JPH09138418A - Liquid crystal matrix display panel inspecting method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an inspecting method answering to a display panel adopting a COG method, eliminating a useless space of a substrate and excellent for inspective precision and inspective efficiency in an inspecting method on manufacture of a liquid crystal matrix display panel. SOLUTION: Signal side inspective electrodes 6 and scan side inspective electrodes 5 provided on the positions superimposed on the seal parts 7 of the display panels are connected in series respectively in the state that many pieces of display panels 21-23 are connected to be made a signal side common inspective electrode 9 and a scan side common inspective electrode 8. Then, an inspective voltage is applied between both common inspective electrodes 8, 9, and the disconnection defects of many pieces of display panels 21-23 are inspected collectively and simultaneously, and further, after connected wires in plural electrode wiring gathered to one side inspective electrode are cut on every other piece by using a laser beam, the short-circuited defects are inspected collectively and simuitaneously.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal matrix display panel inspection method, and more particularly to a liquid crystal matrix display panel for inspecting a large number of display panels at the same time, which is suitable for an inspection performed in a manufacturing process of a display panel having a high pixel density. Regarding the inspection method.

[0002]

2. Description of the Related Art In the conventional inspection performed in the process of manufacturing a liquid crystal matrix display panel, the pitch between terminals becomes smaller as the definition of the display panel becomes higher, and the terminals of the display panel and the terminals for applying an inspection voltage thereto. There is a problem that it is not possible to make a reliable inspection because of insufficient contact with. As a countermeasure against this, the inspection method shown in FIG. 11 has been proposed. (JP-A-5-341246).

According to this method, a pattern of two active matrix substrates 33 is formed on one original substrate 31 as shown in FIG. 11, and it is opposed to the original substrate 31 and is one size smaller than the original substrate 31. The original substrate 32 is provided. The terminals of the odd-numbered signal electrode wirings 38a and the terminals of the even-numbered signal electrode wirings 38b on the original substrate 31 are connected to the signal-side inspection electrodes 34 provided on the opposite sides of the active matrix substrate 33, respectively. There is. Similarly, the terminals of the odd-numbered scan electrode wirings 39a and the terminals of the even-numbered scan electrode wirings 39b on the original substrate 32 are respectively connected to the scanning-side inspection electrodes 35 provided on the opposite sides of the active matrix substrate 33. ing.

Further, the signal electrode wirings 38a, 38b and the scanning electrode wirings 39a, 39 are passed through the inspection voltage applying terminals 37 provided at the ends of the respective inspection electrodes 34, 35.
A predetermined inspection voltage is applied to b to detect wire disconnection defects and short circuit defects. The defect determined to be defective by the above inspection is repaired by irradiating light energy such as a laser. As described above, this proposal can reduce the number of terminals to which the inspection voltage is applied in the inspection process by providing the inspection electrodes 34 and 35 and the inspection voltage application terminal 37 as compared with the related art.

[0005]

However, in the above method, when two display panels are inspected at the same time,
It is necessary to simultaneously apply the inspection voltage to the inspection voltage application terminals 37 formed at about six places. Further, if the number of display panels to be inspected at the same time further increases, the number of required inspection voltage applying terminals 37 will further increase. An increase in the number of the inspection voltage applying terminals 37 is not preferable in terms of inspection reliability and inspection efficiency. Although the wiring pattern as shown in FIG. 11 is not a problem when the driving IC is externally attached to the substrate, the driving IC has recently attracted attention because of its fine pitch correspondence, downsizing and cost reduction.
COG method (Chip On G
It is difficult to deal with a display panel that adopts the "lass".

Further, as shown in FIG. 11, this proposal proposes that after the inspection, the signal side inspection electrode 34, the scanning side inspection electrode 35, the signal electrode wirings 38a and 38b and the scanning electrode wiring 39a,
It is necessary to cut each with 39b. Therefore, 1
The signal side inspection electrode 34 and the scanning side inspection electrode 35 are provided outside the portion cut out to each display panel. As a result, as shown in FIG. 12, in the outer peripheral portion and the central portion of the original substrate 31, the original substrate 3 is provided outside the cutting portion 40 indicated by the broken line.
There is a problem that the cut-off portion 36 of 1 is formed, a lot of useless space is generated on the substrate, and the manufacturing efficiency of the substrate is poor.

In the active matrix display panel, although not shown in the figure, a thin film transistor or MIM (Met (Met) as an active element is provided on the original substrate 31.
A diode such as an alInsulator Metal) is formed and requires a complex and long manufacturing process. Therefore, in order to increase production efficiency, efforts are being made to eliminate useless space so that as many active matrix substrates as possible can be produced from one original substrate 31.
Therefore, in the manufacture of the active matrix display panel, a large amount of wasted space on the original substrate 31 is a serious problem.

Therefore, an object of the present invention is to make it possible to simultaneously inspect a large number of liquid crystal matrix display panels at the same time, and also to inspect for short-circuit defects in high-density wiring. Improves efficiency and also C
It is an object of the present invention to provide a liquid crystal matrix display panel adopting the OG method and a method for inspecting a liquid crystal matrix display panel which can be applied to a liquid crystal active matrix display panel.

[0009]

In order to achieve the above-mentioned object, the method of inspecting a liquid crystal matrix display panel according to the invention of claim 1 in the present invention comprises a plurality of stretching methods in one direction of rows or columns. A pixel substrate having one electrode wiring, a counter substrate having a plurality of other electrode wirings extending in the other direction, and a liquid crystal sandwiched between a pair of substrates including the pixel substrate and the counter substrate. A plurality of liquid crystal matrix display panels each of which has a layer and a sealing portion that seals the liquid crystal layer are connected to each other in one direction to form a disconnection defect and a short circuit defect. A method for inspecting, wherein each of the plurality of electrode wirings and the other of the plurality of electrode wirings, for each display panel, is connected to one of the inspection electrodes and the other of the inspection electrodes and collected, The one inspection electrode and the other inspection electrode in a large number of display panels are respectively connected in series to form one common inspection electrode and the other common inspection electrode, and a predetermined distance is provided between the two common inspection electrodes. The inspection voltage is applied to simultaneously inspect a large number of display panels for disconnection defects at the same time, and then the wiring in the plurality of electrode wirings concentrated on at least one of the inspection electrodes is connected by using a laser beam. After disconnecting every other by cutting, a predetermined inspection voltage is applied between both common inspection electrodes to inspect for a short circuit defect.

According to a second aspect of the invention, in the configuration of the first aspect of the invention, at least a part of one inspection electrode, the other inspection electrode, one common inspection electrode and the other common inspection electrode is sealed. It is characterized in that it is provided at a position overlapping with.

According to a third aspect of the present invention, in the configuration of the first aspect of the invention, at least a part of one inspection electrode, the other inspection electrode, one common inspection electrode and the other common inspection electrode is provided. It is characterized in that an anisotropic conductive seal for connecting to the electrode wiring or the other electrode wiring is provided.

According to a fourth aspect of the present invention, there is provided a method for inspecting a liquid crystal matrix display panel, wherein a plurality of electrode wirings extending in one direction of a row or a column and a plurality of electrode wirings are arranged in a matrix and each of the electrode wirings has an active element. Between a pixel substrate having a large number of pixel electrodes connected to each other, a counter substrate having a plurality of other electrode wirings extending in the other direction, and a pair of substrates composed of the pixel substrate and the counter substrate. A large number of liquid crystal matrix display panels, each of which is composed of a liquid crystal layer sandwiched between the liquid crystal layer and a seal portion that seals the liquid crystal layer, and each of the pair of substrates is connected in one direction. A method for inspecting a disconnection defect and a short circuit defect in a state, wherein one of the plurality of electrode wirings and the other of the plurality of electrode wirings are provided for each display panel and one inspection electrode is provided. And the other inspection electrodes are connected and concentrated, and the one inspection electrode and the other inspection electrode in the plurality of display panels are respectively connected in series to form one common inspection electrode and the other common inspection electrode. , At least a part of the one inspection electrode, the other inspection electrode, the one common inspection electrode, and the other common inspection electrode is provided at a position overlapping the seal portion, and between the two common inspection electrodes. A predetermined inspection voltage is applied to a plurality of display panels to simultaneously inspect for disconnection defects at the same time, and at least one of the electrode wirings concentrated on one of the inspection electrodes is connected with a laser beam. After disconnecting every other line by cutting the wiring, a predetermined inspection voltage is applied between both inspection electrodes to inspect for a short circuit defect.

[0013]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A first embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a schematic enlarged view for explaining a method of inspecting a liquid crystal display panel according to the first embodiment of the present invention. FIG. 2 is a schematic enlarged view showing the AA cross-sectional shape in FIG. FIG. 3 is a schematic enlarged view showing a BB cross-sectional shape in FIG. FIG. 4 is a schematic enlarged view for explaining the inspection method for the liquid crystal display panel in the first embodiment of the present invention.

As shown in FIG. 1, the pixel substrate 2 has a plurality of signal electrode wirings 4 extending in the column direction, and the counter substrate 1 has a plurality of scanning electrode wirings 3 extending in the row direction. As shown in FIG. 2, a liquid crystal layer 10 sandwiched between a pair of substrates composed of the pixel substrate 2 and the counter substrate 1 and a seal portion 7 sealing the liquid crystal layer 10 are provided. 1 display panel 21, 2nd display panel 22, 3rd display panel 2
Three display panels No. 3 are connected in the column direction.

Further, the plurality of signal electrode wirings 4 are provided on the signal side inspection electrodes 6 on the pixel substrate 2 at the positions where the signal electrode wirings 4 are overlapped with the seal portion 7 on the opposite side of the driving IC mounting portion 24 for each display panel. Signal side common inspection electrode 9 for connecting and consolidating and further connecting the signal side inspection electrodes 6 for each display panel in series
Are formed on the pixel substrate 2 at positions where they are overlapped with the seal portion 7. On the other hand, as shown in FIGS. 1 and 3, the plurality of scan electrode wirings 3 are provided on the scan side inspection electrodes 5 at positions where they are overlapped with the seal portion 7 on the opposite side of the drive IC mounting portion 25 for each display panel. The scanning side common inspection electrodes 8 which are connected and gathered on the counter substrate 1 and further connected in series with the scanning side inspection electrodes 5 of the respective display panels are located on the extension lines of the scanning side inspection electrodes 5 at the opposite substrate. 1 is formed. In addition, as shown in FIG. 2, one end of the counter substrate 1 and the pixel substrate 2 are arranged so that an inspection voltage can be applied to the scanning side common inspection electrode 8 and the signal side common inspection electrode 9 from the outside in an inspection process. It is formed to be slightly larger than the opposing substrates.

As described above, the scanning side inspection electrodes 5 are passed through the scanning side common inspection electrodes 8 and the signal side common inspection electrodes 9 in a state where the three display panels are connected in the column direction.
Further, by applying a predetermined inspection voltage to each of the plurality of scanning electrode wirings 3 and each of the plurality of signal electrode wirings 4 from the signal side inspection electrode 6 and detecting an abnormality in the display state, a pixel electrode defect or wiring can be obtained. The disconnection defect of (3) is simultaneously inspected for three display panels at once.

Next, as shown in FIG. 4, signal electrode wirings 51 and 5 gathered on the signal side inspection electrode 6 of each display panel.
2, 53, 54, 55, 56, 57, 58, 59, 60
Signal wirings 52, 54, 56, 5
Laser wires are irradiated at the position of the cutting portion 11 to cut every other connection wire 8, 60 and cut. After that, through the scan-side common inspection electrode 8 and the signal-side common inspection electrode 9, from the scan-side inspection electrode 5 and the signal-side inspection electrode 6 to the plurality of scan electrode wirings 3 and the plurality of signal electrode wirings 4, respectively. By applying a predetermined inspection voltage and detecting an abnormal display state, the signal electrode wirings 51, 52, 53, 54, 5
Short-circuit defects between adjacent wirings of 5, 56, 57, 58, 59 and 60 are simultaneously inspected for three display panels at once.

The defect determined to be defective in the above inspection is repaired by irradiating light energy such as laser. afterwards,
All of the connection lines of the plurality of signal electrode wirings 4 gathered on the signal side inspection electrode 6 and the connection lines of the plurality of scanning electrode wirings 3 gathered on the scanning side inspection electrode 5 are irradiated with a laser beam to be cut. To do. As described above, according to this embodiment, the application of the inspection voltage becomes easy and stable, and it is possible to perform the inspection excellent in the inspection accuracy and the inspection efficiency.

A second embodiment of the present invention will be described with reference to the drawings. FIG. 5 is a schematic enlarged view for explaining a method of inspecting a liquid crystal display panel according to the second embodiment of the present invention.
As shown in FIG. 5, the signal side inspection electrode 6a, the signal side common inspection electrode 9a, the scanning side inspection electrode 5a and the scanning side common inspection electrode 8a are provided outside the seal portion 7, and the signal side inspection electrode 6a is driven. This is an example in which the scanning side inspection electrode 5a is provided at a position on the opposite side of the IC mounting portion 24 and at the position on the opposite side of the driving IC mounting portion 25.

Other inspection methods and the like are the same as those in the first embodiment, but the signal side inspection electrode 6 after the inspection is completed.
A part of the connection of the plurality of signal electrode wirings 4 gathered at a and the connection of the plurality of scanning electrode wirings 3 gathered at the scanning side inspection electrodes 5a is 1 without using a laser beam.
Can be separated when cut into individual panels.
Also in this embodiment, it is possible to perform an inspection excellent in inspection accuracy and inspection efficiency as in the first embodiment.

A third embodiment of the present invention will be described with reference to the drawings. FIG. 6 is a schematic enlarged view for explaining a method of inspecting a liquid crystal display panel according to the third embodiment of the present invention.
FIG. 7 is a schematic enlarged view showing a CC cross sectional shape in FIG. 6. FIG. 8 is a schematic enlarged view for explaining a method of inspecting a liquid crystal display panel according to the third embodiment of the present invention.

As shown in FIG. 6, the pixel substrate 2 has a plurality of signal electrode wirings 4 extending in the column direction, and the counter substrate 1 has a plurality of scanning electrode wirings 3 extending in the row direction. As shown in FIG. 7, a liquid crystal layer 10 sandwiched between a pair of substrates consisting of the pixel substrate 2 and the counter substrate 1, and an anisotropic conductive seal 13 sealing the liquid crystal layer 10. The three display panels including the first display panel 21, the second display panel 22, and the third display panel 23 are connected in the column direction.

One end of the plurality of signal electrode wirings 4 is connected to one end of a signal side inspection electrode 6b provided on the counter substrate 1 via the anisotropic conductive seal 13 for each display panel. The other end of the signal side inspection electrode 6b is connected to a plurality of signal electrode wirings 4 of the adjacent display panel via an anisotropic conductive seal 13. Further, the signal electrode wiring 4 of the third display panel 23 is connected to the signal side common inspection electrode 9
b and the pixel substrate 2 are connected and gathered and connected.

As described above, in the state where the three display panels are connected in the column direction, the scanning side common inspection electrode 5 and the signal side common inspection electrode 9b are passed through the scanning side common inspection electrode 8 and the signal side common inspection electrode 9b. By applying a predetermined inspection voltage from 6b to each of the plurality of scan electrode wirings 3 and the plurality of signal electrode wirings 4 and detecting an abnormality in the display state, three pixel electrode defects or wiring disconnection defects are detected. Inspect all the display panels at the same time.

Next, as shown in FIG. 8, the signal electrode wiring 51 concentrated on the signal side inspection electrode 6b of each display panel,
52, 53, 54, 55, 56, 57, 58, 59, 6
The signal electrode wirings 52, 54, 56, 5 among the 0 connection
8 and 60 every other wire is connected to the cutting portion 11a of the counter substrate 1.
Then, a laser beam is applied at the positions of the cutting portion 11b and the cutting portion 11c on the pixel substrate 2 to cut the pixel substrate 2. After that, the scanning side common inspection electrode 8 and the signal side common inspection electrode 9b are passed through, and the scanning side inspection electrode 5 and the signal side inspection electrode 6 are performed.
By applying a predetermined inspection voltage from b to each of the plurality of scan electrode wirings 3 and the plurality of signal electrode wirings 4 and detecting an abnormal display state, the signal electrode wirings 51, 52,
Short-circuit defects between adjacent wirings of 53, 54, 55, 56, 57, 58, 59 and 60 are simultaneously inspected for three display panels at once.

The defect determined to be defective in the above inspection is repaired by irradiating light energy such as laser. afterwards,
All of the plurality of scan electrode wirings 3 concentrated on the scan side inspection electrode 5 are irradiated with a laser beam to be cut.
Furthermore, the connection of the plurality of signal electrode wirings 4 concentrated on the signal side common inspection electrode 9b and the signal side inspection electrode 6b.
The connection of the plurality of signal electrode wirings 4 concentrated in 1 is 1
When cut into individual panels, they can be separated at the cutting portion 26 shown by the broken line in FIG. The signal side inspection electrode 6b on the counter substrate 1 is an anisotropic conductive seal 13
It can also be provided at a position overlapping with, but at this time, it is cut by irradiation with a laser beam.

In the signal side inspection electrode 6b connected to the plurality of signal electrode wirings 4 of each of the first panel and the second panel and the second panel and the third panel, the plurality of signal electrode wirings 4 are connected. Although it is possible to connect them without doing so, even if there is a defect in one panel, the three panels to be connected are detected as defective, so that the embodiment is preferable. Also in this embodiment, it is possible to perform an inspection excellent in inspection accuracy and inspection efficiency as in the first embodiment.

A fourth embodiment of the present invention will be described with reference to the drawings. FIG. 9 is a schematic enlarged view for explaining the inspection method of the liquid crystal display panel in the fourth embodiment of the present invention.
FIG. 10 is a schematic enlarged view showing a DD cross sectional shape in FIG. 9.

As shown in FIGS. 9 and 10, one end of the plurality of scanning electrode wirings 3 is provided on the pixel substrate 2 via the anisotropic conductive seal 13 for each display panel, and the scanning side inspection electrode 5 is provided.
In this example, the scanning side inspection electrode 5b of each display panel is connected in series on the pixel substrate 2 and connected to the scanning side common inspection electrode 8b. Others are connected in the same manner as in the third embodiment.

Regarding the inspection method, as in the third embodiment, the three inspection panels are connected in the column direction, and the inspection is performed through the scanning-side common inspection electrode 8b and the signal-side common inspection electrode 9b. A predetermined inspection voltage is applied from the scanning side inspection electrode 5b and the signal side inspection electrode 6b (not shown) to the plurality of scanning electrode wirings 3 and the plurality of signal electrode wirings 4, respectively, to detect an abnormal display state. By doing so, the defect of the pixel electrode and the disconnection defect of the wiring are simultaneously inspected for the three display panels collectively. The method of inspecting for short circuit defects is also the same as that of the third embodiment.

After completion of the inspection, the connection of the plurality of scan electrode wirings 3 gathered on the scanning side inspection electrode 5b and the connection of the plurality of signal electrode wirings 4 gathered on the signal side common inspection electrode 9b and The signal side inspection electrode 6b (not shown)
The connection of the plurality of signal electrode wirings 4 concentrated in 1 is 1
When cutting into individual panels, it is possible to separate by cutting the portion of the cutting portion 27 shown by the broken line in FIG.

In the above description of the embodiment of the present invention, it has been described that the short circuit inspection is performed after every other connection in the plurality of signal electrode wirings concentrated on the signal side inspection electrode is cut. Similarly, the electrode wiring may be similarly cut every other connection, and the signal electrode wiring and the scanning electrode wiring may be simultaneously tested for short circuit. In addition, although the number of display panels to be connected has been described as an example, the number of display panels to be connected can be freely selected and increased in consideration of manufacturing efficiency and inspection efficiency of the display panel. is there.

In the description of the embodiments of the present invention, the liquid crystal matrix display panel has been described as an example, but the present invention can be applied to the case of the MIM type and TFT type liquid crystal active matrix display panels, and similar effects can be obtained. Particularly, in the first and third embodiments, it is possible to obtain a greater effect by reducing the wasted space of the pixel substrate. The inspection efficiency is the same even when the arrangements of the pixel substrate and the counter substrate of the embodiment of the present invention are exchanged,
The embodiment is preferable from the viewpoint of reducing the wasteful space of the pixel substrate.

[0034]

As described above, according to the present invention,
In an inspection method that is performed in the manufacturing process of a liquid crystal matrix display panel and measures a large number of display panels, a large number of display panels can be inspected simultaneously by providing a signal side common inspection electrode and a scanning side common inspection electrode. The number of connection terminals required in the inspection process can be reduced to two, that is, the signal-side common inspection electrode and the scanning-side common inspection electrode regardless of whether the number of display panels to be connected is increased or decreased. As a result, the voltage application in the inspection process becomes easy and reliable, and the inspection efficiency is improved.

Further, by adopting cutting with a laser beam as a method of releasing the connection between the inspection electrode and a plurality of electrode wirings in every other contactless manner, it becomes possible to inspect a short-circuit defect of the electrode wiring at a higher density, and display Since the panel is inspected after assembly, the inspection accuracy is also improved. Further, the manufacturing efficiency of the pixel substrate is improved by reducing the wasted space generated by cutting off each inspection electrode and each common inspection electrode. In particular, the effect is great in a liquid crystal active matrix display panel in which useless space on the pixel substrate is required to be eliminated. Further, by providing the signal side inspection electrode and the scanning side inspection electrode at positions opposite to the driving IC mounting portion, it is possible to support a liquid crystal matrix display panel adopting the COG method.

[Brief description of the drawings]

FIG. 1 is a schematic enlarged view for explaining an inspection method for a liquid crystal matrix display panel according to a first embodiment of the present invention.

FIG. 2 is a schematic enlarged view showing an AA cross-sectional shape in FIG.

FIG. 3 is a schematic enlarged view showing a BB cross-sectional shape in FIG.

FIG. 4 is a schematic enlarged view for explaining a method of inspecting a liquid crystal matrix display panel according to the first embodiment of the present invention.

FIG. 5 is a schematic enlarged view for explaining a method for inspecting a liquid crystal matrix display panel according to a second embodiment of the present invention.

FIG. 6 is a schematic enlarged view for explaining a method for inspecting a liquid crystal matrix display panel according to a third embodiment of the present invention.

7 is a schematic enlarged view showing a cross-sectional shape taken along line CC in FIG.

FIG. 8 is a schematic enlarged view for explaining a method of inspecting a liquid crystal matrix display panel according to a third embodiment of the present invention.

FIG. 9 is a schematic enlarged view for explaining a method of inspecting a liquid crystal matrix display panel according to a fourth embodiment of the present invention.

FIG. 10 is a schematic enlarged view showing a DD cross sectional shape in FIG.

FIG. 11 is a schematic enlarged view for explaining a method of inspecting a liquid crystal matrix display panel in a conventional example.

FIG. 12 is a schematic enlarged view for explaining a method for inspecting a liquid crystal matrix display panel in a conventional example.

[Explanation of symbols]

 1 Counter Substrate 2 Pixel Substrate 3 Scan Electrode Wiring 4 Signal Electrode Wiring 5 Scanning Side Inspection Electrode 5a Scanning Side Inspection Electrode 5b Scanning Side Inspection Electrode 6 Signal Side Inspection Electrode 6a Signal Side Inspection Electrode 6b Signal Side Inspection Electrode 7 Seal Section 8 Scanning Side Common inspection electrode 8a Scan side common inspection electrode 8b Scan side common inspection electrode 9 Signal side common inspection electrode 9a Signal side common inspection electrode 9b Signal side common inspection electrode 10 Liquid crystal layer 11 Cutting part 11a Cutting part 11b Cutting part 11c Cutting part 13 Different Directional conductive seal 21 1st display panel 22 2nd display panel 23 3rd display panel 24 Driving IC mounting part 25 Driving IC mounting part 26 Cutting part 27 Cutting part 31 Original substrate 32 Original substrate 33 Active matrix substrate 34 Signal side Inspection electrode 35 Scanning side inspection electrode 36 Cut-off portion 37 Inspection voltage application terminal 38a Signal electrode Line 38b Signal electrode wiring 39a Scan electrode wiring 39b Scan electrode wiring 40 Cutting part 51 Signal electrode wiring 52 Signal electrode wiring 54 Signal electrode wiring 55 Signal electrode wiring 56 Signal electrode wiring 57 Signal electrode wiring 58 Signal electrode wiring 59 Signal electrode wiring 60 Signal Electrode wiring

Claims (4)

[Claims] 1. A pixel substrate having a plurality of electrode wirings extending in one direction of a row or a column, an opposite substrate having a plurality of other electrode wirings extending in the other direction, the pixel substrate, and A large number of liquid crystal matrix display panels each including a liquid crystal layer sandwiched between a pair of substrates made of opposed substrates and a seal portion sealing the liquid crystal layer, each of the pair of substrates being one side. A method for inspecting a disconnection defect and a short circuit defect in a multi-connection state in which the plurality of one electrode wirings and the plurality of other electrode wirings are provided for each display panel, and one inspection electrode is provided. And the other inspection electrodes are connected and concentrated, and the one inspection electrode and the other inspection electrode in the plurality of display panels are connected in series, respectively, and one common inspection electrode and the other common inspection electrode are connected. In addition to the inspection electrodes, a predetermined inspection voltage is applied between the two common inspection electrodes to simultaneously inspect a large number of display panels for disconnection defects at the same time, and then they are concentrated on at least one of the inspection electrodes. After disconnecting the connection between the multiple electrode wirings by cutting the wiring with a laser beam and leaving every other one, a predetermined inspection voltage is applied between both common inspection electrodes to inspect for short-circuit defects. Characteristic liquid crystal matrix display panel inspection method. 2. The one inspection electrode, the other inspection electrode, the one common inspection electrode, and the other common inspection electrode are provided at positions at least partially overlapping with the seal portion. Inspection methods. 3. An anisotropic method as a means for connecting at least a part of one inspection electrode, the other inspection electrode, one common inspection electrode and the other common inspection electrode to one electrode wiring or the other electrode wiring. The inspection method according to claim 1, wherein a conductive conductive seal is provided. 4. A plurality of electrode wirings extending in one direction of rows or columns and a plurality of pixel electrodes arranged in a matrix and individually connected to one of the electrode wirings via an active element. A pixel substrate, a counter substrate having a plurality of other electrode wirings extending in the other direction, a liquid crystal layer sandwiched between a pair of the substrate composed of the pixel substrate and the counter substrate, and the liquid crystal layer. A method for inspecting a disconnection defect and a short circuit defect in a large number of liquid crystal matrix display panels each including a sealing part that is sealed in a state where the pair of substrates are connected in one direction. , The plurality of one electrode wirings and the plurality of the other electrode wirings are connected to one inspection electrode and the other inspection electrode, respectively, for each display panel, and are gathered to form a plurality of display electrodes. The one inspection electrode and the other inspection electrode are respectively connected in series to form one common inspection electrode and the other common inspection electrode, and the one inspection electrode, the other inspection electrode, and the one common inspection electrode. Also, at least a part of the other common inspection electrode is provided at a position overlapping the seal portion, and a predetermined inspection voltage is applied between the two common inspection electrodes to collectively detect disconnection defects of a large number of display panels. Then, at the same time, after disconnecting the connection in the multiple electrode wiring that is gathered on at least one of the inspection electrodes by cutting the wiring with a laser beam and leaving it between every two inspection electrodes. A method for inspecting a liquid crystal matrix display panel, which comprises inspecting a short circuit defect by applying a predetermined inspection voltage to the.