JPH0875410A - Reflection illumination device for projection inspection unit - Google Patents
Reflection illumination device for projection inspection unitInfo
- Publication number
- JPH0875410A JPH0875410A JP6235948A JP23594894A JPH0875410A JP H0875410 A JPH0875410 A JP H0875410A JP 6235948 A JP6235948 A JP 6235948A JP 23594894 A JP23594894 A JP 23594894A JP H0875410 A JPH0875410 A JP H0875410A
- Authority
- JP
- Japan
- Prior art keywords
- light source
- light
- projection
- illumination
- reflection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Instruments For Measurement Of Length By Optical Means (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】この発明は、被検物の表面を観察
するための投影検査器の反射照明装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a reflection illumination device of a projection inspection device for observing the surface of an object to be inspected.
【0002】[0002]
【従来の技術】図5は従来の反射照明装置を備えた投影
検査器の正面図である。2. Description of the Related Art FIG. 5 is a front view of a projection inspector equipped with a conventional reflection illumination device.
【0003】反射照明装置は、垂直落射照明装置10
1、対物レンズ117及び照明光源装置100で構成さ
れている。対物レンズ117は、垂直落射照明装置10
1からの光を集光する図示しないコンデンサレンズと、
コンデンサレンズからの光を載物台111上の被検物1
12へ向けてほぼ直角に反射させる図示しないハーフミ
ラーとを内蔵している。The reflection illuminator is a vertical epi-illuminator 10
1, an objective lens 117 and an illumination light source device 100. The objective lens 117 is the vertical epi-illumination device 10.
A condenser lens (not shown) that collects the light from 1.
The light from the condenser lens is used to inspect the object 1 on the stage 111.
It incorporates a half mirror (not shown) that reflects light at a substantially right angle toward 12.
【0004】照明光源装置100は投影検査器本体11
0に外付けされ、光を斜めから被検物112に照射す
る。垂直落射照明装置101からの光はコンデンサレン
ズを介してハーフミラーで反射され、光が被検物112
に真上から照射される。照明光源装置100からの光は
斜め上方から被検物112に直接照射される。被検物1
12からの反射光(散乱光)でスクリーン上に被検物1
12の拡大像が結像される。The illumination light source device 100 is a projection inspection instrument main body 11
0 is attached externally, and light is obliquely applied to the test object 112. The light from the vertical epi-illumination device 101 is reflected by the half mirror via the condenser lens, and the light is reflected on the test object 112.
It is irradiated from right above. The light from the illumination light source device 100 is directly applied to the test object 112 from obliquely above. Object 1
The object to be inspected 1 on the screen by the reflected light (scattered light) from 12
12 magnified images are formed.
【0005】[0005]
【発明が解決しようとする課題】垂直落射照明と斜め照
明とを切り替えて使用するときは、上述のように垂直落
射照明装置101の他に斜め照明専用の照明光源装置1
00(例えば低電圧のハロゲンランプ)を取り付けなけ
ればならず、更にそれに伴い大型のトランスも必要にな
るため、コストが高くなるという問題があった。When the vertical epi-illumination and the oblique illumination are switched and used, in addition to the vertical epi-illumination device 101, the illumination light source device 1 dedicated to the oblique illumination is used as described above.
00 (for example, a low-voltage halogen lamp) must be attached, and a large transformer is required accordingly, which causes a problem of high cost.
【0006】また、照明光源装置100は投影検査器本
体110の周辺に相応の空間を占有することになるの
で、投影検査器を操作する上で障害となるという問題が
あった。例えば、被検物112が大きい場合や、被検物
112を載置台111上に保持するために治具を用いる
場合に、照明光源装置100が障害となる。Further, since the illumination light source device 100 occupies a corresponding space around the main body 110 of the projection inspection device, there is a problem in that it interferes with the operation of the projection inspection device. For example, the illumination light source device 100 becomes an obstacle when the test object 112 is large or when a jig is used to hold the test object 112 on the mounting table 111.
【0007】この発明はこのような事情に鑑みてなされ
たもので、その課題は操作性を損なわせず、しかもコス
トの低減を図ることができる投影検査器の反射照明装置
を提供することである。。The present invention has been made in view of the above circumstances, and an object thereof is to provide a reflection illuminating device for a projection inspection device which does not impair operability and can reduce cost. . .
【0008】[0008]
【課題を解決するための手段】前述の課題を解決するた
め請求項1記載の発明の投影検査器の反射照明装置は、
照明手段と、前記照明手段からの光を被検物へ向けてほ
ぼ直角に反射させるハーフミラーとを備えた投影検査器
の反射照明装置において、前記照明手段からの光が前記
ハーフミラーと前記被検物とに照明できるように、前記
照明手段が投影検査器本体に移動可能に設けられてい
る。In order to solve the above-mentioned problems, the reflection illuminating device of the projection inspection device according to the invention of claim 1 is
In a reflection illuminating device of a projection inspection device, comprising: an illuminating means; and a half mirror that reflects light from the illuminating means toward a test object at a substantially right angle. The illuminating means is movably provided on the projection inspector main body so that the inspection object can be illuminated.
【0009】また、請求項2記載の発明の投影検査器の
反射照明装置は、光源と、前記光源からの光を集光する
集光光学部材と、前記集光光学部材からの光を被検物へ
向けてほぼ直角に反射させるハーフミラーとを備えた投
影検査器の反射照明装置において、前記光源からの光を
前記被検物に対して斜めに直接照射することができるよ
うに、前記集光光学部材を保持するホルダが、投影検査
器本体に回動可能に設けられている。According to a second aspect of the present invention, there is provided a reflection illuminating device for a projection inspector, which comprises a light source, a condensing optical member for condensing the light from the light source, and the light from the condensing optical member for inspection. In a reflection illuminating device of a projection inspecting device, comprising: a half mirror that reflects an object substantially at a right angle, light from the light source can be directly obliquely irradiated to the object to be inspected. A holder for holding the optical optical member is rotatably provided on the main body of the projection inspection device.
【0010】更に、請求項3記載の発明の投影検査器の
反射照明装置は、前記光源が前記ホルダに固定されてい
る。Further, in the reflection illuminating device of the projection inspection apparatus according to the third aspect of the invention, the light source is fixed to the holder.
【0011】また、請求項4記載の発明の投影検査器の
反射照明装置は、前記ホルダを、前記光源からの光を前
記ハーフミラーへ照射させる位置又は前記光源からの光
を前記被検物へ直接照射させる位置に保持する位置保持
機構を備えている。According to a fourth aspect of the present invention, there is provided a reflection illuminating device for a projection inspector, wherein the holder irradiates the half mirror with the light from the light source or the light from the light source to the object to be inspected. It is provided with a position holding mechanism for holding it in a position for direct irradiation.
【0012】更に、請求項5記載の発明の投影検査器の
反射照明装置は、光源と、前記光源からの光を集光する
集光光学部材と、前記集光光学部材からの光を被検物へ
向けてほぼ直角に反射させるハーフミラーとを備えた投
影検査器の反射照明装置において、前記光源からの光を
前記被検物に対して斜めに直接照射することができるよ
うに、前記光源が前記集光光学部材に対して移動可能で
ある。Further, in the reflection illuminating device of the projection inspection device according to the present invention, the light source, the condensing optical member for condensing the light from the light source, and the light from the condensing optical member are inspected. In a reflection illuminating device of a projection inspecting device, which comprises a half mirror for reflecting an object at a substantially right angle, the light source so that the light from the light source can be obliquely directly applied to the object. Are movable with respect to the condensing optical member.
【0013】また、請求項6記載の発明の投影検査器の
反射照明装置は、前記光源を、前記光源からの光を前記
ハーフミラーへ照射させる位置又は前記光源からの光を
前記被検物へ直接照射させる位置に保持する位置保持機
構を備えている。According to a sixth aspect of the present invention, there is provided a reflection illuminating device for a projection inspection apparatus, wherein the light source irradiates the half mirror with the light from the light source or the light from the light source to the object to be inspected. It is provided with a position holding mechanism for holding it in a position for direct irradiation.
【0014】[0014]
【作用】請求項1記載の発明の投影検査器の反射照明装
置では、照明手段からの光が前記ハーフミラーと前記被
検物とに照明できるように、照明手段が投影検査器本体
に移動可能に設けられているので、垂直落射照明と斜め
照明とを切り替えて使用することができ、垂直落射照明
装置の他に斜め照明専用の照明光源装置が不要になる。In the reflection illuminating device of the projection inspecting apparatus according to the present invention, the illuminating means can be moved to the main body of the projection inspecting apparatus so that the light from the illuminating means can illuminate the half mirror and the object to be inspected. Since the vertical epi-illumination and the oblique illumination can be switched and used, the illumination light source device dedicated to the oblique illumination is unnecessary in addition to the vertical epi-illumination device.
【0015】また、請求項2又は3記載の発明の投影検
査器の反射照明装置では、光源と、前記光源からの光を
集光する集光光学部材と、前記集光光学部材からの光を
被検物へ向けてほぼ直角に反射させるハーフミラーとを
備えた投影検査器の反射照明装置において、前記光源か
らの光を前記被検物に対して斜めに直接照射することが
できるように、前記集光光学部材を保持するホルダが、
投影検査器本体に回動可能に設けられているので、ホル
ダを回転させることにより垂直落射照明と斜め照明とを
切り替えることができ、垂直落射照明装置の他に斜め照
明専用の照明光源装置が不要になる。Further, in the reflection illuminating device of the projection inspection apparatus according to the invention of claim 2 or 3, the light source, the condensing optical member for condensing the light from the light source, and the light from the condensing optical member are used. In the reflection illumination device of the projection inspection device, which comprises a half mirror for reflecting at substantially right angles to the object to be inspected, so that the light from the light source can be directly obliquely irradiated to the object to be inspected, A holder for holding the condensing optical member,
Since it is rotatably provided in the projection inspection device main body, it is possible to switch between vertical epi-illumination and oblique illumination by rotating the holder, and there is no need for an illumination light source device dedicated to oblique illumination in addition to the vertical epi-illumination device. become.
【0016】更に、請求項4記載の発明の投影検査器の
反射照明装置では、前記ホルダを、前記光源からの光を
前記ハーフミラーへ照射させる位置又は前記光源からの
光を前記被検物へ直接照射させる位置に保持する位置保
持機構を備えているので、垂直落射照明と斜め照明との
切り替えを容易且つ確実に行うことができる。Further, in the reflection illuminating device of the projection inspection device according to the present invention, the position where the holder irradiates the half mirror with the light from the light source or the light from the light source to the object to be inspected. Since the position holding mechanism for holding the position in the direct irradiation position is provided, the vertical epi-illumination and the oblique illumination can be easily and surely switched.
【0017】また、請求項5記載の発明の投影検査器の
反射照明装置では、光源と、前記光源からの光を集光す
る集光光学部材と、前記集光光学部材からの光を被検物
へ向けてほぼ直角に反射させるハーフミラーとを備えた
投影検査器の反射照明装置において、前記光源からの光
を前記被検物に対して斜めに直接照射することができる
ように、前記光源が前記集光光学部材に対して移動可能
であるので、前記ホルダを駆動する場合に競べ被駆動部
が小さくなり、その結果小さな駆動力で垂直落射照明と
斜め照明とを切り替えることができる。According to a fifth aspect of the present invention, there is provided a reflection illuminating device for a projection inspector, wherein the light source, a condensing optical member for condensing the light from the light source, and the light from the condensing optical member are inspected. In a reflection illuminating device of a projection inspecting device, which comprises a half mirror for reflecting an object at a substantially right angle, the light source so that the light from the light source can be obliquely directly applied to the object. Is movable with respect to the condensing optical member, the driven part becomes smaller when driving the holder, and as a result, vertical epi-illumination and oblique illumination can be switched with a small driving force.
【0018】更に、請求項6記載の発明の投影検査器の
反射照明装置では、前記光源を、前記光源からの光を前
記ハーフミラーへ照射させる位置又は前記光源からの光
を前記被検物へ直接照射させる位置に保持する位置保持
機構を備えているので、垂直落射照明と斜め照明との切
り替えを容易且つ確実に行うことができる。Further, in the reflection illuminating device of the projection inspection apparatus according to the invention as set forth in claim 6, the position where the light source irradiates the half mirror with the light from the light source or the light from the light source to the object to be inspected. Since the position holding mechanism for holding the position in the direct irradiation position is provided, the vertical epi-illumination and the oblique illumination can be easily and surely switched.
【0019】[0019]
【実施例】以下この発明の実施例を図面に基づいて説明
する。Embodiments of the present invention will be described below with reference to the drawings.
【0020】図1はこの発明の第1実施例に係る反射照
明装置を備えた投影検査器の破断面図である。FIG. 1 is a fragmentary sectional view of a projection inspector equipped with a reflection illumination device according to a first embodiment of the present invention.
【0021】投影検査器本体10には照明装置(照明手
段)1が取り付けられている。照明装置1は、コンデン
サレンズ(集光光学部材)2、コンデンサレンズ2を保
持する筒状のホルダ13、ホルダ13に固定された光源
4、及びホルダ13を所定の回転角度位置に保持する位
置決め機構5で構成される。ホルダ13は投影検査器本
体10にヒンジ部材3で回転可能に取り付けられてい
る。位置決め機構5は、一端が投影検査器本体10に固
定されたバネ6と、バネ6の他端に設けられた係合部材
15と、ホルダ13に固定された凸片16の円弧上の側
面の所定位置に形成された凹部16a,16bとで構成
されている。An illumination device (illumination means) 1 is attached to the projection inspector body 10. The illumination device 1 includes a condenser lens (condensing optical member) 2, a cylindrical holder 13 that holds the condenser lens 2, a light source 4 fixed to the holder 13, and a positioning mechanism that holds the holder 13 at a predetermined rotation angle position. It is composed of 5. The holder 13 is rotatably attached to the main body 10 of the projection inspection device by a hinge member 3. The positioning mechanism 5 includes a spring 6 whose one end is fixed to the projection inspector main body 10, an engagement member 15 which is provided at the other end of the spring 6, and an arc-shaped side surface of a convex piece 16 which is fixed to the holder 13. It is composed of concave portions 16a and 16b formed at predetermined positions.
【0022】投影検査器本体10には筒状のホルダ7に
保持された対物レンズ17が取り付けられ、ホルダ7に
は光源4からの光を載物台11上の被検物12へ向けて
ほぼ直角に反射させるハーフミラー9が内蔵されてい
る。An objective lens 17 held by a cylindrical holder 7 is attached to the projection inspector main body 10, and the light from the light source 4 is directed to the holder 7 so as to direct the light from the light source 4 toward an object 12 to be inspected. A half mirror 9 for reflecting at a right angle is built in.
【0023】図1は垂直落射照明状態を示し、位置決め
機構5の係合部材15は凸片16の凹部16aと係合
し、ホルダ13は光源4からの光がコンデンサレンズ2
を介して水平に出射される位置を保持する。コンデンサ
レンズ2を通過した光源4からの光はホルダ7に保持さ
れた補助コンデンサレンズ8を通過し、ハーフミラー9
で被検物12へ向けてほぼ直角に反射される。被検物1
2からの反射光(散乱光)でスクリーン18上に被検物
12の拡大像が結像される。FIG. 1 shows a vertical epi-illumination state in which the engaging member 15 of the positioning mechanism 5 engages with the concave portion 16a of the convex piece 16, and the holder 13 receives the light from the light source 4 as the condenser lens 2.
Holds the position that is emitted horizontally through the. The light from the light source 4 that has passed through the condenser lens 2 passes through the auxiliary condenser lens 8 held by the holder 7, and the half mirror 9
Is reflected at a substantially right angle toward the inspection object 12. Object 1
A magnified image of the test object 12 is formed on the screen 18 by reflected light (scattered light) from 2.
【0024】図1の垂直落射照明状態から、手動又は例
えばモータでヒンジ部材3を回転中心としてホルダ13
を時計方向へ所定角度回転させると、凸片16の凹部1
6aと係合していた係合部材15が外れ、係合部材15
は凸片16の凹部16bと係合し、図2に示すように、
ホルダ13は光源4からの光が直接被検物12に照射さ
れる位置を保持する。すなわち、斜め照明状態になる。From the vertical epi-illumination state of FIG. 1, the holder 13 is rotated manually or with a motor, for example, with the hinge member 3 as the center of rotation.
When is rotated clockwise by a predetermined angle, the concave portion 1 of the convex piece 16 is
6a is disengaged from the engaging member 15 and the engaging member 15
Engages with the concave portion 16b of the convex piece 16, and as shown in FIG.
The holder 13 holds a position where the light from the light source 4 is directly applied to the test object 12. That is, the oblique illumination state is set.
【0025】コンデンサレンズ2を通過した光源4から
の光は直接被検物へ照射され、被検物からの反射光(散
乱光)でスクリーン18上に被検物12の拡大像が結像
される。The light from the light source 4 which has passed through the condenser lens 2 is directly applied to the object to be inspected, and an enlarged image of the object to be inspected 12 is formed on the screen 18 by reflected light (scattered light) from the object to be inspected. It
【0026】この第1実施例の反射照明装置によれば、
照明装置1を垂直落射照明と斜め照明とに切り替えて使
用することができるので、斜め照明専用の照明光源装置
が不要になり、コスト低減を図り得るとともに、投影検
査器の操作上の障害が除去される。According to the reflective illumination device of the first embodiment,
Since the illumination device 1 can be used by switching between vertical epi-illumination and oblique illumination, an illumination light source device dedicated to oblique illumination is unnecessary, cost can be reduced, and obstacles in operation of the projection inspection device can be eliminated. To be done.
【0027】図3はこの発明の第2実施例に係る反射照
明装置を備えた投影検査器の破断面図である。第1実施
例と共通する部分には同一符号を付して説明を省略す
る。FIG. 3 is a sectional view of a projection inspector equipped with a reflective illumination device according to a second embodiment of the present invention. The same parts as those in the first embodiment are designated by the same reference numerals and the description thereof will be omitted.
【0028】この第2実施例では、ホルダ33の回転中
心のヒンジ部材3と同軸の位置に光源4が位置してい
る。光源4は投影検査器本体10に図示しない支持部材
を介して固定されている。ホルダ33を光源4を回転中
心として回転させて、垂直落射照明と斜め照明とを切り
替える。In the second embodiment, the light source 4 is located coaxially with the hinge member 3 about the rotation center of the holder 33. The light source 4 is fixed to the projection inspection device body 10 via a support member (not shown). The holder 33 is rotated about the light source 4 to switch between vertical epi-illumination and oblique illumination.
【0029】この第2実施例の反射照明装置によれば前
述の第1実施例の反射照明装置と同様の効果を得ること
ができるとともに、光源4が固定されているので、光源
4の配線の引き回しが容易であり、配線が繰り返し屈曲
することがなく、配線の耐久性が向上する。According to the reflection lighting device of the second embodiment, the same effect as that of the reflection lighting device of the first embodiment can be obtained, and since the light source 4 is fixed, the wiring of the light source 4 is fixed. Wiring is easy, the wiring does not repeatedly bend, and the durability of the wiring improves.
【0030】図4はこの発明の第3実施例に係る反射照
明装置を備えた投影検査器の破断面図である。第1実施
例と共通する部分には同一符号を付して説明を省略す
る。FIG. 4 is a fragmentary sectional view of a projection inspector equipped with a reflective illumination device according to a third embodiment of the present invention. The same parts as those in the first embodiment are designated by the same reference numerals and the description thereof will be omitted.
【0031】この第3実施例では、ホルダ53が投影検
査器本体30に固定され、光源24が投影検査器本体3
0に図示しない支持部材を介して移動可能に取り付けら
れている。光源24の下部には移動機構18が設けら
れ、光源24を垂直方向へ移動可能である。また、第3
実施例の位置決め機構5では、バネ6の係合部材15が
係合する凹部18a,18bは移動機構18に設けられ
ている。光源24を垂直方向へ移動させて、垂直落射照
明と斜め照明とを切り替える。In this third embodiment, the holder 53 is fixed to the projection inspector body 30, and the light source 24 is in the projection inspector body 3.
0 is movably attached via a support member (not shown). The moving mechanism 18 is provided below the light source 24, and the light source 24 can be moved in the vertical direction. Also, the third
In the positioning mechanism 5 of the embodiment, the moving mechanism 18 is provided with the recesses 18 a and 18 b with which the engaging member 15 of the spring 6 engages. The light source 24 is moved in the vertical direction to switch between vertical epi-illumination and oblique illumination.
【0032】この第2実施例の反射照明装置によれば、
前述の第1実施例の反射照明装置と同様の効果を得るこ
とができるとともに、ホルダ53を動かさず、光源24
を動かして垂直落射照明と斜め照明とを切り替えるよう
にしたので、切替に要する駆動力が少なくてすむ。した
がってモータ駆動の場合には有効である。According to the reflective illumination device of the second embodiment,
It is possible to obtain the same effect as that of the reflection lighting device of the first embodiment described above, and the holder 53 is not moved and the light source 24 is not moved.
Since the vertical epi-illumination and the oblique illumination are switched by moving, the driving force required for switching can be reduced. Therefore, it is effective in the case of motor drive.
【0033】[0033]
【発明の効果】以上説明したようにこの発明の投影検査
器の反射照明装置によれば、垂直落射照明と斜め照明と
を切り替えて使用することができるので、垂直落射照明
装置の他に斜め照明専用の照明光源装置が不要になり、
コスト低減を図り得るとともに、投影検査器の操作上の
障害が除去される。As described above, according to the reflection illuminating device of the projection inspection apparatus of the present invention, it is possible to switch between the vertical epi-illumination and the oblique illumination, so that the oblique illumination besides the vertical epi-illumination device can be used. No need for a dedicated lighting source device,
The cost can be reduced and the operational obstacles of the projection inspector are eliminated.
【0034】また、請求項2又は3記載の発明の投影検
査器の反射照明装置によれば、ホルダを回転させること
により垂直落射照明と斜め照明とを切り替えることがで
きるので、垂直落射照明装置の他に斜め照明専用の照明
光源装置が不要になり、コスト低減を図り得るととも
に、投影検査器の操作上の障害が除去される。Further, according to the reflection illumination device of the projection inspection apparatus of the invention as defined in claim 2 or 3, the vertical epi-illumination and the oblique illumination can be switched by rotating the holder. Besides, an illumination light source device dedicated to oblique illumination is not required, which can reduce the cost and obstruct the operation of the projection inspection device.
【0035】更に、請求項4記載の発明の投影検査器の
反射照明装置によれば、位置保持機構により垂直落射照
明と斜め照明との切り替えを容易且つ確実に行うことが
できる。Further, according to the reflection illuminating device of the projection inspection apparatus of the fourth aspect of the invention, the vertical holding illumination and the oblique illumination can be switched easily and reliably by the position holding mechanism.
【0036】また、請求項5記載の発明の投影検査器の
反射照明装置によれば、ホルダを駆動する場合に競べ被
駆動部が小さくなるので、小さな駆動力で垂直落射照明
と斜め照明とを切り替えることができる。Further, according to the reflection illumination device of the projection inspection apparatus of the present invention as claimed in claim 5, when the holder is driven, the driven portion becomes small, and therefore the vertical incident illumination and the oblique illumination can be performed with a small driving force. Can be switched.
【0037】更に、請求項6記載の発明の投影検査器の
反射照明装置によれば、位置保持機構により垂直落射照
明と斜め照明との切り替えを容易且つ確実に行うことが
できる。Further, according to the reflection illuminating device of the projection inspecting apparatus of the sixth aspect of the invention, the vertical holding illumination and the oblique illumination can be easily and surely switched by the position holding mechanism.
【図1】図1はこの発明の第1実施例に係る反射照明装
置を備えた投影検査器の破断面図である。FIG. 1 is a cross-sectional view of a projection inspection device equipped with a reflective lighting device according to a first embodiment of the present invention.
【図2】図2は図1の反射照明装置の斜め照明状態を示
す拡大図断面図である。FIG. 2 is an enlarged cross-sectional view showing an oblique illumination state of the reflection illumination device of FIG.
【図3】図3はこの発明の第2実施例に係る反射照明装
置を備えた投影検査器の破断面図である。FIG. 3 is a fragmentary sectional view of a projection inspection device equipped with a reflective lighting device according to a second embodiment of the present invention.
【図4】図4はこの発明の第3実施例に係る反射照明装
置を備えた投影検査器の破断面図である。FIG. 4 is a cross-sectional view of a projection inspection device equipped with a reflective lighting device according to a third embodiment of the present invention.
【図5】図5は従来の反射照明装置を備えた投影検査器
の正面図である。FIG. 5 is a front view of a projection inspection device equipped with a conventional reflection illumination device.
1 照明装置 2 コンデンサレンズ 3 ヒンジ部材 4,24 光源 5 位置決め機構 7,13 ホルダ 9 ハーフミラー 10,30 投影検査器本体 12 被検物 17 対物レンズ DESCRIPTION OF SYMBOLS 1 Illumination device 2 Condenser lens 3 Hinge member 4,24 Light source 5 Positioning mechanism 7,13 Holder 9 Half mirror 10,30 Projection inspector main body 12 Test object 17 Objective lens
Claims (6)
させるハーフミラーとを備えた投影検査器の反射照明装
置において、 前記照明手段からの光が前記ハーフミラーと前記被検物
とに照明できるように、前記照明手段が投影検査器本体
に移動可能に設けられていることを特徴とする投影検査
器の反射照明装置。1. A reflection illuminating device of a projection inspection instrument, comprising: an illuminating means; and a half mirror that reflects light from the illuminating means toward an object to be inspected at a substantially right angle. A reflection illumination device for a projection inspection device, wherein the illuminating means is movably provided in a main body of the projection inspection device so that a half mirror and the object to be inspected can be illuminated.
反射させるハーフミラーとを備えた投影検査器の反射照
明装置において、 前記光源からの光を前記被検物に対して斜めに直接照射
することができるように、前記集光光学部材を保持する
ホルダが、投影検査器本体に回動可能に設けられている
ことを特徴とする投影検査器の反射照明装置。2. A projection comprising a light source, a condensing optical member that condenses the light from the light source, and a half mirror that reflects the light from the condensing optical member toward the object at a substantially right angle. In the reflective illuminating device of the inspection device, a holder for holding the condensing optical member is rotated on the projection inspection device main body so that the light from the light source can be obliquely directly applied to the object to be inspected. A reflection illumination device for a projection inspection device, which is provided so as to be possible.
ことを特徴とする請求項2記載の投影検査器の反射照明
装置。3. The reflection illuminator for a projection inspection device according to claim 2, wherein the light source is fixed to the holder.
ハーフミラーへ照射させる位置又は前記光源からの光を
前記被検物へ直接照射させる位置に保持する位置保持機
構を備えていることを特徴とする請求項2又は3記載の
投影検査器の反射照明装置。4. A position holding mechanism for holding the holder at a position where the light from the light source is applied to the half mirror or a position where the light from the light source is directly applied to the test object. The reflection illuminating device of the projection inspection device according to claim 2 or 3.
反射させるハーフミラーとを備えた投影検査器の反射照
明装置において、 前記光源からの光を前記被検物に対して斜めに直接照射
することができるように、前記光源が前記集光光学部材
に対して移動可能であることを特徴とする投影検査器の
反射照明装置。5. A projection comprising a light source, a condensing optical member for condensing light from the light source, and a half mirror for reflecting the light from the condensing optical member toward a test object at a substantially right angle. In the reflective illumination device of the inspection device, the light source is movable with respect to the condensing optical member so that the light from the light source can be obliquely directly irradiated to the object to be inspected. Reflective lighting equipment for projection inspection equipment.
フミラーへ照射させる位置又は前記光源からの光を前記
被検物へ直接照射させる位置に保持する位置保持機構を
備えていることを特徴とする請求項5記載の投影検査器
の反射照明装置。6. A position holding mechanism for holding the light source at a position where the light from the light source is applied to the half mirror or a position where the light from the light source is directly applied to the test object. The reflection illuminating device of the projection inspection device according to claim 5.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6235948A JPH0875410A (en) | 1994-09-05 | 1994-09-05 | Reflection illumination device for projection inspection unit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6235948A JPH0875410A (en) | 1994-09-05 | 1994-09-05 | Reflection illumination device for projection inspection unit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0875410A true JPH0875410A (en) | 1996-03-22 |
Family
ID=16993594
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6235948A Pending JPH0875410A (en) | 1994-09-05 | 1994-09-05 | Reflection illumination device for projection inspection unit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0875410A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100421427B1 (en) * | 2001-01-11 | 2004-03-09 | 한국과학기술원 | High precision displacement gauge and variable displacement measuring method used a unit displacement using conforcal theory |
-
1994
- 1994-09-05 JP JP6235948A patent/JPH0875410A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100421427B1 (en) * | 2001-01-11 | 2004-03-09 | 한국과학기술원 | High precision displacement gauge and variable displacement measuring method used a unit displacement using conforcal theory |
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