JPH11103168A - Manufacture of multilayered wiring board using insulating resin containing specified oxidation inhibitor - Google Patents

Manufacture of multilayered wiring board using insulating resin containing specified oxidation inhibitor

Info

Publication number
JPH11103168A
JPH11103168A JP26119197A JP26119197A JPH11103168A JP H11103168 A JPH11103168 A JP H11103168A JP 26119197 A JP26119197 A JP 26119197A JP 26119197 A JP26119197 A JP 26119197A JP H11103168 A JPH11103168 A JP H11103168A
Authority
JP
Japan
Prior art keywords
circuit
wiring board
insulating layer
insulating
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP26119197A
Other languages
Japanese (ja)
Other versions
JP4126735B2 (en
Inventor
Shin Takanezawa
伸 高根沢
Masaki Morita
正樹 森田
Kazumasa Takeuchi
一雅 竹内
Shuichi Hatakeyama
修一 畠山
Hiroyuki Fukai
弘之 深井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Showa Denko Materials Co Ltd
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Priority to JP26119197A priority Critical patent/JP4126735B2/en
Publication of JPH11103168A publication Critical patent/JPH11103168A/en
Application granted granted Critical
Publication of JP4126735B2 publication Critical patent/JP4126735B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a method of manufacturing a multilayered wiring board having an insulating layer, wherein a microscopic via hole can be formed while the layer maintains heat resistance and insulation reliability in a moistening state. SOLUTION: In a method for manufacturing a wiring board, which is formed into a multilayered structure by a method, wherein an insulating layer 3 is formed on the surface of a first circuit 2 on an insulating board 1 with the first circuit 2 formed thereon, a via hole 6 for connecting the layer 3 with the circuit 2 is formed in the layer 3, second circuits 8 are formed on the surface of the layer 3 by a copper plating and the inter-layer connection of the via hole 6 is made, a photosensitive resin containing a hindered phenol oxidation inhibitor as its essential component or an insulating resin concurrently using photosensitivity and thermosetting is used for the layer 3.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、多層配線板の製造
方法に関するものであり、更に詳しくは、層間絶縁層を
ビルドアップ方式で形成する多層配線板の絶縁樹脂に関
するものである。
The present invention relates to a method for manufacturing a multilayer wiring board, and more particularly to an insulating resin for a multilayer wiring board in which an interlayer insulating layer is formed by a build-up method.

【0002】[0002]

【従来の技術】通常の多層配線板は、内層回路を形成し
た絶縁基板上に、プリプレグと称するガラス布にエポキ
シ樹脂を含浸し半硬化状態にした材料を銅箔と重ねて熱
プレスにより積層一体化した後、ドリルで層間接続用の
スルーホールをあけ、スルーホール内壁と銅箔表面上に
無電解めっきを行い、さらに必要に応じて電解めっきを
行って必要な厚さの回路導体とした後、不要な銅を除去
して多層配線板を製造する。 近年、電子機器の小型
化、軽量化、多機能化が一段と進み、これに伴い、LS
Iやチップ部品等の高集積化が進みその形態も多ピン
化、小型化へと急速に変化している。これらに対応し、
多層配線板は、電子部品の実装密度を向上するために、
微細配線化の開発が進められている。しかしながら、配
線幅の縮小には技術的に限界があり、現在量産可能な配
線幅は75〜100μmである。このため、単に配線幅
を縮小するだけでは大幅な配線密度の向上が達成しにく
い。また、配線密度向上の隘路となっているのが、直径
300μm前後の面積をしめるスルーホールである。こ
のスルーホールは、一般的にメカニカルドリルで形成さ
れるために比較的に寸法が大きく、このため配線設計の
自由度に乏しくなる。これらの問題を解決するものとし
て、感光性を付与した絶縁樹脂を回路形成した絶縁基板
上に形成し、フォトプロセスにより絶縁樹脂に微少なバ
イアホールを形成して層間接続する方法が、特公平4−
55555号公報や特開昭63−126296号公報に
開示されている。
2. Description of the Related Art A general multilayer wiring board is formed by laminating a semi-cured material obtained by impregnating a glass cloth called a prepreg with an epoxy resin on a semi-cured state on a copper foil on an insulating substrate having an inner layer circuit formed thereon, and hot-pressing the laminated body. After drilling, a through hole for interlayer connection is drilled, electroless plating is performed on the inner wall of the through hole and the copper foil surface, and electrolytic plating is further performed as necessary to obtain a circuit conductor of a required thickness. Then, unnecessary copper is removed to manufacture a multilayer wiring board. In recent years, the miniaturization, weight reduction, and multifunctionalization of electronic devices have progressed further, and with this, LS
As the degree of integration of ICs and chip components is increasing, the form is rapidly changing to increase the number of pins and reduce the size. In response to these,
In order to improve the mounting density of electronic components, multilayer wiring boards
Development of fine wiring is underway. However, there is a technical limit in reducing the wiring width, and the wiring width that can be mass-produced at present is 75 to 100 μm. For this reason, it is difficult to achieve a significant increase in wiring density simply by reducing the wiring width. A bottleneck for improving the wiring density is a through hole having an area of about 300 μm in diameter. Since the through holes are generally formed by a mechanical drill, the dimensions thereof are relatively large, and therefore, the degree of freedom in wiring design is poor. In order to solve these problems, a method is known in which an insulating resin having photosensitivity is formed on an insulating substrate on which a circuit is formed, and fine via holes are formed in the insulating resin by a photo process to perform interlayer connection. −
These are disclosed in Japanese Patent Application Laid-Open No. 55555 and Japanese Patent Application Laid-Open No. 63-126296.

【0003】[0003]

【発明が解決しようとする課題】前記した様に、フォト
プロセスによって形成した微少なバイアホールで層間接
続する多層配線板は、従来抱えていた多層配線板の配線
密度向上の問題に関して大きく寄与するものである。こ
のフォトプロセスによって形成するバイアホールは、小
径であればある程配線設計の自由度が増す点で有利であ
る。しかしながら、微小なバイアホールを得るために絶
縁層は親水性を増した材料設計とする必要がある。樹脂
自体の親水性を増すことは、樹脂に親水基を付加させる
ことなどから容易にできる。しかし、親水性を増すこと
は吸水率を上げることと同様であることから、絶縁層の
吸水特性すなわち加湿状態での耐熱性や絶縁信頼性が低
下しやすくなることは言うまでもない。したがって、絶
縁層としての特性を維持しながらバイアホールの小径化
を実現させることは容易ではない。本発明は、このよう
な点を解決したものであり、特定の酸化防止剤を添加す
ることにより絶縁層として必要な特性を維持したまま、
容易にバイアホールの小径化を実現できる手法を見出し
たものである。
As described above, a multilayer wiring board connected between layers by minute via holes formed by a photo process greatly contributes to the problem of improving the wiring density of a multilayer wiring board which has been conventionally faced. It is. The via hole formed by this photo process is advantageous in that the smaller the diameter, the greater the degree of freedom in wiring design. However, in order to obtain minute via holes, it is necessary to design the insulating layer with a material having increased hydrophilicity. Increasing the hydrophilicity of the resin itself can be easily achieved by adding a hydrophilic group to the resin. However, since increasing the hydrophilicity is the same as increasing the water absorption, it goes without saying that the water absorption properties of the insulating layer, that is, the heat resistance in a humidified state and the insulation reliability are likely to be reduced. Therefore, it is not easy to reduce the diameter of the via hole while maintaining the characteristics as an insulating layer. The present invention is to solve such a point, while maintaining the characteristics required as an insulating layer by adding a specific antioxidant,
The present inventors have found a technique that can easily realize a reduction in the diameter of a via hole.

【0004】[0004]

【課題を解決するための手段】本発明は、第1の回路を
形成した絶縁基板の回路表面上に、絶縁層を形成し、絶
縁層に第1の回路と接続するためのバイアホールを形成
し、銅めっきによって絶縁層表面に第2の回路形成及び
バイアホールの層間接続を行って多層化する配線板の製
造方法において、絶縁層が、ヒンダードフェノール系酸
化防止剤を必須に含む感光性樹脂または感光性と熱硬化
性を併用した絶縁樹脂を用いるものである。そして本発
明は、ヒンダードフェノール系酸化防止剤が、ブチル化
ヒドロキシアニソール、2,6-ジ-t-ブチル-4-エチルフェ
ノール、2,2′-メチレン-ヒ゛ス(4-メチル-6-t-ブチルフ
ェノール)、4,4′-チオビス-(3-メチル-6-t-ブチル
フェノール)、4,4′-ブチリデンビス-(3-メチル-6-t
-ブチルフェノール)、1,1,3-トリス(2-メチル-4ヒド
ロキシ-5-t-ブチルフェニル)ブタン、1,3,5-(4-ヒド
ロキシベンジル)ベンゼン、テトラキス-[メチレン-3-
(3′,5′-ジ-t-ブチル-4′-ヒドロキシルフェニルプ
ロピオネート]メタンの群から選ばれる少なくとも一つ
以上を用いると好ましい多層配線板の製造方法である。
According to the present invention, an insulating layer is formed on a circuit surface of an insulating substrate on which a first circuit is formed, and a via hole for connecting to the first circuit is formed in the insulating layer. In a method of manufacturing a wiring board in which a second circuit is formed on a surface of an insulating layer by copper plating and interlayer connection of via holes is performed to form a multilayer, the insulating layer essentially contains a hindered phenolic antioxidant. A resin or an insulating resin having both photosensitivity and thermosetting properties is used. In the present invention, the hindered phenol-based antioxidant is a compound comprising butylated hydroxyanisole, 2,6-di-t-butyl-4-ethylphenol, 2,2′-methylene-bis (4-methyl-6-t -Butylphenol), 4,4'-thiobis- (3-methyl-6-t-butylphenol), 4,4'-butylidenebis- (3-methyl-6-t
-Butylphenol), 1,1,3-tris (2-methyl-4hydroxy-5-t-butylphenyl) butane, 1,3,5- (4-hydroxybenzyl) benzene, tetrakis- [methylene-3-
The use of at least one selected from the group of (3 ', 5'-di-tert-butyl-4'-hydroxylphenylpropionate) methane is a preferred method for producing a multilayer wiring board.

【0005】[0005]

【発明の実施の形態】本発明で用いるヒンダードフェノ
ール系酸化防止剤は、何種類かを併用しても良く、その
配合量は、酸化防止剤を除いた絶縁樹脂100重量部に対
して0.01〜5重量部が好ましい。0.01重量部未満では、
バイアホールの小径化すなわち解像性向上に効果がな
く、5重量部を超えると光硬化性が充分でなくなるため
に、絶縁特性やはんだ耐熱性が低下する傾向を示す。
BEST MODE FOR CARRYING OUT THE INVENTION The hindered phenolic antioxidant used in the present invention may be used in combination of several kinds. The compounding amount is 0.01 to 100 parts by weight of the insulating resin excluding the antioxidant. ~ 5 parts by weight are preferred. If less than 0.01 parts by weight,
There is no effect in reducing the diameter of the via hole, that is, in improving the resolution. When the content exceeds 5 parts by weight, the photocurability becomes insufficient, so that the insulating properties and solder heat resistance tend to decrease.

【0006】本発明で用いる感光性樹脂または感光性と
熱硬化性を併用した絶縁樹脂としては、光によって架橋
可能な官能基を有した共重合体あるいは単量体を含んだ
組成物または光の他に熱で架橋可能な官能基と熱開始剤
を混合した組成物であれば何れも使用可能である。上記
成分と共に用いることができる他の樹脂成分として挙げ
られる第一の群としては、エポキシ樹脂、ブロム化エポ
キシ樹脂、ゴム変性エポキシ樹脂、ゴム分散エポキシ樹
脂等の脂環式エポキシ樹脂またはビスフェノール−A系
エポキシ樹脂及びこれらエポキシ樹脂の酸変性物が挙げ
られる。特に光照射を行って光硬化を行う場合にはこれ
らエポキシ樹脂と不飽和酸との変性物が好ましい。不飽
和酸としては無水マレイン酸無水物、テトラヒドロフタ
ル酸無水物、イタコン酸無水物、アクリル酸、メタクリ
ル酸等が挙げられる。これらはエポキシ樹脂のエポキシ
基に対し当量もしくは当量以下の配合比率で該不飽和カ
ルボン酸を反応させることによって得られる。このほか
にもメラミン樹脂、シアネートエステル樹脂のような熱
硬化性材料、も好ましい適用例の一つである。他には可
とう性付与材の使用も好適な組み合わせであり、その例
としてはブタジエンアクリロニトリルゴム、天然ゴム、
アクリルゴム、SBR、カルボン酸変性ブタジエンアク
リロニトリルゴム、カルボン酸変性アクリルゴム、架橋
NBR粒子、カルボン酸変性架橋NBR粒子等が挙げら
れる。このような種々の樹脂成分を加えることで光硬化
性、熱硬化性という基本性能を保持したまま硬化物に色
々な性質を付与することが可能になる。
The photosensitive resin used in the present invention or the insulating resin having both photosensitivity and thermosetting properties includes a composition containing a copolymer or a monomer having a functional group which can be crosslinked by light, or a composition containing light. In addition, any composition may be used as long as it is a composition in which a thermally crosslinkable functional group and a thermal initiator are mixed. The first group of other resin components that can be used together with the above components include epoxy resins, brominated epoxy resins, rubber-modified epoxy resins, alicyclic epoxy resins such as rubber-dispersed epoxy resins, and bisphenol-A-based resins. Examples include epoxy resins and acid-modified products of these epoxy resins. In particular, when photo-curing is performed by irradiating light, modified products of these epoxy resins and unsaturated acids are preferable. Examples of the unsaturated acid include maleic anhydride, tetrahydrophthalic anhydride, itaconic anhydride, acrylic acid, methacrylic acid and the like. These can be obtained by reacting the unsaturated carboxylic acid with the epoxy group of the epoxy resin in an equivalent amount or a mixing ratio of the equivalent or less. In addition, a thermosetting material such as a melamine resin and a cyanate ester resin is also one of preferable application examples. Another suitable combination is the use of a flexibility-imparting material, such as butadiene acrylonitrile rubber, natural rubber,
Examples include acrylic rubber, SBR, carboxylic acid-modified butadiene acrylonitrile rubber, carboxylic acid-modified acrylic rubber, crosslinked NBR particles, carboxylic acid-modified crosslinked NBR particles, and the like. By adding such various resin components, it becomes possible to impart various properties to the cured product while maintaining basic properties such as photocurability and thermosetting properties.

【0007】ゴム成分を配合した時には硬化物に強靭な
性質を与えると共に、酸化性薬液による表面処理によっ
て硬化物表面の粗化を簡単に行うことが可能になる。本
発明の感光性樹脂または感光性と熱硬化性を併用した樹
脂を用いる硬化性組成物においては通常使用される添加
剤(重合安定剤、レベリング剤、顔料、染料等)を使用
してもよい。またフィラーを配合することもなんら差し
支えない。フィラーとしてはシリカ、溶融シリカ、タル
ク、アルミナ、水和アルミナ、硫酸バリウム、水酸化カ
ルシウム、アエロジル、炭酸カルシウム等の無機微粒
子、粉末状エポキシ樹脂、粉末状ポリイミド粒子等の有
機微粒子、粉末状テフロン粒子等が挙げられる。これら
のフィラーには予めカップリング処理を施して有っても
よい。これらの分散はニーダー、ボールミル、ビーズミ
ル、3本ロール等既知の混練方法によって達成される
When a rubber component is compounded, the cured product is given tough properties, and the surface of the cured product can be easily roughened by surface treatment with an oxidizing chemical. In the curable composition using the photosensitive resin of the present invention or the resin combining photosensitivity and thermosetting, commonly used additives (polymerization stabilizer, leveling agent, pigment, dye, etc.) may be used. . There is no problem in adding a filler. As fillers, inorganic fine particles such as silica, fused silica, talc, alumina, hydrated alumina, barium sulfate, calcium hydroxide, aerosil, and calcium carbonate, organic fine particles such as powdery epoxy resin, powdery polyimide particles, and powdery Teflon particles And the like. These fillers may be subjected to a coupling treatment in advance. These dispersions are achieved by known kneading methods such as kneaders, ball mills, bead mills, and three rolls.

【0008】以上説明した絶縁層組成物を用いて、図1
に示した工程で多層配線板を製造する。図1に示した工
程に従い詳しく説明する。先ず、第1の回路を形成した
絶縁基板を用意する(図1−(a))。この絶縁基板は
特に限定するものではなく、ガラス布−エポキシ樹脂、
紙−フェノール樹脂、紙−エポキシ樹脂、ガラス布・ガ
ラス紙−エポキシ樹脂等通常の配線板に用いる絶縁基板
が使用できる。第1の回路を形成する方法としては、銅
箔と前記絶縁基板を張り合わせた銅張り積層板を用い、
銅箔の不要な部分をエッチング除去するサブトラクティ
ブ法や、前記絶縁基板の必要な個所に無電解めっきによ
って回路を形成するアディティブ法等、通常の配線板の
製造法を用いることができる。次に、第1の回路を形成
した回路表面上に前記絶縁層を形成する(図1−
(b))。この形成方法は、液状の樹脂をロールコー
ト、カーテンコート、ディプコート等の方法で塗布する
方式や、前記絶縁樹脂をフィルム化してラミネートで張
り合わせる方式を用いることができる。次に、絶縁層
に、第1の回路と接続するバイアホールを形成するため
にフォトマスクを介して露光し(図1−(c))、未露
光部分を現像液により食刻する方法によって絶縁層に第
1の回路と接続するバイアホールを形成する(図1−
(d))。露光は、通常の配線板のレジスト形成方法と
同じ手法が用いられる。また、未露光部分を現像液によ
り食刻する現像液としては、絶縁層に用いた樹脂組成物
をどのような現像タイプにするかで決定され、アルカリ
現像液、準水系現像液、溶剤現像液など一般的なものを
用いることができる。次に、絶縁層を酸化性粗化液で処
理した後、絶縁層上に銅めっきを析出させて第2の回路
形成及びバイアホールの層間接続を行う(図1−
(e))。この場合、絶縁層を紫外線及び紫外線と熱で
硬化させてから酸化性の粗化液に浸漬する手法を用いる
こともできる。酸化性粗化液としては、クロム/硫酸粗
化液、アルカリ過マンガン酸粗化液、フッ化ナトリウム
/クロム/硫酸粗化液、ホウフッ酸粗化液などを用いる
ことができる。さらに第2の回路を形成する方法として
は、粗化した絶縁層表面に無電解めっき用の触媒を付与
して全面に無電解めっき銅を析出させ、更に必要な場合
には電解めっきによって回路導体を必要な厚さにして、
不要な箇所をエッチング除去して形成する方法や、めっ
き触媒を含有した絶縁層を用いて、めっきレジストを形
成して必要な箇所のみ無電解めっきにより回路形成する
方法及びめっき触媒を含有しない絶縁層を粗化し、めっ
き触媒を付与した後めっきレジストを形成して必要な箇
所のみ無電解めっきにより回路形成する方法等を用いる
ことができる。本発明を多層化する場合には、以上の方
法(図1−(b)〜図1−(e))を繰り返し行い多層
化する(工程:図1−(f)〜図1−(h))。この
際、好ましくは、次の回路層を支持する絶縁層を形成す
る前に、その下になる回路層導体表面を粗化して凹凸を
形成したり、従来の多層配線板に用いられるように回路
層導体表面を酸化して凹凸を形成したり、酸化して形成
した凹凸を水素化ホウ素ナトリウムやジメチルアミンボ
ラン等のアルカリ性還元剤を用いて還元して層間の接着
力を高めることができる。
Using the insulating layer composition described above, FIG.
The multilayer wiring board is manufactured by the steps shown in (1). This will be described in detail according to the steps shown in FIG. First, an insulating substrate on which a first circuit is formed is prepared (FIG. 1- (a)). This insulating substrate is not particularly limited, and a glass cloth-epoxy resin,
An insulating substrate used for a normal wiring board such as paper-phenol resin, paper-epoxy resin, glass cloth / glass paper-epoxy resin can be used. As a method of forming the first circuit, using a copper-clad laminate obtained by laminating a copper foil and the insulating substrate,
An ordinary wiring board manufacturing method such as a subtractive method of etching and removing unnecessary portions of a copper foil and an additive method of forming a circuit by electroless plating at a necessary portion of the insulating substrate can be used. Next, the insulating layer is formed on the circuit surface on which the first circuit is formed (FIG. 1).
(B)). As a forming method, a method in which a liquid resin is applied by a method such as roll coating, curtain coating, or dip coating, or a method in which the insulating resin is formed into a film and bonded by lamination can be used. Next, the insulating layer is exposed through a photomask to form a via hole connected to the first circuit (FIG. 1- (c)), and the unexposed portion is etched by a developing solution. A via hole connecting to the first circuit is formed in the layer (FIG. 1)
(D)). Exposure is performed using the same method as that for forming a normal wiring board resist. Further, the developing solution for etching the unexposed portion with a developing solution is determined depending on the type of development of the resin composition used for the insulating layer, and includes an alkali developing solution, a semi-aqueous developing solution, and a solvent developing solution. For example, a general one can be used. Next, after treating the insulating layer with an oxidizing roughening solution, copper plating is deposited on the insulating layer to form a second circuit and connect via holes between layers (FIG. 1).
(E)). In this case, it is also possible to use a method in which the insulating layer is cured with ultraviolet light or ultraviolet light and heat and then immersed in an oxidizing roughening liquid. As the oxidizing roughening solution, a roughening solution of chromium / sulfuric acid, a roughening solution of alkali permanganate, a roughening solution of sodium fluoride / chromium / sulfuric acid, a roughening solution of borofluoric acid, or the like can be used. Further, as a method of forming the second circuit, a catalyst for electroless plating is applied to the surface of the roughened insulating layer to deposit electroless plated copper on the entire surface, and if necessary, a circuit conductor is formed by electrolytic plating. To the required thickness,
A method of forming by removing unnecessary portions by etching, a method of forming a plating resist using an insulating layer containing a plating catalyst, and forming a circuit by electroless plating only at necessary portions, and an insulating layer containing no plating catalyst And a method of forming a plating resist after applying a plating catalyst and forming a circuit by electroless plating only at a necessary portion. When the present invention is multi-layered, the above method (FIG. 1- (b) to FIG. 1- (e)) is repeated to form a multi-layer (step: FIG. 1- (f) to FIG. 1- (h)). ). At this time, preferably, before forming an insulating layer for supporting the next circuit layer, the surface of a circuit layer conductor thereunder is roughened to form irregularities, or a circuit is used as in a conventional multilayer wiring board. Irregularities can be formed by oxidizing the surface of the layer conductor, or the irregularities formed by oxidation can be reduced using an alkaline reducing agent such as sodium borohydride or dimethylamine borane to increase the adhesion between the layers.

【0009】本発明は、特定の添加剤を絶縁層樹脂組成
物に加えることで、層間接続に必要なバイアホールの小
径化が可能なビルドアップ方式で多層化する配線板の製
造方法であり、高密度化に優れた多層配線板を提供する
ことができる。以下に、本発明を実施例により具体的に
説明する。
The present invention relates to a method for producing a wiring board in which a specific additive is added to a resin composition for an insulating layer to form a multilayer structure by a build-up method capable of reducing the diameter of a via hole required for interlayer connection. A multilayer wiring board excellent in high density can be provided. Hereinafter, the present invention will be described specifically with reference to Examples.

【0010】[0010]

【実施例】【Example】

(実施例1) (1)18μmの両面粗化箔を両面に張り付けた銅張り
ガラス布エポキシ樹脂積層板であるMCL−E−67
(日立化成工業株式会社製商品名)を用い、不要な箇所
の銅箔をエッチング除去して、第1の回路を形成した
(図1−(a)に示す)。 (2)この表面の片面に、下記組成の絶縁樹脂をロール
コーターを用いて塗布し、80℃−10分間乾燥して膜
厚50μmの絶縁層を形成した(図1−(b)に示
す)。 ・フタル酸変性ノボラック型エポキシアクリレート(R−5259:日本化薬株 式会社製商品名) 70重量部 ・カルボン酸変成ブタジエン(ハイカーCTBN1300×13:宇部興産株式会社製商品 名) 10重量部 ・フェノールノボラック型Br化エポキシ樹脂(BREN-S:日本化薬株式会 社製商品名) 15重量部 ・光開始剤(イルガキュア651:チバガイギー社製、商品名) 5重量部 ・充填剤、水酸化アルミニウム(ハイジライトH−42M:昭和電工株式会社製 商品名) 10重量部 ・4,4′-ブチリデンビス-(3-メチル-6-t-ブチルフェノール)0.5重量部 (3)バイアホールとなる部分に遮蔽部を形成したフォ
トマスクを介して、露光量300mJ/cm2の紫外線
を照射して(図1−(c)に示す)、さらに未露光部分
を、2、2−ブトキシエタノールを10vol%、4硼
酸ナトリウム8g/lを含んだ現像液で30℃−1分間
スプレー処理をしてバイアホールを形成した。 (4)紫外線2J/cm2を絶縁層に照射して後露光を
行った。 (5)150℃−1時間後加熱を行った。 (6)絶縁層を化学粗化するために、粗化液として、K
MnO4:60g/l、NaOH:40g/lの水溶液
を作製し、50℃に加温して5分間浸漬処理する。KM
nO4浸漬処理後は、SnCl2:30g/l、HCl:
300ml/lの水溶液に室温で5分間浸漬処理して中
和し、粗化凹凸形状を形成した(図1−(d)に示
す)。 (7)第1の絶縁層表面に第2の回路を形成するため
に、まず、PdCl2を含む無電解めっき用触媒である
HS−202B(日立化成工業株式会社製商品名)に、
室温で10分間浸漬処理し、水洗し、無電解銅めっきで
あるL−59めっき液(日立化成工業株式会社製商品
名)に70℃で30分間浸漬し、さらに硫酸銅電解めっ
きを行って、絶縁層表面上に厚さ20μmの導体層を形
成した。次に、めっき導体の不要な箇所をエッチング除
去するためにエッチングレジストを形成し、エッチング
し、その後エッチングレジストを除去して、第1の回路
と接続したバイアホールを含む第2の回路形成を行った
(図1−(e)に示す)。 (8)さらに、多層化するために、第2の回路導体表面
を、亜塩素酸ナトリウム:50g/l,NaOH:20
g/l、リン酸三ナトリウム:10g/lの水溶液に8
5℃で20分間浸漬し、水洗して、80℃で20分間乾
燥して第2の回路導体表面上に酸化銅の凹凸を形成し
た。 (9)(2)〜(8)の工程を繰り返して3層の多層配
線板を作製した(図1−(f)〜図1−(h)に示し
た)
(Example 1) (1) MCL-E-67 which is a copper-clad glass cloth epoxy resin laminate having 18 μm double-sided roughened foil adhered to both sides.
An unnecessary portion of the copper foil was removed by etching using (trade name of Hitachi Chemical Co., Ltd.) to form a first circuit (shown in FIG. 1- (a)). (2) On one side of this surface, an insulating resin having the following composition was applied using a roll coater and dried at 80 ° C. for 10 minutes to form an insulating layer having a thickness of 50 μm (shown in FIG. 1- (b)). . 70% by weight of phthalic acid-modified novolak epoxy acrylate (R-5259: Nippon Kayaku Co., Ltd.) 10 parts by weight of carboxylic acid-modified butadiene (Hiker CTBN1300 × 13: Ube Industries, Ltd.) Novolak-type Br-epoxy resin (BREN-S: trade name, manufactured by Nippon Kayaku Co., Ltd.) 15 parts by weight Photoinitiator (Irgacure 651: trade name, manufactured by Ciba Geigy Corporation) 5 parts by weight Filler, aluminum hydroxide ( Heidilite H-42M: trade name, manufactured by Showa Denko KK 10 parts by weight ・ 0.5 parts by weight of 4,4'-butylidenebis- (3-methyl-6-t-butylphenol) (3) In a portion to be a via hole through a photomask to form a shield portion, and irradiated with ultraviolet light exposure amount 300 mJ / cm 2 (shown in FIG. 1- (c)), a further unexposed portions, 2,2 Bed Butoxyethanol and 10 vol%, to form a via hole to a 30 ° C. -1 min spraying with containing 4 sodium borate 8 g / l developer. (4) Post-exposure was performed by irradiating the insulating layer with ultraviolet rays at 2 J / cm 2 . (5) Heating was performed at 150 ° C. for one hour. (6) In order to chemically roughen the insulating layer, K
An aqueous solution of MnO 4 : 60 g / l and NaOH: 40 g / l is prepared, heated to 50 ° C., and immersed for 5 minutes. KM
After immersion in nO 4 , SnCl 2 : 30 g / l, HCl:
It was neutralized by immersion treatment in a 300 ml / l aqueous solution at room temperature for 5 minutes to form a roughened uneven shape (shown in FIG. 1- (d)). (7) In order to form a second circuit on the surface of the first insulating layer, first, a catalyst for electroless plating containing PdCl 2 , HS-202B (trade name, manufactured by Hitachi Chemical Co., Ltd.)
After immersion treatment at room temperature for 10 minutes, washing with water, immersion in an L-59 plating solution (trade name, manufactured by Hitachi Chemical Co., Ltd.) which is electroless copper plating at 70 ° C. for 30 minutes, and further performing copper sulfate electrolytic plating, A conductor layer having a thickness of 20 μm was formed on the surface of the insulating layer. Next, an etching resist is formed to remove unnecessary portions of the plated conductor by etching, etching is performed, and then the etching resist is removed to form a second circuit including a via hole connected to the first circuit. (Shown in FIG. 1- (e)). (8) Further, in order to form a multilayer, the surface of the second circuit conductor is made of sodium chlorite: 50 g / l, NaOH: 20
g / l, trisodium phosphate: 8 in 10 g / l aqueous solution
It was immersed at 5 ° C. for 20 minutes, washed with water, and dried at 80 ° C. for 20 minutes to form copper oxide irregularities on the surface of the second circuit conductor. (9) The steps (2) to (8) were repeated to produce a three-layer multilayer wiring board (shown in FIGS. 1- (f) to 1- (h)).

【0011】(実施例2)実施例1における4,4′-ブチ
リデンビス-(3-メチル-6-t-ブチルフェノール)の代
わりに、1,1,3-トリス(2-メチル-4-ヒドロキシ-5-t-
ブチルフェニル)ブタンを0.5重量部配合した。その
他は、実施例1と同様な手法で行った。
(Example 2) Instead of 4,4'-butylidenebis- (3-methyl-6-t-butylphenol) in Example 1, 1,1,3-tris (2-methyl-4-hydroxy- 5-t-
(Butylphenyl) butane was added in an amount of 0.5 part by weight. Otherwise, the procedure was the same as in Example 1.

【0012】(実施例3)実施例1における4,4′-ブチ
リデンビス-(3-メチル-6-t-ブチルフェノール)の代
わりに、テトラキス-[メチレン-3-(3′,5′-ジ-t-ブ
チル-4′-ヒドロキシルフェニルプロピオネート]を0.
5重量部配合した。その他は、実施例1と同様な手法で
行った。
Example 3 Instead of 4,4'-butylidenebis- (3-methyl-6-t-butylphenol) in Example 1, tetrakis- [methylene-3- (3 ', 5'-di- t-butyl-4'-hydroxylphenylpropionate].
5 parts by weight were blended. Otherwise, the procedure was the same as in Example 1.

【0013】(比較例1)実施例1において、4,4′-ブ
チリデンビス-(3-メチル-6-t-ブチルフェノール)を
配合しないこと以外は、実施例1と同様にして多層配線
板を作製した。
Comparative Example 1 A multilayer wiring board was produced in the same manner as in Example 1, except that 4,4'-butylidenebis- (3-methyl-6-t-butylphenol) was not blended. did.

【0014】以上のようにして作製した多層配線板の特
性を、表1に示した。なお、測定は、下記のようにして
行った。 ビアホール解像性:バイアホール直径が異なるフォトマ
スクを用いて露光、現像した基板のバイアホール形成部
を金属顕微鏡及び走査型電子顕微鏡を用いて、バイアホ
ール底部の樹脂残りとビアホール形状を観察して評価し
た。ビアホール底部に樹脂残りがなく、また、剥がれや
へこみのないビアホールが形成できる最低の直径をバイ
アホール解像性とした。 ピール強度:JIS C6481に準じ、めっき銅を9
0度方向に10mm幅で剥離した際の接着力を求めた。 288℃はんだ耐熱性:実施例及び比較例で作製した3
層の多層配線板を25mmに切断し、288±1℃に調
整したはんだ浴に60秒間浮かべ、ふくれ等の異常の発
生の有無を調べた。ふくれ等が発生したものを有、発生
しないものを無として評価した。 260はんだ耐熱性(40℃−90%RH2日処理):
実施例及び比較例で作製した3層の多層配線板を25m
mに切断し、40℃、90%RHに調整した恒温恒湿槽
に入れ2日間処理した。処理後、室温に1時間放置した
後に、260±1℃に調整したはんだ浴に30秒間浮か
べふくれ等の異常の発生の有無を調べた。ふくれ等が発
生したものを有、発生しないものを無として評価した。 層間絶縁抵抗:第1の回路と第2の回路から各々リード
線をはんだ付けで取り出し、室温下で第1の回路と第2
の回路間に100V、1分間直流電圧を印加した際の抵
抗を求めた。
Table 1 shows the characteristics of the multilayer wiring board manufactured as described above. In addition, the measurement was performed as follows. Via-hole resolution: The via-hole formed portion of the substrate exposed and developed using a photomask having a different via-hole diameter is observed by using a metallographic microscope and a scanning electron microscope to observe the resin residue and the via-hole shape at the bottom of the via-hole. evaluated. The minimum diameter at which a via hole having no resin residue at the bottom of the via hole and without peeling or dent was formed was defined as via hole resolution. Peel strength: 9 plated copper according to JIS C6481
The adhesive strength when peeled at a width of 10 mm in the 0 degree direction was determined. 288 ° C. solder heat resistance: 3 prepared in Examples and Comparative Examples
The multilayer wiring board having the layers was cut into 25 mm, floated in a solder bath adjusted to 288 ± 1 ° C. for 60 seconds, and examined for occurrence of abnormalities such as blistering. Those with blisters and the like were evaluated as "good" and those without blisters were evaluated as "no". 260 solder heat resistance (40 ° C-90% RH 2 days treatment):
The multilayer wiring board of three layers produced in the example and the comparative example is 25 m
m, and placed in a thermo-hygrostat adjusted to 40 ° C. and 90% RH for 2 days. After the treatment, it was left at room temperature for 1 hour, and then examined for the occurrence of abnormalities such as blistering in a solder bath adjusted to 260 ± 1 ° C. for 30 seconds. Those with blisters and the like were evaluated as "good" and those without blisters were evaluated as "no". Interlayer insulation resistance: Leads are respectively taken out of the first circuit and the second circuit by soldering, and the first circuit and the second circuit are separated at room temperature.
Was measured when a DC voltage of 100 V was applied between the circuits for 1 minute.

【0015】[0015]

【表1】 項目 実施例1 実施例2 実施例3 比較例1 ハ゛イアホール解像性(直径、mm) 0.08 0.09 0.08 0.15 ピール強度(KN/m) 1.0 0.9 1.0 1.1 288℃はんだ耐熱性(常態、60秒) 無 無 無 無 260℃はんだ耐熱性(30秒) 無 無 無 無 (40℃-90%RH-2日処理) 層間絶縁抵抗(Ω) 1012以上 1012以上 1012以上 1012以上 [Table 1] Item Example 1 Example 2 Example 3 Comparative Example 1 Wirehole resolution (diameter, mm) 0.08 0.09 0.08 0.15 Peel strength (KN / m) 1.0 0.9 1.0 1.1 288 ° C Soldering heat resistance (normal state, 60 seconds) None No No No 260 ° C solder heat resistance (30 seconds) No No No No (40 ° C-90% RH-2 days treatment) Interlayer insulation resistance (Ω) 10 12 or more 10 12 or more 10 12 or more 10 12 or more

【0016】表1より、本発明の感光性樹脂または感光
性と熱硬化性を併用した樹脂にヒンダードフェノール系
酸化防止剤を配合した実施例1〜3は、酸化防止剤を含
まない比較例1よりバイアホールの解像性に優れる。ま
た、ヒンダードフェノール系酸化防止剤を添加したにも
係わらず288℃での耐熱性や40℃−90%RHの条件
下に2日処理した後のはんだ耐熱性、層間絶縁抵抗にお
いても無添加の比較例1と同等以上であり他の特性を劣
化させることがない。
From Table 1, it can be seen that Examples 1 to 3 in which a hindered phenolic antioxidant is blended with the photosensitive resin of the present invention or a resin having both photosensitivity and thermosetting properties are Comparative Examples containing no antioxidant. 1 is superior in resolution of the via hole. Despite the addition of the hindered phenolic antioxidant, no heat resistance at 288 ° C., no solder heat resistance after two days of treatment at 40 ° C.-90% RH, and no interlayer insulation resistance Comparative Example 1 is equal to or more than that of Comparative Example 1, and other characteristics are not deteriorated.

【0017】[0017]

【発明の効果】以上のことから、本発明の絶縁樹脂組成
物を用いることで、小径のバイアホール形成性に優れた
ビルドアップ方式の多層配線板を提供することができ
た。
As described above, by using the insulating resin composition of the present invention, it was possible to provide a build-up type multilayer wiring board excellent in forming small-diameter via holes.

【図面の簡単な説明】[Brief description of the drawings]

【図1】(a)〜(h)は、本発明を説明するための断
面図である。
FIGS. 1A to 1H are cross-sectional views illustrating the present invention.

【符号の説明】[Explanation of symbols]

1.絶縁基板 2.第1の回路 3.第1の絶縁層 4.フォトマスク 5.紫外線 6.バイアホール 61.バイアホール 7.粗化面 71.粗化面 8.第2の回路 9.第2の絶縁層 10.第3の回路 1. 1. Insulating substrate 2. First circuit First insulating layer 4. Photomask 5. UV rays 6. Via hole 61. Via hole 7. Roughened surface 71. Roughened surface 8. Second circuit 9. Second insulating layer 10. Third circuit

───────────────────────────────────────────────────── フロントページの続き (72)発明者 畠山 修一 茨城県下館市大字小川1500番地 日立化成 工業株式会社下館研究所内 (72)発明者 深井 弘之 茨城県下館市大字小川1500番地 日立化成 工業株式会社下館工場内 ──────────────────────────────────────────────────の Continuing on the front page (72) Inventor Shuichi Hatakeyama 1500 Odai Ogawa, Shimodate City, Ibaraki Prefecture Inside the Shimodate Research Laboratory, Hitachi Chemical Co., Ltd. (72) Inventor Hiroyuki Fukai 1500 Odai Ogawa Shimodate City, Ibaraki Prefecture Hitachi Chemical Co., Ltd. Inside the Shimodate factory

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 第1の回路を形成した絶縁基板の回路表
面上に、絶縁層を形成し、絶縁層に第1の回路と接続す
るためのバイアホールを形成し、銅めっきによって絶縁
層表面に第2の回路形成及びバイアホールの層間接続を
行って多層化する配線板の製造方法において、絶縁層
が、ヒンダードフェノール系酸化防止剤を必須として含
む感光性樹脂または感光性と熱硬化性を併用した絶縁樹
脂を用いることを特徴とした多層配線板の製造方法。
An insulating layer is formed on a circuit surface of an insulating substrate on which a first circuit is formed, a via hole for connecting the first circuit to the insulating circuit is formed on the insulating layer, and the insulating layer surface is formed by copper plating. In the method for manufacturing a wiring board in which a second circuit is formed and a via hole is connected between layers to form a multilayer, the insulating layer is made of a photosensitive resin containing a hindered phenol-based antioxidant or a photosensitive and thermosetting resin. A method for manufacturing a multilayer wiring board, characterized by using an insulating resin which is used in combination with the above.
【請求項2】 ヒンダードフェノール系酸化防止剤が、
ブチル化ヒドロキシアニソール、2,6-ジ-t-ブチル-4-エ
チルフェノール、2,2′-メチレン-ヒ゛ス(4-メチル-6-t-
ブチルフェノール)、4,4′-チオビス-(3-メチル-6-t
-ブチルフェノール)、4,4′-ブチリデンビス-(3-メチ
ル-6-t-ブチルフェノール)、1,1,3-トリス(2-メチル
-4ヒドロキシ-5-t-ブチルフェニル)ブタン、1,3,5-
(4-ヒドロキシベンジル)ベンゼン、テトラキス-[メ
チレン-3-(3′,5′-ジ-t-ブチル-4′-ヒドロキシルフ
ェニルプロピオネート]メタンの群から選ばれる少なく
とも一つ以上である請求項1に記載の多層配線板の製造
方法。
2. The hindered phenolic antioxidant comprises:
Butylated hydroxyanisole, 2,6-di-t-butyl-4-ethylphenol, 2,2'-methylene-bis (4-methyl-6-t-t-
Butylphenol), 4,4'-thiobis- (3-methyl-6-t
-Butylphenol), 4,4'-butylidenebis- (3-methyl-6-t-butylphenol), 1,1,3-tris (2-methylphenol
-4 hydroxy-5-t-butylphenyl) butane, 1,3,5-
(4-hydroxybenzyl) benzene and at least one selected from the group consisting of tetrakis- [methylene-3- (3 ', 5'-di-tert-butyl-4'-hydroxylphenylpropionate] methane. 2. The method for producing a multilayer wiring board according to 1.
JP26119197A 1997-09-26 1997-09-26 Method for producing multilayer wiring board using insulating resin containing specific antioxidant Expired - Fee Related JP4126735B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26119197A JP4126735B2 (en) 1997-09-26 1997-09-26 Method for producing multilayer wiring board using insulating resin containing specific antioxidant

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26119197A JP4126735B2 (en) 1997-09-26 1997-09-26 Method for producing multilayer wiring board using insulating resin containing specific antioxidant

Publications (2)

Publication Number Publication Date
JPH11103168A true JPH11103168A (en) 1999-04-13
JP4126735B2 JP4126735B2 (en) 2008-07-30

Family

ID=17358415

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26119197A Expired - Fee Related JP4126735B2 (en) 1997-09-26 1997-09-26 Method for producing multilayer wiring board using insulating resin containing specific antioxidant

Country Status (1)

Country Link
JP (1) JP4126735B2 (en)

Also Published As

Publication number Publication date
JP4126735B2 (en) 2008-07-30

Similar Documents

Publication Publication Date Title
JP2006159900A (en) Metal foil with adhesive auxiliary agent and printed wiring board using it
JP2003304068A (en) Resin-attached metal foil for printed wiring board and multilayer printed wiring board using the same
US5993945A (en) Process for high resolution photoimageable dielectric
US5571365A (en) Adhesive for printed circuit board
JP3311450B2 (en) Method of manufacturing multilayer printed wiring board and multilayer printed wiring board
JPH11242330A (en) Photosensitive resin composition, multilayered printed circuit board using that, and its production
US6022670A (en) Process for high resolution photoimageable dielectric
JP3637613B2 (en) Manufacturing method of multilayer wiring board
JP2004014611A (en) Insulation film with supports, multilayer printed circuit board, and its manufacturing method
JPH11103168A (en) Manufacture of multilayered wiring board using insulating resin containing specified oxidation inhibitor
JP3697726B2 (en) Manufacturing method of multilayer wiring board
JPH11103173A (en) Manufacture of multilayered wiring board using insulating resin loaded with specified reducing agent
JP3513827B2 (en) Plastic flow sheet for multilayer printed wiring board and method of manufacturing multilayer printed wiring board using the same
JPH09186462A (en) Manufacture of multilayered flexible printed wiring board
JPH07193373A (en) Multilayer printed wiring board and adhering sheet
JPH10270857A (en) Manufacture of multilayered wiring board
JP2000244132A (en) Manufacture of multilayer wiring board using photosensitive resin containing specified polymerization stabilizer
JP5055659B2 (en) Insulating resin composition, use thereof and method for producing wiring board
JP4051587B2 (en) Method for producing multilayer wiring board using resin composition curable by heat or light
JP3758197B2 (en) Manufacturing method of multilayer printed wiring board
JPH11186719A (en) Manufacturing multilayered wiring board
JPH1154919A (en) Multilayered printed wiring board and its manufacture
JPH11261220A (en) Manufacture of multilayered printed wiring board
JP2000306429A (en) Insulation composition and multilayer wiring plate
JPH0818241A (en) Multilayer printed circuit board and method of manufacture

Legal Events

Date Code Title Description
A621 Written request for application examination

Effective date: 20040908

Free format text: JAPANESE INTERMEDIATE CODE: A621

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20070906

A521 Written amendment

Effective date: 20071018

Free format text: JAPANESE INTERMEDIATE CODE: A821

RD02 Notification of acceptance of power of attorney

Effective date: 20071018

Free format text: JAPANESE INTERMEDIATE CODE: A7422

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20080422

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Effective date: 20080505

Free format text: JAPANESE INTERMEDIATE CODE: A61

FPAY Renewal fee payment (prs date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110523

Year of fee payment: 3

FPAY Renewal fee payment (prs date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110523

Year of fee payment: 3

FPAY Renewal fee payment (prs date is renewal date of database)

Year of fee payment: 3

Free format text: PAYMENT UNTIL: 20110523

FPAY Renewal fee payment (prs date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120523

Year of fee payment: 4

FPAY Renewal fee payment (prs date is renewal date of database)

Year of fee payment: 5

Free format text: PAYMENT UNTIL: 20130523

LAPS Cancellation because of no payment of annual fees