JP3247714B2 - Element heating / cooling test equipment - Google Patents

Element heating / cooling test equipment

Info

Publication number
JP3247714B2
JP3247714B2 JP04412792A JP4412792A JP3247714B2 JP 3247714 B2 JP3247714 B2 JP 3247714B2 JP 04412792 A JP04412792 A JP 04412792A JP 4412792 A JP4412792 A JP 4412792A JP 3247714 B2 JP3247714 B2 JP 3247714B2
Authority
JP
Japan
Prior art keywords
cooling
heating
heater
sample
element heating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP04412792A
Other languages
Japanese (ja)
Other versions
JPH05245394A (en
Inventor
山 宏 一 中
口 裕 哉 谷
田 薫 増
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Aisin Corp
Original Assignee
Aisin Seiki Co Ltd
Aisin Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aisin Seiki Co Ltd, Aisin Corp filed Critical Aisin Seiki Co Ltd
Priority to JP04412792A priority Critical patent/JP3247714B2/en
Publication of JPH05245394A publication Critical patent/JPH05245394A/en
Application granted granted Critical
Publication of JP3247714B2 publication Critical patent/JP3247714B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Devices For Use In Laboratory Experiments (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、素子加熱冷却試験装置
に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an element heating / cooling test apparatus.

【0002】[0002]

【従来の技術】素子加熱冷却試験装置の従来技術には様
々なものが提案されてきている。例えば図3に示す従来
技術の素子加熱冷却試験装置70では、極低温冷凍機7
1のコールドヘツド72に加熱ブロツク73がボルト7
4等により熱的に結合されている。加熱ブロツク73の
内部にはヒータ75が埋設され、また、加熱ブロツクの
上面は試料ステージ76を形成している。
2. Description of the Related Art Various devices have been proposed in the prior art for element heating / cooling test equipment. For example, in a conventional element heating / cooling test apparatus 70 shown in FIG.
Heating block 73 is attached to bolt 7
4 and the like. A heater 75 is embedded inside the heating block 73, and the upper surface of the heating block forms a sample stage 76.

【0003】この素子加熱冷却試験装置70において、
試料ステージ76上に適当な試料を配置し、極低温冷凍
機71によつて10K程度の極低温領域まで冷却した
り、ヒータ75によつて高温領域まで加熱する。
In this element heating / cooling test apparatus 70,
An appropriate sample is placed on the sample stage 76 and cooled to a cryogenic region of about 10 K by a cryogenic refrigerator 71 or heated to a high temperature region by a heater 75.

【0004】[0004]

【発明が解決しようとする課題】しかし、上述した従来
技術の素子加熱冷却試験装置70では極低温冷凍機71
の保護のため、ヒータ75による加熱はせいぜい100
℃程度が限界であつた。
However, in the above-mentioned prior art element heating / cooling test apparatus 70, a cryogenic refrigerator 71 is used.
Heating by the heater 75 is 100
The limit was about ° C.

【0005】ところが、様々な要求により試料を300
℃程度まで加熱することが求められてきている。
[0005] However, due to various demands, 300 specimens are required.
There is a demand for heating to about ° C.

【0006】一方、実公昭61−45872号公報に開
示された従来技術では、極低温冷凍機に代えて液体窒素
等の寒剤にて試料を冷却するようになつている。ところ
が、この従来技術のものでは試料を300℃程度まで加
熱できるが、冷却温度の限界はせいぜい77K程度と高
くなつてしまう。
On the other hand, in the prior art disclosed in Japanese Utility Model Publication No. 61-45872, a sample is cooled with a cryogen such as liquid nitrogen instead of a cryogenic refrigerator. However, with this conventional technique, the sample can be heated to about 300 ° C., but the limit of the cooling temperature is as high as about 77 K at most.

【0007】そこで、本発明では、試料を幅広い温度領
域で加熱冷却できるようにすることを、その技術的課題
とする。
Accordingly, it is an object of the present invention to make it possible to heat and cool a sample in a wide temperature range.

【0008】[0008]

【発明の構成】Configuration of the Invention

【0009】[0009]

【課題を解決するための手段】前述した本発明の技術的
課題を解決するために講じた本発明の技術的手段は、素
子加熱冷却試験装置を、コールドヘツドを有する極低温
冷凍機と、一面がコールドヘツドと熱的に結合され、そ
の内部に冷却水通路が形成された冷却手段と、一面が冷
却手段の他面と熱的に結合され、その内部にヒータが配
設されると共に、他面に試料ステージが形成された加熱
手段から構成し、冷却手段とヒータとの間に空間断熱層
を形成したことである。
In order to solve the above-mentioned technical problems of the present invention, the technical means of the present invention is to provide an element heating / cooling test apparatus including a cryogenic refrigerator having a cold head, Are thermally coupled to the cold head and have a cooling water passage formed therein, and one surface is thermally coupled to the other surface of the cooling device, and a heater is disposed therein and That is, the heating means has a sample stage formed on the surface, and a space heat insulating layer is formed between the cooling means and the heater.

【0010】[0010]

【作用】上述した本発明の技術的手段によれば、極低温
冷凍機により試料ステージ上の試料は極低温領域まで冷
却されると共に、空間断熱層及び冷却手段を介して極低
温冷凍機に対して断熱した上で試料は高温領域まで加熱
される。
According to the above-mentioned technical means of the present invention, the sample on the sample stage is cooled to the cryogenic region by the cryogenic refrigerator, and the cryogenic refrigerator is cooled via the space heat insulating layer and the cooling means. After heat insulation, the sample is heated to a high temperature region.

【0011】[0011]

【実施例】以下、本発明の技術的手段を具体化した実施
例について添付図面に基づいて説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment embodying the technical means of the present invention will be described below with reference to the accompanying drawings.

【0012】図1乃至図2において、素子加熱冷却試験
装置10における極低温冷凍機(例えば逆スターリング
サイクル・GMサイクル冷凍機やパルス管冷凍機等)1
1のコールドヘツド12、冷却手段13及び加熱手段1
4は、ボルト15,16等を介して直列的に熱的に結合
される。尚、加熱手段14の上面は図示しない試料が配
置される試料ステージ17を形成する。ここでは図示し
ないが、コールドヘツド12〜試料ステージ17付近は
真空容器内に収容されるのが一般的である。
1 and 2, a cryogenic refrigerator (for example, a reverse Stirling cycle / GM cycle refrigerator or a pulse tube refrigerator) in an element heating / cooling test apparatus 10 is shown.
1 cold head 12, cooling means 13 and heating means 1
4 is thermally coupled in series via bolts 15, 16 and the like. The upper surface of the heating means 14 forms a sample stage 17 on which a sample (not shown) is placed. Although not shown here, the cold head 12 to the vicinity of the sample stage 17 are generally housed in a vacuum vessel.

【0013】冷却手段13の内部には冷却水が流れる冷
却水通路18が形成されている。加熱手段14の内部に
は図2に示すようなスパイラル状の溝19が形成され、
溝19は加熱手段14の冷却手段13と接する側に開口
している。そして、溝19の底にはスパイラル状のヒー
タ20が溝19に密着するように配設されている。この
結果、ヒータ20と冷却手段13との間には空間断熱層
21が形成される。尚、溝19はできる限り深く形成さ
れ、ヒータ20ができる限り試料ステージ17に接近す
ることが望ましい。また、本実施例において溝19の形
状及びヒータ20の配設状態はスパイラル状のものが示
されているが、試料ステージ17を効率よく加熱できる
ならば特にこの形状に限定されるものではない。
A cooling water passage 18 through which cooling water flows is formed inside the cooling means 13. A spiral groove 19 as shown in FIG. 2 is formed inside the heating means 14,
The groove 19 is open on the side of the heating means 14 which is in contact with the cooling means 13. At the bottom of the groove 19, a spiral heater 20 is disposed so as to be in close contact with the groove 19. As a result, a space heat insulating layer 21 is formed between the heater 20 and the cooling means 13. It is desirable that the groove 19 be formed as deep as possible, and that the heater 20 be as close to the sample stage 17 as possible. Further, in this embodiment, the shape of the groove 19 and the arrangement of the heater 20 are shown as spiral shapes, but the shape is not particularly limited as long as the sample stage 17 can be efficiently heated.

【0014】以上の構成を有する素子加熱冷却試験装置
10の作動について説明する。まず試料ステージ17上
に試料をおいた上で、試料を冷却する際には極低温冷凍
機11を運転させてコールドヘツド12に発生する冷凍
出力により冷却手段13及び加熱手段14を介して試料
を冷却する。このとき、冷却水通路18内に冷却水は流
さず、また、ヒータ20にも通電しない。従つて、試料
の冷却時には冷却手段13及び加熱手段14は単なる熱
伝導体として作用する。
The operation of the device heating / cooling test apparatus 10 having the above configuration will be described. First, after placing the sample on the sample stage 17, when cooling the sample, the cryogenic refrigerator 11 is operated and the sample is cooled via the cooling means 13 and the heating means 14 by the refrigeration output generated in the cold head 12. Cooling. At this time, the cooling water does not flow into the cooling water passage 18 and the heater 20 is not energized. Therefore, when the sample is cooled, the cooling means 13 and the heating means 14 simply act as heat conductors.

【0015】一方、試料を加熱する際には、まず冷却水
通路18に冷却水を流した上で、ヒータ20に通電す
る。ここで、ヒータ20はスパイラル状に配設されてい
るので試料ステージ17全面を均一に加熱し、ひいては
試料全体を均一に加熱することができる。尚、試料ステ
ージ17の温度は図示しない温度センサ等により常時モ
ニタされ、ヒータ20への通電量が制御されることで、
試料は所望の温度に加熱される。また、ヒータ20は溝
19の底に密着して配設されているので、試料ステージ
17を効率よく加熱することができると共に、空間断熱
層21により極低温冷凍機11側への熱伝達量が最小限
に抑えられる。更には、ヒータ20の発生する熱のうち
冷却手段13へと伝達されたものは、冷却水通路18を
流れる冷却水により冷却される。従つて、試料加熱時に
おける極低温冷凍機11の加熱量は非常に小さい。この
結果、試料は10K程度の極低温領域から300℃程度
の高温領域まで加熱冷却できる。
On the other hand, when heating the sample, first, cooling water is supplied to the cooling water passage 18, and then the heater 20 is energized. Here, since the heater 20 is arranged in a spiral shape, the entire surface of the sample stage 17 can be uniformly heated, and thus the entire sample can be uniformly heated. The temperature of the sample stage 17 is constantly monitored by a temperature sensor (not shown) or the like, and the amount of electricity supplied to the heater 20 is controlled.
The sample is heated to a desired temperature. Further, since the heater 20 is disposed in close contact with the bottom of the groove 19, the sample stage 17 can be efficiently heated, and the heat transfer amount to the cryogenic refrigerator 11 side can be reduced by the space heat insulating layer 21. Minimized. Further, of the heat generated by the heater 20, the heat transmitted to the cooling means 13 is cooled by the cooling water flowing through the cooling water passage 18. Therefore, the amount of heating of the cryogenic refrigerator 11 when heating the sample is very small. As a result, the sample can be heated and cooled from a very low temperature range of about 10K to a high temperature range of about 300 ° C.

【0016】尚、冷却水通路18の配設状態は特に図示
しないが、ヒータ20同様にスパイラル状に形成しても
よく、しかし特に配設状態を限定しない。
Although the arrangement of the cooling water passage 18 is not specifically shown, it may be formed in a spiral shape like the heater 20, but the arrangement is not particularly limited.

【0017】[0017]

【発明の効果】上述したように本発明の素子加熱冷却試
験装置では、ヒータと極低温冷凍機との間に空間断熱層
及び冷却手段が配設されているため、加熱手段による極
低温冷凍機の不要な加熱が抑えられる。従つて、極低温
冷凍機に悪影響を与えることなく、試料を高温領域まで
加熱することができると共に、極低温領域まで冷却する
ことができる。
As described above, in the element heating / cooling test apparatus of the present invention, since the space heat insulating layer and the cooling means are provided between the heater and the cryogenic refrigerator, the cryogenic refrigerator using the heating means is provided. Unnecessary heating can be suppressed. Therefore, the sample can be heated to a high temperature region and cooled to a cryogenic region without adversely affecting the cryogenic refrigerator.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明実施例の素子加熱冷却試験装置の構成図
を示す。
FIG. 1 is a configuration diagram of an element heating / cooling test apparatus according to an embodiment of the present invention.

【図2】図1における要部正面図を示す。FIG. 2 shows a front view of a main part in FIG.

【図3】従来技術の素子加熱冷却試験装置の構成図を示
す。
FIG. 3 shows a configuration diagram of a conventional device heating / cooling test apparatus.

【符号の説明】[Explanation of symbols]

10 素子加熱冷却試験装置、 11 極低温冷凍機、 12 コールドヘツド、 13 冷却手段、 14 加熱手段、 17 試料ステージ、 18 冷却水通路、 20 ヒータ、 21 空間断熱層。 Reference Signs List 10 element heating / cooling test apparatus, 11 cryogenic refrigerator, 12 cold head, 13 cooling means, 14 heating means, 17 sample stage, 18 cooling water passage, 20 heater, 21 space heat insulating layer.

フロントページの続き (56)参考文献 特開 平1−104349(JP,A) 特開 昭61−68547(JP,A) 特開 平1−43350(JP,A) 特開 平4−150952(JP,A) 実開 昭63−107729(JP,U) (58)調査した分野(Int.Cl.7,DB名) B01L 7/00 B01L 11/00 - 11/02 G01N 25/00 Continuation of the front page (56) References JP-A-1-104349 (JP, A) JP-A-61-68547 (JP, A) JP-A-1-43350 (JP, A) JP-A-4-150952 (JP, A) , A) Fully open 1988-107729 (JP, U) (58) Fields investigated (Int. Cl. 7 , DB name) B01L 7/00 B01L 11/00-11/02 G01N 25/00

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 コールドヘツドを有する極低温冷凍機
と、 一面が前記コールドヘツドと熱的に結合され、その内部
に冷却水通路が形成された冷却手段と、 一面が前記冷却手段の他面と熱的に結合され、その内部
にヒータが配設されると共に、他面に試料ステージが形
成された加熱手段から成り、 前記冷却手段と前記ヒータとの間には空間断熱層が形成
されていることを特徴とする素子加熱冷却試験装置。
A cryogenic refrigerator having a cold head; cooling means having one surface thermally coupled to the cold head and having a cooling water passage formed therein; The heating means is thermally coupled, has a heater disposed therein, and has a sample stage formed on the other surface, and a space heat insulating layer is formed between the cooling means and the heater. An element heating / cooling test apparatus, characterized in that:
JP04412792A 1992-02-29 1992-02-29 Element heating / cooling test equipment Expired - Fee Related JP3247714B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP04412792A JP3247714B2 (en) 1992-02-29 1992-02-29 Element heating / cooling test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP04412792A JP3247714B2 (en) 1992-02-29 1992-02-29 Element heating / cooling test equipment

Publications (2)

Publication Number Publication Date
JPH05245394A JPH05245394A (en) 1993-09-24
JP3247714B2 true JP3247714B2 (en) 2002-01-21

Family

ID=12682950

Family Applications (1)

Application Number Title Priority Date Filing Date
JP04412792A Expired - Fee Related JP3247714B2 (en) 1992-02-29 1992-02-29 Element heating / cooling test equipment

Country Status (1)

Country Link
JP (1) JP3247714B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011089768A1 (en) * 2010-01-22 2011-07-28 国立大学法人 埼玉大学 Cold-storage-type cryocooler and cooling method using same
CN109612193B (en) * 2013-04-24 2021-04-02 西门子医疗有限公司 Assembly comprising a two-stage cryocooler and an associated mounting device

Also Published As

Publication number Publication date
JPH05245394A (en) 1993-09-24

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