JPH10245693A - Electroplating bath for nickel and nickel alloy and electroplating method - Google Patents

Electroplating bath for nickel and nickel alloy and electroplating method

Info

Publication number
JPH10245693A
JPH10245693A JP4803597A JP4803597A JPH10245693A JP H10245693 A JPH10245693 A JP H10245693A JP 4803597 A JP4803597 A JP 4803597A JP 4803597 A JP4803597 A JP 4803597A JP H10245693 A JPH10245693 A JP H10245693A
Authority
JP
Japan
Prior art keywords
nickel
general formula
bath
nickel alloy
electroplating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4803597A
Other languages
Japanese (ja)
Inventor
Tatsuo Kunishi
多通夫 国司
Naoto Hirose
直人 広瀬
Tamotsu Tokuda
有 徳田
Masanori Endo
正則 遠藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Priority to JP4803597A priority Critical patent/JPH10245693A/en
Publication of JPH10245693A publication Critical patent/JPH10245693A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To prevent corrosion of electronic parts and to prevent precipitation of metals on an insulating part even when the current density is increased, by incorporating a heterocyclic quaternary ammonium compd. as a brightener into a nickel or nickel alloy electroplating bath. SOLUTION: The nickel or nickel alloy electroplating bath consists of a nickel salt or a nickel salt and a water-soluble salt of one or more elements selected from boron, cobalt, copper, iron, manganese, phosphorus, tin and zinc, and a brightener comprising a quaternary ammonium compd. expressed by formulae I to V. In formulae I to V, R1 is 6 to 18C alkyl group, R2 , R3 are -H, -CH3 , -C2 H5 , -OH, -OCH3 , -OC2 H5 , -HN2 , -NO2 -COOH, -SO3 H, X is at least one of halogen ions, CH3 SO4 <-> , C2 H5 SO4 <-> , CH3 COO<-> and NO3 <-> . The pH of the plating bath is controlled to 3 to 10. The brightner is preferably added by about 0.01 to 1g/l.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は電子部品のメッキ工
程に用いられるニッケル又はニッケル合金電気メッキ
浴、およびその電気メッキ方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a nickel or nickel alloy electroplating bath used in a plating process for electronic parts, and a method for electroplating the bath.

【0002】[0002]

【従来の技術】通常、セラミック、ガラス、プラスチッ
ク等を素材とした電子部品には、その電極の半田濡れ性
の向上等を目的として、錫もしくは錫合金メッキが施さ
れるが、そのうちの多くは、半田喰われやホイスカー防
止の目的で、下地にニッケルもしくはニッケル合金メッ
キが施される。
2. Description of the Related Art Normally, electronic parts made of ceramic, glass, plastic or the like are plated with tin or tin alloy for the purpose of improving the solder wettability of the electrodes. For the purpose of preventing solder erosion and whiskers, the base is plated with nickel or a nickel alloy.

【0003】この際、金属をメッキする場合では起こら
ないような様々な問題が発生する。
At this time, various problems occur which do not occur when plating metal.

【0004】例えば、ガラスやセラミック材を用いたチ
ップ部品の中には、pH2.0前後の塩化物浴を用いて
メッキした場合には、ガラスやセラミックが著しい浸食
を受けたり、pH4.0前後のワット浴やスルファミン
酸浴を用いてメッキした場合には、ガラスやセラミック
の浸食は見られないものの、本来絶縁体であるガラスや
セラミックにもメッキが付くと言った現象が生じるもの
がある。
For example, when a chip component using glass or ceramic material is plated using a chloride bath having a pH of about 2.0, the glass or ceramic undergoes significant erosion or a pH of about 4.0. When plating is carried out using a Watt bath or a sulfamic acid bath, there is a phenomenon that glass or ceramic which is originally an insulator is plated, although erosion of glass or ceramic is not observed.

【0005】かかる問題に対処するため、この種の部品
を鍍金する場合、これまでは、pH4〜pH6のニッケ
ルもしくはニッケル合金浴を用い、メッキ電流を極端に
小さくすると言った対策を講じてきた。
In order to cope with such a problem, when plating this kind of component, a countermeasure has been taken so far that a plating current is extremely reduced by using a nickel or nickel alloy bath of pH 4 to pH 6.

【0006】[0006]

【発明が解決しようとする課題】しかしながら、メッキ
電流を極端に小さくすることは、下記(ア)〜(ウ)な
どの様々な問題につながる。 (ア)メッキ時間の長時間化による生産性の低下 (イ)長時間浸漬による部品の特性劣化 (ウ)電極の一部で発生するメッキ不着 本発明は上記のような問題点に鑑みてなされたもので、
電子部品が浸食されることなく、且つ、電流密度を高く
しても、絶縁体部への金属析出が起こらないようなニッ
ケル又はニッケル合金電気メッキ浴およびその電気メッ
キ方法を提供することを目的とする。
However, making the plating current extremely small leads to the following various problems (a) to (c). (A) Deterioration of productivity due to prolonged plating time (a) Deterioration of component characteristics due to prolonged immersion (c) Non-deposition of plating generated on a part of the electrode The present invention has been made in view of the above problems. That
An object of the present invention is to provide a nickel or nickel alloy electroplating bath and a method for electroplating the same, in which metal is not deposited on an insulator portion even when an electronic component is not eroded and a current density is increased. I do.

【0007】[0007]

【課題を解決するための手段】本発明は、上記の課題を
解決するためにニッケル又はニッケル合金電気メッキ浴
およびその電気メッキ方法を完成するに至った。本願第
1の発明のニッケル又はニッケル合金電気メッキ浴は、
(1)ニッケル塩、又は、ニッケル塩と、ホウ素、コバ
ルト、銅、鉄、マンガン、リン、錫、亜鉛の中から選ば
れる1種以上の元素の水溶性塩と、(2)光沢剤として
上記一般式[A]〜[S]のいずれかで示される第4級
アンモニウム化合物(ただし、R 1は炭素数6〜18の
アルキル基、R2、R3は−H、−CH3、−C25、−
OH、−OCH3、−OC25、−NH2、−NO2、−
COOH、−SO3H、Xはハロゲンイオン、CH3SO
4 -、C25SO4 -、CH3COO-、NO3 -のうち少なく
とも1種類)と、(3)pH3〜pH10とを具備する
ことに特徴がある。
The present invention solves the above problems.
Nickel or nickel alloy electroplating bath to solve
And the electroplating method was completed. Application
The nickel or nickel alloy electroplating bath of the first invention is
(1) Nickel salt or nickel salt, boron, edge
From copper, iron, manganese, phosphorus, tin, and zinc
A water-soluble salt of at least one element, and (2) a brightener
Quaternary represented by any of the above general formulas [A] to [S]
Ammonium compounds (provided that R 1Has 6 to 18 carbon atoms
Alkyl group, RTwo, RThreeIs -H, -CHThree, -CTwoHFive, −
OH, -OCHThree, -OCTwoHFive, -NHTwo, -NOTwo, −
COOH, -SOThreeH and X are halogen ions, CHThreeSO
Four -, CTwoHFiveSOFour -, CHThreeCOO-, NOThree -Less of
And (3) pH 3 to pH 10.
It has special features.

【0008】また、本願第2の発明のニッケル又はニッ
ケル合金の電気メッキ方法は、上記のニッケル又はニッ
ケル合金電気メッキ浴を用いて電子部品を電気メッキす
ることに特徴がある。
[0008] Further, the method for electroplating nickel or nickel alloy of the second invention of the present application is characterized in that an electronic component is electroplated using the above-mentioned nickel or nickel alloy electroplating bath.

【0009】[0009]

【発明の実施の形態】本願第1の発明のニッケル又はニ
ッケル合金電気メッキ浴が上記のような構成により、本
発明の目的を達成できる理由は次の通りである。すなわ
ち、以下のような現象(1)〜(2)を突き止め、光沢
剤について更に検討を加えた結果、(a)〜(b)を満
たす上記の一般式の光沢剤で示されるような第4級アン
モニウム化合物を、pH3〜pH10のニッケル又はニ
ッケル合金電器メッキ浴に添加することで、上記絶縁体
上への金属析出が著しく抑制されることを見い出した。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The nickel or nickel alloy electroplating bath according to the first invention of the present application can achieve the object of the present invention by the above-mentioned configuration for the following reasons. That is, the following phenomena (1) and (2) were ascertained, and as a result of further study on the brightener, the fourth agent represented by the above general formula that satisfies (a) and (b) was obtained. It has been found that by adding a quaternary ammonium compound to a nickel or nickel alloy electroplating bath at pH 3 to pH 10, metal deposition on the insulator is significantly suppressed.

【0010】(1)電子部品の構成材料であるセラミッ
クやガラスの溶出は、pHに大きく依存し、特にpH2
以下またはpH10以上の領域で顕著となる。 (2)絶縁体部への金属析出は絶縁体部の浸食が大きい
ほど起こりやすく、また光沢剤の種類によっても著しく
析出状態は異なる。
(1) Elution of ceramic and glass, which are constituent materials of electronic parts, greatly depends on pH, and particularly, pH 2
It becomes remarkable in the region below or pH10 or more. (2) Deposition of metal on the insulator portion is more likely to occur as the erosion of the insulator portion increases, and the deposition state also differs significantly depending on the type of brightener.

【0011】(a)窒素原子を含む5員環もしくは6員
環複素環状構造であること。 (b)窒素原子に結合するアルキル基は、炭素数6〜1
8のバルキーな基であること。
(A) A 5- or 6-membered heterocyclic structure containing a nitrogen atom. (B) The alkyl group bonded to the nitrogen atom has 6 to 1 carbon atoms.
Being a bulky group of 8.

【0012】本願第1の発明で示される光沢剤が界面活
性剤として上記課題に対し有効に作用する詳細な機構は
明らかでないが、下記(1)〜(2)のような構造であ
ることが上記金属析出の抑制に作用しているものと思わ
れる。 (1)R1で示されるアルキル基がある程度の大きさを
持つ(直鎖状の場合は炭素数8以上、環状の場合は炭素
数6以上)。 (2)窒素原子が被鍍金物に対して接近でき、且つ、界
面活性剤同士が密に詰まって吸着できるように、R2
3で示される側鎖基は分子量の小さい官能基からな
る。
Although the detailed mechanism by which the brightener shown in the first invention of the present application effectively acts on the above-mentioned problem as a surfactant is not clear, it may have the following structure (1) or (2). It is thought that this is acting to suppress the metal deposition. (1) The alkyl group represented by R 1 has a certain size (in the case of a straight chain, it has 8 or more carbon atoms, and in the case of a cyclic structure, it has 6 or more carbon atoms). (2) R 2 , so that the nitrogen atoms can approach the plating object and the surfactants can be closely packed and adsorbed.
The side chain group represented by R 3 is a functional group having a small molecular weight.

【0013】R1で示されるアルキル基は、炭素数6〜
18、好適には12〜16であって、直鎖でも分岐を持
っていてもまたは環状であっても良い。炭素数が6より
小さい場合には抑制効果を失い、18より大きい場合に
は水溶性を失う。
The alkyl group represented by R 1 has 6 to 6 carbon atoms.
18, preferably 12 to 16, which may be straight-chain, branched or cyclic. When the carbon number is less than 6, the inhibitory effect is lost, and when the carbon number is more than 18, water solubility is lost.

【0014】R2、R3で示される側鎖基は、分子量の小
さい官能基であれば、抑制効果を損なうことはない。た
だ分子量が大きくなると抑制効果は次第に低下する。
The side chain groups represented by R 2 and R 3 do not impair the inhibitory effect as long as they have a small molecular weight. However, as the molecular weight increases, the inhibitory effect gradually decreases.

【0015】次に、上記光沢剤の添加量であるが、多量
に加えると還元分解が盛んになり工程上の管理が煩雑と
なるため、少なめとすることが望ましく、0.01〜1
g/l、より好ましくは0.01〜0.5g/lであ
る。
Next, regarding the amount of the brightener added, if added in a large amount, reductive decomposition becomes active and management in the process becomes complicated.
g / l, more preferably 0.01 to 0.5 g / l.

【0016】上記光沢剤を添加すべき基本浴について
は、以下(1)〜(2)のような理由から、pH3〜p
H10の領域内にあれば、特に限定されない。 (1)ガラスやセラミックの浸食は、浴組成よりも浴の
pHに影響される。 (2)ガラスやセラミック上への金属析出は、本発明に
よって示される光沢剤によって抑制される。
The basic bath to which the brightener is to be added has a pH of 3 to p due to the following reasons (1) and (2).
There is no particular limitation as long as it is within the region of H10. (1) Erosion of glass or ceramics is more affected by bath pH than bath composition. (2) Metal deposition on glass and ceramics is suppressed by the brightener shown by the present invention.

【0017】次に、本発明を実施例に基づき、さらに具
体的に説明するが、本発明はかかる実施例のみに限定さ
れるものではない。
Next, the present invention will be described more specifically based on examples, but the present invention is not limited to only these examples.

【0018】[0018]

【実施例】表1に試料No.1〜試料No.14の組成
とpHと浴温(℃)を示す。
EXAMPLES Table 1 shows sample Nos. No. 1 to No. 1 14 shows the composition, pH, and bath temperature (° C.).

【0019】[0019]

【表1】 [Table 1]

【0020】また、表1の試料からなるメッキ浴を使用
し、鉛ガラスを焼き付けた(3φ)5×5mmニッケル
単板に電流密度(A/dm2)とメッキ時間(min)
を変えてメッキ処理した。そのときの鉛ガラスの浸食状
態と鉛ガラス上へのメッキの付き方を表2に示す。
Using a plating bath composed of the samples shown in Table 1, a current density (A / dm 2 ) and a plating time (min) were applied to a 5 × 5 mm nickel veneer baked with lead glass (3φ).
And plating was performed. Table 2 shows the erosion state of the lead glass and the manner of plating on the lead glass at that time.

【0021】なお、表2のガラス部の浸食の中で、○と
示したものは外観上浸食された形跡が全く認められない
状態を表し、△と示したものは外観上わずかに浸食され
た形跡が認められる状態を表し、×と示したものは外観
上浸食された形跡が著しく認められる状態を表してい
る。また、表2のガラス部のメッキの中で、○と示した
ものはガラス上に金属析出がほとんど認められない状態
を表し、△と示したものはガラス上に金属析出がわずか
に認められる状態を表し、×と示したものはガラス上に
著しい金属析出が認められる状態を表している。
In Table 2, among the erosion of the glass parts, the one indicated by ○ indicates that no evidence of erosion was observed on the appearance, and the one indicated by △ was slightly eroded on the appearance. A mark indicates a state where a trace is observed, and a cross indicates a state where a trace of erosion is remarkably recognized in appearance. Also, in the plating of the glass part in Table 2, the symbol “○” indicates a state in which almost no metal deposition was observed on the glass, and the symbol “△” indicates a state in which slight metal deposition was observed on the glass. The symbol x indicates a state in which remarkable metal deposition on the glass is observed.

【0022】[0022]

【表2】 [Table 2]

【0023】表2からも明らかなように、試料12で示
されるpH2の酸性浴(塩化物浴)では、浸食時間が長
い場合にはガラス部の浸食もガラス部への金属析出も認
められる。これに対し、試料13(ワット浴)、試料1
4(スルファミン酸浴)で示されるような弱酸性の浴で
は、ガラス部の浸食は抑えられるものの、電流密度が高
くなった場合にはガラス部への金属析出が認められる。
As is clear from Table 2, in the acidic bath (chloride bath) of pH 2 shown in Sample 12, when the erosion time is long, erosion of the glass portion and deposition of metal on the glass portion are observed. On the other hand, sample 13 (watt bath), sample 1
In a weakly acidic bath such as 4 (sulfamic acid bath), erosion of the glass part is suppressed, but when the current density is increased, metal deposition on the glass part is observed.

【0024】一方、試料1〜試料11で示される浴の場
合、電流密度を高くしてもガラス部の浸食もガラス部へ
の金属析出も認められない。
On the other hand, in the case of the baths shown in Samples 1 to 11, neither erosion of the glass portion nor deposition of metal on the glass portion is observed even when the current density is increased.

【0025】[0025]

【発明の効果】本発明を用いれば、電子部品が浸食され
ることなく、且つ、電流密度を高くしても、絶縁体部へ
の金属析出が起こらないようにすることが可能である。
According to the present invention, it is possible to prevent metal deposition on the insulator portion even when the electronic component is not eroded and the current density is increased.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 遠藤 正則 京都府長岡京市天神二丁目26番10号 株式 会社村田製作所内 ──────────────────────────────────────────────────の Continued on the front page (72) Inventor Masanori Endo 2-26-10 Tenjin, Nagaokakyo-shi, Kyoto Inside Murata Manufacturing Co., Ltd.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 以下の構成を具備するニッケル又はニッ
ケル合金電気メッキ浴。 (1)ニッケル塩、又は、ニッケル塩と、ホウ素、コバ
ルト、銅、鉄、マンガン、リン、錫、亜鉛の中から選ば
れる1種以上の元素の水溶性塩 (2)光沢剤として下記一般式[A]〜[S]のいずれ
かで示される第4級アンモニウム化合物 一般式[A] 【化1】 一般式[B] 【化2】 一般式[C] 【化3】 一般式[D] 【化4】 一般式[E] 【化5】 一般式[F] 【化6】 一般式[G] 【化7】 一般式[H] 【化8】 一般式[I] 【化9】 一般式[J] 【化10】 一般式[K] 【化11】 一般式[L] 【化12】 一般式[M] 【化13】 一般式[N] 【化14】 一般式[O] 【化15】 一般式[P] 【化16】 一般式[Q] 【化17】 一般式[R] 【化18】 一般式[S] 【化19】 (ただし、R1は炭素数6〜18のアルキル基、R2、R
3は−H、−CH3、−C25、−OH、−OCH3、−
OC25、−NH2、−NO2、−COOH、−SO
3H、Xはハロゲンイオン、CH3SO4 -、C25
4 -、CH3COO-、NO3 -のうち少なくとも1種類) (3)pH3〜pH10
1. A nickel or nickel alloy electroplating bath having the following constitution. (1) Nickel salt or water-soluble salt of nickel salt and one or more elements selected from boron, cobalt, copper, iron, manganese, phosphorus, tin and zinc (2) Brightener A quaternary ammonium compound represented by any one of [A] to [S]; General formula [B] General formula [C] General formula [D] General formula [E] General formula [F] General formula [G] General formula [H] General formula [I] General formula [J] General formula [K] General formula [L] General formula [M] General formula [N] General formula [O] General formula [P] General formula [Q] General formula [R] General formula [S] (However, R 1 is an alkyl group having 6 to 18 carbon atoms, R 2 , R
3 -H, -CH 3, -C 2 H 5, -OH, -OCH 3, -
OC 2 H 5, -NH 2, -NO 2, -COOH, -SO
3 H and X are halogen ions, CH 3 SO 4 , C 2 H 5 S
At least one of O 4 , CH 3 COO , and NO 3 ) (3) pH 3 to pH 10
【請求項2】 請求項1に記載のニッケル又はニッケル
合金電気メッキ浴を用いて電子部品を電気メッキするこ
とを特徴とするニッケル又はニッケル合金の電気メッキ
方法。
2. A method for electroplating nickel or a nickel alloy, comprising: electroplating an electronic component using the nickel or nickel alloy electroplating bath according to claim 1.
JP4803597A 1997-03-03 1997-03-03 Electroplating bath for nickel and nickel alloy and electroplating method Pending JPH10245693A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
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Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
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Publications (1)

Publication Number Publication Date
JPH10245693A true JPH10245693A (en) 1998-09-14

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Country Status (1)

Country Link
JP (1) JPH10245693A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
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US6238542B1 (en) * 1998-09-15 2001-05-29 Thomas Helden Water soluble brighteners for zinc and zinc alloy electrolytes
KR100469084B1 (en) * 2002-03-25 2005-02-02 한국수력원자력 주식회사 METHOD FOR PLATING Ni-Fe-P ALLOY BY SULFAMATE BATH
WO2005078163A1 (en) * 2004-02-05 2005-08-25 Taskem, Inc. Ternary and quaternary alloys to replace chromium
JP2006213946A (en) * 2005-02-02 2006-08-17 Murata Mfg Co Ltd Nickel plating solution, method for producing electronic parts, and electronic parts
JP2007077463A (en) * 2005-09-15 2007-03-29 Gunma Univ Nickel-boron composite plating liquid, composite plating method using the liquid, and composite plated parts using the method
JP2010007172A (en) * 2008-06-30 2010-01-14 Tdk Corp Nickel electroplating liquid and plating method
CN104264198A (en) * 2014-10-22 2015-01-07 华文蔚 Cerium-nickel-phosphorus alloy electroplating solution and preparation method thereof
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US6238542B1 (en) * 1998-09-15 2001-05-29 Thomas Helden Water soluble brighteners for zinc and zinc alloy electrolytes
KR100469084B1 (en) * 2002-03-25 2005-02-02 한국수력원자력 주식회사 METHOD FOR PLATING Ni-Fe-P ALLOY BY SULFAMATE BATH
WO2005078163A1 (en) * 2004-02-05 2005-08-25 Taskem, Inc. Ternary and quaternary alloys to replace chromium
JP2006213946A (en) * 2005-02-02 2006-08-17 Murata Mfg Co Ltd Nickel plating solution, method for producing electronic parts, and electronic parts
JP4678194B2 (en) * 2005-02-02 2011-04-27 株式会社村田製作所 Electronic component manufacturing method and electronic component
JP2007077463A (en) * 2005-09-15 2007-03-29 Gunma Univ Nickel-boron composite plating liquid, composite plating method using the liquid, and composite plated parts using the method
JP2010007172A (en) * 2008-06-30 2010-01-14 Tdk Corp Nickel electroplating liquid and plating method
CN104264198A (en) * 2014-10-22 2015-01-07 华文蔚 Cerium-nickel-phosphorus alloy electroplating solution and preparation method thereof
WO2018097184A1 (en) * 2016-11-25 2018-05-31 日本高純度化学株式会社 Electrolytic nickel (alloy) plating solution
CN109996907A (en) * 2016-11-25 2019-07-09 日本高纯度化学株式会社 Electrolytic nickel (alloy) plating liquid
KR20190082232A (en) * 2016-11-25 2019-07-09 니혼 고쥰도가가쿠 가부시키가이샤 Electrolytic nickel (alloy) plating solution
JPWO2018097184A1 (en) * 2016-11-25 2019-10-17 日本高純度化学株式会社 Electrolytic nickel (alloy) plating solution
CN109996907B (en) * 2016-11-25 2022-01-11 日本高纯度化学株式会社 Electrolytic nickel (alloy) plating solution
TWI753971B (en) * 2016-11-25 2022-02-01 日商日本高純度化學股份有限公司 Electrolytic nickel (alloy) plating solution
CN114262917A (en) * 2016-11-25 2022-04-01 日本高纯度化学株式会社 Electrolytic nickel (alloy) plating solution
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