JPH1020479A - Method for affixing pellicle to photomask - Google Patents

Method for affixing pellicle to photomask

Info

Publication number
JPH1020479A
JPH1020479A JP19706996A JP19706996A JPH1020479A JP H1020479 A JPH1020479 A JP H1020479A JP 19706996 A JP19706996 A JP 19706996A JP 19706996 A JP19706996 A JP 19706996A JP H1020479 A JPH1020479 A JP H1020479A
Authority
JP
Japan
Prior art keywords
pellicle
photomask
adhesive layer
pressure
sensitive adhesive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19706996A
Other languages
Japanese (ja)
Inventor
Shu Kashida
周 樫田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shin Etsu Chemical Co Ltd
Original Assignee
Shin Etsu Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Etsu Chemical Co Ltd filed Critical Shin Etsu Chemical Co Ltd
Priority to JP19706996A priority Critical patent/JPH1020479A/en
Publication of JPH1020479A publication Critical patent/JPH1020479A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/68Preparation processes not covered by groups G03F1/20 - G03F1/50
    • G03F1/82Auxiliary processes, e.g. cleaning or inspecting
    • G03F1/84Inspecting

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a method for affixing a pellicle to a photomask by omitting the use of a linear having a possibility of generating foreign matter. SOLUTION: A tacky adhesive layer 2 is previously formed at the point to be affixed with a pellicle frame 3 of the photomask 1 and thereafter, the other end face 6 not formed with the tacky adhesive layer of the pellicle frame 3 is pressure welded onto the tacky adhesive layer 2 in the method for affixing the other end face of the pellicle frame 3 spread with a pellicle film 5 via the adhesive layer 4 at one end face to the photomask 1. Since the pellicle obtd. without using the liners is used, there is no generation of the foreign matter from the liners and the degradation in the performance by the foreign matter of the pellicle film is prevented and in addition, the material cost for the liners and the stages and costs for washing, blanking, inspecting, etc., of the liners are saved.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、一端面にペリクル
膜が張設されたペリクルをフォトマスク上に貼着する方
法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for attaching a pellicle having a pellicle film stretched on one end face to a photomask.

【0002】[0002]

【従来の技術】近年、半導体装置は、高密度化、高集積
化の進展に伴ってパターンの微細化が進行しており、フ
ォトマスク上に付着した微細な異物でも転写パターンの
欠陥になるようになってきたことから、このフォトマス
クへの異物の付着を防止するためにフォトマスクにペリ
クルを装着することが広く行われるようになってきてい
る。
2. Description of the Related Art In recent years, the patterning of semiconductor devices has been miniaturized with the progress of high density and high integration, and even fine foreign substances adhering on a photomask may cause defects in a transfer pattern. In order to prevent foreign substances from adhering to the photomask, pellicles have been widely mounted on the photomask.

【0003】そして、このペリクルは、通常、一般的に
金属又は樹脂製のペリクル枠の一端面にペリクル膜を接
着剤で張設し、ペリクル枠の他端面に粘着剤層を形成
し、その粘着剤層を離型性を有するライナー(セパレー
ターとも称する)で保護した構造体となっている。
[0003] The pellicle is generally formed by attaching a pellicle film to one end of a pellicle frame made of metal or resin with an adhesive, and forming an adhesive layer on the other end of the pellicle frame. It has a structure in which the agent layer is protected by a release liner (also referred to as a separator).

【0004】このペリクルの使用は、離型性を有するラ
イナーを剥離して除去した後、露出した粘着剤層をフォ
トマスク(レクチルとも称する)の所定の位置に圧着す
ることによってペリクルをフォトマスクに固定すればよ
い。一方このように製造したペリクルを出荷する際に
は、ペリクル膜に異物のないことを確認後、ペリクルを
所定の容器に収納し、異物が混入しないように厳重に包
装し、梱包を行う。
[0004] This pellicle is used by peeling and removing a liner having a releasing property, and then pressing the exposed pressure-sensitive adhesive layer to a predetermined position of a photomask (also referred to as a reticle) to convert the pellicle into a photomask. Just fix it. On the other hand, when shipping the pellicle manufactured in this way, after confirming that the pellicle film is free from foreign matter, the pellicle is stored in a predetermined container, strictly packed so that foreign matter is not mixed, and packed.

【0005】[0005]

【発明が解決しようとする課題】しかし、このペリクル
を目的地に輸送後、包装・梱包を解き、ペリクルを取り
出してペリクル膜の異物の有無を確認すると、異物が発
生している場合がある。
However, after transporting the pellicle to the destination, unpacking and unpacking the pellicle, taking out the pellicle and checking for the presence of foreign matter in the pellicle film, foreign matter may be generated.

【0006】この原因としては、トラックや鉄道、飛行
機による輸送時及び出荷の積み卸し時の振動や衝撃によ
り、ペリクル膜以外に潜在していた異物がペリクル膜に
付着したためと考えられる。
It is considered that this is because foreign substances other than the pellicle film adhered to the pellicle film due to vibration or impact during transportation by truck, railroad, or airplane and during unloading and shipping.

【0007】ここで、ペリクル膜以外に異物が潜在する
可能性のある場所としては、ペリクル枠の外側及び内側
面、更に粘着剤層の保護に用いているライナー表面が考
えられる。特にライナーは、一般に離型剤をコーティン
グしたプラスチックフィルムを材料として用いているた
め、帯電し易い。その結果、ライナー表面に微粒子が付
着し易く、この微粒子がペリクル膜に移り、異物となる
ことがある。更に、ライナーは、フレームの形状に合わ
せるために打ち抜き刃を用いて打ち抜くものであるが、
その打ち抜き部分の断面からも異物が発生し易い。
[0007] Here, as a place where foreign matter may be present in addition to the pellicle film, the outer and inner surfaces of the pellicle frame and the liner surface used for protecting the pressure-sensitive adhesive layer can be considered. In particular, since the liner generally uses a plastic film coated with a release agent as a material, the liner is easily charged. As a result, fine particles easily adhere to the surface of the liner, and the fine particles may move to the pellicle film and become foreign matters. Furthermore, the liner is punched using a punching blade to match the shape of the frame,
Foreign matter is easily generated from the cross section of the punched portion.

【0008】本発明は、上記事情に鑑みなされたもの
で、上記異物発生のおそれがあるライナーの使用を省略
したペリクルのフォトマスクへの貼着方法を提供するこ
とを目的とする。
The present invention has been made in view of the above circumstances, and it is an object of the present invention to provide a method of attaching a pellicle to a photomask in which the use of a liner that may cause the generation of foreign matter is omitted.

【0009】[0009]

【課題を解決するための手段】本発明者は、上記目的を
達成するため、一端面に接着剤層を介してペリクル膜が
張設されたペリクル枠の他端面をフォトマスクに貼着す
る方法において、フォトマスクのペリクル枠を貼着すべ
き箇所に予め粘着剤層を形成した後、この粘着剤層に上
記ペリクル枠の粘着剤層無形成の他端面を圧着させるこ
とを特徴とするフォトマスクへのペリクル貼着方法を提
供する。
Means for Solving the Problems To achieve the above object, the present inventor has a method of attaching the other end of a pellicle frame having a pellicle film stretched on one end via an adhesive layer to a photomask. In the photomask, a pressure-sensitive adhesive layer is previously formed at a portion of the photomask to which the pellicle frame is to be adhered, and the other end face of the pellicle frame without the pressure-sensitive adhesive layer is pressure-bonded to the pressure-sensitive adhesive layer. To provide a method of attaching a pellicle to a pellicle.

【0010】本発明によれば、予めフォトマスク上のペ
リクルを貼着する領域に粘着剤層を形成するため、ペリ
クル自身にはそのペリクル枠の他端面に粘着剤層を設け
る必要がない。従って、本発明によれば、通常ペリクル
枠の他端面に形成される粘着剤層の保護を目的とするラ
イナーを使用する必要がないので、ライナーを発生源と
する異物の発生がなくなり、その結果、ペリクル膜の異
物による性能の低下が防止できる上、ライナーの原料費
やライナーの洗浄、打ち抜き、検査等の工程、費用を省
くことができ、ペリクルの清浄性を維持する観点から非
常に有利である上、工業的にも有利である。
According to the present invention, since the pressure-sensitive adhesive layer is formed in advance on the area on the photomask where the pellicle is to be adhered, it is not necessary to provide the pressure-sensitive adhesive layer on the other end surface of the pellicle frame on the pellicle itself. Therefore, according to the present invention, it is not necessary to use a liner for the purpose of protecting the pressure-sensitive adhesive layer usually formed on the other end surface of the pellicle frame. In addition to preventing the deterioration of performance due to foreign matter of the pellicle film, the cost of liner materials and the steps and costs of cleaning, punching, inspection, etc. of the liner can be reduced, which is very advantageous from the viewpoint of maintaining the pellicle cleanliness. In addition, it is industrially advantageous.

【0011】[0011]

【発明の実施の形態及び実施例】以下、本発明につき図
面を参照にして更に詳しく説明する。本発明のフォトマ
スクにペリクルを貼着する方法は、図1に示したように
フォトマスク1上のペリクルPを貼着する領域に予め粘
着剤層2を形成し、次いで、該粘着剤層2上に、ペリク
ル枠3の一端面(上端面)に接着剤層4を介してペリク
ル膜5が張設され、他端面(下端面)6には粘着剤層無
形成のペリクルの該他端面6を当接圧着し、粘着剤層2
を介してフォトマスク1にペリクルPを貼着することを
特徴とするものである。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in more detail with reference to the drawings. In the method of attaching a pellicle to a photomask of the present invention, as shown in FIG. 1, an adhesive layer 2 is formed in advance on a region of a photomask 1 where an pellicle P is attached, and then the adhesive layer 2 is formed. A pellicle film 5 is stretched on one end face (upper end face) of the pellicle frame 3 via an adhesive layer 4, and the other end face 6 of the pellicle without an adhesive layer is formed on the other end face (lower end face) 6. And pressure-bonded to form an adhesive layer 2
A pellicle P is attached to the photomask 1 via

【0012】即ち、本発明に使用するペリクルは、図2
に示したようにペリクル枠3の一端面(上端面)に接着
剤層4を介してペリクル膜5が張設され、他端面(下端
面)6には粘着剤層が形成されていないものである。な
お、従来のペリクルは、他端面(下端面)6に粘着層が
設けられ、かつこの粘着層がライナーで保護されてい
る。
That is, the pellicle used in the present invention is shown in FIG.
As shown in (1), a pellicle film 5 is stretched on one end surface (upper end surface) of the pellicle frame 3 via an adhesive layer 4, and an adhesive layer is not formed on the other end surface (lower end surface) 6. is there. In the conventional pellicle, an adhesive layer is provided on the other end surface (lower end surface) 6, and this adhesive layer is protected by a liner.

【0013】また、本発明で使用するフォトマスク1
は、図3に示したようにフォトマスク1のペリクルを貼
着する領域に予め粘着剤層2を形成することが必要であ
る。
Further, a photomask 1 used in the present invention
As shown in FIG. 3, it is necessary to previously form the pressure-sensitive adhesive layer 2 in a region of the photomask 1 where the pellicle is to be adhered.

【0014】ここで、フォトマスク1の材質、形状、ペ
リクル枠3、接着剤層4を形成する接着剤、ペリクル膜
5の材質や形状などは公知の材質、形状とすることがで
きる。例えば、ペリクルフレームの材質としては、一般
的にアルミニウムが用いられ、フォトマスクの材質とし
ては、一般に合成石英等のガラスが用いられる。
Here, the material and shape of the photomask 1, the adhesive for forming the pellicle frame 3, the adhesive layer 4, and the material and shape of the pellicle film 5 can be known materials and shapes. For example, aluminum is generally used as the material of the pellicle frame, and glass such as synthetic quartz is generally used as the material of the photomask.

【0015】本発明に用いる粘着剤としては、特に制限
はなく、一般のゴム系粘着剤やアクリル系粘着剤を用い
ることができるが、耐光性、耐薬品性の点でシリコーン
系粘着剤を用いることが好ましい。
The pressure-sensitive adhesive used in the present invention is not particularly limited, and a general rubber-based pressure-sensitive adhesive or an acrylic pressure-sensitive adhesive can be used, but a silicone-based pressure-sensitive adhesive is used in terms of light resistance and chemical resistance. Is preferred.

【0016】更に、フォトマスク上のペリクルを貼着す
る領域に粘着剤層を形成する方法には特に制限はない
が、粘着剤を一定量吐出しながら所定の領域に塗布する
方法が好適である。なお、粘着剤層の層厚は通常の厚さ
とすることができ、具体的には0.1〜10mm、好ま
しくは0.2〜0.6mmである。
Further, there is no particular limitation on the method of forming the pressure-sensitive adhesive layer on the area where the pellicle is to be adhered on the photomask, but it is preferable to apply the pressure-sensitive adhesive to a predetermined area while discharging a fixed amount of the pressure-sensitive adhesive. . The thickness of the pressure-sensitive adhesive layer can be a usual thickness, specifically 0.1 to 10 mm, preferably 0.2 to 0.6 mm.

【0017】なお、ペリクルを貼着するフォトマスクの
面は、通常、パターンを形成している面であるが、反対
側の面(パターンを形成していない面)にもペリクルを
貼着してもよい。
The surface of the photomask to which the pellicle is adhered is usually the surface on which the pattern is formed, but the pellicle is also adhered to the opposite surface (the surface on which no pattern is formed). Is also good.

【0018】この場合、フォトマスク上の粘着剤層への
ペリクルの圧着方法に別に制限はなく、通常の方法で行
うことができる。
In this case, there is no particular limitation on the method of pressing the pellicle to the pressure-sensitive adhesive layer on the photomask, and it can be performed by a usual method.

【0019】次に、実施例により本発明を具体的に説明
する。 〔実施例〕ペリクル枠として、外寸が122×149m
m、幅が2mm、高さが5.8mmのアルミニウム製フ
レームを用いた。このフレームの一端面に接着剤を介し
てフッ素系ポリマーの薄膜をペリクル膜として張設する
一方、他端面には粘着剤層及びライナーを有しないペリ
クルを作製した。
Next, the present invention will be specifically described with reference to examples. [Example] The outer dimensions of the pellicle frame are 122 x 149 m.
m, an aluminum frame having a width of 2 mm and a height of 5.8 mm was used. A pellicle without a pressure-sensitive adhesive layer and a liner was produced on the other end while a fluoropolymer thin film was stretched as a pellicle film on one end of the frame via an adhesive.

【0020】次に、このペリクルの輸送による異物の発
生の有無をチェックするためにペリクルを専用の容器に
入れて密封後、トラックにより500kmの輸送を行
い、輸送後のペリクルを容器から取り出し、ペリクル膜
上の異物を暗室内で集光ランプを用いて測定したとこ
ろ、異物の増加は認められなかった。
Next, the pellicle is placed in a dedicated container and sealed to check the presence / absence of foreign matter due to the transport of the pellicle. After that, the pellicle is transported for 500 km by a truck, and the pellicle after the transport is taken out of the container. When the foreign matter on the film was measured using a condenser lamp in a dark room, no increase in the foreign matter was recognized.

【0021】一方、フォトマスクのパターンを形成した
面側のペリクルを貼付する領域にシリコーン系粘着剤
(KR−120、信越化学工業社製)をディスペンサー
を用いて塗布し、120℃で3分間乾燥させて、幅2m
m、厚み0.5mmの粘着剤層を形成した。
On the other hand, a silicone-based pressure-sensitive adhesive (KR-120, manufactured by Shin-Etsu Chemical Co., Ltd.) is applied using a dispenser to a region where the pellicle on the side of the photomask pattern is formed, and dried at 120 ° C. for 3 minutes. Let me be 2m wide
m, a pressure-sensitive adhesive layer having a thickness of 0.5 mm was formed.

【0022】次に、輸送試験を行った上記ペリクルをこ
のフォトマスクの所定の位置に置き、30kgの荷重を
3分間かけて圧着した。その結果、ペリクルとフォトマ
スクが粘着剤層を介して均一に貼着されていることが確
認された。
Next, the pellicle subjected to the transportation test was placed at a predetermined position on the photomask, and a pressure of 30 kg was pressed for 3 minutes. As a result, it was confirmed that the pellicle and the photomask were uniformly adhered via the pressure-sensitive adhesive layer.

【0023】[0023]

【発明の効果】本発明の方法によれば、ライナー無使用
のペリクルを用いるので、ライナーからの異物の発生が
なく、このためペリクル膜の異物による性能の低下が防
止できる上、ライナーの原料費やライナーの洗浄、打ち
抜き、検査等の工程、費用を省くことができ、ペリクル
の清浄性を維持する観点から非常に有利である上、工業
的にも有利である。
According to the method of the present invention, since a pellicle without a liner is used, there is no generation of foreign matter from the liner. Therefore, the performance of the pellicle film due to foreign matter can be prevented from being reduced, and the raw material cost of the liner can be prevented. It is possible to omit processes and costs such as cleaning, punching and inspection of the pellicle and the liner, which is very advantageous from the viewpoint of maintaining the pellicle cleanliness and also industrially advantageous.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施に際し、フォトマスク上にペリク
ルを貼着した状態を示す断面図である。
FIG. 1 is a cross-sectional view showing a state in which a pellicle is stuck on a photomask in carrying out the present invention.

【図2】本発明の実施に際し、フォトマスク上に貼着す
る前のペリクル枠の断面図である。
FIG. 2 is a cross-sectional view of a pellicle frame before being attached on a photomask in the embodiment of the present invention.

【図3】本発明の実施に際し、粘着剤層を形成したフォ
トマスクの断面図である。
FIG. 3 is a cross-sectional view of a photomask on which an adhesive layer has been formed in the practice of the present invention.

【符号の説明】[Explanation of symbols]

1 フォトマスク 2 粘着剤層 3 ペリクル枠 4 接着剤層 5 ペリクル膜 6 粘着剤層無形成のペリクル枠他端面 DESCRIPTION OF SYMBOLS 1 Photomask 2 Adhesive layer 3 Pellicle frame 4 Adhesive layer 5 Pellicle film 6 Pelicle frame other end without adhesive layer

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 一端面に接着剤層を介してペリクル膜が
張設されたペリクル枠の他端面をフォトマスクに貼着す
る方法において、フォトマスクのペリクル枠を貼着すべ
き箇所に予め粘着剤層を形成した後、この粘着剤層に上
記ペリクル枠の粘着剤層無形成の他端面を圧着させるこ
とを特徴とするフォトマスクへのペリクル貼着方法。
1. A method for attaching the other end of a pellicle frame having a pellicle film stretched on one end via an adhesive layer to a photomask, in which the pellicle frame of the photomask is pre-adhered to a portion where the pellicle frame is to be attached. A method for adhering a pellicle to a photomask, comprising: forming a pressure-sensitive adhesive layer; and bonding the other end surface of the pellicle frame without the pressure-sensitive adhesive layer to the pressure-sensitive adhesive layer.
JP19706996A 1996-07-08 1996-07-08 Method for affixing pellicle to photomask Pending JPH1020479A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19706996A JPH1020479A (en) 1996-07-08 1996-07-08 Method for affixing pellicle to photomask

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19706996A JPH1020479A (en) 1996-07-08 1996-07-08 Method for affixing pellicle to photomask

Publications (1)

Publication Number Publication Date
JPH1020479A true JPH1020479A (en) 1998-01-23

Family

ID=16368204

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19706996A Pending JPH1020479A (en) 1996-07-08 1996-07-08 Method for affixing pellicle to photomask

Country Status (1)

Country Link
JP (1) JPH1020479A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102081299A (en) * 2009-11-30 2011-06-01 信越化学工业株式会社 A pellicle for lithography
WO2022215609A1 (en) * 2021-04-05 2022-10-13 信越化学工業株式会社 Pellicle frame, pellicle, photomask with pellicle, exposure method, method for manufacturing semiconductor device, and method for manufacturing liquid crystal display

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102081299A (en) * 2009-11-30 2011-06-01 信越化学工业株式会社 A pellicle for lithography
JP2011113033A (en) * 2009-11-30 2011-06-09 Shin-Etsu Chemical Co Ltd Method and apparatus for producing pellicle film
WO2022215609A1 (en) * 2021-04-05 2022-10-13 信越化学工業株式会社 Pellicle frame, pellicle, photomask with pellicle, exposure method, method for manufacturing semiconductor device, and method for manufacturing liquid crystal display

Similar Documents

Publication Publication Date Title
JP5875197B2 (en) Reticle chuck cleaner and reticle chuck cleaning method
JP2000223446A (en) Semiconductor device and manufacture thereof
US6777310B2 (en) Method of fabricating semiconductor devices on a semiconductor wafer using a carrier plate during grinding and dicing steps
US20110236807A1 (en) Pellicle for lithography
JP3037745B2 (en) Pellicle structure
JP3209073B2 (en) Pellicle
EP3249467B1 (en) A pellicle
JP2642637B2 (en) Dustproof film
JP4478557B2 (en) Large pellicle, pellicle transport method, pellicle case, and pellicle transfer device
JPH1020479A (en) Method for affixing pellicle to photomask
JPH1020480A (en) Method for affixing pellicle to photomask
US6303196B1 (en) Pellicle
JP4173239B2 (en) Pellicle for lithography
JP2001024010A (en) Method for manufacturing semiconductor device
JP4478558B2 (en) Large pellicle transport method, transport jig and pellicle case
WO2006006318A1 (en) Mask blank, manufacturing method thereof and transfer plate manufacturing method
KR100737617B1 (en) Packing material for wafer
JPH11135409A (en) Apparatus for detecting and removing foreign matter
JPH07175206A (en) Pellicle
JP2002107914A (en) Pellicle and method for attaching pellicle
JPH09204038A (en) Production of mask
JP3540866B2 (en) Weeha mounter
JP2855044B2 (en) Pellicle storage container
JP3830497B2 (en) Semiconductor wafer manufacturing method and semiconductor device manufacturing method
JP2855045B2 (en) Pellicle