JPH1048053A - Scanning radiation thermometer - Google Patents

Scanning radiation thermometer

Info

Publication number
JPH1048053A
JPH1048053A JP20742896A JP20742896A JPH1048053A JP H1048053 A JPH1048053 A JP H1048053A JP 20742896 A JP20742896 A JP 20742896A JP 20742896 A JP20742896 A JP 20742896A JP H1048053 A JPH1048053 A JP H1048053A
Authority
JP
Japan
Prior art keywords
detector
temperature
scanning
scanning time
aperture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20742896A
Other languages
Japanese (ja)
Inventor
Yasuyuki Yoshino
泰幸 吉野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nittetsu Hokkaido Control Systems Co Ltd
Original Assignee
Nittetsu Hokkaido Control Systems Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nittetsu Hokkaido Control Systems Co Ltd filed Critical Nittetsu Hokkaido Control Systems Co Ltd
Priority to JP20742896A priority Critical patent/JPH1048053A/en
Publication of JPH1048053A publication Critical patent/JPH1048053A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a scanning radiation thermometer to allow a wider measurement range, real time processing and sufficiently precise measurement even under vibration and temperature changes. SOLUTION: A scanning radiation thermometer has a detector 3 to receive radiation energy from a material 12 to be measured, a scanning time controller 10 for the detector 3, a diaphragm 2 provided on the front face of the detector 3, a diaphragm adjuster 11 to adjust the opening of the diaphragm 2, a memory 7 to record a change in relationship between the output and the temperature of the detector 3 when a scanning time and the opening are changed, a central processing unit 6 to select the proper scanning time and the proper opening of the diaphragm 2 in accordance with data in the memory 7 from actually obtained detection output, set the scanning time and the opening of the diaphragm 2 to be proper values while operating the scanning time controller 10 and the diaphragm adjuster 11 and fix the temperature of the material to be measured 12 from the output of the detector 3, and a temperature display device 8.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、測定温度範囲の広
い走査型放射温度計に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a scanning radiation thermometer having a wide measuring temperature range.

【0002】[0002]

【従来の技術】放射温度計は、測定対象物からの放射光
をシリコン等の素子を使用した検出器で受光し、その受
光エネルギーに基づく検出器の出力と対象物の温度との
関係から測定結果を表示するものである。ところで、受
光エネルギーが0のときでも、検出器は暗出力と呼ばれ
るわずかな出力を示し、また受光エネルギーが過大にな
ると出力は飽和してしまう。したがって、測定温度範囲
は、検出器の暗出力レベルから飽和出力レベルまでの範
囲に限定される。
2. Description of the Related Art A radiation thermometer receives radiation emitted from an object to be measured by a detector using an element such as silicon, and measures the relation between the output of the detector based on the received energy and the temperature of the object. The result is displayed. By the way, even when the received light energy is 0, the detector shows a small output called a dark output, and when the received light energy becomes excessive, the output is saturated. Therefore, the measurement temperature range is limited to the range from the dark output level of the detector to the saturation output level.

【0003】従来の走査型放射温度計においては、受光
素子がアレイ状に並んだ検出器の走査時間を変えること
で受光時間を変え、受光エネルギーを加減して測定温度
範囲を拡大している。すなわち、走査時間を短くすると
一走査における受光時間が短くなり、その結果、強い放
射エネルギーを受光しても検出器の出力が飽和し難く、
より高い温度の測定が可能となる。逆に、走査時間を長
くすると一走査における受光時間が長くなり、弱い放射
エネルギーを受光した場合でも、暗出力を超える十分な
出力が得られ、より低い温度の測定が可能となる。
In a conventional scanning radiation thermometer, the light receiving time is changed by changing the scanning time of a detector in which light receiving elements are arranged in an array, and the measuring temperature range is expanded by adjusting the light receiving energy. That is, when the scanning time is shortened, the light receiving time in one scan is shortened. As a result, even when strong radiation energy is received, the output of the detector is hardly saturated,
Higher temperature measurements are possible. Conversely, if the scanning time is lengthened, the light receiving time in one scan is lengthened, and even when weak radiation energy is received, a sufficient output exceeding the dark output is obtained, and measurement at a lower temperature becomes possible.

【0004】この特性を利用し、従来の走査型放射温度
計においては、検出器の走査時間を何段階か設定し、ま
た、設定した各走査時間毎に、検出器の出力と温度との
関係を示すリニアライズデータを記録してある。測定に
際しては、測定しようとする温度に応じた適正な走査時
間を選定し、該走査時間に対応したリニアライズデータ
から温度を求めている。このように、測定しようとする
温度に応じて検出器の走査時間を適正値に設定すること
で、広範囲の領域の温度を測定することができる。
Utilizing this characteristic, in a conventional scanning radiation thermometer, the scanning time of the detector is set at several stages, and the relationship between the output of the detector and the temperature is set for each set scanning time. Is recorded. At the time of measurement, an appropriate scanning time according to the temperature to be measured is selected, and the temperature is obtained from the linearized data corresponding to the scanning time. As described above, by setting the scanning time of the detector to an appropriate value according to the temperature to be measured, it is possible to measure the temperature of a wide area.

【0005】[0005]

【発明が解決しようとする課題】しかし、従来の走査型
放射温度計では、走査時間の可変範囲に限界があるた
め、同一の検出素子を使用した場合の測定可能範囲を十
分には拡大することはできなかった。より高温の測定を
行うために走査時間を短くすると、データ処理速度を高
める必要があり、リアルタイムな処理が困難となる。ま
た、より低温の測定を行うために走査時間を長くする
と、測定対象物によっては振動や温度変化の影響を受
け、正確な測定が困難となる。
However, in the conventional scanning radiation thermometer, there is a limit in the variable range of the scanning time, so that the measurable range when the same detecting element is used is sufficiently expanded. Could not. If the scanning time is shortened for higher temperature measurement, it is necessary to increase the data processing speed, and real-time processing becomes difficult. In addition, if the scanning time is increased to perform measurement at a lower temperature, accurate measurement becomes difficult due to the influence of vibration or temperature change depending on the measurement target.

【0006】したがって従来は、たとえば500℃から
800℃まで測定可能な温度計や、1000℃から15
00℃まで測定可能なもの等、複数の温度計を使い分け
ることで対処していた。本発明は、走査型放射温度計に
おいて、同一温度計の測定範囲を拡大し、しかもリアル
タイムな処理が可能で、かつ振動や温度変化があっても
十分な精度で測定可能な温度計を提供することを目的と
する。
Therefore, conventionally, for example, a thermometer capable of measuring from 500 ° C. to 800 ° C.,
This problem has been dealt with by using a plurality of thermometers such as those capable of measuring up to 00 ° C. The present invention provides a thermometer capable of expanding the measurement range of the same thermometer in a scanning radiation thermometer, performing real-time processing, and measuring with sufficient accuracy even when there is vibration or temperature change. The purpose is to:

【0007】[0007]

【課題を解決するための手段】上記目的を達成するため
の本発明は、測定対象物からの放射エネルギーを受ける
検出器、該検出器の走査時間調整器、該検出器の前面に
設けた絞り、該絞りの開度を調整する絞り調整器、該走
査時間および該開度を変化させたときの前記検出器の出
力と温度との関係の変化を記録するメモリ、実際に得ら
れた検出出力から該メモリのデータに基づき適正な走査
時間および絞りの開度を選定するとともに、前記走査時
間調整器および絞り調整器を作動して走査時間および絞
りの開度を該適正値に設定し、前記検出器の出力から被
測定対象物の温度を定める中央処理装置、該温度の表示
装置を有することを特徴とする走査型放射温度計であ
る。
SUMMARY OF THE INVENTION In order to achieve the above object, the present invention provides a detector for receiving radiant energy from an object to be measured, a scanning time adjuster for the detector, and an aperture provided in front of the detector. A diaphragm adjuster for adjusting the opening of the diaphragm, a memory for recording a change in the relationship between the output of the detector and the temperature when the scanning time and the opening are changed, and a detection output actually obtained. From the above, while selecting an appropriate scanning time and aperture opening based on the data of the memory, operating the scanning time adjuster and the aperture adjuster to set the scanning time and aperture opening to the appropriate value, A scanning radiation thermometer comprising a central processing unit for determining a temperature of an object to be measured from an output of a detector, and a display device for the temperature.

【0008】[0008]

【発明の実施の形態】本発明の走査型放射温度計を図1
に示す例により説明する。測定対象物12からの放射エ
ネルギーを受ける検出器3、検出器3の出力が増幅器4
およびA/D変換器5を経て入力される中央処理装置
6、メモリ7、測定温度の表示装置8を有し、検出器3
の前面にはレンズ1および絞り2が設けられ、絞り2に
は絞りの開度を調整する絞り調整器11が、検出器3に
は走査時間調整器10がそれぞれ設けてある。
FIG. 1 shows a scanning radiation thermometer according to the present invention.
An example will be described with reference to FIG. Detector 3 receiving radiant energy from measurement object 12, and output of detector 3 is amplifier 4
And a central processing unit 6, a memory 7, and a measured temperature display 8 which are input via an A / D converter 5, and a detector 3
A lens 1 and an aperture 2 are provided on the front surface of the aperture, an aperture adjuster 11 for adjusting the aperture of the aperture is provided on the aperture 2, and a scanning time adjuster 10 is provided on the detector 3 respectively.

【0009】メモリ7には、絞り2の開度および検出器
3の走査時間を変化させたときの、検出器3の出力と温
度との関係の変化を記録してある。中央処理装置6は、
実際に得られた検出器3の出力から、メモリ7のデータ
に基づき適正な走査時間および絞りの開度を選定すると
ともに、走査時間調整器10および絞り調整器11を作
動させて、検出器3の走査時間および絞り2の開度を適
正値に調整し、該調整後の検出器3の出力から測定対象
物12の温度を定め、表示装置8に出力する機能を有し
ている。
The memory 7 records the change in the relationship between the output of the detector 3 and the temperature when the opening of the diaphragm 2 and the scanning time of the detector 3 are changed. The central processing unit 6
From the actually obtained output of the detector 3, an appropriate scanning time and aperture opening are selected based on the data in the memory 7, and the scanning time adjuster 10 and the aperture adjuster 11 are operated to detect the detector 3. Has the function of adjusting the scanning time and the opening of the diaphragm 2 to appropriate values, determining the temperature of the measuring object 12 from the output of the detector 3 after the adjustment, and outputting the temperature to the display device 8.

【0010】検出器3の出力は、増幅器4で増幅され、
A/D変換器5でデジタル信号に変換されて中央処理装
置6に入力される。中央処理装置6では、検出器3の出
力に応じて、絞り2の開度および選出器3の走査時間の
適正値を選定する。選定に際しては、メモリ7にあらか
じめ入力されたリニアライズデータを使用する。そし
て、絞り調整器11および走査時間調整器10を作動さ
せ、絞り2および走査時間を調整して、検出器3の出力
から測定対象物の温度を定め、表示装置8に出力する。
The output of the detector 3 is amplified by an amplifier 4,
The signal is converted into a digital signal by the A / D converter 5 and input to the central processing unit 6. The central processing unit 6 selects an appropriate value of the opening degree of the aperture 2 and the scanning time of the selector 3 according to the output of the detector 3. At the time of selection, linearized data previously input to the memory 7 is used. Then, the iris adjuster 11 and the scan time adjuster 10 are operated to adjust the iris 2 and the scan time, determine the temperature of the object to be measured from the output of the detector 3, and output it to the display device 8.

【0011】メモリ7に入力するリニアライズデータの
例を図2に示す。測定対象物の温度が高くなると検出器
3の出力が増大し、図示のような放物線状の温度−出力
曲線が得られる。この曲線は、同一の絞りでは走査時間
を短くすると高温側に移行し、また同一の走査時間では
絞り値を大にすると、すなわち絞り2の開度を狭めると
高温側に移行する。このようなリニアライズデータを参
照し、絞り2の開度と検出器3の走査時間の双方を調整
することにより、測定対象物のより広範囲の温度を測定
することができる。図2のデータによれば、約700℃
から1500℃以上までの温度が測定できる。
FIG. 2 shows an example of linearized data input to the memory 7. When the temperature of the measurement object increases, the output of the detector 3 increases, and a parabolic temperature-output curve as shown in the figure is obtained. This curve shifts to the high temperature side when the scanning time is shortened for the same aperture, and shifts to the high temperature side when the aperture value is increased during the same scanning time, that is, when the opening of the aperture 2 is narrowed. By adjusting both the degree of opening of the diaphragm 2 and the scanning time of the detector 3 with reference to such linearized data, it is possible to measure a wider temperature of the object to be measured. According to the data of FIG.
From 1500 ° C. to 1500 ° C. or higher.

【0012】本発明の温度計において、絞り2および絞
り調整器11は、通常のカメラ用のものなどを採用する
ことができ、検出器3の走査時間調整器10は、検出器
3の受光時間を調整するものであってもよく、検出器3
に走査同期信号を与えるクロック発生回路などを採用す
ることができる。また、表示装置8としては、CRTや
プリンタなどを採用することができる。なお、中央処理
装置6にキーボードなどの入力装置9を付設し、測定対
象物の大体の温度が予測できる場合など、絞り開度ある
いは走査時間をあらかじめ入力しておくこともできる。
In the thermometer of the present invention, the aperture 2 and the aperture adjuster 11 can be those for a normal camera, and the scanning time adjuster 10 of the detector 3 is used for the light receiving time of the detector 3. May be adjusted, and the detector 3
And a clock generation circuit that supplies a scan synchronizing signal to the clock signal. Further, as the display device 8, a CRT, a printer, or the like can be employed. It should be noted that an input device 9 such as a keyboard may be attached to the central processing unit 6 to input the aperture or the scanning time in advance, for example, when the approximate temperature of the measurement target can be predicted.

【0013】[0013]

【実施例】図1に示す構成からなる本発明の走査型放射
温度計により、鋼材の表面温度を測定した。メモリ7に
は、黒体炉を使用して、絞り値を3.5,5.6,8,
16の4水準、検出器3の走査時間を7ms,10ms,2
0ms,30msの4水準にそれぞれ変化させたときの出力
を計測した図2のようなデータをリニアライズデータと
して入力した。
EXAMPLE The surface temperature of a steel material was measured with a scanning radiation thermometer of the present invention having the structure shown in FIG. For the memory 7, a black body furnace is used, and the aperture value is set to 3.5, 5.6, 8,
16 levels, scanning time of detector 3 is 7ms, 10ms, 2
Data as shown in FIG. 2 in which outputs were measured at four levels of 0 ms and 30 ms were input as linearized data.

【0014】本発明の走査型放射温度計による測定結果
を、熱電対による測定結果と比較したところ、600℃
〜1500℃の温度範囲にわたって、両者一致した正確
な値が得られた。また、この温度範囲において、温度変
化の激しい場合についても、正確な測定結果が得られ
た。
The results of measurement by the scanning radiation thermometer of the present invention were compared with the results of measurement by a thermocouple.
Accurate values consistent with both were obtained over a temperature range of 11500 ° C. Also, in this temperature range, accurate measurement results were obtained even when the temperature change was severe.

【0015】[0015]

【発明の効果】本発明の走査型放射温度計によれば、高
温対象物の測定に際しては、絞りの開度を小さくするこ
とで検出器の受光量を低減し、検出器出力の飽和を避
け、データ処理速度に合わせた適正な走査時間で測定で
きる。また、低温対象物の測定に際しては、絞りの開度
を大きくすることで検出器の受光量を増大し、検出器出
力の低下を避け、対象物の振動や温度変化を考慮した適
正な走査時間で測定することができる。したがって、測
定温度が広範囲にわたる場合でも同一の温度計により測
定可能で、その範囲は600℃〜1500℃程度に拡大
でき、しかもリアルタイムな処理が可能で、かつ振動や
温度変化があっても十分な精度で測定できる。
According to the scanning radiation thermometer of the present invention, when measuring a high-temperature object, the amount of light received by the detector is reduced by reducing the aperture of the aperture, and saturation of the output of the detector is avoided. , And can be measured in an appropriate scanning time according to the data processing speed. Also, when measuring low-temperature objects, increasing the aperture of the aperture increases the amount of light received by the detector, avoids a decrease in detector output, and sets an appropriate scanning time in consideration of vibration and temperature changes of the object. Can be measured. Therefore, even if the measurement temperature is wide, it can be measured with the same thermometer, the range can be expanded to about 600 ° C. to 1500 ° C., real-time processing is possible, and sufficient even if there is vibration or temperature change. Can be measured with accuracy.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明温度計の例を示すブロック図である。FIG. 1 is a block diagram showing an example of a thermometer of the present invention.

【図2】本発明温度計におけるメモリのデータを示すグ
ラフである。
FIG. 2 is a graph showing data of a memory in the thermometer of the present invention.

【符号の説明】[Explanation of symbols]

1…レンズ 2…絞り 3…検出器 4…増幅器 5…A/D変換器 6…中央処理装置 7…メモリ 8…表示装置 9…入力装置 10…走査時間調整器 11…絞り調整器 12…測定対象物 DESCRIPTION OF SYMBOLS 1 ... Lens 2 ... Aperture 3 ... Detector 4 ... Amplifier 5 ... A / D converter 6 ... Central processing unit 7 ... Memory 8 ... Display device 9 ... Input device 10 ... Scanning time adjuster 11 ... Aperture adjuster 12 ... Measurement Object

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 測定対象物からの放射エネルギーを受け
る検出器、該検出器の走査時間調整器、該検出器の前面
に設けた絞り、該絞りの開度を調整する絞り調整器、該
走査時間および該開度を変化させたときの前記検出器の
出力と温度との関係の変化を記録するメモリ、実際に得
られた検出出力から該メモリのデータに基づき適正な走
査時間および絞りの開度を選定するとともに、前記走査
時間調整器および絞り調整器を作動して走査時間および
絞りの開度を該適正値に設定し、前記検出器の出力から
被測定対象物の温度を定める中央処理装置、該温度の表
示装置を有することを特徴とする走査型放射温度計。
1. A detector for receiving radiant energy from an object to be measured, a scanning time adjuster for the detector, an aperture provided on a front surface of the detector, an aperture adjuster for adjusting an opening of the aperture, and the scanning. A memory for recording a change in the relationship between the output of the detector and the temperature when the time and the opening degree are changed, and an appropriate scanning time and opening of the aperture based on data of the memory from a detection output actually obtained. Central processing for setting the scanning time adjuster and the aperture adjuster to set the scanning time and the aperture of the aperture to the appropriate values, and for determining the temperature of the object to be measured from the output of the detector, while selecting the degree. A scanning radiation thermometer comprising a device and a display device for the temperature.
JP20742896A 1996-08-06 1996-08-06 Scanning radiation thermometer Pending JPH1048053A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20742896A JPH1048053A (en) 1996-08-06 1996-08-06 Scanning radiation thermometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20742896A JPH1048053A (en) 1996-08-06 1996-08-06 Scanning radiation thermometer

Publications (1)

Publication Number Publication Date
JPH1048053A true JPH1048053A (en) 1998-02-20

Family

ID=16539600

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20742896A Pending JPH1048053A (en) 1996-08-06 1996-08-06 Scanning radiation thermometer

Country Status (1)

Country Link
JP (1) JPH1048053A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018151354A (en) * 2017-03-15 2018-09-27 Jfeスチール株式会社 Radiant temperature measurement apparatus and radiant temperature measurement method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018151354A (en) * 2017-03-15 2018-09-27 Jfeスチール株式会社 Radiant temperature measurement apparatus and radiant temperature measurement method

Similar Documents

Publication Publication Date Title
AU656492B2 (en) Wide dynamic range non-uniformity compensation for infrared focal plane arrays
RU2518348C2 (en) Device and method for detecting infrared radiation using array of resistive bolometers
US7807968B2 (en) Method and system for measuring and compensating for the case temperature variations in a bolometer based system
JP2013243766A (en) Method for correcting video signal of infrared ray sensor, and imaging system
US5001657A (en) Radiation thermometer
JPH09257587A (en) Non-contact type temperature meter
US4015476A (en) Scanning pyrometer system
US4955727A (en) Method and apparatus for a non-contact measuring of a temperature of a body
US6609824B1 (en) Radiation thermometer
JPH1048053A (en) Scanning radiation thermometer
JP2004532977A (en) Method and apparatus for reading a bolometer array using a plurality of bias pulses
US8704180B2 (en) Device and method for detecting infrared radiation through a resistive bolometer matrix
US20020146057A1 (en) System and method for non-contact temperature sensing
JPS6116923B2 (en)
JPH03134524A (en) Radiation-temperature measuring apparatus
Chrzanowski Evaluation of thermal cameras in quality systems according to ISO 9000 or EN 45000 standards
US5823043A (en) Transducer response compensator
JPS633231A (en) Radiation thermometer
JPS6191544A (en) Automatic exposure control for surface defect detection of hot metal material
CN115824429A (en) Thermal response time acquisition method, device, equipment, system and readable storage medium
JPH08278203A (en) Infrared ray radiation thermometer
JPH03215720A (en) Infrared thermometer
JPH0612302B2 (en) Infrared radiation thermometer
CN111678594A (en) Logarithmic calibration method for response linearity of laser power tester
JPH0552748A (en) Device for measuring glossiness and whiteness