GB2188163A - Testing degradation of a sample under thermal cycling - Google Patents

Testing degradation of a sample under thermal cycling Download PDF

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Publication number
GB2188163A
GB2188163A GB08705827A GB8705827A GB2188163A GB 2188163 A GB2188163 A GB 2188163A GB 08705827 A GB08705827 A GB 08705827A GB 8705827 A GB8705827 A GB 8705827A GB 2188163 A GB2188163 A GB 2188163A
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GB
United Kingdom
Prior art keywords
sample
heat sink
temperature
cycling
peltier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB08705827A
Other versions
GB8705827D0 (en
Inventor
David Chinery
David Antony Elmes
John Kimberley Wells
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BP PLC
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BP PLC
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Filing date
Publication date
Application filed by BP PLC filed Critical BP PLC
Publication of GB8705827D0 publication Critical patent/GB8705827D0/en
Publication of GB2188163A publication Critical patent/GB2188163A/en
Withdrawn legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/60Investigating resistance of materials, e.g. refractory materials, to rapid heat changes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/08Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
    • G01N3/18Performing tests at high or low temperatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058Kind of property studied
    • G01N2203/0069Fatigue, creep, strain-stress relations or elastic constants
    • G01N2203/0071Creep
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/022Environment of the test
    • G01N2203/0222Temperature
    • G01N2203/0224Thermal cycling

Abstract

Apparatus in which a sample 1 of material is thermally cycled by means of one or more Peltier devices 2, one junction of each device being in contact with the sample and the other junction in contact with a heat sink 3. The temperature of the heat sink maybe thermostatically stabilised using an ancillary fluid circuit 4 supplied with ice/water, water/anti-freeze. By changing the electrical power to the Peltier devices the sample may be heated and/or cooled as desired. The sample may be thermally cycled whilst being mechanically loaded for creep or strength degradation testing. The sample temperature may be sensed to enable feed back control of the thermal cycle. <IMAGE>

Description

SPECIFICATION Thermal cycling The present invention relates to an apparatus and method forthermal cycling and in particularto thermallycycling a sample of material.
High performance materials for use in demanding applications such as in the aerospace industry usually have to undergo stringent testing. Materials which may be prone to damage or degradation from variable temperature conditions may be tested by placing them in an environment which can be subjected to thermal cycling or alternate hot and cold conditions.
When an electrical currentflows along two dissimilar conductors joined together, heat is absorbed at their junction for one direction of current flow and is evolved at the same junction for the opposite direction of current flow. This phenomenom is known as the Peltier effect. The present invention makes use of the Peltier effect to provide a means forthermally cycling samples of material.
Thus according to the present invention there is provided an apparatus forthermally cycling a sample of material, the apparatus comprising a Peltier device having a hotjunction and a coldjuntion, means for locating a sample of material in thermal communication with one of the junctions and a heat sink in thermal communication with the otherjun- ction, the Peltier device being adapted to providethe desired heating and/or cooling effect at its junctions.
According to the present invention there is also provided a method ofthermallycycling a sample of material, the method comprising the steps (a) locating the sample in thermal communication with one of the junctions of a Peltier device, the otherjunction being in thermal communication with a heat sink (b) supplying electrical power to the Peltier device so as toheatand/orcoolthesample.
The sample of material may be located between two or more Peltier devices, each Peltier device being adapted to provide the desired heating and/or cooling effect at its junctions.
The heat sink is desirably in communication with an ancillaryfluid circuit to stabilise its temperature during heattransferto and from the Peltier device.
The fluid circuit may increase the effective thermal mass of the heat sink. Temperature stability of the system may be achieved by thermostatically con trolling the temperature of the fluid circuit. The heat sink may be a block of a heat conducting material cooled by forced circulation or natural convection of air. In this case the head sink may have fins to in crease the surface area.
The invention will now be described by way of ex ample only and with referenceto the accompanying drawing.
Figure 1 shows a schematic diagram of an appar atusforthermallycycling asampleofmaterial.A sample of material (1) is sandwiched between two Peltier devices, (2) so that it is in thermal communic ation with one junction of each ofthe Peltierdevices, which communicate electrically so that their hot and cold junctions correspond, i.e. both devices either heat or cool the sample of material atthe sametime.
The otherjunction of each device (2) is in thermal communication with a heat sink (3) which is a block of heat conductive metal such as copper, brass or aluminium alloy.A heattransferfluid (4) such as ice/ water orwater/antifreeze mixture or similar, is circulated through passages in the heat sinks and main tains them at a substantially constanttemperature.
In a cooling mode, an electrical power supply is arranged to provide typically 6 amps at 40 volts to the Peltier devices. In the present example this causes cooling ofthe material sample down to 35"C below the heatsinktemperature, which mighttypically be -1 5"C, giving a sample temperature of -50"C.
The electrical power supply may be reversed by means of relays or switchgearto heatthe sample.
The electrical power supply may be actuated by a suitable device such as a timer ortemperature sensor. Atypical current of -3.4 amps at -18 volts wil I raise the sample temperature to about 11 5 C above the heatsinktemperature, i.e., 100 C, because ohmic losses in the Peltier devices now assist heating.
When desired, the electrical powersupply may be switched back to the cooling mode, and the cycle may be repeated.
The use of different types of Peltier device may allowuppertemperaturesto reach2500C.
In the present invention, the sample is static, and this facilitates instrumentation of the sample for testing and the like. Also, it is possible to cyclethermally the sample under a mechanical loading test for creep Or strength degradation. Also, by sensing the temperature of the sample, feedback control of the temperature cycle, ramp rate, etc. is possible under automatic control.
The invention has potential advantages over existing thermal cycling methods such as improved control of heating and cooling rates, shorter cycle times, compactness, has ability of having differing tem peratures at the junctions of the device and may be cheaperthan a refrigerator/oven system.
1. An apparatusforthermally cycling a sample material, the apparatus comprising a Peltier device having hotjunction and a cold junction, means for locating a sample of material in thermal communication with one of the junctions and a heat sink in thermal communication with the otherjunction, the Peltier device being adapted to provide the desired heating and/or cooling effect at itsjunctions.
2. An apparatus forthermally cycling a sample of material according to claim 1 in which the sample is sandwiched between two or more Peltierdevices.
3. An apparatusforthermallycycling asampleof material according to claims 1 or 2 comprising meansforthermostatically stabilising the temperature ofthe heat sink.
4. An apparatus forthermally cycling a sample of material according to claim 3 in which means for thermostatically stabilising the temperature ofthe heat sink comprises a heattransferfluid which is cir- culated through passages in the heat sink.
5. An apparatusforthermallycycling a sample of
**WARNING** end of DESC field may overlap start of CLMS **.

Claims (14)

**WARNING** start of CLMS field may overlap end of DESC **. SPECIFICATION Thermal cycling The present invention relates to an apparatus and method forthermal cycling and in particularto thermallycycling a sample of material. High performance materials for use in demanding applications such as in the aerospace industry usually have to undergo stringent testing. Materials which may be prone to damage or degradation from variable temperature conditions may be tested by placing them in an environment which can be subjected to thermal cycling or alternate hot and cold conditions. When an electrical currentflows along two dissimilar conductors joined together, heat is absorbed at their junction for one direction of current flow and is evolved at the same junction for the opposite direction of current flow. This phenomenom is known as the Peltier effect. The present invention makes use of the Peltier effect to provide a means forthermally cycling samples of material. Thus according to the present invention there is provided an apparatus forthermally cycling a sample of material, the apparatus comprising a Peltier device having a hotjunction and a coldjuntion, means for locating a sample of material in thermal communication with one of the junctions and a heat sink in thermal communication with the otherjun- ction, the Peltier device being adapted to providethe desired heating and/or cooling effect at its junctions. According to the present invention there is also provided a method ofthermallycycling a sample of material, the method comprising the steps (a) locating the sample in thermal communication with one of the junctions of a Peltier device, the otherjunction being in thermal communication with a heat sink (b) supplying electrical power to the Peltier device so as toheatand/orcoolthesample. The sample of material may be located between two or more Peltier devices, each Peltier device being adapted to provide the desired heating and/or cooling effect at its junctions. The heat sink is desirably in communication with an ancillaryfluid circuit to stabilise its temperature during heattransferto and from the Peltier device. The fluid circuit may increase the effective thermal mass of the heat sink. Temperature stability of the system may be achieved by thermostatically con trolling the temperature of the fluid circuit. The heat sink may be a block of a heat conducting material cooled by forced circulation or natural convection of air. In this case the head sink may have fins to in crease the surface area. The invention will now be described by way of ex ample only and with referenceto the accompanying drawing. Figure 1 shows a schematic diagram of an appar atusforthermallycycling asampleofmaterial.A sample of material (1) is sandwiched between two Peltier devices, (2) so that it is in thermal communic ation with one junction of each ofthe Peltierdevices, which communicate electrically so that their hot and cold junctions correspond, i.e. both devices either heat or cool the sample of material atthe sametime. The otherjunction of each device (2) is in thermal communication with a heat sink (3) which is a block of heat conductive metal such as copper, brass or aluminium alloy.A heattransferfluid (4) such as ice/ water orwater/antifreeze mixture or similar, is circulated through passages in the heat sinks and main tains them at a substantially constanttemperature. In a cooling mode, an electrical power supply is arranged to provide typically 6 amps at 40 volts to the Peltier devices. In the present example this causes cooling ofthe material sample down to 35"C below the heatsinktemperature, which mighttypically be -1 5"C, giving a sample temperature of -50"C. The electrical power supply may be reversed by means of relays or switchgearto heatthe sample. The electrical power supply may be actuated by a suitable device such as a timer ortemperature sensor. Atypical current of -3.4 amps at -18 volts wil I raise the sample temperature to about 11 5 C above the heatsinktemperature, i.e., 100 C, because ohmic losses in the Peltier devices now assist heating. When desired, the electrical powersupply may be switched back to the cooling mode, and the cycle may be repeated. The use of different types of Peltier device may allowuppertemperaturesto reach2500C. In the present invention, the sample is static, and this facilitates instrumentation of the sample for testing and the like. Also, it is possible to cyclethermally the sample under a mechanical loading test for creep Or strength degradation. Also, by sensing the temperature of the sample, feedback control of the temperature cycle, ramp rate, etc. is possible under automatic control. The invention has potential advantages over existing thermal cycling methods such as improved control of heating and cooling rates, shorter cycle times, compactness, has ability of having differing tem peratures at the junctions of the device and may be cheaperthan a refrigerator/oven system. CLAIMS
1. An apparatusforthermally cycling a sample material, the apparatus comprising a Peltier device having hotjunction and a cold junction, means for locating a sample of material in thermal communication with one of the junctions and a heat sink in thermal communication with the otherjunction, the Peltier device being adapted to provide the desired heating and/or cooling effect at itsjunctions.
2. An apparatus forthermally cycling a sample of material according to claim 1 in which the sample is sandwiched between two or more Peltierdevices.
3. An apparatusforthermallycycling asampleof material according to claims 1 or 2 comprising meansforthermostatically stabilising the temperature ofthe heat sink.
4. An apparatus forthermally cycling a sample of material according to claim 3 in which means for thermostatically stabilising the temperature ofthe heat sink comprises a heattransferfluid which is cir- culated through passages in the heat sink.
5. An apparatusforthermallycycling a sample of material according to claim 3 in which the means for thermostatically stabilising the temperature of the heatsinkcomprises forced circulation or natural convection of air.
6. An apparatus forthermally cycling a sample of material according to any of the preceding claims comprising meansforcontrolling the heating and/or cooling effect on the sample by sensing the temperature of the sample.
7. An apparatus for thermal Iy cycl ing a sample of material as hereinbefore described and with reference to the accompanying drawing.
8. A method forthermally cycling a sample of material, the method comprising the steps (a) locating the sample in thermal communication with one of the junctions of a Peltier device, the otherjunction being in thermal communication with a heat sink (b) supplying electrical powerto the Peltier device so as to heatand/orcool the sample.
9. A method forthermally cycling a sample of material according to claim 8 in which the sample is sandwiched between two or more Peltier devices.
10. Amethodforthermallycycling a sample of material according to claims 8 or 9 comprising meansforthermostatically stabilising the temperature of the heat sink.
11. A method for thermal Iy cycl ing a sample of material according to claim 10 in which the means forthermostatically stabilising the temperature of the heat sink comprises a heattransferfluid which is circulated through passages in the heat sink.
12. A method forthermally cycling a sample of material according to claim 10 in which the means for thermostatically stabilising the temperature of the heat sink comprises forced circulation or natural convection of air.
13. A method forthermally cycling a sample of material according to claims 8 to 12 in whichthe heating and/or cooling effect on the sample is controy led by means comprising sensing thetem- perature of the sample.
14. Amethodforthermallycycling asampleof material as hereinbefore described.
GB08705827A 1986-03-18 1987-03-12 Testing degradation of a sample under thermal cycling Withdrawn GB2188163A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB868606641A GB8606641D0 (en) 1986-03-18 1986-03-18 Testing device

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GB8705827D0 GB8705827D0 (en) 1987-04-15
GB2188163A true GB2188163A (en) 1987-09-23

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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2728682A1 (en) * 1994-12-26 1996-06-28 Commissariat Energie Atomique DEVICE FOR TESTING AN OPTICAL ELEMENT SUBJECT TO RADIATION
WO2009135768A1 (en) * 2008-05-09 2009-11-12 Emitec Gesellschaft Für Emissionstechnologie Mbh Device for delivering a reductant and method for producing a motor vehicle
US7645070B2 (en) * 1997-03-28 2010-01-12 Applied Biosystems, Llc Thermal cycler for PCR
WO2010129993A1 (en) * 2009-05-11 2010-11-18 The University Of Queensland A thermo-electric device
US20110056661A1 (en) * 2009-09-01 2011-03-10 Life Technologies Corporation Thermal Block Assemblies and Instruments Providing Low Thermal Non-Uniformity for Rapid Thermal Cycling
RU194314U1 (en) * 2018-12-17 2019-12-05 Федеральное государственное бюджетное учреждение науки Федеральный исследовательский центр "Якутский научный центр Сибирского отделения Российской академии наук" ACTIVE COOLED DEVICE FOR RESEARCH OF DEFORMATION OF POLYMERIC MATERIALS AT LOW TEMPERATURES BY ATOMIC-POWER MICROSCOPY
RU216048U1 (en) * 2022-11-11 2023-01-16 Федеральное автономное учреждение "Центральный аэрогидродинамический институт имени профессора Н.Е. Жуковского" (ФАУ "ЦАГИ") Device for measuring the adhesion force of ice

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109253940A (en) * 2018-10-12 2019-01-22 南昌航空大学 A kind of experimental provision for turbo blade material heat fatigue

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GB1002008A (en) * 1962-11-13 1965-08-18 Canadian Patents Dev Variable temperature portable testing chambers
GB1058619A (en) * 1963-02-08 1967-02-15 Cie Ind Des Ceramiques Electro Peltier effect refrigeration or heating device
GB1117600A (en) * 1965-10-05 1968-06-19 Exxon Research Engineering Co Improved pour point meter
GB1345101A (en) * 1972-01-21 1974-01-30 Omnia Eng Ltd Instrument for measurement of dewpoints or partial water vapour pressures
GB2141872A (en) * 1981-05-11 1985-01-03 Extracorporeal Med Spec Liquid heating or cooling apparatus

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1052171A (en) *
GB211301A (en) * 1923-01-06 1924-02-21 Kaichi Komori Improvements in packing rings for stuffing-boxes
GB1002008A (en) * 1962-11-13 1965-08-18 Canadian Patents Dev Variable temperature portable testing chambers
GB1058619A (en) * 1963-02-08 1967-02-15 Cie Ind Des Ceramiques Electro Peltier effect refrigeration or heating device
GB1117600A (en) * 1965-10-05 1968-06-19 Exxon Research Engineering Co Improved pour point meter
GB1345101A (en) * 1972-01-21 1974-01-30 Omnia Eng Ltd Instrument for measurement of dewpoints or partial water vapour pressures
GB2141872A (en) * 1981-05-11 1985-01-03 Extracorporeal Med Spec Liquid heating or cooling apparatus

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0720010A1 (en) * 1994-12-26 1996-07-03 Commissariat A L'energie Atomique Testing device for optical element subjected to radiation
US5733042A (en) * 1994-12-26 1998-03-31 Commissariat A L'energie Atomique Device and method for testing an optical element subjected to radiation
FR2728682A1 (en) * 1994-12-26 1996-06-28 Commissariat Energie Atomique DEVICE FOR TESTING AN OPTICAL ELEMENT SUBJECT TO RADIATION
US9776187B2 (en) 1997-03-28 2017-10-03 Applied Biosystems, Llc Thermal cycler for PCR
US7645070B2 (en) * 1997-03-28 2010-01-12 Applied Biosystems, Llc Thermal cycler for PCR
WO2009135768A1 (en) * 2008-05-09 2009-11-12 Emitec Gesellschaft Für Emissionstechnologie Mbh Device for delivering a reductant and method for producing a motor vehicle
CN102016251B (en) * 2008-05-09 2014-07-30 排放技术有限公司 Device for delivering a reductant and method for producing a motor vehicle
US8978361B2 (en) 2008-05-09 2015-03-17 Emitec Gesellschaft Fuer Emissionstechnologie Mbh Apparatus for delivering a reducing agent and method for producing a motor vehicle
WO2010129993A1 (en) * 2009-05-11 2010-11-18 The University Of Queensland A thermo-electric device
US20110056661A1 (en) * 2009-09-01 2011-03-10 Life Technologies Corporation Thermal Block Assemblies and Instruments Providing Low Thermal Non-Uniformity for Rapid Thermal Cycling
US10049895B2 (en) * 2009-09-01 2018-08-14 Life Technologies Corporation Thermal block assemblies and instruments providing low thermal non-uniformity for rapid thermal cycling
RU194314U1 (en) * 2018-12-17 2019-12-05 Федеральное государственное бюджетное учреждение науки Федеральный исследовательский центр "Якутский научный центр Сибирского отделения Российской академии наук" ACTIVE COOLED DEVICE FOR RESEARCH OF DEFORMATION OF POLYMERIC MATERIALS AT LOW TEMPERATURES BY ATOMIC-POWER MICROSCOPY
RU216048U1 (en) * 2022-11-11 2023-01-16 Федеральное автономное учреждение "Центральный аэрогидродинамический институт имени профессора Н.Е. Жуковского" (ФАУ "ЦАГИ") Device for measuring the adhesion force of ice

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Publication number Publication date
GB8705827D0 (en) 1987-04-15
GB8606641D0 (en) 1986-04-23

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