JPH09252013A - Die, apparatus and method for sealing semiconductor device with resin - Google Patents

Die, apparatus and method for sealing semiconductor device with resin

Info

Publication number
JPH09252013A
JPH09252013A JP5914996A JP5914996A JPH09252013A JP H09252013 A JPH09252013 A JP H09252013A JP 5914996 A JP5914996 A JP 5914996A JP 5914996 A JP5914996 A JP 5914996A JP H09252013 A JPH09252013 A JP H09252013A
Authority
JP
Japan
Prior art keywords
peripheral
central
mold
pressing
pressure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5914996A
Other languages
Japanese (ja)
Inventor
Naoto Takebe
直人 武部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP5914996A priority Critical patent/JPH09252013A/en
Publication of JPH09252013A publication Critical patent/JPH09252013A/en
Pending legal-status Critical Current

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  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Abstract

PROBLEM TO BE SOLVED: To reduce voids, prevent blow holes, and improve the production efficiency by providing a movable center pressing part, a peripheral pressing part and a die clamp disposed to press from the central part of the peripheral part. SOLUTION: A die 7a has an upper and lower parts symmetric to a plane, a pressing face 8a of the die is concentricity square defined by a central part 9a and peripheral part 10a around which a die clamp 11a to group and fix a lead frame is disposed. The central part 9a protrudes to a chip housing side (pressing direction) from the part 10a. Both parts 9a and 10a are movable to the clamp 11a, thereby being able to reduce voids staying in a seal member and prevent blow holes.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】この発明は、半導体装置の封
止装置用金型及び封止装置及び封止方法に係り、特に半
導体装置の樹脂封止のための圧縮成形法の改良に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a mold for a sealing device of a semiconductor device, a sealing device and a sealing method, and more particularly to improvement of a compression molding method for resin sealing of a semiconductor device.

【0002】[0002]

【従来の技術】図6は、従来の半導体装置の封止装置用
金型の平面図で、図7は、図6の7−7線に沿った半導
体装置の封止装置の断面図である。図6に示すように、
封止装置の金型1は、周囲の型締め部1a、その内側の
金型1bからなる。型締め部1aの四隅にはエアベント
2がある。また、型締め部1aの加圧面の内側部分の境
界に沿って押し切り面1cがある。押し切り面1cは5
0μm程度の凸状の薄く細長い面である。
2. Description of the Related Art FIG. 6 is a plan view of a conventional mold for a semiconductor device sealing device, and FIG. 7 is a cross-sectional view of the semiconductor device sealing device taken along line 7-7 of FIG. . As shown in FIG.
The mold 1 of the sealing device is composed of a mold clamping portion 1a on the periphery and a mold 1b inside thereof. Air vents 2 are provided at four corners of the mold clamping portion 1a. Further, there is a push-cut surface 1c along the boundary of the inner portion of the pressing surface of the mold clamping portion 1a. Push cut surface 1c is 5
It is a thin thin elongated surface having a convex shape of about 0 μm.

【0003】図7に示すように、封止装置の金型1は図
中の上下方向に面対称になっている。この装置は、封止
部材である樹脂シート(タブレット)3、半導体チップ
4、樹脂シート3をその順に重ねた状態で、金型1によ
って図中の上下から加圧し樹脂封止する構造となってい
る。半導体チップ4に接触する樹脂シート3の接触面は
凸状に形成されている。
As shown in FIG. 7, the mold 1 of the sealing device is plane-symmetrical in the vertical direction in the figure. This device has a structure in which a resin sheet (tablet) 3 which is a sealing member, a semiconductor chip 4, and a resin sheet 3 are stacked in this order, and a mold 1 is used to press the resin sheet from above and below in the figure to perform resin sealing. There is. The contact surface of the resin sheet 3 that contacts the semiconductor chip 4 is formed in a convex shape.

【0004】半導体チップ4にはリードフレーム(また
は、TABテープ)5が接続されている。押し切り面1
cを含む型締め部1aは、リードフレーム5を挟んで固
定する。上下の型締め部1aにそれぞれ駆動手段6aが
取り付けられている。また、上下の前記内側の金型1b
にそれぞれ駆動手段6bが取り付けられている。尚、駆
動手段6a、6bは周知の油圧機構、サーボモータ等で
よい。
A lead frame (or TAB tape) 5 is connected to the semiconductor chip 4. Push cut surface 1
The mold clamping portion 1a including c is fixed by sandwiching the lead frame 5. Driving means 6a are attached to the upper and lower mold clamping portions 1a, respectively. Also, the upper and lower inner molds 1b
A drive means 6b is attached to each. The drive means 6a, 6b may be a known hydraulic mechanism, servo motor, or the like.

【0005】次に、上記の金型1を用いた封止装置の動
作及び封止方法を説明する。図中の上から、樹脂シート
3、半導体チップ4、樹脂シート3をその順に重ね、金
型1の内部に収容する。その後、型締め部1aによって
リードフレーム5を挟んで固定する。その後、加熱した
前記内側の金型1bを樹脂シート3に押し付ける。樹脂
シート3は溶融し、さらに内側の金型1bによって加圧
される。この時、内側の金型1bの圧縮過程で巻き込ん
だ空気及び樹脂に内在する気泡をエアベント2から逃が
す。その後、加熱を続け、樹脂が硬化し、半導体チップ
4が封止される。
Next, the operation and sealing method of the sealing device using the mold 1 will be described. The resin sheet 3, the semiconductor chip 4, and the resin sheet 3 are stacked in this order from the top in the figure and housed in the mold 1. After that, the lead frame 5 is sandwiched and fixed by the mold clamping portion 1a. Then, the heated inner mold 1b is pressed against the resin sheet 3. The resin sheet 3 melts and is further pressed by the inner die 1b. At this time, the air entrained in the compression process of the inner mold 1b and the air bubbles contained in the resin escape from the air vent 2. Then, heating is continued, the resin is cured, and the semiconductor chip 4 is sealed.

【0006】[0006]

【発明が解決しようとする課題】しかしながら、上記の
ような構成では、下記のような問題がある。加圧成形の
際に、金型1内で溶融した樹脂は均一な圧力を受けるの
で、溶融した樹脂内に取り残された気泡は滞留する。そ
のままの状態で樹脂が硬化するため、この気泡によりボ
イドが生じるという問題があった。
However, the above configuration has the following problems. At the time of pressure molding, the resin melted in the mold 1 receives a uniform pressure, so that the bubbles left behind remain in the melted resin. Since the resin is cured as it is, there is a problem that voids are generated by the bubbles.

【0007】この問題の対策のため、例えば特開平6ー
326143号(特願平5−109381号)には、図
7に示すような樹脂シート3の半導体チップ4との接触
面を凸状に形成することが記載されている。つまり、樹
脂シート3の接触面は周辺より中心部が隆起した球面状
である。このような形状の樹脂シート3を用いた場合、
加圧時に中心より外周に向かって圧力が順次伝わる。そ
の結果、溶融した樹脂内の中心部よりその周辺の圧力が
低くなり、気泡が追い出さやすくなる。
To solve this problem, for example, in Japanese Patent Laid-Open No. 6-326143 (Japanese Patent Application No. 5-109381), the contact surface of the resin sheet 3 with the semiconductor chip 4 as shown in FIG. It is described to form. That is, the contact surface of the resin sheet 3 has a spherical shape in which the central portion is raised more than the periphery. When the resin sheet 3 having such a shape is used,
When pressure is applied, the pressure is sequentially transmitted from the center toward the outer circumference. As a result, the pressure in the periphery of the molten resin becomes lower than that in the central portion, and the bubbles are easily expelled.

【0008】しかし、この場合にも、上記の封止の前に
樹脂シート3の形状を凸状に整える(以下、プリフォー
ムと記す)ため、専用のプリフォーム用の金型等をパッ
ケージ毎に準備する必要がある。また、樹脂製造の効率
が低下し、大幅にコストが増加するという問題がある。
However, also in this case, in order to adjust the shape of the resin sheet 3 to a convex shape (hereinafter referred to as a preform) before the above-mentioned sealing, a dedicated preform die or the like is provided for each package. You need to prepare. Further, there is a problem that the efficiency of resin production is lowered and the cost is significantly increased.

【0009】この発明の目的は、不良の発生が防止さ
れ、製造効率が良い半導体装置の封止装置及びそのため
の封止装置用金型及び低い製造コストの封止方法を提供
することにある。
An object of the present invention is to provide a sealing device for a semiconductor device, which prevents generation of defects and has good manufacturing efficiency, a mold for the sealing device therefor, and a sealing method with low manufacturing cost.

【0010】[0010]

【課題を解決するための手段】上記課題を解決し目的を
達成するために、この発明の半導体装置の封止装置用金
型及び封止装置及び封止方法においては以下の手段を講
じた。 (1)請求項1に記載した本発明の半導体装置の封止装
置用金型は、リードフレームが接続された半導体チップ
の上、下面にそれぞれ対向して設けられ、前記半導体チ
ップの上、下面側に配置された平板状の封止部材の中央
部を挟んで加圧する互いに移動可能な中央加圧部と、前
記半導体チップの上、下面にそれぞれ対向して前記中央
加圧部に隣接して設けられ、前記封止部材の前記中央部
に隣接した周辺部を挟んで加圧する互いに移動可能な周
辺加圧部と、少なくとも前記周辺加圧部に隣接して設け
られ、前記リードフレームを挟んで固定する互いに移動
可能な型締め部とを備えている。さらに、前記中央加圧
部から外周の前記周辺加圧部に向けて順次加圧するよう
に配置されている。
In order to solve the above problems and achieve the object, the following means are taken in the mold for a sealing device of a semiconductor device, the sealing device and the sealing method of the present invention. (1) A mold for a sealing device of a semiconductor device according to a first aspect of the present invention is provided so as to face an upper surface and a lower surface of a semiconductor chip to which a lead frame is connected, respectively. And a movable central pressing portion that presses with a central portion of a flat plate-shaped sealing member sandwiched therebetween, and an upper and a lower surface of the semiconductor chip, which face each other and are adjacent to the central pressing portion. A movable peripheral pressurizing portion that is provided to press the peripheral portion adjacent to the central portion of the sealing member, and at least adjacent to the peripheral pressurizing portion, and sandwich the lead frame. And a mold clamping part that is movable relative to each other for fixing. Further, it is arranged so as to sequentially apply pressure from the central pressurizing portion toward the peripheral pressurizing portion on the outer periphery.

【0011】上記本発明の半導体装置の封止装置用金型
においては、前記封止部材の前記中央部と前記周辺部と
を加圧する部分が別になっており、かつ互いに移動可能
なので、加圧の際に前記封止部材の前記中央部から前記
周辺部に向けて加圧の大きさを小さくしていくことが可
能となる。従って、前記封止部材に滞留する気泡を減少
させることが可能になり、巣不良の発生が防止される。 (2)請求項2に記載した本発明の半導体装置の封止装
置は、リードフレームが接続された半導体チップの上、
下面にそれぞれ対向して設けられ、前記半導体チップの
上、下面側に配置された封止部材の中央部を挟んで加圧
する互いに移動可能な中央加圧部と、前記半導体チップ
の上、下面にそれぞれ対向して前記中央加圧部に隣接し
て設けられ、前記封止部材の前記中央部に隣接した周辺
部を挟んで加圧する互いに移動可能な周辺加圧部と、少
なくとも前記周辺加圧部に隣接して設けられ、前記リー
ドフレームを挟んで固定する互いに移動可能な型締め部
とを有する金型を備えている。さらに、前記金型の中央
加圧部から周辺加圧部の順に駆動し、前記封止部材を加
圧する駆動手段を備えている。
In the mold for the sealing device of the semiconductor device according to the present invention, since the portions for pressing the central portion and the peripheral portion of the sealing member are separate and are movable with respect to each other, the pressure is applied. At this time, it becomes possible to decrease the magnitude of the pressure from the central portion of the sealing member toward the peripheral portion. Therefore, it becomes possible to reduce the air bubbles staying in the sealing member and prevent the occurrence of nest defects. (2) A semiconductor device encapsulation device according to a second aspect of the present invention is a semiconductor device on which a lead frame is connected,
Centrally movable parts that are provided to face each other and are movable on both sides of the semiconductor chip, sandwiching the central part of the sealing member arranged on the upper and lower surfaces of the semiconductor chip, and on the upper and lower surfaces of the semiconductor chip. Peripheral pressurizing portions, which are provided so as to face each other and are adjacent to the central pressurizing portion, and which pressurize while sandwiching a peripheral part adjacent to the central part of the sealing member, and at least the peripheral pressurizing portion. And a mold having a mold clamping part that is movable adjacent to each other and is fixed by sandwiching the lead frame. Further, a driving means for driving the sealing member by driving in order from the central pressing portion of the mold to the peripheral pressing portion is provided.

【0012】上記本発明の半導体装置の封止装置におい
ては、封止時、前記封止部材の前記中央部から前記周辺
部に向けて加圧の大きさが小さくなるので、前記封止部
材に滞留する気泡が減少する。従って、巣不良の発生が
防止される。また、前記封止部材のプリフォームの必要
がないので、半導体装置のコストが低減される。
In the semiconductor device sealing device of the present invention described above, since the amount of pressure applied from the central portion to the peripheral portion of the sealing member decreases during sealing, Air bubbles that accumulate are reduced. Therefore, the occurrence of nest defects is prevented. In addition, the cost of the semiconductor device is reduced because there is no need to preform the sealing member.

【0013】また、請求項3に示すように、前記中央加
圧部は四角状であり、前記周辺加圧部は前記中央加圧部
に隣接して囲む同心の1段または複数段の四角状に形成
され、前記型締め部は前記周辺部に隣接して囲む同心の
四角状に形成されている。
Further, according to a third aspect of the present invention, the central pressurizing portion has a rectangular shape, and the peripheral pressurizing portion has a concentric one-step or multi-step rectangular shape surrounding the central pressurizing section. And the mold clamping portion is formed in a concentric square shape surrounding and adjoining the peripheral portion.

【0014】上記本発明の半導体装置の封止装置におい
ては、前記金型が四角状であるので、前記封止部材の形
状が前記半導体チップの形状に合っており、封止後の前
記封止部材の整形が容易である。
In the semiconductor device sealing device of the present invention, since the mold is square, the shape of the sealing member matches the shape of the semiconductor chip, and the sealing after sealing is performed. The shaping of the member is easy.

【0015】また、請求項4に示すように、前記周辺加
圧部は、前記型締め部との隣接部に第1の弾性部材を介
して設けられ、非加圧時はその先端部が前記型締め部の
先端から離れた第1の位置にあり、前記型締め部が前記
リードフレームを挟持した状態において、前記第1の弾
性部材の付勢力に抗してその先端部が前記リードフレー
ムから所定の距離離れた第2の位置に移動される。さら
に、前記中央加圧部は、前記周辺加圧部内に第2の弾性
部材を介在して移動可能に設けられ、前記周辺加圧部が
前記型締め部の前記第1の位置にある時その先端部が前
記周辺加圧部の先端部より突出され、前記周辺加圧部が
前記第2の位置に移動する際先端が前記封止部材に当接
してそれを加圧し、前記第2の弾性部材の付勢力に抗し
て前記周辺加圧部内に移動し、前記周辺加圧部が前記第
2の位置にある時、その先端部が前記周辺加圧部の先端
部と同位置となる構成とされている。
According to a fourth aspect of the present invention, the peripheral pressurizing portion is provided adjacent to the mold clamping portion via a first elastic member, and the tip portion thereof is the non-pressurizing portion. At a first position distant from the tip of the mold clamping portion, and in the state where the mold clamping portion holds the lead frame, the tip portion of the first elastic member resists the urging force of the first elastic member from the lead frame. It is moved to a second position that is a predetermined distance away. Further, the central pressurizing unit is movably provided inside the peripheral pressurizing unit with a second elastic member interposed, and when the peripheral pressurizing unit is at the first position of the mold clamping unit, The tip portion is projected from the tip portion of the peripheral pressure portion, and when the peripheral pressure portion moves to the second position, the tip abuts against the sealing member to press it, and the second elastic A structure in which the distal end portion is located at the same position as the distal end portion of the peripheral pressure portion when the peripheral pressure portion moves into the peripheral pressure portion against the biasing force of the member and the peripheral pressure portion is in the second position. It is said that.

【0016】上記本発明の半導体装置の封止装置におい
ては、溶融した樹脂の中央部から周辺部に向けて加圧の
大きさが小さくなるので、硬化した樹脂に滞留する気泡
が減少し、巣不良の発生が防止される。また、駆動手段
は従来のままでよいので、封止装置のコストを低くでき
る。
In the above-described semiconductor device sealing device of the present invention, since the amount of pressure applied from the central portion of the melted resin to the peripheral portion thereof decreases, the amount of bubbles remaining in the cured resin decreases and The occurrence of defects is prevented. Further, since the driving means may be the same as the conventional one, the cost of the sealing device can be reduced.

【0017】請求項5に示すように、前記駆動手段は、
前記型締め部、前記中央加圧部、前記周辺加圧部をそれ
ぞれ独立に駆動する。上記本発明の半導体装置の封止装
置においては、前記駆動手段が前記中央加圧部、前記周
辺加圧部、前記型締め部に独立に取り付けられているの
で、加圧するための駆動力が分散され、比較的駆動力の
弱い前記駆動手段を用いることができる。従って、封止
装置のコストが低くなる。 (3)請求項6に記載の半導体装置の封止方法は、リー
ドフレームを挟持する型締め部と、この型締め部内に設
けられ半導体チップの上面側及び下面側に設けられる封
止部材の周辺を加圧する周辺加圧部と、この周辺加圧部
内に設けられ前記封止部材の中央部を加圧する中央加圧
部とを具備する金型を用いる。さらに、前記型締め部に
より前記リードフレームを挟持した状態で前記中央加圧
部で前記封止部材の中央部を加熱するとともに加圧す
る。この後、前記周辺加圧部により前記封止部材の周辺
を加圧する。
According to a fifth aspect, the driving means comprises:
The mold clamping section, the central pressing section, and the peripheral pressing section are independently driven. In the above-described semiconductor device sealing device of the present invention, since the driving means is independently attached to the central pressing portion, the peripheral pressing portion, and the mold clamping portion, the driving force for pressing is dispersed. The driving means having a relatively weak driving force can be used. Therefore, the cost of the sealing device is reduced. (3) In the method for sealing a semiconductor device according to claim 6, the die clamping portion for sandwiching the lead frame and the periphery of the encapsulating member provided in the die clamping portion and provided on the upper surface side and the lower surface side of the semiconductor chip. A mold is used which includes a peripheral pressurizing part for pressurizing the peripheral part and a central pressurizing part provided in the peripheral pressurizing part for pressurizing the central part of the sealing member. Further, the central pressing portion heats and pressurizes the central portion of the sealing member while the lead frame is sandwiched by the mold clamping portion. Then, the periphery of the sealing member is pressed by the peripheral pressing unit.

【0018】上記本発明の半導体装置の封止方法におい
ては、溶融した前記封止部材の中央部から周辺部に向け
て加圧の大きさが小さくなるので、前記封止部材に滞留
する気泡が減少する。また、その前記封止部材の気泡が
減少した状態で樹脂が硬化するので、封止された半導体
装置の巣不良の発生が防止される。従って、製造効率が
向上する。また、製造コストが低減され、結局、半導体
装置のコストが低減される。
In the method of sealing a semiconductor device according to the present invention, since the magnitude of the pressure applied from the central portion to the peripheral portion of the melted sealing member becomes smaller, air bubbles staying in the sealing member are reduced. Decrease. In addition, since the resin cures in a state where the bubbles of the sealing member are reduced, it is possible to prevent the occurrence of a defect in the sealed semiconductor device. Therefore, the manufacturing efficiency is improved. Further, the manufacturing cost is reduced, and eventually the cost of the semiconductor device is reduced.

【0019】[0019]

【発明の実施の形態】以下、本発明の実施の形態につい
て図面を参照して説明する。尚、図6、7と同一部分に
は同一符号を付す。図1(a)は本発明の実施の形態の
平面図で、図1(b)は図1(a)の1bー1b線に沿
った断面図である。以下、主に図7と異なる部分につい
て説明する。
BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described below with reference to the drawings. The same parts as those in FIGS. 6 and 7 are designated by the same reference numerals. 1A is a plan view of an embodiment of the present invention, and FIG. 1B is a sectional view taken along line 1b-1b of FIG. 1A. Hereinafter, the part different from FIG. 7 will be mainly described.

【0020】図1(a)に示すように、金型7aは四角
状で、中央の四角状の加圧面8aとその周囲の型締め部
11aとからなる。図1(b)に示すように、金型7a
は、図示せぬ半導体チップ、樹脂シートが重ねて収容さ
れ、図中の上下方向から加圧するように、上部と下部か
らなる。この金型7aの上部と下部は面対称となってい
る。金型7aの加圧面8aは、中央加圧部9aとその周
囲の周辺加圧部10aによって同心の四角状に形成され
る。つまり、この場合、加圧面8aは2段になってい
る。この周辺加圧部10aの周囲には、図示せぬリード
フレームを挟んで固定する型締め部11aが設けられて
いる。この中央加圧部9aは半導体チップを収容する側
(以下、加圧方向と記す)に周辺加圧部10aよりも突
き出ている。型締め部11aは中央加圧部9aよりも加
圧方向に突き出ている。これら中央部9a、周辺加圧部
10aは、後述するように型締め部11aに対して移動
可能とされている。
As shown in FIG. 1 (a), the mold 7a has a quadrangular shape and comprises a central quadrangular pressing surface 8a and a mold clamping portion 11a around the pressing surface 8a. As shown in FIG. 1B, the mold 7a
Includes a semiconductor chip (not shown) and a resin sheet which are stacked on top of each other and are composed of an upper part and a lower part so that pressure is applied from the vertical direction in the figure. The upper part and the lower part of the mold 7a are plane-symmetric. The pressing surface 8a of the mold 7a is formed in a concentric square shape by the central pressing portion 9a and the peripheral pressing portion 10a around the central pressing portion 9a. That is, in this case, the pressing surface 8a has two steps. Around the peripheral pressure portion 10a, a mold clamping portion 11a for fixing the lead frame (not shown) is provided. The central pressing portion 9a projects from the peripheral pressing portion 10a on the side where the semiconductor chip is housed (hereinafter referred to as the pressing direction). The mold clamping portion 11a projects in the pressing direction more than the central pressing portion 9a. The central portion 9a and the peripheral pressure portion 10a are movable with respect to the mold clamping portion 11a, as described later.

【0021】図2は、駆動手段である油圧機構を含めた
実施の形態の構成を示す断面図である。図2に示すよう
に、図中の上下の各周辺加圧部14、各型締め部15に
はそれぞれ油圧機構6a、6bが取り付けられている。
以下、図中の半導体チップ4、リードフレーム5の上部
について構成を説明するが下部についても同様である。
FIG. 2 is a sectional view showing the construction of the embodiment including a hydraulic mechanism which is a driving means. As shown in FIG. 2, hydraulic mechanisms 6a and 6b are attached to the upper and lower peripheral pressing portions 14 and the mold clamping portions 15 in the drawing, respectively.
The structure of the semiconductor chip 4 and the upper portion of the lead frame 5 will be described below, but the same applies to the lower portion.

【0022】中央加圧部13は周辺加圧部14の加圧面
の中央に配置されている。つまり、周辺加圧部14の加
圧面の中央に凹部が設けられ、その凹部に中央加圧部1
3が挿入されている。中央加圧部13は弾性体16を介
して周辺加圧部14に連結されている。
The central pressing portion 13 is arranged at the center of the pressing surface of the peripheral pressing portion 14. That is, a concave portion is provided at the center of the pressing surface of the peripheral pressing portion 14, and the central pressing portion 1 is provided in the concave portion.
3 is inserted. The central pressure member 13 is connected to the peripheral pressure member 14 via an elastic body 16.

【0023】周辺加圧部14の4つの側面のそれぞれに
凸部が設けられている。前記凸部に対応した型締め部1
5の側面の位置に凹部が設けられている。この周辺加圧
部14の凸部は型締め部15の凹部にはめ込まれてい
る。周辺加圧部14の凸部と型締め部15の凹部の加圧
方向の幅の差dは、後述する距離a1 より十分に長い。
つまり、組み合わされた凸部と凹部の間の空間に弾性部
材17が挿入されて、周辺加圧部14と型締め部15が
連結される。つまり、初期状態では、弾性部材17は周
辺加圧部14を押し上げている。尚、図中下側の場合、
弾性部材17は周辺加圧部14を押し下げている。
A convex portion is provided on each of the four side surfaces of the peripheral pressing portion 14. Mold clamping part 1 corresponding to the convex part
A concave portion is provided at a position on the side surface of 5. The convex portion of the peripheral pressing portion 14 is fitted in the concave portion of the mold clamping portion 15. The difference d in the width between the convex portion of the peripheral pressing portion 14 and the concave portion of the mold clamping portion 15 in the pressing direction is sufficiently longer than the distance a1 described later.
That is, the elastic member 17 is inserted into the space between the combined convex portion and concave portion, and the peripheral pressing portion 14 and the mold clamping portion 15 are connected. That is, in the initial state, the elastic member 17 pushes up the peripheral pressure portion 14. In the case of the lower side in the figure,
The elastic member 17 pushes down the peripheral pressing portion 14.

【0024】半導体チップ4、リードフレーム5、平板
状の樹脂シート18を金型12の中に収容した状態にお
いて、樹脂シート18の半導体チップ4に接した面の反
対側の面とリードフレームを含む平面との距離をa1 と
し、型締め部15の加圧面を含む仮想平面と中央加圧部
13の加圧面との距離をbとする。この場合、距離a1
は距離bより短い。また、周辺加圧部14の加圧面と中
央加圧部13の加圧面との距離cは0より大きい。尚、
図中下側の場合、樹脂シート18の半導体チップ4に接
した面の反対の面とリードフレームを含む平面との距離
a2 は大体樹脂シート18の厚さである。一方、距離a
1 は大体樹脂シート18及び半導体チップ4の厚さの和
である。尚、中央加圧部13と周辺加圧部14、及び、
周辺加圧部14の凸部と型締め部15の凹部の摺動する
部分は通常のはめ合いの公差程度に設計されている。
When the semiconductor chip 4, the lead frame 5 and the flat resin sheet 18 are housed in the mold 12, the surface of the resin sheet 18 opposite to the surface in contact with the semiconductor chip 4 and the lead frame are included. The distance from the plane is a1, and the distance between the virtual plane including the pressure surface of the mold clamping portion 15 and the pressure surface of the central pressure portion 13 is b. In this case, the distance a1
Is shorter than the distance b. The distance c between the pressure surface of the peripheral pressure portion 14 and the pressure surface of the central pressure portion 13 is larger than 0. still,
In the case of the lower side in the figure, the distance a2 between the surface of the resin sheet 18 opposite to the surface in contact with the semiconductor chip 4 and the plane including the lead frame is approximately the thickness of the resin sheet 18. On the other hand, the distance a
1 is the sum of the thicknesses of the resin sheet 18 and the semiconductor chip 4. In addition, the central pressure part 13 and the peripheral pressure part 14, and
The sliding portions of the convex portion of the peripheral pressing portion 14 and the concave portion of the mold clamping portion 15 are designed to have a normal fitting tolerance.

【0025】尚、周辺加圧部14に凹部、型締め部15
に凸部が設けられてもよい。この場合、初期状態では、
上側では弾性部材17は周辺加圧部14を押し上げ、下
側では押し下げている。また、尚、凸部及び凹部は4つ
の側面にそれぞれ設けられていたが、1箇所、あるいは
複数でもよい。また、その凸部及び凹部は4つの側面の
周囲に帯状に連続した形状としてもよい。凸部及び凹部
が複数の場合、摺動のバランスの点から凸部及び凹部を
設ける位置は金型の中央に対して対称であることが望ま
しい。
It should be noted that the peripheral pressing portion 14 has a concave portion and a mold clamping portion 15
A convex portion may be provided at. In this case, in the initial state,
The elastic member 17 pushes up the peripheral pressure portion 14 on the upper side, and pushes it down on the lower side. In addition, although the convex portion and the concave portion are provided on the four side surfaces, respectively, the convex portion and the concave portion may be provided at one place or a plurality thereof. Further, the convex portion and the concave portion may be formed in a continuous band shape around the four side surfaces. When there are a plurality of protrusions and recesses, it is desirable that the positions where the protrusions and recesses are provided are symmetrical with respect to the center of the mold from the viewpoint of sliding balance.

【0026】次に本発明の実施の形態の動作とその封止
方法を説明する。図3は、図1の場合の封止方法を説明
するための断面図である。図3(a)に示すように、ま
ず、型締め部11aを駆動し、リードフレーム5を型締
め部11aで挟持し、半導体チップ4を位置決め固定す
る。その後、図3(b)に示すように、熱せられた中央
加圧部9aを駆動し、平板状の樹脂シート18の中央部
付近を加圧すると共に加熱する。図3(c)に示すよう
に、樹脂シート18の中央部付近が溶融するとともに、
熱せられた周辺加圧部10aを駆動することによって樹
脂シート18の周辺部を加圧する。この時点で、溶融し
た樹脂の中央部と周辺部の圧力の差(以下、差圧と記
す)が生じている。従って、溶融した樹脂の内部の気泡
が順次外部に押し出されていく。最終的に、気泡はエア
ベント2から金型7aの外部に逃げる。
Next, the operation of the embodiment of the present invention and the sealing method thereof will be described. FIG. 3 is a cross-sectional view for explaining the sealing method in the case of FIG. As shown in FIG. 3A, first, the mold clamping portion 11a is driven, the lead frame 5 is sandwiched by the mold clamping portion 11a, and the semiconductor chip 4 is positioned and fixed. After that, as shown in FIG. 3B, the heated central pressing portion 9a is driven to press and heat the vicinity of the central portion of the flat resin sheet 18. As shown in FIG. 3C, the resin sheet 18 is melted near the center and
The peripheral portion of the resin sheet 18 is pressed by driving the heated peripheral pressing portion 10a. At this point, a difference in pressure between the central portion and the peripheral portion of the melted resin (hereinafter, referred to as a differential pressure) occurs. Therefore, the bubbles inside the molten resin are sequentially pushed out to the outside. Finally, the bubbles escape from the air vent 2 to the outside of the mold 7a.

【0027】さらに、中央加圧部9a、周辺加圧部10
aによって加熱を続け、樹脂を硬化させる。つまり、半
導体チップ4が封止される。尚、図中下側の中央加圧部
9a、周辺加圧部10aは、上側の中央加圧部9a、周
辺加圧部10aとタイミングを合わせて動かす。
Further, the central pressing portion 9a and the peripheral pressing portion 10
The heating is continued by a to cure the resin. That is, the semiconductor chip 4 is sealed. The central pressing portion 9a and the peripheral pressing portion 10a on the lower side in the drawing are moved in time with the central pressing portion 9a and the peripheral pressing portion 10a on the upper side.

【0028】図2の場合、油圧機構6a、6bによって
金型12の型締め部15、周辺加圧部14が別々に、同
時に、同じ速さで駆動される。つまり、型締め部15、
中央加圧部13、周辺加圧部14が同じ位置関係を保ち
ながら樹脂シート18、半導体チップ4、リードフレー
ム5に押し付けられる。
In the case of FIG. 2, the mold clamping section 15 and the peripheral pressing section 14 of the mold 12 are driven separately and simultaneously at the same speed by the hydraulic mechanisms 6a and 6b. That is, the mold clamping unit 15,
The central pressing portion 13 and the peripheral pressing portion 14 are pressed against the resin sheet 18, the semiconductor chip 4, and the lead frame 5 while maintaining the same positional relationship.

【0029】型締め部15によってリードフーム5が挟
まれて固定された後、油圧機構6bによって周辺加圧部
14は駆動を続ける。加熱された中央加圧部13が弾性
体16を介して樹脂シート18の中央部を加圧する。図
3の場合と同様に、差圧によって、溶融した樹脂の内部
の気泡が周辺に押し出されていく。さらに、加熱を続
け、樹脂はその中央部から順に硬化していく。
After the lead frame 5 is sandwiched and fixed by the mold clamping portion 15, the peripheral pressure portion 14 continues to be driven by the hydraulic mechanism 6b. The heated central pressing portion 13 presses the central portion of the resin sheet 18 via the elastic body 16. As in the case of FIG. 3, the bubbles inside the molten resin are pushed out to the periphery by the differential pressure. Further, heating is continued, and the resin is sequentially cured from its central portion.

【0030】次に、加熱された周辺加圧部14によって
樹脂シート18の中央部の周辺が加圧される。つまり、
樹脂の中央部から周辺部に向けて溶融していき、及び、
差圧によって樹脂内部の気泡は中央部からさらに外周側
に押し出される。以下、図3の場合と同様に半導体チッ
プ4、リードフレーム5が樹脂封止される。
Next, the periphery of the central portion of the resin sheet 18 is pressed by the heated peripheral pressing portion 14. That is,
The resin melts from the center to the periphery, and
Due to the pressure difference, the bubbles inside the resin are further pushed out from the central portion to the outer peripheral side. Thereafter, the semiconductor chip 4 and the lead frame 5 are resin-sealed as in the case of FIG.

【0031】上記の実施の形態においては、溶融した樹
脂の中央部からその外側の周辺部に向けて加圧の大きさ
が小さくなるので、気泡が効果的にエアベント2から逃
げ、硬化した樹脂に滞留する気泡が減少する。従って、
巣不良の発生が防止される。また、樹脂シートのプリフ
ォームの必要がないので、製造コストが低減される。ま
た、前記金型が四角状であるので、前記樹脂シートの形
状が前記半導体チップの形状に合っている。つまり、封
止後の前記封止部材の整形が容易である。また、油圧機
構6a、6bは従来のままでよいので、封止装置のコス
トが高くならない。
In the above-mentioned embodiment, since the magnitude of the pressurization becomes smaller from the central portion of the melted resin toward the outer peripheral portion thereof, the bubbles effectively escape from the air vent 2 to the cured resin. Air bubbles that accumulate are reduced. Therefore,
The occurrence of nest defects is prevented. Further, since there is no need to preform the resin sheet, the manufacturing cost is reduced. In addition, since the mold has a square shape, the shape of the resin sheet matches the shape of the semiconductor chip. That is, it is easy to shape the sealing member after sealing. Further, since the hydraulic mechanisms 6a and 6b may be the same as the conventional ones, the cost of the sealing device does not increase.

【0032】上記の実施の形態の封止方法においては、
溶融した樹脂の中央から外周に向けて加圧の大きさが小
さくなるので、溶融した樹脂に滞留する気泡が減少す
る。また、その気泡が減少した状態で順に中央部から外
周に向けて樹脂が硬化していくので、巣不良の発生が防
止され、製造効率が向上し、また、製造コストが低減さ
れる。 (変形例)変形例について説明する。図4(a)は、図
1の金型7bの加圧面8bが3段の場合の平面図であ
る。図4(b)は、図4(a)の4b−4b線に沿った
断面図である。図4(a)に示すように、金型7aと同
様に、中央加圧部9b、周辺加圧部10b、10c、型
締め部11bは金型7bの中央から外周に向けてその順
に配置され、同心の四角状となっている。また、型締め
部11b、中央加圧部9b、周辺加圧部10b、10c
はその順に加圧方向に突き出ている。尚、中央加圧部、
周辺加圧部からなる加圧面は4段以上でもよい。これら
中央加圧部9a、周辺加圧部10b、10c、型締め部
11bはそれぞれに対して互いに移動可能とされてい
る。
In the sealing method of the above embodiment,
Since the amount of pressure applied from the center of the melted resin to the outer circumference decreases, the bubbles remaining in the melted resin decrease. Further, since the resin is sequentially cured from the central portion toward the outer periphery in the state where the bubbles are reduced, the occurrence of nest defects is prevented, the manufacturing efficiency is improved, and the manufacturing cost is reduced. (Modification) A modification will be described. FIG. 4A is a plan view when the pressing surface 8b of the mold 7b of FIG. 1 has three steps. FIG. 4B is a sectional view taken along line 4b-4b of FIG. As shown in FIG. 4A, similarly to the mold 7a, the central pressing portion 9b, the peripheral pressing portions 10b, 10c, and the mold clamping portion 11b are arranged in that order from the center of the mold 7b toward the outer periphery. , Are concentric squares. Further, the mold clamping part 11b, the central pressing part 9b, the peripheral pressing parts 10b, 10c.
Protrude in the pressing direction in that order. In addition, the central pressure unit,
The pressing surface composed of the peripheral pressing portion may have four or more steps. The central pressing portion 9a, the peripheral pressing portions 10b, 10c, and the mold clamping portion 11b are movable with respect to each other.

【0033】図5は別の変形例を示す断面図である。図
5は動作中の状態を示している。加圧面及び基本的な構
成、動作、封止方法については上記の実施の形態と同じ
である。つまり、金型20の加圧面は、第1の実施の形
態の加圧面8aと同じである。以下、異なる点について
説明する。
FIG. 5 is a sectional view showing another modification. FIG. 5 shows a state during operation. The pressing surface, basic structure, operation, and sealing method are the same as those in the above-described embodiment. That is, the pressing surface of the mold 20 is the same as the pressing surface 8a of the first embodiment. The different points will be described below.

【0034】図5に示すように、図示せぬ別の土台に固
定されたそれぞれの駆動手段である油圧機構19a、1
9b、19cがそれぞれ金型20の中央加圧部21、周
辺加圧部22、型締め部23に独立に取り付けられてい
る。尚、油圧機構19a、19b、19cの代わりにサ
ーボモータを用いてもよい。
As shown in FIG. 5, hydraulic mechanisms 19a, 1 which are respective driving means fixed to another base not shown.
9b and 19c are independently attached to the central pressure part 21, the peripheral pressure part 22 and the mold clamping part 23 of the mold 20, respectively. A servo motor may be used instead of the hydraulic mechanisms 19a, 19b, 19c.

【0035】この場合、油圧機構19c、19a、19
bは独立に操作される。つまり、油圧機構19c、19
a、19bの駆動開始のタイミング、駆動速度、圧力を
別に設定し、最適な状態に調整する。尚、油圧機構19
c、19a、19bによって、型締め部23、中央加圧
部21、周辺加圧部22をそれぞれ同じ駆動開始タイミ
ング、同じ駆動速度、同じ圧力で樹脂シートに押し付け
てもよい。従って、型締め部23とリードフレーム5と
の距離、中央加圧部21、周辺加圧部22と樹脂シート
とのそれぞれの距離によって、各部の接触のタイミング
が決まる。
In this case, the hydraulic mechanisms 19c, 19a, 19
b is operated independently. That is, the hydraulic mechanisms 19c, 19
The drive start timings, drive speeds, and pressures of a and 19b are set separately and adjusted to the optimum state. The hydraulic mechanism 19
The mold clamping portion 23, the central pressing portion 21, and the peripheral pressing portion 22 may be pressed against the resin sheet with the same driving start timing, the same driving speed, and the same pressure by c, 19a, and 19b. Therefore, the contact timing of each part is determined by the distance between the mold clamping part 23 and the lead frame 5, the central pressing part 21, the peripheral pressing part 22 and the resin sheet.

【0036】この変形例においては、別の油圧機構によ
って各加圧部を駆動するので、加圧するための駆動力が
分散され、比較的弱い駆動力の油圧機構を用いることが
できる。
In this modification, since each pressurizing unit is driven by another hydraulic mechanism, the driving force for pressurizing is dispersed, and a hydraulic mechanism having a relatively weak driving force can be used.

【0037】尚、上記の実施の形態の金型は四角状で中
央加圧部から外周に向けて同心状に配置されている。し
かし、この配置に限らず、周辺加圧部は中央加圧部から
左右の両側のみに外に向けて設けられてもよい。
The molds of the above-mentioned embodiments are rectangular and are arranged concentrically from the central pressing portion toward the outer periphery. However, the arrangement is not limited to this arrangement, and the peripheral pressing portion may be provided outward only on the left and right sides from the central pressing portion.

【0038】尚、上記の実施の形態の半導体チップ4及
びリードフレーム5の上下の向きは特願平6ー3261
42号に示されるように、素子面が下向きの方が望まし
い。つまり、半導体チップ4の素子面の反対面、つまり
リードフレーム5のリードとの非接続面に樹脂シート1
8を搭載する。そして、別の樹脂シートを下側の金型に
直接供給し、これと同時もしくはその直後に、半導体チ
ップ4とそれに搭載された樹脂シート18を一緒に素子
面を下側(樹脂シート18を半導体チップ4の上側)に
して金型内に供給し、樹脂封止する。この場合、型締め
前に樹脂シートが落下するといった不具合を防止でき、
有効である。また、この時、樹脂シート18は半導体チ
ップ4とリードとの非接続面上に搭載されるので、樹脂
シートの搭載によって接続ワイヤが変形されることも少
ない。
The vertical direction of the semiconductor chip 4 and the lead frame 5 of the above-described embodiment is in Japanese Patent Application No. 6-3261.
As shown in No. 42, it is preferable that the element surface is downward. That is, the resin sheet 1 is provided on the surface opposite to the element surface of the semiconductor chip 4, that is, the surface of the lead frame 5 that is not connected to the leads.
Equipped with 8. Then, another resin sheet is directly supplied to the lower mold, and at the same time as or immediately after this, the semiconductor chip 4 and the resin sheet 18 mounted thereon are put together on the element side (the resin sheet 18 is a semiconductor The upper side of the chip 4) is supplied to the inside of the mold, and the resin is sealed. In this case, it is possible to prevent problems such as the resin sheet dropping before mold clamping,
It is valid. In addition, at this time, since the resin sheet 18 is mounted on the non-connecting surface between the semiconductor chip 4 and the leads, the connection wire is less likely to be deformed by mounting the resin sheet.

【0039】尚、樹脂は、冷やすことによって硬化する
熱可塑性のあるものでもよい。この場合、中央加圧部、
周辺加圧部のそれぞれの加熱及び冷却によって、樹脂が
それぞれ溶融及び硬化する。
The resin may be a thermoplastic resin which is cured by cooling. In this case, the central pressure unit,
The resin is melted and cured by the heating and cooling of the peripheral pressurizing portion, respectively.

【0040】[0040]

【発明の効果】以上説明したように、この発明によれ
ば、不良の発生が防止され、製造効率が良い半導体装置
の封止装置及びそのための封止装置用金型及び低い製造
コストの封止方法を提供できる。
As described above, according to the present invention, a semiconductor device encapsulation device which prevents occurrence of defects and has high manufacturing efficiency, a metal mold for an encapsulation device therefor, and a low manufacturing cost encapsulation device. A method can be provided.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施の形態に係る金型の構成を示す図FIG. 1 is a diagram showing a configuration of a mold according to an embodiment of the present invention.

【図2】本発明の実施の形態に係る半導体装置の封止装
置を示す断面図。
FIG. 2 is a sectional view showing a sealing device for a semiconductor device according to an embodiment of the present invention.

【図3】本発明の実施の形態に係る半導体装置の封止方
法を示す断面図。
FIG. 3 is a cross-sectional view showing a method for sealing a semiconductor device according to an embodiment of the present invention.

【図4】本発明の実施の形態に係る金型の構成を示す
図。
FIG. 4 is a diagram showing a configuration of a mold according to an embodiment of the present invention.

【図5】本発明の実施の形態に係る半導体装置の封止装
置を示す断面図。
FIG. 5 is a sectional view showing a sealing device for a semiconductor device according to an embodiment of the present invention.

【図6】従来の半導体装置の封止装置の金型の一例の構
成を示す平面図
FIG. 6 is a plan view showing a configuration of an example of a mold of a conventional semiconductor device sealing device.

【図7】従来の半導体装置の封止装置の一例の構成を示
す断面図。
FIG. 7 is a sectional view showing a configuration of an example of a conventional semiconductor device sealing device.

【符号の説明】[Explanation of symbols]

3、18、18a…樹脂シート(または樹脂)、 4…半導体チップ、 5…リードフレーム、 1、7a、7b、12、20…金型、 8a、8b…加圧面、 9a、9b、13、21…中央加圧部、 10a、10b、10c、14、22…周辺加圧部、 11a、11b、15、23…型締め部、 16、17…弾性部材、 6a、6b、19a、19b、19c…油圧機構。 3, 18, 18a ... Resin sheet (or resin), 4 ... Semiconductor chip, 5 ... Lead frame, 1, 7a, 7b, 12, 20 ... Mold, 8a, 8b ... Pressing surface, 9a, 9b, 13, 21 ... central pressing part, 10a, 10b, 10c, 14, 22 ... peripheral pressing part, 11a, 11b, 15, 23 ... mold clamping part, 16, 17 ... elastic member, 6a, 6b, 19a, 19b, 19c ... Hydraulic mechanism.

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】リードフレームが接続された半導体チップ
の上、下面にそれぞれ対向して設けられ、前記半導体チ
ップの上、下面側に配置された平板状の封止部材の中央
部を挟んで加圧する互いに移動可能な中央加圧部と、 前記半導体チップの上、下面にそれぞれ対向して前記中
央加圧部に隣接して設けられ、前記封止部材の前記中央
部に隣接した周辺部を挟んで加圧する互いに移動可能な
周辺加圧部と、 少なくとも前記周辺加圧部に隣接して設けられ、前記リ
ードフレームを挟んで固定する互いに移動可能な型締め
部とを備え、 前記中央加圧部から外周の前記周辺加圧部に向けて順次
加圧するように配置されたことを特徴とする半導体装置
の封止装置用金型。
1. A semiconductor chip to which a lead frame is connected is provided on an upper surface and a lower surface of the semiconductor chip, respectively, and a flat plate-shaped sealing member disposed on the upper surface and the lower surface of the semiconductor chip is sandwiched by a central portion. A movable central pressing portion that is pressed against each other, and a peripheral portion that is provided adjacent to the central pressing portion facing the upper and lower surfaces of the semiconductor chip, respectively, and that is adjacent to the central portion of the sealing member. A centrally-pressurized portion, which includes a movable peripherally-pressurizing portion that pressurizes with each other, and a mutually movable mold-clamping portion that is provided adjacent to at least the peripherally-pressurized portion and that sandwiches and fixes the lead frame. A mold for a sealing device of a semiconductor device, wherein the mold is arranged so as to sequentially apply pressure to the peripheral pressure applying portion on the outer periphery.
【請求項2】リードフレームが接続された半導体チップ
の上、下面にそれぞれ対向して設けられ、前記半導体チ
ップ上、下面側に配置された封止部材の中央部を挟んで
加圧する互いに移動可能な中央加圧部と、 前記半導体チップの上、下面にそれぞれ対向して前記中
央加圧部に隣接して設けられ、前記封止部材の前記中央
部に隣接した周辺部を挟んで加圧する互いに移動可能な
周辺加圧部と、 少なくとも前記周辺加圧部に隣接して設けられ、前記リ
ードフレームを挟んで固定する互いに移動可能な型締め
部とを有する金型と、 前記金型の中央加圧部から周辺加圧部の順に駆動し、前
記封止部材を加圧する駆動手段とを具備することを特徴
とする半導体装置の封止装置。
2. A semiconductor chip to which a lead frame is connected is provided on the upper and lower surfaces of the semiconductor chip so as to face each other. A central pressing part, and a semiconductor chip that is provided adjacent to the central pressing part so as to face the upper and lower surfaces of the semiconductor chip, and presses each other while sandwiching a peripheral part of the sealing member adjacent to the central part. A mold having a movable peripheral pressing part, and a mold clamping part which is provided adjacent to at least the peripheral pressing part and which is fixed with the lead frame sandwiched therebetween, and a central pressing part of the mold. A sealing device for a semiconductor device, comprising: a driving unit that drives in order from a pressing unit to a peripheral pressing unit to press the sealing member.
【請求項3】前記中央加圧部は四角状であり、 前記周辺加圧部は前記中央加圧部に隣接して囲む同心の
1段または複数段の四角状に形成され、 前記型締め部は前記周辺部に隣接して囲む同心の四角状
に形成されていることを特徴とする請求項2記載の半導
体装置の封止装置。
3. The central pressing part has a quadrangular shape, and the peripheral pressing part is formed in a concentric one-step or multi-step quadrangular shape surrounding the central pressing part. 3. The semiconductor device encapsulation device according to claim 2, wherein is formed in a concentric square shape that is adjacent to and surrounds the peripheral portion.
【請求項4】前記周辺加圧部は、前記型締め部との隣接
部に第1の弾性部材を介して設けられ、非加圧時はその
先端部が前記型締め部の先端から離れた第1の位置にあ
り、前記型締め部が前記リードフレームを挟持した状態
において、前記第1の弾性部材の付勢力に抗してその先
端部が前記リードフレームから所定の距離離れた第2の
位置に移動され、 前記中央加圧部は、前記周辺加圧部内に第2の弾性部材
を介在して移動可能に設けられ、前記周辺加圧部が前記
型締め部の前記第1の位置にある時その先端部が前記周
辺加圧部の先端部より突出され、前記周辺加圧部が前記
第2の位置に移動する際先端が前記封止部材に当接して
それを加圧し、前記第2の弾性部材の付勢力に抗して前
記周辺加圧部内に移動し、前記周辺加圧部が前記第2の
位置にある時、その先端部が前記周辺加圧部の先端部と
同位置となる構成とされることを特徴とする請求項2に
記載の半導体装置の封止装置。
4. The peripheral pressurizing part is provided adjacent to the mold clamping part via a first elastic member, and its tip is separated from the tip of the mold clamping part when no pressure is applied. In the first position, the tip of the second elastic member is separated from the lead frame by a predetermined distance against the urging force of the first elastic member in a state where the mold clamping portion holds the lead frame. To a position, the central pressurizing unit is movably provided in the peripheral pressurizing unit with a second elastic member interposed, and the peripheral pressurizing unit is located at the first position of the mold clamping unit. At a certain time, the tip portion thereof is projected from the tip portion of the peripheral pressure portion, and when the peripheral pressure portion moves to the second position, the tip end abuts against the sealing member to press it, The second elastic member moves into the peripheral pressure applying portion against the biasing force of the elastic member, and the peripheral pressure applying portion moves to the second pressure applying portion. The semiconductor device encapsulation device according to claim 2, wherein the tip portion of the semiconductor device is located at the same position as the tip portion of the peripheral pressurizing portion when in the position.
【請求項5】前記駆動手段は、前記型締め部、前記中央
加圧部、前記周辺加圧部をそれぞれ独立に駆動すること
を特徴とする請求項2または請求項3に記載の半導体装
置の封止装置。
5. The semiconductor device according to claim 2, wherein the driving unit drives the mold clamping unit, the central pressing unit, and the peripheral pressing unit independently of each other. Sealing device.
【請求項6】リードフレームを挟持する型締め部と、こ
の型締め部内に設けられ半導体チップの上面側及び下面
側に設けられる封止部材の周辺を加圧する周辺加圧部
と、この周辺加圧部内に設けられ前記封止部材の中央部
を加圧する中央加圧部とを具備する金型を用い、 前記型締め部により前記リードフレームを挟持した状態
で前記中央加圧部で前記封止部材の中央部を加熱すると
ともに加圧し、 この後、前記周辺加圧部により前記封止部材の周辺を加
圧することを特徴とする半導体装置の封止方法。
6. A mold clamping part for sandwiching a lead frame, a peripheral pressing part for pressing the periphery of a sealing member provided in the mold clamping part on the upper surface side and the lower surface side of a semiconductor chip, and a peripheral pressing part. A mold provided with a central pressure part that is provided in a pressure part and presses the central part of the sealing member is used, and the mold is clamped by the central pressure part while sandwiching the lead frame. A method of encapsulating a semiconductor device, comprising heating and pressurizing a central part of a member, and thereafter applying pressure to the periphery of the encapsulating member by the peripheral pressurizing part.
JP5914996A 1996-03-15 1996-03-15 Die, apparatus and method for sealing semiconductor device with resin Pending JPH09252013A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5914996A JPH09252013A (en) 1996-03-15 1996-03-15 Die, apparatus and method for sealing semiconductor device with resin

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5914996A JPH09252013A (en) 1996-03-15 1996-03-15 Die, apparatus and method for sealing semiconductor device with resin

Publications (1)

Publication Number Publication Date
JPH09252013A true JPH09252013A (en) 1997-09-22

Family

ID=13105006

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5914996A Pending JPH09252013A (en) 1996-03-15 1996-03-15 Die, apparatus and method for sealing semiconductor device with resin

Country Status (1)

Country Link
JP (1) JPH09252013A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002036270A (en) * 2000-07-21 2002-02-05 Apic Yamada Corp Method and apparatus for sealing resin
JP2011146518A (en) * 2010-01-14 2011-07-28 Oki Semiconductor Co Ltd Mold resin sealing device and molding method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002036270A (en) * 2000-07-21 2002-02-05 Apic Yamada Corp Method and apparatus for sealing resin
JP4484329B2 (en) * 2000-07-21 2010-06-16 アピックヤマダ株式会社 Resin sealing method and resin sealing device
JP2011146518A (en) * 2010-01-14 2011-07-28 Oki Semiconductor Co Ltd Mold resin sealing device and molding method

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