JPH09153437A - Gas feed/exhaust system of portable closed container - Google Patents

Gas feed/exhaust system of portable closed container

Info

Publication number
JPH09153437A
JPH09153437A JP7337816A JP33781695A JPH09153437A JP H09153437 A JPH09153437 A JP H09153437A JP 7337816 A JP7337816 A JP 7337816A JP 33781695 A JP33781695 A JP 33781695A JP H09153437 A JPH09153437 A JP H09153437A
Authority
JP
Japan
Prior art keywords
gas
exhaust
concentration
mixed
clean room
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7337816A
Other languages
Japanese (ja)
Other versions
JP3893635B2 (en
Inventor
Miki Tanaka
幹 田中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shinko Electric Co Ltd
Original Assignee
Shinko Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinko Electric Co Ltd filed Critical Shinko Electric Co Ltd
Priority to JP33781695A priority Critical patent/JP3893635B2/en
Publication of JPH09153437A publication Critical patent/JPH09153437A/en
Application granted granted Critical
Publication of JP3893635B2 publication Critical patent/JP3893635B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To improve the freedom of a placement in a clean room and the safety health of operators, who operate in the room, by a method wherein inert gas, which is evacuated from a gas substituting device, is changed into mixed gas, which does not exert an effect on the operators, and the mixed gas is exhausted in the clean room. SOLUTION: This system is provided with a portable closed container 2, which is housed with semiconductor wafers W and is closed, a gas substituting device 3 for substituting the air in the contaniner 2 for inert gas and a gas exhaust tube for evacuating exhaust gas, which is exhausted from the device 3 and contains the inert gas, outside of a clean room 1. At this time, a gas exhaust device 16 of a structure, wherein the exhaust gas, which is evacuated from the device 3, is mixed with oxygen gas and the concentration of the mixed gas subsequent to this mixing is set into a concentration in a prescribed concentration ragion (c) that does not exert an effect on the human body to exhaust the mixed gas in the room 1, is connected with the gas exhaust tube.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、クリンルーム内で
半導体ウエハの搬送に用いられる可搬式コンテナに係わ
り、特に、可搬式コンテナ内を不活性ガスの雰囲気に置
換するガス給排気システムに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a portable container used for transferring semiconductor wafers in a clean room, and more particularly to a gas supply / exhaust system for replacing the inside of the portable container with an inert gas atmosphere.

【0002】[0002]

【従来の技術】半導体の製造は、内部雰囲気を清浄化し
たクリンルーム内において行われるが、クリンルーム内
での各工程間の搬送においても、半導体処理装置内と同
等以上のクリーン環境下とするように、この半導体ウエ
ハを段々に収納したウエハカセットを可搬式密閉コンテ
ナに収納して行うことも試みられ始められた。更に、半
導体の製造は微細加工が極限まで進み、膜厚も薄く導線
も極細線になると、半導体ウエハの自然酸化による極薄
の酸化膜をも問題視され始め、可搬式密閉コンテナの内
部にガス置換装置で不活性ガス(例えば、窒素ガス)を
供給して、半導体ウエハの自然酸化膜成長の原因となる
酸素を可搬式密閉コンテナ外に放出し、コンテナ内の内
部雰囲気を不活性ガスに置換している。
2. Description of the Related Art Semiconductors are manufactured in a clean room whose internal atmosphere has been cleaned. However, even during transportation between the respective steps in the clean room, a clean environment equal to or higher than that in the semiconductor processing apparatus is used. Thus, it has begun to be attempted to store the semiconductor wafers in a stepwise manner in a portable airtight container. Furthermore, when semiconductors are manufactured to the limit of microfabrication and the film thickness is thin and the conductor wires are extremely thin, ultra-thin oxide films due to natural oxidation of semiconductor wafers become a problem, and gas inside the portable airtight container becomes a problem. By supplying an inert gas (for example, nitrogen gas) with a replacement device, oxygen that causes natural oxide film growth on semiconductor wafers is released to the outside of a portable sealed container, and the internal atmosphere inside the container is replaced with an inert gas. doing.

【0003】このように、可搬式密閉コンテナの内部雰
囲気を不活性ガスに置換するガス給排気システムとして
は、本願発明者は、図3に示すものを提案し、以下に説
明する。図3において、可搬式密閉コンテナのガス給排
気システムは、クリンルーム1内の配置されたガス置換
装置3と、ガス排気管4とから構成され、このガス置換
装置3上に不活性ガス(例えば、窒素ガス)で置換され
る可搬式密閉コンテナ2(以下、単に、密閉コンテナ2
という。)が載置される。この密閉コンテナ2は、内部
に半導体ウエハWを収納するウエハカセット7を蓋2A
上に載置して気密に収納している。また、ガス置換装置
3は、内部に昇降台5を有する昇降装置6が配置されて
おり、この昇降台5がガス置換装置3の上方開口部3A
内に嵌合されてガス置換装置3を気密にしている。ま
た、ガス置換装置3には、図示していない不活性ガス供
給装置と上方開口部3Aとを連通する給気管8と、上記
不活性ガス供給装置から供給される不活性ガスを排気す
る排気管4とがそれぞれ接続されている。このガス排気
管4はガス置換装置3内に開口する排気管9と、この排
気管9に連続してクリンルーム1の外部まで延びる主排
気管4Aとから構成されている。尚、主排気管4Aはク
リンルーム内1に配置される図示していない半導体製造
装置等や搬送装置の作動の障害とならないように、クリ
ンルーム1の穴付き床板15(グレーチング)の下部に
配置されていると共に、ガス置換装置3のみならず上記
半導体装置等からの排気ガスも一括して排気できるよう
に接続されている。10は給気管8中に配置された給気
弁、11は排気管9中に配置された排気弁、12は主排
気管4Aから各装置の排気ガス等を吸引そてクリンルー
ムの外部に放出する吸引ファン、13は吸引ファン12
で吸引された排気ガス等に存在する塵や埃を除去するフ
ィルターである。
As a gas supply / exhaust system for replacing the internal atmosphere of the portable airtight container with the inert gas as described above, the present inventor has proposed the one shown in FIG. 3 and will be described below. In FIG. 3, a gas supply / exhaust system for a portable closed container is composed of a gas replacement device 3 arranged in a clean room 1 and a gas exhaust pipe 4, and an inert gas (for example, an inert gas (eg, , Nitrogen gas), which is replaced by a portable airtight container 2 (hereinafter, simply, the airtight container 2
That. ) Is placed. This hermetic container 2 has a lid 2A that covers a wafer cassette 7 that houses a semiconductor wafer W therein.
It is placed on top and stored airtightly. Further, the gas replacement device 3 is provided with an elevating device 6 having an elevating table 5 therein, and the elevating table 5 has an upper opening 3A of the gas replacement device 3.
It is fitted inside to make the gas replacement device 3 airtight. Further, in the gas replacement device 3, an air supply pipe 8 that connects an inert gas supply device (not shown) to the upper opening 3A, and an exhaust pipe that exhausts the inert gas supplied from the inert gas supply device. 4 and 4 are connected to each other. The gas exhaust pipe 4 is composed of an exhaust pipe 9 that opens into the gas replacement device 3 and a main exhaust pipe 4A that is continuous with the exhaust pipe 9 and extends to the outside of the clean room 1. The main exhaust pipe 4A is arranged below the floor plate 15 (grating) with holes in the clean room 1 so as not to interfere with the operation of the semiconductor manufacturing equipment and the like (not shown) arranged in the clean room 1 and the transfer equipment. In addition, the exhaust gas from not only the gas replacement device 3 but also the semiconductor device or the like can be exhausted at once. Reference numeral 10 is an air supply valve arranged in the air supply pipe 8, 11 is an exhaust valve arranged in the exhaust pipe 9, and 12 is a main exhaust pipe 4A for sucking exhaust gas of each device and discharging it to the outside of the clean room. Suction fan, 13 is a suction fan 12
It is a filter that removes dust and dirt present in the exhaust gas and the like sucked in.

【0004】そして、密閉コンテナ2内を不活性ガスで
置換するために、密閉コンテナ2をガス置換装置3の開
口部3Aを覆う状態でガス置換装置3と、昇降装置6の
昇降台5上に亘って気密に載置した後、この昇降台5と
の結合により密閉コンテナ2の蓋2Aを開状態にする。
そして、昇降台5を蓋2A、ウエハカセット7とともに
下降させて密閉コンテナ2内とガス置換装置3とを連通
状態にした後、給気弁10及び排気弁11を開弁すると
共に、吸引ファン12を作動させる。これにより、上記
不活性ガス供給装置から不活性ガスがガス置換装置3、
密閉コンテナ2内に供給され、半導体ウエハWの自然酸
化膜成長の原因となる酸素ガス等が不活性ガスとともに
排気ガスとして吸引ファン12で吸引され排気管6、主
排気管4Aを通った後、フィルター13を通過する際に
穴付き床板15からクリンルーム1内の空気も吸引して
クリンルーム1の外部に放出される。その後、所定時間
が経過してガス置換装置3と密閉コンテナ2内の不活性
ガスの純度が上がって置換されると、給気弁10及び排
気弁11を閉弁して、ガス置換装置3への不活性ガスの
供給と、ガス置換装置3からの排気ガスの排気を停止し
た後、昇降装置6の昇降台5を蓋2A、ウエハカセット
7と共に上昇して、密閉コンテナ2内に気密にウエハカ
セット7を収納する。
In order to replace the inside of the closed container 2 with an inert gas, the closed container 2 is placed on the gas replacement device 3 and the lift 5 of the lifting device 6 in a state of covering the opening 3A of the gas replacement device 3. After airtightly mounted over the airtight container, the lid 2A of the hermetically sealed container 2 is opened by coupling with the lifting table 5.
Then, the elevating table 5 is lowered together with the lid 2A and the wafer cassette 7 to bring the inside of the closed container 2 and the gas replacement device 3 into communication with each other, and then the air supply valve 10 and the exhaust valve 11 are opened and the suction fan 12 is opened. Operate. Thereby, the inert gas is supplied from the inert gas supply device to the gas replacement device 3,
After the oxygen gas or the like, which is supplied into the closed container 2 and causes the natural oxide film growth of the semiconductor wafer W, is sucked together with the inert gas as the exhaust gas by the suction fan 12 and passes through the exhaust pipe 6 and the main exhaust pipe 4A, When passing through the filter 13, the air in the clean room 1 is also sucked from the floor plate 15 with holes and released to the outside of the clean room 1. After that, when a predetermined time elapses and the purity of the inert gas in the gas replacement device 3 and the closed container 2 is increased and replaced, the air supply valve 10 and the exhaust valve 11 are closed and the gas replacement device 3 is operated. After the supply of the inert gas and the exhaust of the exhaust gas from the gas replacement device 3 are stopped, the lifting table 5 of the lifting device 6 is lifted together with the lid 2A and the wafer cassette 7 to hermetically seal the wafer in the hermetic container 2. Store the cassette 7.

【0005】ところで、本願発明者が図3で提案した可
搬式密閉コンテナのガス給排気システムでは、クリンル
ーム内に配置される半導体製造装置や、クリンルーム内
を走行する搬送装置の走行経路の確保等の関係から、ガ
ス置換装置をガス排気管の主排気管の近傍に設置される
という保証はなく、この主排気管から離れた場所に配置
されると排気管が長くなってしまい、長くなった排気管
を通る排気ガスの排気抵抗が増加して良好に排気できな
くなることが想定される。この結果、密閉コンテナの内
部雰囲気を不活性ガスで置換するガス置換装置の置換性
能が低下するという問題が浮上する。
By the way, in the gas supply / exhaust system of the portable closed container proposed by the inventor of the present invention, the traveling route of the semiconductor manufacturing device arranged in the clean room and the transport device traveling in the clean room is secured. Therefore, there is no guarantee that the gas replacement device will be installed near the main exhaust pipe of the gas exhaust pipe, and if it is placed away from this main exhaust pipe, the exhaust pipe will become longer and longer. It is assumed that the exhaust resistance of the exhaust gas passing through the exhaust pipe increases and the exhaust cannot be performed properly. As a result, there arises a problem that the replacement performance of the gas replacement device that replaces the internal atmosphere of the closed container with the inert gas deteriorates.

【0006】[0006]

【発明が解決しようとする課題】この問題を解決するた
めには、ガス置換装置から排気される排気ガスを主排気
管を通すことなく、直接、クリンルーム内に放出するこ
とで、排気管の長さが短縮でき、排気管の排気抵抗の増
加によるガス置換装置の置換性能の低下は解消される。
また、主排気管の設置位置に気づかうことなく、ガス置
換装置をクリンルーム内で自由に配置することができ
る。
In order to solve this problem, the exhaust gas exhausted from the gas replacement device is directly discharged into the clean room without passing through the main exhaust pipe. The length can be shortened, and the deterioration of the replacement performance of the gas replacement device due to the increase in the exhaust resistance of the exhaust pipe can be solved.
Further, the gas replacement device can be freely arranged in the clean room without noticing the installation position of the main exhaust pipe.

【0007】しかしながら、ガス置換装置からの排気ガ
スをクリンルーム内に放出すると、クリンルーム内の排
気ガスに対する濃度が上昇し、酸素不足の状態に陥るこ
とになる。この結果、クリンルーム内での作業者が酸欠
症状を起こす可能性が高く、また、直ちに、酸欠症状を
起こさなくても、いつ何時、酸欠症状に陥るかもしれな
いという不安状態で作業を行うことになる。また、ガス
置換装置からの排気ガスをクリンルーム内に放出するこ
とで衛生上、好ましくないという問題が発生する。
However, when the exhaust gas from the gas replacement device is released into the clean room, the concentration of the exhaust gas in the clean room increases, resulting in a lack of oxygen. As a result, workers in the clean room are more likely to develop an oxygen deficiency condition, and even if they do not immediately develop an oxygen deficiency condition, they are likely to fall into an oxygen deficiency condition at any time. Will be done. Further, since the exhaust gas from the gas replacement device is discharged into the clean room, there is a problem in that it is not preferable in hygiene.

【0008】本発明は、この問題を解決するためになさ
れたもので、ガス置換装置から排気される不活性ガスを
作業者に影響のない混合ガスに変化させて、クリンルー
ム内に放出することにより、クリンルーム内の配置の自
由度と、クリンルーム内で作業する作業者の安全衛生を
図ることのできる可搬式密閉コンテナのガス給排気シス
テムを提供する。
The present invention has been made to solve this problem, and changes the inert gas exhausted from the gas replacement device into a mixed gas that does not affect the operator and discharges it into the clean room. Thus, a gas supply / exhaust system for a portable closed container is provided, which can achieve the degree of freedom of arrangement in the clean room and the safety and health of workers who work in the clean room.

【0009】[0009]

【課題を解決するための手段】上記問題を解決するた
め、本発明の可搬式密閉コンテナのガス給排気システム
では、請求項1においては、半導体ウエハを収納し密閉
される可搬式密閉コンテナと、前記可搬式密閉コンテナ
内を不活性ガスで置換するガス置換装置と、前記ガス置
換装置から排気される前記不活性ガスを含む排気ガスを
クリンルーム外に放出するガス排気管とを備えてなる可
搬式密閉コンテナのガス給排気システムにおいて、前記
ガス排気管には、前記ガス置換装置から排気される前記
排気ガスを酸素ガスで混合して、この混合後の混合ガス
の濃度を人体に影響のない所定濃度領域として前記クリ
ンルーム内に放出するガス排気装置を接続したことを特
徴とするものである。これにより、ガス置換装置の排気
ガスに酸素ガスを混合して、混合後の混合ガスの濃度を
クリンルーム内で作業する作業者に影響を与えない所定
濃度にして、クリンルーム内に放出することができる。
In order to solve the above problems, in a gas supply / exhaust system for a portable closed container according to the present invention, in claim 1, a portable closed container for accommodating and sealing a semiconductor wafer, A gas replacement device for replacing the inside of the portable closed container with an inert gas, and a gas exhaust pipe for discharging exhaust gas containing the inert gas exhausted from the gas replacement device to the outside of the clean room. In the gas supply / exhaust system for a portable closed container, the exhaust gas exhausted from the gas replacement device is mixed with oxygen gas in the gas exhaust pipe, and the concentration of the mixed gas after the mixing does not affect the human body. A gas exhaust device for discharging into the clean room as a predetermined concentration region is connected. As a result, oxygen gas is mixed with the exhaust gas of the gas replacement device, and the concentration of the mixed gas after mixing is set to a predetermined concentration that does not affect the worker working in the clean room, and the mixed gas is discharged into the clean room. You can

【0010】請求項2においては、請求項1のものに、
前記ガス排気装置は、前記ガス置換装置から前記ガス排
気管を通して排気される前記排気ガスと外部から供給さ
れる酸素ガスとを混合させるガス混合室と、前記ガス混
合室で混合された混合ガスの不活性ガス、又は酸度ガス
の濃度を検出するガス濃度検出手段と、前記ガス混合室
内に供給される前記酸素ガスの流量を変化させる流量制
御手段と、前記ガス濃度検出手段からの検出信号に基づ
いて、前記ガス混合室内で混合された混合ガス中の前記
不活性ガス又は酸素ガスの濃度を人体に影響のないガス
濃度設定領域内となるように前記流量制御手段を制御す
る制御装置と、前記混合ガスをフィルターで清浄して放
出する清浄室とを、備えてなることを特徴とするもので
ある。これにより、ガス濃度検出手段からの検出信号に
基づいて、制御装置が流量制御手段を制御して、ガス混
合室に供給される酸素ガスの流量をガス置換装置から排
気される排気ガスの流量に応じて変化させることで、ク
リンルーム内で作業する作業者に影響を与えないように
ガス混合室内の混合ガスの不活性ガス、又は酸素ガスの
ガス濃度設定領域内となるように確実にコントロール
し、クリンルーム内に放出することができる。
In the second aspect, in addition to the first aspect,
The gas exhaust device includes a gas mixing chamber for mixing the exhaust gas exhausted from the gas replacement device through the gas exhaust pipe and an oxygen gas supplied from the outside, and a mixed gas mixed in the gas mixing chamber. Gas concentration detection means for detecting the concentration of the inert gas or acidity gas, flow rate control means for changing the flow rate of the oxygen gas supplied into the gas mixing chamber, and a detection signal from the gas concentration detection means A controller for controlling the flow rate control means so that the concentration of the inert gas or oxygen gas in the mixed gas mixed in the gas mixing chamber is within a gas concentration setting region that does not affect the human body, A clean room for cleaning the mixed gas with a filter and discharging the mixed gas. As a result, the control device controls the flow rate control device based on the detection signal from the gas concentration detection device so that the flow rate of the oxygen gas supplied to the gas mixing chamber becomes the flow rate of the exhaust gas exhausted from the gas replacement device. Depending on the change, the control is made surely so that it is within the gas concentration setting area of the inert gas or oxygen gas in the gas mixture chamber so that it does not affect the workers working in the clean room. , Can be released into the clean room.

【0011】請求項3においては、請求項2のものに、
前記制御装置には、前記ガス濃度設定領域を変動可能と
する濃度設定器が接続されていることを特徴とするもの
である。これにより、ガス混合室の混合ガス中の不活性
ガス、又は酸素ガスのガス濃度設定領域を、クリンルー
ム内の環境に応じて設定できる。
According to a third aspect, in addition to the second aspect,
The controller is connected to a concentration setter capable of changing the gas concentration setting region. Thereby, the gas concentration setting region of the inert gas or the oxygen gas in the mixed gas in the gas mixing chamber can be set according to the environment in the clean room.

【0012】請求項4においては、請求項1又は請求項
2のものに、前記ガス置換装置と前記ガス排気装置と
が、一体型して形成されていることを特徴とするもので
ある。これにより、ガス給排気システムがコンパクトに
なり、搬送も容易に行うことができる。
According to a fourth aspect of the present invention, the gas replacement device and the gas exhaust device are integrally formed as in the first or second aspect. As a result, the gas supply / exhaust system becomes compact and can be easily transported.

【0013】[0013]

【発明の実施の形態】以下、本発明の実施の形態におけ
る可搬式密閉コンテナのガス給排気システムについて説
明する。図1は本発明の実施の形態における可搬式密閉
コンテナのガス給排気システムを示す模式図、図2は本
発明の実施の形態における可搬式密閉コンテナのガス給
排気システムを構成するガス置換装置とガス排気装置を
一体型にした縦断面図である。尚、図1及び図2におい
て、本願発明者が提案したシステムである図3と同一の
符号は同一の部材を示すので、その説明を要略する。
BEST MODE FOR CARRYING OUT THE INVENTION A gas supply / exhaust system for a portable closed container according to an embodiment of the present invention will be described below. FIG. 1 is a schematic diagram showing a gas supply / exhaust system for a portable airtight container according to an embodiment of the present invention, and FIG. 2 is a gas replacement device constituting a gas supply / exhaust system for a portable airtight container according to an embodiment of the present invention. FIG. 3 is a vertical cross-sectional view in which a gas exhaust device is integrated. 1 and 2, the same reference numerals as those in FIG. 3, which is the system proposed by the inventor of the present application, indicate the same members, and thus the description thereof will be omitted.

【0014】図1において、本発明の実施の形態のおけ
る可搬式密閉コンテナのガス給排気システムは、本願発
明者が提案したシステムである図3に示したガス置換装
置3に、ガス排気装置16を連結してガス置換装置3か
ら排気される排気ガス〔不活性ガス(例えば、窒素ガ
ス)と、酸素ガス(空気)の混合ガス〕をクリンルーム
1内に排気可能としたものである。このガス排気装置1
6は、ガス混合室17と、ガス混合室17内に供給する
酸素ガスの流量を変化させる流量制御手段となる流量制
御弁18と、ガス混合室17内に供給されるガス置換装
置3からの排気ガスと酸素ガスとの混合ガスの濃度を検
出するガス濃度検出手段であるガス濃度センサ19と、
ガス濃度センサ19の出力に基づいて流量制御弁18の
開弁度を制御する制御装置10と、混合室17からの混
合ガスを清浄してクリーンルーム1内に放出する清浄室
21とを主要部として構成されている。
In FIG. 1, a gas supply / exhaust system for a portable closed container according to an embodiment of the present invention is a system proposed by the inventor of the present invention. The exhaust gas [mixed gas of inert gas (for example, nitrogen gas) and oxygen gas (air)] exhausted from the gas replacement device 3 can be exhausted into the clean room 1 by connecting. This gas exhaust system 1
Reference numeral 6 denotes a gas mixing chamber 17, a flow rate control valve 18 serving as a flow rate control means for changing the flow rate of oxygen gas supplied into the gas mixing chamber 17, and a gas replacement device 3 supplied into the gas mixing chamber 17. A gas concentration sensor 19 which is a gas concentration detecting means for detecting the concentration of a mixed gas of exhaust gas and oxygen gas,
The control device 10 that controls the opening degree of the flow rate control valve 18 based on the output of the gas concentration sensor 19, and the clean room 21 that cleans the mixed gas from the mixing room 17 and discharges it into the clean room 1 are the main parts. It is configured.

【0015】ガス混合室17は、絞り管23を通して清
浄室21に連通している。この清浄室21は絞り管23
が開口する側壁21aに対向する側がクリンルーム1内
に開口しており、この開口側からフィルター13が挿入
されて、側壁21aとの間に流体放射空間Aを区画して
いる。また、ガス混合室17と清浄室21とを連通する
絞り管23は、各室17,23より小径にされている。
すなわち、後に説明するが、ガス混合室17にガス置換
装置3から排気される排気ガスと、図示しない酸素ガス
貯蔵器から供給される酸素ガスとの混合ガスが、ガス混
合室17から絞られる状態で絞り管23を通って、清浄
室21内の流体放射空間Aに放射状に流出するように、
絞り管23の径を各室17,21より小さくしたのもの
である。
The gas mixing chamber 17 communicates with the clean chamber 21 through the throttle tube 23. This clean room 21 has a throttle tube 23
The side opposite to the side wall 21a that is open is opened in the clean room 1, and the filter 13 is inserted from this open side to define the fluid radiation space A with the side wall 21a. Further, the throttle pipe 23 that connects the gas mixing chamber 17 and the clean chamber 21 has a smaller diameter than the chambers 17 and 23.
That is, as will be described later, a state in which a mixed gas of exhaust gas exhausted from the gas replacement device 3 into the gas mixing chamber 17 and oxygen gas supplied from an oxygen gas storage device (not shown) is squeezed from the gas mixing chamber 17. So as to radially flow out to the fluid radiating space A in the clean room 21 through the throttle pipe 23,
The diameter of the throttle tube 23 is smaller than that of each chamber 17, 21.

【0016】また、ガス混合室17の絞り管23が開口
する側壁に対向する側壁17aには、ガス置換装置3に
連絡される排気管9が開口しており、この排気管9中に
はガス置換装置3から排気される排気ガスを吸引してガ
ス混合室17内に供給する吸引装置25(例えば、ポン
プ、ファン等)が配置されている。そして、排気管9か
らガス混合室17内に供給される排気ガスの流れ方向a
に直交する方向から、図示していない酸素ガス貯蔵装置
に貯蔵された酸素ガスをガス混合室17内に供給する酸
素ガス供給管22が、例えば、ガス混合室17の上壁1
7bに開口している。
Further, an exhaust pipe 9 connected to the gas replacement device 3 is opened at a side wall 17a of the gas mixing chamber 17 opposite to the side wall at which the throttle pipe 23 is opened. A suction device 25 (for example, a pump, a fan, etc.) that sucks the exhaust gas exhausted from the displacement device 3 and supplies the exhaust gas into the gas mixing chamber 17 is arranged. Then, the flow direction a of the exhaust gas supplied from the exhaust pipe 9 into the gas mixing chamber 17
The oxygen gas supply pipe 22 for supplying the oxygen gas stored in the oxygen gas storage device (not shown) into the gas mixing chamber 17 from the direction orthogonal to the
It opens to 7b.

【0017】また、酸素ガス供給管22には、上記酸素
ガス貯蔵装置側からガス混合室17に向かって、順々
に、上記酸素ガス貯蔵装置から酸素ガスを吸引する吸引
装置30(例えば、ポンプ、ファン等)と、流量制御弁
18とが配置されている。この流量制御弁18は、排気
管9及び酸素ガス供給管22中のそれぞれに配置された
吸引装置25,30とともに、制御装置20に接続され
ており、この制御装置20の各種指令に基づき作動す
る。
Further, in the oxygen gas supply pipe 22, a suction device 30 (for example, a pump) for sucking oxygen gas from the oxygen gas storage device in order from the oxygen gas storage device side toward the gas mixing chamber 17. , A fan, etc.) and the flow rate control valve 18 are arranged. The flow rate control valve 18 is connected to the control device 20 together with the suction devices 25 and 30 arranged in the exhaust pipe 9 and the oxygen gas supply pipe 22, respectively, and operates based on various commands of the control device 20. .

【0018】ガス濃度検出手段19は、ガス混合室17
と清浄室21とを連絡する絞り管23内に配置されて、
ガス混合室17で混合される排気ガスと酸素ガスからな
る混合ガスのうち、酸素ガスの含有率(酸素ガス濃度)
を検出する酸素ガス濃度検出センサ(以下、酸素ガス濃
度検出センサ19という。)であって、絞り管23を通
過する混合ガスの酸素ガス濃度に応じた酸素ガス濃度検
出信号bを制御装置20に送出する。ここで、酸素ガス
濃度検出センサ19は、磁気モーメントを発生する数の
少ない常磁性気体として知られる酸素ガスの特性を利用
した、例えば、磁気風方式や圧力検出式の磁気式酸素計
等が用いられる。
The gas concentration detecting means 19 comprises a gas mixing chamber 17
Is placed in a throttle tube 23 that connects the clean room 21 with the clean room 21,
Content rate of oxygen gas (oxygen gas concentration) in the mixed gas composed of exhaust gas and oxygen gas mixed in the gas mixing chamber 17
Which is an oxygen gas concentration detection sensor (hereinafter referred to as oxygen gas concentration detection sensor 19) for detecting the oxygen gas concentration detection signal b according to the oxygen gas concentration of the mixed gas passing through the throttle pipe 23. Send out. Here, the oxygen gas concentration detection sensor 19 uses, for example, a magnetic wind type or pressure detection type magnetic oximeter that utilizes the characteristics of oxygen gas known as paramagnetic gas that generates a small number of magnetic moments. To be

【0019】そして、制御装置20は、酸素ガス濃度検
出センサ19からの酸素ガス濃度検出信号bを入力する
と、この内部に予め設定され、又は濃度設定器16で入
力設定される人体に影響のない酸素ガス濃度領域データ
c(例えば、酸素濃度領域データの上限値を30%、下
限値を18%とする領域に設定する。)と、酸素ガス濃
度検出信号bとを比較して、流量制御弁18の開弁度を
決定する開弁度指令d(電圧)を流量制御弁18に送出
すると共に、各吸引装置25,30に対して作動指令e
を送出する。
When the control device 20 receives the oxygen gas concentration detection signal b from the oxygen gas concentration detection sensor 19, the control device 20 does not affect the human body preset inside the oxygen gas concentration detection signal b or input by the concentration setting device 16. The oxygen gas concentration region data c (for example, the upper limit value of the oxygen concentration region data is set to 30% and the lower limit value is set to 18%) is compared with the oxygen gas concentration detection signal b, and the flow control valve is compared. The valve opening degree command d (voltage) that determines the valve opening degree of 18 is sent to the flow control valve 18, and the operation command e is sent to each of the suction devices 25 and 30.
Is sent.

【0020】本発明の実施の形態におけるガス給排気シ
ステムは、以上のように構成されるが、次にガス給排気
システムの作動について説明する。尚、説明の便宜上、
給気管8中の給気弁10、流量制御弁18は閉弁状態あ
り、また、各吸引装置25,30は作動していないもの
と、更に、昇降台5がガス置換装置3の上方開口部3A
内に嵌合されてガス置換装置3内を気密にしているもの
とする。
The gas supply / exhaust system according to the embodiment of the present invention is configured as described above. Next, the operation of the gas supply / exhaust system will be described. For convenience of explanation,
The air supply valve 10 and the flow rate control valve 18 in the air supply pipe 8 are in a closed state, the suction devices 25 and 30 are not in operation, and the lift 5 is located above the gas replacement device 3. 3A
It is assumed that the inside of the gas replacement device 3 is fitted into the inside to make the inside of the gas replacement device airtight.

【0021】先ず、密閉コンテナ2内を不活性ガスで置
換するために、密閉コンテナ2をガス置換装置3の開口
部3Aを覆う状態でガス置換装置3、昇降装置6の昇降
台5上に亘って気密に載置した後、昇降台5を上昇させ
て開口部3Aから密閉コンテナ2の蓋2Aに結合して開
状態にする。そして、昇降台5を蓋2A、ウエハカセッ
ト7とともに下降させて可搬式コンテナ2内とガス置換
装置3とを連通状態にした後、給気弁10を開弁して図
示しない不活性ガス供給器から不活性ガス(例えば、窒
素ガス)をガス置換装置3及び密閉コンテナ2内に供給
する。このとき、制御装置20は、初期条件として排気
管9中の吸引装置25に作動指令eを送出して、吸引装
置25を作動させる。これにより、吸引装置25ガス置
換装置3から排気ガスを吸引して、排気管9を通してガ
ス排気装置16のガス混合室17内に流出する。
First, in order to replace the inside of the closed container 2 with an inert gas, the closed container 2 is covered with the gas replacement device 3 and the lifting table 5 of the lifting device 6 while covering the opening 3A of the gas replacement device 3. After air-tightly mounting, the elevating table 5 is raised to be connected to the lid 2A of the closed container 2 through the opening 3A and opened. Then, the elevating table 5 is lowered together with the lid 2A and the wafer cassette 7 to bring the inside of the portable container 2 into communication with the gas replacement device 3, and then the air supply valve 10 is opened to supply an inert gas supply device (not shown). An inert gas (for example, nitrogen gas) is supplied into the gas replacement device 3 and the closed container 2. At this time, the control device 20 sends an operation command e to the suction device 25 in the exhaust pipe 9 as an initial condition to operate the suction device 25. As a result, the suction device 25 sucks the exhaust gas from the gas replacement device 3 and flows through the exhaust pipe 9 into the gas mixing chamber 17 of the gas exhaust device 16.

【0022】また、不活性ガスをガス置換装置3に供給
する作動と同時に、制御装置20は酸素ガス供給管22
中の吸引装置30と、流量制御弁18との各々に作動指
令e、開弁指令dを送出する。これにより、吸引装置3
0が上記酸素ガス貯蔵器から酸素ガスを吸引して、酸素
ガス供給管22、流量制御弁18を通してガス排気装置
16のガス混合室17に流出する。そして、排気管9か
ら排気される排気ガスと、酸素ガス供給管22から供給
される酸素ガスとは、互いにその流れ方向が直交するよ
うにガス混合室17に流出するので、このガス混合室1
7内で十分に混合されることになる。
At the same time as the operation of supplying the inert gas to the gas replacement device 3, the controller 20 controls the oxygen gas supply pipe 22.
An operation command e and a valve opening command d are sent to each of the suction device 30 and the flow rate control valve 18 therein. Thereby, the suction device 3
0 sucks oxygen gas from the oxygen gas storage device and flows out to the gas mixing chamber 17 of the gas exhaust device 16 through the oxygen gas supply pipe 22 and the flow rate control valve 18. The exhaust gas exhausted from the exhaust pipe 9 and the oxygen gas supplied from the oxygen gas supply pipe 22 flow into the gas mixing chamber 17 so that their flow directions are orthogonal to each other.
It will be well mixed in 7.

【0023】次いで、ガス混合室17で混合された排気
ガスと酸素ガスとの混合ガスは、ガス混合室17から絞
られる状態で絞り管23を通った後、この絞り管23よ
り大きいくなっている清浄室内21の流体放射空間A内
に放射状に流出する。このように、ガス混合室17から
の混合ガスが絞り管23を通過する際に、酸素ガス濃度
検出センサ19が絞り管23を通過する混合ガスの酸素
ガス濃度を検出して、混合ガスの酸素ガス濃度の応じた
酸素ガス濃度検出信号bを制御装置20に送出する。そ
して、酸素ガス濃度検出センサ19からのガス濃度検出
信号bを入力した制御装置20は、予め設定された、又
は濃度設定器26で入力設定された酸素ガス濃度領域デ
ータcと、ガス濃度検出信号bとを比較し、例えば、絞
り管23を通過する混合ガスの酸素ガス濃度が人体に影
響のない酸素ガス濃度領域データcの下限値以下である
と流量制御弁18の開弁度を最大とする開弁指令dを流
量制御弁18に送出し、酸素ガス濃度が人体に影響のな
い酸素ガス濃度領域データcの下限値から上限値に向か
う程、流量制御弁18の開弁度が段々に小さくなるよう
な開弁指令dを流量制御弁18に送出する。これによ
り、流量制御弁18が、制御装置10からの開弁度指令
dに基づいてその開弁度を変化させて、上記酸素ガス貯
蔵器から吸引装置30で吸引された酸素ガスの通過流量
を制御して、ガス混合室17内に流出される酸素ガスの
流量を変化させる。この結果、ガス置換装置3から排気
される排気ガス量に応じて、クリンルーム1内に排気さ
れる混合ガス中の酸素ガス濃度を酸素ガス濃度領域デー
タc内とするように、ガス混合室17内に上記酸素ガス
貯蔵器から、吸引装置30、流量制御弁18を通して酸
素ガスの流量を変化させて流出させることができる。
Then, the mixed gas of the exhaust gas and the oxygen gas mixed in the gas mixing chamber 17 passes through the throttle pipe 23 in a state of being throttled from the gas mixing chamber 17, and then becomes larger than the throttle pipe 23. It flows out radially into the fluid radiating space A in the clean room 21. As described above, when the mixed gas from the gas mixing chamber 17 passes through the throttle tube 23, the oxygen gas concentration detection sensor 19 detects the oxygen gas concentration of the mixed gas passing through the throttle tube 23, and the oxygen of the mixed gas is detected. An oxygen gas concentration detection signal b corresponding to the gas concentration is sent to the control device 20. Then, the control device 20, which has received the gas concentration detection signal b from the oxygen gas concentration detection sensor 19, receives the oxygen gas concentration region data c preset or input and set by the concentration setting device 26 and the gas concentration detection signal. For example, when the oxygen gas concentration of the mixed gas passing through the throttle pipe 23 is equal to or lower than the lower limit value of the oxygen gas concentration region data c that does not affect the human body, the open degree of the flow control valve 18 is set to the maximum. The valve opening command d is sent to the flow rate control valve 18, and the opening degree of the flow rate control valve 18 gradually increases as the oxygen gas concentration goes from the lower limit value to the upper limit value of the oxygen gas concentration region data c that does not affect the human body. A valve opening command d that makes the flow rate control valve 18 smaller is sent. Accordingly, the flow rate control valve 18 changes the degree of valve opening based on the degree of valve opening degree command d from the control device 10 to change the passage flow rate of the oxygen gas sucked by the suction device 30 from the oxygen gas storage device. It is controlled to change the flow rate of the oxygen gas flowing into the gas mixing chamber 17. As a result, the gas mixing chamber 17 is adjusted so that the oxygen gas concentration in the mixed gas discharged into the clean room 1 falls within the oxygen gas concentration region data c according to the amount of exhaust gas discharged from the gas replacement device 3. It is possible to change the flow rate of the oxygen gas from the oxygen gas storage device through the suction device 30 and the flow rate control valve 18 and allow the oxygen gas to flow out.

【0024】そして、ガス混合室18から絞り管23を
通った混合ガスは、清浄室16内の流体放射空間Aに放
射状に流出して、清浄室16内に挿入されているフィル
ター13の全面からこの内部に流入して、このフィルタ
ー13を通過する際に混合ガス内に存在する塵や埃が除
去された後、清浄室16の開口からクリンルーム1内に
放出されるが、この放出される混合ガスは人体に影響を
与えない酸素ガス濃度とされているので、クリンルーム
1内で作業する作業者が酸欠症状に陥ることもなく、安
全且つ衛生に作業が行える。
The mixed gas that has passed through the throttle tube 23 from the gas mixing chamber 18 radially flows out into the fluid radiating space A in the cleaning chamber 16 and is discharged from the entire surface of the filter 13 inserted in the cleaning chamber 16. Dust and dust existing in the mixed gas when flowing into the inside and passing through the filter 13 are removed and then released into the clean room 1 from the opening of the clean room 16, which is released. Since the mixed gas has an oxygen gas concentration that does not affect the human body, the worker who works in the clean room 1 does not fall into the oxygen deficiency condition, and can work safely and hygienically.

【0025】その後、所定時間が経過してガス置換装置
3と密閉コンテナ2内の不活性ガスの純度が上がって置
換されると、給気弁10、流量制御弁18を閉弁すると
共に、各吸引装置25,30を停止して、ガス置換装置
3への不活性ガスの供給と、ガス置換装置3からの排気
ガスの排気を停止した後、昇降装置6の昇降台5を蓋2
A、ウエハカセット7と共に上昇して、密閉コンテナ2
内に気密にウエハカセット7を収納して、密閉コンテナ
2の不活性ガスでの置換を完了する。
After that, when a predetermined time has elapsed and the purity of the inert gas in the gas replacement device 3 and the hermetically sealed container 2 is increased and replaced, the air supply valve 10 and the flow control valve 18 are closed, and at the same time, After stopping the suction devices 25 and 30 to stop the supply of the inert gas to the gas replacement device 3 and the exhaust of the exhaust gas from the gas replacement device 3, the lifting table 5 of the lifting device 6 is covered with the lid 2.
A, ascending together with the wafer cassette 7 to form a closed container 2
The wafer cassette 7 is hermetically housed therein, and the replacement of the closed container 2 with the inert gas is completed.

【0026】尚、本発明の実施の形態における可搬式密
閉コンテのガス給排気システムにおいては、ガス置換装
置3とガス排気装置16とを別々に設けたものを示した
が、これに限定されるものでなく、図2に示すように、
ガス置換装置3とガス排気装置16とを直列的に一体型
に形成したものであってもよい。なお、この場合におい
て、図2に示すように、ガス置換装置3の下側に連続し
てガス混合室17を一体形成すると共に、ガス混合室1
7内に清浄室21を設けたものである。また、ガス置換
装置3とガス混合室17とを連通する排気管9には、ガ
ス混合室17からの混合ガスの流れを阻止する逆止弁2
7が配置されている。そして、ガス混合室17内で、ガ
ス置換装置3から排気される排気ガスと上記酸素ガス貯
蔵器から供給される酸素ガスとの混合をうまく行わせる
ため、酸素ガス供給管22を、排気管9からガス混合室
17内に供給される排気ガスの流れ方向aに直交する方
向からガス混合室17内に開口させ、この酸素ガス供給
管22の直下に清浄室21を設けた。尚、図2における
可搬式密閉コンテナのガス給排気システムの作動は、上
記図1に示したガス給排気システムと同様に行われる。
また、図2では直列的に一体としているため不活性ガス
の供給流量でもってガス混合室17内に流されるため吸
引装置25は必要とはしない。
In the gas supply / exhaust system for the portable airtight container according to the embodiment of the present invention, the gas replacement device 3 and the gas exhaust device 16 are separately provided, but the present invention is not limited to this. Not as shown in Figure 2,
The gas replacement device 3 and the gas exhaust device 16 may be formed integrally in series. In this case, as shown in FIG. 2, the gas mixing chamber 17 is formed integrally with the lower side of the gas replacement device 3 continuously.
A clean room 21 is provided in the inside 7. In addition, the check valve 2 that blocks the flow of the mixed gas from the gas mixing chamber 17 is provided in the exhaust pipe 9 that connects the gas replacement device 3 and the gas mixing chamber 17.
7 are arranged. Then, in order to successfully mix the exhaust gas exhausted from the gas replacement device 3 and the oxygen gas supplied from the oxygen gas storage device in the gas mixing chamber 17, the oxygen gas supply pipe 22 is connected to the exhaust pipe 9 From the direction orthogonal to the flow direction “a” of the exhaust gas supplied into the gas mixing chamber 17 from the above, the inside of the gas mixing chamber 17 was opened, and the cleaning chamber 21 was provided directly below the oxygen gas supply pipe 22. The operation of the gas supply / exhaust system for the portable airtight container in FIG. 2 is performed in the same manner as the gas supply / exhaust system shown in FIG.
Further, in FIG. 2, the suction device 25 is not necessary because the inert gas is fed into the gas mixing chamber 17 by the flow rate of the inert gas because it is integrated in series.

【0027】尚、本発明の図1及び図2に示す、可搬式
密閉コンテナのガス給排気システムにおいては、ガス濃
度検出手段19として酸素ガス濃度検出センサを用いた
ものを示したが、これに限定されるものでなく、ガス混
合室17で混合される混合ガスのうち不活性ガスである
窒素ガスの濃度を検出する窒素ガス濃度検出センサを用
いてもよい。また、ガス混合室17内における、ガス置
換装置3からの排気ガスと、上記酸素ガス貯蔵器からの
酸素ガスとの混合を促進するために、図1に示すよう
に、ガス混合室17内に攪拌装置24を設けてもよい。
更に、フィルター13は、従来から使用されているのも
でも構わないが、クリンルーム1内の環境に応じて、微
粒子の補集率が高く、フィルター自体による圧力損失が
極めて低いという性能をもつ超高性能フィルター(HE
PAフィルター)、又は超高性能フィルター(HEPA
フィルター)以上の性能を持つ超々高性能フィルター
(ULPAフィルター)を用いてもよい。また、本発明
の図1及び図2の可搬式密閉コンテナのガス給排気シス
テムにおては、ガス混合室17で混合された混合ガスを
クリンルーム1内に放出することについて説明したが、
クリンルーム1の外部に放出するようにしてもよい。な
お、予めガス置換装置3から排気される排気ガスに含ま
れる不活性ガスが少量であるとわかっている時には、上
記の酸素ガス貯蔵器に代え空気貯蔵器を設置し空気を供
給しても良い。更に、半導体の製造が行われているクリ
ーンルーム1内は、通常そのクリーン度を保つために空
調が行われている。従って、図1及び図2に示した可搬
式密閉コンテナのガス給排気システムにおいて、上記酸
素ガス貯蔵器や空気貯蔵器を酸素ガス供給管22に接続
することなく、クリーンルーム1内の空気を直接、酸素
ガス供給管22から吸引装置30で吸引して、ガス混合
室17内に供給するようにしたものであっても良い。
In the portable airtight container gas supply / exhaust system shown in FIGS. 1 and 2, an oxygen gas concentration detecting sensor is used as the gas concentration detecting means 19. The present invention is not limited to this, and a nitrogen gas concentration detection sensor that detects the concentration of nitrogen gas that is an inert gas in the mixed gas mixed in the gas mixing chamber 17 may be used. In order to promote the mixing of the exhaust gas from the gas replacement device 3 and the oxygen gas from the oxygen gas storage chamber in the gas mixing chamber 17, as shown in FIG. A stirring device 24 may be provided.
Further, although the filter 13 may be conventionally used, it has a performance that the collection rate of fine particles is high and the pressure loss due to the filter itself is extremely low depending on the environment in the clean room 1. High-performance filter (HE
PA filter) or ultra high performance filter (HEPA
An ultra-high performance filter (ULPA filter) having a performance equal to or higher than that of a filter may be used. Further, in the gas supply / exhaust system of the portable closed container of FIGS. 1 and 2 according to the present invention, it has been described that the mixed gas mixed in the gas mixing chamber 17 is discharged into the clean room 1.
It may be released to the outside of the clean room 1. If it is known in advance that the amount of inert gas contained in the exhaust gas exhausted from the gas replacement device 3 is small, an air reservoir may be installed in place of the oxygen gas reservoir to supply air. . Further, in the clean room 1 where semiconductors are manufactured, air conditioning is usually performed to maintain the cleanliness. Therefore, in the gas supply / exhaust system of the portable closed container shown in FIGS. 1 and 2, the air in the clean room 1 is directly connected without connecting the oxygen gas storage or the air storage to the oxygen gas supply pipe 22. The oxygen gas supply pipe 22 may be sucked by the suction device 30 and supplied into the gas mixing chamber 17.

【0028】[0028]

【発明の効果】このように本発明の可搬式密閉コンテナ
のガス給排気システムによれば、請求項1では、ガス置
換装置の不活性ガスに酸素ガスを混合して、混合後の混
合ガスの濃度をクリンルーム内で作業する作業者に影響
を与えない所定濃度にして、クリンルーム内に放出する
ことができる。この結果、クリンルーム内の作業者が安
全、且つ安心して作業できると共に、クリンルーム内で
の配置の自由度が増加する。
As described above, according to the gas supply / exhaust system for a portable airtight container of the present invention, in the first aspect, the inert gas of the gas replacement device is mixed with the oxygen gas, and the mixed gas after mixing is mixed. The concentration can be set to a predetermined concentration that does not affect the worker who works in the clean room, and can be released into the clean room. As a result, the worker in the clean room can work safely and with peace of mind, and the degree of freedom of arrangement in the clean room increases.

【0029】請求項2においては、請求項1の効果に加
えて、ガス濃度検出手段からの検出信号に基づいて、制
御装置が流量制御手段を制御して、ガス混合室に供給さ
れる酸素ガスの流量をガス置換装置から排気される排気
ガスの流量に応じて変化させることで、クリンルーム内
で作業する作業者に影響を与えないようにガス混合室内
の混合ガスの不活性ガス、又は酸素ガスのガス濃度設定
領域内となるように確実にコントロールし、クリンルー
ム内に放出することができる。この結果、クリンルーム
内の作業者が安全、且つ安心して作業できると共に、ク
リンルーム内での配置の自由度が増加する。
In the second aspect, in addition to the effect of the first aspect, the control device controls the flow rate control means on the basis of the detection signal from the gas concentration detection means to supply the oxygen gas to the gas mixing chamber. By changing the flow rate of the gas according to the flow rate of the exhaust gas exhausted from the gas replacement device, an inert gas of the mixed gas in the gas mixing chamber or oxygen so as not to affect the worker working in the clean room. It is possible to surely control the gas so that it is within the gas concentration setting region and release it into the clean room. As a result, the worker in the clean room can work safely and with peace of mind, and the degree of freedom of arrangement in the clean room increases.

【0030】請求項3においては、請求項2の効果に加
えて、ガス混合室の混合ガス中の不活性ガス、又は酸素
ガスのガス濃度設定領域を、クリンルーム内の環境に応
じて設定できる。
In the third aspect, in addition to the effect of the second aspect, the gas concentration setting region of the inert gas or the oxygen gas in the mixed gas in the gas mixing chamber can be set according to the environment in the clean room. .

【0031】請求項4においては、請求項1又は請求項
2の効果に加えて、ガス給排気システムがコンパクトに
なり、搬送も容易に行うことができ、クリンルーム内の
空間を無駄なく使用することが可能となる。
According to claim 4, in addition to the effect of claim 1 or claim 2, the gas supply / exhaust system is made compact, the transportation can be performed easily, and the space in the clean room is used without waste. It becomes possible.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施の形態における可搬式密閉コンテ
ナのガス給排気システムを示す模式図である。
FIG. 1 is a schematic diagram showing a gas supply / exhaust system for a portable closed container according to an embodiment of the present invention.

【図2】本発明の実施の形態における可搬式密閉コンテ
ナのガス給排気システムを構成するガスパージステーシ
ョンとガス排気装置を一体型にした縦断面図である。
FIG. 2 is a vertical cross-sectional view in which a gas purging station and a gas exhausting device that constitute a gas supply / exhaust system of a portable closed container according to an embodiment of the present invention are integrated.

【図3】本願発明者が提案した可搬式密閉コンテナのガ
ス給排気システムを示す模式図である。
FIG. 3 is a schematic diagram showing a gas supply / exhaust system for a portable closed container proposed by the inventor of the present application.

【符号の説明】[Explanation of symbols]

W 半導体ウエハ 1 クリンルーム 2 可搬式密閉コンテナ 3 ガス置換装置 4 ガス排気管 13 フィルター 16 ガス排気装置 17 ガス混合室 18 流量制御弁(流量制御手段) 19 酸素ガス濃度検出センサ(ガス濃度検出手段) 20 制御装置 21 清浄室 26 濃度設定器 b 酸素ガス濃度検出信号 c 酸素ガス濃度領域データ W semiconductor wafer 1 clean room 2 portable closed container 3 gas replacement device 4 gas exhaust pipe 13 filter 16 gas exhaust device 17 gas mixing chamber 18 flow control valve (flow control means) 19 oxygen gas concentration detection sensor (gas concentration detection means) 20 control device 21 clean room 26 concentration setting device b oxygen gas concentration detection signal c oxygen gas concentration region data

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 半導体ウエハを収納し密閉される可搬式
密閉コンテナと、前記可搬式密閉コンテナ内を不活性ガ
スで置換するガス置換装置と、前記ガス置換装置から排
気される前記不活性ガスを含む排気ガスをクリンルーム
外に放出するガス排気管とを備えてなる可搬式密閉コン
テナのガス給排気システムにおいて、前記ガス排気管に
は、前記ガス置換装置から排気される前記排気ガスを酸
素ガスで混合して、この混合後の混合ガスの濃度を人体
に影響のない所定濃度領域として前記クリンルーム内に
放出するガス排気装置を接続したことを特徴とする可搬
式密閉コンテナのガス給排気システム。
1. A portable airtight container for housing and sealing a semiconductor wafer, a gas replacement device for replacing the inside of the portable airtight container with an inert gas, and the inert gas exhausted from the gas replacement device. In a gas supply / exhaust system for a portable closed container, which comprises a gas exhaust pipe for discharging exhaust gas containing the gas to the outside of the clean room, the gas exhaust pipe includes the exhaust gas exhausted from the gas replacement device as oxygen gas. A gas supply / exhaust system for a portable closed container, which is connected to a gas exhaust device for mixing the mixed gas and releasing the concentration of the mixed gas into the clean room as a predetermined concentration region that does not affect the human body. .
【請求項2】 前記ガス排気装置は、前記ガス置換装置
から前記ガス排気管を通して排気される前記排気ガスと
外部から供給される酸素ガスとを混合させるガス混合室
と、前記ガス混合室で混合された混合ガスの不活性ガ
ス、又は酸度ガスの濃度を検出するガス濃度検出手段
と、前記ガス混合室内に供給される前記酸素ガスの流量
を変化させる流量制御手段と、前記ガス濃度検出手段か
らの検出信号に基づいて、前記ガス混合室内で混合され
た混合ガス中の前記不活性ガス又は酸素ガスの濃度を人
体に影響のないガス濃度設定領域内となるように前記流
量制御手段を制御する制御装置と、前記混合ガスをフィ
ルターで清浄して放出する清浄室とを、備えてなること
を特徴とする請求項1記載の可搬式密閉コンテナのガス
給排気システム。
2. The gas exhaust device includes a gas mixing chamber for mixing the exhaust gas exhausted from the gas replacement device through the gas exhaust pipe with an oxygen gas supplied from the outside, and a gas mixing chamber for mixing in the gas mixing chamber. From the gas concentration detection means, a gas concentration detection means for detecting the concentration of the inert gas or the acidity gas of the mixed gas, a flow rate control means for changing the flow rate of the oxygen gas supplied into the gas mixing chamber, Based on the detection signal of, the flow rate control means is controlled so that the concentration of the inert gas or oxygen gas in the mixed gas mixed in the gas mixing chamber is within a gas concentration setting region that does not affect the human body. The gas supply / exhaust system for a portable closed container according to claim 1, further comprising a control device and a cleaning chamber for cleaning the mixed gas with a filter and discharging the mixed gas.
【請求項3】 前記制御装置には、前記ガス濃度設定領
域を変動可能とする濃度設定器が接続されていることを
特徴とする請求項1記載の可搬式密閉コンテナのガス給
排気システム。
3. The gas supply / exhaust system for a portable airtight container according to claim 1, wherein the controller is connected to a concentration setter capable of changing the gas concentration setting region.
【請求項4】 前記ガス置換装置と前記ガス排気装置と
が、一体型して形成されていることを特徴とする請求項
1又は請求項2記載の可搬式密閉コンテナのガス給排気
システム。
4. The gas supply / exhaust system for a portable closed container according to claim 1, wherein the gas replacement device and the gas exhaust device are integrally formed.
JP33781695A 1995-11-30 1995-11-30 Gas supply and exhaust system for portable sealed containers Expired - Fee Related JP3893635B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP33781695A JP3893635B2 (en) 1995-11-30 1995-11-30 Gas supply and exhaust system for portable sealed containers

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33781695A JP3893635B2 (en) 1995-11-30 1995-11-30 Gas supply and exhaust system for portable sealed containers

Publications (2)

Publication Number Publication Date
JPH09153437A true JPH09153437A (en) 1997-06-10
JP3893635B2 JP3893635B2 (en) 2007-03-14

Family

ID=18312239

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33781695A Expired - Fee Related JP3893635B2 (en) 1995-11-30 1995-11-30 Gas supply and exhaust system for portable sealed containers

Country Status (1)

Country Link
JP (1) JP3893635B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005210118A (en) * 2004-01-20 2005-08-04 Alcatel Station for controlling and purging mini-environment
JP2015082577A (en) * 2013-10-23 2015-04-27 Tdk株式会社 Substrate transfer method
JP6032372B2 (en) * 2013-09-26 2016-11-30 村田機械株式会社 Purge apparatus and purge method
CN116525508A (en) * 2023-05-23 2023-08-01 乐孜芯创半导体设备(上海)有限公司 Closed wafer box loading port and gas replacement method thereof

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005210118A (en) * 2004-01-20 2005-08-04 Alcatel Station for controlling and purging mini-environment
JP4651396B2 (en) * 2004-01-20 2011-03-16 アルカテル−ルーセント Device with purge station
JP6032372B2 (en) * 2013-09-26 2016-11-30 村田機械株式会社 Purge apparatus and purge method
TWI619192B (en) * 2013-09-26 2018-03-21 Murata Machinery Ltd Purge device and method
JP2015082577A (en) * 2013-10-23 2015-04-27 Tdk株式会社 Substrate transfer method
CN116525508A (en) * 2023-05-23 2023-08-01 乐孜芯创半导体设备(上海)有限公司 Closed wafer box loading port and gas replacement method thereof
CN116525508B (en) * 2023-05-23 2024-03-26 乐孜芯创半导体设备(上海)有限公司 Closed wafer box loading port and gas replacement method thereof

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