JPH0915053A - Infrared temperature measuring apparatus - Google Patents

Infrared temperature measuring apparatus

Info

Publication number
JPH0915053A
JPH0915053A JP7162493A JP16249395A JPH0915053A JP H0915053 A JPH0915053 A JP H0915053A JP 7162493 A JP7162493 A JP 7162493A JP 16249395 A JP16249395 A JP 16249395A JP H0915053 A JPH0915053 A JP H0915053A
Authority
JP
Japan
Prior art keywords
temperature
thermistor
voltage
resistor
infrared
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7162493A
Other languages
Japanese (ja)
Inventor
Mitsuteru Hataya
光輝 畑谷
Hironori Kami
浩則 上
Kazunori Kidera
和憲 木寺
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP7162493A priority Critical patent/JPH0915053A/en
Publication of JPH0915053A publication Critical patent/JPH0915053A/en
Pending legal-status Critical Current

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Abstract

PURPOSE: To obtain a highly accurate infrared temperature measuring apparatus. CONSTITUTION: The infrared temperature measuring apparatus comprises a thermistor THR1 to which a voltage is applied through a resistor R1, a chopper 4 for intercepting the infrared rays incident on the thermistor THR1 intermittently, a temperature regulator 5 for the thermistor THR1, and a section 6 for controlling the temperature regulator 5 based on a signal corresponding to the voltage across a resistor R1 so that the difference of voltage across the resistor R1 will be zero when the infrared rays are intercepted, and when not intercepted. Consequently, the relationship between the resistance of thermistor THR1 and the temperature requires no correction and the aging of thermistor THR1 gives no adverse effect. Furthermore, fluctuation in the characteristics among a plurality of thermistors gives no adverse effect.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、赤外線を捉えて温度被
測定物の温度を測定する赤外線温度測定装置に関するも
のである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an infrared temperature measuring device for capturing infrared rays and measuring the temperature of a temperature measured object.

【0002】[0002]

【従来の技術】図3の回路図に基づいて従来の赤外線温
度測定装置の一例を説明する。図で、THR1は、赤外線検
出用サーミスタで、温度被測定物から放射される赤外線
を直接入射するように配置されている。THR2は、温度補
償用サーミスタである。赤外線検出用サーミスタTHR1に
は抵抗R1が直列に接続され、温度補償用サーミスタTHR2
には抵抗R2が直列に接続され、赤外線検出用サーミスタ
THR1と抵抗R1の直列回路と、温度補償用サーミスタTHR2
と抵抗R2の直列回路とが並列に接続されてブリッジ回路
1が形成されている。赤外線検出用サーミスタTHR1と温
度補償用サーミスタTHR2の接続点は電源E の高電位側に
接続され、抵抗R1と抵抗R2の接続点は電源E の低電位側
に接続されている。
2. Description of the Related Art An example of a conventional infrared temperature measuring device will be described with reference to the circuit diagram of FIG. In the figure, THR1 is an thermistor for detecting infrared rays, and is arranged so that the infrared rays emitted from the temperature-measuring object are directly incident thereon. THR2 is a thermistor for temperature compensation. A resistor R1 is connected in series to the infrared detection thermistor THR1, and the temperature compensation thermistor THR2
A resistor R2 is connected in series to the infrared detection thermistor.
Series circuit of THR1 and resistor R1 and thermistor THR2 for temperature compensation
And a series circuit of the resistor R2 are connected in parallel to form a bridge circuit 1. The connection point between the infrared detection thermistor THR1 and the temperature compensation thermistor THR2 is connected to the high potential side of the power supply E, and the connection point of the resistors R1 and R2 is connected to the low potential side of the power supply E.

【0003】また、A1は、赤外線検出用サーミスタTHR1
と抵抗R1の接続点と、温度補償用サーミスタTHR2と抵抗
R2の接続点間の電圧V1を増幅する増幅器、A2は抵抗R2の
両端の電圧V2を増幅する増幅器である。電圧V1は温度被
測定物と赤外線検出用サーミスタTHR1の温度差を反映し
た信号となり、電圧V2は室温すなわち赤外線を吸収して
いない状態の赤外線検出用サーミスタTHR1の温度を反映
した信号となる。これらの電圧V1,V2は、それぞれ、増
幅器A1,A2で増幅された後、信号処理回路2に入力され
る。信号処理回路2は、(1)式に示す理論式に基づい
て、入力した信号を処理し温度被測定物の温度を算出す
るように構成されている。 R=R0EXP {B(1/T0-1/T) }・・・(1) ここで、R0は基準温度T0(K) でのサーミスタの抵抗値、
B はサーミスタ定数である。
A1 is an infrared detection thermistor THR1.
And resistance R1 connection point, temperature compensation thermistor THR2 and resistance
An amplifier that amplifies the voltage V1 between the connection points of R2, A2 is an amplifier that amplifies the voltage V2 across the resistor R2. The voltage V1 is a signal that reflects the temperature difference between the temperature-measuring object and the infrared detection thermistor THR1, and the voltage V2 is a signal that reflects the temperature of the infrared detection thermistor THR1 at room temperature, that is, in a state where infrared rays are not absorbed. These voltages V1 and V2 are input to the signal processing circuit 2 after being amplified by the amplifiers A1 and A2, respectively. The signal processing circuit 2 is configured to process the input signal and calculate the temperature of the temperature measured object based on the theoretical equation shown in the equation (1). R = R 0 EXP {B (1 / T 0 -1 / T)} (1) where R 0 is the resistance value of the thermistor at the reference temperature T 0 (K),
B is the thermistor constant.

【0004】[0004]

【発明が解決しようとする課題】図3に示した赤外線温
度測定装置を用いて温度を測定する場合、理論式
((1)式)に含まれる誤差要因の他に、増幅器A1,A2
でのオフセット電圧、赤外線検出用サーミスタTHR1と温
度補償用サーミスタTHR2の特性ばらつき等の誤差要因に
よる誤差が発生していたので、測定精度を向上させるた
めに、通常、様々な補正処理が行われていた。しかし、
そのために回路がかなり複雑で大規模になり、得られる
精度にも限界があるという問題点があった。
When the temperature is measured using the infrared temperature measuring device shown in FIG. 3, the amplifiers A1 and A2 are included in addition to the error factors included in the theoretical formula (equation (1)).
Since there were errors due to error factors such as offset voltage in the and the infrared detection thermistor THR1 and temperature compensation thermistor THR2 characteristics, various correction processes are usually performed to improve the measurement accuracy. It was But,
As a result, the circuit becomes quite complicated and large in scale, and there is a problem in that the accuracy that can be obtained is limited.

【0005】本発明は、上記問題点に鑑みなされたもの
で、その目的とするところは、サーミスタを用いた赤外
線温度測定装置において、サーミスタの特性のばらつき
等の影響を受けず、その補正も必要としない高精度な赤
外線温度測定装置の構造を提供することにある。
The present invention has been made in view of the above problems. An object of the present invention is to correct an infrared temperature measuring device using a thermistor without being affected by variations in thermistor characteristics. Another object of the present invention is to provide a highly accurate infrared temperature measuring device structure.

【0006】[0006]

【課題を解決するための手段】上記目的を達成するた
め、請求項1記載の赤外線温度測定装置は、直列に接続
された抵抗を介して電圧が印加されるサーミスタと、そ
のサーミスタへの赤外線入射を断続的に遮断するチョッ
パーと、前記サーミスタの近傍に配置されて前記サーミ
スタの温度を調整する温度調整手段と、前記サーミスタ
の両端電圧または前記抵抗の両端電圧に応じた信号を入
力し、赤外線を遮断した場合と赤外線を遮断していない
場合の、前記サーミスタの両端電圧または前記抵抗の両
端電圧の差が零となるように前記温度調整手段の温度を
制御する温度制御部とを備えたことを特徴とするもので
ある。
In order to achieve the above object, the infrared temperature measuring device according to claim 1 is a thermistor to which a voltage is applied via a resistor connected in series, and an infrared ray incident on the thermistor. A chopper for intermittently shutting off the temperature, temperature adjusting means arranged in the vicinity of the thermistor for adjusting the temperature of the thermistor, and inputting a signal according to the voltage across the thermistor or the voltage across the resistor, infrared rays are emitted. And a temperature controller for controlling the temperature of the temperature adjusting means so that the difference between the voltage across the thermistor or the voltage across the resistor when the infrared light is not blocked is zero. It is a feature.

【0007】請求項2記載の赤外線温度測定装置は、直
列に接続された抵抗を介して電圧が印加されるサーミス
タと、そのサーミスタへの赤外線入射を断続的に遮断す
るチョッパーと、前記サーミスタの両端電圧または前記
抵抗の両端電圧に応じた信号を入力し、赤外線を遮断し
た場合と赤外線を遮断していない場合の、前記サーミス
タの両端電圧または前記抵抗の両端電圧の差が零となる
ように前記チョッパーの温度を制御する温度制御部とを
備えたことを特徴とするものである。
An infrared temperature measuring device according to a second aspect of the present invention is a thermistor to which a voltage is applied via a resistor connected in series, a chopper for intermittently interrupting the infrared ray incident on the thermistor, and both ends of the thermistor. A signal corresponding to the voltage or the voltage across the resistor is input so that the difference between the voltage across the thermistor and the voltage across the resistor when the infrared light is blocked and when the infrared light is not blocked is zero. And a temperature controller for controlling the temperature of the chopper.

【0008】[0008]

【作用】請求項1記載の赤外線温度測定装置は、赤外線
検出用のサーミスタと抵抗の直列回路に電圧を印加し、
温度被測定物からサーミスタに放射される赤外線をチョ
ッパーにより断続しながら、サーミスタの両端電圧また
は抵抗の両端電圧を測定することを特徴とするものであ
る。温度被測定物とサーミスタの温度が異なれば、サー
ミスタの両端電圧または抵抗の両端電圧は、チョッパー
の開閉に応じて変化する交流成分を含んだ信号となる。
ここで、それらの両端電圧の交流成分が零になるよう
に、つまり、チョッパーの開閉状態によらず、サーミス
タの両端電圧または抵抗の両端電圧が一定となるよう
に、温度制御部によって温度調整手段の温度を調整し
て、サーミスタの温度を調整すれば、この時の温度調整
手段(サーミスタ)の温度が温度被測定物の温度とな
る。
The infrared temperature measuring device according to claim 1 applies a voltage to a series circuit of a thermistor for detecting infrared rays and a resistor,
It is characterized in that the voltage across the thermistor or the voltage across a resistor is measured while the infrared rays radiated from the temperature measured object to the thermistor are intermittently cut by the chopper. If the temperature of the object to be measured and the temperature of the thermistor are different, the voltage across the thermistor or the voltage across the resistor becomes a signal containing an AC component that changes according to the opening and closing of the chopper.
Here, the temperature control unit controls the temperature so that the AC component of the voltage across them becomes zero, that is, the voltage across the thermistor or the voltage across the resistor becomes constant regardless of the open / closed state of the chopper. If the temperature of the thermistor is adjusted by adjusting the temperature of, the temperature of the temperature adjusting means (thermistor) at this time becomes the temperature of the temperature measured object.

【0009】請求項2記載の赤外線温度測定装置は、サ
ーミスタと抵抗の直列回路に電圧を印加し、温度被測定
物からサーミスタに放射される赤外線をチョッパーによ
り断続しながら、サーミスタの両端電圧または抵抗の両
端電圧を測定する点では、請求項1記載の赤外線温度測
定装置と同じであるが、請求項2記載の赤外線温度測定
装置は、サーミスタの両端電圧または抵抗の両端電圧の
交流成分が零となるように、温度制御部によってチョッ
パーの温度を調整することを特徴とするもので、サーミ
スタの両端電圧または抵抗の両端電圧の交流成分が零と
なる時のチョッパーの温度が温度被測定物の温度とな
る。
In the infrared temperature measuring device according to the second aspect of the invention, a voltage is applied to a series circuit of a thermistor and a resistor, and while infrared rays radiated from the temperature measured object to the thermistor are interrupted by a chopper, the voltage across the thermistor or the resistance. Is the same as the infrared temperature measuring device according to claim 1, but the infrared temperature measuring device according to claim 2 is that the AC component of the voltage across the thermistor or the voltage across the resistor is zero. Therefore, the temperature of the chopper is adjusted by the temperature control unit so that the temperature of the chopper when the AC component of the voltage across the thermistor or the voltage across the resistor becomes zero is the temperature of the measured object. Becomes

【0010】[0010]

【実施例】図1の構成図に基づいて本発明の赤外線温度
測定装置の一実施例について説明する。図で、THR1はサ
ーミスタで、温度被測定物3から放射される赤外線を直
接入射するように配置されている。サーミスタTHR1には
抵抗R1が直列に接続されており、その直列回路には電源
電圧Vdd が印加されている。4は温度被測定物3とサー
ミスタTHR1間に配置されて、サーミスタTHR1へ入射する
赤外線を断続的に遮断するチョッパーである。また、A1
は抵抗R1の両端電圧を増幅する増幅器、5は温度調整手
段としてサーミスタTHR1の近傍に配置された、サーミス
タTHR1の温度を調整する温度調整装置、6は増幅器A1の
出力を入力して、チョッパー4によって赤外線を遮断し
た場合と赤外線を遮断していない場合の、抵抗R1の両端
電圧の差が零となるように、温度調整装置5の温度を制
御する温度制御部である。他に、チョッパー4を駆動す
る手段等が設けられているが、図1では主要構成のみを
図示することとしその他の構成は図示を省略している。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the infrared temperature measuring device of the present invention will be described based on the block diagram of FIG. In the figure, THR1 is a thermistor and is arranged so that the infrared rays emitted from the DUT 3 are directly incident thereon. A resistance R1 is connected in series to the thermistor THR1, and the power supply voltage Vdd is applied to the series circuit. Reference numeral 4 denotes a chopper which is arranged between the temperature measured object 3 and the thermistor THR1 and intermittently blocks infrared rays incident on the thermistor THR1. Also, A1
Is an amplifier for amplifying the voltage across the resistor R1, 5 is a temperature adjusting device for adjusting the temperature of the thermistor THR1, which is arranged in the vicinity of the thermistor THR1 as a temperature adjusting means, 6 is an input of the output of the amplifier A1, and is a chopper 4 The temperature control unit controls the temperature of the temperature adjusting device 5 so that the difference between the voltages across the resistor R1 when the infrared light is blocked and when the infrared light is not blocked is zero. In addition, although means for driving the chopper 4 and the like are provided, only the main configuration is shown in FIG. 1 and other configurations are omitted.

【0011】次に、図1に示した赤外線温度測定装置の
動作について説明する。測定前は、チョッパー4が閉じ
た状態であり、温度被測定物3から放射された赤外線は
サーミスタTHR1には入射していない。増幅器A1には、抵
抗R1の両端電圧(直流電圧)が入力されている。測定時
には、一定時間、チョッパー4を開けた状態にする。こ
れにより、温度被測定物3から放射された赤外線がサー
ミスタTHR1に入射する。この時、温度被測定物3の温度
がサーミスタTHR1の温度より高ければ、サーミスタTHR1
の抵抗値が下がり、抵抗R1の両端電圧、増幅器A1の出力
電圧が上昇することになる。この場合には、温度制御部
6が温度調整装置5を制御しサーミスタTHR1の温度を上
げるようにする。
Next, the operation of the infrared temperature measuring device shown in FIG. 1 will be described. Before the measurement, the chopper 4 is in a closed state, and the infrared rays emitted from the temperature measured object 3 are not incident on the thermistor THR1. The voltage across the resistor R1 (DC voltage) is input to the amplifier A1. At the time of measurement, the chopper 4 is kept open for a certain period of time. As a result, the infrared rays emitted from the temperature measured object 3 enter the thermistor THR1. At this time, if the temperature of the DUT 3 is higher than the temperature of the thermistor THR1, the thermistor THR1
The resistance value of the resistor R1 decreases, and the voltage across the resistor R1 and the output voltage of the amplifier A1 increase. In this case, the temperature controller 6 controls the temperature adjusting device 5 to raise the temperature of the thermistor THR1.

【0012】その後、再び、一定時間、チョッパー4を
開けた状態とする。この時、もし、温度被測定物3の温
度がサーミスタTHR1の温度より低ければ、温度制御部6
が温度調整装置5を制御しサーミスタTHR1の温度を下げ
るように動作する。この動作を繰り返し、チョッパー4
を開けた時、抵抗R1の両端電圧の変化が零になれば、そ
の時のサーミスタTHR1(温度調整装置5)の温度が温度
被測定物3の温度となる。
After that, the chopper 4 is opened again for a certain period of time. At this time, if the temperature of the DUT 3 is lower than the temperature of the thermistor THR1, the temperature control unit 6
Controls the temperature adjusting device 5 to operate to lower the temperature of the thermistor THR1. Repeat this operation, chopper 4
If the change in the voltage across the resistor R1 becomes zero when the is opened, the temperature of the thermistor THR1 (temperature adjusting device 5) at that time becomes the temperature of the temperature measured object 3.

【0013】図2の構成図に基づいて本発明の赤外線温
度測定装置の異なる実施例について説明する。但し、図
1に示した構成と同等構成については同符号を付すこと
とする。図で、THR1は、サーミスタで、温度被測定物3
から放射される赤外線を直接入射するように配置されて
いる。サーミスタTHR1には抵抗R1が直列に接続されてお
り、その直列回路には電源電圧Vdd が印加されている。
4は温度被測定物3とサーミスタTHR1間に配置されて、
サーミスタTHR1へ入射する赤外線を断続的に遮断するチ
ョッパーである。チョッパー4はその温度調整が可能な
材料で構成されている。A1は抵抗R1の両端電圧を増幅す
る増幅器、6は増幅器A1の出力を入力して、チョッパー
4によって赤外線を遮断した場合と赤外線を遮断してい
ない場合の、抵抗R1の両端電圧の差が零となるように、
チョッパー4の温度を制御する温度制御部である。
A different embodiment of the infrared temperature measuring apparatus of the present invention will be described with reference to the configuration diagram of FIG. However, the same components as those shown in FIG. 1 are designated by the same reference numerals. In the figure, THR1 is a thermistor, and the measured object 3
It is arranged so that the infrared rays emitted from it directly enter. A resistance R1 is connected in series to the thermistor THR1, and the power supply voltage Vdd is applied to the series circuit.
4 is placed between the DUT 3 and the thermistor THR1,
It is a chopper that intermittently blocks infrared rays that enter the thermistor THR1. The chopper 4 is made of a material whose temperature can be adjusted. A1 is an amplifier that amplifies the voltage across the resistor R1, 6 is the input of the output of the amplifier A1, and the difference between the voltage across the resistor R1 when the infrared rays are blocked by the chopper 4 and when the infrared rays are not blocked is zero. So that
A temperature control unit that controls the temperature of the chopper 4.

【0014】次に、図2に示した赤外線温度測定装置の
動作について説明する。測定前は、チョッパー4が閉じ
た状態であり、温度被測定物3から放射された赤外線は
サーミスタTHR1には入射しない。増幅器A1には、抵抗R1
の両端電圧(直流電圧)が入力されている。測定時に
は、一定時間、チョッパー4を開けた状態にする。これ
により、温度被測定物3から放射された赤外線がサーミ
スタTHR1に入射する。この時、温度被測定物3の温度が
サーミスタTHR1の温度より高ければ、サーミスタTHR1の
抵抗値が下がり、抵抗R1の両端電圧、増幅器A1の出力電
圧が上昇することになる。この場合には、温度制御部6
がチョッパー4の温度を上げるように動作する。
Next, the operation of the infrared temperature measuring device shown in FIG. 2 will be described. Before the measurement, the chopper 4 is in the closed state, and the infrared rays emitted from the temperature measured object 3 do not enter the thermistor THR1. The amplifier A1 has a resistor R1
The voltage between both ends (DC voltage) is input. At the time of measurement, the chopper 4 is kept open for a certain period of time. As a result, the infrared rays emitted from the temperature measured object 3 enter the thermistor THR1. At this time, if the temperature of the DUT 3 is higher than the temperature of the thermistor THR1, the resistance value of the thermistor THR1 decreases, and the voltage across the resistor R1 and the output voltage of the amplifier A1 increase. In this case, the temperature control unit 6
Operates to raise the temperature of the chopper 4.

【0015】その後、再び、一定時間、チョッパー4を
開けた状態とする。この時、もし、温度被測定物3の温
度がサーミスタTHR1の温度より低ければ、温度制御部6
がチョッパー4の温度を下げるように動作する。この動
作を繰り返し、チョッパー4を開けた時、抵抗R1の両端
電圧の変化が零になれば、その時のチョッパー4の温度
が温度被測定物3の温度となる。
After that, the chopper 4 is opened again for a certain period of time. At this time, if the temperature of the DUT 3 is lower than the temperature of the thermistor THR1, the temperature control unit 6
Operates to lower the temperature of the chopper 4. When this operation is repeated and the chopper 4 is opened, if the change in the voltage across the resistor R1 becomes zero, the temperature of the chopper 4 at that time becomes the temperature of the temperature measured object 3.

【0016】[0016]

【発明の効果】請求項1または請求項2記載の赤外線温
度測定装置では、サーミスタの抵抗値から、直接、温度
被測定物の温度を読み取ることをせず、温度制御可能な
温度基準物(温度調整装置、チョッパー)から放射され
る赤外線量と、温度被測定物から放射される赤外線量と
を比較するようにして、温度被測定物の温度を測定する
ので、サーミスタの抵抗値とその温度との関係を補正す
る必要がない。また、経時変化によるサーミスタの特性
の変化の影響を受けない。さらに、1つのサーミスタの
みを用いているので、複数のサーミスタ間の特性ばらつ
きの影響を受けることがない。このため、請求項1また
は請求項2記載の赤外線温度測定装置によれば高精度な
温度測定が可能となる。
In the infrared temperature measuring device according to the first or second aspect of the present invention, the temperature controllable temperature reference object (temperature control device) can be used without directly reading the temperature of the temperature measured object from the resistance value of the thermistor. The temperature of the temperature measurement object is measured by comparing the amount of infrared radiation emitted from the adjustment device and the chopper) with the amount of infrared radiation emitted from the temperature measurement object. Therefore, the resistance value of the thermistor and its temperature are measured. There is no need to correct the relationship. Further, it is not affected by changes in the characteristics of the thermistor due to changes over time. Furthermore, since only one thermistor is used, it is not affected by the characteristic variations among the thermistors. Therefore, the infrared temperature measuring device according to claim 1 or 2 enables highly accurate temperature measurement.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の赤外線温度測定装置の一実施例を示す
構成図である。
FIG. 1 is a configuration diagram showing an embodiment of an infrared temperature measuring device of the present invention.

【図2】本発明の赤外線温度測定装置の異なる実施例を
示す構成図である。
FIG. 2 is a configuration diagram showing another embodiment of the infrared temperature measuring device of the present invention.

【図3】従来の赤外線温度測定装置の一例を示す回路図
である。
FIG. 3 is a circuit diagram showing an example of a conventional infrared temperature measuring device.

【符号の説明】[Explanation of symbols]

R1 抵抗 THR1 サーミスタ 4 チョッパー 5 温度調整装置(温度調整手段) 6 温度制御部 R1 resistance THR1 thermistor 4 chopper 5 temperature adjustment device (temperature adjustment means) 6 temperature control unit

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 直列に接続された抵抗を介して電圧が印
加されるサーミスタと、そのサーミスタへの赤外線入射
を断続的に遮断するチョッパーと、前記サーミスタの近
傍に配置されて前記サーミスタの温度を調整する温度調
整手段と、前記サーミスタの両端電圧または前記抵抗の
両端電圧に応じた信号を入力し、赤外線を遮断した場合
と赤外線を遮断していない場合の、前記サーミスタの両
端電圧または前記抵抗の両端電圧の差が零となるように
前記温度調整手段の温度を制御する温度制御部とを備え
たことを特徴とする赤外線温度測定装置。
1. A thermistor to which a voltage is applied through a resistor connected in series, a chopper that intermittently blocks infrared rays from entering the thermistor, and a temperature of the thermistor that is disposed in the vicinity of the thermistor. A temperature adjusting means for adjusting and a signal according to the voltage across the thermistor or the voltage across the resistor are input, and the voltage across the thermistor or the resistor in the case of blocking infrared light and the case of not blocking infrared light An infrared temperature measuring device, comprising: a temperature control unit that controls the temperature of the temperature adjusting unit so that the voltage difference between both ends becomes zero.
【請求項2】 直列に接続された抵抗を介して電圧が印
加されるサーミスタと、そのサーミスタへの赤外線入射
を断続的に遮断するチョッパーと、前記サーミスタの両
端電圧または前記抵抗の両端電圧に応じた信号を入力
し、赤外線を遮断した場合と赤外線を遮断していない場
合の、前記サーミスタの両端電圧または前記抵抗の両端
電圧の差が零となるように前記チョッパーの温度を制御
する温度制御部とを備えたことを特徴とする赤外線温度
測定装置。
2. A thermistor to which a voltage is applied via a resistor connected in series, a chopper for intermittently blocking infrared rays from entering the thermistor, and a voltage across the thermistor or a voltage across the resistor. A temperature control unit that controls the temperature of the chopper so that the difference between the voltage across the thermistor or the voltage across the resistor when the infrared light is blocked and the infrared light is not blocked is zero. An infrared temperature measuring device comprising:
JP7162493A 1995-06-28 1995-06-28 Infrared temperature measuring apparatus Pending JPH0915053A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7162493A JPH0915053A (en) 1995-06-28 1995-06-28 Infrared temperature measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7162493A JPH0915053A (en) 1995-06-28 1995-06-28 Infrared temperature measuring apparatus

Publications (1)

Publication Number Publication Date
JPH0915053A true JPH0915053A (en) 1997-01-17

Family

ID=15755674

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7162493A Pending JPH0915053A (en) 1995-06-28 1995-06-28 Infrared temperature measuring apparatus

Country Status (1)

Country Link
JP (1) JPH0915053A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012225717A (en) * 2011-04-18 2012-11-15 Mitsubishi Materials Corp Infrared sensor device
JP2018060781A (en) * 2016-09-29 2018-04-12 旭化成エレクトロニクス株式会社 Light receiving device, and method for compensating light emitting device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012225717A (en) * 2011-04-18 2012-11-15 Mitsubishi Materials Corp Infrared sensor device
JP2018060781A (en) * 2016-09-29 2018-04-12 旭化成エレクトロニクス株式会社 Light receiving device, and method for compensating light emitting device
US9980336B2 (en) 2016-09-29 2018-05-22 Asahi Kasei Microdevices Corporation Light receiving device, light emitting device and light receiving/emitting device

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