JPH08122166A - Method and instrument for measuring temperature - Google Patents

Method and instrument for measuring temperature

Info

Publication number
JPH08122166A
JPH08122166A JP25796994A JP25796994A JPH08122166A JP H08122166 A JPH08122166 A JP H08122166A JP 25796994 A JP25796994 A JP 25796994A JP 25796994 A JP25796994 A JP 25796994A JP H08122166 A JPH08122166 A JP H08122166A
Authority
JP
Japan
Prior art keywords
temperature
span
measurement
value
measurement temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP25796994A
Other languages
Japanese (ja)
Inventor
Toshiya Kawada
敏哉 河田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP25796994A priority Critical patent/JPH08122166A/en
Publication of JPH08122166A publication Critical patent/JPH08122166A/en
Withdrawn legal-status Critical Current

Links

Abstract

PURPOSE: To provide a temperature measuring instrument which can accurately measure temperature even if the temperature greatly changes and may take any value. CONSTITUTION: In the temperature measuring instrument with a temperature sensor 1 for varying resistance according to temperature, a resistance-voltage conversion part 2 for converting resistance to a voltage value by supplying a constant current to the temperature sensor, a zero point adjustment part 5 for adjusting zero point in reference to a voltage value applied to the temperature sensor when temperature is a lower-limit temperature of a measurement temperature span, a span adjustment part 6 for adjusting span so that the span matches with the width of the conversion range of an A/D conversion part, an A/D conversion part 3 for converting the voltage value into a digital value, and an operation processing part for converting the digital value into a measurement temperature value, temperature is measured in the maximum measurement temperature span, the measurement temperature span is set so that the measurement temperature is within the measurement temperature span, and temperature is measured again based on the measurement temperature span.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、温度に応じて抵抗値の
変化する温度センサを用いて温度を測定する温度計測装
置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a temperature measuring device for measuring temperature using a temperature sensor whose resistance value changes according to temperature.

【0002】[0002]

【従来の技術】温度測定装置は気温や水温を測定して表
示等の出力をするものであり、従来の技術を図3を用い
て説明する。図3は温度測定装置のブロック図である。
2. Description of the Related Art A temperature measuring device measures an air temperature or a water temperature and outputs a display or the like. A conventional technique will be described with reference to FIG. FIG. 3 is a block diagram of the temperature measuring device.

【0003】図3において、1は温度に応じて抵抗値の
変化する温度センサであり、抵抗−電圧変換部2は温度
センサ1に一定電流を供給して抵抗値を電圧値に変換す
る。
In FIG. 3, reference numeral 1 denotes a temperature sensor whose resistance value changes according to temperature, and a resistance-voltage converter 2 supplies a constant current to the temperature sensor 1 to convert the resistance value into a voltage value.

【0004】ゼロ点調整部5は、前記電圧値のゼロ点調
整を行い、スパン調整部6は、スパンの調整を行う。制
御部7は、測定温度スパン入力部4において操作者が入
力した測定温度スパンに基づいて、ゼロ点調整部5およ
びスパン調整部6の調整についての制御を行う。測定温
度スパンの範囲内における温度に従って変化する電圧値
の範囲は、ゼロ点調整およびスパン調整を経て、A/D
変換部3の電圧値の変換範囲と対応付けられる。
The zero point adjustment unit 5 performs zero point adjustment of the voltage value, and the span adjustment unit 6 performs span adjustment. The control unit 7 controls the adjustment of the zero point adjusting unit 5 and the span adjusting unit 6 based on the measured temperature span input by the operator at the measured temperature span input unit 4. The range of voltage value that changes according to the temperature within the range of measurement temperature span is A / D after zero point adjustment and span adjustment.
It is associated with the conversion range of the voltage value of the conversion unit 3.

【0005】A/D変換部3は、電圧値をデジタル値に
変換し、演算処理部8がデジタル値を測定温度値に変換
する。該温度値は、出力部9により表示あるいは外部に
信号として出力する。
The A / D conversion section 3 converts the voltage value into a digital value, and the arithmetic processing section 8 converts the digital value into a measured temperature value. The temperature value is displayed by the output unit 9 or output as a signal to the outside.

【0006】A/D変換部3の分解能は一定であるた
め、操作者が測定温度スパンを広く設定すると、分解能
は低くなり、測定温度スパンを狭く設定すると分解能は
高くなることとなる。
Since the resolution of the A / D converter 3 is constant, if the operator sets a wide measurement temperature span, the resolution will be low, and if the measurement temperature span is set narrow, the resolution will be high.

【0007】[0007]

【発明が解決しようとする課題】しかしながら、上述の
図3に示すような温度測定装置にあっては、あらかじめ
一定の範囲に測定温度が必ず入ることがわかっている場
合は、測定温度スパンを狭く設定することができ、精度
良く温度の計測が可能であるが、測定対象である温度の
変化が大きく、どのような値をとるか不定の場合、測定
温度スパンを広く設定する必要があり、測定温度スパン
を広く設定すると分解能は低くなるので、一度操作者が
測定温度スパンを設定しただけでは精度良く温度を測定
することができないという問題点があった。
However, in the temperature measuring device as shown in FIG. 3 described above, when it is known in advance that the measured temperature always falls within a certain range, the measured temperature span is narrowed. Although it can be set and the temperature can be measured with high accuracy, it is necessary to set a wide measurement temperature span if there is a large change in the temperature to be measured and it is uncertain what value to take. If the temperature span is set wide, the resolution becomes low, so there is a problem in that the temperature cannot be accurately measured even if the operator once sets the measurement temperature span.

【0008】本発明は、上記問題点を改善するために成
されたもので、その目的とするところは、測定対象であ
る温度の変化が大きく、どのような値をとるか不定の場
合においても、精度良く温度を測定できる温度測定装置
を提供することにある。
The present invention has been made in order to solve the above-mentioned problems, and an object of the present invention is to provide a method even when the temperature to be measured has a large change and the value to be taken is uncertain. Another object of the present invention is to provide a temperature measuring device capable of measuring temperature with high accuracy.

【0009】[0009]

【課題を解決するための手段】本発明は上記の問題を解
決するために、請求項1記載の発明にあっては、温度に
応じて抵抗値の変化する温度センサに一定電流を供給し
て抵抗値を電圧値に変換し、電圧値をデジタル値に変換
し、該デジタル値から測定温度値を算出する温度測定方
法において、最大測定温度スパンにて温度の測定を行
い、該計測結果に基づいて、測定温度スパン内に計測温
度が入るように、ゼロ点調整およびスパン調整を行い、
該設定された測定温度スパンにて再び温度の測定を行う
ことを特徴とする方法である。
In order to solve the above problems, the present invention provides a temperature sensor whose resistance value changes according to temperature by supplying a constant current to the temperature sensor. In the temperature measuring method of converting the resistance value into the voltage value, converting the voltage value into the digital value, and calculating the measured temperature value from the digital value, the temperature is measured in the maximum measurement temperature span and based on the measurement result. Adjust the zero point and span so that the measured temperature is within the measured temperature span.
In this method, the temperature is measured again with the set measurement temperature span.

【0010】また、請求項2記載の発明にあっては、温
度に応じて抵抗値の変化する温度センサと、該温度セン
サに一定電流を供給して抵抗値を電圧値に変換する抵抗
−電圧変換部と、測定温度スパンの下限温度のときに前
記温度センサにかかる電圧値を基準としてゼロ点調整を
行うゼロ点調整部と、前記測定温度スパンをA/D変換
部の変換範囲の幅に合わせるようにスパン調整を行うス
パン調整部と、センサにかかる電圧値をデジタル値に変
換するA/D変換部と、該デジタル値を測定温度値に変
換する演算処理部とを有する温度測定装置において、最
大測定温度スパンにて温度の計測を行い、該計測温度に
基づいて、測定温度スパン内に計測温度が入るように、
測定温度スパンを設定する測定温度スパン設定部を設け
たことを特徴とするものである。
According to the second aspect of the invention, a temperature sensor whose resistance value changes according to temperature, and a resistance-voltage which supplies a constant current to the temperature sensor to convert the resistance value into a voltage value. The conversion unit, a zero point adjustment unit that performs zero point adjustment based on the voltage value applied to the temperature sensor at the lower limit temperature of the measurement temperature span, and the measurement temperature span within the conversion range width of the A / D conversion unit. In a temperature measuring device having a span adjusting section for performing a span adjustment so as to match, an A / D converting section for converting a voltage value applied to a sensor into a digital value, and an arithmetic processing section for converting the digital value into a measured temperature value. , The temperature is measured in the maximum measurement temperature span, and based on the measured temperature, the measurement temperature falls within the measurement temperature span,
It is characterized in that a measurement temperature span setting unit for setting the measurement temperature span is provided.

【0011】[0011]

【作用】以上のように構成したことにより、請求項1記
載の発明にあっては、まず最大測定温度スパンにて、ゼ
ロ点調整、スパン調整を行った後に温度の測定を行い、
該計測結果である測定温度に基づいて、該測定温度が測
定温度スパン内に入るように測定温度スパンを設定し、
再度ゼロ点調整およびスパン調整を行い、該設定された
スパンにて再び温度の測定を行うことにより、最大測定
温度スパンと比べて狭い測定温度スパンとA/D変換部
の変換範囲とを対応させることができる。
With the above construction, according to the invention of claim 1, first, zero point adjustment and span adjustment are performed at the maximum measurement temperature span, and then the temperature is measured,
Based on the measurement temperature that is the measurement result, the measurement temperature span is set so that the measurement temperature falls within the measurement temperature span,
The zero point adjustment and the span adjustment are performed again, and the temperature is measured again at the set span, so that the measurement temperature span narrower than the maximum measurement temperature span and the conversion range of the A / D converter are associated with each other. be able to.

【0012】また、請求項2記載の発明にあっては、測
定温度スパン設定部は測定温度スパンに最大測定温度ス
パンを設定し、該測定温度スパンとA/D変換部の変換
範囲とが合うように、ゼロ点調整部がゼロ点調整を行
い、スパン調整部がスパン調整を行った後に温度の測定
を行い、該計測結果である測定温度に基づいて、測定温
度スパン設定部は測定温度が測定温度スパン内に入るよ
うに測定温度スパンを再び設定して、再度ゼロ点調整お
よびスパン調整を行い、該設定された測定温度スパンに
て温度の測定を行うことにより、最大測定温度スパンと
比べて狭い測定温度スパンとA/D変換部の変換範囲と
を対応させることができる。
According to the second aspect of the present invention, the measurement temperature span setting unit sets the maximum measurement temperature span to the measurement temperature span, and the measurement temperature span and the conversion range of the A / D conversion unit match. As described above, the zero point adjustment unit performs the zero point adjustment, the span adjustment unit performs the span adjustment, and then the temperature is measured, and the measured temperature span setting unit determines the measured temperature based on the measured temperature as the measurement result. Set the measurement temperature span again so that it falls within the measurement temperature span, perform zero point adjustment and span adjustment again, and measure the temperature at the set measurement temperature span. The narrow measurement temperature span and the conversion range of the A / D converter can be associated with each other.

【0013】[0013]

【実施例】本発明の温度測定装置の一実施例を図1、図
2を用いて説明する。図1は温度測定装置のブロック図
である。図2は、温度測定装置の動作を示すフローチャ
ートである。
DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the temperature measuring device of the present invention will be described with reference to FIGS. FIG. 1 is a block diagram of a temperature measuring device. FIG. 2 is a flowchart showing the operation of the temperature measuring device.

【0014】図1において、1は温度センサを示す。温
度センサ1は、気温や水温等を検出するもので、その温
度に応じて変化する抵抗値を有し、最大測定温度スパン
[Tmin℃〜Tmax℃]の範囲内の温度が計測可能であ
る。
In FIG. 1, reference numeral 1 indicates a temperature sensor. The temperature sensor 1 detects an air temperature, a water temperature, and the like, has a resistance value that changes according to the temperature, and can measure a temperature within a maximum measurement temperature span [Tmin ° C to Tmax ° C].

【0015】抵抗−電圧変換部2は温度センサ1に一定
電流を供給して、温度Tr℃のときの抵抗値を電圧値Er
に変換する。
The resistance-voltage converter 2 supplies a constant current to the temperature sensor 1 to change the resistance value at the temperature Tr ° C. to the voltage value Er.
Convert to.

【0016】A/D変換部3は、アナログ値である電圧
値をデジタル値に変換するものである。
The A / D converter 3 converts a voltage value, which is an analog value, into a digital value.

【0017】測定温度スパン設定部11は、後述する演
算処理部8が出力する測定温度値に基づいて、測定温度
スパン[Ta℃〜Tb℃]を設定するものである。測定温
度スパン[Ta℃〜Tb℃]とは、最大測定温度スパン
[Tmin℃〜Tmax℃]の範囲内で、測定に使用するため
に指定する測定温度の範囲であり、次式を満たす。
The measurement temperature span setting unit 11 sets the measurement temperature span [Ta ° C to Tb ° C] based on the measured temperature value output by the arithmetic processing unit 8 described later. The measurement temperature span [Ta [deg.] C. to Tb [deg.] C.] is the range of the measurement temperature specified for use in the measurement within the range of the maximum measurement temperature span [Tmin [deg.] C. to Tmax [deg.] C.) and satisfies the following equation.

【0018】Tmin℃≦Ta℃<Tb℃≦Tmax℃ 最大測定温度スパン[Tmin℃〜Tmax℃]のときの電圧
値の幅[Emin〜Emax]と、A/D変換部3の分解能
(例えば量子化ビット数が8bitであれば、256段
階である)とを対応させる場合に比べ、測定温度スパン
[Ta℃〜Tb℃]のときの電圧値の幅[Ea〜Eb]とA
/D変換部3の分解能とを対応させる方が精度は高くな
る。
Tmin ° ≤Ta ° C <Tb ° C≤Tmax ° C The width of voltage value [Emin to Emax] at the maximum measurement temperature span [Tmin ° to Tmax ° C] and the resolution of the A / D converter 3 (for example, quantum If the number of digitized bits is 8 bits, there are 256 stages), as compared with the case of corresponding to the range of voltage values [Ea to Eb] and A at the measurement temperature span [Ta ° C to Tb ° C].
The accuracy is higher when the resolution of the / D converter 3 is associated.

【0019】例えば[0℃〜256℃]の範囲に対応す
る電圧値の幅を8Bitの分解能でA/D変換すると、
デジタルの値1と温度1℃分に相当する電圧値とが対応
し、一方[0℃〜16℃]の範囲に対応する電圧値の幅
を8Bitの分解能でA/D変換すると、デジタルの値
1と温度1/16℃分に相当する電圧とが対応するの
で、測定温度スパンを狭く設定すると計測精度は高くな
ることとなる。
For example, when the width of the voltage value corresponding to the range of [0 ° C. to 256 ° C.] is A / D converted with a resolution of 8 Bit,
When the digital value 1 corresponds to the voltage value corresponding to the temperature of 1 ° C., and the width of the voltage value corresponding to the range of [0 ° C. to 16 ° C.] is A / D converted with a resolution of 8 Bit, the digital value is obtained. Since 1 corresponds to a voltage corresponding to a temperature of 1/16 ° C., the measurement accuracy will be high if the measurement temperature span is set narrow.

【0020】つまり、測定温度スパン[Ta℃〜Tb℃]
について計測を行えば、A/D変換部3の分解能と対応
する測定温度スパン[Ta℃〜Tb℃]は最大測定温度ス
パン[Tmin℃〜Tmax℃]と比べて狭いので、A/D変
換部3の分解能が同一であっても相対的に精度が向上す
る。
That is, the measurement temperature span [Ta ° C to Tb ° C]
The measurement temperature span [Ta ° C to Tb ° C] corresponding to the resolution of the A / D converter 3 is narrower than the maximum measurement temperature span [Tmin ° C to Tmax ° C]. Even if the resolutions of 3 are the same, the accuracy is relatively improved.

【0021】しかし、計算上は測定温度スパンを無限に
狭めれば、精度は無限に向上することとなるが、温度セ
ンサの精度に限界があり、測定温度スパンを一定の幅以
下に狭めて精度向上を図っても計測誤差により意味をな
す値を出力しないので、測定温度スパンには計測誤差の
影響を受けない最小の温度幅が存在する。従って、測定
温度スパン[Ta℃〜Tb℃]は最大測定温度スパン[T
min℃〜Tmax℃]より狭く、かつ最小の温度幅より広く
設定する。
However, in the calculation, if the measurement temperature span is narrowed infinitely, the accuracy will be improved infinitely, but the accuracy of the temperature sensor is limited, and the measurement temperature span is narrowed to a certain width or less. Even if it is improved, a meaningful value is not output due to the measurement error, so that the measurement temperature span has a minimum temperature width that is not affected by the measurement error. Therefore, the measurement temperature span [Ta ℃ ~ Tb ℃] is the maximum measurement temperature span [T
[min ° C to Tmax ° C] and wider than the minimum temperature range.

【0022】ゼロ点調整部5は、ブリッジ回路によって
構成されており、測定温度スパン[Ta℃〜Tb℃]の下
限温度Ta℃における温度センサ1にかかる電圧値Eaを
基準とし、温度Tr℃のときに電圧値(Er−Ea)が得
られるように、温度センサ1から取り出す電圧値Erか
ら基準の電圧値Eaを除去するゼロ点調整を行う。
The zero-point adjusting unit 5 is composed of a bridge circuit, and is based on the voltage value Ea applied to the temperature sensor 1 at the lower limit temperature Ta ° C. of the measurement temperature span [Ta ° C. to Tb ° C.] and the temperature Tr ° C. Zero point adjustment is performed to remove the reference voltage value Ea from the voltage value Er extracted from the temperature sensor 1 so that the voltage value (Er-Ea) can be obtained at any time.

【0023】スパン調整部6は、負帰還のオペアンプに
より構成されており、測定温度スパン[Ta℃〜Tb℃]
に対応する電圧値の幅[Ea〜Eb]をA/D変換部3の
電圧の変換範囲に合うように電圧値を増幅して調整し、
該増幅した電圧値EgをA/D変換部3に入力する。
The span adjusting unit 6 is composed of a negative feedback operational amplifier, and has a measurement temperature span [Ta ° C to Tb ° C].
The width [Ea to Eb] of the voltage value corresponding to is adjusted by amplifying the voltage value so as to match the conversion range of the voltage of the A / D conversion unit 3,
The amplified voltage value Eg is input to the A / D conversion unit 3.

【0024】A/D変換部3は、電圧値(Er−Ea)を
増幅したアナログ値の電圧値Egからデジタル値Dに変
換し、該デジタル値Dを演算処理部8に入力する。
The A / D converter 3 converts the analog voltage value Eg obtained by amplifying the voltage value (Er-Ea) into a digital value D, and inputs the digital value D to the arithmetic processing unit 8.

【0025】制御部7は、測定温度スパン設定部11が
設定した測定温度スパン[Ta℃〜Tb℃]を、ゼロ点調
整部5およびスパン調整部6に入力する。ゼロ点調整部
5は制御部7から入力された測定温度スパン[Ta℃〜
Tb℃]に基づいて調整を行い、スパン調整部6も該測
定温度スパン[Ta℃〜Tb℃]に基づいて調整を行う。
The control unit 7 inputs the measurement temperature span [Ta ° C. to Tb ° C.] set by the measurement temperature span setting unit 11 to the zero point adjusting unit 5 and the span adjusting unit 6. The zero-point adjusting unit 5 receives the measurement temperature span [Ta ° C ~
Tb [deg.] C.], and the span adjusting unit 6 also adjusts based on the measured temperature span [Ta [deg.] C. to Tb [deg.] C.].

【0026】演算処理部8は、前記デジタル値Dを測定
温度スパン[Ta℃〜Tb℃]の下限温度Ta℃からの相
対温度Th℃に変換し、該相対温度Th℃と前記測定温度
スパンの下限温度Ta℃とを加え合わせて最終的に測定
温度Tr℃を算出する。
The arithmetic processing unit 8 converts the digital value D into a relative temperature Th ° C from the lower limit temperature Ta ° C of the measurement temperature span [Ta ° C to Tb ° C], and calculates the relative temperature Th ° C and the measurement temperature span. The lower limit temperature Ta ° C is added and finally measured temperature Tr ° C is calculated.

【0027】出力部9は、演算処理部8の算出する測定
温度値を外部に出力するものであり、液晶表示したり、
信号として出力する。記憶部10は、測定温度値および
測定温度スパン設定部11と演算処理部8と制御部7と
の動作プログラムを記憶する。
The output unit 9 outputs the measured temperature value calculated by the arithmetic processing unit 8 to the outside and displays it on a liquid crystal display or
Output as a signal. The storage unit 10 stores operation programs for the measured temperature value and the measured temperature span setting unit 11, the arithmetic processing unit 8, and the control unit 7.

【0028】以上のように構成された温度測定装置の動
作ならびに測定温度スパン設定部11における測定温度
スパンの設定方法を図2に示すフローチャートに基づい
て説明する。また、最大測定温度スパンを[0℃〜25
6℃]とし、測定時の対象となる温度は150.5℃で
あるとして以下の説明を行うこととする。
The operation of the temperature measuring device configured as described above and the method of setting the measurement temperature span in the measurement temperature span setting unit 11 will be described with reference to the flowchart shown in FIG. Also, set the maximum measurement temperature span to [0 ° C to 25
6 ° C.] and the target temperature at the time of measurement is 150.5 ° C., and the following description will be given.

【0029】まず、測定温度スパン設定部11は、測定
温度スパン[Ta℃〜Tb℃]を最大測定温度スパンであ
る[0℃〜256℃]に設定する(ステップ101)。
First, the measurement temperature span setting unit 11 sets the measurement temperature span [Ta ° C to Tb ° C] to the maximum measurement temperature span [0 ° C to 256 ° C] (step 101).

【0030】制御部7がゼロ点調整部5およびスパン調
整部6に測定温度スパン[0℃〜256℃]を入力し、
該測定温度スパン[0℃〜256℃]に基づいて、ゼロ
点調整部5がゼロ点調整を行い、スパン調整部6がスパ
ン調整を行う(ステップ102、103)。測定温度ス
パンを[0℃〜256℃]としたのは、従来の技術にお
いて説明した温度測定装置で、値不定の温度を測定する
ときは測定温度スパンを広く設定するのと同様の理由に
よるものである。
The control unit 7 inputs the measured temperature span [0 ° C to 256 ° C] into the zero point adjusting unit 5 and the span adjusting unit 6,
Based on the measured temperature span [0 ° C. to 256 ° C.], the zero point adjustment unit 5 performs zero point adjustment, and the span adjustment unit 6 performs span adjustment (steps 102 and 103). The measurement temperature span is set to [0 ° C. to 256 ° C.] for the same reason as when the temperature measurement device described in the prior art is used, and the measurement temperature span is set wide when measuring an indefinite temperature. Is.

【0031】抵抗−電圧変換部2は、温度センサの抵抗
値を電圧値に変換する(ステップ104)。既にゼロ点
調整およびスパン調整が行われているので、該電圧値の
とりうる範囲はA/D変換部3がデジタル値に変換しう
る電圧の範囲と一致する。
The resistance-voltage converter 2 converts the resistance value of the temperature sensor into a voltage value (step 104). Since the zero point adjustment and the span adjustment have already been performed, the range of the voltage value can be the same as the range of the voltage that the A / D converter 3 can convert into the digital value.

【0032】そこで、A/D変換部3は、該電圧値を8
bit(256段階)のデジタル値に変換する(ステッ
プ105)。測定温度スパン[0℃〜256℃]の温度
幅256℃にデジタル値の256段階が対応するので、
デジタル値の1は、温度1℃を示す。従って、測温対象
物の温度150.5℃に対応する電圧値より、デジタル
値150が得られる。
Therefore, the A / D converter 3 changes the voltage value to 8
It is converted into a digital value of bit (256 steps) (step 105). Since the temperature range of the measurement temperature span [0 ° C to 256 ° C] is 256 ° C, 256 stages of digital values correspond,
A digital value of 1 indicates a temperature of 1 ° C. Therefore, the digital value 150 is obtained from the voltage value corresponding to the temperature of the temperature measurement object of 150.5 ° C.

【0033】デジタル値の1に対して温度1℃の比率で
あることは測定温度スパンより算出できるので、演算処
理部8はこの比率を用いて、デジタル値150を変換し
て温度150℃を得る。該温度150℃は、測定温度ス
パン[0℃〜256℃]の下限温度0℃からの相対温度
であるから、相対温度150℃と前記測定温度スパンの
下限温度0℃とを加え合わせて最終的に測定温度150
℃を算出する(ステップ106)。
Since the ratio of the temperature of 1 ° C. to the digital value of 1 can be calculated from the measurement temperature span, the arithmetic processing unit 8 uses this ratio to convert the digital value 150 to obtain the temperature of 150 ° C. . Since the temperature of 150 ° C. is a relative temperature from the lower limit temperature of 0 ° C. of the measurement temperature span [0 ° C. to 256 ° C.], the relative temperature of 150 ° C. and the lower limit temperature of the measurement temperature span of 0 ° C. are added to obtain the final temperature. Measured temperature 150
Calculate ° C (step 106).

【0034】測定温度150℃は測定スパン設定部11
に入力され、測定スパン設定部11は該測定温度が12
8℃以上か否かを判断する(ステップ107)。
The measuring temperature of 150 ° C. is measured span setting section 11
Is input to the measurement span setting unit 11 and the measurement temperature is set to 12
It is determined whether the temperature is 8 ° C. or higher (step 107).

【0035】測定温度が128℃より低ければ、測定ス
パン設定部11は測定温度スパンを[0℃〜128℃]
に設定する(ステップ108)。測定温度が128℃以
上であれば、測定スパン設定部11は測定温度スパンを
[128℃〜256℃]に設定する(ステップ10
9)。現在測定されている温度は150℃であるので、
測定温度スパンは[128℃〜256℃]に設定され
る。
If the measurement temperature is lower than 128 ° C., the measurement span setting section 11 sets the measurement temperature span to [0 ° C. to 128 ° C.].
(Step 108). If the measurement temperature is 128 ° C or higher, the measurement span setting unit 11 sets the measurement temperature span to [128 ° C to 256 ° C] (step 10).
9). Since the temperature currently measured is 150 ° C,
The measurement temperature span is set to [128 ° C to 256 ° C].

【0036】次に、新たに設定された測定温度スパン
[128℃〜256℃]に従って、ゼロ点調整(ステッ
プ110)およびスパン調整(ステップ111)を行
う。
Next, zero point adjustment (step 110) and span adjustment (step 111) are performed according to the newly set measurement temperature span [128 ° C. to 256 ° C.].

【0037】抵抗−電圧変換部2は、温度センサ1の抵
抗値を電圧値に変換する(ステップ112)。既に新た
に設定された測定温度スパン[128℃〜256℃]に
従ってゼロ点調整およびスパン調整が行われているの
で、該電圧値のとりうる範囲はA/D変換部3がデジタ
ル値に変換しうる電圧の範囲と一致する。
The resistance-voltage converter 2 converts the resistance value of the temperature sensor 1 into a voltage value (step 112). Since the zero point adjustment and the span adjustment are already performed according to the newly set measurement temperature span [128 ° C. to 256 ° C.], the range of the voltage value can be converted into a digital value by the A / D conversion unit 3. Voltage range.

【0038】そこで、A/D変換部3は、該アナログ電
圧値を8bitのデジタル値に変換する(ステップ11
3)。即ち、A/D変換部3は、測定温度スパン[12
8℃〜256℃]における測定温度に対応する抵抗値か
ら変換して得た電圧値を、8bit(256段階)のデ
ジタル値に変換する。測定温度スパン[128℃〜25
6℃]の温度幅128℃はデジタル値の256段階と対
応しているので、デジタル値の1は、温度0.5℃を示
す。従って、測温対象物の温度が150.5℃であるな
らば128℃からの温度である22.5℃に対応する電
圧値から、デジタル値45が得られる。
Therefore, the A / D converter 3 converts the analog voltage value into an 8-bit digital value (step 11).
3). That is, the A / D conversion unit 3 measures the measurement temperature span [12
The voltage value obtained by converting from the resistance value corresponding to the measured temperature at 8 ° C. to 256 ° C.] is converted into a digital value of 8 bits (256 stages). Measurement temperature span [128 ℃ -25
6 ° C.] temperature range of 128 ° C. corresponds to 256 digital values, so a digital value of 1 indicates a temperature of 0.5 ° C. Therefore, if the temperature of the temperature measurement object is 150.5 ° C., the digital value 45 is obtained from the voltage value corresponding to 22.5 ° C., which is the temperature from 128 ° C.

【0039】演算処理部8は、デジタル値の1に対して
温度0.5℃の比率でデジタル値45を変換して温度2
2.5℃を得る。該温度22.5℃は、測定温度スパン
[128℃〜256℃]の下限温度128℃からの相対
温度である。該相対温度22.5℃と前記測定温度スパ
ンの下限温度128℃とを加え合わせて最終的に測定温
度150.5℃を算出する(ステップ114)。
The arithmetic processing unit 8 converts the digital value 45 at a ratio of 0.5 ° C. to 1 of the digital value to obtain the temperature of 2
Obtain 2.5 ° C. The temperature 22.5 ° C. is a relative temperature from the lower limit temperature 128 ° C. of the measurement temperature span [128 ° C. to 256 ° C.]. The relative temperature of 22.5 ° C. and the lower limit temperature of the measured temperature span of 128 ° C. are added together to finally calculate the measured temperature of 150.5 ° C. (step 114).

【0040】測定温度は記憶部10に格納され、あるい
は液晶ディスプレイ等により外部に出力される(ステッ
プ115、116)。
The measured temperature is stored in the storage unit 10 or is output to the outside by a liquid crystal display or the like (steps 115 and 116).

【0041】なお、本実施例では最大測定温度スパンを
[0℃〜256℃]として説明したが、最大測定温度ス
パンは温度センサの性能により決定されるものであるの
で、[0℃〜256℃]に限定されるものではない。
Although the maximum measurement temperature span is described as [0 ° C. to 256 ° C.] in this embodiment, the maximum measurement temperature span is determined by the performance of the temperature sensor, and therefore, [0 ° C. to 256 ° C.]. ] Is not limited thereto.

【0042】また、測定温度スパンの再設定において、
[0℃〜128℃]と[128℃〜256℃]との温度
の幅が128℃の測定温度スパンを用いたが、測定温度
スパンは128℃に限られるものではない。例えば、5
0℃あるいは10℃等の測定温度スパンを用いてもよ
い。
Further, in resetting the measurement temperature span,
Although a measurement temperature span having a temperature range of [0 ° C to 128 ° C] and [128 ° C to 256 ° C] of 128 ° C is used, the measurement temperature span is not limited to 128 ° C. For example, 5
A measurement temperature span such as 0 ° C. or 10 ° C. may be used.

【0043】本実施例では測定温度スパンの再設定は1
回しか行っていないが、例えば、128℃の測定温度ス
パンで測定した後に、さらに64℃の測定温度スパンで
測定を行うなどのように数回測定温度スパンを行うよう
にしてもよい。
In this embodiment, the resetting of the measurement temperature span is 1
Although it is performed only once, the measurement temperature span may be performed several times, for example, after the measurement temperature span of 128 ° C. is measured and then the measurement temperature span of 64 ° C. is further performed.

【0044】また、本実施例では抵抗センサ1の示す抵
抗値と抵抗−電圧変換部2により変換された電圧値とは
比例の関係にあり、従って対象物の温度とデジタル値と
の関係も比例の関係にあるが、抵抗センサの示す抵抗値
と抵抗−電圧変換部により変換された電圧値の関係は比
例の関係に限られるものではなく、一定の関係を有して
いれば足りる。例えば、上記関係が曲線の式などの関数
で表されるような場合は、対象物の温度とA/D変換後
のデジタル値も同様の関係を有するので、演算処理部に
おいて逆関数を用いてデジタル値から測定温度値を算出
すればよい。
Further, in the present embodiment, the resistance value indicated by the resistance sensor 1 and the voltage value converted by the resistance-voltage conversion unit 2 are in a proportional relationship, so that the relationship between the temperature of the object and the digital value is also proportional. However, the relationship between the resistance value indicated by the resistance sensor and the voltage value converted by the resistance-voltage conversion unit is not limited to the proportional relationship, and a constant relationship is sufficient. For example, when the above relationship is represented by a function such as a curve formula, the temperature of the object and the digital value after A / D conversion have the same relationship, and therefore the inverse function is used in the arithmetic processing unit. The measured temperature value may be calculated from the digital value.

【0045】[0045]

【発明の効果】本発明の温度測定装置は上述のように構
成してあるから、請求項1記載の発明にあっては、まず
最大測定温度スパンにて、ゼロ点調整、スパン調整を行
った後に温度の測定を行い、該計測結果である温度に基
づいて、測定温度スパン内に測定温度が入るように測定
温度スパンを再び設定し、再度ゼロ点調整およびスパン
調整を行い、該設定されたスパンにて温度の測定を行
い、最大測定温度スパンと比べて狭い測定温度スパンと
A/D変換部の変換範囲とを対応させることができるの
で、測定対象である温度の変化が大きく、どのような値
をとるか不定の場合においても、精度良く温度を測定で
きる温度測定方法を提供することができるという効果を
奏する。
Since the temperature measuring device of the present invention is constructed as described above, according to the invention of claim 1, first, zero point adjustment and span adjustment are performed at the maximum measurement temperature span. After that, the temperature was measured, the measurement temperature span was set again so that the measurement temperature was within the measurement temperature span, and the zero point adjustment and the span adjustment were performed again based on the temperature as the measurement result. Since the temperature is measured in the span and the narrower measurement temperature span than the maximum measurement temperature span and the conversion range of the A / D conversion unit can be associated with each other, the change in the temperature to be measured is large. It is possible to provide a temperature measuring method capable of accurately measuring the temperature even when it takes an uncertain value.

【0046】請求項2記載の発明にあっては、前記請求
項1の発明を具現化して、測定対象である温度の変化が
大きく、どのような値をとるか不定の場合においても、
精度良く温度を測定できる温度測定装置を提供すること
ができるという効果を奏する。
According to a second aspect of the present invention, the invention of the first aspect is embodied, and even when the temperature to be measured is greatly changed and it is uncertain what value to take,
It is possible to provide a temperature measurement device that can measure temperature with high accuracy.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の温度測定装置の一実施例を示すブロッ
ク図である。
FIG. 1 is a block diagram showing an embodiment of a temperature measuring device of the present invention.

【図2】上記実施例の温度測定装置の動作を示すフロー
チャートである。
FIG. 2 is a flowchart showing the operation of the temperature measuring device of the above embodiment.

【図3】従来の温度測定装置のブロック図である。FIG. 3 is a block diagram of a conventional temperature measuring device.

【符号の説明】[Explanation of symbols]

1 温度センサ 2 抵抗−電圧変換部 3 A/D変換部 5 ゼロ点調整部 6 スパン調整部 8 演算処理部 11 測定温度スパン調整部 1 Temperature Sensor 2 Resistance-Voltage Converter 3 A / D Converter 5 Zero Point Adjuster 6 Span Adjuster 8 Calculation Processor 11 Measurement Temperature Span Adjuster

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 温度に応じて抵抗値の変化する温度セン
サに一定電流を供給して抵抗値を電圧値に変換し、電圧
値をデジタル値に変換し、該デジタル値から測定温度値
を算出する温度測定方法において、最大測定温度スパン
にて温度の測定を行い、該計測結果に基づいて、測定温
度スパン内に計測温度が入るように、ゼロ点調整および
スパン調整を行い、該設定された測定温度スパンにて再
び温度の測定を行うことを特徴とする温度計測方法。
1. A constant current is supplied to a temperature sensor whose resistance value changes according to temperature, the resistance value is converted into a voltage value, the voltage value is converted into a digital value, and the measured temperature value is calculated from the digital value. In the temperature measuring method, the temperature is measured in the maximum measurement temperature span, and based on the measurement result, the zero point adjustment and the span adjustment are performed so that the measurement temperature falls within the measurement temperature span, and the setting is performed. A temperature measuring method characterized in that the temperature is measured again in a measurement temperature span.
【請求項2】 温度に応じて抵抗値の変化する温度セン
サと、該温度センサに一定電流を供給して抵抗値を電圧
値に変換する抵抗−電圧変換部と、測定温度スパンの下
限温度のときに前記温度センサにかかる電圧値を基準と
してゼロ点調整を行うゼロ点調整部と、前記測定温度ス
パンをA/D変換部の変換範囲の幅に合わせるようにス
パン調整を行うスパン調整部と、センサにかかる電圧値
をデジタル値に変換するA/D変換部と、該デジタル値
を測定温度値に変換する演算処理部とを有する温度測定
装置において、最大測定温度スパンにて温度の計測を行
い、該計測温度に基づいて、測定温度スパン内に計測温
度が入るように、測定温度スパンを設定する測定温度ス
パン設定部を設けたことを特徴とする温度計測装置。
2. A temperature sensor whose resistance value changes according to temperature, a resistance-voltage conversion unit which supplies a constant current to the temperature sensor to convert the resistance value into a voltage value, and a lower limit temperature of a measurement temperature span. Sometimes, a zero point adjustment unit that performs zero point adjustment based on the voltage value applied to the temperature sensor, and a span adjustment unit that performs span adjustment so that the measured temperature span matches the width of the conversion range of the A / D conversion unit. In a temperature measuring device having an A / D conversion unit for converting a voltage value applied to a sensor into a digital value and an arithmetic processing unit for converting the digital value into a measured temperature value, temperature measurement is performed in a maximum measurement temperature span. The temperature measuring device is provided with a measurement temperature span setting unit that sets the measurement temperature span so that the measurement temperature falls within the measurement temperature span based on the measurement temperature.
JP25796994A 1994-10-24 1994-10-24 Method and instrument for measuring temperature Withdrawn JPH08122166A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25796994A JPH08122166A (en) 1994-10-24 1994-10-24 Method and instrument for measuring temperature

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25796994A JPH08122166A (en) 1994-10-24 1994-10-24 Method and instrument for measuring temperature

Publications (1)

Publication Number Publication Date
JPH08122166A true JPH08122166A (en) 1996-05-17

Family

ID=17313736

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25796994A Withdrawn JPH08122166A (en) 1994-10-24 1994-10-24 Method and instrument for measuring temperature

Country Status (1)

Country Link
JP (1) JPH08122166A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100801629B1 (en) * 2005-09-27 2008-02-11 삼창기업 주식회사 Method for inspecting and repairing a PCB of atomic power plant facilities
KR100806937B1 (en) * 2006-07-25 2008-02-22 삼창기업 주식회사 Apparatus for converting analog to digital signal based on VME bus used in nuclear plant safety system
KR100806935B1 (en) * 2006-07-25 2008-02-22 삼창기업 주식회사 Apparatus for converting analog to digital signal based on VME bus used in safety system of nuclear plant
KR100806934B1 (en) * 2006-07-25 2008-02-22 삼창기업 주식회사 Apparatus for inputting digital signal based on VME bus used in nuclear plant safety system and method therefor
KR100835651B1 (en) * 2006-07-24 2008-06-05 삼창기업 주식회사 Resistance-voltage converting module used in control system of nuclear plant
KR100835653B1 (en) * 2006-07-25 2008-06-05 삼창기업 주식회사 Current-Voltage Converting Module used in nuclear plant safety system
KR100835646B1 (en) * 2006-07-25 2008-06-05 삼창기업 주식회사 Freqeuncy voltage converting module used in control system of nuclear plant
KR100848882B1 (en) * 2006-07-25 2008-07-28 삼창기업 주식회사 Apparatus for processing digital signal in safety system of nuclear plant and method therefor

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100801629B1 (en) * 2005-09-27 2008-02-11 삼창기업 주식회사 Method for inspecting and repairing a PCB of atomic power plant facilities
KR100835651B1 (en) * 2006-07-24 2008-06-05 삼창기업 주식회사 Resistance-voltage converting module used in control system of nuclear plant
KR100806937B1 (en) * 2006-07-25 2008-02-22 삼창기업 주식회사 Apparatus for converting analog to digital signal based on VME bus used in nuclear plant safety system
KR100806935B1 (en) * 2006-07-25 2008-02-22 삼창기업 주식회사 Apparatus for converting analog to digital signal based on VME bus used in safety system of nuclear plant
KR100806934B1 (en) * 2006-07-25 2008-02-22 삼창기업 주식회사 Apparatus for inputting digital signal based on VME bus used in nuclear plant safety system and method therefor
KR100835653B1 (en) * 2006-07-25 2008-06-05 삼창기업 주식회사 Current-Voltage Converting Module used in nuclear plant safety system
KR100835646B1 (en) * 2006-07-25 2008-06-05 삼창기업 주식회사 Freqeuncy voltage converting module used in control system of nuclear plant
KR100848882B1 (en) * 2006-07-25 2008-07-28 삼창기업 주식회사 Apparatus for processing digital signal in safety system of nuclear plant and method therefor

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