JPH1090355A - Image formation apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an image formation apparatus by which a defect and a fault part can be judged easily. SOLUTION: In an image formation apparatus which forms an image on the basis of a command which is input from an input and display part, boundary scan test circuits 1a to 6a are installed in one part or all parts of an electronic circuit constituting the apparatus. The boundary scan test circuits 1a to 6a are provided with a test-signal generation part 12 which generates a test signal, with a test-data recording part 15 which records test data to be output from the boundary scan test circuits 1a to 6a, with a judgment part 13 which judges the test data and with a test-result display and control part 14 which displays a judged result on the input and display part.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an image forming apparatus, and more particularly, to an image forming apparatus having a self-checking function.

[0002]

2. Description of the Related Art Image forming apparatuses are widely used in offices today. In such an image forming apparatus, various kinds of inspection signals are input to an electronic circuit at the time of assembling the apparatus and when a failure occurs in the apparatus, and the inspection and the failure location are determined based on whether or not the output of the electronic circuit is normal. I was trying to do it.

[0003]

As described above, in a conventional image forming apparatus, various kinds of inspection signals are input to an electronic circuit when the apparatus is assembled or when a failure occurs in the apparatus, and the output of the electronic circuit is output. Inspections and faulty parts are determined based on whether they are normal.

An image forming apparatus is composed of many electronic circuits, and it takes a very long time to determine whether or not the electronic circuits are normal. SUMMARY OF THE INVENTION It is an object of the present invention to provide an image forming apparatus capable of easily determining a defect or a trouble part.

[0005]

Means adopted by the present invention to solve the above-mentioned problems will be described. According to the first aspect of the present invention, in an image forming apparatus for forming an image based on a command input from an input / display unit, a band scan test circuit is provided in a part or all of the electronic circuits constituting the image forming apparatus. A test signal generating unit for generating a test signal in the band scan test circuit, a test data recording unit for recording test data output from the band scan test circuit, and test data recorded in the test data recording unit And a test result display control unit that causes the input / display unit to display a result of the determination by the determination unit.

In the invention according to claim 2, the display of the determination result by the determination section, which is displayed by the test result display control section, is transferred and displayed on the transfer paper of the image forming apparatus. A band scan test circuit is provided in a part or all of the electronic circuit, a predetermined test signal is generated and input to the band scan test circuit, and the test data output from the band scan test circuit is stored in a normal state. It is determined whether the value is different from the value, and the determination result is transferred and displayed on the input / display unit of the image forming apparatus or on the transfer paper, so that it is easy to determine whether the electronic circuit is normal or not and the location of the failure. can do.

[0007] In the invention according to claim 3, the display of the judgment result by the judgment unit, which is displayed by the test result display control unit, is also displayed in addition to the judgment result. In the invention according to claim 4, the display of the test data is performed by displaying the input and output of the test data.

Further, since the input and output of the test data are displayed together with the display of the judgment result, it is possible to easily know the cause of the defect or the failure. According to a fifth aspect of the present invention, in the image forming apparatus for forming an image based on a command input from an input / display unit, a band scan test circuit is provided in a part or all of the electronic circuits constituting the image forming apparatus. A test signal generating unit for generating a test signal in the band scan test circuit; a test data recording unit for recording test data output from the band scan test circuit; and a test recorded in the test data recording unit. Data transfer means for transferring data to the center.

According to a sixth aspect of the present invention, a test signal input to the band scan test circuit is transferred from the center via the data transfer means instead of the test signal generator. A partly or entirely part of the electronic circuit is provided with a band scan test circuit, and a predetermined test signal is generated and input to the band scan test circuit or transferred from the center via data transfer means,
The test data output from the boundary scan test circuit is transferred to the center via the data transfer means. Therefore, when a failure occurs in the image forming apparatus, a maintenance person does not need to go to a place where the apparatus is installed. In addition, a test can be performed using a large amount of test pattern data, and a failure location or a failure location can be easily specified and its cause can be easily known.

[0010]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention will be described with reference to FIGS. FIG. 1 is a configuration diagram of a first embodiment,
FIG. 2 is a configuration diagram of the band-scan test circuit of the embodiment, FIG. 3 is a configuration diagram of a band scan cell of the band-scan test circuit, FIG. 4 is a specific example of the input / display unit of the embodiment, and FIG.・ Specific examples of the liquid crystal display screen of the display unit,
FIG. 6 is an operation flowchart of the first embodiment.

In FIG. 1, reference numeral 1 denotes an image memory for recording image data for forming an image of an image forming apparatus; 2, an input / display unit for inputting image forming conditions and the like; A scan unit 4 to be created is an image forming transfer unit for making image data conspicuous and transferring to a transfer paper to form an image. A paper feeding unit 5 feeds the transfer paper to the image forming transfer unit 4. This is a fixing paper discharge section that fixes the formed transfer paper and discharges it to a discharge tray.

Reference numeral 10 denotes a processor (CPU) for executing processing, 11 denotes an image forming control unit in which a program for controlling image formation of the image forming apparatus is stored, and 12 denotes data or a program for generating a test signal. A test signal generator 13 is provided for determining test results, a test result display controller 14 for displaying test results, and a test data recorder 15 for recording test data.

Also, 1b to 6b are interfaces (I
/ O) and 7 are buses for connecting the CPU 10 to the I / Os 1b to 6b. Also, an image memory 1, an input / display unit 2, a scanning unit 3, an image transfer unit 4, a paper feeding unit 5, and a fixing paper discharging unit 6.
In some or all of the electronic circuits of the above, that is, in the electronic circuits to be inspected, the band-scan test circuit (B
ST) 1a to 6a are provided.

The boundary scan test circuit includes, for example, I
It is standardized by EEE1149.1 and provided as shown in FIG. FIG. 2 shows a case where a band-scan test circuit is mounted on each of two ICs, IC 30 and IC 40.

Reference numerals 30a and 40a denote internal logics of the ICs 30 and 40, respectively, 30b to 30j and 4
0b to 40j are terminals. The configuration of the boundary scan test circuits 1a to 6a will be described using the IC 30 as a representative. The boundary scan test circuit includes band scan cells (BSC) 31a to 31f, a bypass register 32, an instruction register 33, a multiplexer 34, and a TAP (Te
st Access Port) controller 35.

As shown in FIG. 3, the band scan cell 31 includes multiplexers (MUX) 31-1 and 31-2 and latches 31-3 and 31-4, and is controlled by a TAP controller 35. I
When C is in normal operation, the data signal DI input from the terminal (or output from the internal logic) is
-2 to output the data signal DO to the internal logic (or terminal).

When testing the IC, the test signal SI
Is input to the internal logic via MUX 31-1, latches 31-3 and 31-4, and MUX-2, and the data output from the internal logic is output as test data SO via MUX 31-1 and latch 31-3. Output.

As shown in FIG. 2, the data SO is input as a test signal SI of the next BSC, and the input test signal SI is latched by a latch 31-3 and output as test data SO. Operates as a shift register and transfers serial data.

From the CPU 10, TDI (Test Data I)
n), TMS (Test Mode Select) and TCK (Test
Clock) is output, and TDO (Test Data Out) is transferred from the boundary scan test circuit and input. T
MS and TCK are input to each TAP controller,
TDI is output as a test signal of each BSC, and its output TDO is input as TDI of the next band scan test circuit.

In the test of the internal logic, the CPU
10, a test signal TDI is sent out, latched by the latches 31-4 of the BSCs 31a to 31c provided on the input side of the logic and input to the logic 30a, and the result is latched by the latches 31 of the BSCs 31d to 31f provided on the output side. -3, latched and shifted, output as a TDO signal, and
The data is transferred to U10, and it is determined whether the operation is normal or not.

The test for determining whether the connection lines 50a to 50c connecting the IC 30 and the IC 40 are disconnected or short-circuited is performed by using the BSCs 30e to 30c provided on the IC 30 side.
g to send out “1” and “0” signals,
It is determined by changing the pattern whether or not a corresponding output is obtained from the BSCs 41a to 41c provided on the side.

That is, for example, "1" is added to the BSC 31d.
"0" is latched and transmitted to the BSCs 31e and 31f, "1" is transmitted to the BSC 41c, and the BSCs 41b and 41f are transmitted.
When "0" is output to "a", the BSCs 41a to 4c are normal.
If both 1c are "0", it is determined that the connection line 50a is disconnected, and if both the BSCs 41c and 41b are "1", it is determined that the connection lines 50a and 50b are short-circuited.

The input / display unit 2 is for inputting and displaying copy conditions and the like.
Numeric keypad 2 for inputting the number of copies as shown in
1, a liquid crystal display screen 22 for displaying operation states and messages, a guidance key 23 for shifting to a mode for displaying operation functions and methods, a program key 24 for registering and recalling settings, and for correcting input errors and operations. Clear stop key 25 to interrupt, liquid crystal display screen (touch panel) 2
2, a brightness adjustment knob 26 for adjusting the brightness, a mode clear / excess heat / timer key 27, an interrupt key 28 for inputting a command to start an interrupt operation, and a start key 29 for starting a copy operation.

Further, as shown in FIG. 5, the liquid crystal display screen 22 shows "can be copied" and "please wait".
Message area 22-1 for displaying a message such as
A copy number display section 22-2 for displaying the number of sheets set in the upper row and the number of gopi in the lower row, a density adjustment key 22-3 for adjusting the image density, a paper selection key 22-4 for selecting copy paper, and a transfer paper size. Paper designation scaling key 22-5 for automatically enlarging / reducing together and sort key 22-
6, stack key 22-7, staple key 22-8,
Special original feed key 22-9, scaling key 22-10, double side / page continuous copy key 22-11, erase / move key 22-1
2. The cover / interleaf key 22-13 is displayed. Also 22
Reference numeral -14 denotes a sort key provided for the present invention described later.

Each of the keys 22-3 to 22-14 has a touch panel structure, and the displayed items are input by touching the displayed screen with a finger. Then, the display screen changes. FIG. 5 shows that A4 landscape paper is selected and input as copy paper. Also, "A4 side", "A4
The display of “vertical”, “B5 horizontal”, “B4 vertical” and “A3 vertical” indicates that there are five paper feed trays for storing the sheets to be copied,
The size and direction of the paper stored in each tray are detected and displayed.

When "automatic paper selection" is selected, paper of the same size and in the same direction as the original to be copied is selected and copying is performed. Next, the operation of the first embodiment will be described with reference to FIG. In step S1, the image forming control section 11 determines whether or not a test key for starting a test has been pressed from the input / display section 2, and if not, proceeds to step S20 to execute a normal image forming process. To form an image.

As a test key, for example, an interrupt key 2
When the clear / stop key 25 is pressed for 2 seconds or more after pressing 8, it is determined that the test key has been pressed. If it is determined in step S1 that the test key has been pressed, the process proceeds to step S2, where the image forming control unit 1
1 instructs the test signal generator 12, the test signal generator 12 sends signals (TMS and TCK) for starting the test for the n-th unit to the TAP controller, and proceeds to step S3 to test signal (TDI).
Is sent.

The TAP controller has a B corresponding to the TMS.
The SC is controlled, the TDI signal is latched, the test signal is input to the internal logic, and the output TDO signal is returned. In step S4, the test data recording unit 15
Records the returned TDO signal.

In step S5, the judging section 13 reads the TDO signal recorded in the test data recording section 15, compares the TDO signal recorded in advance with the TDO signal output in a normal state, and determines whether there is an error. Is determined. In step S6, the test result display control unit 14 displays the determination result in step S5.

FIG. 9 shows a specific example of the display in step S6, and the liquid crystal display screen 22 of the input / display unit 2
5 shows the name of the unit having a failure and the input (IN) and output (OUT) of the IC. In FIG. 9, IC1-
The portion masked by the output signal of OUT 2 indicates a signal in which an error has occurred.

In the above description, the display of the determination result is displayed on the liquid crystal display screen 22 of the input / display unit 2. However, the image formation transfer unit 4 may transfer the image to transfer paper and display the result. good. When the test result of the n-th unit is completed in step S6, the process proceeds to step S7, where the input / display unit 2
Is pressed.

In step S8, the test signal generator 12
When the start key is pressed in step S7, if there is a test for the next (n + 1) th unit, the process proceeds to step S2, and steps S2 to S8 are repeated. If there is no test, the test process is terminated. Next, referring to FIG.
A second embodiment of the present invention will be described. FIG. 7 is a configuration diagram of the second embodiment.

In the second embodiment, a MODEM 8 and an I / O 8b are added to the configuration of the first embodiment described with reference to FIG. In the second embodiment, FIG.
As shown in FIG. 6, steps S1 to S4 described in the first embodiment with reference to FIG. 6 are executed, test data is recorded in the test data recording unit 15, and in step S8, n + 1 unit tests are gradually performed. In this case, the process proceeds to step S2, and steps S2 to S4 and S8 are repeated.

When the tests of all the units are completed, the process proceeds to step S9, where the test data recorded in the test data recording unit 15 is transferred to the center via the MODEM 8, and the processing is terminated. At the center, a defect and a failure point are determined from the transfer data.

Although the test signal is generated from the test signal generator 12 in the embodiment, the test signal may be transmitted from the center via the MODEM 8. Further, in the embodiment, the image forming apparatus is configured so that the self-inspection can be performed and the determination can be performed even at the center. However, only the determination is performed at the center, and the determination unit 13 and the test result display controller 1
4 may be removed.

[0036]

As described above, according to the present invention, the following effects can be obtained. A band-scan test circuit is provided in a part or all of the electronic circuit, and a predetermined test signal is generated and input to the band-scan test circuit,
Since it is determined whether the test data output from the boundary scan test circuit is different from a previously recorded normal value, and the determination result is transferred and displayed on the input / display unit of the image forming apparatus or on the transfer paper, it is easy. Then, it can be determined whether the electronic circuit is normal or not and the location of the failure.

Further, since the input and output of the test data are displayed together with the display of the judgment result, it is possible to easily know the cause of the defect or the failure. In addition, a band scan test circuit is provided in a part or all of the electronic circuit,
A predetermined test signal is generated and input to the boundary scan test circuit or transferred from the center via data transfer means, and the test data output from the boundary scan test circuit is transmitted to the center via data transfer means. Since the transfer is performed, when a failure occurs in the image forming apparatus, a test can be performed with a large amount of test pattern data without a maintenance person going to the place where the apparatus is installed. The location and the cause can be easily known.

[Brief description of the drawings]

FIG. 1 is a configuration diagram of a first embodiment of the present invention.

FIG. 2 is a configuration diagram of a boundary scan test circuit.

FIG. 3 is a configuration diagram of bandalis scan.

FIG. 4 is a specific example of an input / display unit.

FIG. 5 is a specific example of a liquid crystal display screen.

FIG. 6 is an operation flowchart of the first embodiment.

FIG. 7 is a configuration diagram of a second embodiment of the present invention.

FIG. 8 is an operation flowchart of the second embodiment.

FIG. 9 is a specific example of a test result display.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Image memory 2 Input / display part 3 Scanning part 4 Image transfer part 5 Paper supply part 6 Fixing discharge part 8 Modem (MODEM) 1a-6a Boundary scan test circuit 10 Processor (CPU) 11 Image formation control part 12 Test signal Generation unit 13 Judgment unit 14 Test result display control unit 15 Test data recording unit

Claims (6)

[Claims] 1. An image forming apparatus for forming an image based on a command input from an input / display unit, wherein a band scan test circuit is provided in a part or all of an electronic circuit constituting the image forming apparatus; A test signal generating unit for generating a test signal in a scan test circuit; a test data recording unit for recording test data output from the boundary scan test circuit; and a test data recorded in the test data recording unit having a normal value. An image forming apparatus comprising: a determination unit configured to determine whether or not the determination result is different; and a test result display control unit configured to display a determination result of the determination unit on the input / display unit. 2. The image according to claim 1, wherein the display of the determination result by the determination unit, which is displayed by the test result display control unit, is transferred and displayed on transfer paper of the image forming apparatus. Forming equipment. 3. The display according to claim 1, wherein the display of the determination result by the determination unit, which is displayed by the test result display control unit, also displays test data in addition to the determination result. Image forming device. 4. The image forming apparatus according to claim 3, wherein the test data is displayed by displaying input and output of the test data. 5. An image forming apparatus for forming an image based on a command input from an input / display unit, wherein a band scan test circuit is provided in a part or the whole of an electronic circuit constituting the image forming apparatus. A test signal generating unit for generating a test signal in a scan test circuit; a test data recording unit for recording test data output from the boundary scan test circuit; and a test data recorded in the test data recording unit as a center. An image forming apparatus comprising: a data transfer unit configured to transfer data. 6. The image according to claim 5, wherein a test signal input to said band scan test circuit is transferred from a center via said data transfer means in place of said test signal generator. Forming equipment.