JPH10275582A - Specimen heating and cooling device of electronic microscope or the like - Google Patents
Specimen heating and cooling device of electronic microscope or the likeInfo
- Publication number
- JPH10275582A JPH10275582A JP7824697A JP7824697A JPH10275582A JP H10275582 A JPH10275582 A JP H10275582A JP 7824697 A JP7824697 A JP 7824697A JP 7824697 A JP7824697 A JP 7824697A JP H10275582 A JPH10275582 A JP H10275582A
- Authority
- JP
- Japan
- Prior art keywords
- heat
- sample
- heat conductor
- specimen
- heating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、電子顕微鏡等の試
料の加熱および冷却装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for heating and cooling a sample such as an electron microscope.
【0002】[0002]
【従来の技術】電子顕微鏡等の試料の加熱および冷却装
置の概略を図3により説明する。図3において、試料1
はヒートコンダクタ2に接触しており、冷媒3等によっ
てヒートコンダクタ2を介して冷却される。また、加熱
用電源4を用い、試料1へ通電することにより加熱す
る。こうして試料1は加熱あるいは冷却され、それぞれ
の状態において電子顕微鏡による観察が行われる。2. Description of the Related Art An apparatus for heating and cooling a sample such as an electron microscope will be schematically described with reference to FIG. In FIG. 3, sample 1
Are in contact with the heat conductor 2 and are cooled via the heat conductor 2 by the refrigerant 3 or the like. In addition, the heating is performed by energizing the sample 1 using the heating power supply 4. Thus, the sample 1 is heated or cooled, and observation with an electron microscope is performed in each state.
【0003】[0003]
【発明が解決しようとする課題】電子顕微鏡等の微小領
域の観察を行う装置においては、試料とその周辺の温度
が安定していないと、観察領域が移動して精度良く観察
することができない。図3の例において、試料1を効率
よく安定して加熱するには、試料1は外部と熱的に絶縁
されている必要がある。しかし、試料1は冷却用のヒー
トコンダクタ2および冷媒3に接続されていて、熱的に
絶縁されていない。逆に試料1を効率よく安定して冷却
するためには、試料1とヒートコンダクタ2との熱接触
を良くする必要がある。従って、同一構造の装置によっ
て構成の変更なしに試料1の加熱と冷却をそれぞれ効率
良く安定して行うことは困難であった。In an apparatus for observing a minute area such as an electron microscope, if the temperature of the sample and the surrounding area is not stable, the observation area moves and cannot be observed with high accuracy. In the example of FIG. 3, in order to efficiently and stably heat the sample 1, the sample 1 needs to be thermally insulated from the outside. However, the sample 1 is connected to the heat conductor 2 for cooling and the refrigerant 3 and is not thermally insulated. Conversely, in order to efficiently and stably cool the sample 1, it is necessary to improve the thermal contact between the sample 1 and the heat conductor 2. Therefore, it has been difficult to efficiently and stably perform heating and cooling of the sample 1 with the same structure without changing the configuration.
【0004】本発明は上記課題を解決するためのもの
で、装置の構成の変更なしに、試料の加熱、冷却を効率
よく安定して行うことができる電子顕微鏡等の試料加熱
・冷却装置を提供することを目的とする。The present invention has been made to solve the above problems, and provides a sample heating / cooling apparatus such as an electron microscope which can efficiently and stably heat and cool a sample without changing the configuration of the apparatus. The purpose is to do.
【0005】[0005]
【課題を解決するための手段】本発明は、試料と接触す
る第1のヒートコンダクタと、冷媒によって冷却され、
熱膨張、収縮により第1のヒートコンダクタと接触/切
り離し可能な第2のヒートコンダクタと、試料を加熱す
る加熱手段とを備えたことを特徴とする。また、本発明
は、試料と接触する第1のヒートコンダクタと、冷媒に
よって冷却され、熱膨張、収縮により第1のヒートコン
ダクタと接触/切り離し可能な第2のヒートコンダクタ
と、加熱手段と接触し、熱膨張、収縮により前記第1の
ヒートコンダクタと接触/切り離し可能な第3のヒート
コンダクタとを備えたことを特徴とする。According to the present invention, there is provided a first heat conductor in contact with a sample, wherein the first heat conductor is cooled by a refrigerant,
It is characterized by comprising a second heat conductor capable of contacting / separating from the first heat conductor by thermal expansion and contraction, and heating means for heating the sample. Further, the present invention provides a first heat conductor which is in contact with a sample, a second heat conductor which is cooled by a refrigerant and which can be contacted / separated from the first heat conductor by thermal expansion and contraction, and a heating means. , A third heat conductor that can be brought into contact with and separated from the first heat conductor by thermal expansion and contraction.
【0006】[0006]
【発明の実施の形態】以下、本発明の実施の形態につい
て説明する。図1は本発明の実施の形態の例を示す図
で、図1(a)は試料冷却時、図1(b)は試料加熱時
をそれぞれ示している。図1(a)において、試料1は
ヒートコンダクタ2a上に配置され、ヒートコンダクタ
2aと接触/切り離し可能なヒートコンダクタ2bを介
して冷媒3によって冷却される。また、試料1は定電流
源からなる加熱用電源4からの通電によって加熱され
る。ヒートコンダクタ2aとヒートコンダクタ2bとの
接合面はそれぞれカギ状になっており、お互いにかみ合
わさっている。ヒートコンダクタ2a、2bは低温で収
縮し、高温で膨張する熱伝導性のよい銅等の物質ででき
ている。ヒートコンダクタの材質としては、低温での熱
伝導が良く、かつ熱膨張係数が大きいもの、また強度、
加工のし易さ等の面も考慮して選ぶ必要があるが、総合
的にみて銅を使用することがのぞましく、また、黄銅、
アルミニウム、ステンレス鋼等を用いることも可能であ
る。Embodiments of the present invention will be described below. 1A and 1B show an example of an embodiment of the present invention. FIG. 1A shows a state when a sample is cooled, and FIG. 1B shows a state when a sample is heated. In FIG. 1A, a sample 1 is placed on a heat conductor 2a, and is cooled by a refrigerant 3 via a heat conductor 2b that can be contacted / separated from the heat conductor 2a. Further, the sample 1 is heated by energization from a heating power supply 4 composed of a constant current source. The joint surface between the heat conductor 2a and the heat conductor 2b is in a key shape and meshes with each other. The heat conductors 2a and 2b are made of a material having good thermal conductivity, such as copper, which contracts at a low temperature and expands at a high temperature. As a material of the heat conductor, a material having good thermal conductivity at low temperatures and a large coefficient of thermal expansion, strength,
It is necessary to select in consideration of the ease of processing, etc., but it is preferable to use copper from a comprehensive perspective.
It is also possible to use aluminum, stainless steel, or the like.
【0007】次に、図1の装置の動作を説明する。試料
1を冷媒3によって冷却する場合(図1(a))、ヒー
トコンダクタ2a,2bの温度が低下し、ヒートコンダ
クタ2bはそれぞれ収縮する。その結果、カギ型の接合
面がお互いに締めつけられるようになる。その結果、ヒ
ートコンダクタ2a,2bの接合が強くなり、熱接触が
向上して冷却にとっての条件が満たされる。一方、加熱
用電源4を用いて試料1を加熱する場合(図1
((b))には、ヒートコンダクタ2a,2bの温度が
上昇し、熱膨張する。その結果、カギ型の接合面が離
れ、試料の熱絶縁性が向上し、加熱の条件が満たされ
る。こうして試料1の冷却時にはヒートコンダクタ2
a,2bの熱接触が向上し、加熱時には試料1の熱絶縁
性が向上することから、同一構造の装置で構成の変更な
しに試料1の加熱と冷却をそれぞれ効率良く、安定して
行うことができる。Next, the operation of the apparatus shown in FIG. 1 will be described. When the sample 1 is cooled by the coolant 3 (FIG. 1A), the temperatures of the heat conductors 2a and 2b decrease, and the heat conductor 2b contracts. As a result, the key-shaped joint surfaces are tightened together. As a result, the joining of the heat conductors 2a and 2b is strengthened, the thermal contact is improved, and the condition for cooling is satisfied. On the other hand, when the sample 1 is heated using the heating power supply 4 (FIG. 1).
In ((b)), the temperature of the heat conductors 2a and 2b rises and thermally expands. As a result, the key-shaped bonding surface is separated, the thermal insulation of the sample is improved, and the heating conditions are satisfied. Thus, when the sample 1 is cooled, the heat conductor 2
Since the thermal contact between a and 2b is improved and the thermal insulation of the sample 1 is improved during heating, the heating and cooling of the sample 1 can be performed efficiently and stably without changing the configuration using the same apparatus. Can be.
【0008】図2は本発明の実施の形態の他の例を示す
図である。図2において、試料1、冷媒3、ヒートコン
ダクタ2a,2bの構成は図1の場合と同じである。こ
の例においては、加熱側にヒートコンダクタ2cを設け
たもので、ヒートコンダクタ2cの一端はヒートコンダ
クタ2aと接触している。また、他端はヒータ5と接触
している。ヒートコンダクタ2a,2cの接合面は高温
で膨張接触し、低温で収縮切り離される。図1の場合で
説明したように、冷却時にはヒートコンダクタ2a,2
bが接触し、一方、ヒートコンダクタ2a,2cは切り
離される。加熱時には、ヒートコンダクタ2a,2cが
膨張するため接触し、ヒートコンダクタ2a,2bが切
り離される。こうして図1の場合と同様に同一構造の装
置で、構成の変更なしに試料の加熱と冷却をそれぞれ効
率良く安定して行うことができる。FIG. 2 is a diagram showing another example of the embodiment of the present invention. 2, the configurations of the sample 1, the refrigerant 3, and the heat conductors 2a and 2b are the same as those in FIG. In this example, the heat conductor 2c is provided on the heating side, and one end of the heat conductor 2c is in contact with the heat conductor 2a. The other end is in contact with the heater 5. The joining surfaces of the heat conductors 2a and 2c expand and contact at a high temperature, and are contracted and separated at a low temperature. As described in the case of FIG. 1, the heat conductors 2a and 2
b comes into contact, while the heat conductors 2a and 2c are cut off. During heating, the heat conductors 2a and 2c expand and come into contact with each other, and the heat conductors 2a and 2b are separated. In this way, similarly to the case of FIG. 1, the heating and cooling of the sample can be efficiently and stably performed without changing the configuration using the same structure of the apparatus.
【0009】なお、ヒートコンダクタの接合の組合わせ
と数は、必要に応じて変更可能である。また、ヒートコ
ンダクタの形状は膨張、収縮によって接触、切り離しが
可能であればどのような形状でも良く、冷却、加熱の方
法は上記方法に限定されるものではない。また、以上の
ような試料の加熱、冷却装置は電子顕微鏡等に限らず、
試料の温度の安定性が求められる装置にはすべて適用可
能である。The combination and number of the heat conductors can be changed as necessary. The shape of the heat conductor may be any shape as long as it can be contacted and separated by expansion and contraction, and the method of cooling and heating is not limited to the above method. In addition, the heating and cooling devices for the sample described above are not limited to electron microscopes and the like.
The present invention is applicable to all devices that require the stability of the sample temperature.
【0010】[0010]
【発明の効果】以上のように本発明によれば、ヒートコ
ンダクタの膨張、収縮を用いてヒートコンダクタの接
触、切り離しを行うことにより、装置の構成の変更なし
に試料の加熱、冷却が可能となり、効率良く安定して試
料の加熱、冷却を行うことが可能となる。As described above, according to the present invention, it is possible to heat and cool a sample without changing the configuration of the apparatus by contacting and separating the heat conductor using expansion and contraction of the heat conductor. In addition, the sample can be efficiently and stably heated and cooled.
【図1】 本発明の実施の形態を示す図で、(a)は試
料冷却時、(b)は試料加熱時をそれぞれ示す図であ
る。FIGS. 1A and 1B are diagrams showing an embodiment of the present invention, in which FIG. 1A shows a state when a sample is cooled, and FIG.
【図2】 本発明の実施の形態の他の例を示す図であ
る。FIG. 2 is a diagram showing another example of the embodiment of the present invention.
【図3】 電子顕微鏡等の試料の加熱および冷却の概略
図である。FIG. 3 is a schematic diagram of heating and cooling of a sample such as an electron microscope.
1…試料、2a,2b,2c…ヒートコンダクタ、3…
冷媒、4…加熱用電源、5…ヒータ、6…ヒータ用電
源。1 ... Sample, 2a, 2b, 2c ... Heat conductor, 3 ...
Refrigerant, 4 ... heating power supply, 5 ... heater, 6 ... heater power supply.
Claims (1)
と、冷媒によって冷却され、熱膨張、収縮により第1の
ヒートコンダクタと接触/切り離し可能な第2のヒート
コンダクタと、試料を加熱する加熱手段とを備えた電子
顕微鏡等の試料加熱・冷却装置。 【請求項1】 試料と接触する第1のヒートコンダクタ
と、冷媒によって冷却され、熱膨張、収縮により第1の
ヒートコンダクタと接触/切り離し可能な第2のヒート
コンダクタと、加熱手段と接触し、熱膨張、収縮により
前記第1のヒートコンダクタと接触/切り離し可能な第
3のヒートコンダクタとを備えた電子顕微鏡等の試料加
熱・冷却装置。1. A first heat conductor which is in contact with a sample, a second heat conductor which is cooled by a refrigerant and which can be contacted / separated from the first heat conductor by thermal expansion and contraction, and heating means for heating the sample A sample heating / cooling device such as an electron microscope equipped with: A first heat conductor which is in contact with a sample, a second heat conductor which is cooled by a refrigerant and which can be contacted / separated from the first heat conductor by thermal expansion and contraction, and a heating means; A sample heating / cooling device such as an electron microscope including a third heat conductor that can be brought into contact with and separated from the first heat conductor by thermal expansion and contraction.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7824697A JPH10275582A (en) | 1997-03-28 | 1997-03-28 | Specimen heating and cooling device of electronic microscope or the like |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7824697A JPH10275582A (en) | 1997-03-28 | 1997-03-28 | Specimen heating and cooling device of electronic microscope or the like |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH10275582A true JPH10275582A (en) | 1998-10-13 |
Family
ID=13656660
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7824697A Withdrawn JPH10275582A (en) | 1997-03-28 | 1997-03-28 | Specimen heating and cooling device of electronic microscope or the like |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH10275582A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10239224A (en) * | 1997-02-26 | 1998-09-11 | Jeol Ltd | Heat conductor |
JPH1130573A (en) * | 1997-05-20 | 1999-02-02 | Jeol Ltd | Holder holding device |
WO2001038947A1 (en) * | 1999-11-26 | 2001-05-31 | Eyela-Chino Inc. | Sample temperature regulator |
EP1852889A2 (en) * | 2006-05-01 | 2007-11-07 | FEI Company | Particle-optical apparatus with temperature switch |
EP1852888A1 (en) * | 2006-05-01 | 2007-11-07 | FEI Company | Particle-optical apparatus with temperature switch |
DE112010001712T5 (en) | 2009-04-22 | 2012-08-30 | Hitachi High-Technologies Corporation | SAMPLE HOLDER, METHOD OF USING THE SAMPLE HOLDER, AND CHARGE STAINING JET DEVICE |
KR20150001842A (en) | 2012-06-28 | 2015-01-06 | 가부시키가이샤 히다치 하이테크놀로지즈 | Cryogenic specimen holder and cooling source container |
-
1997
- 1997-03-28 JP JP7824697A patent/JPH10275582A/en not_active Withdrawn
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10239224A (en) * | 1997-02-26 | 1998-09-11 | Jeol Ltd | Heat conductor |
JPH1130573A (en) * | 1997-05-20 | 1999-02-02 | Jeol Ltd | Holder holding device |
WO2001038947A1 (en) * | 1999-11-26 | 2001-05-31 | Eyela-Chino Inc. | Sample temperature regulator |
GB2362727A (en) * | 1999-11-26 | 2001-11-28 | Eyela Chino Inc | Sample temperature regulator |
GB2362727B (en) * | 1999-11-26 | 2004-04-21 | Eyela Chino Inc | Sample temperature regulator |
US6988546B1 (en) | 1999-11-26 | 2006-01-24 | Eyela-Chino Inc. | Sample temperature regulator |
US7182130B2 (en) | 1999-11-26 | 2007-02-27 | Eyela-Chino Inc. | Sample temperature regulator |
EP1852889A2 (en) * | 2006-05-01 | 2007-11-07 | FEI Company | Particle-optical apparatus with temperature switch |
EP1852888A1 (en) * | 2006-05-01 | 2007-11-07 | FEI Company | Particle-optical apparatus with temperature switch |
JP2007299753A (en) * | 2006-05-01 | 2007-11-15 | Fei Co | Particle-optical device with temperature switch |
EP1852889A3 (en) * | 2006-05-01 | 2007-12-05 | FEI Company | Particle-optical apparatus with temperature switch |
US7420184B2 (en) | 2006-05-01 | 2008-09-02 | Fei Company | Particle-optical apparatus with temperature switch |
DE112010001712T5 (en) | 2009-04-22 | 2012-08-30 | Hitachi High-Technologies Corporation | SAMPLE HOLDER, METHOD OF USING THE SAMPLE HOLDER, AND CHARGE STAINING JET DEVICE |
US8853648B2 (en) | 2009-04-22 | 2014-10-07 | Hitachi High-Technologies Corporation | Sample holder, method for use of the sample holder, and charged particle device |
KR20150001842A (en) | 2012-06-28 | 2015-01-06 | 가부시키가이샤 히다치 하이테크놀로지즈 | Cryogenic specimen holder and cooling source container |
US9543112B2 (en) | 2012-06-28 | 2017-01-10 | Hitachi High-Technologies Corporation | Specimen cryo holder and dewar |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A300 | Withdrawal of application because of no request for examination |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 20040601 |