JPH11166976A5 - - Google Patents

Info

Publication number
JPH11166976A5
JPH11166976A5 JP1997333838A JP33383897A JPH11166976A5 JP H11166976 A5 JPH11166976 A5 JP H11166976A5 JP 1997333838 A JP1997333838 A JP 1997333838A JP 33383897 A JP33383897 A JP 33383897A JP H11166976 A5 JPH11166976 A5 JP H11166976A5
Authority
JP
Japan
Prior art keywords
layer
channel
ray detector
ray
semiconductor layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1997333838A
Other languages
English (en)
Japanese (ja)
Other versions
JPH11166976A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP9333838A priority Critical patent/JPH11166976A/ja
Priority claimed from JP9333838A external-priority patent/JPH11166976A/ja
Publication of JPH11166976A publication Critical patent/JPH11166976A/ja
Publication of JPH11166976A5 publication Critical patent/JPH11166976A5/ja
Pending legal-status Critical Current

Links

JP9333838A 1997-12-04 1997-12-04 Ｘ線検出器及びｘ線ｃｔ装置 Pending JPH11166976A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9333838A JPH11166976A (ja) 1997-12-04 1997-12-04 Ｘ線検出器及びｘ線ｃｔ装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9333838A JPH11166976A (ja) 1997-12-04 1997-12-04 Ｘ線検出器及びｘ線ｃｔ装置

Publications (2)

Publication Number Publication Date
JPH11166976A JPH11166976A (ja) 1999-06-22
JPH11166976A5 true JPH11166976A5 (enExample) 2005-07-21

Family

ID=18270515

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9333838A Pending JPH11166976A (ja) 1997-12-04 1997-12-04 Ｘ線検出器及びｘ線ｃｔ装置

Country Status (1)

Country Link
JP (1) JPH11166976A (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6298113B1 (en) * 2000-02-07 2001-10-02 General Electric Company Self aligning inter-scintillator reflector x-ray damage shield and method of manufacture
WO2002101413A1 (en) * 2001-06-12 2002-12-19 Institute Of Whole Body Metabolism Particle beam quantative sensor
JPWO2003067282A1 (ja) 2002-02-08 2005-06-02 株式会社東芝 Ｘ線検出器およびｘ線検出器の製造方法
EP3120383B1 (en) 2015-01-15 2017-11-29 Koninklijke Philips N.V. Imaging detector module assembly
CN110320546B (zh) * 2018-03-29 2024-04-19 厦门迈通光电有限公司 闪烁体阵列和制备闪烁体阵列的模具及方法
CN112782744B (zh) * 2020-12-30 2023-12-26 江苏赛诺格兰医疗科技有限公司 一体化粘接SiPM探测器的制作方法及安装平台

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