JPH1021537A - Production of magnetic recording medium - Google Patents

Production of magnetic recording medium

Info

Publication number
JPH1021537A
JPH1021537A JP17350496A JP17350496A JPH1021537A JP H1021537 A JPH1021537 A JP H1021537A JP 17350496 A JP17350496 A JP 17350496A JP 17350496 A JP17350496 A JP 17350496A JP H1021537 A JPH1021537 A JP H1021537A
Authority
JP
Japan
Prior art keywords
contact angle
substrate
recording medium
magnetic recording
cleaning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17350496A
Other languages
Japanese (ja)
Inventor
Yoshitaka Kimura
至孝 木村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Chemical Corp
Original Assignee
Mitsubishi Chemical Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Chemical Corp filed Critical Mitsubishi Chemical Corp
Priority to JP17350496A priority Critical patent/JPH1021537A/en
Publication of JPH1021537A publication Critical patent/JPH1021537A/en
Pending legal-status Critical Current

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  • Magnetic Record Carriers (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)

Abstract

PROBLEM TO BE SOLVED: To enable production of a magnetic recording medium having few defects by controlling the contact angle of the substrate surface with pure water after surface treatment within a specified range. SOLUTION: The surface state of a substrate after surface treatment relates to data defects of a magnetic recording medium, and especially among properties of the surface state, the contact angle with pure water largely relates to defects. The contact angle is preferably <=85 deg.. Since the contact angle is influenced by the cleaning state of the surface, the cleaning degree is increased by using a detergent having high cleaning performance, by increasing the temp. of the cleaning liquid, by extending the cleaning time, by cleaning while scrubbing, etc., in order to control the contact angle to 85 deg.. If the contact angle is >85 deg., the substrate surface is easily dried before the film forming process after the surface treatment and contamination deposits and fixed on the dried part. This causes peeling after a film is formed. Therefore, by controlling the contact angle to <=85 deg., the substrate is prevented from drying during carrying, and moreover, a magnetic recording medium having little defects can be obtd.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明が属する技術分野】本発明は、磁気記録媒体の製
造方法に関し、特にその表面加工処理工程を有する磁気
記録媒体の製造方法に関する。
The present invention relates to a method of manufacturing a magnetic recording medium, and more particularly to a method of manufacturing a magnetic recording medium having a surface processing step.

【0002】[0002]

【従来の技術】非磁性基板上に磁性層が設けられた磁気
記録媒体は、磁気ディスク装置に組み込まれ、コンピュ
ータ装置の外部記憶手段として広く用いられている。こ
のような磁気記録媒体においては、磁性層の異方性制御
や記録再生ヘッドの貼り付き(吸着)防止を目的とし
て、テキスチャ加工と呼ばれる表面加工処理が行われる
ことが多い。
2. Description of the Related Art A magnetic recording medium in which a magnetic layer is provided on a non-magnetic substrate is incorporated in a magnetic disk device and is widely used as an external storage means of a computer device. Such magnetic recording media are often subjected to a surface processing called texture processing for the purpose of controlling the anisotropy of the magnetic layer and preventing sticking (adsorption) of the recording / reproducing head.

【0003】テキスチャ加工は基板表面に微少な凹凸を
形成する処理であるが、その加工方法及び加工パターン
については従来多くの検討がなされている。すなわち、
加工方法としては遊離砥粒を用いる方法、砥粒が塗布さ
れた研磨テープを用いる方法が、加工パターンとしては
同心円状のもの、交差するものなどをそれぞれ挙げるこ
とができる。そしてこのような検討の結果、加工方法や
加工パターン、凹凸の大きさが最終的な磁気記録媒体の
特性に影響を与えることが判明している。
The texture processing is a processing for forming minute irregularities on the surface of a substrate, and many methods and processing patterns have been conventionally studied. That is,
Examples of the processing method include a method using free abrasive grains and a method using a polishing tape coated with abrasive grains, and the processing patterns include concentric ones and intersecting ones. As a result of such studies, it has been found that the processing method, the processing pattern, and the size of the irregularities affect the final characteristics of the magnetic recording medium.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、このよ
うな表面加工処理後、磁性層等の薄膜をスパッタリング
するまでの過程における基板の表面状態と、磁気記録媒
体の特性との関係についてはこれまで検討されておら
ず、製造ラインの配置や、製造日程などの要因により決
まる状態になっていた。
However, the relationship between the surface state of the substrate and the characteristics of the magnetic recording medium in the process from the surface processing to the sputtering of a thin film such as a magnetic layer has been studied so far. However, it was determined by factors such as the layout of the production line and the production schedule.

【0005】[0005]

【課題を解決するための手段】本発明者は表面加工処理
後の基板表面状態と磁気記録媒体のデータ欠陥との間に
関係があることを見いだした。そして表面状態の中でも
特に接触角の大きさが関係することを突き止め、本発明
に到達した。
The present inventor has found that there is a relationship between the substrate surface condition after the surface processing and the data defect of the magnetic recording medium. The inventors have found that the magnitude of the contact angle is particularly related to the surface state, and arrived at the present invention.

【0006】すなわち、本発明の要旨は、非磁性基板上
に少なくとも磁性層が設けられる磁気記録媒体の製造方
法であって、製膜処理前に表面加工処理工程を含み、か
つこの表面加工処理後の基板表面における純水接触角が
85°以下であることを特徴とする磁気記録媒体の製造
方法にある。
That is, the gist of the present invention is a method for manufacturing a magnetic recording medium in which at least a magnetic layer is provided on a non-magnetic substrate, the method including a surface processing step before a film forming process, and a method after the surface processing. Wherein the pure water contact angle on the substrate surface is 85 ° or less.

【0007】[0007]

【発明の実施の形態】以下、本発明につき詳細に説明す
る。本発明において、非磁性基板としては、通常、シリ
コン基板、アルミニウム合金板またはガラス基板が用い
られるが、銅、チタン等の金属基板、セラミック基板、
樹脂基板等を用いることもできる。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below in detail. In the present invention, as the non-magnetic substrate, usually, a silicon substrate, an aluminum alloy plate or a glass substrate is used, but a metal substrate such as copper and titanium, a ceramic substrate,
A resin substrate or the like can also be used.

【0008】基板上には通常下地層が設けられる。下地
層は、通常、非磁性体からなり、好ましくはNiP合金
層であり、通常、無電解メッキ法またはスパッタ法によ
り形成される。また、その厚みは、好ましくは50〜2
0,000nm、特に好ましくは100〜15,000
nmである。本発明でいう基板は、これら下地層を設け
た状態のものを指す。
[0008] An underlayer is usually provided on the substrate. The underlayer is usually made of a nonmagnetic material, preferably a NiP alloy layer, and is usually formed by electroless plating or sputtering. The thickness is preferably 50 to 2
000 nm, particularly preferably 100-15,000
nm. The substrate in the present invention refers to a substrate provided with these underlayers.

【0009】表面加工処理は薄膜を堆積させる前に行
う。加工方法は遊離砥粒を用いる方法、砥粒が塗布され
た研磨テープを用いる方法など、いかなる方法でも良
い。また、処理前と処理後の表面粗さの大小関係も問わ
ない。すなわち、処理前よりも平滑に研磨する場合であ
っても、表面を粗くする場合でも良い。さらに、加工パ
ターンについても同心円状、交差状など、任意である。
The surface processing is performed before depositing the thin film. The processing method may be any method such as a method using free abrasive grains and a method using a polishing tape coated with abrasive grains. In addition, the magnitude relationship between the surface roughness before and after the treatment does not matter. That is, the polishing may be performed more smoothly than before the processing, or the surface may be roughened. Further, the processing pattern is also arbitrary such as concentric or crossing.

【0010】下地層と磁性層の間には、Cr層、あるい
はCu層等の中間層を設けるのが好ましく、その膜厚
は、通常、20〜200nm、好ましくは50〜100
nmである。
[0010] An intermediate layer such as a Cr layer or a Cu layer is preferably provided between the underlayer and the magnetic layer, and the thickness thereof is usually 20 to 200 nm, preferably 50 to 100 nm.
nm.

【0011】磁性層は、無電解メッキ、電気メッキ、ス
パッタ、蒸着等の方法によって形成され、Co−P、C
o−Ni−P、Co−Ni−Cr、Co−Ni−Pt、
Co−Cr−Ta、Co−Cr−Pt、Co−Cr−T
a−Pt系合金等の強磁性合金薄膜が形成され、その膜
厚は通常30〜70nm程度である。
The magnetic layer is formed by a method such as electroless plating, electroplating, sputtering, or vapor deposition.
o-Ni-P, Co-Ni-Cr, Co-Ni-Pt,
Co-Cr-Ta, Co-Cr-Pt, Co-Cr-T
A ferromagnetic alloy thin film such as an a-Pt alloy is formed, and its thickness is usually about 30 to 70 nm.

【0012】この磁性層上には必要に応じて保護層が設
けられるが、保護層としては蒸着、スパッタ、プラズマ
CVD、イオンプレーティング、湿式法等の方法によ
り、炭素膜、水素化カーボン膜、TiC、SiC等の炭
化物膜、SiN、TiN等の窒化膜、SiO、AlO、
ZrO等の酸化物膜等が成膜される。これらのうち、特
に好ましくは、炭素膜、水素化カーボン膜である。ま
た、保護層上には通常、潤滑剤層が設けられる。
A protective layer is provided on the magnetic layer as required. The protective layer may be formed by a method such as vapor deposition, sputtering, plasma CVD, ion plating, or a wet method. Carbide films such as TiC and SiC, nitride films such as SiN and TiN, SiO, AlO,
An oxide film such as ZrO is formed. Among these, a carbon film and a hydrogenated carbon film are particularly preferable. Further, a lubricant layer is usually provided on the protective layer.

【0013】本発明による製造方法においては、表面加
工処理後の基板の接触角が85度以下であることを特徴
とする。基板の接触角は表面の洗浄度合いに大きく影響
を受けるため、接触角を85度以下にするためには、表
面加工処理後の基板洗浄方法を考慮する必要がある。
In the manufacturing method according to the present invention, the contact angle of the substrate after the surface processing is 85 degrees or less. Since the contact angle of the substrate is greatly affected by the degree of surface cleaning, it is necessary to consider a substrate cleaning method after the surface processing in order to make the contact angle 85 degrees or less.

【0014】具体的には、洗浄能力の高い洗剤を用い
る、洗浄液の温度を上げる、洗浄の時間を延ばす、スク
ラブを用いて洗浄する等、洗浄の度合いを高めると接触
角は小さくなる。
More specifically, the contact angle becomes smaller when the degree of cleaning is increased, such as by using a detergent having a high cleaning ability, raising the temperature of the cleaning liquid, extending the cleaning time, or cleaning with a scrub.

【0015】接触角が85度を超えると、表面加工処理
後の製膜工程に至るまでに基板表面が乾燥しやすくな
る。乾燥した部分には汚れが集まって固着し、落ちにく
くなる。このような汚れが固着した部分は、製膜後の剥
離原因となる。よって本発明においては接触角を85度
以下とすることにより、搬送中に基板が乾燥することを
防ぎ、ひいては欠陥の少ない磁気記録媒体を実現してい
る。
When the contact angle exceeds 85 degrees, the surface of the substrate is easily dried before the film forming step after the surface processing. Dirt collects and adheres to the dried part, making it difficult to remove. The portion where such dirt is fixed becomes a cause of peeling after film formation. Therefore, in the present invention, by setting the contact angle to 85 degrees or less, it is possible to prevent the substrate from drying during transport, and to realize a magnetic recording medium with few defects.

【0016】[0016]

【実施例】直径3.5インチのアルミニウム合金板にN
i−Pメッキを施し、鏡面研磨後洗浄した基板を24枚
用意した。次に、日立電子エンジニアリング社製テキス
チャーマシンを用い、ゴムローラーにより基板の両面に
MIPOX社製アルミナテープ(商品名WA8000SFOY)を
押しつけ、クーラントを滴下しながら平均表面粗さが5
0Å程度となるように表面加工処理を行った。
EXAMPLE An aluminum alloy plate having a diameter of 3.5 inches was coated with N.
Twenty-four substrates were subjected to i-P plating, mirror-polished and washed. Next, using a texture machine manufactured by Hitachi Electronics Engineering Co., Ltd., alumina tape (trade name: WA8000SFOY) manufactured by MIPOX Co., Ltd. was pressed against both sides of the substrate with rubber rollers, and the average surface roughness was 5
The surface processing was performed so as to be about 0 °.

【0017】次に、表1に示す条件で基板を洗浄し、接
触角の異なるサンプルを4枚ずつ製造した。
Next, the substrate was washed under the conditions shown in Table 1, and four samples having different contact angles were manufactured.

【0018】[0018]

【表1】 [Table 1]

【0019】これらサンプルにおいて、接触角は協和界
面科学株式会社製 FACE接触角計CA−S150型
を用い、純水による液適法で測定した。
In these samples, the contact angle was measured using a FACE contact angle meter CA-S150, manufactured by Kyowa Interface Science Co., Ltd., by a suitable method using pure water.

【0020】次に、実施例及び比較例で得られた基板上
にスパッタリング法によってCr下地層(1000
Å)、CoCrTa磁性膜(500Å)、カーボン保護
膜(200Å)を順に製膜し、さらに保護層上に潤滑剤
を塗布して磁気ディスクを製造した。得られた磁気ディ
スクに対し、表面欠陥個数(CM個数)を以下の方法で
評価した。
Next, a Cr underlayer (1000) was formed on the substrates obtained in Examples and Comparative Examples by sputtering.
Å), a CoCrTa magnetic film (500 Å) and a carbon protective film (200 Å) were sequentially formed, and a lubricant was applied on the protective layer to manufacture a magnetic disk. The number of surface defects (the number of CMs) of the obtained magnetic disk was evaluated by the following method.

【0021】Guzik社製テスター RWA501型 回転数 5500rpm テストヘッド 薄膜ヘッド(G.W.=5μm) テストピッチ 5.0μm ミッシングスライス 70% 周波数 ゾーンビットにて13.7〜23.7MH
zで実施 各実施例及び比較例につき評価結果を表2に示す。
Guzik tester RWA501 type Rotation speed 5500 rpm Test head Thin film head (GW = 5 μm) Test pitch 5.0 μm Missing slice 70% Frequency 13.7 to 23.7 MHZ at zone bit
Table 2 shows the evaluation results for each example and comparative example.

【0022】[0022]

【表2】 [Table 2]

【0023】[0023]

【発明の効果】以上説明したように、本発明による磁気
記録媒体の製造方法によれば、テキスチャ加工後の基板
の接触角を特定範囲に制御することにより、欠陥の少な
い磁気記録媒体を実現できるという効果を有する。
As described above, according to the method for manufacturing a magnetic recording medium of the present invention, a magnetic recording medium with few defects can be realized by controlling the contact angle of the substrate after texture processing to a specific range. It has the effect of.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 非磁性基板上に少なくとも磁性層が設け
られる磁気記録媒体の製造方法であって、製膜工程前に
表面加工処理工程を含み、かつこの表面加工処理後の基
板表面における純水接触角が85°以下であることを特
徴とする磁気記録媒体の製造方法。
1. A method of manufacturing a magnetic recording medium comprising a non-magnetic substrate having at least a magnetic layer provided thereon, comprising a surface processing step before a film forming step, wherein pure water on a substrate surface after the surface processing step is provided. A method for manufacturing a magnetic recording medium, wherein a contact angle is 85 ° or less.
JP17350496A 1996-07-03 1996-07-03 Production of magnetic recording medium Pending JPH1021537A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17350496A JPH1021537A (en) 1996-07-03 1996-07-03 Production of magnetic recording medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17350496A JPH1021537A (en) 1996-07-03 1996-07-03 Production of magnetic recording medium

Publications (1)

Publication Number Publication Date
JPH1021537A true JPH1021537A (en) 1998-01-23

Family

ID=15961756

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17350496A Pending JPH1021537A (en) 1996-07-03 1996-07-03 Production of magnetic recording medium

Country Status (1)

Country Link
JP (1) JPH1021537A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001286835A (en) * 2000-04-10 2001-10-16 Jeol Ltd Cleaning device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001286835A (en) * 2000-04-10 2001-10-16 Jeol Ltd Cleaning device

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