JPH11183536A5 - - Google Patents

Info

Publication number
JPH11183536A5
JPH11183536A5 JP1997349656A JP34965697A JPH11183536A5 JP H11183536 A5 JPH11183536 A5 JP H11183536A5 JP 1997349656 A JP1997349656 A JP 1997349656A JP 34965697 A JP34965697 A JP 34965697A JP H11183536 A5 JPH11183536 A5 JP H11183536A5
Authority
JP
Japan
Prior art keywords
magnetic field
effective value
domain data
amplifier circuit
calculation circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1997349656A
Other languages
English (en)
Japanese (ja)
Other versions
JPH11183536A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP9349656A priority Critical patent/JPH11183536A/ja
Priority claimed from JP9349656A external-priority patent/JPH11183536A/ja
Publication of JPH11183536A publication Critical patent/JPH11183536A/ja
Publication of JPH11183536A5 publication Critical patent/JPH11183536A5/ja
Pending legal-status Critical Current

Links

JP9349656A 1997-12-18 1997-12-18 磁気測定装置 Pending JPH11183536A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9349656A JPH11183536A (ja) 1997-12-18 1997-12-18 磁気測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9349656A JPH11183536A (ja) 1997-12-18 1997-12-18 磁気測定装置

Publications (2)

Publication Number Publication Date
JPH11183536A JPH11183536A (ja) 1999-07-09
JPH11183536A5 true JPH11183536A5 (OSRAM) 2005-07-28

Family

ID=18405215

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9349656A Pending JPH11183536A (ja) 1997-12-18 1997-12-18 磁気測定装置

Country Status (1)

Country Link
JP (1) JPH11183536A (OSRAM)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5526384B2 (ja) * 2009-10-22 2014-06-18 国立大学法人名古屋大学 細胞組織評価装置
CN111521958B (zh) * 2020-04-22 2022-08-09 北京森馥科技股份有限公司 低频磁场测量方法、装置、电子设备及存储介质

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