JPH10293088A - Substrate-surface inspecting device - Google Patents
Substrate-surface inspecting deviceInfo
- Publication number
- JPH10293088A JPH10293088A JP9102022A JP10202297A JPH10293088A JP H10293088 A JPH10293088 A JP H10293088A JP 9102022 A JP9102022 A JP 9102022A JP 10202297 A JP10202297 A JP 10202297A JP H10293088 A JPH10293088 A JP H10293088A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- fixing frame
- motor
- glass substrate
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Sampling And Sample Adjustment (AREA)
- Liquid Crystal (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、基板表面検査装置
に関し、特に基板の表面及び裏面を容易に検査する技術
に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a substrate surface inspection apparatus, and more particularly to a technique for easily inspecting the front and back surfaces of a substrate.
【0002】[0002]
【従来の技術】従来より、例えばLCD(liquid crysta
l display:液晶表示) には、ガラス基板が用いられ、製
造工程中、そのガラス基板の表面及び裏面について、ゴ
ミ、キズ、ムラ等の有無が検査される。かかる検査は、
反射光及び透過光により目視検査で行われ、従来の基板
表面検査装置では、表面、裏面の検査を1ステージ毎に
行っていた。2. Description of the Related Art Conventionally, for example, LCD (liquid crysta)
l display: a liquid crystal display), a glass substrate is used. During the manufacturing process, the front and back surfaces of the glass substrate are inspected for dust, scratches, unevenness, and the like. Such an inspection
The inspection is performed by visual inspection using reflected light and transmitted light. In the conventional substrate surface inspection apparatus, the inspection of the front surface and the back surface is performed for each stage.
【0003】[0003]
【発明が解決しようとする課題】しかしながら、従来の
基板表面検査装置では、ガラス基板のセット、反転等
は、作業者により行われ、作業が煩雑であった。また、
近年、このような検査を1ステージ上で行いたいという
要望が強くなってきた。本発明はこのような従来の課題
に鑑みてなされたもので、基板の表面及び裏面の検査を
1ステージ上で簡単に行えるような基板表面検査装置を
提供することを目的とする。However, in the conventional substrate surface inspection apparatus, setting and reversal of the glass substrate are performed by an operator, and the operation is complicated. Also,
In recent years, there has been an increasing demand for performing such an inspection on one stage. The present invention has been made in view of such conventional problems, and an object of the present invention is to provide a substrate surface inspection apparatus that can easily inspect the front and back surfaces of a substrate on one stage.
【0004】[0004]
【課題を解決するための手段】このため、請求項1の発
明にかかる装置は、基板のおもて面及び裏面を検査する
基板表面検査装置において、前記基板の端部を担持して
基板を固定する基板固定枠と、該基板固定枠を、載置し
た検査ステージ上で基板のおもて面及び裏面を反転させ
るように回動させる手段と、該基板固定枠を検査ステー
ジのステージ面と略平行に移動させる移動手段と、を備
えた。According to a first aspect of the present invention, there is provided an apparatus for inspecting a front surface and a back surface of a substrate. A substrate fixing frame to be fixed, means for rotating the substrate fixing frame so that the front and back surfaces of the substrate are inverted on the mounted inspection stage, and a stage surface of the inspection stage for fixing the substrate fixing frame to the stage. And moving means for moving substantially in parallel.
【0005】かかる構成によれば、基板のおもて面を検
査するときは、基板を検査ステージ面と略平行にする。
また、基板に光を透過させて検査するときは、回動手段
により基板固定枠を立てる。そして、基板の裏面を検査
するときは、移動手段により移動させて回動手段により
基板を立てたときとは反対側に回動する。これにより、
基板のおもて面と裏面とが反転する。裏面の検査を行う
ことが可能となる。According to such a configuration, when inspecting the front surface of the substrate, the substrate is made substantially parallel to the inspection stage surface.
When the inspection is performed by transmitting light to the substrate, a substrate fixing frame is set up by the rotating means. Then, when inspecting the back surface of the substrate, the substrate is moved by the moving means and rotated by the rotating means to the opposite side to when the substrate is set up. This allows
The front side and the back side of the substrate are inverted. The inspection of the back surface can be performed.
【0006】請求項2の発明にかかる装置では、前記回
動手段は、モータと、該モータの回転を基板固定枠に伝
達する歯車と、によって構成されている。かかる構成に
よれば、モータの回転が歯車を介して基板固定枠に伝達
され、基板固定枠が回動される。請求項3の発明にかか
る装置では、前記移動手段は、ボールネジと、基板固定
枠及び回動手段と係合してボールネジと噛み合うボール
ナットと、によって構成されている。In the apparatus according to a second aspect of the present invention, the rotating means includes a motor and a gear for transmitting rotation of the motor to the substrate fixing frame. According to this configuration, the rotation of the motor is transmitted to the substrate fixing frame via the gear, and the substrate fixing frame is rotated. In the apparatus according to the third aspect of the present invention, the moving means includes a ball screw and a ball nut which engages with the substrate fixing frame and the rotating means and meshes with the ball screw.
【0007】かかる構成によれば、ボールネジを回転さ
せることにより、ボールナットが移動し、基板固定枠及
び回動手段がボールナットと係合しているので、一体と
なって移動する。According to such a configuration, the ball nut is moved by rotating the ball screw, and the substrate fixing frame and the rotating means are engaged with the ball nut, so that the ball nut is moved integrally.
【0008】[0008]
【発明の実施の形態】以下、本発明の実施の形態を図1
〜図7に基づいて説明する。図1は、例えばLCD用の
ガラス基板の表面を検査する基板表面検査装置を示し、
図2は、図1のA−A’断面図であり、図3は、図1の
部分拡大図である。。FIG. 1 is a block diagram showing an embodiment of the present invention.
This will be described with reference to FIG. FIG. 1 shows a substrate surface inspection apparatus for inspecting the surface of a glass substrate for LCD, for example.
FIG. 2 is a sectional view taken along line AA ′ of FIG. 1, and FIG. 3 is a partially enlarged view of FIG. .
【0009】基板固定枠2は、ガラス基板1を固定する
ための枠であり、ガラス基板1を固定するストッパ(図
示せず)と、ガラス基板1が落下しないようにガラス基
板1を吸着する吸着盤(図示せず)と、を備えている。
このガラス基板1は、一般的には550×650mm、
厚さ0.7mm程度のものであり、ストッパは、このガ
ラス基板1の端から5〜10mm以内の部分を支持す
る。The substrate fixing frame 2 is a frame for fixing the glass substrate 1, and includes a stopper (not shown) for fixing the glass substrate 1 and a suction for sucking the glass substrate 1 so that the glass substrate 1 does not drop. And a board (not shown).
This glass substrate 1 is generally 550 × 650 mm,
The stopper has a thickness of about 0.7 mm, and supports a portion within 5 to 10 mm from the end of the glass substrate 1.
【0010】検査ステージ5上には、バックボード6が
備えられている。このバックボード6は、ガラス基板1
の表面を見やすくするために備えられたものであり、黒
に塗装され、艶消しされている。基板固定枠2は、シャ
フト7に固定され、このシャフト7の端部には、平歯車
8aが連結されている。On the inspection stage 5, a back board 6 is provided. The backboard 6 is a glass substrate 1
It is provided to make it easier to see the surface, and is painted black and matte. The substrate fixing frame 2 is fixed to a shaft 7, and an end of the shaft 7 is connected to a spur gear 8a.
【0011】図3に示すように、この平歯車8aに平歯
車8bが噛み合い、この平歯車8bは、モータ9用の減
速機10に連結されている。検査ステージ5の上面に
は、ボールネジ11と、このボールネジ11と噛み合う
ボールナット12と、が備えられている。また、図1に
示すように、検査ステージ5の下面には、モータ13が
配置され、ボールネジ11はタイミングベルト14を介
してモータ13に接続され、モータ13が回転すること
によりボールネジ11は回転し、ボールナット12は、
検査ステージ5のステージ面と平行に移動する。基板固
定枠2は、このボールナット12に固定されている。As shown in FIG. 3, a spur gear 8b meshes with the spur gear 8a, and the spur gear 8b is connected to a speed reducer 10 for a motor 9. A ball screw 11 and a ball nut 12 that meshes with the ball screw 11 are provided on the upper surface of the inspection stage 5. As shown in FIG. 1, a motor 13 is disposed on the lower surface of the inspection stage 5, and the ball screw 11 is connected to the motor 13 via a timing belt 14. The rotation of the motor 13 causes the ball screw 11 to rotate. , Ball nut 12
It moves parallel to the stage surface of the inspection stage 5. The board fixing frame 2 is fixed to the ball nut 12.
【0012】検査ステージ5は架台15によって支持さ
れ、この架台15にはモータ16の回転速度を減速する
減速機17が取り付けられている。図3に示すように、
この減速機17は架台15に回動自由に取付られてい
る。減速機17はさらに減速機18に連結され、この減
速機18は、タイミングベルト19を介してモータ20
に連結されている。The inspection stage 5 is supported by a gantry 15, and a speed reducer 17 for reducing the rotation speed of a motor 16 is attached to the gantry 15. As shown in FIG.
The speed reducer 17 is rotatably mounted on the gantry 15. The speed reducer 17 is further connected to a speed reducer 18, which is connected to a motor 20 via a timing belt 19.
It is connected to.
【0013】尚、モータ9、13、16、20には、例
えばバックラッシュのないACサーボモータ等が用いら
れる。図4〜図7に示すように、検査ステージ5の真
上、側方には、夫々、反射光検査用の照明装置21、透
過光検査用の照明装置22が配置されている。尚、モー
タ9、平歯車8a,8b、シャフト7が回動手段に、モ
ータ13、タイミングベルト14、ボールネジ11、ボ
ールナット12が移動手段に相当する。As the motors 9, 13, 16, and 20, for example, an AC servo motor without backlash is used. As shown in FIGS. 4 to 7, an illumination device 21 for the reflected light inspection and an illumination device 22 for the transmitted light inspection are arranged directly above and beside the inspection stage 5. Note that the motor 9, the spur gears 8a and 8b, and the shaft 7 correspond to a rotating unit, and the motor 13, the timing belt 14, the ball screw 11, and the ball nut 12 correspond to a moving unit.
【0014】次に動作を説明する。まず、ガラス基板1
を基板固定枠2に載置する。そして、ガラス基板1をス
トッパで基板固定枠2に固定することにより、ガラス基
板1は、吸着盤によって吸着され、落下が防止される。
ガラス基板1の表面検査は、まず、ガラス基板1のおも
て面に光を反射させておもて面を検査し、次に、ガラス
基板1を立てて光を透過させ、そして、ガラス基板1を
裏面に反転して光を反射させることにより行われる。Next, the operation will be described. First, the glass substrate 1
Is placed on the substrate fixing frame 2. Then, by fixing the glass substrate 1 to the substrate fixing frame 2 with the stopper, the glass substrate 1 is sucked by the suction disk, and is prevented from dropping.
The surface inspection of the glass substrate 1 is performed by first reflecting the light on the front surface of the glass substrate 1 and inspecting the front surface, and then setting the glass substrate 1 up to allow the light to pass therethrough. This is performed by inverting 1 to the back and reflecting light.
【0015】ガラス基板1のおもて面を検査する場合、
図4に示すように、ガラス基板1の面が検査ステージ5
のステージ面と平行になるように基板固定枠2を配設す
る。そして、照明装置21でガラス基板1の表面を真上
から照明する。ガラス基板1の表面にゴミ、キズ、ムラ
等があると、照明装置22の光はガラス基板1上で散乱
するため、これによりこのガラス基板1の表面のゴミ等
の有無がはっきり分かる。When inspecting the front surface of the glass substrate 1,
As shown in FIG. 4, the surface of the glass substrate 1 is
The substrate fixing frame 2 is disposed so as to be parallel to the stage surface. Then, the illumination device 21 illuminates the surface of the glass substrate 1 from directly above. If there is dust, scratches, unevenness, or the like on the surface of the glass substrate 1, the light from the lighting device 22 is scattered on the glass substrate 1, so that the presence or absence of dust or the like on the surface of the glass substrate 1 can be clearly seen.
【0016】尚、光が反射する角度を調節する場合は、
モータ16又はモータ20を回転させて検査ステージ5
を傾斜させる。即ち、モータ16を回転させたとき、モ
ータ16の回転速度は減速機17によって減速され、減
速機17に固定された架台15が回動し、検査ステージ
5は、図2に示すようにX方向に傾斜する。When adjusting the angle at which light is reflected,
Inspection stage 5 by rotating motor 16 or motor 20
Tilt. That is, when the motor 16 is rotated, the rotation speed of the motor 16 is reduced by the speed reducer 17, the gantry 15 fixed to the speed reducer 17 rotates, and the inspection stage 5 moves in the X direction as shown in FIG. Incline.
【0017】また、モータ20を回転させたとき、モー
タ20の回転がタイミングベルト19を介して減速機1
8に伝達され、減速機18は回動し、検査ステージ5
は、図1に示すようにY方向に傾斜する。次に、ガラス
基板1に光を透過させて検査をする場合は、モータ9及
びモータ13を回転させる。モータ9の回転は、平歯車
8b,8aを介してシャフト7に伝達され、シャフト7
が回転して基板固定枠2は図5に示すように立ち上が
る。また、モータ13を回転させたときは、モータ13
の回転速度が減速機10によって減速され、タイミング
ベルト14を介してボールネジ11が回転し、ボールナ
ット12が移動し、基板固定枠2が図6に示すように移
動する。基板固定枠2はこのボールナット12に固定さ
れているので、基板固定枠2は検査ステージ5のステー
ジ面と平行に移動する。基板固定枠2が立ち上がった
ら、モータ9の回転を停止し、ボールナット12が所定
の位置まで移動したとき、モータ13の回転を停止す
る。尚、モータ9及びモータ13の駆動タイミングは、
例えば基板固定枠2を立ち上げから移動させるように別
々であってもよい。When the motor 20 is rotated, the rotation of the motor 20 is
8, the reduction gear 18 rotates, and the inspection stage 5
Are inclined in the Y direction as shown in FIG. Next, when the inspection is performed by transmitting light through the glass substrate 1, the motor 9 and the motor 13 are rotated. The rotation of the motor 9 is transmitted to the shaft 7 via the spur gears 8b and 8a.
Rotates, and the substrate fixing frame 2 rises as shown in FIG. When the motor 13 is rotated, the motor 13
Is reduced by the speed reducer 10, the ball screw 11 rotates via the timing belt 14, the ball nut 12 moves, and the substrate fixing frame 2 moves as shown in FIG. Since the substrate fixing frame 2 is fixed to the ball nut 12, the substrate fixing frame 2 moves parallel to the stage surface of the inspection stage 5. When the board fixing frame 2 rises, the rotation of the motor 9 is stopped, and when the ball nut 12 moves to a predetermined position, the rotation of the motor 13 is stopped. The drive timing of the motor 9 and the motor 13 is as follows.
For example, they may be separated so that the substrate fixing frame 2 is moved from startup.
【0018】そして、照明装置22でガラス基板1を照
明し、反対側からガラス基板1を観察する。次に、ガラ
ス基板1の裏面を検査するときは、モータ9及びモータ
13を逆方向に回転させる。モータ9の回転は、減速機
10、平歯車8a,8bを介してシャフト7に伝達さ
れ、シャフト7が回動し、基板固定枠2が図7に示すよ
うに倒れ、ガラス基板1のガラス面が検査ステージ5の
ステージ面と平行になったとき、モータ9の回転を停止
させる。そして、ガラス基板1のおもて面を検査したと
きと同様に照明装置21でガラス基板1の裏面を照明し
て照明装置21からの反射光によりガラス基板1の裏面
を観察し、ゴミ等の有無の検査が行われる。Then, the glass substrate 1 is illuminated by the illumination device 22, and the glass substrate 1 is observed from the opposite side. Next, when inspecting the back surface of the glass substrate 1, the motor 9 and the motor 13 are rotated in opposite directions. The rotation of the motor 9 is transmitted to the shaft 7 via the reduction gear 10 and the spur gears 8a and 8b, the shaft 7 rotates, and the substrate fixing frame 2 falls down as shown in FIG. Is stopped in parallel with the stage surface of the inspection stage 5, the rotation of the motor 9 is stopped. Then, the back surface of the glass substrate 1 is illuminated by the lighting device 21 in the same manner as when the front surface of the glass substrate 1 is inspected, and the back surface of the glass substrate 1 is observed by the reflected light from the lighting device 21 to remove dust and the like. An inspection for presence is performed.
【0019】かかる構成によれば、基板固定枠2は回動
し、検査ステージ5のステージ面と平行に基板固定枠2
は移動するようになっているので、ガラス基板1のおも
て面及び裏面の検査を1ステージ上で行うことができ
る。また、ガラス基板1の操作を人手を介さずに行うこ
とができ、ガラス基板1のおもて面及び裏面検査を容易
に行うことができる。According to this configuration, the substrate fixing frame 2 rotates, and the substrate fixing frame 2 is rotated in parallel with the stage surface of the inspection stage 5.
Is moved, so that the front and back surfaces of the glass substrate 1 can be inspected on one stage. In addition, the operation of the glass substrate 1 can be performed without human intervention, and the front and back surfaces of the glass substrate 1 can be easily inspected.
【0020】[0020]
【発明の効果】以上説明したように、請求項1の発明に
かかる装置によれば、1つの検査ステージ上で基板のお
もて面及び裏面を容易に検査することができる。請求項
2の発明にかかる装置によれば、基板固定枠を回動させ
ることができる。As described above, according to the apparatus of the first aspect of the present invention, the front and back surfaces of the substrate can be easily inspected on one inspection stage. According to the apparatus of the second aspect, the substrate fixing frame can be rotated.
【0021】請求項3の発明にかかる装置によれば、基
板固定枠及び回動手段を一体として移動させることがで
きる。According to the third aspect of the present invention, the substrate fixing frame and the rotating means can be moved integrally.
【図1】本発明の実施の形態を示す側面図。FIG. 1 is a side view showing an embodiment of the present invention.
【図2】図1のA−A’断面図。FIG. 2 is a sectional view taken along line A-A 'of FIG.
【図3】図2の部分拡大図。FIG. 3 is a partially enlarged view of FIG. 2;
【図4】図1〜図3の動作説明図。FIG. 4 is a diagram illustrating the operation of FIGS. 1 to 3;
【図5】同上動作説明図。FIG. 5 is an operation explanatory view of the above operation.
【図6】同上動作説明図。FIG. 6 is an operation explanatory view of the above operation.
【図7】同上動作説明図。FIG. 7 is an operation explanatory view of the above operation.
1 ガラス基板 2 基板固定枠 8a,8b 平歯車 11 ボールネジ 12 ボールナット Reference Signs List 1 glass substrate 2 substrate fixing frame 8a, 8b spur gear 11 ball screw 12 ball nut
Claims (3)
面検査装置において、 前記基板の端部を担持して基板を固定する基板固定枠
と、 該基板固定枠を、載置した検査ステージ上で基板のおも
て面及び裏面を反転させるように回動させる手段と、 該基板固定枠を検査ステージのステージ面と略平行に移
動させる移動手段と、を備えたことを特徴とする基板表
面検査装置。1. A substrate surface inspection apparatus for inspecting a front surface and a back surface of a substrate, a substrate fixing frame for holding an end of the substrate and fixing the substrate, and an inspection on which the substrate fixing frame is mounted. Means for rotating the substrate so that the front and back surfaces of the substrate are inverted on the stage; and moving means for moving the substrate fixing frame substantially parallel to the stage surface of the inspection stage. Board surface inspection equipment.
転を基板固定枠に伝達する歯車と、によって構成された
ことを特徴とする請求項1に記載の基板表面検査装置。2. The substrate surface inspection apparatus according to claim 1, wherein said rotating means comprises a motor and a gear for transmitting rotation of said motor to a substrate fixing frame.
枠及び回動手段と係合してボールネジと噛み合うボール
ナットと、によって構成されたことを特徴とする請求項
1又は請求項2に記載の基板表面検査装置。3. The moving means according to claim 1, wherein the moving means comprises a ball screw, and a ball nut which engages with the ball screw by engaging with the substrate fixing frame and the rotating means. Substrate surface inspection equipment.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10202297A JP3364408B2 (en) | 1997-04-18 | 1997-04-18 | Board surface inspection equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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JP10202297A JP3364408B2 (en) | 1997-04-18 | 1997-04-18 | Board surface inspection equipment |
Publications (2)
Publication Number | Publication Date |
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JPH10293088A true JPH10293088A (en) | 1998-11-04 |
JP3364408B2 JP3364408B2 (en) | 2003-01-08 |
Family
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JP10202297A Expired - Lifetime JP3364408B2 (en) | 1997-04-18 | 1997-04-18 | Board surface inspection equipment |
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JP (1) | JP3364408B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011215123A (en) * | 2010-03-31 | 2011-10-27 | Jokon Kaku | Frame mechanism for inspection system |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS553151Y2 (en) * | 1975-02-18 | 1980-01-25 | ||
JPS6312945A (en) * | 1986-07-03 | 1988-01-20 | Toshiba Corp | Screen inspection instrument |
JPH04301547A (en) * | 1991-03-28 | 1992-10-26 | Nidek Co Ltd | Apparatus and method for inspecting surface |
JPH0557254A (en) * | 1991-09-04 | 1993-03-09 | Nippon Electric Glass Co Ltd | Method for classifying glass plate |
JPH0639323Y2 (en) * | 1987-02-09 | 1994-10-12 | 株式会社東洋精機製作所 | Device for supplying test pieces having different sample frames |
JPH076885B2 (en) * | 1988-06-13 | 1995-01-30 | 住友金属鉱山株式会社 | Automatic sample setting device for plate sample analyzer with rotating sample table |
JPH088323A (en) * | 1994-06-21 | 1996-01-12 | Nikon Corp | Method for transferring and inspecting package mounting rear projection optical detection element |
JPH08137091A (en) * | 1994-11-08 | 1996-05-31 | Miyazaki Oki Electric Co Ltd | Visual inspection device for mask |
JPH10268209A (en) * | 1997-03-24 | 1998-10-09 | Olympus Optical Co Ltd | Large-sized substrate inspection device |
-
1997
- 1997-04-18 JP JP10202297A patent/JP3364408B2/en not_active Expired - Lifetime
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS553151Y2 (en) * | 1975-02-18 | 1980-01-25 | ||
JPS6312945A (en) * | 1986-07-03 | 1988-01-20 | Toshiba Corp | Screen inspection instrument |
JPH0639323Y2 (en) * | 1987-02-09 | 1994-10-12 | 株式会社東洋精機製作所 | Device for supplying test pieces having different sample frames |
JPH076885B2 (en) * | 1988-06-13 | 1995-01-30 | 住友金属鉱山株式会社 | Automatic sample setting device for plate sample analyzer with rotating sample table |
JPH04301547A (en) * | 1991-03-28 | 1992-10-26 | Nidek Co Ltd | Apparatus and method for inspecting surface |
JPH0557254A (en) * | 1991-09-04 | 1993-03-09 | Nippon Electric Glass Co Ltd | Method for classifying glass plate |
JPH088323A (en) * | 1994-06-21 | 1996-01-12 | Nikon Corp | Method for transferring and inspecting package mounting rear projection optical detection element |
JPH08137091A (en) * | 1994-11-08 | 1996-05-31 | Miyazaki Oki Electric Co Ltd | Visual inspection device for mask |
JPH10268209A (en) * | 1997-03-24 | 1998-10-09 | Olympus Optical Co Ltd | Large-sized substrate inspection device |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011215123A (en) * | 2010-03-31 | 2011-10-27 | Jokon Kaku | Frame mechanism for inspection system |
Also Published As
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JP3364408B2 (en) | 2003-01-08 |
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