JPH1016242A - Production of ink jet recorder - Google Patents

Production of ink jet recorder

Info

Publication number
JPH1016242A
JPH1016242A JP16907396A JP16907396A JPH1016242A JP H1016242 A JPH1016242 A JP H1016242A JP 16907396 A JP16907396 A JP 16907396A JP 16907396 A JP16907396 A JP 16907396A JP H1016242 A JPH1016242 A JP H1016242A
Authority
JP
Japan
Prior art keywords
ink
thin film
metal membrane
heating resistor
connection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16907396A
Other languages
Japanese (ja)
Other versions
JP3705652B2 (en
Inventor
Masao Mitani
正男 三谷
Kenji Yamada
健二 山田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koki Holdings Co Ltd
Original Assignee
Hitachi Koki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Koki Co Ltd filed Critical Hitachi Koki Co Ltd
Priority to JP16907396A priority Critical patent/JP3705652B2/en
Priority to US08/761,900 priority patent/US5790154A/en
Publication of JPH1016242A publication Critical patent/JPH1016242A/en
Application granted granted Critical
Publication of JP3705652B2 publication Critical patent/JP3705652B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a recorder of a system preventing the surface oxidation of an Ni metal membrane electrode, drastically enhancing the yield of electrical connection work, also enhanceing the reliability of connection and flying ink liquid droplets to a recording medium by utilizing heat energy. SOLUTION: In the production of an ink jet recorder supplying a pulse current to a heating resistor consisting of a TaSi-O ternary alloy membrane resistor and an Ni metal membrane conductor provided in the vicinity of an ink emitting orifice to rapidly evaporate a part of the ink in an ink liquid passage and emitting liquid droplet like ink from the emitting orifice by the expansion force of the formed air bubble to perform recording, before the thermal oxidation treatment of the heating resistor, the surface of at least an Ni metal membrane electrode for connection among an Ni metal membrane conductor and the Ni metal membrane electrode for the connection with the external circuit connected thereto is preliminarily subjected to gold plating treatment.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、熱エネルギを利用
してインク液滴を記録媒体に向けて飛翔させる形式の記
録装置の製造方法に関するものである。
[0001] 1. Field of the Invention [0002] The present invention relates to a method of manufacturing a recording apparatus of the type in which ink droplets fly toward a recording medium using thermal energy.

【0002】[0002]

【従来の技術】パルス加熱によってインクの一部を急速
に気化させ、その膨張力によってインク液滴をオリフィ
スから吐出させる方式のインクジェット記録装置は特開
昭48-9622号公報、特開昭54-51837号公報等によって開
示されている。
2. Description of the Related Art An ink jet recording apparatus in which a part of ink is rapidly vaporized by pulse heating and ink droplets are ejected from an orifice by the expansion force is disclosed in JP-A-48-9622 and JP-A-54-1982. No. 51837 discloses this.

【0003】このパルス加熱の最も簡便な方法は薄膜ヒ
−タにパルス通電することであり、その具体的な方法が
日経メカニカル1992年12月28日号58ページ、及びHewlet
t-Packard-Journal,Aug.1988で発表されている。これら
従来の薄膜ヒ−タの共通する基本的構成は、薄膜抵抗体
と薄膜導体を厚さ約3μmの酸化防止層で被覆し、該酸
化防止層のキャビテーション破壊を防ぐ目的で、この上
に厚さ約0.5μmのTa金属層を被覆するというもの
であった。
The simplest method of this pulse heating is to apply a pulse current to a thin film heater. The specific method is described in Nikkei Mechanical, December 28, 1992, p. 58, and in Hewlet.
Published in t-Packard-Journal, Aug. 1988. The basic structure common to these conventional thin film heaters is that a thin film resistor and a thin film conductor are covered with an antioxidant layer having a thickness of about 3 μm, and a thin film is formed thereon for the purpose of preventing cavitation damage of the antioxidant layer. It was intended to cover a Ta metal layer having a thickness of about 0.5 μm.

【0004】しかし、このように厚い多層保護層を介し
てインクをパルス加熱するため、インクの吐出に必要な
投入エネルギは15〜30μJ/パルスにも達し、その
殆んどのエネルギは基板(ヘッド)の昇温に消費される
という大きな欠点があった。
However, since the ink is pulse-heated through such a thick multilayer protective layer, the input energy required for discharging the ink reaches 15 to 30 μJ / pulse, and most of the energy is applied to the substrate (head). However, there is a major drawback that it is consumed for raising the temperature.

【0005】これを抜本的に改善する目的で、本発明者
はTa−Si−O三元合金薄膜抵抗体を開発し、これを
熱酸化することでその表面に約100Åという厚さの電
気絶縁性と機械的強度に優れた自己酸化被膜を形成する
方法を発明した(特願平07-43968号、および特願平07-3
40486号参照)。これによって、インクの吐出に必要な
エネルギは2.4〜2.7μJ/パルスにまで低減さ
れ、しかも安定な吐出に最適な加熱速度範囲(1×10
8〜5×108℃/s)をこのヒータによって容易に実現
できるようになった(本発明者の特願平07-285650号参
照)。
In order to drastically improve this, the present inventor has developed a Ta-Si-O ternary alloy thin film resistor, and thermally oxidizes the Ta-Si-O ternary alloy thin film resistor to form an electric insulating layer having a thickness of about 100 ° on its surface. Invented a method of forming a self-oxidized film having excellent properties and mechanical strength (Japanese Patent Application Nos. 07-43968 and 07-3).
No. 40486). As a result, the energy required for ink ejection is reduced to 2.4 to 2.7 μJ / pulse, and the optimal heating speed range (1 × 10
The 8 ~5 × 10 8 ℃ / s ) can now be easily realized by the heater (see Japanese Patent Application No. 07-285650 by the present inventors).

【0006】一方、自己酸化膜を持つTa−Si−O三
元合金薄膜抵抗体を有効に利用するためには、インク中
でも腐食しない通電電極用の薄膜金属材料が不可欠であ
り、本発明者は最適材料としてNiを選択してきた(特
開平06-71888号公報等参照)。
On the other hand, in order to effectively use a Ta—Si—O ternary alloy thin film resistor having a self-oxidizing film, a thin film metal material for a current-carrying electrode that does not corrode even in ink is indispensable. Ni has been selected as the optimum material (see Japanese Patent Application Laid-Open No. 06-71888).

【0007】しかし、インク中で優れた耐蝕性を示す薄
膜Ni導体でも、正極側の薄膜Ni導体は電蝕され易
く、長時間の使用には問題のあることが分かった。これ
に対しては、無機絶縁物層と有機絶縁物層を効果的に利
用することによって長時間の使用に耐えるヒ−タを実現
することができた(特願平07-43968号、及び特願平08-1
22091号参照)。
However, even with a thin film Ni conductor showing excellent corrosion resistance in the ink, it has been found that the thin film Ni conductor on the positive electrode side is easily corroded and has a problem in long-term use. On the other hand, by effectively utilizing the inorganic insulating layer and the organic insulating layer, a heater that can be used for a long time could be realized (Japanese Patent Application No. 07-43968, and 08-1 Ganpei
22091).

【0008】[0008]

【発明が解決しようとする課題】上述したような優れた
特性を有するTa−Si−O三元合金薄膜抵抗体を用い
たインクジェットヘッドを製造する方法として、既に本
発明者は図3に示す製造プロセスを適用している(特願
平07-135185号、特願平07-320446号参照)。
As a method of manufacturing an ink jet head using a Ta-Si-O ternary alloy thin film resistor having the above-mentioned excellent characteristics, the present inventor has already shown the manufacturing method shown in FIG. The process is applied (see Japanese Patent Application Nos. 07-135185 and 07-320446).

【0009】図3のプロセスでは、Ta−Si−O三元
合金薄膜抵抗体を熱酸化(11)することによって、耐キャ
ビテ−ション性に優れた極薄自己酸化絶縁被膜をその表
面に形成することができる。この際、熱酸化には350
℃以上の加熱が必要であるが、Ni金属薄膜導体の表面
も同時に熱酸化され、更にこの延長上に在る外部回路と
の接続用Ni金属薄膜電極の表面も絶縁化されてしま
う。このため、外部回路と電気的に接続するためには、
この絶縁被膜をドライエッチング等によって除去するこ
とが必要であった。
In the process shown in FIG. 3, an ultra-thin self-oxidizing insulating film having excellent cavitation resistance is formed on the surface of the Ta-Si-O ternary alloy thin film resistor by thermal oxidation (11). be able to. At this time, 350 to thermal oxidation
Although heating at a temperature of at least ° C. is required, the surface of the Ni metal thin film conductor is also thermally oxidized at the same time, and the surface of the Ni metal thin film electrode for connection to an external circuit on this extension is also insulated. Therefore, in order to electrically connect to an external circuit,
It was necessary to remove this insulating film by dry etching or the like.

【0010】本発明の課題は、Ni金属薄膜電極の表面
酸化を防止すると共に、電気的接続作業の歩留りを飛躍
的に向上させ、接続の信頼性をも向上させることにあ
る。
It is an object of the present invention to prevent oxidation of the surface of a Ni metal thin film electrode, dramatically improve the yield of electrical connection work, and improve the reliability of connection.

【0011】[0011]

【発明が解決するための手段】上記課題は、インク吐出
口近傍に設けられたTa−Si−O三元合金薄膜抵抗体
とNi金属薄膜導体からなる発熱抵抗体にパルス通電す
ることによってインク液路中のインクの一部を急速に気
化させ、この気泡の膨張力によって前記吐出口から液滴
状インクを吐出させて記録するインクジェット記録装置
の製造方法において、前記発熱抵抗体を熱酸化処理する
前に、前記Ni金属薄膜導体とこれにつながる外部回路
との接続用Ni金属薄膜電極のうち、少なくとも前記接
続用Ni金属薄膜電極の表面を金めっき処理しておくこ
とによって達成される。
SUMMARY OF THE INVENTION The object of the present invention is to provide an ink liquid by applying a pulse current to a heating resistor composed of a Ta-Si-O ternary alloy thin-film resistor and a Ni metal thin-film conductor provided in the vicinity of an ink discharge port. In a method of manufacturing an ink jet recording apparatus in which a part of ink in a path is rapidly vaporized and droplet ink is ejected from the ejection port by the expansion force of the bubble to perform recording, the heating resistor is subjected to thermal oxidation treatment. This is achieved by performing gold plating on at least the surface of the Ni metal thin film electrode for connection among the Ni metal thin film electrodes for connection between the Ni metal thin film conductor and an external circuit connected thereto.

【0012】[0012]

【発明の実施の形態】以下、本発明の発熱抵抗体につい
て、その実施例を図面を用いて説明する。
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a perspective view of a heating resistor according to the present invention.

【0013】なお、インクジェットプリントヘッドの構
造とか製造方法の詳細については省略するが、本願が対
象とする発熱抵抗体はトップシュ−タタイプ、サイドシ
ュ−タタイプの如何にかかわらず、いわゆるサ−マルイ
ンクジェットプリントヘッドに共通するもので、両タイ
プに適用可能なものである。
Although the details of the structure and the manufacturing method of the ink jet print head will be omitted, the heating resistor to which the present invention is applied is a so-called thermal ink jet print regardless of whether it is a top heater type or a side heater type. It is common to heads and is applicable to both types.

【0014】先ず、Si基板1の表面に約2μm厚さの
SiO2断熱層2を形成する。このSiO2断熱層2は、
Si基板1を熱酸化させて形成しても良いし、図1
(a)に示すように、同一Si基板1上にドライバ回路
14を形成する時に形成される多層構造のSiO2層2
を利用してもよい。また、後者の場合は、このSiO2
層2の上にプラズマCVD法によって約1μm厚さのS
i窒化膜がパッシベ−ション膜として形成されているの
が一般的であるが、このSiO2/Si342層膜を断
熱層2として利用してもよいことは本発明者の特許出願
発明(特願平07-320446号)に記した通りである。
First, an SiO 2 heat insulating layer 2 having a thickness of about 2 μm is formed on the surface of a Si substrate 1. This SiO 2 heat insulating layer 2
The Si substrate 1 may be formed by thermal oxidation,
As shown in FIG. 1A, a SiO 2 layer 2 having a multilayer structure formed when a driver circuit 14 is formed on the same Si substrate 1.
May be used. In the latter case, the SiO 2
An approximately 1 μm thick S is formed on the layer 2 by a plasma CVD method.
In general, an i-nitride film is formed as a passivation film. However, it is disclosed in the patent application of the inventor that this SiO 2 / Si 3 N 4 two-layer film may be used as the heat insulating layer 2. This is as described in the invention (Japanese Patent Application No. 07-320446).

【0015】以下、ドライバ回路一体型ヘッドを例にし
て説明する。
Hereinafter, a description will be given of an example of a head integrated with a driver circuit.

【0016】この断熱層2を有するSi基板1上に、
(b)に示すようにTa−Si−O三元合金薄膜6とN
i金属薄膜7をスパッタ法によって順次積層させ、
(c)に示すようにフォトエッチングによって所定形状
の発熱抵抗体8とボンディングパッド11を形成する。
On the Si substrate 1 having the heat insulating layer 2,
As shown in (b), the Ta—Si—O ternary alloy thin film 6 and N
i metal thin films 7 are sequentially laminated by a sputtering method,
As shown in (c), the heating resistor 8 and the bonding pad 11 having a predetermined shape are formed by photoetching.

【0017】発熱抵抗体8と導体9の膜厚は各々約0.
1μmと約0.5μm、発熱抵抗体形状は例えば50μ
m□、発熱抵抗体8の抵抗値はTa−Si−O三元合金
薄膜の組成比によって若干の相違があるが、80〜25
0Ωである。なお、ここで検討した三元合金薄膜の組成
比は特願平07−340486号にて記載した64%≦
Ta≦85%、5%≦Si≦26%、6%≦O≦15%
の範囲のものを中心とした。
The thickness of each of the heating resistor 8 and the conductor 9 is about 0.5.
1 μm and about 0.5 μm, and the heating resistor shape is, for example, 50 μm.
m □ and the resistance value of the heating resistor 8 are slightly different depending on the composition ratio of the Ta—Si—O ternary alloy thin film.
0Ω. The composition ratio of the ternary alloy thin film studied here is 64% ≦ described in Japanese Patent Application No. 07-340486.
Ta ≦ 85%, 5% ≦ Si ≦ 26%, 6% ≦ O ≦ 15%
The range was centered.

【0018】前記Ta−Si−O三元合金薄膜6は、3
50℃以上の熱酸化処理でその表面に約100Åという
極めて薄く、且つ機械的強度にも優れた絶縁性自己酸化
被膜を形成し、電解質インク中でのパルス通電にも充分
長い稼動寿命を示す材料となる。このため、従来は図1
(c)の段階でこの熱酸化処理を行っていたが、一括処
理ではボンディングパッド11のNi薄膜表面も薄く酸
化されるので、ドライエッチングなどによる酸化被膜の
選択除去が必要であった。或いは(c)の段階で、ボン
ディングパッド11から駆動信号を投入し、薄膜ヒータ
を酸化雰囲気中でパルス加熱することによって抵抗体上
のみを酸化させることも行っていた。しかしこれでは生
産性に問題があり、やはり一括処理が望まれていた。
The Ta—Si—O ternary alloy thin film 6 has a thickness of 3
A material that forms an extremely thin insulating self-oxidizing film with excellent mechanical strength of about 100 ° on its surface by thermal oxidation treatment at 50 ° C or higher, and has a sufficiently long operating life even when pulsed in electrolyte ink. Becomes For this reason, conventionally, FIG.
This thermal oxidation treatment was performed at the stage (c). However, since the surface of the Ni thin film of the bonding pad 11 was thinly oxidized in the batch treatment, it was necessary to selectively remove the oxide film by dry etching or the like. Alternatively, at the stage (c), a driving signal is applied from the bonding pad 11 and the thin film heater is pulse-heated in an oxidizing atmosphere to oxidize only the resistor. However, this has a problem in productivity, and batch processing has been desired.

【0019】そこで(c)の段階でNi金属薄膜表面の
みにAuめっき12を施し、これによって一括熱酸化処
理のできる方法を開発したのである。すなわち、(c)
の基板を置換金めっき液に浸漬し、基板上のNi薄膜表
面の全てをAuめっきする。この置換金めっき液には例
えば日立化成(株)製のHGS−100を使用すれば、
Ni薄膜表面(含側面)のみに約500Åの厚さでAu
めっきすることができる。これを更に無電解Auめっき
液に浸漬し、Auめっきの厚さを1000〜1500Å
又はこれ以上の厚さにする。この無電解Auめっき液に
は例えば日立化成(株)製のHGS−2000が使用で
きる。
Therefore, at the stage (c), the Au plating 12 was applied only to the surface of the Ni metal thin film, and thereby a method capable of performing a batch thermal oxidation treatment was developed. That is, (c)
Of the Ni thin film on the substrate is Au-plated. If, for example, HGS-100 manufactured by Hitachi Chemical Co., Ltd. is used as the replacement gold plating solution,
Au with a thickness of about 500mm only on the surface (including the side) of the Ni thin film
Can be plated. This is further immersed in an electroless Au plating solution to reduce the thickness of the Au plating to 1000 to 1500 °.
Or make it thicker. For this electroless Au plating solution, for example, HGS-2000 manufactured by Hitachi Chemical Co., Ltd. can be used.

【0020】置換AuめっきはNi表面にしか付着せ
ず、無電解AuめっきはAu表面にしか付着しないの
で、図1(d)に示すようにNi薄膜7、9、9’の表
面の全てがAuめっき12され、薄膜ヒ−タ部8の上に
は付着しない。この基板を約400℃で熱酸化すると、
図1(e)に示すように薄膜ヒ−タ部8の表面は約10
0Åの厚さの熱酸化絶縁被膜13でおおわれるので、基
板上のすべての薄膜表面(含側面)がAuか熱酸化絶縁
被膜で被覆されることになる。
Since the substituted Au plating adheres only to the Ni surface and the electroless Au plating adheres only to the Au surface, as shown in FIG. 1D, all of the surfaces of the Ni thin films 7, 9, and 9 'are removed. Au plating 12 is applied and does not adhere on the thin film heater 8. When this substrate is thermally oxidized at about 400 ° C.,
As shown in FIG. 1 (e), the surface of the thin film heater 8 is about 10
Since it is covered with the thermal oxide insulating film 13 having a thickness of 0 °, all the thin film surfaces (including the side surfaces) on the substrate are covered with Au or the thermal oxide insulating film.

【0021】なお、本発明において、Auめっき12を
このように厚くするのは、400℃前後の熱酸化処理で
NiとAuが数100Åの距離を相互拡散するが、その
場合でもNiがAuめっきの表面にまで拡散してこない
ようにするためである。
In the present invention, the reason why the thickness of the Au plating 12 is increased as described above is that Ni and Au mutually diffuse by a distance of several hundreds of degrees by a thermal oxidation treatment at about 400 ° C. This is to prevent diffusion to the surface.

【0022】このようにして形成されたドライバ回路一
体型ヒータ基板(Siウエハ基板)の上に、インクジェ
ットデバイスを薄膜プロセスによって形成する工程を図
2に示す。ここで図1(a)は、図2(8)の工程が完
了したウエハの断面の一部を示し、薄膜ヒータ8とボン
ディングパッド11は1対1に対応するのではなく、ヒ
ータn個に対し約6パッドが対応している。
FIG. 2 shows a process of forming an ink jet device on the heater circuit integrated heater substrate (Si wafer substrate) thus formed by a thin film process. Here, FIG. 1 (a) shows a part of the cross section of the wafer after the process of FIG. 2 (8) is completed, and the thin film heater 8 and the bonding pad 11 do not correspond one-to-one, but are n heaters. On the other hand, about 6 pads correspond.

【0023】本発明において、熱酸化処理工程の直前に
Auめっき工程を導入することは、(1)発熱抵抗体の
一括熱酸化処理が可能、(2)インク溝形成がAl被覆
処理なしで可能、(インク溝形成用エッチングにはヒド
ラジン水溶液が使われるが、Ni薄膜はこれによって溶
解するので、Al膜で被覆してこれを防止していた。今
回のAuめっき処理によって図3の(12)、(1
3)、(15)の3工程が削除できた)(3)ボンディ
ングパッドのAuめっき工程の削除(既にAuめっきさ
れている)、(4)Ni薄膜導体の低抵抗化(1/2〜
1/3化)、という大きな効果が得られる。
In the present invention, the introduction of the Au plating step immediately before the thermal oxidation step can be achieved by (1) batch thermal oxidation of the heating resistor, and (2) formation of ink grooves without Al coating. (The hydrazine aqueous solution is used for the etching for forming the ink groove. However, since the Ni thin film is dissolved by this, it is covered with an Al film to prevent this. This Au plating process causes (12) in FIG. , (1
(3) and (15) could be eliminated) (3) Au plating step of the bonding pad was eliminated (already plated with Au), (4) Low resistance of Ni thin film conductor (1/2 to 1/2)
(1/3)).

【0024】勿論、Auめっき処理された導体でも、電
解質インク中では正極側電極が電蝕され易くなることは
Ni導体の場合と同様であり、これに対しては薄い無機
絶縁物層と有機絶縁物層の被覆という対策によって解決
できることは先述の通りである。
Of course, even in the case of a conductor plated with Au, the positive electrode is easily eroded in the electrolyte ink as in the case of the Ni conductor, whereas a thin inorganic insulating layer and an organic insulating material are used. As described above, the problem can be solved by the measure of covering the material layer.

【0025】このようにして、製作されたヘッドに水性
インクを充填して印字させたところ、1億ドット以上の
インクの吐出後においても初期状態と何ら変わることの
ない動作を示した。インクの吐出に必要な印加電力は、
400dpiのノズルで約2μJ/ドット(2W×1μ
s)と小さく、従来技術のヘッドに比べ約1/10と桁
違いに小さい特徴を持っていることは言うまでもない。
When the produced head was filled with the aqueous ink and printed, the operation showed no change from the initial state even after the ejection of 100 million dots or more of ink. The applied power required for ink ejection is
About 2μJ / dot (2W × 1μ) with 400 dpi nozzle
Needless to say, it has a feature that is as small as s) and about 10 times smaller than that of the conventional head.

【0026】なお、Auめっき処理のコストは、めっき
面積とめっき厚さの積に比例するので、ボンディングパ
ッド11のNi薄膜以外は必ずしもAuめっきする必要
はない。この場合はレジストでめっきの不要なNi薄膜
を被覆し、ボンディングパッド部のみをAuめっきすれ
ば良く、同様にライン抵抗の低減のために共通Ni薄膜
導体を含めてめっき処理することもある。
Since the cost of the Au plating process is proportional to the product of the plating area and the plating thickness, it is not always necessary to perform Au plating except for the Ni thin film of the bonding pad 11. In this case, a Ni thin film that does not require plating is coated with a resist, and only the bonding pad portion may be Au-plated. Similarly, a plating process may be performed including a common Ni thin-film conductor to reduce line resistance.

【0027】また、熱処理によるAuとNiの相互拡散
で、置換Auめっき膜だけではその表面にNiが析出
し、これが酸化して不動態化し易い。このため、置換A
uめっき膜の上に厚付け用無電解Auめっきを追加し、
合計厚さを少なくとも1000〜1500Åとすること
が必要である。こうすることによって、外部回路との接
続の作業性(接続歩留り、接続強度等)が完全となり、
信頼性も格段に向上することは説明するまでもないであ
ろう。また、ヘッド製造プロセス全体の合理化はヘッド
の製造歩留りを向上させ、製造コストを更に引き下げる
ことに貢献している。
Also, due to the mutual diffusion of Au and Ni due to the heat treatment, Ni is deposited on the surface of the substituted Au plating film alone, and this is easily oxidized and passivated. Therefore, the substitution A
Add electroless Au plating for thickening on the u plating film,
The total thickness must be at least 1000-1500 °. By doing so, the workability of connection with the external circuit (connection yield, connection strength, etc.) becomes complete,
It goes without saying that the reliability is also greatly improved. Further, the rationalization of the entire head manufacturing process contributes to improving the manufacturing yield of the head and further reducing the manufacturing cost.

【0028】[0028]

【発明の効果】熱酸化処置工程の直前にNi薄膜のAu
めっき処理を行うことによって、 (1)発熱抵抗体の一括熱酸化処理が可能 (2)Al被覆処理なしでインク溝の形成が可能 (3)従来技術のボンディングパッドのAuめっき工程
が全面的に不要化 (4)ライン抵抗の大きいNi薄膜導体を低抵抗化(1
/2〜1/3化) (5)外部回路との接続歩留りと信頼性の向上 等が達成でき、ヘッドの製造歩留りの向上と製造コスト
の低減をも達成した。
[Effect of the Invention] Immediately before the thermal oxidation treatment step, the Ni thin film Au
By performing the plating process, (1) batch thermal oxidation treatment of the heating resistor is possible (2) ink grooves can be formed without Al coating treatment (3) Au plating process of the bonding pad of the prior art is entirely performed (4) Low resistance of Ni thin film conductor with large line resistance (1)
(5) The yield of connection to an external circuit and the improvement of reliability were achieved, and the improvement of the manufacturing yield of the head and the reduction of the manufacturing cost were also achieved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の一例を工程順に示すヒ−タ基板の断
面図である。
FIG. 1 is a sectional view of a heater substrate showing an example of the present invention in the order of steps.

【図2】 本発明の一例を示すヘッド製造工程を示すフ
ローチャートである。
FIG. 2 is a flowchart illustrating a head manufacturing process according to an example of the invention.

【図3】 従来技術のヘッド製造工程を示すフローチャ
ートである。
FIG. 3 is a flowchart showing a conventional head manufacturing process.

【符号の説明】[Explanation of symbols]

1はSi基板、2はSiO2層、3はドライバ回路のA
l配線、4はボンディングパッド用のスルーホール、6
はTa−Si−O三元合金薄膜、7はNi金属薄膜、8
は発熱抵抗体、9,9’は配線導体、10は接続部、1
1はボンディングパッド、12はAuめっき被膜、13
は自己酸化被膜、14はドライバ回路のデバイス部であ
る。
1 is a Si substrate, 2 is a SiO 2 layer, 3 is a driver circuit A
l wiring, 4 is a through hole for bonding pad, 6
Is a Ta-Si-O ternary alloy thin film, 7 is a Ni metal thin film, 8
Is a heating resistor, 9, 9 'are wiring conductors, 10 is a connecting portion, 1
1 is a bonding pad, 12 is an Au plating film, 13
Denotes a self-oxidized film, and 14 denotes a device portion of the driver circuit.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】インク吐出口近傍に設けられたTa−Si
−O三元合金薄膜抵抗体とNi金属薄膜導体からなる発
熱抵抗体にパルス通電することによってインク液路中の
インクの一部を急速に気化させ、この気泡の膨張力によ
って前記吐出口から液滴状インクを吐出させて記録する
インクジェット記録装置の製造方法において、前記発熱
抵抗体を熱酸化処理する前に前記Ni金属薄膜導体とこ
れにつながる外部回路との接続用Ni金属薄膜電極のう
ち、少なくと接続用Ni金属薄膜電極の表面を金めっき
処理しておくことを特徴とするインクジェット記録装置
の製造方法。
1. A Ta-Si provided near an ink discharge port.
A part of the ink in the ink liquid path is rapidly vaporized by applying a pulse current to a heating resistor composed of a -O ternary alloy thin film resistor and a Ni metal thin film conductor, and the expansion force of the bubble causes the liquid to flow out of the discharge port. In the method of manufacturing an ink jet recording apparatus for discharging and recording ink droplets, the Ni metal thin film conductor is connected to an external circuit connected to the Ni metal thin film conductor before the heating resistor is thermally oxidized. A method for manufacturing an ink jet recording apparatus, characterized in that at least the surface of a connecting Ni metal thin film electrode is subjected to gold plating.
JP16907396A 1995-12-08 1996-06-28 Inkjet recording apparatus and manufacturing method thereof Expired - Lifetime JP3705652B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP16907396A JP3705652B2 (en) 1996-06-28 1996-06-28 Inkjet recording apparatus and manufacturing method thereof
US08/761,900 US5790154A (en) 1995-12-08 1996-12-09 Method of manufacturing an ink ejection recording head and a recording apparatus using the recording head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16907396A JP3705652B2 (en) 1996-06-28 1996-06-28 Inkjet recording apparatus and manufacturing method thereof

Publications (2)

Publication Number Publication Date
JPH1016242A true JPH1016242A (en) 1998-01-20
JP3705652B2 JP3705652B2 (en) 2005-10-12

Family

ID=15879832

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16907396A Expired - Lifetime JP3705652B2 (en) 1995-12-08 1996-06-28 Inkjet recording apparatus and manufacturing method thereof

Country Status (1)

Country Link
JP (1) JP3705652B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6578950B2 (en) 2000-08-28 2003-06-17 Fuji Photo Film Co., Ltd. Line head and image recording method
US6595622B2 (en) 2001-03-29 2003-07-22 Fuji Photo Film Co., Ltd. Ink jet printhead with thick substrate providing reduced warpage
US6932461B2 (en) 2002-12-16 2005-08-23 Fuji Xerox Co., Ltd. Ink-jet recording head
JP2008265164A (en) * 2007-04-20 2008-11-06 Canon Inc Substrate for ink jet recording head and its production process

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6578950B2 (en) 2000-08-28 2003-06-17 Fuji Photo Film Co., Ltd. Line head and image recording method
US6595622B2 (en) 2001-03-29 2003-07-22 Fuji Photo Film Co., Ltd. Ink jet printhead with thick substrate providing reduced warpage
US6932461B2 (en) 2002-12-16 2005-08-23 Fuji Xerox Co., Ltd. Ink-jet recording head
JP2008265164A (en) * 2007-04-20 2008-11-06 Canon Inc Substrate for ink jet recording head and its production process
US8182072B2 (en) 2007-04-20 2012-05-22 Canon Kabushiki Kaisha Substrate for inkjet printing head and method for manufacturing the substrate

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