JPH09289156A - Substrate spin-processing method and device - Google Patents

Substrate spin-processing method and device

Info

Publication number
JPH09289156A
JPH09289156A JP12241696A JP12241696A JPH09289156A JP H09289156 A JPH09289156 A JP H09289156A JP 12241696 A JP12241696 A JP 12241696A JP 12241696 A JP12241696 A JP 12241696A JP H09289156 A JPH09289156 A JP H09289156A
Authority
JP
Japan
Prior art keywords
substrate
cup
rectifying plate
rotating
charged
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12241696A
Other languages
Japanese (ja)
Inventor
Hiroshi Kobayashi
寛 小林
Sanenobu Matsunaga
実信 松永
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP12241696A priority Critical patent/JPH09289156A/en
Publication of JPH09289156A publication Critical patent/JPH09289156A/en
Pending legal-status Critical Current

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  • Application Of Or Painting With Fluid Materials (AREA)
  • Coating Apparatus (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)

Abstract

PROBLEM TO BE SOLVED: To prevent fine particles of processing liquid which fly away from a substrate from being attached again to the substrate, by a method wherein the substrate is made to spin on a vertical axis, and a straightening plate is provided under the substrate inside a cup which surrounds the side and lower part of the substrate, and the inner surface of the cup and/or the straightening plate is charged with electricity. SOLUTION: A substrate is made to spin on a vertical axis as held in a horizontal position, processing liquid is fed to the surface of the substrate, and processing liquid which fly away from the surface of the substrate is recovered by a cup 46 which is possessed of an open top and made to surround the side and lower part of the substrate. Furthermore, air which flows into the cup 46 through its open top is guided in a peripheral direction by a straightening plate 50 provided inside the cup 46 under the substrate, the inside of the cup 46 is exhausted, and the substrate is processed. At this point, the inside of the cup 46 and/or the straightening plate 50 is charged with electricity, and the substrate is processed. A friction jig 54 is used to charge the inside of the cup 46 and the straightening plate 50 with electricity.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】この発明は、スピンコータや
スピンデベロッパ、スピンスクラバなどのように、半導
体ウエハやガラス基板等の基板を水平姿勢に保持して鉛
直軸回りに回転させながら塗布液、現像液、洗浄液等の
処理液を基板表面へ供給して処理を行なう基板回転式処
理方法並びに基板回転式処理装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention, like a spin coater, a spin developer, a spin scrubber, etc., holds a substrate such as a semiconductor wafer or a glass substrate in a horizontal posture and rotates it around a vertical axis to apply a coating solution or a developing solution. The present invention relates to a substrate rotary processing method and a substrate rotary processing apparatus for supplying a processing liquid such as a cleaning liquid to the surface of a substrate for processing.

【0002】[0002]

【従来の技術】半導体製造装置等として使用される基板
回転式処理装置、例えばスピンコータでは、半導体ウエ
ハやガラス基板等の基板をチャックで水平姿勢に保持し
て鉛直軸回りに回転させながら基板表面へ塗布液を供給
し、基板を取り囲むように配設されたカップにより、基
板の回転に伴って基板上から周囲へ飛散する塗布液を回
収し、そのカップの内部をカップ底部から排気して、カ
ップの上面開口を通しカップ内へ清浄空気を導き入れる
ようにしている。そして、カップの内部に配設された整
流板により、カップ内へ流入した空気を外周方向へ導い
てからカップ内底面に沿ってカップ中心部の方へ導き、
カップ内に気流を形成して、基板上から飛散した余分の
塗布液が基板に再付着することを防止するようにしてい
る(例えば実公平6−28223号公報、特開平5−2
34874号公報等参照)。図3に、従来のスピンコー
タの概略構成の1例を示す。
2. Description of the Related Art In a substrate rotary processing apparatus used as a semiconductor manufacturing apparatus, for example, a spin coater, a substrate such as a semiconductor wafer or a glass substrate is held horizontally by a chuck and is rotated around a vertical axis to reach the substrate surface. The cup that is supplied with the coating liquid and surrounds the substrate collects the coating liquid that is scattered from the substrate to the surroundings as the substrate rotates, and the inside of the cup is exhausted from the bottom of the cup. Clean air is introduced into the cup through the top opening of the. Then, by the rectifying plate arranged inside the cup, the air that has flowed into the cup is guided in the outer peripheral direction and then guided toward the center of the cup along the bottom surface of the cup,
An air flow is formed in the cup to prevent the excess coating liquid scattered from the substrate from re-adhering to the substrate (for example, Japanese Utility Model Publication No. 6-28223 and JP-A 5-2).
34874, etc.). FIG. 3 shows an example of a schematic configuration of a conventional spin coater.

【0003】図3に要部を一部縦断面で示したスピンコ
ータは、基板Wを水平姿勢に保持するスピンチャック1
0を有し、スピンチャック10に保持された基板Wは、
スピンチャック10を支持する回転支軸12に連結され
たスピンモータ14によって鉛直軸回りに回転させられ
る。基板Wの周囲には、上面に開口18を有し、スピン
チャック10に保持された基板Wの側方及び下方を取り
囲むような容器状に形成されたカップ16が配設されて
いる。カップ16の内部には、スピンチャック10に保
持された基板Wの下方に円錐台状の整流板20が固設さ
れており、整流板20の下面側とカップ16の内底面と
の間に通気路22が形成され、整流板20の下方位置
に、通気路22に連通する排気口24が設けられてい
る。排気口24は、排気路26を経て図示しない排気手
段に流路接続されている。また、カップ16の内底部は
排液路28をなしており、カップ16の内底部に溜まっ
たドレンは、排液路28を通って排液口(図示せず)の
方へ流動し、排液口からドレン配管30を通ってカップ
16外へ排出されるようになっている。また、スピンチ
ャック10に保持された基板Wの上方には、基板Wの表
面へフォトレジスト液等の塗布液を供給する給液ノズル
32が配設されている。
A spin coater, a partial portion of which is shown in a vertical cross section in FIG. 3, is a spin chuck 1 for holding a substrate W in a horizontal posture.
The substrate W having 0 and held by the spin chuck 10 is
It is rotated about a vertical axis by a spin motor 14 connected to a rotation support shaft 12 that supports the spin chuck 10. Around the substrate W, there is provided a container-shaped cup 16 having an opening 18 on the upper surface and surrounding the side and the lower side of the substrate W held by the spin chuck 10. A frustoconical flow plate 20 is fixed inside the cup 16 below the substrate W held by the spin chuck 10, and ventilation is provided between the lower surface side of the flow plate 20 and the inner bottom surface of the cup 16. A passage 22 is formed, and an exhaust port 24 communicating with the ventilation passage 22 is provided below the straightening vane 20. The exhaust port 24 is connected to an exhaust means (not shown) via an exhaust path 26. Further, the inner bottom portion of the cup 16 forms a drainage passage 28, and the drain accumulated in the inner bottom portion of the cup 16 flows through the drainage passage 28 toward a drainage port (not shown) to be drained. The liquid is discharged from the liquid port to the outside of the cup 16 through the drain pipe 30. Further, above the substrate W held by the spin chuck 10, a liquid supply nozzle 32 for supplying a coating liquid such as a photoresist liquid to the surface of the substrate W is arranged.

【0004】図3に示したようなスピンコータでは、カ
ップ16の上方から供給される清浄空気は、カップ16
の上面開口18を通って流下しカップ16内へ流入す
る。カップ16内へ流入した空気は、基板Wの回転動作
に伴って旋回しながら整流板20の上面に沿って下向き
にかつ外周方向へ流れ、排気手段の排気圧により整流板
20の下面側へ回り込んで通気路22へ流入し、通気路
22を通って排気口24から排気路26内へ流入し、排
気路26を通ってカップ16外へ排出される。
In the spin coater as shown in FIG. 3, the clean air supplied from above the cup 16 is the cup 16
Flowing down through the upper opening 18 and into the cup 16. The air that has flowed into the cup 16 flows downward along the upper surface of the straightening vane 20 in the outer peripheral direction while swirling as the substrate W rotates, and turns to the lower surface side of the straightening vane 20 by the exhaust pressure of the exhaust means. The gas flows into the vent passage 22 through the vent passage 22, flows from the exhaust port 24 into the exhaust passage 26, and passes through the exhaust passage 26 and is discharged to the outside of the cup 16.

【0005】[0005]

【発明が解決しようとする課題】ところが、基板Wの回
転中のカップ16内には、複雑な流れの気流が発生して
おり、カップ16の内周壁面に衝突した飛散塗布液は、
一部がミスト状となってカップ16内に滞留している。
このカップ16内に滞留している塗布液微粒子は、処理
中の気流変化によって基板Wの方へ流されるし、基板に
再付着するといったことが起こる。これは、空気中の微
粒子はその大きさが直径10μm以下になると、重力や
慣性力の影響を殆んど受けずに気流に乗ってしまうこ
と、及び、微粒子の直径が1μmに満たない程度になる
と、基板への微粒子の付着は、基板と微粒子間のクーロ
ン力(静電気力)によって支配的に行なわれることによ
る。塗布液の微粒子が基板Wに再付着すると、塗布むら
の原因となり、塗布品質の低下を来たすことになる。ま
た、基板Wの裏への塗布液の付着は、露光工程での不良
原因にもなり得る。
However, a complicated flow of air is generated in the cup 16 during the rotation of the substrate W, and the scattered coating liquid colliding with the inner peripheral wall surface of the cup 16 is
Part of it becomes a mist and remains in the cup 16.
The fine particles of the coating liquid staying in the cup 16 are caused to flow toward the substrate W due to a change in the air flow during the processing, and are reattached to the substrate. This is because when the size of fine particles in the air is 10 μm or less, they are not affected by gravity or inertial force and are carried in the air flow, and the diameter of fine particles is less than 1 μm. Then, the adhesion of the fine particles to the substrate is predominantly performed by the Coulomb force (electrostatic force) between the substrate and the fine particles. If the fine particles of the coating liquid reattach to the substrate W, uneven coating is caused and the coating quality is deteriorated. Further, the adhesion of the coating liquid to the back surface of the substrate W may cause a defect in the exposure process.

【0006】この発明は、以上のような事情に鑑みてな
されたものであり、基板の処理中において、基板上から
飛散した処理液の一部が微粒子となって基板に再付着す
ることを防止し、処理むらの発生を無くして処理品質の
低下を防ぐことができる基板回転式処理方法を提供する
こと、並びに、その方法を好適に実施することができる
基板回転式処理装置を提供することを目的とする。
The present invention has been made in view of the above circumstances, and prevents a part of the processing liquid scattered from the substrate from becoming fine particles and reattaching to the substrate during the processing of the substrate. However, it is possible to provide a substrate rotary processing method capable of preventing the occurrence of processing unevenness and preventing the deterioration of processing quality, and to provide a substrate rotary processing apparatus capable of suitably implementing the method. To aim.

【0007】[0007]

【課題を解決するための手段】請求項1に係る発明は、
基板を水平姿勢に保持して鉛直軸回りに回転させるとと
もに、基板の表面へ処理液を供給し、上面が開口したカ
ップにより、基板の側方及び下方を取り囲むようにして
基板上から周囲へ飛散する処理液を回収するとともに、
前記カップの内部の、基板の下方に配設された整流板に
より、カップの上面開口を通して流下しカップ内へ流入
した空気を外周方向へ導き、排気手段によりカップの内
部を排気して、基板の処理を行なうようにする基板回転
式処理方法において、基板の処理中に、前記カップの内
面と前記整流板の両方又はその何れか一方を帯電させた
状態に保持することを特徴とする。
The invention according to claim 1 is
While holding the substrate in a horizontal position and rotating it about the vertical axis, the processing liquid is supplied to the surface of the substrate, and a cup with an open top surface surrounds the sides and bottom of the substrate and scatters from the top of the substrate to the surroundings. And collect the processing liquid
Inside the cup, a current plate disposed below the substrate guides the air flowing down through the upper opening of the cup and flowing into the cup in the outer peripheral direction, and the exhaust means exhausts the inside of the cup, In the substrate rotary processing method for performing the processing, during the processing of the substrate, both or one of the inner surface of the cup and the rectifying plate is held in a charged state.

【0008】請求項2に係る発明は、請求項1記載の基
板回転式処理方法において、上記カップの内面や上記整
流板を静電気によって帯電させることを特徴とする。
According to a second aspect of the present invention, in the substrate rotary processing method according to the first aspect, the inner surface of the cup and the rectifying plate are electrostatically charged.

【0009】請求項3に係る発明は、請求項1記載の基
板回転式処理方法において、上記カップの内面や上記整
流板を、それに電圧を印加して帯電させることを特徴と
する。
According to a third aspect of the present invention, in the substrate rotary processing method according to the first aspect, a voltage is applied to the inner surface of the cup and the rectifying plate to charge the inner surface of the cup and the rectifying plate.

【0010】請求項4に係る発明は、基板を水平姿勢に
保持して鉛直軸回りに回転させる基板保持・回転手段
と、この基板保持・回転手段に保持された基板の表面へ
処理液を供給する処理液供給手段と、上面が開口した容
器状ををなし、前記基板保持・回転手段に保持された基
板の側方及び下方を取り囲むように配設され、基板上か
ら周囲へ飛散する処理液を回収するためのカップと、こ
のカップの内部の、前記基板保持・回転手段に保持され
た基板の下方に配設され、カップの上面開口を通して流
下しカップ内へ流入した空気を外周方向へ導くための整
流板と、前記カップの内部を排気手段に連通させる排気
路とを備えた基板回転式処理装置において、前記カップ
の内面と前記整流板の両方又はその何れか一方を帯電さ
せる帯電手段を設けたことを特徴とする。
According to a fourth aspect of the invention, the substrate holding / rotating means for holding the substrate in a horizontal posture and rotating it about a vertical axis, and the processing liquid is supplied to the surface of the substrate held by the substrate holding / rotating means. Processing liquid supply means for forming a container having an opened upper surface, and is disposed so as to surround the side and the bottom of the substrate held by the substrate holding / rotating means, and the processing liquid is scattered from above the substrate to the surroundings. Is disposed below the substrate held by the substrate holding / rotating means inside the cup, and the air that flows down through the upper opening of the cup and flows into the cup is guided to the outer peripheral direction. In a substrate rotary processing apparatus including a rectifying plate for, and an exhaust passage that communicates the inside of the cup with an exhaust unit, a charging unit that charges both or one of the inner surface of the cup and the rectifying plate is provided. Establishment It is characterized in.

【0011】請求項5に係る発明は、請求項4記載の基
板回転式処理装置において、上記帯電手段が、基板を保
持していない状態の基板保持・回転手段に着脱自在に装
着される摩擦治具であって、その摩擦治具が、基板保持
・回転手段により回転させられた際にカップの内面や整
流板の表面に連続して摺接する摩擦部材を有しているこ
とを特徴とする。
According to a fifth aspect of the present invention, in the substrate rotary processing apparatus according to the fourth aspect, the charging means is detachably mounted on the substrate holding / rotating means in a state where the substrate is not held. The tool is characterized in that the friction jig has a friction member that continuously slides in contact with the inner surface of the cup or the surface of the current plate when rotated by the substrate holding / rotating means.

【0012】請求項6に係る発明は、請求項4記載の基
板回転式処理装置において、上記カップや上記整流板を
導電材料によって形成し、上記帯電手段を、カップや整
流板に電圧を印加する電力供給装置としたことを特徴と
する。
According to a sixth aspect of the present invention, in the substrate rotary processing apparatus according to the fourth aspect, the cup and the rectifying plate are made of a conductive material, and the charging means applies a voltage to the cup and the rectifying plate. It is characterized in that the power supply device.

【0013】請求項1に係る発明の基板回転式処理方法
では、基板の処理中においてカップの内面及び/又は整
流板が帯電状態に保持されているので、回転している基
板上から処理液が飛散しカップの内周壁面に衝突するな
どして生成されカップ内に滞留している直径1μm以下
の処理液微粒子は、クーロン力によりカップの内面や整
流板の方へ引き付けられてカップ内面や整流板の表面に
付着する。このため、基板への処理液微粒子の再付着量
が低減される。
In the substrate rotary processing method according to the first aspect of the present invention, since the inner surface of the cup and / or the rectifying plate is held in a charged state during the processing of the substrate, the processing liquid is discharged from the rotating substrate. The particles of the processing liquid with a diameter of 1 μm or less, which are generated by scattering and colliding with the inner wall surface of the cup and staying in the cup, are attracted toward the inner surface of the cup and the current plate by the Coulomb force, and the inner surface of the cup and the air flow are rectified. Adheres to the surface of the plate. For this reason, the re-adhesion amount of the processing liquid particles on the substrate is reduced.

【0014】請求項2に係る発明の方法では、カップの
内面及び/又は整流板が静電気によって帯電させられる
ことにより、処理液の微粒子がカップ内面や整流板の表
面に付着する。
In the method of the second aspect of the present invention, the inner surface of the cup and / or the rectifying plate are electrostatically charged, so that the fine particles of the treatment liquid adhere to the inner surface of the cup and the surface of the rectifying plate.

【0015】請求項3に係る発明の方法では、カップの
内面及び又は整流板がそれに電圧を印加されて帯電させ
られることにより、処理液の微粒子がカップ内面や整流
板の表面に付着する。
In the method according to the third aspect of the present invention, the inner surface of the cup and / or the rectifying plate are charged by applying a voltage thereto, so that the fine particles of the treatment liquid adhere to the inner surface of the cup and the surface of the rectifying plate.

【0016】請求項4に係る発明の基板回転式処理装置
では、帯電手段によってカップの内面及び/又は整流板
が帯電させられるので、基板の処理中にカップ内面や整
流板を帯電状態に保持しておくことにより、基板保持・
回転手段に保持されて回転している基板上から処理液が
飛散しカップの内周壁面に衝突するなどして生成されカ
ップ内に帯電している直径1μm以下の処理液の微粒子
が、クーロン力によりカップ内面や整流板の方へ引き付
けられてカップ内面や整流板の表面に付着するる。この
ため、基板への処理液の微粒子の再付着量が低減され
る。
In the substrate rotary processing apparatus according to the fourth aspect of the present invention, since the inner surface of the cup and / or the rectifying plate is charged by the charging means, the inner surface of the cup and the rectifying plate are kept charged during the processing of the substrate. By holding the
The particles of the processing liquid having a diameter of 1 μm or less, which are generated by the processing liquid being scattered from the substrate being held by the rotating means and rotating and colliding with the inner peripheral wall surface of the cup, have Coulomb force. As a result, it is attracted toward the inner surface of the cup and the current plate, and adheres to the inner surface of the cup and the surface of the current plate. Therefore, the amount of redeposition of the fine particles of the processing liquid on the substrate is reduced.

【0017】請求項5に係る発明の装置では、基板の処
理を行なっていないときに、基板保持・回転手段が基板
を保持していない状態で摩擦治具を基板保持・回転手段
に装着させる。そして、基板保持・回転手段により摩擦
治具を回転させることにより、摩擦治具の摩擦部材がカ
ップ内面や整流板の表面に連続して摺接し、摩擦部材が
カップの内面及び/又は整流板の表面との摩擦によって
カップ内面や整流板が帯電する。この後、基板保持・回
転手段から摩擦治具を取り外し、基板保持・回転手段に
基板を保持させて、カップ内面や整流板が帯電した状態
で基板の処理が行なわれる。
In the apparatus according to the fifth aspect of the present invention, the friction jig is mounted on the substrate holding / rotating means while the substrate holding / rotating means is not holding the substrate when the substrate is not being processed. Then, by rotating the friction jig by the substrate holding / rotating means, the friction member of the friction jig continuously slides in contact with the inner surface of the cup or the surface of the straightening plate, and the friction member of the inner surface of the cup and / or the straightening plate The inner surface of the cup and the current plate are charged due to the friction with the surface. Thereafter, the friction jig is removed from the substrate holding / rotating means, the substrate is held by the substrate holding / rotating means, and the substrate is processed while the inner surface of the cup and the rectifying plate are charged.

【0018】請求項6に係る発明の装置では、電力供給
装置によってカップ及び/又は整流板に電圧を印加する
ことにより、カップ内面や整流板が帯電し、この状態で
基板の処理が行なわれる。
In the apparatus according to the sixth aspect of the invention, by applying a voltage to the cup and / or the rectifying plate by the power supply device, the inner surface of the cup and the rectifying plate are charged, and the substrate is processed in this state.

【0019】[0019]

【発明の実施の形態】以下、この発明の最良の実施形態
について図1及び図2を参照しながら説明する。
BEST MODE FOR CARRYING OUT THE INVENTION The best mode for carrying out the present invention will be described below with reference to FIGS.

【0020】図1は、この発明の実施形態の1例を示
し、基板の処理を行なっていないときの基板回転式処理
装置、ここではスピンコータの要部の概略構成を示す縦
断面図である。スピンコータの基本的構成自体は、従来
と何ら変わるところが無く、図1において、40はスピ
ンチャック、42は回転支軸、44はスピンモータ、4
6はカップ、48はカップ46の上面開口、50は整流
板、52は、整流板50の下面側とカップ46の内底面
との間に形成される通気路である。
FIG. 1 is a longitudinal sectional view showing an example of the embodiment of the present invention and showing a schematic structure of a main part of a substrate rotary processing apparatus, here a spin coater, when a substrate is not processed. The basic structure itself of the spin coater is not different from the conventional one, and in FIG. 1, 40 is a spin chuck, 42 is a rotation support shaft, 44 is a spin motor, 4
6 is a cup, 48 is an upper surface opening of the cup 46, 50 is a straightening vane, and 52 is a ventilation path formed between the lower surface side of the straightening vane 50 and the inner bottom surface of the cup 46.

【0021】この発明に係る基板回転式処理方法は、図
1に示したようなスピンコータを使用して実施される
が、この処理方法では、カップ46の内面もしくは整流
板50又はその両方、この実施形態ではカップ46内面
と整流板50の両方をそれぞれ帯電させた状態に保持し
て、基板の処理を行なうようにする。カップ46内面及
び整流板50を帯電させるのには、図1に示したような
摩擦治具54が使用される。
The substrate rotary processing method according to the present invention is carried out by using a spin coater as shown in FIG. 1. In this processing method, the inner surface of the cup 46, the straightening plate 50, or both of them are used. In the configuration, both the inner surface of the cup 46 and the rectifying plate 50 are held in a charged state, and the substrate is processed. A friction jig 54 as shown in FIG. 1 is used to charge the inner surface of the cup 46 and the rectifying plate 50.

【0022】摩擦治具54は、基板と同程度の大きさの
円板部56の周縁部に二叉の取付け桿58を固着し、取
付け桿58の二叉の各端部に摩擦刷毛60、62をそれ
ぞれ取着して構成されている。この摩擦治具54は、基
板の処理を行なっていないときに、基板に代えて円板部
56をスピンチャック40に保持させることにより、ス
ピンチャック40に装着される。摩擦治具54がスピン
チャック40に装着されたとき、各摩擦刷毛60、62
は、カップ60の内面及び整流板62の上面に接触する
ようになっている。この状態で、スピンモータ44を駆
動させることにより、摩擦治具54はスピンチャック4
0と一体になって回転し、各摩擦刷毛60、62がカッ
プ46内面及び整流板50上面にそれぞれ連続して摺接
する。この際、各摩擦刷毛60、62とカップ46内面
及び整流板50上面との摩擦により、カップ46内面及
び整流板50が静電気で帯電することになる。例えば、
カップ46及び整流板50がポリプロピレンで形成され
ているときは、カップ46及び整流板50は負電位に帯
電する。尚、摩擦治具の構成は図示例のものに限定され
ず、種々の構成のものを採用し得る。
The friction jig 54 has a bifurcated mounting rod 58 fixedly attached to the peripheral edge of a disk portion 56 having the same size as the base plate, and a friction brush 60 is attached to each end of the bifurcated mounting rod 58. 62 are attached to each other. The friction jig 54 is mounted on the spin chuck 40 by holding the disk portion 56 on the spin chuck 40 instead of the substrate when the substrate is not processed. When the friction jig 54 is mounted on the spin chuck 40, each friction brush 60, 62
Touches the inner surface of the cup 60 and the upper surface of the current plate 62. In this state, by driving the spin motor 44, the friction jig 54 is moved to the spin chuck 4
The friction brushes 60 and 62 are continuously brought into sliding contact with the inner surface of the cup 46 and the upper surface of the current plate 50, respectively. At this time, the friction between the friction brushes 60 and 62 and the inner surface of the cup 46 and the upper surface of the straightening plate 50 causes the inner surface of the cup 46 and the straightening plate 50 to be electrostatically charged. For example,
When the cup 46 and the rectifying plate 50 are made of polypropylene, the cup 46 and the rectifying plate 50 are negatively charged. The structure of the friction jig is not limited to the illustrated example, and various structures can be adopted.

【0023】カップ46の内面及び整流板50が帯電す
ると、スピンモータ44の駆動を停止させ、スピンチャ
ック40から摩擦治具54を取り外す。そして、通常の
処理と同様の操作により、スピンチャック40に基板を
保持させ、カップ46の内面及び整流板50がそれぞれ
帯電した状態に保持されながら、基板の処理が行なわれ
る。基板の処理中においては、カップ46の内面及び整
流板50がそれぞれ帯電状態に保持されているので、カ
ップ46内に滞留している直径1μm以下の処理液微粒
子は、クーロン力によってカップ46及び整流板50の
方へ引き付けられてカップ46内面や整流板50の表面
に付着し、基板に処理液微粒子が再付着することが少な
くなる。尚、基板の処理が終了してカップ46の内部を
洗浄するときは、帯電状態を解消させ或いは逆の電位に
帯電させるようにする。
When the inner surface of the cup 46 and the current plate 50 are charged, the drive of the spin motor 44 is stopped and the friction jig 54 is removed from the spin chuck 40. Then, the substrate is processed while the spin chuck 40 holds the substrate and the inner surface of the cup 46 and the rectifying plate 50 are held in a charged state by the same operation as a normal process. During the processing of the substrate, since the inner surface of the cup 46 and the rectifying plate 50 are held in a charged state, the processing liquid particles having a diameter of 1 μm or less retained in the cup 46 are rectified by the Coulomb force. It is less likely that the processing liquid fine particles are attracted toward the plate 50 and adhere to the inner surface of the cup 46 and the surface of the flow regulating plate 50, and the processing liquid particles re-adhere to the substrate. When the inside of the cup 46 is cleaned after the processing of the substrate is completed, the charged state is canceled or the opposite potential is charged.

【0024】図2に示したスピンコータは、図3に示し
た従来のスピンコータと基本構成が概略同じである。た
だ、カップ16が、上カップ16aと下カップ16bと
を嵌め合って構成されており、上カップ16aが導電材
料によって形成されている。そして、カップ16の上カ
ップ16aに電力供給装置64が電気接続されており、
カップ16の上カップ16aを帯電させることができる
構成となっている。このスピンコータによって基板Wの
処理を行なうときは、処理中、電力供給装置64によっ
て上カップ16aに電圧を印加し、上カップ16aの内
面を帯電させた状態に保持しながら基板Wを処理し、基
板Wの処理が終了した後に、電力供給装置64による上
カップ16aに対する電圧の印加を止める。尚、図2に
示したスピンコータでは、上カップ16aだけを帯電さ
せるようにしているが、カップ16の下カップ16b、
整流板20、さらにはスピンチャック40以外の構成部
品も導電材料によって形成し、それらも電力供給装置に
電気接続して処理中に帯電させるようにしてもよい。
The spin coater shown in FIG. 2 has substantially the same basic structure as the conventional spin coater shown in FIG. However, the cup 16 is configured by fitting the upper cup 16a and the lower cup 16b together, and the upper cup 16a is formed of a conductive material. The power supply device 64 is electrically connected to the upper cup 16a of the cup 16,
The upper cup 16a of the cup 16 can be electrically charged. When the substrate W is processed by this spin coater, a voltage is applied to the upper cup 16a by the power supply device 64 during the processing to process the substrate W while keeping the inner surface of the upper cup 16a charged. After the processing of W is completed, the application of the voltage to the upper cup 16a by the power supply device 64 is stopped. In the spin coater shown in FIG. 2, only the upper cup 16a is charged, but the lower cup 16b of the cup 16 is
The rectifying plate 20 and also the components other than the spin chuck 40 may be formed of a conductive material, and they may be electrically connected to the power supply device and charged during the process.

【0025】[0025]

【発明の効果】請求項1に係る発明の基板回転式処理方
法によれば、基板の処理中において、基板上から飛散し
た処理液の一部が微粒子となって基板に再付着すること
が低減され、処理むらの発生を無くして処理品質の低下
を防ぐことができる。
According to the substrate rotary processing method of the first aspect of the present invention, it is possible to reduce the possibility that a part of the processing liquid scattered from the substrate becomes fine particles and reattaches to the substrate during the processing of the substrate. Therefore, it is possible to prevent the occurrence of processing unevenness and prevent deterioration of processing quality.

【0026】請求項2に係る発明の方法では、カップの
内面及び/又は整流板が静電気によって帯電させられる
ことにより、処理液の微粒子がカップ内面や整流板の表
面に付着し、このため、基板への処理液微粒子の再付着
量が低減することとなる。
In the method according to the second aspect of the present invention, the inner surface of the cup and / or the rectifying plate is electrostatically charged, so that the fine particles of the treatment liquid adhere to the inner surface of the cup and the surface of the rectifying plate. The amount of re-adhesion of the fine particles of the treatment liquid on the surface of the substrate is reduced.

【0027】請求項3に係る発明の方法では、カップの
内面及び又は整流板がそれに電圧を印加されて帯電させ
られることにより、処理液の微粒子がカップ内面や整流
板の表面に付着し、このため、基板への処理液微粒子の
再付着量が低減することとなる。
In the method according to the third aspect of the present invention, the inner surface of the cup and / or the rectifying plate are charged by applying a voltage thereto, whereby the fine particles of the treatment liquid adhere to the inner surface of the cup and the surface of the rectifying plate. Therefore, the amount of redeposition of the processing liquid particles on the substrate is reduced.

【0028】請求項4に係る発明の基板回転式処理装置
を使用すると、請求項1に係る発明の方法を好適に実施
することができ、基板の処理中において、基板上から飛
散した処理液の一部が微粒子となって基板に再付着する
ことを低減させ、処理むらの発生を無くして処理品質の
低下を防ぐことができる。
When the substrate rotary processing apparatus of the invention according to claim 4 is used, the method of the invention according to claim 1 can be preferably carried out, and during the processing of the substrate, the processing liquid scattered from the substrate is removed. It is possible to prevent a part of the particles from becoming fine particles and redepositing on the substrate, eliminate the occurrence of processing unevenness, and prevent deterioration of processing quality.

【0029】請求項5に係る発明の装置では、基板の処
理を行なっていないときに、摩擦治具によってカップの
内面及び/又は整流板の表面を静電気で帯電させること
ができ、基板の処理中に、処理液の微粒子をカップ内面
や整流板の表面に付着させて、基板への処理液微粒子の
再付着量を低減させることができる。そして、摩擦治具
を用意するだけで、従来の基板回転式処理装置自体に
は、何らの変更も必要としない。
In the apparatus according to the fifth aspect of the present invention, the inner surface of the cup and / or the surface of the rectifying plate can be electrostatically charged by the friction jig when the substrate is not being processed. In addition, the fine particles of the treatment liquid can be adhered to the inner surface of the cup or the surface of the rectifying plate to reduce the re-adhesion amount of the treatment liquid fine particles to the substrate. Then, only the friction jig is prepared, and the conventional substrate rotary processing apparatus itself does not require any modification.

【0030】請求項6に係る発明の装置では、電力供給
装置による電圧の印加によりカップ及び/又は整流板を
帯電させることができ、基板の処理中に、処理液の微粒
子をカップ内面や整流板の表面に付着させて、基板への
処理液微粒子の再付着量を低減させることができる。
In the apparatus according to the sixth aspect of the present invention, the cup and / or the rectifying plate can be charged by applying a voltage from the power supply device, and during the processing of the substrate, the fine particles of the processing liquid are charged on the inner surface of the cup or the rectifying plate. It is possible to reduce the redeposition amount of the processing liquid fine particles on the substrate by adhering to the surface of the substrate.

【図面の簡単な説明】[Brief description of drawings]

【図1】この発明の実施形態の1例を示し、基板の処理
を行なっていないときのスピンコータの要部の概略構成
を示す縦断面図である。
FIG. 1 is a longitudinal sectional view showing an example of an embodiment of the present invention and showing a schematic configuration of a main part of a spin coater when a substrate is not processed.

【図2】この発明の実施形態の別の例を示し、スピンコ
ータの要部の概略構成を示す一部縦断面図である。
FIG. 2 is a partial vertical cross-sectional view showing another example of the embodiment of the present invention and showing a schematic configuration of a main part of a spin coater.

【図3】従来のスピンコータの概略構成の1例を示す要
部の一部縦断面図である。
FIG. 3 is a partial vertical cross-sectional view of a main part showing an example of a schematic configuration of a conventional spin coater.

【符号の説明】[Explanation of symbols]

10、40 スピンチャック 12、42 回転支軸 14、44 スピンモータ 16、46 カップ 18、48 カップの上面開口 20、50 整流板 26 排気路 32 給液ノズル 54 摩擦治具 56 摩擦治具の円板部 60、62 摩擦刷毛 64 電力供給装置 10, 40 Spin chuck 12, 42 Rotating spindle 14, 44 Spin motor 16, 46 Cup 18, 48 Cup upper opening 20, 50 Straightening plate 26 Exhaust path 32 Liquid supply nozzle 54 Friction jig 56 Friction jig disk Parts 60, 62 Friction brush 64 Power supply device

フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 H01L 21/30 564C Continuation of front page (51) Int.Cl. 6 Identification number Office reference number FI technical display location H01L 21/30 564C

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 基板を水平姿勢に保持して鉛直軸回りに
回転させるとともに、基板の表面へ処理液を供給し、上
面が開口したカップにより、基板の側方及び下方を取り
囲むようにして基板上から周囲へ飛散する処理液を回収
するとともに、前記カップの内部の、基板の下方に配設
された整流板により、カップの上面開口を通して流下し
カップ内へ流入した空気を外周方向へ導き、排気手段に
よりカップの内部を排気して、基板の処理を行なうよう
にする基板回転式処理方法において、 基板の処理中に、前記カップの内面及び/又は前記整流
板を帯電させた状態に保持することを特徴とする基板回
転式処理方法。
1. A substrate is horizontally held and rotated about a vertical axis, a treatment liquid is supplied to the surface of the substrate, and a cup having an open upper surface surrounds the side and the lower side of the substrate. While collecting the processing liquid scattered from the top to the surroundings, inside the cup, by the rectifying plate disposed below the substrate, the air flowing down through the upper opening of the cup and leading into the cup in the outer peripheral direction, In a substrate rotating processing method, in which the inside of a cup is evacuated by an evacuation means to process a substrate, an inner surface of the cup and / or the rectifying plate is held in a charged state during processing of the substrate. A substrate rotating type processing method characterized by the above.
【請求項2】 カップの内面及び/又は整流板を静電気
によって帯電させる請求項1記載の基板回転式処理方
法。
2. The substrate rotating processing method according to claim 1, wherein the inner surface of the cup and / or the current plate is charged by static electricity.
【請求項3】 カップの内面及び/又は整流板を、それ
に電圧を印加して帯電させる請求項1記載の基板回転式
処理方法。
3. The substrate rotary processing method according to claim 1, wherein the inner surface of the cup and / or the rectifying plate is charged by applying a voltage thereto.
【請求項4】 基板を水平姿勢に保持して鉛直軸回りに
回転させる基板保持・回転手段と、 この基板保持・回転手段に保持された基板の表面へ処理
液を供給する処理液供給手段と、 上面が開口した容器状ををなし、前記基板保持・回転手
段に保持された基板の側方及び下方を取り囲むように配
設され、基板上から周囲へ飛散する処理液を回収するた
めのカップと、 このカップの内部の、前記基板保持・回転手段に保持さ
れた基板の下方に配設され、カップの上面開口を通して
流下しカップ内へ流入した空気を外周方向へ導くための
整流板と、 前記カップの内部を排気手段に連通させる排気路とを備
えた基板回転式処理装置において、 前記カップの内面及び/又は前記整流板を帯電させる帯
電手段を設けたことを特徴とする基板回転式処理装置。
4. A substrate holding / rotating means for holding a substrate in a horizontal posture and rotating it about a vertical axis, and a processing liquid supply means for supplying a processing liquid to the surface of the substrate held by the substrate holding / rotating means. , A cup having a container shape with an open upper surface and disposed so as to surround the side and the lower side of the substrate held by the substrate holding / rotating means, and a cup for collecting the processing liquid scattered from above the substrate to the surroundings. A straightening plate disposed inside the cup, below the substrate held by the substrate holding / rotating means, for guiding the air flowing down through the upper opening of the cup and flowing into the cup in the outer peripheral direction, A substrate rotary processing apparatus having an exhaust path for communicating the inside of the cup with an exhaust means, characterized in that a charging means for charging the inner surface of the cup and / or the rectifying plate is provided. Dress .
【請求項5】 帯電手段が、基板を保持していない状態
の基板保持・回転手段に着脱自在に装着され基板保持・
回転手段により回転させられた際にカップの内面及び/
又は整流板の表面に連続して摺接する摩擦部材を有した
摩擦治具である請求項4記載の基板回転式処理装置。
5. The substrate holding / rotating means is detachably mounted on the substrate holding / rotating means in a state where the charging means does not hold the substrate.
The inner surface of the cup and / or when rotated by the rotating means
5. The substrate rotary processing apparatus according to claim 4, which is a friction jig having a friction member that continuously slides in contact with the surface of the current plate.
【請求項6】 カップ及び/又は整流板が導電材料によ
って形成され、帯電手段が、前記カップ及び/又は整流
板に電圧を印加する電力供給装置である請求項4記載の
基板回転式処理装置。
6. The substrate rotary processing apparatus according to claim 4, wherein the cup and / or the rectifying plate is made of a conductive material, and the charging means is a power supply device for applying a voltage to the cup and / or the rectifying plate.
JP12241696A 1996-04-19 1996-04-19 Substrate spin-processing method and device Pending JPH09289156A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12241696A JPH09289156A (en) 1996-04-19 1996-04-19 Substrate spin-processing method and device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12241696A JPH09289156A (en) 1996-04-19 1996-04-19 Substrate spin-processing method and device

Publications (1)

Publication Number Publication Date
JPH09289156A true JPH09289156A (en) 1997-11-04

Family

ID=14835288

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12241696A Pending JPH09289156A (en) 1996-04-19 1996-04-19 Substrate spin-processing method and device

Country Status (1)

Country Link
JP (1) JPH09289156A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100900628B1 (en) * 2006-09-15 2009-06-02 다이닛뽕스크린 세이조오 가부시키가이샤 Substrate processing apparatus and substrate processing method
WO2013018414A1 (en) * 2011-07-29 2013-02-07 東京エレクトロン株式会社 Treatment liquid supply device, treatment liquid supply method and computer storage medium

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100900628B1 (en) * 2006-09-15 2009-06-02 다이닛뽕스크린 세이조오 가부시키가이샤 Substrate processing apparatus and substrate processing method
US8815048B2 (en) 2006-09-15 2014-08-26 Dainippon Screen Mfg. Co., Ltd. Substrate processing apparatus and substrate processing method
US9852931B2 (en) 2006-09-15 2017-12-26 SCREEN Holdings Co., Ltd. Substrate processing apparatus
US10468273B2 (en) 2006-09-15 2019-11-05 SCREEN Holdings Co., Ltd. Substrate processing method
US10629459B2 (en) 2006-09-15 2020-04-21 SCREEN Holdings Co., Ltd. Substrate processing apparatus
WO2013018414A1 (en) * 2011-07-29 2013-02-07 東京エレクトロン株式会社 Treatment liquid supply device, treatment liquid supply method and computer storage medium
US9308542B2 (en) 2011-07-29 2016-04-12 Tokyo Electron Limited Treatment solution supply apparatus, treatment solution supply method, and computer storage medium

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