JPH10194787A - Glass substrate for recording medium, and production of recording medium - Google Patents

Glass substrate for recording medium, and production of recording medium

Info

Publication number
JPH10194787A
JPH10194787A JP8359151A JP35915196A JPH10194787A JP H10194787 A JPH10194787 A JP H10194787A JP 8359151 A JP8359151 A JP 8359151A JP 35915196 A JP35915196 A JP 35915196A JP H10194787 A JPH10194787 A JP H10194787A
Authority
JP
Japan
Prior art keywords
glass substrate
recording medium
chemical strengthening
layer
back surfaces
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8359151A
Other languages
Japanese (ja)
Other versions
JP2998952B2 (en
Inventor
Shinji Eda
伸二 江田
Noboru Yamaguchi
昇 山口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hoya Corp
Original Assignee
Hoya Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoya Corp filed Critical Hoya Corp
Priority to JP8359151A priority Critical patent/JP2998952B2/en
Publication of JPH10194787A publication Critical patent/JPH10194787A/en
Application granted granted Critical
Publication of JP2998952B2 publication Critical patent/JP2998952B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Surface Treatment Of Glass (AREA)
  • Magnetic Record Carriers (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)

Abstract

PROBLEM TO BE SOLVED: To obtain a glass substrate for a recording medium, equalized in the depths of compression strain layers on the front and back surfaces of the glass substrate to correct the curvature of the substrate, and excellent in flatness by chemically reinforcing again an already chemically reinforced glass substrate different in the depths of the compression strains on the front and back surfaces. SOLUTION: When a glass substrate different in the depths of compression strain layers on the front and back surfaces is again chemically reinforced, the permeation rate or amount of relatively larger diameter ions permeated from an ion exchange treatment liquid into the surface layer portion of the glass substrate is excellent in comparison with a case the ions are permeated into a surface layer portion on the side large in the depth of the compression strain layer. When the front and back surfaces of the glass substrate are thereby again chemically reinforced in the same conditions, the depths of the compression strain layers on the front and back surfaces are equalized. The curvature of the again chemically reinforced glass substrate is preferably <=5μm.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、記録媒体用ガラス
基板の製造方法、及び記録媒体の製造方法等に関する。
The present invention relates to a method for manufacturing a glass substrate for a recording medium, a method for manufacturing a recording medium, and the like.

【0002】[0002]

【従来の技術】磁気ディスク等の磁気記録媒体用基板と
しては、アルミニウム基板が広く用いられてきたが、磁
気ディスクの小型・薄板化と、高密度記録化に伴い、ア
ルミニウム基板に比べ強度や平坦性などに優れたガラス
基板に徐々に置き換わりつつある。
2. Description of the Related Art Aluminum substrates have been widely used as substrates for magnetic recording media such as magnetic disks. However, as magnetic disks have become smaller and thinner and recording density has increased, the strength and flatness of aluminum substrates have been reduced. Is gradually being replaced by a glass substrate with excellent properties.

【0003】これは、ガラス基板は、最近のハードディ
スクの小径・薄板化に対応できる十分な硬度を有する等
の特性を有し、物理的・化学的耐久性にも優れ、しか
も、その表面を比較的容易に高い平面精度に形成でき、
したがってスペーシングを小さくでき磁気ヘッドの低浮
上走行化等を達成しやすい性質を有していることが高密
度記録化実現により適しているからである。
[0003] This is because glass substrates have characteristics such as having sufficient hardness to cope with recent small-diameter and thinner hard disks, have excellent physical and chemical durability, and have a comparative surface. Can be easily formed with high plane accuracy.
Therefore, it is more suitable for realizing high-density recording that the magnetic head has such a property that the spacing can be reduced and the magnetic head can easily be operated at a low flying height.

【0004】通常、磁気ディスク等の記録媒体用ガラス
基板においては、ガラス基板の強度を向上させる目的
で、ガラス基板の表面を化学強化処理することが多い。
[0004] Generally, in glass substrates for recording media such as magnetic disks, the surface of the glass substrate is often subjected to chemical strengthening treatment in order to improve the strength of the glass substrate.

【0005】詳しくは、ガラス基板を磁気ディスク用基
板として用いる場合には、耐衝撃性や耐振動性を向上さ
せ衝撃や振動によって基板が破損するのを防止する目的
で、ガラス基板の表面に低温イオン交換法による化学強
化処理を施すことが多い。
More specifically, when a glass substrate is used as a magnetic disk substrate, the surface of the glass substrate is kept at a low temperature in order to improve the shock resistance and vibration resistance and to prevent the substrate from being damaged by shock or vibration. In many cases, chemical strengthening treatment is performed by an ion exchange method.

【0006】化学強化処理は、例えば、ガラス中のL
i、Naイオン等をそれらよりも相対的にイオン半径の
大きいNa、Kイオン等でイオン交換により置換して、
ガラス表層部に強い圧縮応力を発生させて強度を増大さ
せる処理である。
The chemical strengthening treatment is performed, for example, by using L in glass.
i, Na ions, etc., are replaced by Na, K ions, etc., having a relatively large ionic radius by ion exchange,
This is a process for generating a strong compressive stress in the glass surface layer to increase the strength.

【0007】そして、この化学強化処理後に基板の平滑
性を向上させるため、あるいは、化学強化の際基板に付
着する不純物を除去するために、基板の研磨を行うこと
がある。
The substrate may be polished to improve the smoothness of the substrate after the chemical strengthening process or to remove impurities adhering to the substrate during the chemical strengthening.

【0008】[0008]

【発明が解決しようとする課題】このように、化学強化
後に基板を再研磨すると、ガラス基板に反りが発生す
る。これは、化学強化された基板には、基板の表層部に
圧縮歪み層(圧縮応力層)が、基板の内部に引張応力層
が形成されており、バランスが取れているのであるが、
化学強化後の再研磨により、基板の表面及び裏面の各圧
縮歪み層の深さに差が生じ、この結果、基板に反りが発
生するためである。
As described above, when the substrate is polished again after the chemical strengthening, the glass substrate is warped. This is because the chemically strengthened substrate is balanced because a compressive strain layer (compressive stress layer) is formed on the surface of the substrate and a tensile stress layer is formed inside the substrate.
This is because the re-polishing after the chemical strengthening causes a difference in the depth of each of the compression strain layers on the front surface and the back surface of the substrate, and as a result, the substrate is warped.

【0009】このような問題点を解決するため、特開平
7−134823号公報に記載のように基板の表面及び
裏面の研磨量をコントロールする方法も提案されている
が、基板の反りを完全に除去することは困難であった。
In order to solve such a problem, a method of controlling the amount of polishing on the front surface and the back surface of the substrate has been proposed as disclosed in Japanese Patent Application Laid-Open No. Hei 7-134823. It was difficult to remove.

【0010】また、磁気ディスク用ガラス基板のリサイ
クル(再生)の場合にも同様の問題が生じる。すなわ
ち、完成させた磁気ディスクが不良になった場合、磁性
層等の薄膜を剥離してガラス基板の薄膜が形成されてい
た側の表面を再研磨することが行われているが、この時
も再研磨した表面の圧縮歪み層の深さが裏面のそれより
浅くなり、反りが生じる。
A similar problem also occurs in the case of recycling (reproducing) a glass substrate for a magnetic disk. That is, when the completed magnetic disk becomes defective, the thin film such as the magnetic layer is peeled off and the surface of the glass substrate on which the thin film is formed is polished again. The depth of the compression-strained layer on the polished front surface becomes shallower than that on the rear surface, and warpage occurs.

【0011】本発明は上述した背景の下になされたもの
であり、基板の反りが少なく、平坦性に優れた記録媒体
用ガラス基板の提供を第一の目的とする。
The present invention has been made under the above-mentioned background, and has as its first object to provide a glass substrate for a recording medium having a small flatness and excellent flatness.

【0012】また、基板の反りが少なく、平坦性に優れ
た記録媒体の提供を第二の目的とする。
It is a second object of the present invention to provide a recording medium in which the substrate is less warped and has excellent flatness.

【0013】[0013]

【課題を解決するための手段】上記目的を達成するため
に本発明者らは鋭意研究を重ねた結果、化学強化された
ガラス基板であって圧縮歪み層の深さが表面と裏面とで
異なったガラス基板を、再度化学強化すると、イオン交
換処理液中からガラス基板の表層部に進入する相対的に
イオン半径の大きなイオンは、圧縮歪み層の深さが浅い
側の表層部に進入する場合の方が、圧縮歪み層の深さが
深い側の表層部に進入する場合に比べ、速度あるいは量
において勝っており、ガラス基板の表裏面を同じ条件で
再度化学強化すると、圧縮歪み層の深さが均等化され、
ガラス基板の反りを是正できることを見出し本発明を完
成するに至った。
Means for Solving the Problems In order to achieve the above object, the present inventors have conducted intensive studies and as a result, the depth of the compressively strained layer is different between the front surface and the back surface of a chemically strengthened glass substrate. When the glass substrate is chemically strengthened again, ions having a relatively large ionic radius that enter the surface layer of the glass substrate from the ion exchange treatment liquid enter the surface layer on the side where the depth of the compressively strained layer is shallow. Is superior in speed or amount to the case where the depth of the compressively strained layer enters the deeper surface layer portion, and when the front and back surfaces of the glass substrate are chemically strengthened again under the same conditions, the depth of the compressively strained layer becomes larger. Are equalized,
The inventors have found that the warpage of the glass substrate can be corrected, and have completed the present invention.

【0014】すなわち、本発明の記録媒体用ガラス基板
の製造方法は、化学強化された記録媒体用ガラス基板の
製造方法において、化学強化によってガラス基板の表面
及び裏面に各々形成された圧縮歪み層の各々の深さの差
を、再化学強化することにより減少させる構成としてあ
る。
That is, the method of manufacturing a glass substrate for a recording medium according to the present invention is a method of manufacturing a glass substrate for a recording medium which has been chemically strengthened. The difference between the depths is reduced by re-chemical strengthening.

【0015】また、本発明の他の記録媒体用ガラス基板
の製造方法は、ガラス基板の主表面を研削、研磨した後
に化学強化し、その後に再研磨し、次いで、化学強化に
よってガラス基板の表面及び裏面に各々形成された圧縮
歪み層の各々の深さの差を、再化学強化することにより
減少させる構成としてある。
In another method of manufacturing a glass substrate for a recording medium according to the present invention, the main surface of the glass substrate is ground and polished, then chemically strengthened, polished again, and then the surface of the glass substrate is chemically strengthened. And the difference in depth of each of the compression-strained layers formed on the back surface is reduced by re-chemical strengthening.

【0016】さらに、本発明の他の記録媒体用ガラス基
板の製造方法は、薄膜の形成された化学強化されたガラ
ス基板から薄膜を剥離し、研磨した後に、化学強化によ
ってガラス基板の表面及び裏面に各々形成された圧縮歪
み層の各々の深さの差を、再化学強化することにより減
少させる構成としてある。
Further, the method of manufacturing a glass substrate for a recording medium according to the present invention is further characterized in that the thin film is peeled off from the chemically strengthened glass substrate on which the thin film is formed, polished, and then the front and back surfaces of the glass substrate are chemically strengthened. The difference in the depth of each of the compression-strained layers formed in each of the above is reduced by re-chemical strengthening.

【0017】また、本発明の記録媒体用ガラス基板の製
造方法は、上記本発明の記録媒体用ガラス基板の製造方
法において、ガラス基板の反りが、5ミクロン以下であ
る構成としてある。
Further, the method for producing a glass substrate for a recording medium of the present invention is the same as the above method for producing a glass substrate for a recording medium, wherein the warpage of the glass substrate is 5 μm or less.

【0018】さらに、本発明の記録媒体の製造方法は、
上記本発明の記録媒体用ガラス基板の製造方法で製造さ
れた記録媒体用ガラス基板上に、少なくとも記録層を形
成する構成としてある。
Further, the method for producing a recording medium according to the present invention comprises:
At least a recording layer is formed on the glass substrate for a recording medium manufactured by the method for manufacturing a glass substrate for a recording medium of the present invention.

【0019】[0019]

【作用】本発明では、化学強化されたガラス基板であっ
て圧縮歪み層の深さが表面と裏面とで異なったガラス基
板を、再度化学強化することによって、圧縮歪み層の深
さが均等化され、ガラス基板の反りを是正できる。した
がって、基板の反りが少なく、平坦性に優れた記録媒体
用ガラス基板が得られる。
According to the present invention, the depth of the compression-strained layer is equalized by chemically strengthening again the glass substrate which is a chemically strengthened glass substrate in which the depth of the compression-strained layer is different between the front surface and the back surface. Thus, the warpage of the glass substrate can be corrected. Therefore, a glass substrate for a recording medium having less warpage of the substrate and excellent flatness can be obtained.

【0020】以下、本発明を詳細に説明する。Hereinafter, the present invention will be described in detail.

【0021】本発明では、化学強化によってガラス基板
の表面及び裏面に各々形成された歪み層の各々の深さの
差を、再化学強化することにより減少させることを特徴
とする。
The present invention is characterized in that the difference in the depth of each of the strained layers formed on the front and back surfaces of the glass substrate by chemical strengthening is reduced by re-chemical strengthening.

【0022】ここで、圧縮歪み層の深さが表面と裏面と
で異なったガラス基板の成因は特に制限させず、どのよ
うな原因で生じたものであってもよい。このようなガラ
ス基板は、通常、化学強化されたガラス基板を研磨する
ことで生じる。例えば、ガラス基板の主表面を研削、研
磨した後に化学強化し、その後に再研磨すると生じる。
また、薄膜の形成された化学強化されたガラス基板から
薄膜を剥離し、研磨してリサイクルすることでも生じ
る。
Here, the origin of the glass substrate in which the depth of the compressively strained layer is different between the front surface and the rear surface is not particularly limited, and may be caused by any cause. Such a glass substrate is usually generated by polishing a chemically strengthened glass substrate. For example, it occurs when the main surface of a glass substrate is ground and polished, then chemically strengthened, and then polished again.
It also occurs when the thin film is peeled from the chemically strengthened glass substrate on which the thin film is formed, polished and recycled.

【0023】最初の化学強化によって表裏面に生じる圧
縮歪み層の深さや、圧縮応力の値などは、特に制限され
ない。また、化学強化されたガラス基板のガラス組成も
特に制限されない。
The depth of the compression-strained layer formed on the front and back surfaces by the first chemical strengthening, the value of the compression stress, and the like are not particularly limited. Further, the glass composition of the chemically strengthened glass substrate is not particularly limited.

【0024】本発明では、再化学強化は、化学強化条件
(化学強化液、温度、時間など)を適宜選択、制御して
再度化学強化を行えばよい。再化学強化は、最初の化学
強化と、同一の条件であってもよく、異なる条件であっ
てもよい。
In the present invention, the chemical strengthening may be performed again by appropriately selecting and controlling the chemical strengthening conditions (chemical strengthening solution, temperature, time, etc.). The re-chemical strengthening may be under the same conditions as the first chemical strengthening or under different conditions.

【0025】表裏面の圧縮歪み層の深さの差と基板の反
りとは相関関係にあるので、表裏面の圧縮歪み層の深さ
の差はゼロか、あるいは、ゼロに近いことが好ましい。
これは、再化学強化後の表裏面の圧縮歪み層の深さの差
は、ゼロであることが基板の反りを最小限とするために
は好ましいが、表裏面の圧縮歪み層の深さの差がゼロに
近ければ基板の反りは実質的に小さいので実用上問題は
ないからである。
Since there is a correlation between the difference in the depth of the compression-strained layers on the front and back surfaces and the warpage of the substrate, the difference in the depths of the compression-strained layers on the front and back surfaces is preferably zero or close to zero.
This is because the difference in the depth of the compressive strain layers on the front and back surfaces after the re-chemical strengthening is preferably zero in order to minimize the warpage of the substrate. If the difference is close to zero, the warpage of the substrate is substantially small and there is no practical problem.

【0026】再化学強化後のガラス基板の反りは、3ミ
クロン以下であることが好ましく、1ミクロン以下であ
ることがさらに好ましい。
The warpage of the glass substrate after the re-chemical strengthening is preferably 3 μm or less, more preferably 1 μm or less.

【0027】本発明では、最初の化学強化及び再化学強
化における化学強化方法は、従来より公知の化学強化法
であれば特に制限されない。
In the present invention, the chemical strengthening method in the first chemical strengthening and re-chemical strengthening is not particularly limited as long as it is a conventionally known chemical strengthening method.

【0028】ガラス基板の化学強化は、例えば、加熱し
た化学強化溶液にガラス基板を浸漬し、ガラス基板表層
のイオンを化学強化溶液中のイオンでイオン交換して行
う。
The chemical strengthening of the glass substrate is performed, for example, by immersing the glass substrate in a heated chemical strengthening solution and ion-exchanging ions on the surface layer of the glass substrate with ions in the chemical strengthening solution.

【0029】ここで、イオン交換法としては、低温型イ
オン交換法、高温型イオン交換法、表面結晶化法、ガラ
ス表面の脱アルカリ法などが知られているが、ガラス転
移点の観点からガラス転移温度を超えない領域でイオン
交換を行う低温型イオン交換法を用いることが好まし
い。
Here, as the ion exchange method, a low-temperature type ion exchange method, a high-temperature type ion exchange method, a surface crystallization method, a dealkalization method of a glass surface, and the like are known. It is preferable to use a low-temperature ion exchange method in which ion exchange is performed in a region not exceeding a transition temperature.

【0030】低温型イオン交換法は、ガラスの転移温度
Tg以下の温度域で、ガラス中のアルカリイオンを、そ
れよりもイオン半径の大きいアルカリイオンと置換し、
イオン交換部の容積増加によってガラス表層に強い圧縮
応力を発生させてガラス表面を強化する方法である。
In the low-temperature ion exchange method, alkali ions in glass are replaced with alkali ions having a larger ionic radius in a temperature range not higher than the glass transition temperature Tg.
This is a method in which a strong compressive stress is generated in the glass surface layer by increasing the volume of the ion exchange section, thereby strengthening the glass surface.

【0031】化学強化溶液としては、硝酸カリウム(K
NO3)、硝酸ナトリウム(NaNO3)、炭酸カリウム
(K2CO3)などの溶融塩や、これらの塩を混合したも
の(KNO3+NaNO3、KNO3+K2CO3など)の
溶融塩、あるいは、これらの塩にCu、Ag、Rb、C
sなどのイオンの塩を混合したものの溶融塩等が挙げら
れる。なお、化学強化溶液は、溶融塩でなく上記塩の溶
液であってもよい。
As the chemical strengthening solution, potassium nitrate (K
Molten salts such as NO 3 ), sodium nitrate (NaNO 3 ) and potassium carbonate (K 2 CO 3 ), and molten salts of a mixture of these salts (KNO 3 + NaNO 3 , KNO 3 + K 2 CO 3 ); Alternatively, Cu, Ag, Rb, C
Examples thereof include a molten salt of a mixture of salts of ions such as s. Note that the chemical strengthening solution may be a solution of the above salt instead of the molten salt.

【0032】化学強化溶液の加熱温度は、280〜66
0℃、特に300〜400℃が好ましい。
The heating temperature of the chemical strengthening solution is 280-66.
0 ° C, particularly 300-400 ° C, is preferred.

【0033】浸漬時間は、数時間〜数十時間とすること
が好ましい。
The immersion time is preferably several hours to several tens of hours.

【0034】なお、ガラス基板を溶融塩に浸漬する前
に、ガラス基板を予熱しておくことが好ましい。
It is preferable that the glass substrate is preheated before immersing the glass substrate in the molten salt.

【0035】ガラス基板としては、化学強化可能なガラ
ス基板であれば特に制限されない。また、ガラス基板の
サイズ、厚さ等は特に制限されない。
The glass substrate is not particularly limited as long as it can be chemically strengthened. Further, the size, thickness, and the like of the glass substrate are not particularly limited.

【0036】なお、ガラス基板の厚さは、0.1〜20
mm程度が好ましく、0.635〜0.889mm程度
がさらに好ましい。
The thickness of the glass substrate is 0.1 to 20.
mm, and more preferably about 0.635 to 0.889 mm.

【0037】ガラス基板の材質としては、例えば、アル
ミノシリケートガラス、ソーダライムガラス、ソーダア
ルミノケイ酸ガラス、アルミノボロシリケートガラス、
ボロシリケートガラス、石英ガラス、チェーンシリケー
トガラス、又は、結晶化ガラス等のガラスセラミックな
どが挙げられる。なお、アルミノシリケートガラスは、
耐衝撃性や耐振動性に優れるため特に好ましい。
Examples of the material of the glass substrate include aluminosilicate glass, soda lime glass, sodaaluminosilicate glass, aluminoborosilicate glass,
Examples thereof include borosilicate glass, quartz glass, chain silicate glass, and glass ceramics such as crystallized glass. In addition, aluminosilicate glass is
It is particularly preferable because it has excellent impact resistance and vibration resistance.

【0038】アルミノシリケートガラスとしては、Si
2:62〜75重量%、Al23:5〜15重量%、
Li2O:4〜10重量%、Na2O:4〜12重量%、
ZrO2:5.5〜15重量%を主成分として含有する
とともに、Na2O/ZrO2の重量比が0.5〜2.
0、Al23/ZrO2の重量比が0.4〜2.5であ
る化学強化用ガラス等が好ましい。
As the aluminosilicate glass, Si
O 2 : 62 to 75% by weight, Al 2 O 3 : 5 to 15% by weight,
Li 2 O: 4 to 10% by weight, Na 2 O: 4 to 12% by weight,
ZrO 2: 5.5 to 15 with containing by weight% as the main component, the weight ratio of Na 2 O / ZrO 2 is 0.5 to 2.
0, Al 2 O 3 / weight ratio of ZrO 2 of glass for chemical strengthening is 0.4 to 2.5 is preferred.

【0039】また、ZrO2の未溶解物が原因で生じる
ガラス基板表面の突起をなくすためには、モル%表示
で、SiO2を57〜74%、ZnO2を0〜2.8%、
Al23を3〜15%、LiO2を7〜16%、Na2
を4〜14%含有する化学強化用ガラス等を使用するこ
とが好ましい。
In order to eliminate projections on the glass substrate surface caused by undissolved ZrO 2 , 57% to 74% of SiO 2 , 0% to 2.8% of ZnO 2 ,
The Al 2 O 3 3~15%, the LiO 2 7~16%, Na 2 O
It is preferable to use glass for chemical strengthening containing 4 to 14%.

【0040】このようなアルミノシリケートガラスは、
化学強化することによって、圧縮応力、引張応力、圧縮
応力層の深さの三者をバランス良く制御できるととも
に、抗折強度や、耐熱性に優れ、高温環境下であっても
Naの析出がないとともに平坦性を維持し、ヌープ硬度
にも優れる。
Such an aluminosilicate glass is
By chemically strengthening, the three factors of compressive stress, tensile stress, and depth of compressive stress layer can be controlled in a well-balanced manner, and the bending strength and heat resistance are excellent, and there is no precipitation of Na even in a high temperature environment. In addition, it maintains flatness and has excellent Knoop hardness.

【0041】化学強化されたガラス基板の研磨(再研磨
含む)方法は、特に制限されず、公知の研磨技術が利用
できる。
The method of polishing (including re-polishing) the chemically strengthened glass substrate is not particularly limited, and a known polishing technique can be used.

【0042】研磨方法としては、例えば、軟質ポリシ
ャ、硬質ポリシャ等の研磨パッド(研磨粉)による研
磨、研磨剤(砥粒など)による研磨、ブラシ研磨などの
機械研磨等が挙げられる。なお、これらの機械研磨は、
必要な表面粗さの鏡面を得るため、異なる種類の機械研
磨、あるいは、ポリシャの種類や粒径等を異とする機械
研磨等を適宜組み合わせて実施できる。
Examples of the polishing method include polishing with a polishing pad (polishing powder) such as a soft polisher and a hard polisher, polishing with an abrasive (abrasives and the like), and mechanical polishing such as brush polishing. In addition, these mechanical polishing,
In order to obtain a mirror surface having a required surface roughness, different types of mechanical polishing, or mechanical polishing using different types of polishers, different particle sizes, or the like can be appropriately combined.

【0043】ここで、軟質ポリシャとしては、例えば、
スウェード、ベロアを素材とするもの等が挙げられ、硬
質ポリシャとしては、例えば、硬質ベロア、ウレタン発
砲、ピッチ含浸スウェード等が挙げられる。また、研磨
剤として、酸化セリウム(CeO2)、アルミナ(γ−
Al23)、べんがら(Fe23)、酸化クロム(Cr
23)、酸化ジルコニウム(ZrO2)、酸化チタン
(TiO2)などが挙げられる。
Here, as the soft polisher, for example,
Suedes and velours are used as materials. Examples of the hard polisher include hard velours, urethane foam, and pitch impregnated suede. Cerium oxide (CeO 2 ), alumina (γ-
Al 2 O 3 ), bran (Fe 2 O 3 ), chromium oxide (Cr
2 O 3 ), zirconium oxide (ZrO 2 ), titanium oxide (TiO 2 ) and the like.

【0044】ガラス基板の主表面(記録層が形成される
面を指し、片面あるいは両面を指す)の研削、研磨工程
は、特に制限されず、公知の研削、研磨工程が利用でき
る。
The grinding and polishing steps of the main surface of the glass substrate (indicating the surface on which the recording layer is formed, indicating one or both sides) are not particularly limited, and known grinding and polishing steps can be used.

【0045】ガラス基板の研削、研磨の工程は、通常、
大きく分けて、(1)荒ずり(粗研削)、(2)砂掛け
(精研削、ラッピング)、(3)第一研磨(ポリッシ
ュ)、(4)第二研磨(ファイナル研磨、ポリッシュ)
の各工程からなる。
The steps of grinding and polishing a glass substrate are usually
It can be roughly divided into (1) rough grinding (rough grinding), (2) sanding (fine grinding, lapping), (3) first polishing (polishing), (4) second polishing (final polishing, polishing)
Of each process.

【0046】ガラス基板の表面粗さは、好ましくは、R
max:0.01〜2μm、Ra:0.001〜1μm
未満、さらに好ましくは、Rmax:0.01〜1μ
m、Ra:0.001〜0.8μm、より以上に好まし
くは、Rmax:0.01〜1μm、Ra:0.001
〜0.5μmである。
The surface roughness of the glass substrate is preferably R
max: 0.01 to 2 μm, Ra: 0.001 to 1 μm
Less, more preferably, Rmax: 0.01-1 μm
m, Ra: 0.001 to 0.8 μm, more preferably Rmax: 0.01 to 1 μm, Ra: 0.001
0.50.5 μm.

【0047】上述した本発明の記録媒体用ガラス基板
は、磁気記録媒体用ガラス基板の他、光磁気ディスク用
のガラス基板や、光ディスクなどの電子光学用ディスク
基板としても利用できる。
The above-described glass substrate for a recording medium of the present invention can be used as a glass substrate for a magneto-optical disk and a disk substrate for an electro-optical disk such as an optical disk, in addition to a glass substrate for a magnetic recording medium.

【0048】次に、本発明の記録媒体の製造方法につい
て説明する。
Next, a method for manufacturing the recording medium of the present invention will be described.

【0049】本発明の記録媒体の製造方法は、上述した
本発明方法によって得られた記録媒体用ガラス基板上
に、少なくとも記録層を形成することを特徴とする。
The method for producing a recording medium of the present invention is characterized in that at least a recording layer is formed on a glass substrate for a recording medium obtained by the above-mentioned method of the present invention.

【0050】本発明では、基板の反りが少なく、平坦性
に優れた記録媒体用ガラス基板を使用しているので、基
板の反りが少なく、平坦性に優れた記録媒体が得られ
る。
In the present invention, since a glass substrate for a recording medium having less warpage of the substrate and excellent flatness is used, a recording medium having less warpage of the substrate and excellent flatness can be obtained.

【0051】以下、磁気記録媒体を例に挙げて本発明の
記録媒体の製造方法について説明する。
Hereinafter, a method for manufacturing a recording medium according to the present invention will be described by taking a magnetic recording medium as an example.

【0052】磁気記録媒体は、通常、磁気ディスク用ガ
ラス基板上に、下地層、磁性層、保護層、潤滑層を順次
積層して製造する。本発明では、上述した本発明方法に
よって得られた記録媒体用ガラス基板を使用する。
The magnetic recording medium is usually manufactured by sequentially laminating an underlayer, a magnetic layer, a protective layer and a lubricating layer on a glass substrate for a magnetic disk. In the present invention, a glass substrate for a recording medium obtained by the above-described method of the present invention is used.

【0053】磁気記録媒体における下地層は、磁性層に
応じて選択される。
The underlayer in the magnetic recording medium is selected according to the magnetic layer.

【0054】下地層としては、例えば、Cr、Mo、T
a、Ti、W、V、B、Alなどの非磁性金属から選ば
れる少なくとも一種以上の材料からなる下地層等が挙げ
られる。Coを主成分とする磁性層の場合には、磁気特
性向上等の観点からCr単体やCr合金であることが好
ましい。また、下地層は単層とは限らず、同一又は異種
の層を積層した複数層構造とすることもできる。例え
ば、Cr/Cr、Cr/CrMo、Cr/CrV、Cr
V/CrV、Al/Cr/CrMo、Al/Cr/C
r、Al/Cr/CrV、Al/CrV/CrV等の多
層下地層等が挙げられる。
As the underlayer, for example, Cr, Mo, T
a, an underlayer made of at least one material selected from nonmagnetic metals such as Ti, W, V, B, and Al. In the case of a magnetic layer containing Co as a main component, it is preferable to use Cr alone or a Cr alloy from the viewpoint of improving magnetic properties. The underlayer is not limited to a single layer, and may have a multilayer structure in which the same or different layers are stacked. For example, Cr / Cr, Cr / CrMo, Cr / CrV, Cr
V / CrV, Al / Cr / CrMo, Al / Cr / C
r, a multilayer base layer of Al / Cr / CrV, Al / CrV / CrV and the like.

【0055】磁気記録媒体における磁性層の材料は特に
制限されない。
The material of the magnetic layer in the magnetic recording medium is not particularly limited.

【0056】磁性層としては、例えば、Coを主成分と
するCoPt、CoCr、CoNi、CoNiCr、C
oCrTa、CoPtCr、CoNiPtや、CoNi
CrPt、CoNiCrTa、CoCrTaPt、Co
CrPtSiOなどの磁性薄膜が挙げられる。磁性層
は、磁性膜を非磁性膜(例えば、Cr、CrMo、Cr
Vなど)で分割してノイズの低減を図った多層構成(例
えば、CoPtCr/CrMo/CoPtCr、CoC
rTaPt/CrMo/CoCrTaPtなど)として
もよい。
As the magnetic layer, for example, CoPt, CoCr, CoNi, CoNiCr, C
oCrTa, CoPtCr, CoNiPt, CoNi
CrPt, CoNiCrTa, CoCrTaPt, Co
A magnetic thin film such as CrPtSiO may be used. The magnetic layer is made of a non-magnetic film (for example, Cr, CrMo, Cr).
V, etc. to reduce noise (for example, CoPtCr / CrMo / CoPtCr, CoC
rTaPt / CrMo / CoCrTaPt).

【0057】磁気抵抗型ヘッド(MRヘッド)又は大型
磁気抵抗型ヘッド(GMRヘッド)対応の磁性層として
は、Co系合金に、Y、Si、希土類元素、Hf、G
e、Sn、Znから選択される不純物元素、又はこれら
の不純物元素の酸化物を含有させたものなども含まれ
る。
As a magnetic layer corresponding to a magnetoresistive head (MR head) or a large magnetoresistive head (GMR head), Y, Si, rare earth elements, Hf, G
An impurity element selected from e, Sn, and Zn, or an element containing an oxide of these impurity elements is also included.

【0058】また、磁性層としては、上記の他、フェラ
イト系、鉄−希土類系や、SiO2、BNなどからなる
非磁性膜中にFe、Co、FeCo、CoNiPt等の
磁性粒子が分散された構造のグラニュラーなどであって
もよい。また、磁性層は、内面型、垂直型のいずれの記
録形式であってもよい。
As the magnetic layer, in addition to the above, magnetic particles such as Fe, Co, FeCo, and CoNiPt are dispersed in a non-magnetic film made of ferrite, iron-rare earth, SiO 2 , BN, or the like. It may be a granular structure or the like. Further, the magnetic layer may have any of an inner surface type and a perpendicular type recording format.

【0059】磁気記録媒体における保護層は特に制限さ
れない。
The protective layer in the magnetic recording medium is not particularly limited.

【0060】保護層としては、例えば、Cr膜、Cr合
金膜、カーボン膜、ジルコニア膜、シリカ膜等が挙げら
れる。これらの保護膜は、下地層、磁性層等とともにイ
ンライン型スパッタ装置で連続して形成できる。また、
これらの保護膜は、単層としてもよく、あるいは、同一
又は異種の膜からなる多層構成としてもよい。
Examples of the protective layer include a Cr film, a Cr alloy film, a carbon film, a zirconia film, and a silica film. These protective films can be continuously formed with an underlayer, a magnetic layer, and the like by an in-line type sputtering apparatus. Also,
These protective films may have a single-layer structure or a multilayer structure composed of the same or different films.

【0061】本発明では、上記保護層上に、あるいは上
記保護層に替えて、他の保護層を形成してもよい。例え
ば、上記保護層に替えて、Cr膜の上にテトラアルコキ
シランをアルコール系の溶媒で希釈した中に、コロイダ
ルシリカ微粒子を分散して塗布し、さらに焼成して酸化
ケイ素(SiO2)膜を形成してもよい。
In the present invention, another protective layer may be formed on the above protective layer or in place of the above protective layer. For example, instead of the above-mentioned protective layer, colloidal silica fine particles are dispersed and applied to a Cr film after diluting tetraalkoxylan with an alcohol-based solvent, and then fired to form a silicon oxide (SiO 2 ) film. It may be formed.

【0062】磁気記録媒体における潤滑層は特に制限さ
れない。
The lubricating layer in the magnetic recording medium is not particularly limited.

【0063】潤滑層は、例えば、液体潤滑剤であるパー
フロロポリエーテル(PFPE)をフレオン系などの溶
媒で希釈し、媒体表面にディッピング法、スピンコート
法、スプレイ法によって塗布し、必要に応じ加熱処理を
行って形成する。
The lubricating layer is prepared, for example, by diluting perfluoropolyether (PFPE), which is a liquid lubricant, with a solvent such as Freon, and applying the diluted solution to the medium surface by dipping, spin coating, or spraying. It is formed by performing heat treatment.

【0064】[0064]

【実施例】以下、実施例にもとづき本発明をさらに具体
的に説明する。
EXAMPLES The present invention will be described below more specifically based on examples.

【0065】実施例1 Embodiment 1

【0066】ガラス基板の製造 表裏面に100ミクロンの深さで強度20kg/mm2
の圧縮歪み層を有し、内部に3kg/mm2の引張応力
を有する厚さ0.6mm、外径65mmφの化学強化さ
れたガラス基板を作製した。
Production of Glass Substrate On the front and back surfaces, a strength of 20 kg / mm 2 at a depth of 100 μm
, A chemically strengthened glass substrate having a thickness of 0.6 mm and an outer diameter of 65 mmφ having a tensile stress of 3 kg / mm 2 inside was prepared.

【0067】なお、ガラス基板としては、モル%表示
で、SiO2を57〜74%、ZnO2を0〜2.8%、
Al23を3〜15%、LiO2を7〜16%、Na2
を4〜14%、を主成分として含有するアルミノシリケ
イトガラスからなる化学強化用ガラス(例えば、モル%
表示で、SiO2:67.0%、ZnO2:1.0%、A
23:9.0%、LiO2:12.0%、Na2O:1
0.0%を主成分として含有する化学強化用ガラス)を
使用した。また、化学強化は、硝酸カリウム(60%)
と硝酸ナトリウム(40%)を混合した化学強化溶液を
用意し、この化学強化溶液を400℃に加熱し、300
℃に予熱された洗浄済みのガラス基板を約4時間浸漬し
て行った。
As a glass substrate, in terms of mol%, SiO 2 is 57 to 74%, ZnO 2 is 0 to 2.8%,
The Al 2 O 3 3~15%, the LiO 2 7~16%, Na 2 O
For chemical strengthening comprising an aluminosilicate glass containing 4 to 14% as a main component (for example, mol%
As shown, SiO 2 : 67.0%, ZnO 2 : 1.0%, A
l 2 O 3 : 9.0%, LiO 2 : 12.0%, Na 2 O: 1
Glass for chemical strengthening containing 0.0% as a main component) was used. Chemical strengthening is performed by potassium nitrate (60%)
And a nitric acid solution (40%) were prepared, and the chemically strengthened solution was heated to 400 ° C.
The cleaning was performed by immersing the cleaned glass substrate preheated to a temperature of about 4 hours.

【0068】次いで、薄膜を形成する表面の平坦性を向
上させるため、上記で作製したガラス基板の両主表面を
1〜2ミクロン研磨した。このときの平坦性は4ミクロ
ンに悪化した。
Next, in order to improve the flatness of the surface on which the thin film is formed, both main surfaces of the glass substrate prepared above were polished by 1 to 2 μm. At this time, the flatness deteriorated to 4 microns.

【0069】次に、上記研磨後のガラス基板を、化学強
化処理液に約2時間(最初の化学強化処理の約半分の処
理時間)浸漬した。この再化学強化処理によって、平坦
性は1ミクロンに改善され、化学強化されたガラス基板
に研磨を施す前の状態に修復されたことが確認された。
Next, the polished glass substrate was immersed in a chemical strengthening treatment solution for about 2 hours (about half the processing time of the first chemical strengthening treatment). It was confirmed that the flatness was improved to 1 micron by the re-chemical strengthening treatment, and the chemically strengthened glass substrate was restored to a state before polishing.

【0070】磁気ディスクの製造 上述した工程を経て得られた磁気ディスク用ガラス基板
の両面に、インライン式のスパッタリング装置を用い
て、AlNのスパッタによるテクスチャー層、Cr下地
層、CrMo下地層、CoPtCrTa磁性層、C保護
層を順次成膜して磁気ディスクを得た。
Manufacture of Magnetic Disk A texture layer, a Cr underlayer, a CrMo underlayer, and a CoPtCrTa magnetic layer were formed on both surfaces of a glass substrate for a magnetic disk obtained through the above-described steps by using an in-line sputtering apparatus. A layer and a C protective layer were sequentially formed to obtain a magnetic disk.

【0071】得られた磁気ディスクの平坦性は1ミクロ
ンであった。
The flatness of the obtained magnetic disk was 1 μm.

【0072】また、得られた磁気ディスクについてグラ
イドテストを実施したところ、ヒット(ヘッドが磁気デ
ィスク表面の突起にかすること)やクラッシュ(ヘッド
が磁気ディスク表面の突起に衝突すること)は認められ
なかった。
When a glide test was performed on the obtained magnetic disk, a hit (the head touches a protrusion on the surface of the magnetic disk) and a crash (the head collides with a protrusion on the surface of the magnetic disk) were recognized. Did not.

【0073】実施例2 ガラス基板の製造 表裏面に100ミクロンの深さで強度20kg/mm2
の圧縮歪み層を有し、内部に3kg/mm2の引張応力
を有する厚さ0.6mm、外径65mmφの化学強化さ
れたガラス基板を25枚作製した。
Example 2 Production of Glass Substrate On the front and back surfaces, a strength of 20 kg / mm 2 at a depth of 100 μm
And a chemically strengthened glass substrate having a thickness of 0.6 mm and an outer diameter of 65 mm having a tensile strain of 3 kg / mm 2 inside was prepared.

【0074】なお、ガラス基板としては、モル%表示
で、SiO2を57〜74%、ZnO2を0〜2.8%、
Al23を3〜15%、LiO2を7〜16%、Na2
を4〜14%、を主成分として含有するアルミノシリケ
イトガラスからなる化学強化用ガラス(例えば、モル%
表示で、SiO2:67.0%、ZnO2:1.0%、A
23:9.0%、LiO2:12.0%、Na2O:1
0.0%を主成分として含有する化学強化用ガラス)を
使用した。また、化学強化は、硝酸カリウム(60%)
と硝酸ナトリウム(40%)を混合した化学強化溶液を
用意し、この化学強化溶液を400℃に加熱し、300
℃に予熱された洗浄済みのガラス基板を浸漬して行っ
た。
As the glass substrate, in terms of mol%, SiO 2 is 57 to 74%, ZnO 2 is 0 to 2.8%,
The Al 2 O 3 3~15%, the LiO 2 7~16%, Na 2 O
For chemical strengthening comprising an aluminosilicate glass containing 4 to 14% as a main component (for example, mol%
As shown, SiO 2 : 67.0%, ZnO 2 : 1.0%, A
l 2 O 3 : 9.0%, LiO 2 : 12.0%, Na 2 O: 1
Glass for chemical strengthening containing 0.0% as a main component) was used. Chemical strengthening is performed by potassium nitrate (60%)
And a nitric acid solution (40%) were prepared, and the chemically strengthened solution was heated to 400 ° C.
The cleaning was performed by immersing a washed glass substrate that had been preheated to ° C.

【0075】磁気ディスクの製造 上述した工程を経て得られた磁気ディスク用ガラス基板
の両面に、インライン式のスパッタリング装置を用い
て、AlNのスパッタによるテクスチャー層、Cr下地
層、CrMo下地層、CoPtCrTa磁性層、C保護
層を順次成膜して磁気ディスクを得た。
Manufacture of Magnetic Disk A texture layer, a Cr underlayer, a CrMo underlayer, and a CoPtCrTa magnetic layer were formed on both surfaces of a glass substrate for a magnetic disk obtained through the above-described steps by using an in-line type sputtering apparatus. A layer and a C protective layer were sequentially formed to obtain a magnetic disk.

【0076】上記で得た磁気ディスクからエッチングに
より薄膜を除去してガラス基板に戻し、このガラス基板
の両主表面を2〜3ミクロン研磨した。このときの平坦
性は平均値で5.38ミクロンに悪化した。
The thin film was removed from the magnetic disk obtained above by etching and returned to the glass substrate, and both main surfaces of the glass substrate were polished by 2 to 3 μm. The flatness at this time deteriorated to 5.38 microns on average.

【0077】次に、上記研磨後のガラス基板を、化学強
化処理液に約4時間浸漬した。この再化学強化処理によ
って、平坦性は平均値で3.21ミクロンに改善され、
化学強化されたガラス基板に研磨を施す前の状態に修復
されたことが確認された。
Next, the polished glass substrate was immersed in a chemical strengthening treatment solution for about 4 hours. By this re-chemical strengthening treatment, the flatness is improved to 3.21 microns on average,
It was confirmed that the glass substrate that had been chemically strengthened was restored to a state before polishing.

【0078】磁気ディスクの製造 上述した工程を経て得られた磁気ディスク用ガラス基板
の両面に、インライン式のスパッタリング装置を用い
て、AlNのスパッタによるテクスチャー層、Cr下地
層、CrMo下地層、CoPtCrTa磁性層、C保護
層を順次成膜して磁気ディスクを得た。
Manufacture of Magnetic Disk A texture layer, a Cr underlayer, a CrMo underlayer, and a CoPtCrTa magnetic layer were formed on both sides of a glass substrate for a magnetic disk obtained through the above-described steps by using an in-line type sputtering apparatus. A layer and a C protective layer were sequentially formed to obtain a magnetic disk.

【0079】得られた磁気ディスクの平坦性は平均値で
約3ミクロンであった。
The flatness of the obtained magnetic disk was about 3 μm on average.

【0080】また、得られた磁気ディスクについてグラ
イドテストを実施したところ、ヒット(ヘッドが磁気デ
ィスク表面の突起にかすること)やクラッシュ(ヘッド
が磁気ディスク表面の突起に衝突すること)は認められ
なかった。
When a glide test was performed on the obtained magnetic disk, a hit (the head touches a protrusion on the surface of the magnetic disk) and a crash (the head hits a protrusion on the surface of the magnetic disk) were recognized. Did not.

【0081】実施例3〜4 アルミノシリケートガラスの代わりにソーダライムガラ
ス(実施例3)、ソーダアルミノケイ酸ガラス(実施例
4)を用いたこと以外は実施例1と同様にして、磁気デ
ィスク用ガラス基板及び磁気ディスクを得た。
Examples 3-4 Glass for magnetic disks was prepared in the same manner as in Example 1 except that soda lime glass (Example 3) and soda aluminosilicate glass (Example 4) were used instead of aluminosilicate glass. A substrate and a magnetic disk were obtained.

【0082】得られた磁気ディスクについて実施例1と
同様の試験を行った結果、実施例1と同様の効果が確認
された。
The same test as in Example 1 was performed on the obtained magnetic disk, and the same effect as in Example 1 was confirmed.

【0083】実施例5 実施例1で得られた磁気ディスク用ガラス基板の両面
に、Al(膜厚50オングストローム)/Cr(100
0オングストローム)/CrMo(100オングストロ
ーム)からなる下地層、CoPtCr(120オングス
トローム)/CrMo(50オングストローム)/Co
PtCr(120オングストローム)からなる磁性層、
Cr(50オングストローム)保護層をインライン型ス
パッタ装置で形成した。
Example 5 On both sides of the glass substrate for a magnetic disk obtained in Example 1, Al (film thickness 50 Å) / Cr (100
0 Å / CrMo (100 Å), CoPtCr (120 Å) / CrMo (50 Å) / Co
A magnetic layer made of PtCr (120 Å),
A Cr (50 Å) protective layer was formed by an in-line type sputtering apparatus.

【0084】上記基板を、シリカ微粒子(粒経100オ
ングストローム)を分散した有機ケイ素化合物溶液(水
とIPAとテトラエトキシシランとの混合液)に浸し、
焼成することによってSiO2からなるテクスチャー機
能を持った保護層を形成し、さらに、この保護層上をパ
ーフロロポリエーテルからなる潤滑剤でディップ処理し
て潤滑層を形成して、MRヘッド用磁気ディスクを得
た。
The above substrate is immersed in an organic silicon compound solution (a mixed solution of water, IPA and tetraethoxysilane) in which fine silica particles (particle size: 100 Å) are dispersed,
A protective layer having a texture function made of SiO 2 is formed by firing, and a dip treatment is performed on the protective layer with a lubricant made of perfluoropolyether to form a lubricating layer. Got a disc.

【0085】得られた磁気ディスクについて実施例1と
同様の試験を行った結果、実施例1と同様の効果が確認
された。
As a result of performing the same test as in Example 1 on the obtained magnetic disk, the same effect as in Example 1 was confirmed.

【0086】実施例6 下地層をAl/Cr/Crとし、磁性層をCoNiCr
Taとしたこと以外は実施例5と同様にして薄膜ヘッド
用磁気ディスクを得た。
Example 6 The underlayer was made of Al / Cr / Cr, and the magnetic layer was made of CoNiCr.
A magnetic disk for a thin film head was obtained in the same manner as in Example 5 except that Ta was used.

【0087】上記磁気ディスクについて実施例5と同様
のことが確認された。
The same thing as Example 5 was confirmed for the above magnetic disk.

【0088】以上好ましい実施例を挙げて本発明を説明
したが、本発明は必ずしも上記実施例に限定されるもの
ではない。
Although the present invention has been described with reference to the preferred embodiments, the present invention is not necessarily limited to the above embodiments.

【0089】例えば、ガラス基板の種類や磁性層等の記
録層の種類は実施例のものに限定されない。
For example, the type of the glass substrate and the type of the recording layer such as the magnetic layer are not limited to those of the embodiment.

【0090】[0090]

【発明の効果】以上説明したように本発明では、化学強
化されたガラス基板であって圧縮歪み層の深さが表面と
裏面とで異なったガラス基板を、再度化学強化している
ので、圧縮歪み層の深さが均等化され、ガラス基板の反
りを是正できる。したがって、基板の反りが少なく、平
坦性に優れた記録媒体用ガラス基板及び記録媒体が得ら
れる。
As described above, according to the present invention, a glass substrate which is chemically strengthened and whose compression strain layer has a different depth between the front surface and the back surface is chemically strengthened again. The depth of the strained layer is equalized, and the warpage of the glass substrate can be corrected. Therefore, a glass substrate for a recording medium and a recording medium which are less warped and excellent in flatness can be obtained.

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 化学強化された記録媒体用ガラス基板の
製造方法において、 化学強化によってガラス基板の表面及び裏面に各々形成
された圧縮歪み層の各々の深さの差を、再化学強化する
ことにより減少させることを特徴とする記録媒体用ガラ
ス基板の製造方法。
1. A method for manufacturing a chemically strengthened glass substrate for a recording medium, wherein the difference in depth between the compression-strained layers formed on the front and back surfaces of the glass substrate by chemical strengthening is re-chemically strengthened. A method for producing a glass substrate for a recording medium, characterized in that the method comprises:
【請求項2】 ガラス基板の主表面を研削、研磨した後
に化学強化し、その後に再研磨し、次いで、化学強化に
よってガラス基板の表面及び裏面に各々形成された圧縮
歪み層の各々の深さの差を、再化学強化することにより
減少させることを特徴とする記録媒体用ガラス基板の製
造方法。
2. The main surface of the glass substrate is ground and polished, then chemically strengthened, polished again, and then the depth of each of the compressively strained layers respectively formed on the front and back surfaces of the glass substrate by chemical strengthening. Characterized in that the difference between the two is reduced by re-chemical strengthening.
【請求項3】 薄膜の形成された化学強化されたガラス
基板から薄膜を剥離し、研磨した後に、化学強化によっ
てガラス基板の表面及び裏面に各々形成された圧縮歪み
層の各々の深さの差を、再化学強化することにより減少
させることを特徴とする記録媒体用ガラス基板の製造方
法。
3. The thickness difference between the compression-strained layers formed on the front and back surfaces of the glass substrate by chemical strengthening after peeling and polishing the thin film from the chemically strengthened glass substrate on which the thin film is formed. Is reduced by re-chemical strengthening, thereby producing a glass substrate for a recording medium.
【請求項4】 ガラス基板の反りが、5ミクロン以下で
あることを特徴とする請求項1乃至3記載の記録媒体用
ガラス基板。
4. The glass substrate for a recording medium according to claim 1, wherein the warpage of the glass substrate is 5 μm or less.
【請求項5】 請求項1乃至4記載の記録媒体用ガラス
基板上に、少なくとも記録層を形成することを特徴とす
る記録媒体の製造方法。
5. A method for manufacturing a recording medium, comprising: forming at least a recording layer on the glass substrate for a recording medium according to claim 1.
JP8359151A 1996-12-29 1996-12-29 Glass substrate for recording medium and method for producing recording medium Expired - Fee Related JP2998952B2 (en)

Priority Applications (1)

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Application Number Priority Date Filing Date Title
JP8359151A JP2998952B2 (en) 1996-12-29 1996-12-29 Glass substrate for recording medium and method for producing recording medium

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Publication Number Publication Date
JPH10194787A true JPH10194787A (en) 1998-07-28
JP2998952B2 JP2998952B2 (en) 2000-01-17

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007164901A (en) * 2005-12-14 2007-06-28 Konica Minolta Opto Inc Glass substrate for magnetic recording medium and method of manufacturing glass substrate for magnetic recording medium
WO2010001844A1 (en) * 2008-06-30 2010-01-07 Hoya株式会社 Magnetic disc substrate, method for manufacturing the same, and magnetic disc
JP2010116276A (en) * 2008-11-11 2010-05-27 Nippon Electric Glass Co Ltd Tempered glass substrate and producing method of the same
WO2012005307A1 (en) * 2010-07-06 2012-01-12 旭硝子株式会社 Method for increasing strength of glass substrate
CN113233788A (en) * 2021-06-30 2021-08-10 重庆鑫景特种玻璃有限公司 Method for recycling tempered glass

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007164901A (en) * 2005-12-14 2007-06-28 Konica Minolta Opto Inc Glass substrate for magnetic recording medium and method of manufacturing glass substrate for magnetic recording medium
WO2010001844A1 (en) * 2008-06-30 2010-01-07 Hoya株式会社 Magnetic disc substrate, method for manufacturing the same, and magnetic disc
US8728638B2 (en) 2008-06-30 2014-05-20 Hoya Corporation Magnetic disk substrate, method for manufacturing the same, and magnetic disk
JP5593224B2 (en) * 2008-06-30 2014-09-17 Hoya株式会社 Magnetic disk substrate, manufacturing method thereof, and magnetic disk
JP2010116276A (en) * 2008-11-11 2010-05-27 Nippon Electric Glass Co Ltd Tempered glass substrate and producing method of the same
WO2012005307A1 (en) * 2010-07-06 2012-01-12 旭硝子株式会社 Method for increasing strength of glass substrate
CN113233788A (en) * 2021-06-30 2021-08-10 重庆鑫景特种玻璃有限公司 Method for recycling tempered glass

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