JPH0990306A - Substrate drying nozzle - Google Patents
Substrate drying nozzleInfo
- Publication number
- JPH0990306A JPH0990306A JP27057495A JP27057495A JPH0990306A JP H0990306 A JPH0990306 A JP H0990306A JP 27057495 A JP27057495 A JP 27057495A JP 27057495 A JP27057495 A JP 27057495A JP H0990306 A JPH0990306 A JP H0990306A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- gas
- drying
- buffer chamber
- drying nozzle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、気体を噴射して液晶パ
ネル用ガラス基板やプリント基板等を乾燥するノズルに
関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a nozzle for injecting a gas to dry a glass substrate for a liquid crystal panel, a printed circuit board or the like.
【0002】[0002]
【従来の技術】液晶用ガラス基板、プリント基板の薬液
処理を行った後、純水を用いて洗浄を行い、乾燥空気、
または、窒素等の気体をノズルから噴射して基板を乾燥
する。この乾燥方式を、通称エアナイフ乾燥方式と呼ん
でいる。2. Description of the Related Art A glass substrate for liquid crystal and a printed circuit board are chemically treated and then washed with pure water and dried with air.
Alternatively, a gas such as nitrogen is jetted from a nozzle to dry the substrate. This drying method is commonly called an air knife drying method.
【0003】基板の大きさが500×600mmと大型
化するに伴い、乾燥ノズルの長さも600〜700mm
と長くなり基板の全幅に気体を均一に噴射することが困
難となっている。As the size of the substrate is increased to 500 × 600 mm, the length of the drying nozzle is also 600 to 700 mm.
Therefore, it becomes difficult to uniformly inject the gas over the entire width of the substrate.
【0004】基板を均一に乾燥するため乾燥ノズルに印
加する気体の圧力を高くしたり、乾燥ノズルを2本にし
たり、あるいは、噴射口のスリット幅を数十ミクロンと
狭くし、また、基板に対する噴射角度を変える等して問
題解決を計っている。In order to uniformly dry the substrate, the pressure of the gas applied to the drying nozzle is increased, the number of drying nozzles is increased to two, or the slit width of the injection port is narrowed to several tens of microns. We are trying to solve the problem by changing the injection angle.
【0005】[0005]
【発明が解決しようとする課題】しかしながら、気体の
圧力を高くすると気体の消費量が多くなるだけでなく、
装置内のパーティクルが飛散し、それが基板に再付着し
基板の乾燥品質を低下させるという欠陥があった。However, increasing the gas pressure not only increases the gas consumption, but also increases the gas consumption.
There was a defect that particles in the apparatus were scattered and reattached to the substrate to deteriorate the drying quality of the substrate.
【0006】さらに、30〜50μmとスリット幅を狭
くするには、一般的なステンレス鋼等の材料では精度が
確保できないためセラミックスやサファイヤ等加工が困
難な材料を使用しなければならないという欠陥があっ
た。Further, in order to narrow the slit width to 30 to 50 μm, there is a defect that materials such as ceramics and sapphire, which are difficult to process, must be used because accuracy cannot be ensured with materials such as general stainless steel. It was
【0007】また、この種の乾燥ノズルは、スリット幅
のわずかな変化が乾燥ムラにつながるという欠陥があっ
た。Further, this type of drying nozzle has a defect that a slight change in slit width leads to uneven drying.
【0008】本発明の目的は、一般的なステンレス鋼等
の材料を用いて乾燥ムラのない均一な基板乾燥を可能に
し、さらに、低圧力で効率よく乾燥を行うことを可能と
した基板乾燥ノズルを提供することである。An object of the present invention is to make it possible to uniformly dry a substrate by using a material such as general stainless steel, and to dry the substrate efficiently at a low pressure. Is to provide.
【0009】また、本発明の他の目的は、パーティクル
付着のない高品質乾燥を可能とした基板乾燥ノズルを提
供することである。Another object of the present invention is to provide a substrate drying nozzle capable of high quality drying without particle adhesion.
【0010】[0010]
【問題を解決するための手段】上記目的を達成するた
め、本発明は、気体供給口と第1の緩衝室と気体絞り手
段と整流手段を備えた第2の緩衝室とスリット状噴射口
からなることを特徴とする。To achieve the above object, the present invention comprises a gas supply port, a first buffer chamber, a second buffer chamber provided with a gas throttle means and a rectifying means, and a slit-shaped jet port. It is characterized by
【0011】[0011]
【実施例】以下本発明を図面に基づいて説明する。DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below with reference to the drawings.
【0012】図1は乾燥ノズルの配設状態を示す概略斜
視図である。回転ローラ(図示されず)等を用いて水平
な状態で基板1を2の方向へ搬送する。FIG. 1 is a schematic perspective view showing the arrangement of the drying nozzles. The substrate 1 is conveyed in the direction 2 in a horizontal state by using a rotating roller (not shown) or the like.
【0013】乾燥ノズル3は濡れた基板の表裏両面に近
接して配設され、気体を噴射して乾燥する。気体として
は清浄な乾燥空気、または、窒素を使用する。The drying nozzles 3 are arranged close to both the front and back surfaces of the wet substrate, and spray gas to dry the substrate. Clean dry air or nitrogen is used as the gas.
【0014】図2は本発明の基板乾燥ノズルの縦断面
図、図3は側面図、図4は本発明の気体整流手段となる
波板の斜視図である。FIG. 2 is a vertical sectional view of the substrate drying nozzle of the present invention, FIG. 3 is a side view thereof, and FIG. 4 is a perspective view of a corrugated plate serving as the gas rectifying means of the present invention.
【0015】乾燥ノズル2は12と、13に2分割さ
れ、ネジ14によって当接されている。乾燥のための圧
縮気体は供給口4から供給され、第1の緩衝室5に導入
され、絞りギャップ6で一旦絞った後、第2の緩衝室7
で再度圧力の均一化を行うと同時に整流板8で整流して
スリット状の噴射口9から気体を噴射する。The drying nozzle 2 is divided into 12 and 13 and is abutted by screws 14. The compressed gas for drying is supplied from the supply port 4, introduced into the first buffer chamber 5, once throttled by the throttle gap 6, and then the second buffer chamber 7
At the same time, the pressure is equalized again, and at the same time, the gas is jetted from the slit-shaped jet port 9 by being straightened by the straightening plate 8.
【0016】第2の緩衝室7に図4に示す波板を狹設す
ることによって、噴射口9から気体が均一に噴射するよ
うに作用して、均一な基板乾燥が可能となる。By providing the corrugated plate shown in FIG. 4 in the second buffer chamber 7, the gas is uniformly ejected from the ejection port 9 and uniform substrate drying is possible.
【0017】従来の乾燥ノズルには、均一な乾燥を行う
ため噴射口9のスリット幅を30〜50μmにしなけれ
ばならなかったが、本発明では、絞りギャップ6、第2
の緩衝室7、整流板8を付加することにより噴射口9の
スリット幅を0.08〜0.15mmと大きくすること
ができるので一般のステンレス鋼の使用が可能となっ
た。In the conventional drying nozzle, the slit width of the injection port 9 had to be 30 to 50 μm in order to perform uniform drying, but in the present invention, the aperture gap 6 and the second gap.
Since the slit width of the injection port 9 can be increased to 0.08 to 0.15 mm by adding the buffer chamber 7 and the rectifying plate 8 of (1), general stainless steel can be used.
【0018】波板8の高さ10を、第2の緩衝室7の幅
11より大きいか、または、等しくして狹設することに
より、波板8が第2の緩衝室7の内部に固定されるので
安定した気体の整流が行われる。By fixing the height 10 of the corrugated plate 8 to be larger than or equal to the width 11 of the second buffer chamber 7, the corrugated plate 8 is fixed inside the second buffer chamber 7. As a result, stable gas rectification is performed.
【0019】また、整流板により基板全幅にわたり均一
な気体噴射ができるため、気体の圧力も従来の1.5〜
2.0kgf/cm2 から0.5kgf/cm2 と小さ
くすることが可能となった。また、圧力が低下したこと
により気体の使用効率が向上しただけでなく、パーティ
クルの発生も少なくなり乾燥品質が向上した。Further, since the gas is uniformly jetted over the entire width of the substrate by the straightening plate, the pressure of the gas is 1.5 to 1.5.
It has become possible to reduce it from 2.0 kgf / cm 2 to 0.5 kgf / cm 2 . In addition, not only the gas use efficiency was improved due to the reduced pressure, but also the generation of particles was reduced and the drying quality was improved.
【0020】[0020]
【発明の効果】以上説明したように、本発明は次のよう
な効果を奏するものである。As described above, the present invention has the following effects.
【0021】基板を均一にムラなく乾燥し、低圧力、少
流量の気体で効率的に乾燥することができる。また、パ
ーティクル付着の少ない高品質乾燥が得られる。The substrate can be uniformly and evenly dried, and efficiently dried with a gas having a low pressure and a small flow rate. In addition, high quality drying with less particle adhesion can be obtained.
【図1】本発明の乾燥ノズルの配設状態を示す概略斜視
図である。FIG. 1 is a schematic perspective view showing an arrangement state of a drying nozzle of the present invention.
【図2】本発明の基板乾燥ノズルの縦断面図である。FIG. 2 is a vertical sectional view of a substrate drying nozzle of the present invention.
【図3】本発明の基板乾燥ノズルの側面図である。FIG. 3 is a side view of the substrate drying nozzle of the present invention.
【図4】本発明の気体整流手段となる波板の斜視図であ
る。FIG. 4 is a perspective view of a corrugated plate that serves as gas rectifying means of the present invention.
1…基板、2…基板の搬送方向、3…乾燥ノズル、4…
供給口、5…第1の緩衝室、6…絞りギャップ、7…第
2の緩衝室、8…整流板、9…噴射口、10…波板8の
高さ、11…緩衝室7の幅、14…ネジ。1 ... Substrate, 2 ... Substrate transport direction, 3 ... Drying nozzle, 4 ...
Supply port, 5 ... First buffer chamber, 6 ... Restriction gap, 7 ... Second buffer chamber, 8 ... Straightening plate, 9 ... Injection port, 10 ... Height of corrugated plate 8, 11 ... Width of buffer chamber 7 , 14 ... screws.
Claims (3)
おいて、気体供給口と第1の緩衝室と気体絞り手段と整
流手段を備えた第2の緩衝室とスリット状噴射口からな
ることを特徴とする基板乾燥ノズル。1. A nozzle for injecting a gas to dry a substrate, comprising a gas supply port, a first buffer chamber, a second buffer chamber provided with a gas throttle means and a rectifying means, and a slit-shaped jet port. Characteristic substrate drying nozzle.
する請求項1記載の基板乾燥ノズル。2. The substrate drying nozzle according to claim 1, wherein the rectifying means is a corrugated plate.
11より大きいか、または、等しくしたことを特徴とす
る請求項2記載の基板乾燥ノズル。3. The substrate drying nozzle according to claim 2, wherein the height 10 of the corrugated plate is larger than or equal to the width 11 of the second buffer chamber.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP27057495A JPH0990306A (en) | 1995-09-25 | 1995-09-25 | Substrate drying nozzle |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP27057495A JPH0990306A (en) | 1995-09-25 | 1995-09-25 | Substrate drying nozzle |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0990306A true JPH0990306A (en) | 1997-04-04 |
Family
ID=17488045
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP27057495A Pending JPH0990306A (en) | 1995-09-25 | 1995-09-25 | Substrate drying nozzle |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0990306A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6418640B1 (en) * | 1999-05-31 | 2002-07-16 | Hitachi Electronics Engineering Co., Ltd. | Drying apparatus for a substrate and drying method thereof |
JP2015507589A (en) * | 2011-11-21 | 2015-03-12 | コーニング インコーポレイテッド | Glass processing apparatus and glass processing method |
-
1995
- 1995-09-25 JP JP27057495A patent/JPH0990306A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6418640B1 (en) * | 1999-05-31 | 2002-07-16 | Hitachi Electronics Engineering Co., Ltd. | Drying apparatus for a substrate and drying method thereof |
JP2015507589A (en) * | 2011-11-21 | 2015-03-12 | コーニング インコーポレイテッド | Glass processing apparatus and glass processing method |
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