいは細管状エレメント内部へ気体が供給
される。In the filter device of the invention according to claim 4,
The processing liquid flows from the processing liquid supply pipe through the processing liquid inflow port into the hollow portion of the cylindrical particle removing member disposed inside the closed container and having one end closed by the closing member. Through the particle removing member composed of a large number of thin tubular elements, flows into a liquid flow path formed by the inner surface of the closed container and the outer peripheral surface of the particle removing member, and seals from the liquid flow path. It flows out into the processing liquid supply pipe through the processing liquid outlet of the container. Alternatively, the processing liquid is supplied from the processing liquid supply pipe through the processing liquid inflow port to the inner surface of the closed container and the outer peripheral surface of the cylindrical particle removing member which is disposed inside the closed container and one end of which is closed by the closing member. Flows into the liquid flow path formed by the above, and from the liquid flow path, passes through the particle removing member composed of a number of narrow tubular elements, flows into the hollow portion of the particle removing member, and flows into the hollow portion. Out of the processing solution supply pipe through the processing solution outlet of the closed container. In addition, a large number of thin tubular elements constituting the particle removing member are respectively arranged so as to face from one end side to the other end side of the particle removing member, one end side is airtightly closed by a gas closing member, and the other end side is closed. By communicating with the vent of the container, the inside of the tubular element is depressurized, or gas is supplied to the inside of the tubular element.
【0017】[0017]
【発明の実施の形態】以下、この発明の好適な実施形態
について図面を参照しながら説明する。Preferred embodiments of the present invention will be described below with reference to the drawings.
【0018】図1は、基板処理装置の1例である基板回
転式現像装置へ現像液を供給する現像液供給系の概略構
成の1例を示す図である。基板回転式現像装置10は、
スピンチャック12上に基板Wを水平姿勢で吸着保持し
た状態で、基板Wを鉛直軸回りに回転させながら、吐出
ノズル14の吐出口から基板Wの表面へ現像液を供給し
て、基板W表面に形成された露光済みのフォトレジスト
膜を現像処理するようになっている。FIG. 1 is a diagram showing an example of a schematic configuration of a developing solution supply system that supplies a developing solution to a substrate rotary developing device, which is an example of a substrate processing apparatus. The substrate rotating type developing device 10 includes:
While the substrate W is held on the spin chuck 12 in a horizontal posture by suction, the developing solution is supplied from the discharge port of the discharge nozzle 14 to the surface of the substrate W while the substrate W is rotated about a vertical axis. The exposed photoresist film formed on the substrate is developed.
【0019】現像装置10の吐出ノズル14へ現像液を
供給する現像液供給系は、密閉容器からなり現像液16
を貯留する現像液タンク18、この現像液タンク18の
上部からそのタンク18内の上部空間へ窒素ガスを供給
するための窒素ガス供給配管20、および、一端側が現
像液タンク18内の現像液16中へ差し入れられ、他端
側が現像装置10の吐出ノズル14に接続された現像液
供給配管22を備えて構成されている。そして、窒素ガ
スボンベ等の窒素ガス供給源から窒素ガス供給配管20
を通って現像液タンク18内の上部空間へ窒素ガスを供
給することにより、タンク18内の現像液16の液面を
押圧して現像液供給配管22内へ現像液16を送り出
し、現像液供給配管22を通って吐出ノズル14へ現像
液を圧送するようになっている。なお、窒素ガスの圧力
によって現像液を圧送する構成に代えて、ポンプなどに
より現像液を圧送するような構成としてもよい。The developing solution supply system for supplying the developing solution to the discharge nozzle 14 of the developing device 10 comprises a closed container,
Tank 18 for storing nitrogen, a nitrogen gas supply pipe 20 for supplying nitrogen gas from an upper portion of the developer tank 18 to an upper space in the tank 18, and one end of the developer 16 in the developer tank 18. The developing device is provided with a developing solution supply pipe 22 which is inserted therein and whose other end is connected to the discharge nozzle 14 of the developing device 10. Then, from a nitrogen gas supply source such as a nitrogen gas cylinder,
By supplying nitrogen gas to the upper space in the developer tank 18 through the tank, the liquid level of the developer 16 in the tank 18 is pressed to send the developer 16 into the developer supply pipe 22, and the developer is supplied. The developer is fed under pressure to the discharge nozzle 14 through the pipe 22. Note that, instead of the configuration in which the developer is pumped by the pressure of the nitrogen gas, a configuration in which the developer is pumped by a pump or the like may be employed.
【0020】現像液タンク18から吐出ノズル14へ至
る現像液供給配管22には、後述するような構成を備え
現像液に含まれるパーティクルを除去するパーティクル
除去作用および現像液中に溶存している気体を除去する
脱気作用を有するフィルタ装置24、配管22内を流通
する現像液の流量を確認するための流量計26、ならび
に、吐出ノズル14への現像液の供給および供給停止を
切り替える開閉制御弁28がそれぞれ介在して配設され
ている。A developing solution supply pipe 22 extending from the developing solution tank 18 to the discharge nozzle 14 is provided with a structure as described below to remove particles contained in the developing solution, and a gas dissolved in the developing solution. Filter device 24 having a degassing function for removing water, a flow meter 26 for checking the flow rate of the developer flowing through the pipe 22, and an opening / closing control valve for switching between supplying and stopping the supply of the developer to the discharge nozzle 14. 28 are provided respectively.
【0021】フィルタ装置24は、図2に縦断面図を、
図3に図2のIII−III矢視横断面図をそれぞれ示すよう
に、円筒状の密閉容器30の内部に、パーティクル除去
作用と共に脱気作用を有するパーティクル除去部材32
を内蔵している。パーティクル除去部材32は、円筒状
に形成されており、パーティクル除去部材32の軸線方
向長さより長い管体34の外側に、その管体34と横断
面同心円状に嵌挿されている。管体34の管壁には、多
数の貫通小孔36が形成されている。パーティクル除去
部材32の一端面(図2では下端面)は、管体34の一
端と共に閉塞部材38によって閉塞されている。また、
パーティクル除去部材32の他端面側(図2では上端面
側)は、管体34の他端部(図2では上端部)に密嵌さ
れた環状部材40が液密に連接されている。そして、図
4に外観斜視図を示すように、パーティクル除去部材3
2、管体34、閉塞部材38および環状部材40は、一
体的に構成されている。The filter device 24 is shown in FIG.
As shown in FIG. 3 as a cross-sectional view taken along the line III-III of FIG. 2, a particle removing member 32 having a particle removing function and a degassing function inside a cylindrical closed container 30.
Built-in. The particle removing member 32 is formed in a cylindrical shape, and is fitted outside the tubular body 34 longer than the axial length of the particle removing member 32 in a concentric circular cross section with the tubular body 34. A number of small through holes 36 are formed in the tube wall of the tube 34. One end surface (the lower end surface in FIG. 2) of the particle removing member 32 is closed by a closing member 38 together with one end of the tube 34. Also,
On the other end surface side (the upper end surface side in FIG. 2) of the particle removing member 32, an annular member 40 tightly fitted to the other end portion (the upper end portion in FIG. 2) of the tube 34 is connected in a liquid-tight manner. Then, as shown in the external perspective view of FIG.
2. The tube 34, the closing member 38 and the annular member 40 are integrally formed.
【0022】パーティクル除去部材32は、図4のA部
分の拡大図を図5に示すように、例えばポリエチレン系
樹脂からなる気体透過膜材によって形成された多数の細
管状エレメント42を織成して構成されている。そし
て、パーティクル除去部材32の内部は、一部をさらに
拡大した断面図を図6に示すように、それぞれの細管状
エレメント42の内部が通気路44となり、細管状エレ
メント42と細管状エレメント42との間が液通路46
となる。それぞれの細管状エレメント42は、気体のみ
を透過させ液体を透過させない微細孔48を多数有して
おり、細管状エレメント42の外側の液通路46を通っ
て現像液が流れると、現像液中に溶存している気体のみ
が気体透過膜材を透過して細管状エレメント42内部の
通気路44内へ移行するようになっている。また、パー
ティクル除去部材32を構成する多数の細管状エレメン
ト42はそれぞれ、パーティクル除去部材32の一端側
から他端側へ向くように(図2では上下方向に)配置さ
れている。なお、図示例では、細管状エレメント42を
織物のように織り込んでそれを幾層にも積層したものを
円筒状に成形して、円筒状のパーティクル除去部材32
を構成するようにしているが、多数の細管状エレメント
からパーティクル除去部材を構成するには、それ以外の
方法によってもよく、例えば、多数の細管状エレメント
を絡み合わせながら単にブロック状に密集させて枠など
で円筒状に成形保持するようにして、パーティクル除去
部材を構成するようにしてもよい。The particle removing member 32 is formed by weaving a number of tubular elements 42 formed of a gas-permeable membrane material made of, for example, a polyethylene resin, as shown in FIG. ing. As shown in FIG. 6, a partially enlarged cross-sectional view of the inside of the particle removing member 32, the inside of each of the narrow tubular elements 42 becomes a ventilation path 44, and the narrow tubular element 42, the narrow tubular element 42 Between the liquid passage 46
Becomes Each of the thin tubular elements 42 has a large number of fine holes 48 that allow only gas to pass and no liquid to pass, and when the developing solution flows through the liquid passage 46 outside the thin tubular element 42, Only dissolved gas permeates through the gas permeable membrane material and moves into the air passage 44 inside the tubular element 42. A large number of the thin tubular elements 42 constituting the particle removing member 32 are respectively arranged (in the vertical direction in FIG. 2) from one end to the other end of the particle removing member 32. In the illustrated example, the thin tubular element 42 is woven like a woven fabric, and a plurality of layers are formed into a cylindrical shape, and the cylindrical particle removing member 32 is formed.
However, in order to constitute the particle removing member from a large number of thin tubular elements, other methods may be used. The particle removing member may be configured to be formed and held in a cylindrical shape by a frame or the like.
【0023】パーティクル除去部材32を構成している
多数の細管状エレメント42の内部のそれぞれの通気路
44の一端(図2では下端)は、閉塞部材38によって
気密に閉塞されている。また、パーティクル除去部材3
2の上端面側が連接されてパーティクル除去部材32と
一体的に構成された環状部材40に、パーティクル除去
部材32との連接面側に開口した環状凹部からなる通気
室50が形成されていて、この通気室50に、円筒状の
パーティクル除去部材32を構成している多数の細管状
エレメント42の内部の通気路44の他端(図2では上
端)がそれぞれ連通している。なお、図示例では、パー
ティクル除去部材32の一端面および管体34の一端を
それぞれ閉塞する閉塞部材38によって、パーティクル
除去部材32の多数の細管状エレメント42内部の通気
路44の一端を気密に閉塞するようにしているが、多数
の細管状エレメント42の一端を個別の気体閉塞部材に
よって閉塞するようにしてもよい。One end (the lower end in FIG. 2) of each of the air passages 44 inside the many tubular elements 42 constituting the particle removing member 32 is closed air-tight by a closing member 38. In addition, the particle removing member 3
The upper end surface side of 2 is connected to an annular member 40 integrally formed with the particle removing member 32, and a ventilation chamber 50 formed of an annular concave portion opened on the connecting surface side with the particle removing member 32 is formed. The other end (the upper end in FIG. 2) of the ventilation path 44 inside the many small tubular elements 42 constituting the cylindrical particle removing member 32 communicates with the ventilation chamber 50. In the illustrated example, one end of the ventilation path 44 inside the many thin tubular elements 42 of the particle removing member 32 is air-tightly closed by the closing member 38 that closes one end surface of the particle removing member 32 and one end of the tube 34. However, one end of each of the multiple tubular elements 42 may be closed by an individual gas closing member.
【0024】円筒状の密閉容器30の一端側(図2では
下端側)には、現像液流入口52が設けられている。ま
た、密閉容器30の他端面(図2では上端面)の中央部
には、内周部の一部に雌ねじ56が螺刻された開口部5
4が形成されており、その開口部54に、雌ねじ56に
螺合する雄ねじ58が外周部の一部に螺刻され管体34
の上端部の外周面に密嵌されて固着される取付け部材5
8が螺着されるようになっている。取付け部材58の下
端面と環状部材40の上端面との間には、液密状態を保
つためのO−リング62が配設されている。そして、管
体34の端部が密閉容器30の端面から突出するよう
に、密閉容器30の内部にパーティクル除去部材32、
管体34、閉塞部材38および環状部材40の一体構成
物が収納され、密閉容器30の端面から突出した管体3
4の端部が現像液流出口64となる。なお、密閉容器3
0は、その内部にパーティクル除去部材32等からなる
一体構成物を収納することができるように、上・下に分
割可能な構造とされているが、その図示を省略してい
る。パーティクル除去部材32等からなる一体構成物が
密閉容器30の内部に収納された状態で、密閉容器30
の一端側(図2では下端側)の内面と閉塞部材38との
間、および、密閉容器30の内周面とパーティクル除去
部材32の外周面との間にそれぞれ液流路が形成される
ように、パーティクル除去部材32の軸線方向長さおよ
び外径のそれぞれの寸法が設定される。さらに、密閉容
器30の開口部54の周辺部に、密閉容器30の端面に
通気口66が開口した通気路68が形設されていて、そ
の通気路68と環状部材40に形成された通気室50と
が連通している。密閉容器30の通気口66には、図1
に示すように真空ポンプ70が流路接続されている。な
お、真空ポンプ70を用いる代わりに、クリーンルーム
などに配備されている真空ユーティリティに密閉容器3
0の通気口66を流路接続するようにしてもよい。A developer inlet 52 is provided at one end (the lower end in FIG. 2) of the cylindrical closed container 30. In the center of the other end surface (the upper end surface in FIG. 2) of the sealed container 30, an opening 5 in which a female screw 56 is threaded in a part of the inner peripheral portion is provided.
A male screw 58 screwed into a female screw 56 is screwed into a part of the outer peripheral portion of the opening 54 to form a tube body 34.
Mounting member 5 tightly fitted and fixed to the outer peripheral surface of the upper end of the
8 is screwed. An O-ring 62 is provided between the lower end surface of the mounting member 58 and the upper end surface of the annular member 40 to maintain a liquid-tight state. Then, the particle removing member 32 is provided inside the closed container 30 so that the end of the tube 34 protrudes from the end surface of the closed container 30.
A tube 3 in which an integrated component of the tube 34, the closing member 38 and the annular member 40 is housed and protrudes from the end surface of the closed container 30
The end of 4 serves as a developer outlet 64. In addition, closed container 3
Reference numeral 0 denotes a structure that can be divided into upper and lower portions so that an integrated component including the particle removing member 32 and the like can be stored therein, but illustration thereof is omitted. In a state where the integrated component including the particle removing member 32 and the like is stored in the closed container 30, the closed container 30
The liquid flow paths are formed between the inner surface of one end side (the lower end side in FIG. 2) and the closing member 38 and between the inner peripheral surface of the sealed container 30 and the outer peripheral surface of the particle removing member 32, respectively. Then, the respective dimensions of the axial length and the outer diameter of the particle removing member 32 are set. Further, a ventilation path 68 having an opening 66 at the end face of the closed container 30 is formed around the opening 54 of the closed container 30, and a ventilation chamber formed in the ventilation path 68 and the annular member 40. And 50 are in communication. As shown in FIG.
The vacuum pump 70 is connected to the flow path as shown in FIG. In addition, instead of using the vacuum pump 70, a closed container 3 is attached to a vacuum utility provided in a clean room or the like.
The zero ventilation port 66 may be connected to the flow path.
【0025】以上のような構成を有するフィルタ装置2
4は、現像液流入口52が上流側すなわち現像液タンク
18側となり現像液流出口64が下流側すなわち現像装
置10の吐出ノズル14側となるように、現像液供給配
管22に、それぞれ図示しない管継手を介して接続され
る。また、密閉容器30の通気口66が、真空ポンプ7
0に接続された配管72に図示しない管継手を介して接
続され、パーティクル除去部材32の多数の細管状エレ
メント42の内部の通気路44内が所定の圧力に減圧さ
れるようになっている。そして、現像液供給配管22内
に現像液を流すと、現像液は、図2に流れの方向を矢印
で示すように、現像液供給配管22内から現像液流入口
52を通って密閉容器30内へ流入し、密閉容器30の
内面とパーティクル除去部材32の外周面および閉塞部
材38との間に形成された液流路を通り、その液流路か
らパーティクル除去部材32を透過して、貫通小孔36
を通り管体34内へ流入する。この際に、現像液に含ま
れているパーティクルがパーティクル除去部材32によ
って除去されるとともに、現像液中に溶存している気体
が、パーティクル除去部材32を構成する細管状エレメ
ント42を形成している気体透過膜材を通して減圧状態
の細管状エレメント42内部の通気路44内へ移行し
て、現像液中から気体が除去される。そして、パーティ
クルが除去されて清浄化されるとともに脱気された現像
液は、管体34内を通り、現像液流出口64を通ってフ
ィルタ装置24から流出し、現像液供給配管22を通っ
て現像装置10の吐出ノズル14へ送られる。The filter device 2 having the above configuration
4, the developer supply pipe 22 is not shown so that the developer inlet 52 is on the upstream side, that is, the developer tank 18 side, and the developer outlet 64 is on the downstream side, that is, the discharge nozzle 14 side of the developing device 10. Connected via a pipe joint. Further, the ventilation port 66 of the sealed container 30 is
The particle removing member 32 is connected to a pipe 72 connected through a pipe joint (not shown) so as to reduce the pressure inside the air passage 44 inside the many small tubular elements 42 of the particle removing member 32 to a predetermined pressure. When the developer flows into the developer supply pipe 22, the developer flows from the developer supply pipe 22 through the developer inlet 52 into the closed container 30, as indicated by the arrow in FIG. And flows through the liquid passage formed between the inner surface of the sealed container 30 and the outer peripheral surface of the particle removing member 32 and the closing member 38, and penetrates through the particle removing member 32 from the liquid passage and penetrates. Small hole 36
, And flows into the tube 34. At this time, the particles contained in the developing solution are removed by the particle removing member 32, and the gas dissolved in the developing solution forms the thin tubular element 42 constituting the particle removing member 32. The gas moves through the gas permeable membrane material into the air passage 44 inside the reduced-pressure tubular element 42 to remove gas from the developer. The developer that has been cleaned and degassed by removing particles passes through the tube 34, flows out of the filter device 24 through the developer outlet 64, passes through the developer supply pipe 22, It is sent to the discharge nozzle 14 of the developing device 10.
【0026】このフィルタ装置24は、密閉容器30の
内部にパーティクル除去機能と共に脱気機能を有するパ
ーティクル除去部材32を内蔵しているので、パーティ
クル除去機能のみを有するフィルタ装置が現像液供給配
管に介設された既設の現像液供給系に、現像液中に溶存
する気体を除去する脱気機能を付加しようとする場合に
は、このフィルタ装置24を、パーティクル除去機能の
みを有するフィルタ装置と交換して配設すればよい。し
たがって、従来のように、フィルタ装置とは別に脱気装
置を現像液供給配管に追加して設置する、といったこと
を行わなくてもよいので、脱気装置の取付けのための余
分なスペースを必要とすることがない。また、パーティ
クル除去機能と共に脱気機能を有する現像液供給系を新
規に設計しようとする場合には、従来のように、フィル
タ装置の他に脱気装置の取付けのためのスペースを確保
する、といった必要が無いので、現像液供給系の設置ス
ペースが少なくて済み、また、コスト的にも有利とな
る。The filter device 24 has a built-in particle removing member 32 having a particle removing function and a degassing function inside the closed container 30, so that the filter device having only the particle removing function is connected to the developer supply pipe. In order to add a degassing function for removing gas dissolved in the developing solution to the existing developing solution supply system, replace the filter device 24 with a filter device having only a particle removing function. It should just be arranged. Therefore, it is not necessary to add a deaerator to the developer supply pipe separately from the filter device as in the related art, so that an extra space for mounting the deaerator is required. And never. Further, when a developer supply system having a degassing function together with a particle removing function is newly designed, a space for mounting a degassing device in addition to a filter device is secured as in the related art. Since there is no need, the installation space for the developer supply system can be reduced, and the cost is also advantageous.
【0027】なお、上記した実施形態では、フィルタ装
置24において、現像液を、密閉容器30の一端側(図
2では下端側)から密閉容器30の内面とパーティクル
除去部材32の外周面および閉塞部材38との間に形成
された液流路へ流入させ、その液流路からパーティクル
除去部材32を透過させて管体34内へ流入させ、管体
34内からその端部(図2では上端部)を通って流出さ
せるようにしているが、図2に示したフィルタ装置24
の現像液流入口52を現像液流出口とし現像液流出口6
4を現像液流入口として、現像液を矢印で示した方向と
は逆向きに流すようにしてもよい。この場合には、現像
液は、管体34の端部(図2では上端部)の現像液流入
口を通って流入し、管体34内を通り、その管体34内
から貫通小孔36を通ってパーティクル除去部材32を
透過して、密閉容器30の内面とパーティクル除去部材
32の外周面および閉塞部材38との間に形成された液
流路へ流入し、その液流路から密閉容器の一端部(図2
では下端部)の現像液流出口を通って流出することにな
る。In the above-described embodiment, in the filter device 24, the developer is supplied from one end side (the lower end side in FIG. 2) of the sealed container 30 to the inner surface of the sealed container 30, the outer peripheral surface of the particle removing member 32, and the closing member. 38, the liquid flows through the particle removing member 32 through the liquid flow path and flows into the tube 34, and the end (the upper end in FIG. ), But the filter device 24 shown in FIG.
The developer inlet 52 is used as the developer outlet and the developer outlet 6 is used as the developer outlet.
4 may be used as a developing solution inlet, and the developing solution may flow in a direction opposite to the direction indicated by the arrow. In this case, the developer flows in through the developer inlet at the end (the upper end in FIG. 2) of the tube 34, passes through the tube 34, and from the inside of the tube 34 to the small through hole 36. Through the particle removing member 32, flows into a liquid flow path formed between the inner surface of the closed container 30 and the outer peripheral surface of the particle removing member 32 and the closing member 38, and from the liquid flow path, the closed container One end (Fig. 2
In this case, it flows out through the developer outlet at the lower end).
【0028】また、上記した実施の形態では、通気路4
4の一端を閉塞部材38によって気密に閉塞し、通気路
44の他端側を真空ポンプ70に連通させるように構成
しているが、それに限られるものではなく、例えば、通
気路44の一端側と真空ポンプ70とを連通させるため
の連通路を密閉容器30内に形成し、通気路44の両端
を真空ポンプ70と連通させるようにしてもよい。In the above-described embodiment, the air passage 4
Although one end of the air passage 4 is air-tightly closed by a closing member 38 and the other end of the air passage 44 is connected to the vacuum pump 70, the invention is not limited thereto. A communication path for communicating the vacuum pump 70 with the vacuum pump 70 may be formed, and both ends of the ventilation path 44 may be connected to the vacuum pump 70.
【0029】また、上記した実施形態では、基板回転式
現像装置へ現像液を供給する現像液供給系にこの発明を
適用して、フィルタ装置24の密閉容器30に設けられ
パーティクル除去部材32を構成している細管状エレメ
ント42の内部の通気路44に連通した通気口66に真
空ポンプ70を流路接続した例について説明したが、こ
の発明を、例えば、洗浄液として純水を基板の表面へ吐
出する基板洗浄装置へ洗浄液(純水)を供給する洗浄液
供給系に適用する場合には、図1中に便宜的に示したよ
うに、フィルタ装置24の密閉容器30に設けられた通
気口66に、例えば、液化した二酸化炭素が充填された
ガスボンベ74と液化二酸化炭素を気化させるガス発生
器76とから構成された気体供給手段を、ガス供給配管
78を介して流路接続する。このような構成とした場合
には、パーティクル除去部材32を構成している細管状
エレメント42の内部の通気路44内へ二酸化炭素を供
給することができ、通気路44内の二酸化炭素を、パー
ティクル除去部材32を透過する純水中へ気体透過膜材
を通して移行させ、純水中に二酸化炭素を溶存させるこ
とができる。これにより、純水の比抵抗値を下げて帯電
が起こりにくくした上で、純水を基板表面へ供給するこ
とができるようになる。なお、純水中に溶存させる気体
としては、二酸化炭素に限らず、誘電率の高い気体であ
ればよい。In the above-described embodiment, the present invention is applied to the developing solution supply system for supplying the developing solution to the substrate rotary developing device, and the particle removing member 32 provided in the closed container 30 of the filter device 24 is constituted. Although the example in which the vacuum pump 70 is connected to the ventilation port 66 communicating with the ventilation path 44 inside the thin tubular element 42 is described, the present invention is, for example, discharging pure water as a cleaning liquid to the surface of the substrate. When the present invention is applied to a cleaning liquid supply system for supplying a cleaning liquid (pure water) to a substrate cleaning apparatus, a ventilation port 66 provided in the closed container 30 of the filter device 24 as shown in FIG. For example, a gas supply means composed of a gas cylinder 74 filled with liquefied carbon dioxide and a gas generator 76 for vaporizing liquefied carbon dioxide is passed through a gas supply pipe 78 To continue. In the case of such a configuration, carbon dioxide can be supplied into the air passage 44 inside the narrow tubular element 42 constituting the particle removing member 32, and the carbon dioxide in the air passage 44 is removed by the particles. The gas permeable membrane material is transferred to pure water passing through the removing member 32 to dissolve carbon dioxide in the pure water. This makes it possible to supply the pure water to the substrate surface after lowering the specific resistance value of the pure water to make the charging less likely to occur. The gas dissolved in pure water is not limited to carbon dioxide, but may be any gas having a high dielectric constant.
【0030】さらに、上記した説明では、パーティクル
除去部材32の形状を円筒状としたが、パーティクル除
去部材は、各種形状に成形することができ、例えば、多
数の細管状エレメントから平板状のパーティクル除去部
材を構成して、その平板状のパーティクル除去部材によ
り密閉容器の内部を2つの区画に仕切るようにしてもよ
い。Further, in the above description, the shape of the particle removing member 32 is cylindrical. However, the particle removing member can be formed into various shapes. A member may be formed, and the inside of the closed container may be divided into two sections by the plate-like particle removing member.
【0031】[0031]
【発明の効果】請求項1に係る発明の処理液供給装置用
フィルタ装置を使用すると、既設の基板処理システムの
処理液供給装置の処理液供給配管にも、パーティクル除
去機能のみを有するフィルタ装置と交換するだけで、脱
気機能や気体溶存機能を容易に付加することができると
ともに、配管の取回しが最小限で済むので、同一機種の
装置間での互換性を保つことができ、また、処理液供給
装置を新規に設置する場合には、装置の小型化および低
コスト化を図ることができる。According to the first aspect of the present invention, there is provided a filter apparatus having only a particle removing function in a processing liquid supply pipe of an existing processing liquid supply apparatus of a substrate processing system. By simply replacing the equipment, the degassing function and gas dissolving function can be easily added, and piping management is minimized, so that compatibility between devices of the same model can be maintained. When a processing liquid supply device is newly installed, the size and cost of the device can be reduced.
【0032】請求項2に係る発明のフィルタ装置を使用
すると、処理液中から気体を除去することが可能にな
る。When the filter device according to the second aspect of the present invention is used, it becomes possible to remove gas from the processing liquid.
【0033】請求項3に係る発明のフィルタ装置を使用
すると、処理液中に気体、例えば純水中に二酸化炭素を
溶存させることが可能になる。When the filter device according to the third aspect of the present invention is used, it becomes possible to dissolve carbon dioxide in a gas, for example, pure water, in the treatment liquid.
【0034】請求項4に係る発明のフィルタ装置では、
密閉容器の内部に配設されるパーティクル除去部材が円
筒状をなしているので、装置がコンパクトになる。In the filter device according to the fourth aspect of the present invention,
Since the particle removing member provided inside the closed container has a cylindrical shape, the apparatus is compact.
【図1】基板処理装置の1例である基板回転式現像装置
へ現像液を供給する現像液供給系の概略構成の1例を示
す図である。FIG. 1 is a diagram illustrating an example of a schematic configuration of a developing solution supply system that supplies a developing solution to a substrate rotary developing device, which is an example of a substrate processing apparatus.
【図2】この発明の1実施形態を示すフィルタ装置の縦
断面図である。FIG. 2 is a longitudinal sectional view of a filter device showing one embodiment of the present invention.
【図3】図2のIII−III矢視横断面図である。FIG. 3 is a cross-sectional view taken along the line III-III of FIG. 2;
【図4】図2に示したフィルタ装置の構成要素であるパ
ーティクル除去部材、管体、閉塞部材および環状部材の
一体構成物の外観斜視図である。FIG. 4 is an external perspective view of an integrated component of a particle removing member, a tube, a closing member, and an annular member, which are components of the filter device shown in FIG.
【図5】図4のA部分の拡大図であって、パーティクル
除去部材の表面を拡大して示す図である。5 is an enlarged view of a portion A in FIG. 4 and is an enlarged view showing a surface of a particle removing member. FIG.
【図6】パーティクル除去部材の一部をさらに拡大して
示す断面図である。FIG. 6 is a sectional view showing a part of a particle removing member in a further enlarged manner.
W 基板 10 基板回転式現像装置 12 スピンチャック 14 吐出ノズル 16 現像液 18 現像液タンク 20 窒素ガス供給配管 22 現像液供給配管 24 フィルタ装置 30 密閉容器 32 パーテイクル除去部材 34 管体 36 管体の貫通小孔 38 閉塞部材 40 環状部材 42 気体透過膜材によって形成された細管状エレメン
ト 44 細管状エレメントの内部の通気路 46 液通路 48 微細孔 50 通気室 52 現像液流入口 54 開口部 58 取付け部材 64 現像液流入口 66 通気口 68 通気路 70 真空ポンプ 72 配管 74 液化した二酸化炭素が充填されたガスボンベ 76 ガス発生器 78 ガス供給配管W Substrate 10 Substrate rotary developing device 12 Spin chuck 14 Discharge nozzle 16 Developing solution 18 Developing solution tank 20 Nitrogen gas supply pipe 22 Developing solution supply pipe 24 Filter device 30 Sealed container 32 Particle removal member 34 Tube 36 Small penetration of tube Hole 38 closing member 40 annular member 42 thin tubular element formed of a gas permeable membrane material 44 air passage inside the thin tubular element 46 liquid passage 48 minute hole 50 ventilation chamber 52 developer inlet 54 opening 58 attachment member 64 developing Liquid inlet 66 Vent 68 Vent 70 Vacuum pump 72 Piping 74 Gas cylinder filled with liquefied carbon dioxide 76 Gas generator 78 Gas supply piping
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 FI H01L 21/31 H01L 21/30 564Z ──────────────────────────────────────────────────の Continued on the front page (51) Int.Cl. 6 Identification code FI H01L 21/31 H01L 21/30 564Z
Claims (4)
供給装置の処理液供給配管に介在して配設された処理液
供給装置用フィルタ装置において、 処理液流入口および処理液流出口ならびに通気口を有す
る密閉容器の内部に、その内部を流路的に処理液流入側
と処理液流出側とに仕切るように、気体のみを透過させ
る気体透過膜材によって形成された多数の細管状エレメ
ントで構成されたパーティクル除去部材を配設し、その
パーティクル除去部材を構成する多数の細管状エレメン
トの少なくともその一方の端部を前記密閉容器の通気口
に連通させたことを特徴とする処理液供給装置用フィル
タ装置。1. A processing liquid supply device filter device disposed in a processing liquid supply pipe of a processing liquid supply device for supplying a processing liquid to a substrate processing apparatus, comprising: a processing liquid inlet, a processing liquid outlet, A large number of tubular elements formed by a gas-permeable membrane material that allows only gas to pass therethrough so as to partition the inside into a processing liquid inflow side and a processing liquid outflow side inside a closed container having a vent. Wherein a plurality of narrow tubular elements constituting the particle removing member are communicated with at least one end thereof through a vent of the closed container. Filter device for equipment.
された請求項1記載の処理液供給装置用フィルタ装置。2. The filter device for a processing liquid supply device according to claim 1, wherein a vent of the closed container is connected to a flow path of the pressure reducing means.
接続された請求項1記載の処理液供給装置用フィルタ装
置。3. The filter device for a processing liquid supply device according to claim 1, wherein a ventilation port of the closed container is connected to the gas supply means in a flow path.
その円筒状のパーティクル除去部材の一端側が閉塞部材
によって液密に閉塞されるとともに、円筒状のパーティ
クル除去部材が、その中空部と密閉容器の処理液流入口
または処理液流出口とが連通するように密閉容器の内部
に配設され、パーティクル除去部材を構成する多数の細
管状エレメントのそれぞれが、パーティクル除去部材の
一端側から他端側へ向くように配置されて、多数の細管
状エレメントのそれぞれの一端側が気体閉塞部材によっ
て気密に閉塞されるとともにそれぞれの他端側が前記密
閉容器の通気口に連通した請求項1ないし請求項3のい
ずれかに記載の処理液供給装置用フィルタ装置。4. A particle removing member having a cylindrical shape,
One end side of the cylindrical particle removing member is closed in a liquid-tight manner by the closing member, and the cylindrical particle removing member communicates between the hollow portion and the processing liquid inlet or the processing liquid outlet of the closed container. Are disposed inside the closed container, and each of a large number of small tubular elements constituting the particle removing member are arranged so as to face from one end side to the other end side of the particle removing member, and each of the large number of small tubular elements. 4. The filter device for a processing liquid supply device according to claim 1, wherein one end of the filter is hermetically closed by a gas closing member, and the other end of the filter is connected to a vent of the closed container.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3383298A JPH11216337A (en) | 1998-01-29 | 1998-01-29 | Filter device for treatment liquid feeder |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3383298A JPH11216337A (en) | 1998-01-29 | 1998-01-29 | Filter device for treatment liquid feeder |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH11216337A true JPH11216337A (en) | 1999-08-10 |
Family
ID=12397474
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3383298A Pending JPH11216337A (en) | 1998-01-29 | 1998-01-29 | Filter device for treatment liquid feeder |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH11216337A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015106656A (en) * | 2013-11-29 | 2015-06-08 | 東京エレクトロン株式会社 | Filter device |
KR20220033917A (en) * | 2020-09-10 | 2022-03-17 | 세메스 주식회사 | Degassing apparatus, equipment for treating substrate and treatment solution degassing method |
-
1998
- 1998-01-29 JP JP3383298A patent/JPH11216337A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015106656A (en) * | 2013-11-29 | 2015-06-08 | 東京エレクトロン株式会社 | Filter device |
KR20220033917A (en) * | 2020-09-10 | 2022-03-17 | 세메스 주식회사 | Degassing apparatus, equipment for treating substrate and treatment solution degassing method |
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