JP4347785B2 - Substrate rotating processing equipment - Google Patents

Substrate rotating processing equipment Download PDF

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JP4347785B2
JP4347785B2 JP2004332625A JP2004332625A JP4347785B2 JP 4347785 B2 JP4347785 B2 JP 4347785B2 JP 2004332625 A JP2004332625 A JP 2004332625A JP 2004332625 A JP2004332625 A JP 2004332625A JP 4347785 B2 JP4347785 B2 JP 4347785B2
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substrate
cup
wall surface
hydrophilic
processing liquid
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JP2006147673A (en
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憲太郎 徳利
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Screen Holdings Co Ltd
Dainippon Screen Manufacturing Co Ltd
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Screen Holdings Co Ltd
Dainippon Screen Manufacturing Co Ltd
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Description

この発明は、半導体ウエハ、液晶表示装置用ガラス基板、フォトマスク用ガラス基板、光ディスク用基板等の基板を水平姿勢に保持して鉛直軸回りに回転させ基板表面へ洗浄液、塗布液、現像液等の処理液を供給して、洗浄、塗布、現像等の基板処理を行う基板回転式処理装置に関する。   In the present invention, a semiconductor wafer, a glass substrate for a liquid crystal display device, a glass substrate for a photomask, a substrate for an optical disk, etc. are held in a horizontal position and rotated about a vertical axis to rotate the substrate surface to a cleaning solution, a coating solution, a developing solution, etc. The present invention relates to a substrate rotating type processing apparatus that supplies the processing liquid and performs substrate processing such as cleaning, coating, and development.

半導体ウエハ等の基板をスピンチャックで水平姿勢に保持して鉛直軸回りに回転させ、基板表面へ処理液、例えば純水等の洗浄液を供給して、基板を洗浄処理するとき、基板表面に供給された洗浄液は、遠心力によって基板周縁へ拡散し、使用済み洗浄液は基板周縁から周囲へ飛散する。スピンチャックに保持された基板の周囲には、その側方および下方を取り囲むようにカップが配設されており、基板上から周囲へ飛散した使用済み洗浄液は、カップの内壁面に衝突して捕捉され、カップ内壁面上を流下してカップ底部に捕集され、カップ下部に設けられた排液口からドレン管を通って排出され回収されるようになっている(例えば、特許文献1参照。)。   When a substrate such as a semiconductor wafer is held in a horizontal position by a spin chuck and rotated around the vertical axis, a processing liquid such as pure water is supplied to the substrate surface to supply the substrate surface when cleaning the substrate. The cleaned cleaning solution is diffused to the periphery of the substrate by centrifugal force, and the used cleaning solution is scattered from the periphery of the substrate to the periphery. A cup is placed around the substrate held by the spin chuck so as to surround the side and bottom of the substrate, and used cleaning liquid that has scattered from the substrate to the periphery collides with the inner wall surface of the cup and is captured. Then, it flows down on the inner wall surface of the cup, is collected at the bottom of the cup, and is discharged and collected through a drain pipe from a drain port provided at the lower part of the cup (see, for example, Patent Document 1). ).

基板上から周囲へ飛散した処理液を回収するためのカップは、従来、ポリテトラフルオロエチレン(PTFE)等のフッ素樹脂、ポリ塩化ビニル(PVC)、ポリプロピレン(PP)などのプラスチック材料、あるいは、ステンレス鋼等の金属材料で形成されているが、現在ではほとんどのカップが樹脂製である。このカップの主要な機能は、基板上から周囲へ飛散した処理液が基板処理部外にまで飛散するのを防止することであるが、それと同時に、処理液を捕集して速やかにカップ底部の排液口へ流動させることである。ところで、一般的には、カップを形成しているプラスチック材料は疎水性であるが、カップを長期間にわたって使用していると、カップの内壁面が親水化する。これは、処理液との接触によってカップの内壁面が劣化したり、組成変化を起こしたり、処理液成分や不純物が付着し乾燥して堆積したりすることなどで、表面状態が変化するためである。
特開平10−323633号公報(第3頁、図1)
Conventionally, cups for recovering the processing liquid scattered from the substrate to the surrounding area have been conventionally made of fluororesins such as polytetrafluoroethylene (PTFE), plastic materials such as polyvinyl chloride (PVC) and polypropylene (PP), or stainless steel. Although it is made of a metal material such as steel, most cups are now made of resin. The main function of this cup is to prevent the processing liquid splashed from the substrate to the surroundings from scattering to the outside of the substrate processing section, but at the same time, the processing liquid is collected and quickly collected at the bottom of the cup. It is to flow to the drainage port. By the way, in general, the plastic material forming the cup is hydrophobic, but when the cup is used for a long time, the inner wall surface of the cup becomes hydrophilic. This is because the surface condition changes due to deterioration of the inner wall surface of the cup due to contact with the processing liquid, composition change, deposition of processing liquid components and impurities attached, etc. is there.
Japanese Patent Application Laid-Open No. 10-323633 (page 3, FIG. 1)

図4は、基板回転式処理装置の概略構成を示す模式図である。図において、1が、基板Wを水平姿勢に保持するスピンチャックであり、2が、基板Wを保持したスピンチャック1を支持して鉛直軸回りに回転させるための回転支軸であり、3が、処理液を捕集するカップであり、4が、処理液を排出し回収するための排液部である。カップ3が疎水性の材料で形成されているとき、カップ3の内壁面は、純水等の洗浄液のように親水性の処理液が衝突したときに処理液を弾いてしまう。このため、図4の(a)に示すように、基板Wの表面から周囲へ飛散してカップ3の内壁面に衝突した処理液は、内壁面で跳ね返って一部が基板Wの表面に再付着する。このとき、使用済み洗浄液のように処理液が不純物を含んでいると、処理液中の不純物がパーティクルとなって基板Wを汚染し、また、カップの内壁面の一部に処理液が付着して乾燥していたりすると、それがパーティクルとなって内壁面で跳ね返った処理液とともに基板Wの表面に付着し基板Wを汚染する、といった問題を生じる。一方、カップ3の内壁面が親水性になっていると、図4の(b)に示すように、基板Wの表面から周囲へ飛散してカップ3の内壁面に衝突した親水性の処理液は、内壁面上で薄膜状に拡がってカップ3の底部へ流下し、排液部4を通して排出される。ところが、処理液は、カップ3の内壁面上をゆっくりと流動するため、処理液がカップ3の内壁面上に留まる時間が長くなり、この結果、カップの内壁面に処理液が付着して乾燥し不純物や処理液成分がカップ3の内壁面に堆積しやすくなり、それが基板汚染の原因になる、といった問題点がある。   FIG. 4 is a schematic diagram showing a schematic configuration of the substrate rotation processing apparatus. In the figure, 1 is a spin chuck for holding the substrate W in a horizontal position, 2 is a rotation support shaft for supporting the spin chuck 1 holding the substrate W and rotating it around a vertical axis, and 3. , A cup for collecting the processing liquid, and 4 is a drainage part for discharging and collecting the processing liquid. When the cup 3 is formed of a hydrophobic material, the inner wall surface of the cup 3 repels the processing liquid when a hydrophilic processing liquid collides with the cleaning liquid such as pure water. For this reason, as shown in FIG. 4A, the processing liquid splashed from the surface of the substrate W to the periphery and collided with the inner wall surface of the cup 3 bounces off the inner wall surface, and a part of the processing liquid reappears on the surface of the substrate W. Adhere to. At this time, if the processing liquid contains impurities such as a used cleaning liquid, the impurities in the processing liquid become particles and contaminate the substrate W, and the processing liquid adheres to a part of the inner wall surface of the cup. If it is dry, it causes a problem that it becomes particles and adheres to the surface of the substrate W together with the treatment liquid bounced off the inner wall surface, thereby contaminating the substrate W. On the other hand, when the inner wall surface of the cup 3 is hydrophilic, as shown in FIG. 4 (b), the hydrophilic processing liquid that has scattered from the surface of the substrate W to the periphery and collided with the inner wall surface of the cup 3. Spreads in the form of a thin film on the inner wall surface, flows down to the bottom of the cup 3 and is discharged through the drainage part 4. However, since the processing liquid slowly flows on the inner wall surface of the cup 3, it takes longer time for the processing liquid to stay on the inner wall surface of the cup 3. As a result, the processing liquid adheres to the inner wall surface of the cup and is dried. However, there is a problem that impurities and processing solution components are likely to be deposited on the inner wall surface of the cup 3, which causes substrate contamination.

この発明は、以上のような事情に鑑みてなされたものであり、回転する基板の表面から飛散した処理液がカップの内壁面で跳ね返ることを防止するとともに、処理液がカップの内壁面上に長く留まって、カップの内壁面に処理液が付着し乾燥して不純物や処理液成分がカップ内壁面に堆積する、といったことを防止して、カップに起因する基板汚染の原因を取り除くことができる基板回転式処理装置を提供することを目的とする。   The present invention has been made in view of the circumstances as described above, and prevents the processing liquid splashed from the surface of the rotating substrate from splashing on the inner wall surface of the cup, and the processing liquid on the inner wall surface of the cup. It is possible to remove the cause of substrate contamination caused by the cup by staying for a long time and preventing the treatment liquid from adhering to the inner wall surface of the cup and drying to deposit impurities and treatment liquid components on the inner wall surface of the cup. An object of the present invention is to provide a substrate rotating type processing apparatus.

請求項1に係る発明は、基板を水平姿勢に保持する基板保持手段と、この基板保持手段に保持された基板を鉛直軸回りに回転させる基板回転手段と、前記基板保持手段に保持された基板の表面へ処理液を供給する処理液供給手段と、上面が開口した容器状をなし、前記基板保持手段に保持された基板の側方および下方を取り囲むように配設され、基板上から周囲へ飛散する処理液を回収するためのカップとを備えた基板回転式処理装置において、前記カップの内壁面の少なくとも、基板上から周囲へ飛散した処理液が衝突する部分およびその周辺部分に、親水性表面と疎水性表面とを混在させたことを特徴とする。   The invention according to claim 1 is a substrate holding means for holding the substrate in a horizontal position, a substrate rotating means for rotating the substrate held by the substrate holding means about a vertical axis, and a substrate held by the substrate holding means. A processing liquid supply means for supplying a processing liquid to the surface of the substrate, and a container shape having an upper surface opened, and is disposed so as to surround a side and a lower side of the substrate held by the substrate holding means. In a substrate rotation type processing apparatus provided with a cup for collecting scattered processing liquid, at least a portion of the inner wall surface of the cup that collides with the processing liquid scattered from the substrate to the periphery and a peripheral portion thereof are hydrophilic. It is characterized by mixing a surface and a hydrophobic surface.

請求項2に係る発明は、請求項1記載の基板回転式処理装置において、親水性表面と疎水性表面とが水平方向に延びる縞状に混在したことを特徴とする。   According to a second aspect of the present invention, in the substrate rotation processing apparatus according to the first aspect, the hydrophilic surface and the hydrophobic surface are mixed in stripes extending in the horizontal direction.

請求項3に係る発明は、請求項1記載の基板回転式処理装置において、親水性表面と疎水性表面とが市松模様状に混在したことを特徴とする。   The invention according to claim 3 is the substrate rotation processing apparatus according to claim 1, wherein the hydrophilic surface and the hydrophobic surface are mixed in a checkered pattern.

請求項1に係る発明の基板回転式処理装置においては、カップの内壁面の、基板上から周囲へ飛散した処理液が衝突する部分およびその周辺部分が、親水性表面と疎水性表面とが混在するように表面処理されているので、当該部分の全体が疎水性表面であるカップに比べて親水性の処理液の跳ね返りが減少し、また、疎水性表面に衝突して表面上で拡散した処理液は、速やかに隣接する親水性表面へ流れて親水性表面上に凝集するので、処理液の跳ね返りが起こりにくい。また、親水性表面に衝突した処理液は、元々跳ね返りを生じにくい。したがって、基板上から飛散してカップの内壁面に衝突した処理液が内壁面で跳ね返って、使用済み処理液の一部が基板の表面に再付着する、といったことが防止される。一方、親水性表面に衝突して薄膜状に拡がり、また、疎水性表面から親水性表面へ流れて凝集した処理液は、或る程度の大きさの液滴に成長すると、親水性表面から流下して隣接する疎水性表面へ流動するので、親水性表面上に留まる時間が短くなる。したがって、カップの内壁面に処理液が付着して乾燥し不純物や処理液成分がカップの内壁面に堆積する、といったことが防止される。
このように、請求項1に係る発明の基板回転式処理装置を使用すると、回転する基板の表面から周囲へ飛散した処理液がカップ内壁面で跳ね返ることが防止されるとともに、カップの内壁面に処理液が付着し乾燥して不純物や処理液成分がカップ内壁面に堆積することが防止されるので、カップに起因する基板汚染の原因を取り除くことができる。
In the substrate rotating type processing apparatus according to the first aspect of the present invention, a hydrophilic surface and a hydrophobic surface are mixed in the portion of the inner wall surface of the cup where the processing liquid splashed from the substrate to the periphery collides with the peripheral portion. As a result of the surface treatment, the rebound of the hydrophilic treatment liquid is reduced compared to a cup whose entire surface is a hydrophobic surface, and the treatment which has collided with the hydrophobic surface and diffused on the surface Since the liquid quickly flows to the adjacent hydrophilic surface and aggregates on the hydrophilic surface, the treatment liquid is unlikely to rebound. In addition, the treatment liquid that has collided with the hydrophilic surface is unlikely to rebound from the beginning. Therefore, it is possible to prevent the processing liquid splashing from the substrate and colliding with the inner wall surface of the cup from bouncing back on the inner wall surface, and a part of the used processing liquid is reattached to the surface of the substrate. On the other hand, the treatment liquid that collides with the hydrophilic surface and spreads in the form of a thin film and flows from the hydrophobic surface to the hydrophilic surface and agglomerates flows down from the hydrophilic surface when growing into droplets of a certain size. As a result, the time to stay on the hydrophilic surface is shortened. Therefore, it is possible to prevent the treatment liquid from adhering to the inner wall surface of the cup and drying to deposit impurities and treatment liquid components on the inner wall surface of the cup.
Thus, when the substrate rotating processing apparatus of the invention according to claim 1 is used, the processing liquid splashed from the surface of the rotating substrate to the surroundings is prevented from splashing on the inner wall surface of the cup, and on the inner wall surface of the cup. Since the treatment liquid adheres and is dried and impurities and treatment liquid components are prevented from being deposited on the inner wall surface of the cup, the cause of substrate contamination caused by the cup can be removed.

請求項2に係る発明の基板回転式処理装置では、親水性表面と疎水性表面とが水平方向に延びる縞状に混在することにより、請求項1に係る上記作用効果が確実に奏される。   In the substrate rotating type processing apparatus according to the second aspect of the present invention, the hydrophilic surface and the hydrophobic surface are mixed in a stripe shape extending in the horizontal direction, so that the above-described operational effect according to the first aspect is reliably exhibited.

請求項3に係る発明の基板回転式処理装置では、親水性表面と疎水性表面とが市松模様状に混在することにより、請求項1に係る上記作用効果が確実に奏される。   In the substrate rotating type processing apparatus according to the third aspect of the present invention, the hydrophilic surface and the hydrophobic surface are mixed in a checkered pattern, so that the above-described operational effect according to the first aspect is reliably exhibited.

以下、この発明の最良の実施形態について図1ないし図3を参照しながら説明する。
図1は、この発明の実施形態の1例を示し、基板回転式処理装置、例えば基板回転式洗浄装置(スピンスクラバ)の要部の概略構成を示す縦断面図である。
The best embodiment of the present invention will be described below with reference to FIGS.
FIG. 1 shows an example of an embodiment of the present invention, and is a longitudinal sectional view showing a schematic configuration of a main part of a substrate rotating processing apparatus, for example, a substrate rotating cleaning apparatus (spin scrubber).

この洗浄装置は、半導体ウエハ等の基板Wを水平姿勢に保持するスピンチャック10を有し、スピンチャック10に保持された基板Wは、スピンチャック10を支持する回転支軸12に連結されたスピンモータ14によって鉛直軸回りに水平面内で回転させられる。基板Wの周囲には、上面が開口しスピンチャック10に保持された基板Wの側方および下方を取り囲むような容器状に形成されたカップ16が配設されている。カップ16の内部には、スピンチャック10に保持された基板Wの下方に円錐台状の整流部材18が配設されており、整流部材18の中央部に支持円筒20が一体的に固着されている。そして、支持円筒20の内部に回転支軸12が挿通されている。カップ16と整流部材18とは、カップ16の底壁部が整流部材18の底面部に回り込むように屈曲加工されて一体的に連接している。支持円筒20と回転支軸12とは連結しておらず、したがって、カップ16、整流部材18および支持円筒20は、スピンチャック10、回転支軸12およびスピンモータ14に対し一体となって上下方向へ移動可能であり、図示していない昇降機構により、図示した基板洗浄時の位置とそれより下方の基板搬出入時の位置との間で昇降させることができるようになっている。   The cleaning apparatus includes a spin chuck 10 that holds a substrate W such as a semiconductor wafer in a horizontal posture, and the substrate W held by the spin chuck 10 is connected to a rotation support shaft 12 that supports the spin chuck 10. The motor 14 is rotated in the horizontal plane around the vertical axis. Around the substrate W, there is disposed a cup 16 which is formed in a container shape so as to surround the side and bottom of the substrate W which is opened on the upper surface and held by the spin chuck 10. Inside the cup 16, a truncated cone-shaped rectifying member 18 is disposed below the substrate W held by the spin chuck 10, and a support cylinder 20 is integrally fixed to the center of the rectifying member 18. Yes. The rotation support shaft 12 is inserted into the support cylinder 20. The cup 16 and the rectifying member 18 are bent and connected integrally so that the bottom wall portion of the cup 16 wraps around the bottom surface portion of the rectifying member 18. The support cylinder 20 and the rotation support shaft 12 are not connected. Therefore, the cup 16, the rectifying member 18 and the support cylinder 20 are integrated with the spin chuck 10, the rotation support shaft 12 and the spin motor 14 in the vertical direction. It is possible to move up and down between a position at the time of cleaning the substrate and a position at the time of loading / unloading the substrate below it by a lifting mechanism (not shown).

スピンチャック10に保持された基板Wの上方には、基板Wの表面へ純水等の洗浄液を供給する洗浄液供給ノズル22が配設されている。洗浄液供給ノズル22は、図示した位置からカップ16の外方へ退避させることができるようになっている。また、図示していないが、スピンチャック10に保持された基板Wの上方には、基板Wの表面を走査しながらスクラブ洗浄する回転洗浄ブラシが設置されており、回転洗浄ブラシは、上下方向へ移動可能に支持されている。   A cleaning liquid supply nozzle 22 that supplies a cleaning liquid such as pure water to the surface of the substrate W is disposed above the substrate W held by the spin chuck 10. The cleaning liquid supply nozzle 22 can be retracted to the outside of the cup 16 from the illustrated position. Although not shown, a rotary cleaning brush for scrub cleaning while scanning the surface of the substrate W is installed above the substrate W held by the spin chuck 10. It is supported movably.

カップ16は、円錐台周面の形状に形成され内壁面が下向きに拡開した上側カップ部24、この上側カップ部24の下端縁に連接して円筒状に形成され整流部材18の底面部に回り込むように屈曲した底壁部を有する下側カップ部26、および、上側カップ部24の上端縁に連接してその上端縁から内方に向かって水平に張り出した円環部28から構成され、それらが一体化して容器状に形成されている。上側カップ部24は、基板洗浄の際に、スピンチャック10に保持された基板Wが位置する水平面を含む高さに配置され、基板Wの表面から周囲へ飛散した洗浄液は上側カップ部24の内壁面に衝突する。下側カップ部26には、その底壁部に排液口30が形設され、排液口30にドレン管32が連通接続されている。また、下側カップ部26の底壁部には、整流部材18の下面と対向する位置に開口した排気管34が設けられており、この排気管34を通してカップ16内の排気が行われるようになっている。   The cup 16 is formed in the shape of a circular truncated cone and has an upper wall portion 24 whose inner wall surface is expanded downward. The cup 16 is connected to the lower edge of the upper cup portion 24 and is formed in a cylindrical shape. A lower cup portion 26 having a bottom wall portion bent so as to wrap around, and an annular portion 28 connected to the upper end edge of the upper cup portion 24 and projecting horizontally inward from the upper end edge; They are integrated into a container shape. The upper cup portion 24 is disposed at a height including a horizontal plane on which the substrate W held by the spin chuck 10 is positioned during substrate cleaning, and the cleaning liquid scattered from the surface of the substrate W to the surroundings is contained in the upper cup portion 24. Collide with the wall. A drainage port 30 is formed in the bottom wall portion of the lower cup portion 26, and a drain pipe 32 is connected to the drainage port 30. Further, an exhaust pipe 34 opened at a position facing the lower surface of the rectifying member 18 is provided on the bottom wall portion of the lower cup portion 26 so that the exhaust in the cup 16 is exhausted through the exhaust pipe 34. It has become.

上記した構成のカップ16は、PTFE等のフッ素樹脂、ポリ塩化ビニル、ポリプロピレンなどのプラスチック材料で形成されている。そして、カップ16の少なくとも上側カップ部24、すなわち、基板Wの表面から周囲へ飛散した洗浄液が衝突する部分である上側カップ部24の内壁面を、図2に展開図を示すように、親水性表面36と疎水性表面38とが水平方向に延びる縞状に混在するように表面処理している。疎水性のプラスチック材料で形成された上側カップ部24の内壁面を部分的に親水化処理する方法としては、例えば、目の極く細かいヤスリ等を使用して物理的に内壁面を粗面化したり、プラズマ処理、すなわち、プラズマ発生部を先端に持つノズルを使用し、そのノズル先端で内壁面を走査して内壁面を粗面化したり、薬剤を使用し、耐薬品性テープ等で内壁面を部分的にマスキングした後に薬剤を内壁面に塗布して粗面化したり、カップの内壁面に親水性材料を薄膜状に被着形成したりする方法があるが、親水化処理の方法はどのようなものであってもよい。   The cup 16 configured as described above is formed of a fluororesin such as PTFE, or a plastic material such as polyvinyl chloride or polypropylene. Then, at least the upper cup portion 24 of the cup 16, that is, the inner wall surface of the upper cup portion 24, which is a portion where the cleaning liquid scattered from the surface of the substrate W collides, is hydrophilic as shown in FIG. 2. The surface treatment is performed so that the surface 36 and the hydrophobic surface 38 are mixed in stripes extending in the horizontal direction. As a method of partially hydrophilizing the inner wall surface of the upper cup portion 24 formed of a hydrophobic plastic material, for example, the inner wall surface is physically roughened using an extremely fine file. Or plasma treatment, that is, use a nozzle with a plasma generating part at the tip, scan the inner wall surface with the nozzle tip to roughen the inner wall surface, use chemicals, and use chemical resistant tape etc. There are methods such as applying a chemical to the inner wall surface after partially masking the surface to roughen the surface, or depositing a hydrophilic material in a thin film on the inner wall surface of the cup. It may be something like this.

図3は、上側カップ部の内壁面に親水性表面と疎水性表面とを混在させる別の実施形態を示し、この図3に展開図を示すように、上側カップ部40の内壁面を、親水性表面42と疎水性表面44とが市松模様状に混在するように表面処理してもよい。また、それ以外の形態、例えば、三角形を組み合わせた鱗模様状としたり、六角形を組み合わせたハニカム状としたりしてもよい。なお、上側カップ部24の内壁面全体ではなく、上側カップ部24の内壁面の一部に親水性表面36と疎水性表面38とを混在させるようにしてもよい。また、上側カップ部24以外の下側カップ部26の内壁面の一部あるいは全体を、親水性表面と疎水性表面とが混在するように表面処理しても差し支えない。   FIG. 3 shows another embodiment in which a hydrophilic surface and a hydrophobic surface are mixed on the inner wall surface of the upper cup portion. As shown in a development view in FIG. 3, the inner wall surface of the upper cup portion 40 is made hydrophilic. Surface treatment may be performed so that the hydrophobic surface 42 and the hydrophobic surface 44 are mixed in a checkered pattern. Further, other forms such as a scale pattern combining triangles or a honeycomb pattern combining hexagons may be used. Note that the hydrophilic surface 36 and the hydrophobic surface 38 may be mixed in a part of the inner wall surface of the upper cup portion 24 instead of the entire inner wall surface of the upper cup portion 24. In addition, a part or the whole of the inner wall surface of the lower cup portion 26 other than the upper cup portion 24 may be surface-treated so that a hydrophilic surface and a hydrophobic surface are mixed.

この基板回転式洗浄装置では、カップ16の、基板W上から周囲へ飛散した純水等の洗浄液が衝突する部分である上側カップ部24の内壁面に親水性表面36と疎水性表面38とを混在させているので、上側カップ部24の内壁面が疎水性表面のままであるカップに比べて洗浄液の跳ね返りが減少する。また、上側カップ部24内壁面の疎水性表面38に衝突して表面上で拡散した洗浄液は、速やかに上・下に隣接する親水性表面36へ流れて親水性表面36上に凝集するため、洗浄液の跳ね返りが起こりにくくなる。そして、上側カップ部24内壁面の親水性表面36に衝突した洗浄液は、薄膜状に拡がるので元々跳ね返りを生じにくい。このため、基板W上から飛散して上側カップ部24の内壁面に衝突した洗浄液が内壁面で跳ね返って、使用済み洗浄液の一部が基板Wの表面に再付着する、といったことが防止されるので、使用済み洗浄液に含まれた不純物がパーティクルとなって基板Wを汚染する心配が無くなる。   In this substrate rotation type cleaning apparatus, a hydrophilic surface 36 and a hydrophobic surface 38 are formed on the inner wall surface of the upper cup portion 24 where the cleaning liquid such as pure water scattered from the substrate W to the periphery of the cup 16 collides. Since they are mixed, the rebound of the cleaning liquid is reduced as compared with a cup in which the inner wall surface of the upper cup portion 24 remains a hydrophobic surface. Further, the cleaning liquid that collides with the hydrophobic surface 38 of the inner wall surface of the upper cup portion 24 and diffuses on the surface quickly flows to the hydrophilic surface 36 adjacent to the upper and lower sides and aggregates on the hydrophilic surface 36. The cleaning liquid is less likely to rebound. And since the washing | cleaning liquid which collided with the hydrophilic surface 36 of the inner wall surface of the upper side cup part 24 spreads in a thin film form, it does not produce a rebound from the first. For this reason, it is prevented that the cleaning liquid splashed from the substrate W and collided with the inner wall surface of the upper cup portion 24 rebounds on the inner wall surface, and a part of the used cleaning liquid is reattached to the surface of the substrate W. Therefore, there is no concern that impurities contained in the used cleaning liquid become particles and contaminate the substrate W.

一方、上側カップ部24内壁面の親水性表面36に衝突して薄膜状に拡がり、また、疎水性表面38から親水性表面36へ流れて凝集した洗浄液は、或る程度の大きさの液滴に成長すると、親水性表面36から流下して下側に隣接する疎水性表面38へ流動するので、親水性表面36上に留まる時間が短くなる。したがって、上側カップ部24の内壁面に洗浄液が付着して乾燥し使用済み洗浄液中の不純物が上側カップ部24の内壁面に堆積する、といったことが防止される。そして、上側カップ部24の内壁面から下側カップ部26の内壁面へ流下した使用済み洗浄液は、疎水性表面である下側カップ部26の内壁面上を速やかに流下して内底部に捕集され、下側カップ部26の底壁部に設けられた排液口30の方へ速やかに流動して、排液口30からドレン管32を通ってカップ16から排出され回収される。   On the other hand, the cleaning liquid that collides with the hydrophilic surface 36 on the inner wall surface of the upper cup portion 24 and spreads in a thin film shape and flows from the hydrophobic surface 38 to the hydrophilic surface 36 and aggregates is a droplet of a certain size. When it grows, it flows down from the hydrophilic surface 36 and flows to the hydrophobic surface 38 adjacent to the lower side, so that the time spent on the hydrophilic surface 36 is shortened. Therefore, it is possible to prevent the cleaning liquid from adhering to the inner wall surface of the upper cup portion 24 and drying and depositing impurities in the used cleaning liquid on the inner wall surface of the upper cup portion 24. The used cleaning liquid that has flowed down from the inner wall surface of the upper cup portion 24 to the inner wall surface of the lower cup portion 26 quickly flows down on the inner wall surface of the lower cup portion 26, which is a hydrophobic surface, and is trapped in the inner bottom portion. Collected, quickly flows toward the drainage port 30 provided in the bottom wall portion of the lower cup portion 26, and is discharged from the cup 16 through the drain pipe 32 through the drainage port 30 and collected.

上記した実施形態では、この発明を基板回転式洗浄装置に適用する場合について説明したが、この発明は、それ以外の基板回転式処理装置、例えば現像装置(スピンデベロッパ)、塗布装置(スピンコータ)等についても同様に適用し得るものである。また、カップの構造は、上記実施形態で説明したものに限らない。   In the above-described embodiment, the case where the present invention is applied to the substrate rotating cleaning apparatus has been described. However, the present invention is not limited to the substrate rotating processing apparatus, such as a developing device (spin developer), a coating device (spin coater), and the like. The same applies to. Moreover, the structure of the cup is not limited to that described in the above embodiment.

この発明の実施形態の1例を示し、基板回転式処理装置である基板回転式洗浄装置の要部の概略構成を示す縦断面図である。BRIEF DESCRIPTION OF THE DRAWINGS It is a longitudinal cross-sectional view which shows an example of embodiment of this invention, and shows schematic structure of the principal part of the board | substrate rotary cleaning apparatus which is a substrate rotary processing apparatus. 図1に示した基板回転式洗浄装置の構成要素であるカップの上側カップ部を展開した状態で示す図である。It is a figure shown in the state which expand | deployed the upper cup part of the cup which is a component of the board | substrate rotation type cleaning apparatus shown in FIG. この発明の別の実施形態を示し、基板回転式洗浄装置の構成要素であるカップの上側カップ部を展開した状態で示す図である。It is a figure which shows another embodiment of this invention, and shows the state which expand | deployed the upper cup part of the cup which is a component of a board | substrate rotary cleaning apparatus. 基板回転式処理装置の概略構成を示す模式図であって、(a)は、基板の表面から周囲へ飛散した親水性の処理液が疎水性のカップ内壁面に衝突した際の様子を説明するための図であり、(b)は、基板の表面から周囲へ飛散した親水性の処理液が親水性のカップ内壁面に衝突した際の様子を説明するための図である。BRIEF DESCRIPTION OF THE DRAWINGS It is a schematic diagram which shows schematic structure of a board | substrate rotation type processing apparatus, Comprising: (a) demonstrates a mode at the time of the hydrophilic process liquid which scattered from the surface of the board | substrate colliding with the hydrophobic cup inner wall surface. (B) is a figure for demonstrating a mode at the time of the hydrophilic processing liquid which scattered from the surface of the board | substrate colliding with the hydrophilic inner surface of a cup.

符号の説明Explanation of symbols

10 スピンチャック
12 回転支軸
14 スピンモータ
16 カップ
18 整流部材
20 支持円筒
22 洗浄液供給ノズル
24、40 上側カップ部
26 下側カップ部
30 排液口
32 ドレン管
34 排気管
36、42 上側カップ部内壁面の親水性表面
38、44 上側カップ部内壁面の疎水性表面
W 基板
DESCRIPTION OF SYMBOLS 10 Spin chuck 12 Rotation support shaft 14 Spin motor 16 Cup 18 Rectification member 20 Support cylinder 22 Cleaning liquid supply nozzle 24, 40 Upper cup part 26 Lower cup part 30 Drain port 32 Drain pipe 34 Exhaust pipe 36, 42 Upper cup part inner wall surface Hydrophilic surface 38, 44 Hydrophobic surface of the inner wall surface of the upper cup part W substrate

Claims (3)

基板を水平姿勢に保持する基板保持手段と、
この基板保持手段に保持された基板を鉛直軸回りに回転させる基板回転手段と、
前記基板保持手段に保持された基板の表面へ処理液を供給する処理液供給手段と、
上面が開口した容器状をなし、前記基板保持手段に保持された基板の側方および下方を取り囲むように配設され、基板上から周囲へ飛散する処理液を回収するためのカップと、
を備えた基板回転式処理装置において、
前記カップの内壁面の少なくとも、基板上から周囲へ飛散した処理液が衝突する部分およびその周辺部分に、親水性表面と疎水性表面とを混在させたことを特徴とする基板回転式処理装置。
A substrate holding means for holding the substrate in a horizontal position;
Substrate rotating means for rotating the substrate held by the substrate holding means around a vertical axis;
A processing liquid supply means for supplying a processing liquid to the surface of the substrate held by the substrate holding means;
A cup having an upper surface opened, disposed so as to surround the side and lower side of the substrate held by the substrate holding means, and a cup for recovering the processing liquid scattered from the substrate to the surroundings;
In the substrate rotation processing apparatus provided with
A substrate rotating processing apparatus, wherein a hydrophilic surface and a hydrophobic surface are mixed in at least a portion of the inner wall surface of the cup where a processing liquid scattered from the substrate to the periphery collides with the peripheral portion.
親水性表面と疎水性表面とが水平方向に延びる縞状に混在した請求項1記載の基板回転式処理装置。 The substrate rotating processing apparatus according to claim 1, wherein the hydrophilic surface and the hydrophobic surface are mixed in stripes extending in the horizontal direction. 親水性表面と疎水性表面とが市松模様状に混在した請求項1記載の基板回転式処理装置。 The substrate rotation processing apparatus according to claim 1, wherein the hydrophilic surface and the hydrophobic surface are mixed in a checkered pattern.
JP2004332625A 2004-11-17 2004-11-17 Substrate rotating processing equipment Expired - Fee Related JP4347785B2 (en)

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