JPH11209868A - Production of carbon nitride film and device for producing it - Google Patents

Production of carbon nitride film and device for producing it

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Publication number
JPH11209868A
JPH11209868A JP1401698A JP1401698A JPH11209868A JP H11209868 A JPH11209868 A JP H11209868A JP 1401698 A JP1401698 A JP 1401698A JP 1401698 A JP1401698 A JP 1401698A JP H11209868 A JPH11209868 A JP H11209868A
Authority
JP
Japan
Prior art keywords
carbon
nitrogen
nitride film
ions
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP1401698A
Other languages
Japanese (ja)
Inventor
Toshiya Watanabe
俊哉 渡辺
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP1401698A priority Critical patent/JPH11209868A/en
Publication of JPH11209868A publication Critical patent/JPH11209868A/en
Withdrawn legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To improve the reactivity between carbon and nitrogen and to synthe size a carbon nitride film excellent in wear resistance on a substrate with tight adhesion by irradiating the surface of a base material held in a vacuum vessel with ions contg. nitrogen by specified irradiating energy and simultaneously irradiating it with carbon vapor. SOLUTION: In a vacuum vessel 11, a substrate 13 composed of a high speed tool steel or the like is held via a substrate holder 12. This substrate 13 is irradiated with nitrogen ions 19 from an ion impregnating device. The irradiating energy from the ions is regulated to the value of 20 to 150 keV in which the ions are not etched and are not impregnated into the substrate. Simultaneously with this, carbon 15 as an evaporating source 14 is heated by the irradiation of an elecron beam 16, and the surface of the substrate is irradiated with the generated carbon vapor 17. At this time, the evaporating quantity of the carbon 15 is controlled via a monitor 18, and the ratio of it to nitrogen ions 19 is regulated. In this way, a mixed layer of a carbon nitrogen film formed by the energy of the irradiating ions and the substrate 13 is formed to improve the adhesion between the carbon nitrogen film and the base material.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は各種回転機械の軸受
やスライダー等の摺動部材、情報機器の記憶装置等の、
耐摩耗性を要求される部材に適用される窒化炭素膜の製
造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to sliding members such as bearings and sliders of various rotary machines, storage devices of information equipment, and the like.
The present invention relates to a method for producing a carbon nitride film applied to a member requiring abrasion resistance.

【0002】[0002]

【発明が解決しようとする課題】窒化炭素は、これがβ
−C3 4 構造を採るとき、ダイヤモンドを凌ぐ硬度を
有し、高い耐摩耗性を有するとされている。また、上記
窒化炭素は、上記β−C 3 4 構造以外の組成、構造に
おいても、耐摩耗性は勿論、潤滑性、熱的安定性、化学
的安定性にも優れていると予想されていることから、各
種回転機械の軸受やスライダー等の摺動部材や情報機器
の記憶装置等への応用が期待されている。かかる窒化炭
素膜を合成する方法として、従来次の方法での合成が試
みられている。
The carbon nitride has a β
-CThreeNFourWhen adopting a structure, hardness exceeding diamond
It is said to have high wear resistance. Also,
The carbon nitride is the β-C ThreeNFourFor composition and structure other than structure
In addition to lubrication, thermal stability, chemical resistance,
Is expected to have excellent mechanical stability.
Sliding members such as bearings and sliders for various types of rotary machines and information devices
Is expected to be applied to storage devices and the like. Such nitrided carbon
As a method of synthesizing a base film, conventionally, the synthesis by the following method has been tried.
Has been seen.

【0003】即ち、上記方法として、スパッタ法、プラ
ズマCVD法、レーザー蒸着法、イオン注入法等がある
が、未だβ−C3 4 構造の窒化炭素膜合成の確認例は
ない。また上記従来の方法にあっては、上記炭素膜中の
組成比のみに注目した場合も、窒化炭素膜中の炭素/窒
素組成比もβ−C3 4 の化学量論組成比(炭素:窒素
=3:4)が得られておらず、全て膜組成は炭素過剰で
あって、窒素含有率は最大でも30%となっている。さ
らに、従来技術では、合成された窒化炭素膜の性能も殆
ど明らかになっておらず、また、十分な密着性を有する
窒化炭素膜も合成されていない。
That is, as the above method, there are a sputtering method, a plasma CVD method, a laser vapor deposition method, an ion implantation method and the like, but there is no confirmed example of synthesizing a carbon nitride film having a β-C 3 N 4 structure. Further, in the above conventional method, when attention is paid only to the composition ratio in the carbon film, the carbon / nitrogen composition ratio in the carbon nitride film is also the stoichiometric composition ratio of β-C 3 N 4 (carbon: Nitrogen = 3: 4) was not obtained, and the film compositions were all excessive in carbon, and the nitrogen content was at most 30%. Furthermore, in the prior art, the performance of the synthesized carbon nitride film is hardly clarified, and a carbon nitride film having sufficient adhesiveness has not been synthesized.

【0004】上記のように、従来の窒化炭素膜の製造方
法では、目的とする窒化炭素膜の組成及び構造が得られ
ていないが、その理由として、炭素と窒素の反応性がき
わめて低いこと、並びにβ−C3 4 が非平衡物質であ
るため組成、構造の制御がきわめて困難なこと等が挙げ
られる。また、窒化炭素が非平衡物質であるため、膜中
に蓄積される内部応力が大きいため十分な密着性が得ら
れないことも一因である。従って、β−C3 4 合成を
なすためには、炭素と窒素の反応性を向上させるととも
に、窒化炭素膜と基材との密着性を向上させる必要があ
る。
As described above, in the conventional method for manufacturing a carbon nitride film, the intended composition and structure of the carbon nitride film cannot be obtained, because the reactivity between carbon and nitrogen is extremely low. In addition, since β-C 3 N 4 is a non-equilibrium substance, it is extremely difficult to control the composition and structure. Another reason is that since carbon nitride is a non-equilibrium substance, the internal stress accumulated in the film is large and sufficient adhesion cannot be obtained. Therefore, in order to synthesize β-C 3 N 4 , it is necessary to improve the reactivity between carbon and nitrogen and also to improve the adhesion between the carbon nitride film and the substrate.

【0005】本発明の目的は、炭素と窒素との反応性を
向上させるとともに、窒化炭素膜と基材との密着性を向
上させ得る窒化炭素膜の合成方法を提供することにあ
る。
An object of the present invention is to provide a method of synthesizing a carbon nitride film which can improve the reactivity between carbon and nitrogen and improve the adhesion between the carbon nitride film and a substrate.

【0006】[0006]

【課題を解決するための手段】本発明は上記問題点を解
決するもので、その第1発明は、真空容器内に保持され
た基材上に、窒素を含有するイオンを照射すると同時に
炭素蒸気を照射することを特徴とする窒化炭素膜の製造
方法にある。
SUMMARY OF THE INVENTION The present invention solves the above-mentioned problems. The first invention is to irradiate nitrogen-containing ions onto a substrate held in a vacuum vessel and simultaneously apply carbon vapor to the substrate. And a method for producing a carbon nitride film.

【0007】尚、上記製造方法において、上記イオンの
照射エネルギを20keV〜150keVに設定するのが好
ましい。
In the above-mentioned manufacturing method, it is preferable that the irradiation energy of the ions is set to 20 keV to 150 keV.

【0008】また第2発明は、上記第1発明に係る製造
方法を実施するための装置に係り、内部に窒化炭素膜形
成用の基材が設置された真空容器と、同真空容器内の上
記基材の下方に設置され、電子ビーム等により炭素を加
熱し蒸発させる蒸発源と、窒素イオンを生成して上記基
材に照射するイオン注入装置とを備えたことを特徴とす
る窒化炭素膜の製造装置にある。
The second invention also relates to an apparatus for carrying out the manufacturing method according to the first invention, wherein a vacuum container having a base material for forming a carbon nitride film therein is provided, and A carbon nitride film, which is provided below the base material and includes an evaporation source for heating and evaporating carbon by an electron beam or the like, and an ion implanter for generating nitrogen ions and irradiating the base material with the ions. In the manufacturing equipment.

【0009】上記発明に係る窒素または窒素を含有する
イオン照射と炭素蒸気照射を同時に行うイオン蒸着法に
よれば、照射するイオンのエネルギを変化させることが
できるため、非平衡物質の合成に有効な手段であり、炭
素と窒素の反応性を向上させることが可能となる。ま
た、窒素あるいは窒素を含有するイオン照射の照射量と
炭素の蒸発量を変化させることにより、窒化炭素膜中の
炭素/窒素組成比を変化させることができる。この際に
おいて、照射イオンのエネルギを十分に高くすることに
よって、この運動エネルギにより窒化炭素膜と基材との
混合層が形成され、窒化炭素膜/基材間の密着性を向上
させることができる。
According to the ion vapor deposition method of the present invention, in which the irradiation of nitrogen or nitrogen-containing ions and the irradiation of carbon vapor are performed at the same time, the energy of the ions to be irradiated can be changed. This is a means for improving the reactivity between carbon and nitrogen. Further, by changing the irradiation amount of nitrogen or ion irradiation containing nitrogen and the amount of evaporation of carbon, the carbon / nitrogen composition ratio in the carbon nitride film can be changed. At this time, by increasing the energy of the irradiation ions sufficiently, a mixed layer of the carbon nitride film and the substrate is formed by the kinetic energy, and the adhesion between the carbon nitride film and the substrate can be improved. .

【0010】ここで第2発明においてイオンの照射エネ
ルギを20keV〜150keVとしたのは、窒素を含有す
るイオンのエネルギが20keV以下のときには、イオン
のエッチング効果により形成された窒化炭素膜が削られ
るため、結果的に窒化炭素膜が形成できず、また、上記
窒素を含有するイオンのエネルギが150keVを超える
ときには、窒素イオンが基材内部へ注入されるため、基
材の表面に窒素が残留しなくなり、窒化炭素膜を形成で
きないことによる。
Here, the reason why the ion irradiation energy is set to 20 keV to 150 keV in the second invention is that when the energy of ions containing nitrogen is 20 keV or less, the carbon nitride film formed by the ion etching effect is shaved. As a result, when a carbon nitride film cannot be formed and the energy of the nitrogen-containing ions exceeds 150 keV, nitrogen ions are implanted into the inside of the base material, so that nitrogen does not remain on the surface of the base material. This is because a carbon nitride film cannot be formed.

【0011】[0011]

【発明の実施の形態】以下図1〜図3を参照して本発明
の実施形態につき詳細に説明する。図1は本発明の実施
形態に係る窒化炭素の製造方法による窒化炭素膜の合成
に用いた窒化炭素膜製造装置の真空槽の構成図、図2は
上記窒化炭素膜製造装置の全体構成図、図3は窒化炭素
膜の性能比較線図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below in detail with reference to FIGS. FIG. 1 is a configuration diagram of a vacuum chamber of a carbon nitride film production apparatus used for synthesizing a carbon nitride film by a carbon nitride production method according to an embodiment of the present invention, FIG. 2 is an overall configuration diagram of the carbon nitride film production apparatus, FIG. 3 is a performance comparison diagram of the carbon nitride film.

【0012】上記窒化炭素膜製造装置は、図2に示すよ
うに、真空槽10とイオン注入装置20とにより構成さ
れる。図2において、上記イオン注入装置20は、高エ
ネルギのイオンを発生、注入させる装置でイオン源2
2、同イオン源22から窒素イオンを引き出す引き出し
電極23、同窒素イオン中の所定の窒素イオンを選択す
る質量分離器24、この窒素イオンを加速してエネルギ
増加を行なうための加速管25、後述する真空槽10内
の基材全体に上記窒素イオンが照射される範囲に走査さ
せるための走査管26等を備えている。
As shown in FIG. 2, the above-mentioned carbon nitride film manufacturing apparatus includes a vacuum chamber 10 and an ion implantation apparatus 20. In FIG. 2, the ion implantation apparatus 20 is an apparatus for generating and implanting high-energy ions.
2, an extraction electrode 23 for extracting nitrogen ions from the ion source 22, a mass separator 24 for selecting a predetermined nitrogen ion in the nitrogen ions, an acceleration tube 25 for accelerating the nitrogen ions to increase the energy, described later. A scanning tube 26 and the like are provided for scanning the entire substrate in the vacuum chamber 10 to be irradiated with the nitrogen ions.

【0013】また、上記真空槽10は図1のように構成
されており、11は真空容器で内部が真空に保持されて
いる。13は基材、12は同基材13を取り付けるため
の基材ホルダーである。14は上記真空容器11の底部
に設置された蒸発源で、炭素15を電子ビーム16によ
り蒸発させるものである。31はこの真空槽10と上記
イオン注入装置20とを接続するイオン注入路、32は
排気口、18は上記蒸発源14からの炭素蒸気の蒸発量
を測定するモニターである。
The vacuum chamber 10 is constructed as shown in FIG. 1. Numeral 11 denotes a vacuum vessel, the inside of which is maintained at a vacuum. Reference numeral 13 denotes a substrate, and 12 denotes a substrate holder for mounting the substrate 13. Reference numeral 14 denotes an evaporation source provided at the bottom of the vacuum vessel 11 for evaporating carbon 15 by an electron beam 16. Reference numeral 31 denotes an ion injection path connecting the vacuum tank 10 and the ion implantation apparatus 20, 32 denotes an exhaust port, and 18 denotes a monitor for measuring the amount of carbon vapor evaporated from the evaporation source 14.

【0014】次に図1〜図2に示す窒化炭素膜製造装置
を用いた窒化炭素膜の製造方法について説明する。
Next, a method for manufacturing a carbon nitride film using the carbon nitride film manufacturing apparatus shown in FIGS. 1 and 2 will be described.

【0015】図2において、イオン源でイオン化された
窒素イオンは、引き出し電極23により上記イオン源2
2内より引き出され、質量分離器24に導かれ、ここで
所定の窒素イオン(例えばN2 + )を選択する。選択さ
れた窒素イオンは、加速管25により所定のエネルギま
で加速された後、走査管26で窒素イオンビームの注入
ターゲットとなる真空槽10内の基材13全体に照射さ
れる範囲に走査させる。
In FIG. 2, nitrogen ions ionized by the ion source are extracted by the extraction electrode 23 into the ion source 2.
2 and guided to the mass separator 24, where a predetermined nitrogen ion (for example, N 2 + ) is selected. After the selected nitrogen ions are accelerated to a predetermined energy by the accelerating tube 25, they are scanned by the scanning tube 26 so as to irradiate the entire substrate 13 in the vacuum chamber 10 serving as a nitrogen ion beam injection target.

【0016】図1において、上記真空槽10内において
は、イオン注入装置20から供給される窒素イオン19
を真空容器11内に基材ホルダー12に取り付けられた
基材13に対して照射すると同時に、真空容器11内の
下部に設置された上記蒸発源14内の炭素15を電子ビ
ーム16により蒸発させ、これにより炭素蒸気17を基
材13上に蒸着させる。そして、上記モニター18によ
り、上記炭素蒸気17の基材13への蒸発量を測定す
る。
In FIG. 1, nitrogen ions 19 supplied from an ion implanter 20 are provided in the vacuum chamber 10.
Is irradiated on the substrate 13 attached to the substrate holder 12 in the vacuum container 11, and at the same time, the carbon 15 in the evaporation source 14 installed at the lower part in the vacuum container 11 is evaporated by the electron beam 16, Thereby, the carbon vapor 17 is deposited on the base material 13. Then, the amount of evaporation of the carbon vapor 17 to the substrate 13 is measured by the monitor 18.

【0017】次に、図1〜図2に示される窒化炭素膜製
造装置を用いた窒化炭素膜の合成方法につき説明する。
先ず、高速度工具鋼等からなる基材13に有機溶剤(例
えばアセトン)で超音波洗浄を施した後、真空容器11
内の基材ホルダー12に取り付け、2X 10-6torr以下
に予備排気する。次に、上記イオン源22に供給した窒
素ガスを同イオン源22内でイオン化し、加速管25で
加速し、質量分離器24で質量分離し、走査管26を経
た窒素イオン19を基材13へ照射する。これと同時
に、蒸発源14から炭素蒸気17を電子ビーム16によ
って蒸発させ、基材13上に蒸着させる。
Next, a method of synthesizing a carbon nitride film using the apparatus for manufacturing a carbon nitride film shown in FIGS. 1 and 2 will be described.
First, the base material 13 made of high-speed tool steel or the like is subjected to ultrasonic cleaning with an organic solvent (for example, acetone).
Attached to the substrate holder 12 of the inner and pre-evacuation below 2 X 10 -6 torr. Next, the nitrogen gas supplied to the ion source 22 is ionized in the ion source 22, accelerated by an acceleration tube 25, mass-separated by a mass separator 24, and the nitrogen ions 19 passing through a scanning tube 26 are converted into the base material 13. Irradiation. At the same time, the carbon vapor 17 is evaporated from the evaporation source 14 by the electron beam 16 and deposited on the substrate 13.

【0018】ここで、例えば上記窒素イオン19のエネ
ルギを70keV、炭素蒸気17の蒸発速度を1.0Å/
sec とすると、上記プロセスにより、炭素/窒素組成比
1の窒化炭素膜を合成でき、また、上記窒素イオン19
のエネルギを70keV、炭素蒸気17の蒸発速度を2.
0Å/sec とすると、炭素/窒素組成比2の窒化炭素膜
を合成できる。このように窒素イオン19のエネルギを
一定とし炭素蒸気17の蒸発速度を変化させることによ
り、窒化炭素膜中の炭素/窒素組成比を変化させること
ができる。なお、上記窒素イオン19のエネルギが20
keV以上150keV以下の範囲内であれば、同イオン1
9のエネルギが70keV以外のときでも、上記と同様に
窒化炭素膜の炭素/窒素組成比を調整することができ
る。
Here, for example, the energy of the nitrogen ions 19 is 70 keV, and the evaporation rate of the carbon vapor 17 is 1.0 ° /
sec, a carbon nitride film having a carbon / nitrogen composition ratio of 1 can be synthesized by the above process.
Energy of 70 keV and evaporation rate of carbon vapor 17 of 2.
When 0 ° / sec, a carbon nitride film having a carbon / nitrogen composition ratio of 2 can be synthesized. Thus, by changing the evaporation rate of the carbon vapor 17 while keeping the energy of the nitrogen ions 19 constant, the carbon / nitrogen composition ratio in the carbon nitride film can be changed. The energy of the nitrogen ions 19 is 20
In the range of keV to 150 keV, the same ion 1
Even when the energy of No. 9 is other than 70 keV, the carbon / nitrogen composition ratio of the carbon nitride film can be adjusted in the same manner as described above.

【0019】上記範囲の根拠について説明すると、窒素
を含有するイオンのエネルギが、20keV以下のときに
はイオンのエッチング効果により形成された窒化炭素膜
が削られるため窒化炭素膜が形成できず、また、上記窒
素を含有するイオンのエネルギが150keVを超えると
窒素イオンが基材13の内部へ注入されるため、基材1
3の表面に窒素の残留が無くなり、窒化炭素膜が形成で
きないことによる。
To explain the basis of the above range, when the energy of ions containing nitrogen is 20 keV or less, the carbon nitride film formed by the ion etching effect is shaved, so that a carbon nitride film cannot be formed. When the energy of the ions containing nitrogen exceeds 150 keV, nitrogen ions are implanted into the base material 13 so that the base material 1
This is because nitrogen remains on the surface of No. 3 and a carbon nitride film cannot be formed.

【0020】また、上記窒素イオン19のエネルギを2
0keV以上150keV以下とすることにより、窒化炭素
膜と基材13との密着性を向上させることができる。図
3は、窒化炭素膜を合成する際の、高エネルギの窒素イ
オン照射の有無における窒化炭素膜と基材13との密着
力の比較を示す。上記密着力はスクラッチ試験により行
い、窒化炭素膜が基材13から剥離するときの力により
評価した。図3に示す結果より、同図Bに示す高エネル
ギ窒素イオン照射を施したものの方が、同図Aで示す照
射無しのものの約2倍の密着力を有している。
The energy of the nitrogen ions 19 is 2
By setting the voltage between 0 keV and 150 keV, the adhesion between the carbon nitride film and the base material 13 can be improved. FIG. 3 shows a comparison of the adhesion between the carbon nitride film and the base material 13 with and without high energy nitrogen ion irradiation when synthesizing the carbon nitride film. The adhesion was evaluated by a scratch test, and was evaluated based on the force when the carbon nitride film was peeled off from the substrate 13. From the results shown in FIG. 3, those subjected to the high-energy nitrogen ion irradiation shown in FIG. B have approximately twice the adhesive strength as those without irradiation shown in FIG.

【0021】以上の方法で作製した窒化炭素膜を光電子
分光法により調査した結果、炭素と窒素の結合が認めら
れ、窒化炭素が合成されていることが確認できた。さら
に、上記窒化炭素膜と基材13との界面を同分析法によ
り調査した結果、窒化炭素膜の構成元素である窒素と炭
素が基材13内に入り込み、窒化炭素と基材13との混
合層が形成されていることが明らかとなった。
The carbon nitride film produced by the above method was examined by photoelectron spectroscopy. As a result, a bond between carbon and nitrogen was recognized, and it was confirmed that carbon nitride was synthesized. Furthermore, as a result of examining the interface between the carbon nitride film and the base material 13 by the same analysis method, nitrogen and carbon, which are constituent elements of the carbon nitride film, entered the base material 13 and mixed with the carbon nitride and the base material 13. It became clear that a layer was formed.

【0022】また、上記窒化炭素膜が合成された基材1
3を用いてSUSボール/窒化炭素膜摺動試験を行なっ
た結果、摩擦係数が基材13である高速度工具鋼よりも
低く、摩耗幅も小さいという結果が得られ、耐摩耗性に
優れていることも確認された。
The substrate 1 on which the carbon nitride film is synthesized
As a result of the SUS ball / carbon nitride film sliding test using No.3, it was found that the coefficient of friction was lower than that of the high-speed tool steel as the base material 13 and the wear width was smaller, resulting in excellent wear resistance. It was also confirmed that.

【0023】[0023]

【発明の効果】本発明は以上のように構成されており、
本発明によれば、基材上に、窒素を含有するイオンと炭
素蒸気とを同時に照射することにより、反応性の低い炭
素と窒素との化合物合成が可能となるとともに高い密着
性を有する窒化炭素膜を得ることができる。これによ
り、基材への密着性が高く耐摩耗性の大きい窒化炭素膜
製品を得ることができる。
The present invention is configured as described above.
According to the present invention, by simultaneously irradiating the base material with nitrogen-containing ions and carbon vapor, a compound of low reactivity carbon and nitrogen can be synthesized and carbon nitride having high adhesion A membrane can be obtained. As a result, a carbon nitride film product having high adhesion to the substrate and high wear resistance can be obtained.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施形態に係る窒化炭素膜製造装置の
真空槽の構成図。
FIG. 1 is a configuration diagram of a vacuum tank of a carbon nitride film manufacturing apparatus according to an embodiment of the present invention.

【図2】上記窒化炭素膜製造装置の全体構成図。FIG. 2 is an overall configuration diagram of the carbon nitride film manufacturing apparatus.

【図3】窒化炭素膜の性能比較図。FIG. 3 is a performance comparison diagram of a carbon nitride film.

【符号の説明】[Explanation of symbols]

10 真空槽 11 真空容器 12 基材ホルダー 13 基材 14 蒸発源 15 炭素 18 モニター 20 イオン注入装置 22 イオン源 23 引き出し電極 24 質量分離器 25 加速管 26 走査管 31 イオン注入路 DESCRIPTION OF SYMBOLS 10 Vacuum tank 11 Vacuum container 12 Substrate holder 13 Substrate 14 Evaporation source 15 Carbon 18 Monitor 20 Ion implantation apparatus 22 Ion source 23 Extraction electrode 24 Mass separator 25 Acceleration tube 26 Scanning tube 31 Ion injection path

【手続補正書】[Procedure amendment]

【提出日】平成10年9月1日[Submission date] September 1, 1998

【手続補正1】[Procedure amendment 1]

【補正対象書類名】図面[Document name to be amended] Drawing

【補正対象項目名】図1[Correction target item name] Fig. 1

【補正方法】変更[Correction method] Change

【補正内容】[Correction contents]

【図1】 FIG.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 真空容器内に保持された基材上に、窒素
を含有するイオンを照射すると同時に炭素蒸気を照射す
ることを特徴とする窒化炭素膜の製造方法。
1. A method for producing a carbon nitride film, comprising irradiating a substrate held in a vacuum vessel with ions containing nitrogen and simultaneously irradiating it with carbon vapor.
【請求項2】 上記イオンの照射エネルギを20keV〜
150keVに設定した請求項1記載の窒化炭素膜の製造
方法。
2. An ion irradiation energy of 20 keV or more.
The method for producing a carbon nitride film according to claim 1, wherein the voltage is set to 150 keV.
【請求項3】 内部に窒化炭素膜形成用の基材が設置さ
れた真空容器と、同真空容器内の上記基材の下方に設置
され、電子ビーム等により炭素を加熱し蒸発させる蒸発
源と、窒素イオンを生成して上記基材に照射するイオン
注入装置とを備えたことを特徴とする窒化炭素膜の製造
装置。
3. A vacuum vessel in which a base material for forming a carbon nitride film is provided, and an evaporation source provided below the base material in the vacuum vessel and heating and evaporating carbon by an electron beam or the like. And an ion implantation apparatus for generating nitrogen ions and irradiating the substrate with the nitrogen ions.
JP1401698A 1998-01-27 1998-01-27 Production of carbon nitride film and device for producing it Withdrawn JPH11209868A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1401698A JPH11209868A (en) 1998-01-27 1998-01-27 Production of carbon nitride film and device for producing it

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1401698A JPH11209868A (en) 1998-01-27 1998-01-27 Production of carbon nitride film and device for producing it

Publications (1)

Publication Number Publication Date
JPH11209868A true JPH11209868A (en) 1999-08-03

Family

ID=11849408

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1401698A Withdrawn JPH11209868A (en) 1998-01-27 1998-01-27 Production of carbon nitride film and device for producing it

Country Status (1)

Country Link
JP (1) JPH11209868A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013057093A (en) * 2011-09-07 2013-03-28 Toyota Motor Corp Sliding member, method for manufacturing the same, and sliding structure

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013057093A (en) * 2011-09-07 2013-03-28 Toyota Motor Corp Sliding member, method for manufacturing the same, and sliding structure

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