JPH10160810A - Magnetism measuring apparatus - Google Patents

Magnetism measuring apparatus

Info

Publication number
JPH10160810A
JPH10160810A JP31580396A JP31580396A JPH10160810A JP H10160810 A JPH10160810 A JP H10160810A JP 31580396 A JP31580396 A JP 31580396A JP 31580396 A JP31580396 A JP 31580396A JP H10160810 A JPH10160810 A JP H10160810A
Authority
JP
Japan
Prior art keywords
converter
offset adjustment
offset
measured value
magnetic field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP31580396A
Other languages
Japanese (ja)
Other versions
JP3610707B2 (en
Inventor
Kenji Iijima
健二 飯島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP31580396A priority Critical patent/JP3610707B2/en
Publication of JPH10160810A publication Critical patent/JPH10160810A/en
Application granted granted Critical
Publication of JP3610707B2 publication Critical patent/JP3610707B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Measuring Magnetic Variables (AREA)

Abstract

PROBLEM TO BE SOLVED: To obtain a magnetism measuring apparatus by which an offset adjusting speed and an offset adjusting accuracy are improved and which eliminates a need of an offset adjusting process in its manufacture. SOLUTION: A background magnetic field which is measured by a magnetism detecting element 1 and by a magnetism measuring circuit 2 is fetched by a CPU 6 through a differential amplifier 4 and an A/D converter 5. When a measured value V2 is at +10V or higher, one bit each is turned on and off from an MBS in a D/A converter 7, and a comparison is executed sequentially. When the measured value is within ±10V, signal corresponding to the measured value is returned to the differential amplifier 4 from the D/A converter 7, the signal of the D/A converter 7 of the differential output 4 becomes zero, and the above processing operation is repeated.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は指示中に指示器の
絶対値に比べ、微小な磁界変化を有する場合の磁気測定
器に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a magnetometer in which a change in a magnetic field is smaller than an absolute value of an indicator during an indication.

【0002】[0002]

【従来の技術】磁界測定器におけるオフセット磁界の打
ち消し方法としては従来、粗調整と微調整つまみを併用
してマニュアル調整を行う方法、D/A変換器のMSB
から1ビットずつ立てて逐次比較により駆動する方法、
D/A変換器のLSBより順次積み上げて目的値に近づ
けてゆく積分法により駆動する方法などが採用されてい
る。
2. Description of the Related Art Conventionally, as a method of canceling an offset magnetic field in a magnetic field measuring device, a method of performing a manual adjustment by using both a coarse adjustment and a fine adjustment knob, an MSB of a D / A converter
From 1 bit at a time and driven by successive approximation,
A method of driving by an integration method of sequentially accumulating from the LSB of the D / A converter and approaching the target value is adopted.

【0003】[0003]

【発明が解決しようとする課題】上記した従来のオフセ
ット調整方法では、マニュアル調整の場合、オフセット
調整するのに手間がかかるという問題があり、またD/
A変換器を用いた逐次比較法の場合は、オフセット調整
精度の難点と製造時に調整工程を要するという問題があ
り、積分法による場合は、オフセット調整速度が遅いと
いう難点と、これも製造時に調整工程を要するという問
題があった。この発明は上記問題点に着目してなされた
ものであって、オフセット調整速度とオフセット調整精
度の改善を実現しつつ、製造時のオフセット調整工程を
省略しうる磁気測定器を提供することをを目的とする。
The above-described conventional offset adjustment method has a problem that it takes time and effort to adjust the offset in the case of manual adjustment.
In the case of the successive approximation method using the A-converter, there is a problem that the offset adjustment accuracy is difficult and an adjustment step is required at the time of manufacturing. There was a problem that a process was required. SUMMARY OF THE INVENTION The present invention has been made in view of the above problems, and provides a magnetometer capable of eliminating the offset adjustment step at the time of manufacturing while improving the offset adjustment speed and the offset adjustment accuracy. Aim.

【0004】[0004]

【課題を解決するための手段】この発明は、磁気測定手
段の測定出力をA/D変換器を介して演算手段に取り込
み、背景磁界のみの測定出力に応じて所定電圧をD/A
変換器を介して測定信号取り込み手段に戻し、オフセッ
ト調整を行う磁気測定器において、オフセット調整を指
示する手段と、このオフセット調整の指示下で測定値が
所定範囲を越えている場合、逐次比較によりオフセット
調整を実施する手段と、測定値が所定範囲内になるとA
/D変換器を通して取り込んだ測定値に見合った値をD
/A変換器に設定して、測定系に戻すことを複数回繰り
返す手段とを備えている。
According to the present invention, a measurement output of a magnetic measuring means is taken into an arithmetic means via an A / D converter, and a predetermined voltage is applied to a D / A according to a measurement output of only a background magnetic field.
Return to the measurement signal acquisition means via the converter, in the magnetometer for performing the offset adjustment, means for instructing the offset adjustment, and if the measured value exceeds a predetermined range under the instruction of the offset adjustment, by successive comparison Means for performing offset adjustment, and A when the measured value falls within a predetermined range.
The value corresponding to the measured value taken through the / D converter is D
Means for setting a value to the / A converter and returning to the measurement system a plurality of times.

【0005】この磁気測定器では、オフセット調整を行
うのに、その旨を指示手段で指示すると、先ず背景磁界
のみの入力にして、その測定信号を取込み、測定値が所
定以上の場合に、D/A変換器による逐次比較を実施
し、これにより取込み値が所定値以下になると、その測
定値に見合った信号をD/A変換器を介して測定値に戻
し、出力が0となるまでこの処理が複数回繰り返され
る。
In this magnetometer, when the offset is adjusted by the instruction means, the input is made only of the background magnetic field, and the measurement signal is taken in. A / A converter performs successive approximation, and when the acquired value becomes equal to or less than a predetermined value, a signal corresponding to the measured value is returned to the measured value via the D / A converter. The process is repeated multiple times.

【0006】[0006]

【発明の実施形態】以下、実施の形態により、この発明
をさらに詳細に説明する。図1は、この発明の一実施形
態磁気測定器のハード構成を示すブロック図である。こ
の磁気測定器は、磁気検出素子1と、磁気測定回路2
と、この磁気測定回路2からの入力信号V1 を受ける差
動増幅器4と、差動増幅器4のアナログ出力信号V2
デジタル信号に変換するA/D変換器5と、A/D変換
器5からの出力信号を取り込み、記憶するCPU6と、
CPU6より出力されるデジタル信号をオフセット信号
としてアナログ信号に変換して、差動増幅器4のマイナ
ス入力端に加えるD/A変換器7と、出力回路8とから
構成されている。磁気検出素子1と磁気測定回路2で磁
気測定手段3を構成している。出力回路8は表示素子及
びアナログ出力信号、デジタル出力信号等を出力する出
力回路である。一般にオフセット磁界について例えば背
景磁界が50000nTで数nTの磁界変化を測定する
場合、オフセット磁界はこの背景磁界のことをいう。さ
らにオフセット調整とはこのオフセット磁界を打ち消す
ことをいう。数nT程度の磁界変化を測定する場合の測
定範囲例は、例えば±100nTである。この場合、測
定磁界が100nTの時、磁気測定回路及びその供給電
源が±15vであれば、V2 は10vとするのが一般的
である。上記実施形態磁気測定器のオフセット調整動作
を説明するのに、この具体的な値で説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in more detail with reference to embodiments. FIG. 1 is a block diagram showing a hardware configuration of a magnetometer according to one embodiment of the present invention. This magnetometer comprises a magnetism detecting element 1 and a magnetism measuring circuit 2
When a differential amplifier 4 that receives the input signal V 1 of the from the magnetic measuring circuit 2, an A / D converter 5 for converting an analog output signal V 2 of the differential amplifier 4 into a digital signal, A / D converter A CPU 6 for receiving and storing output signals from the CPU 5;
It comprises a D / A converter 7 for converting a digital signal output from the CPU 6 into an analog signal as an offset signal and applying it to a minus input terminal of the differential amplifier 4, and an output circuit 8. The magnetism detecting means 1 and the magnetism measuring circuit 2 constitute the magnetism measuring means 3. The output circuit 8 is an output circuit that outputs a display element, an analog output signal, a digital output signal, and the like. In general, for example, when a magnetic field change of several nT is measured with a background magnetic field of 50,000 nT, the offset magnetic field refers to the background magnetic field. Further, offset adjustment refers to canceling out the offset magnetic field. An example of a measurement range when measuring a magnetic field change of about several nT is, for example, ± 100 nT. In this case, when the measured magnetic field is 100 nT and the magnetic measurement circuit and its supply power are ± 15 V, V 2 is generally set to 10 V. The offset adjustment operation of the magnetometer according to the above embodiment will be described using the specific values.

【0007】次に、図3に示すフローチャートにより、
上記実施形態磁気測定器のオフセット調整処理動作につ
いて説明する。オフセット調整はCPU6に付設される
オフセットモード指定器を操作することによって動作を
開始する。このオフセットモードの指示は生産終了時に
自動的に行うものに変えても良いし、必要に応じ随時オ
フセット調整モードキーを操作することによって、オフ
セット調整に入ることができる。オフセット調整動作に
入ると、先ずA/D変換器7の出力を取り込み、CPU
6ではこのV2 が±10vを越えているか否かを判定す
る(ST2)。このV2 が±10vを越えていると、V
2 が±10v以内となるようにD/A変換器8を逐次比
較を遂行する(ST3)。ST4ではV2 が±10v以
内になったか否かを判定し、10v以内となるまでST
3に戻り、逐次比較処理を継続する。逐次比較法はD/
A変換器7のMSB側より1ビットずつON/OFFし
て、V2 の変化をA/D変換器5を通してモニタしつつ
設定する。16ビットのA/D変換器なら最大16回で
測定が終了する。仮にこの調整方法をLSBより徐々に
設定する場合は最大216回の設定が必要となる(積分
法)。
Next, according to the flowchart shown in FIG.
The offset adjustment operation of the magnetometer according to the embodiment will be described. The offset adjustment is started by operating an offset mode designator attached to the CPU 6. The instruction of the offset mode may be changed to the instruction automatically performed at the end of the production, or the offset adjustment can be started by operating the offset adjustment mode key as needed. When the offset adjustment operation starts, first, the output of the A / D converter 7 is fetched and the CPU
In 6 determines whether the V 2 exceeds the ± 10v (ST2). If V 2 exceeds ± 10 V, V
The D / A converter 8 performs successive approximation so that 2 is within ± 10 V (ST3). ST4 In V 2, it is determined whether it is within ± 10v, ST until within 10v
3 and the successive approximation processing is continued. The successive approximation method is D /
The A / D converter 7 is turned on / off one bit at a time from the MSB side, and set while monitoring the change in V 2 through the A / D converter 5. In the case of a 16-bit A / D converter, measurement is completed at a maximum of 16 times. If when setting gradually this adjustment method from LSB is required up to 2 16 times setting (integration method).

【0008】V2 が±10v以内となればST4の判定
がYESとなり、次にA/D変換器5を通してV2 を測
定する(ST5)。そしてこのV2 が0vとなるよう
に、CPU6ではD/A変換器7に測定値V2 に相当す
る信号を設定する(ST6)。実際にはV2 が0vとな
るように、CPU6でD/A変換器7を設定しても、差
動増幅器4、A/D変換器5及びD/A変換器7の誤差
に見合った量が出力として残る。つまり0vとならな
い。そのため、さらに変数=2かをST7で判定し、n
=2となるまで最初変数0の状態から変数nを1インク
リメントして(ST8)ST5に戻り、同様にV2 をA
/D変換器5を通して測定するとともに、V 2 が0vと
なるようにD/A変換器7を設定し(ST6)、これを
n=2となるまで、つまりST5、ST6の処理を2回
繰り返す。2回の繰り返しによってオフセット調整が終
了する。最低2回で行うことになる。
[0008] VTwoIs within ± 10v, ST4 judgment
Is YES, and then V through the A / D converter 5.TwoMeasure
(ST5). And this VTwoIs 0v
In the CPU 6, the measured value V is supplied to the D / A converter 7.TwoEquivalent to
A signal is set (ST6). Actually VTwoIs 0v
Even if the D / A converter 7 is set by the CPU 6,
Error of the dynamic amplifier 4, the A / D converter 5, and the D / A converter 7
The amount corresponding to remains as output. In other words, it becomes 0v
No. Therefore, it is further determined in ST7 whether variable = 2, and n
= 1 from the state of variable 0 until variable = 2
(ST8) and returns to ST5.TwoA
/ D converter 5 and V TwoIs 0v
D / A converter 7 is set (ST6) so that
Until n = 2, that is, ST5 and ST6 are performed twice
repeat. Offset adjustment is completed by two repetitions
Complete. This will be done at least twice.

【0009】ST6での最初の調整の誤差が仮に10%
とすると、2度行うと誤差が1%程度となる。D/A変
換器7、A/D変換器5の分解能が10vの1%、つま
り100mVに比べて十分小さい場合、このようにな
る。図2は、この発明の他の実施形態磁気測定器のハー
ド構成を示す回路ブロック図である。この実施形態磁気
測定器は、図1の回路においてはD/A変換器7の出力
を差動増幅器4に戻しているのに対し、フィードバック
回路9を介して磁気検出装置1に戻している点が相違す
る。調整方法は、上記図1の磁気測定器と同様に行う。
ここでも磁気測定器回路2の出力がV2 に相当する。
The error of the first adjustment in ST6 is assumed to be 10%
If this is done twice, the error will be about 1%. This is the case when the resolution of the D / A converter 7 and the A / D converter 5 is 1% of 10v, that is, sufficiently smaller than 100mV. FIG. 2 is a circuit block diagram showing a hardware configuration of a magnetometer according to another embodiment of the present invention. The magnetic measuring device of this embodiment returns the output of the D / A converter 7 to the differential amplifier 4 in the circuit of FIG. Are different. The adjustment is performed in the same manner as in the magnetometer shown in FIG.
The output of the magnetic measuring circuit 2 corresponds to V 2 again.

【0010】[0010]

【発明の効果】この発明によれば、オフセット調整を指
示する手段と、このオフセット調整の指示下で測定値が
所定範囲を越えている場合、逐次比較によりオフセット
調整を実施する手段と、測定値が所定範囲内になるとA
/D変換器を通して取り込んだ測定値に見合った値をD
/A変換器で設定して測定器に戻すことを複数回繰り返
す手段とを備えてオフセット調整するので、素早く精度
の良いオフセット調整を実現しうるとともに、自動的に
オフセットを実施しうるので、製造時にいちいち調整す
る必要がないという効果を奏する。
According to the present invention, means for instructing offset adjustment, means for performing offset adjustment by successive approximation when the measured value exceeds a predetermined range under the instruction of offset adjustment, Is within a predetermined range.
The value corresponding to the measured value taken through the / D converter is D
Since the offset adjustment is provided with means for repeating the setting by the A / A converter and returning to the measuring device a plurality of times, the offset can be quickly and accurately adjusted, and the offset can be automatically performed. There is an effect that it is not necessary to adjust each time.

【図面の簡単な説明】[Brief description of the drawings]

【図1】この発明の一実施形態磁気測定器のハード構成
を示すブロック図である。
FIG. 1 is a block diagram illustrating a hardware configuration of a magnetometer according to an embodiment of the present invention.

【図2】この発明の他の実施形態磁気測定器のハード構
成を示すブロック図である。
FIG. 2 is a block diagram illustrating a hardware configuration of a magnetometer according to another embodiment of the present invention.

【図3】上記図1の実施形態磁気測定器のオフセット調
整を説明するためのフロー図である。
FIG. 3 is a flowchart for explaining offset adjustment of the magnetometer according to the embodiment shown in FIG. 1;

【符号の説明】[Explanation of symbols]

1 磁気検出素子 2 磁気測定回路 4 差動増幅器 5 A/D変換器 6 CPU 7 D/A変換器 DESCRIPTION OF SYMBOLS 1 Magnetic detection element 2 Magnetic measurement circuit 4 Differential amplifier 5 A / D converter 6 CPU 7 D / A converter

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】磁気測定手段の測定出力をA/D変換器を
介して演算手段に取込み、背景磁界のみの測定出力に応
じて所定電圧をD/A変換器を介して測定信号取り込み
系に戻し、オフセット調整を行う磁気測定器において、 オフセット調整を指示する手段と、 このオフセット調整の指示下で測定値が所定範囲を越え
ている場合、逐次比較によりオフセット調整を実施する
手段と、 測定値が所定範囲内になるとA/D変換器を通して取り
込んだ測定値に見合った値をD/A変換器に設定して測
定系に戻すことを複数回繰り返す手段と、 を備えたことを特徴とする磁気測定器。
1. A measuring output of a magnetic measuring means is taken into an arithmetic means via an A / D converter, and a predetermined voltage is supplied to a measuring signal taking system via a D / A converter in accordance with a measuring output of only a background magnetic field. Means for instructing an offset adjustment in a magnetic measuring device for performing return and offset adjustment; means for performing an offset adjustment by successive approximation when a measured value exceeds a predetermined range under the instruction of the offset adjustment; Means for setting a value corresponding to the measurement value taken in through the A / D converter to the D / A converter and returning the value to the measurement system a plurality of times when is within a predetermined range. Magnetometer.
JP31580396A 1996-11-27 1996-11-27 Magnetic measuring instrument Expired - Fee Related JP3610707B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31580396A JP3610707B2 (en) 1996-11-27 1996-11-27 Magnetic measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31580396A JP3610707B2 (en) 1996-11-27 1996-11-27 Magnetic measuring instrument

Publications (2)

Publication Number Publication Date
JPH10160810A true JPH10160810A (en) 1998-06-19
JP3610707B2 JP3610707B2 (en) 2005-01-19

Family

ID=18069748

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31580396A Expired - Fee Related JP3610707B2 (en) 1996-11-27 1996-11-27 Magnetic measuring instrument

Country Status (1)

Country Link
JP (1) JP3610707B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006250922A (en) * 2005-02-10 2006-09-21 Uchihashi Estec Co Ltd Electric current sensor
JP2006250921A (en) * 2005-02-10 2006-09-21 Uchihashi Estec Co Ltd Electric current sensor and electric current detection method
JP2007139532A (en) * 2005-11-17 2007-06-07 Shimadzu Corp Magnetic field measuring device
JP5102409B1 (en) * 2012-04-10 2012-12-19 株式会社アイテス Electronic panel inspection equipment
JP2014052262A (en) * 2012-09-06 2014-03-20 Seiko Npc Corp Magnetic sensor

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006250922A (en) * 2005-02-10 2006-09-21 Uchihashi Estec Co Ltd Electric current sensor
JP2006250921A (en) * 2005-02-10 2006-09-21 Uchihashi Estec Co Ltd Electric current sensor and electric current detection method
JP4630401B2 (en) * 2005-02-10 2011-02-09 東北電力株式会社 Current sensor and current detection method
JP4722717B2 (en) * 2005-02-10 2011-07-13 東北電力株式会社 Current sensor
JP2007139532A (en) * 2005-11-17 2007-06-07 Shimadzu Corp Magnetic field measuring device
JP4525566B2 (en) * 2005-11-17 2010-08-18 株式会社島津製作所 Magnetic field measuring instrument
JP5102409B1 (en) * 2012-04-10 2012-12-19 株式会社アイテス Electronic panel inspection equipment
WO2013153615A1 (en) * 2012-04-10 2013-10-17 株式会社アイテス Electronic panel inspection device
JP2014052262A (en) * 2012-09-06 2014-03-20 Seiko Npc Corp Magnetic sensor

Also Published As

Publication number Publication date
JP3610707B2 (en) 2005-01-19

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