JPH0955169A - Sample evaporation source for ion source - Google Patents

Sample evaporation source for ion source

Info

Publication number
JPH0955169A
JPH0955169A JP7224590A JP22459095A JPH0955169A JP H0955169 A JPH0955169 A JP H0955169A JP 7224590 A JP7224590 A JP 7224590A JP 22459095 A JP22459095 A JP 22459095A JP H0955169 A JPH0955169 A JP H0955169A
Authority
JP
Japan
Prior art keywords
sample
sample container
porous body
plasma generation
container
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7224590A
Other languages
Japanese (ja)
Inventor
Yasuhiro Matsuda
恭博 松田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nissin Electric Co Ltd
Original Assignee
Nissin Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nissin Electric Co Ltd filed Critical Nissin Electric Co Ltd
Priority to JP7224590A priority Critical patent/JPH0955169A/en
Publication of JPH0955169A publication Critical patent/JPH0955169A/en
Pending legal-status Critical Current

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  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Sources, Ion Sources (AREA)

Abstract

PROBLEM TO BE SOLVED: To stably hold a necessary vapor pressure, even in the case of a molten sample having large wettability. SOLUTION: A sample container 20 in which a solid sample is filled at the normal temperature is insulated and fitted to a flange board 3 and a vapor emission part of the container is formed from a porous body 20a of a high melting point material. When the sample container is heated by a heater 8 and the sample is melt, a sample of large wettability is impregnated in the outer surface of the porous body and evaporated from the surface, and the vapor is supplied in a plasma generation chamber 1. The molten sample is not crept from the sample container. When a prescribed electric potential is applied on the sample container in relation to a plasma generation chamber by a bias DC supply source 23, electrons or ions in plasma collide with the molten sample impregnated in the sample container or the porous body so as to be heated. Heating by the heater 8 and heating by the electropotential adjustment of the sample container facilitate the temperature control of the sample container including the porous body part.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、常温で固体の試料
をイオン注入装置等のイオン源に蒸気で供給する試料蒸
発源に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sample evaporation source for supplying a solid sample at room temperature to an ion source such as an ion implantation apparatus by vapor.

【0002】[0002]

【従来の技術】従来、常温で固体の物質をイオン源の試
料とする場合、オーブンのるつぼ(坩堝)内に試料を充
填し、加熱することにより試料を溶融(液化)蒸発させ
てイオン源に供給している。図4はバケット型イオン源
の一例についての概略断面構成図、図5は同イオン源に
おける試料蒸発源について、一部を切り欠いて示した拡
大斜視図である。イオン源のプラズマ生成チャンバ1の
下部に試料蒸発源2は取り付けられている。試料蒸発源
2はフランジ板3に組み立てられており、同フランジ板
をプラズマ生成チャンバ1に形成した蒸発源ポート4の
フランジ5に結合することにより、試料蒸発源はイオン
源に取り付けられている。
2. Description of the Related Art Conventionally, when a solid substance at room temperature is used as a sample for an ion source, the sample is filled in a crucible of an oven and heated to melt (liquefy) and evaporate the sample into an ion source. We are supplying. FIG. 4 is a schematic cross-sectional configuration diagram of an example of a bucket type ion source, and FIG. 5 is an enlarged perspective view showing a sample evaporation source in the same ion source with a part cut away. The sample evaporation source 2 is attached to the lower part of the plasma generation chamber 1 of the ion source. The sample evaporation source 2 is assembled to the flange plate 3, and the sample evaporation source is attached to the ion source by connecting the flange evaporation plate 2 to the flange 5 of the evaporation source port 4 formed in the plasma generation chamber 1.

【0003】試料蒸発源2における試料が充填されたる
つぼ6は試料を均一に加熱するためにオーブン7の中に
収容されている。オーブン7の周囲には加熱用ヒータ8
が設けられており、さらに周りを熱遮蔽板9で蔽い、る
つぼ内の試料10を均一に加熱して溶融蒸発させ、るつ
ぼの開口からプラズマ生成チャンバ1内に試料の蒸気を
供給する。
The crucible 6 filled with the sample in the sample evaporation source 2 is housed in an oven 7 for uniformly heating the sample. A heater 8 for heating is provided around the oven 7.
Is further provided, and the surroundings are covered with a heat shield plate 9 to uniformly heat and melt and evaporate the sample 10 in the crucible, and the sample vapor is supplied into the plasma generation chamber 1 through the opening of the crucible.

【0004】プラズマ生成チャンバ1内に供給された試
料の蒸気に熱電子放出用フィラメント11からの電子が
当たり、プラズマが生成され、プラズマ電極12、引出
し電極13、接地電極14のビーム引出し電極系によっ
てイオンビームが引出される。プラズマ生成チャンバ1
には同チャンバの内部を所定の温度に保つための加熱用
ヒータ15と熱遮蔽板16が設けられており、また、チ
ャンバの外壁部にはプラズマ閉じ込め用磁場を形成する
マグネット17が取り付けられている。
Electrons from the thermionic emission filament 11 hit the vapor of the sample supplied into the plasma generation chamber 1 to generate plasma, and the beam extraction electrode system of the plasma electrode 12, the extraction electrode 13, and the ground electrode 14 is used. The ion beam is extracted. Plasma generation chamber 1
Is provided with a heater 15 and a heat shield plate 16 for keeping the inside of the chamber at a predetermined temperature, and a magnet 17 for forming a magnetic field for plasma confinement is attached to the outer wall of the chamber. There is.

【0005】[0005]

【発明が解決しようとする課題】試料10を溶融(液
化)させた場合、るつぼ6との相性で、アルミニウム、
シリコンのように金属試料の濡れ性が大きいと、溶融試
料がるつぼを這い上がり、るつぼの外側に回り込み、さ
らにはオーブン7にまで入り込み、悪くすると溶融試料
が吹きこぼれてさらに外側のるつぼ加熱用ヒータ8にま
で付着することがある。このようになると、るつぼ加熱
用ヒータを適切に加熱制御してもプラズマ生成に必要な
所要の試料蒸気圧が発生できなくなったり、蒸気圧が不
安定になったりすると共に、試料蒸発源2をイオン源か
ら外したとき、オーブン7からるつぼ6が取り外せない
ことを含む蒸発源構成部材の損傷という事態が生ずる。
When the sample 10 is melted (liquefied), it is compatible with the crucible 6 and aluminum,
When the wettability of a metal sample is large like silicon, the molten sample crawls up the crucible, wraps around the outside of the crucible, and further enters the oven 7. May adhere to even. In this case, even if the crucible heating heater is appropriately heated, the required sample vapor pressure necessary for plasma generation cannot be generated or the vapor pressure becomes unstable, and the sample evaporation source 2 is set to the ion vaporization source. When removed from the source, a situation occurs where the evaporation source components are damaged, including the inability to remove the crucible 6 from the oven 7.

【0006】本発明は、特に溶融試料の濡れ性が大きい
場合にあっても、溶融試料が這いでることがないように
し、必要な蒸気圧を安定に保持でき、構成部材の損傷を
防ぐことができるイオン源用試料蒸発源の提供を目的と
するものである。
The present invention prevents the melted sample from crawling even when the wettability of the melted sample is particularly high, can stably maintain the required vapor pressure, and prevent damage to the constituent members. The purpose is to provide a sample evaporation source for an ion source.

【0007】[0007]

【課題を解決するための手段】本発明のイオン源用蒸発
源は、試料が充填され、試料蒸気放出部が多孔質体で形
成されている試料容器と、この試料容器の周囲に設けら
れた加熱用ヒータとを備えてなることを主たる特徴とす
るものである。
An evaporation source for an ion source according to the present invention is provided with a sample container in which a sample is filled and a sample vapor discharge part is formed of a porous body, and around the sample container. Its main feature is that it comprises a heater for heating.

【0008】試料容器を加熱用ヒータで加熱し、内部の
試料を溶融させることにより、濡れ性の大きい溶融試料
は多孔質体の外側表面にまで含浸し、表面から蒸発し、
蒸気はイオン源のプラズマ生成チャンバ内に供給され
る。
By heating the sample container with a heater for melting and melting the sample inside, the molten sample having high wettability is impregnated into the outer surface of the porous body and evaporated from the surface.
The vapor is supplied into the plasma generation chamber of the ion source.

【0009】さらに本発明は、上記試料容器がイオン源
のプラズマ生成チャンバに対して絶縁して取り付けられ
ており、試料容器に、プラズマ生成チャンバに対し所要
の電位を与えることができるように構成したことを特徴
とするものである。
Further, according to the present invention, the sample container is attached so as to be insulated from the plasma generation chamber of the ion source, and the sample container can be provided with a required electric potential for the plasma generation chamber. It is characterized by that.

【0010】試料容器に、プラズマ生成チャンバに対し
所要の電位を与えることにより、プラズマ生成チャンバ
内に生成されているプラズマ中の電子或いはイオンを試
料容器及び多孔質体に含浸した溶融試料に衝突させて加
熱することができる。加熱用ヒータによる加熱のみなら
ず、試料容器の電位調節による加熱制御を適用すること
により、多孔質体部分を含む試料容器の温度制御が容易
になり、プラズマ生成チャンバ内にプラズマ生成に必要
な蒸気圧を安定に保持するように定量の蒸気を供給する
ための所要の温度を安定に保持することができる。
By applying a required electric potential to the plasma generation chamber in the sample container, electrons or ions in the plasma generated in the plasma generation chamber are made to collide with the sample container and the molten sample impregnated in the porous body. Can be heated. By applying not only the heating by the heater for heating but also the heating control by adjusting the potential of the sample container, it becomes easy to control the temperature of the sample container including the porous body part, and the vapor required for plasma generation in the plasma generation chamber. The required temperature for supplying a fixed amount of steam so that the pressure is stably maintained can be stably maintained.

【0011】[0011]

【発明の実施の形態】常温で固体の試料が充填される試
料容器は高融点材料で形成されており、同容器の蒸気放
出部は高融点材料による多孔質体で形成されている。こ
の多孔質体は、タングステン、タンタル、モリブデン等
の高融点金属材料、或いは炭素、炭化珪素等の高融点材
料の粉末の焼結、粉末を加熱し、粉末表面をくっつける
ことにより形成する。試料容器の周囲に加熱用ヒータを
設け、同容器を加熱し、試料を溶融させると、濡れ性の
大きい溶融試料は多孔質体の外側表面にまで含浸し、溶
融試料は表面から這いでることなく、表面から蒸発す
る。
BEST MODE FOR CARRYING OUT THE INVENTION A sample container in which a solid sample is filled at room temperature is made of a high melting point material, and a vapor discharge part of the container is made of a porous body made of a high melting point material. This porous body is formed by sintering a powder of a refractory metal material such as tungsten, tantalum, molybdenum, or a refractory material such as carbon or silicon carbide, heating the powder, and adhering the powder surfaces. When a heater for heating is installed around the sample container and the sample is melted and the sample is melted, the molten sample with high wettability is impregnated to the outer surface of the porous body, and the molten sample does not crawl from the surface. , Evaporate from the surface.

【0012】試料容器の蒸気放出部における多孔質体
は、蒸気放出部に、溶融試料が含浸し、蒸発させる多数
の細孔を設けることにより形成することができ、また、
溶融試料が含浸し、蒸発するように目の細かいメッシュ
を蒸気放出部に1枚或いは適数枚重ねて取付けて形成す
ることができる。
The porous body in the vapor discharge part of the sample container can be formed by providing the vapor discharge part with a large number of pores for impregnating and evaporating the molten sample, and
It is possible to form one mesh or a proper number of meshes having a fine mesh so that the molten sample is impregnated and evaporated so as to evaporate.

【0013】蒸気放出部が高融点材料で形成されている
試料容器をイオン源のプラズマ生成チャンバに対して絶
縁して取付け、試料容器とプラズマ生成チャンバ間にバ
イアス直流電源を接続する。この電源により、試料容器
にプラズマ生成チャンバに対し所要の電位を与え、プラ
ズマ生成チャンバ内に生成されているプラズマ中の電子
或いはイオンを試料容器及び多孔質体に含浸した溶融試
料に衝突させて加熱する。ヒータによる加熱と試料容器
の電位調節による加熱の併用により、多孔質体部分を含
む試料容器の温度制御が容易になる。
A sample container in which the vapor discharge part is made of a high melting point material is attached to the plasma generation chamber of the ion source in an insulated manner, and a bias DC power supply is connected between the sample container and the plasma generation chamber. With this power supply, the sample container is given a required electric potential for the plasma generation chamber, and electrons or ions in the plasma generated in the plasma generation chamber are made to collide with the sample container and the molten sample impregnated in the porous body and heated. To do. The combined use of heating by the heater and heating by adjusting the potential of the sample container facilitates temperature control of the sample container including the porous body portion.

【0014】[0014]

【実施例】本発明の実施例について図面を参照して説明
する。図1は実施例の断面構成図であり、図4,図5と
同一符号は同等部分を示す。イオン源用試料蒸発源2は
フランジ板3に組み立て、プラズマ生成チャンバ1の上
部の蒸発源ポート4に取り付けられている。常温で固体
の試料が充填される試料容器20は支持部材21と絶縁
体22を用いてフランジ板3に絶縁して取り付けられて
おり、同容器の蒸気放出部は高融点材料による多孔質体
20aで形成されている。
Embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a cross-sectional configuration diagram of the embodiment, and the same reference numerals as those in FIGS. 4 and 5 denote the same parts. The ion source sample evaporation source 2 is assembled on the flange plate 3 and attached to the evaporation source port 4 at the upper part of the plasma generation chamber 1. A sample container 20 filled with a solid sample at room temperature is insulated and attached to the flange plate 3 using a support member 21 and an insulator 22, and the vapor discharge part of the container is a porous body 20a made of a high melting point material. Is formed by.

【0015】試料容器20の周囲には加熱用ヒータ8が
設けられており、高融点の試料に対しては、試料容器が
高温に保持できるように、加熱用ヒータ8の外側に熱遮
蔽板9を設ける。試料容器20を加熱し、内部の試料を
溶融させることにより、濡れ性の大きい溶融試料10は
多孔質体20aの外側表面にまで含浸し、一定面積の多
孔質体表面から試料が蒸発し、蒸気がプラズマ生成チャ
ンバ1内に供給される。加熱ヒータ8による試料容器2
0の温度調節で、多孔質体20aから溶融試料が這いで
ることもなく、プラズマ生成チャンバ1内にプラズマ生
成に必要な蒸気圧を保つことができる蒸気を安定して供
給できる。
A heater 8 for heating is provided around the sample container 20. For a sample having a high melting point, a heat shield plate 9 is provided outside the heater 8 for heating so that the sample container can be kept at a high temperature. To provide. By heating the sample container 20 and melting the sample inside, the molten sample 10 having high wettability is impregnated even into the outer surface of the porous body 20a, and the sample is evaporated from the surface of the porous body having a certain area to form a vapor. Are supplied into the plasma generation chamber 1. Sample container 2 by heater 8
By adjusting the temperature to 0, the molten sample does not crawl from the porous body 20a, and the steam capable of maintaining the vapor pressure necessary for plasma generation can be stably supplied into the plasma generation chamber 1.

【0016】試料容器20の支持部材21を介して同容
器とプラズマ生成チャンバ1との間にバイアス直流電源
23を接続し、多孔質体20a部分を含む試料容器にプ
ラズマ生成チャンバに対して電位を与えるようにする。
例えば、試料容器20にプラズマ生成チャンバ1に対し
て正の電位を与えると、同チャンバに生成されているプ
ラズマ中の電子が多孔質体20a及び多孔質体に含浸し
ている溶融試料に衝突し、加熱する。また、試料容器2
0にプラズマ生成チャンバ1に対し負電位を与えること
により、試料容器及び溶融試料にイオンを衝突させて加
熱することができる。加熱用ヒータ8による加熱のみな
らず、試料容器20の電位調節による加熱制御を適用す
ることにより、多孔質体部分を含む試料容器の温度制御
が容易になり、プラズマ生成チャンバ1内にプラズマ生
成に必要な蒸気圧を安定に保持できる定量の蒸気を供給
するための所要の温度を安定に得ることができる。
A bias DC power supply 23 is connected between the sample container 20 and the plasma generation chamber 1 via a support member 21 of the sample container 20, and a potential is applied to the sample container including the porous body 20a with respect to the plasma generation chamber. Try to give.
For example, when a positive potential is applied to the sample container 20 with respect to the plasma generation chamber 1, electrons in the plasma generated in the chamber collide with the porous body 20a and the molten sample impregnated in the porous body. , Heat. Also, the sample container 2
By applying a negative potential to the plasma generation chamber 1 at 0, ions can be made to collide with the sample container and the molten sample to heat them. By applying not only the heating by the heating heater 8 but also the heating control by adjusting the potential of the sample container 20, it becomes easy to control the temperature of the sample container including the porous body portion and generate plasma in the plasma generation chamber 1. It is possible to stably obtain the required temperature for supplying a fixed amount of vapor that can stably maintain the required vapor pressure.

【0017】試料容器20は高融点材料で形成されてお
り、その多孔質体20aの部分は高融点材料、例えばタ
ングステン、タンタル、モリブデン等の高融点金属材
料、或いは炭素、炭化珪素等の高融点材料の粉末の焼
結、粉末を加熱し、粉末表面をくっつけることにより形
成する。高融点材料の粉末粒の大きさは形成された多孔
質体20aに溶融材料が含浸し、表面からの蒸発が適切
となるように選定する。
The sample container 20 is made of a high melting point material, and the porous body 20a has a high melting point material such as a high melting point metal material such as tungsten, tantalum, molybdenum, or a high melting point material such as carbon or silicon carbide. Formed by sintering the powder of the material, heating the powder and sticking the powder surfaces together. The size of the powder particles of the high melting point material is selected so that the formed porous body 20a is impregnated with the molten material and the evaporation from the surface is appropriate.

【0018】試料容器20の蒸気放出部は多孔質体20
aで形成されており、多孔質体に溶融試料を含浸させ、
表面から蒸発させているから、試料容器はプラズマ生成
チャンバ1の水平側面部から上部の任意角度位置に配置
することが可能であるが、図1に示すようにチャンバ1
の上部に垂直、下向きに取り付けるのが最適である。こ
の場合、試料容器20内の溶融試料が減少しても常に蒸
気放出部の多孔質体20aには溶融試料が含浸し、容器
内の試料量に拘らず、常に安定して試料蒸気を供給する
ことができる。
The vapor discharge portion of the sample container 20 is the porous body 20.
a is formed by impregnating a porous sample with a molten sample,
Since the sample container is evaporated from the surface, it is possible to arrange the sample container at an arbitrary angle position above the horizontal side surface portion of the plasma generation chamber 1, but as shown in FIG.
It is best to mount vertically and downward on the top of the. In this case, even if the molten sample in the sample container 20 decreases, the porous sample 20a in the vapor discharge portion is always impregnated with the molten sample, and the sample vapor is always stably supplied regardless of the amount of the sample in the container. be able to.

【0019】図2は他の実施例の断面構成図であり、図
1と同一符号は同等部分を示す。試料容器20における
蒸気放出部を形成する多孔質体20aは容器の側面部に
及ぶところまで設けられている。試料容器20はフラン
ジ板3に絶縁せずに取り付け、同フランジ板は絶縁体2
2’を介在させてプラズマ生成チャンバ1に絶縁して取
付け、同チャンバに対して試料容器に電位を与えること
ができるようにする。なお、多孔質体20aは試料容器
20の全面、側面、或いはその一部に設けてもよい。多
孔質体20aには溶融試料が含浸し、表面から蒸発する
から、多孔質体から溶融試料が濡れでて周囲の部材に付
着することはない。
FIG. 2 is a sectional view showing the structure of another embodiment, and the same reference numerals as those in FIG. 1 denote the same parts. The porous body 20a forming the vapor discharge part of the sample container 20 is provided up to the side surface of the container. The sample container 20 is attached to the flange plate 3 without insulation, and the flange plate is an insulator 2.
2'is interposed so as to be insulated and attached to the plasma generation chamber 1 so that a potential can be applied to the sample container in the chamber. The porous body 20a may be provided on the entire surface of the sample container 20, the side surface, or a part thereof. Since the molten sample is impregnated in the porous body 20a and evaporated from the surface, the molten sample does not get wet from the porous body and adhere to surrounding members.

【0020】図3は本発明の要部、試料容器についての
他の実施例を示す。図3(a)において、高融点材料で
形成された試料容器20の蒸気放出部に多数の細孔24
が設けられている。容器内部からこの細孔内に溶融試料
が含浸して蒸発し、イオン源のプラズマ生成チャンバ内
に試料蒸気が供給される。
FIG. 3 shows another embodiment of the essential part of the present invention, the sample container. In FIG. 3A, a large number of pores 24 are formed in the vapor discharge part of the sample container 20 formed of a high melting point material.
Is provided. The molten sample is impregnated into the pores from the inside of the container and evaporated, and the sample vapor is supplied into the plasma generation chamber of the ion source.

【0021】図3(b)では高融点材料で形成された試
料容器20の蒸気放出部に目の細かいメッシュ25が取
り付けられている。このメッシュは1枚或いは適数枚重
ねることにより、容器内部から溶融試料がメッシュ内に
含浸して蒸発し、イオン源のプラズマ生成チャンバ内に
試料蒸気を供給する。
In FIG. 3B, a fine mesh 25 is attached to the vapor discharge portion of the sample container 20 formed of a high melting point material. By laminating one mesh or an appropriate number of meshes, the molten sample is impregnated into the mesh from the inside of the container and evaporated, and the sample vapor is supplied into the plasma generation chamber of the ion source.

【0022】これら、試料容器20における細孔24の
形成部分、及び試料容器20に取り付けられたメッシュ
25は本明細書でいう多孔質体に包含される。
The portion where the pores 24 are formed in the sample container 20 and the mesh 25 attached to the sample container 20 are included in the porous body referred to in the present specification.

【0023】本発明のイオン源用試料蒸発源は、蒸気
(ガス)で試料が供給されてイオンが発生できる任意の
イオン源に適用することができ、バケット型イオン源に
留まらず、ECRイオン源、フリーマンイオン源、カウ
フマンイオン源等に用いることができる。
The sample evaporation source for an ion source of the present invention can be applied to any ion source capable of generating ions by supplying a sample with vapor (gas), and is not limited to a bucket type ion source, but an ECR ion source. , A Freeman ion source, a Kauffman ion source, etc.

【0024】[0024]

【発明の効果】本発明は、以上説明したように構成した
ので、試料容器を加熱し、内部の試料を溶融させること
により、濡れ性の大きい溶融試料は多孔質体の外側表面
にまで含浸し、表面の一定面積から蒸発させることがで
きるから、安定に蒸気をイオン源のプラズマ生成チャン
バに供給することができ、溶融試料の這い出すこともな
いから、蒸発源構成部材の損傷も生じない。
Since the present invention is configured as described above, by heating the sample container and melting the sample inside, the molten sample having high wettability is impregnated to the outer surface of the porous body. Since the vapor can be evaporated from a certain area on the surface, the vapor can be stably supplied to the plasma generation chamber of the ion source, and the molten sample does not crawl out, so that the vapor source constituent members are not damaged.

【0025】試料容器に、プラズマ生成チャンバに対し
所要の電位を与えることにより、プラズマ生成チャンバ
内に生成されているプラズマ中の電子或いはイオンを試
料容器及び溶融試料にイオンを衝突させて加熱すること
ができるから、加熱用ヒータによる加熱のみならず、試
料容器の電位制御による加熱制御を実施することによ
り、多孔質体部分を含む試料容器の温度制御が容易にな
り、プラズマ生成チャンバ内にプラズマ生成に必要な蒸
気圧を安定に保持するように定量の蒸気を供給するため
の所定の温度を安定に保持することができる。
By applying a required electric potential to the plasma generation chamber to the sample container, electrons or ions in the plasma generated in the plasma generation chamber are heated by colliding the ions with the sample container and the molten sample. Therefore, not only the heating by the heater for heating but also the heating control by the potential control of the sample container facilitates the temperature control of the sample container including the porous body part, and the plasma generation in the plasma generation chamber. It is possible to stably maintain a predetermined temperature for supplying a constant amount of vapor so that the required vapor pressure is stably maintained.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例の断面構成図である。FIG. 1 is a sectional configuration diagram of an embodiment of the present invention.

【図2】他の実施例の断面構成図である。FIG. 2 is a sectional configuration diagram of another embodiment.

【図3】本発明の要部、試料容器についての他の具体例
の構成図である。
FIG. 3 is a configuration diagram of another specific example of a main part of the present invention and a sample container.

【図4】従来の試料蒸発源を有するバケット型イオン源
の概略断面構成図である。
FIG. 4 is a schematic cross-sectional configuration diagram of a bucket type ion source having a conventional sample evaporation source.

【図5】図4における試料蒸発源について、その一部を
切り欠いて示した拡大斜視図である。
5 is an enlarged perspective view showing the sample evaporation source in FIG. 4 with a part thereof cut away.

【符号の説明】[Explanation of symbols]

1 プラズマ生成チャンバ 2 試料蒸発源 3 フランジ板 4 蒸発源ポート 8 加熱用ヒータ 9 熱遮蔽板 20 試料容器 20a 多孔質体 21 支持部材 22,22’ 絶縁体 23 バイアス直流電源 24 細孔 25 メッシュ 1 Plasma Generation Chamber 2 Sample Evaporation Source 3 Flange Plate 4 Evaporation Source Port 8 Heating Heater 9 Heat Shielding Plate 20 Sample Container 20a Porous Body 21 Support Member 22, 22 'Insulator 23 Bias DC Power Supply 24 Pore 25 Mesh

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 試料が充填され、試料蒸気放出部が多孔
質体で形成されている試料容器と、この試料容器の周囲
に設けられた加熱用ヒータとを備えてなることを特徴と
するイオン源用試料蒸発源。
1. An ion comprising a sample container filled with a sample and having a sample vapor discharge portion formed of a porous body, and a heating heater provided around the sample container. Sample evaporation source.
【請求項2】 試料容器がイオン源のプラズマ生成チャ
ンバに対して絶縁して取り付けられており、試料容器
に、プラズマ生成チャンバに対し所要の電位を与えるこ
とができるように構成したことを特徴とする請求項1記
載のイオン源用試料蒸発源。
2. The sample container is attached so as to be insulated from the plasma generation chamber of the ion source, and the sample container is configured so that a required electric potential can be applied to the plasma generation chamber. The sample evaporation source for an ion source according to claim 1.
JP7224590A 1995-08-10 1995-08-10 Sample evaporation source for ion source Pending JPH0955169A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7224590A JPH0955169A (en) 1995-08-10 1995-08-10 Sample evaporation source for ion source

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7224590A JPH0955169A (en) 1995-08-10 1995-08-10 Sample evaporation source for ion source

Publications (1)

Publication Number Publication Date
JPH0955169A true JPH0955169A (en) 1997-02-25

Family

ID=16816120

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7224590A Pending JPH0955169A (en) 1995-08-10 1995-08-10 Sample evaporation source for ion source

Country Status (1)

Country Link
JP (1) JPH0955169A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6593580B2 (en) 2001-04-24 2003-07-15 Nissin Electric Co., Ltd. Ion source vaporizer
JP2007258154A (en) * 2006-02-23 2007-10-04 Nec Electronics Corp Ion implantation device
JP2014003046A (en) * 2012-06-15 2014-01-09 Hitachi Ltd Ion implantation method
US20160240355A1 (en) * 2012-08-31 2016-08-18 International Business Machines Corporation System and method for differential etching
US9886972B2 (en) 2012-08-31 2018-02-06 International Business Machines Corporation Magnetic recording head having protected reader sensors and near zero recessed write poles
JP2023500912A (en) * 2019-11-07 2023-01-11 アプライド マテリアルズ インコーポレイテッド Insertable target holder for enhanced stability and performance of solid dopant materials
US11854760B2 (en) 2021-06-21 2023-12-26 Applied Materials, Inc. Crucible design for liquid metal in an ion source

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6593580B2 (en) 2001-04-24 2003-07-15 Nissin Electric Co., Ltd. Ion source vaporizer
JP2007258154A (en) * 2006-02-23 2007-10-04 Nec Electronics Corp Ion implantation device
JP2014003046A (en) * 2012-06-15 2014-01-09 Hitachi Ltd Ion implantation method
US20160240355A1 (en) * 2012-08-31 2016-08-18 International Business Machines Corporation System and method for differential etching
US9886972B2 (en) 2012-08-31 2018-02-06 International Business Machines Corporation Magnetic recording head having protected reader sensors and near zero recessed write poles
US9966237B2 (en) * 2012-08-31 2018-05-08 International Business Machines Corporation System and method for differential etching
US10170139B2 (en) 2012-08-31 2019-01-01 International Business Machines Corporation Magnetic recording head having protected reader sensors and near zero recessed write poles
JP2023500912A (en) * 2019-11-07 2023-01-11 アプライド マテリアルズ インコーポレイテッド Insertable target holder for enhanced stability and performance of solid dopant materials
US11854760B2 (en) 2021-06-21 2023-12-26 Applied Materials, Inc. Crucible design for liquid metal in an ion source

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