JPH11176997A - Glass mold semiconductor device coating glass slurry - Google Patents
Glass mold semiconductor device coating glass slurryInfo
- Publication number
- JPH11176997A JPH11176997A JP36284697A JP36284697A JPH11176997A JP H11176997 A JPH11176997 A JP H11176997A JP 36284697 A JP36284697 A JP 36284697A JP 36284697 A JP36284697 A JP 36284697A JP H11176997 A JPH11176997 A JP H11176997A
- Authority
- JP
- Japan
- Prior art keywords
- glass
- slurry
- weight
- aliphatic alcohol
- semiconductor element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C8/00—Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
- C03C8/14—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions
- C03C8/16—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions with vehicle or suspending agents, e.g. slip
Landscapes
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Glass Compositions (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、ガラスモールド型半導
体素子の被覆に用いられるガラススラリーに関するもの
である。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a glass slurry used for coating a glass mold type semiconductor device.
【0002】[0002]
【従来の技術】従来、PN接合部を有するシリコンダイ
オード等の半導体素子全体をガラスで被覆して素子の表
面安定化と気密封止を行う、いわゆるガラスモールド型
半導体が知られている。この半導体は、亜鉛系或いは鉛
系のガラス粉末に純水を適当量添加して作製したガラス
スラリーを、回転状態にある半導体素子及び電極に滴下
して巻き付けた後、乾燥、焼成することにより製造され
る。2. Description of the Related Art Heretofore, a so-called glass-molded semiconductor has been known in which a semiconductor element such as a silicon diode having a PN junction is entirely covered with glass to stabilize the surface of the element and hermetically seal the element. This semiconductor is manufactured by adding a suitable amount of pure water to zinc-based or lead-based glass powder, dropping and winding a glass slurry on a semiconductor element and an electrode in a rotating state, followed by drying and firing. Is done.
【0003】[0003]
【発明が解決しようとする課題】ところで半導体素子と
電極の界面には段差があり平坦でないことから、スラリ
ーの巻き付けの際に泡(ボイド)を巻き込みやすい。巻
き込まれた泡の多くは半導体素子表面に接する形で存在
するため、被覆用ガラスの本来の目的である表面安定化
や気密封止が不十分となり、半導体素子の電気特性の劣
化、特に逆耐圧の低下や逆漏れ電流の増加を起こす原因
となっている。Since the interface between the semiconductor element and the electrode has a step and is not flat, bubbles (voids) are liable to be involved when the slurry is wound. Since most of the entrained bubbles are in contact with the surface of the semiconductor element, the surface stabilization and hermetic sealing, which are the original purposes of the coating glass, are insufficient, and the electrical characteristics of the semiconductor element are deteriorated, particularly, the reverse withstand voltage. And the reverse leakage current increases.
【0004】本発明の目的は、巻き込み泡による電気特
性の劣化がないガラスモールド型半導体素子被覆用ガラ
ススラリーを提供することである。[0004] It is an object of the present invention to provide a glass slurry for coating a glass mold type semiconductor element which does not deteriorate the electric characteristics due to entrained bubbles.
【0005】[0005]
【課題を解決するための手段】本発明のガラスモールド
型半導体素子被覆用ガラススラリーは、ガラス粉末と水
からなるガラスモールド型半導体素子被覆用ガラススラ
リーにおいて、脂肪族アルコールが添加されてなること
を特徴とする。The glass slurry for coating a glass mold type semiconductor element of the present invention is obtained by adding an aliphatic alcohol to a glass slurry for coating a glass mold type semiconductor element comprising glass powder and water. Features.
【0006】[0006]
【作用】本発明のガラススラリーは、脂肪族アルコール
の添加により、半導体素子との濡れ性が向上するため、
泡の巻き込みが減少する。また素子表面と泡の間にスラ
リーが回り込みやすくなり、素子表面に泡が接触しにく
くなるため、半導体素子の電気特性の劣化を防止でき
る。The glass slurry of the present invention improves the wettability with a semiconductor element by adding an aliphatic alcohol.
Foam entrapment is reduced. In addition, since the slurry easily flows between the element surface and the bubbles, and the bubbles hardly come into contact with the element surface, deterioration of the electrical characteristics of the semiconductor element can be prevented.
【0007】本発明において使用されるガラス粉末は、
ガラスモールド型半導体素子被覆用として使用可能なも
のであれば限定されないが、特に亜鉛系ガラスの場合に
効果的である。亜鉛系ガラスとしては、例えば重量百分
率でZnO 45〜75%、B2 O3 15〜30%、
SiO2 5〜15%、PbO 1〜10%、MnO2
0〜5%、Bi2 O3 0〜20%、Nb2 O5 0
〜5%、Sb2 O30〜4%、Al2 O3 0〜5%、
TiO2 0〜3%、CeO2 0〜2%の組成を有す
るガラスが使用できる。また鉛系ガラスとしては、例え
ば重量百分率でPbO 30〜70%、SiO2 25
〜60%、B2 O3 0〜20%、Al2 O3 0〜1
0%の組成を有するガラスが使用できる。The glass powder used in the present invention is:
There is no particular limitation as long as it can be used for coating a glass mold type semiconductor element, but it is particularly effective in the case of zinc-based glass. The zinc-based glass, for example, 45 to 75% ZnO by weight percent, B 2 O 3 15~30%,
SiO 2 5~15%, PbO 1~10% , MnO 2
0~5%, Bi 2 O 3 0~20 %, Nb 2 O 5 0
~5%, Sb 2 O 3 0~4 %, Al 2 O 3 0~5%,
TiO 2 0 to 3%, the glass having a composition of CeO 2 0 to 2% may be used. As the lead-based glass, for example, 30 to 70% by weight of PbO, 25% by weight of SiO 2
~60%, B 2 O 3 0~20 %, Al 2 O 3 0~1
Glass having a composition of 0% can be used.
【0008】本発明において添加される脂肪族アルコー
ルとしては、炭素数が1〜3のものを1種又は2種以上
使用することが好ましく、具体的にはメチルアルコー
ル、エチルアルコール、イソプロピルアルコール等が使
用できる。脂肪族アルコールの炭素数を1〜3に限定し
た理由は、炭素数4以上のアルコールを使用するとスラ
リーの巻き付け、乾燥後の表面の平滑性が得られず、焼
成後の形状不安定要因となり易いためである。As the aliphatic alcohol to be added in the present invention, it is preferable to use one or more of aliphatic alcohols having 1 to 3 carbon atoms, specifically, methyl alcohol, ethyl alcohol, isopropyl alcohol and the like. Can be used. The reason for limiting the number of carbon atoms of the aliphatic alcohol to 1 to 3 is that if an alcohol having 4 or more carbon atoms is used, the slurry is not wound, and the smoothness of the surface after drying is not obtained. That's why.
【0009】脂肪族アルコールの添加量は、ガラス粉末
100重量部に対して0.1〜5重量部であることが好
ましい。添加量をこのように限定する理由は、0.1重
量部より少ないと半導体素子との濡れ性を改善する効果
が小さく、5重量部より多いとスラリーの巻き付け、乾
燥後の表面の平滑性が得にくいためである。The amount of the aliphatic alcohol to be added is preferably 0.1 to 5 parts by weight based on 100 parts by weight of the glass powder. The reason for limiting the addition amount in this manner is that if it is less than 0.1 part by weight, the effect of improving the wettability with the semiconductor element is small, and if it is more than 5 parts by weight, the slurry is wound and the surface smoothness after drying is reduced. This is because it is difficult to obtain.
【0010】本発明において、ガラス粉末をスラリー化
するために添加される水としては、純水を使用すること
が望ましく、またその添加量はガラス粉末100重量部
に対して25〜45重量部が適当である。In the present invention, pure water is desirably used as the water added to make the glass powder into a slurry, and the amount of addition is 25 to 45 parts by weight based on 100 parts by weight of the glass powder. Appropriate.
【0011】[0011]
【実施例】以下、本発明を実施例に基づいて説明する。DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below based on embodiments.
【0012】表1及び表2は本発明の実施例(試料N
o.1〜6)及び比較例(試料No.7)を示してい
る。Tables 1 and 2 show examples of the present invention (sample N
o. 1 to 6) and a comparative example (sample No. 7).
【0013】[0013]
【表1】 [Table 1]
【0014】[0014]
【表2】 [Table 2]
【0015】試料No.1〜6は次のようにして調製し
た。Sample No. 1 to 6 were prepared as follows.
【0016】まずガラス粉末として、亜鉛系ガラス(Z
nO 60%、B2 O3 25%、SiO2 10%、
PbO 2%、Bi2 O3 1%、Nb2 O5 1%、
Sb2 O3 1%)及び鉛系ガラス(PbO 45%、
SiO2 40%、B2 O310%、Al2 O3 5
%)の2種類を用意した。なお各ガラス粉末は平均粒径
が4μmとなるように作製した。First, a zinc-based glass (Z
nO 60%, B 2 O 3 25%, SiO 2 10%,
PbO 2%, Bi 2 O 3 1%, Nb 2 O 5 1%,
Sb 2 O 3 1%) and lead glass (PbO 45%,
SiO 2 40%, B 2 O 3 10%, Al 2 O 3 5
%) Were prepared. In addition, each glass powder was produced so that an average particle diameter might be set to 4 micrometers.
【0017】次にガラス粉末100重量部に対して純水
35重量部を添加し、さらに炭素数が1〜3の脂肪族ア
ルコールを添加し、混練してスラリーとし、試料を得
た。なおガラス粉末の種類、脂肪族アルコールの種類及
び添加量は表の通りとした。Next, 35 parts by weight of pure water was added to 100 parts by weight of the glass powder, and an aliphatic alcohol having 1 to 3 carbon atoms was further added and kneaded to obtain a slurry to obtain a sample. In addition, the kind of glass powder, the kind and addition amount of aliphatic alcohol were as shown in the table.
【0018】また試料No.7は、脂肪族アルコールを
添加せず、他は上記と同様にして作製した。Sample No. 7 was produced in the same manner as described above except that no aliphatic alcohol was added.
【0019】次に、各試料を回転している半導体素子へ
滴下して巻き付け、乾燥後、680℃で焼成を行った。
続いて半導体素子を被覆しているガラスを研磨して素子
表面を露出させた後、研磨面を実体顕微鏡にて観察し、
泡の総数、素子表面に接している泡数、及び素子に接し
ていない泡の素子表面からの距離を測定した。結果を表
に示す。Next, each sample was dropped and wound around a rotating semiconductor element, dried, and fired at 680 ° C.
Subsequently, after polishing the glass covering the semiconductor element to expose the element surface, the polished surface was observed with a stereoscopic microscope,
The total number of bubbles, the number of bubbles in contact with the element surface, and the distance of bubbles not in contact with the element from the element surface were measured. The results are shown in the table.
【0020】表から明らかなように、脂肪族アルコール
を添加していない試料No.7は、泡数が24個であ
り、その内17個が素子表面に接していた。また素子と
接していない泡の素子表面からの距離は最短で50μm
であった。これに対して本発明の実施例であるNo.1
〜6の試料は、泡数が12〜15個と試料No.7に比
べて半減しており、しかも素子表面と接する泡は6個以
下と激減していた。また素子と接していない泡の素子表
面からの距離は110μm以上あり、試料No.7に比
べ、素子と泡との間にスラリーが回り込みやすく、両者
の接触が起こり難くなっていることが分かった。As is clear from the table, Sample No. to which no aliphatic alcohol was added was used. Sample No. 7 had 24 bubbles, of which 17 were in contact with the element surface. The distance of bubbles not in contact with the element from the element surface is 50 μm at the shortest.
Met. On the other hand, in the embodiment of the present invention, No. 1
The samples No. to No. 6 have 12 to 15 bubbles and the sample Nos. 7, and the number of bubbles in contact with the element surface was sharply reduced to 6 or less. The distance of the bubbles not in contact with the element from the element surface was 110 μm or more. It was found that the slurry was more likely to flow between the element and the foam than in Example 7, and the contact between the two was hard to occur.
【0021】[0021]
【発明の効果】以上説明したように、本発明のガラスス
ラリーを使用すると、スラリー巻き付け時に発生する泡
の巻き込みを減少させることができ、また素子表面と泡
の接触を起こし難くすることが可能である。それゆえ半
導体素子の電気特性の劣化を防止でき、ガラスモールド
型半導体素子の被覆に用いられるガラススラリーとして
好適である。As described above, when the glass slurry of the present invention is used, the entrapment of bubbles generated during the winding of the slurry can be reduced, and the contact of the bubbles with the element surface can be suppressed. is there. Therefore, deterioration of the electrical characteristics of the semiconductor element can be prevented, and it is suitable as a glass slurry used for coating a glass mold type semiconductor element.
Claims (3)
型半導体素子被覆用ガラススラリーにおいて、脂肪族ア
ルコールが添加されてなることを特徴とするガラスモー
ルド型半導体素子被覆用ガラススラリー。1. A glass slurry for coating a glass mold type semiconductor element, comprising: a glass slurry for coating a glass mold type semiconductor element comprising glass powder and water, wherein an aliphatic alcohol is added.
することを特徴とする請求項1のガラスモールド型半導
体素子被覆用ガラススラリー。2. The glass slurry for coating a glass mold type semiconductor element according to claim 1, wherein an aliphatic alcohol having 1 to 3 carbon atoms is used.
25〜45重量部、炭素数1〜3の脂肪族アルコールが
0.1〜5重量部であることを特徴とする請求項1のガ
ラスモールド型半導体素子被覆用ガラススラリー。3. The method according to claim 1, wherein water is 25 to 45 parts by weight and aliphatic alcohol having 1 to 3 carbon atoms is 0.1 to 5 parts by weight based on 100 parts by weight of the glass powder. Glass mold type glass slurry for semiconductor element coating.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP36284697A JPH11176997A (en) | 1997-12-12 | 1997-12-12 | Glass mold semiconductor device coating glass slurry |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP36284697A JPH11176997A (en) | 1997-12-12 | 1997-12-12 | Glass mold semiconductor device coating glass slurry |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH11176997A true JPH11176997A (en) | 1999-07-02 |
Family
ID=18477881
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP36284697A Pending JPH11176997A (en) | 1997-12-12 | 1997-12-12 | Glass mold semiconductor device coating glass slurry |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH11176997A (en) |
-
1997
- 1997-12-12 JP JP36284697A patent/JPH11176997A/en active Pending
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