JPH0862093A - Device for inspecting light emitting characteristics of lamp - Google Patents
Device for inspecting light emitting characteristics of lampInfo
- Publication number
- JPH0862093A JPH0862093A JP19498394A JP19498394A JPH0862093A JP H0862093 A JPH0862093 A JP H0862093A JP 19498394 A JP19498394 A JP 19498394A JP 19498394 A JP19498394 A JP 19498394A JP H0862093 A JPH0862093 A JP H0862093A
- Authority
- JP
- Japan
- Prior art keywords
- light
- light receiving
- lamp
- holes
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、ランプの発光特性の検
査技術に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a technique for inspecting a light emission characteristic of a lamp.
【0002】[0002]
【従来の技術】従来、ランプの発光特性はランプ個々に
発光光量総量あるいは消費電力を求めて、これを判断指
標としていた。2. Description of the Related Art Conventionally, the light emission characteristics of a lamp have been obtained by obtaining the total amount of emitted light or the power consumption of each lamp and using this as a judgment index.
【0003】[0003]
【発明が解決しようとする課題】しかしながら、例え
ば、ランプを使用する装置の一例として、穀物に含有さ
れる成分の含有率や米の食味値等を分光分析手法で検査
するものがある。このような分光分析装置に使用される
ランプは、その光量レベル、指向特性のばらつきが問題
となる。しかしながら、従来から採用されているランプ
(例えばハロゲンランプ)は、ランプ間で光量レベル、
指向特性のばらつきが大きく、ランプ替えにより測定結
果に影響がでるという問題があった。従って、本発明の
目的は、例えばランプ替えのときでも、同じ特性のラン
プを用いることにより、影響を低減できるように、個々
のランプが備えた光量レベル特性、指向特性を簡易且つ
正確に、検査することができるランプの発光特性検査装
置を得ることにある。However, for example, as an example of a device using a lamp, there is a device for inspecting the content rate of components contained in grains, the taste value of rice, and the like by a spectroscopic analysis method. The lamp used in such a spectroscopic analysis device has a problem in that the light amount level and the directional characteristic vary. However, the conventionally used lamps (for example, halogen lamps) are
There is a problem that the variation of the directional characteristics is large and the measurement result is affected by changing the lamp. Therefore, an object of the present invention is to easily and accurately inspect the light amount level characteristic and the directional characteristic of each lamp so that the influence can be reduced by using the lamp having the same characteristic even when replacing the lamp. It is to obtain a device for inspecting light emission characteristics of a lamp.
【0004】[0004]
【課題を解決するための手段】この目的を達成するため
の本発明によるランプの発光特性検査装置の特徴構成
は、これが、検査対象のランプから照射される照射光を
透過可能な複数の透過孔を備えた仕切り板を、所定の回
転軸芯回りに回転可能に備え、前記仕切り板に対して前
記ランプが配設される側とは反対側の位置に、前記透過
孔を透過してくる前記照射光を受光可能な複数の受光孔
を備えた受光板を、前記仕切り板と同軸に固定して備
え、到達する光量を検出可能な単一の受光素子を備えた
受光部と、前記受光孔に入射する前記照射光を、各別に
前記受光部に導く光導入手段とを備え、前記回転軸芯回
りの前記仕切り板と前記受光板との相対回転位置関係を
検出する回転位置検出手段を備え、前記仕切り板に備え
られる前記複数の透過孔と前記受光板に備えられる前記
複数の受光孔とが、夫々対応する板上で、前記回転軸芯
に直角な二次元平面内に二次元的に分散して配置される
とともに、前記透過孔と前記受光孔との相対位置関係に
おいて、任意の回転姿勢夫々で、前記回転軸芯に沿った
方向において特定単一の前記透過孔と対応する特定単一
の前記受光孔のみが互いに重なる位置関係に配設されて
いることにあり、その作用・効果は次の通りである。In order to achieve this object, a characteristic structure of an apparatus for inspecting light emission characteristics of a lamp according to the present invention is that it has a plurality of transmission holes capable of transmitting irradiation light emitted from a lamp to be inspected. A partition plate provided with rotatably around a predetermined axis of rotation, at a position opposite to the side where the lamp is arranged with respect to the partition plate, at a position opposite to the transmission hole. A light-receiving portion having a plurality of light-receiving holes capable of receiving irradiation light, fixedly provided coaxially with the partition plate, having a single light-receiving element capable of detecting the amount of light reaching, and the light-receiving hole. And a rotation position detecting means for detecting a relative rotation positional relationship between the partition plate around the rotation axis and the light receiving plate. , The plurality of transmissions provided in the partition plate And the plurality of light-receiving holes provided in the light-receiving plate are arranged two-dimensionally in a two-dimensional plane perpendicular to the rotation axis on the corresponding plates, and the transmission holes and In a relative positional relationship with the light receiving hole, only a specific single light receiving hole corresponding to the specific single transmission hole and a specific single light receiving hole in a direction along the axis of rotation are placed in a positional relationship in which they are overlapped with each other. It is arranged, and its action and effect are as follows.
【0005】[0005]
【作用】つまり、ランプの発光特性の検査にあたって
は、ランプが仕切り板の前方側(受光板とは反対側)に
配設されて、検査がおこなわれる。この状態において、
ランプから照射される光は、仕切り板に到達するととも
に、この板に備えられる複数の透過孔を透過して受光板
に到達する。ここで、受光板に到達する光は複数の透過
孔を突き抜けた光であるが、透過孔と受光孔との回転軸
芯に沿った位置関係により、特定単一の受光孔のみに光
(これは、前記受光孔に対応する特定単一の透過孔を通
過した光)が到達可能となっている。そして、この光が
光導入手段により受光部に導かれて、受光素子で検出さ
れる。一方、仕切り板と受光板との相対回転位置関係
は、回転位置検出手段により検出される。従って、受光
部で受光される光量と、仕切り板と受光板との相対回転
位置関係とを同時的に検出すると、相対回転位置関係と
受光状態にある受光孔との位置対応を取ることにより、
受光孔がある特定点における光量特性を得ることができ
る。そして、仕切り板を順次回転させながら、この操作
を繰り返すことにより、回転軸芯に対して概直角な二次
元平面上におけるランプの発光特性及び指向特性を検出
することができる。ここで、例えば、多数の受光素子を
二次元的に配列したセンサを、ランプに対して配設し、
このセンサ(多数の受光素子)の出力より、ランプの発
光特性、指向特性を検査することも考えられるが、この
場合、センサに備えられる各受光素子の特性が異なりや
すく、得られるランプ特性に信頼性が無いという問題を
生じることとなるが、本願においては、受光部に配設さ
れる受光素子は単一であり、全ての受光孔に対して共通
となるため、このような問題を生じることはない。In other words, when inspecting the light emission characteristics of the lamp, the lamp is disposed on the front side of the partition plate (the side opposite to the light receiving plate) and the inspection is performed. In this state,
The light emitted from the lamp reaches the partition plate, and also passes through the plurality of transmission holes provided in the plate to reach the light receiving plate. Here, the light reaching the light-receiving plate is light that has penetrated through the plurality of transmission holes, but due to the positional relationship between the transmission holes and the light-receiving holes along the axis of rotation, light is transmitted to only a specific single light-receiving hole (this Is capable of reaching light that has passed through a specific single transmission hole corresponding to the light receiving hole. Then, this light is guided to the light receiving portion by the light introducing means and detected by the light receiving element. On the other hand, the relative rotational positional relationship between the partition plate and the light receiving plate is detected by the rotational position detecting means. Therefore, when the amount of light received by the light receiving unit and the relative rotational position relationship between the partition plate and the light receiving plate are detected simultaneously, the relative rotational position relationship and the position of the light receiving hole in the light receiving state are taken into account,
It is possible to obtain the light amount characteristic at a specific point where the light receiving hole is present. Then, by repeating this operation while sequentially rotating the partition plate, it is possible to detect the light emission characteristic and the directional characteristic of the lamp on the two-dimensional plane substantially orthogonal to the axis of rotation. Here, for example, a sensor in which a large number of light receiving elements are two-dimensionally arranged is provided for the lamp,
It is possible to inspect the light emission characteristics and directional characteristics of the lamp from the output of this sensor (many light receiving elements), but in this case, the characteristics of each light receiving element included in the sensor are likely to differ, and the obtained lamp characteristics are reliable. However, in the present application, there is a single light-receiving element provided in the light-receiving portion, and the light-receiving element is common to all the light-receiving holes, which causes such a problem. There is no.
【0006】[0006]
【発明の効果】従って、例えばランプ替えのときでも、
同じ特性のランプを用いることにより、影響を低減でき
るように、個々のランプが備えた光量レベル特性、指向
特性を簡易且つ正確に、検査することができるランプの
発光特性検査装置を得ることができた。従って全光量の
評価、消費電力に基づいてランプの評価を行って、ラン
プの交換をおこなうよりも、さらに特性の似通ったラン
プを選択できるようになった。結果、ランプを分光分析
装置に使用する場合においても、ランプ交換による分析
値の評価をより信頼性のあるものとすることができるよ
うになる。Therefore, even when changing the lamp, for example,
By using lamps having the same characteristics, it is possible to obtain a lamp emission characteristic inspection device capable of easily and accurately inspecting the light amount level characteristic and the directional characteristic of each lamp so that the influence can be reduced. It was Therefore, it becomes possible to select a lamp having similar characteristics rather than replacing the lamp by evaluating the total light amount and the lamp based on the power consumption. As a result, even when the lamp is used in the spectroscopic analysis device, the evaluation of the analysis value by replacing the lamp can be made more reliable.
【0007】[0007]
【実施例】本願の実施例を図面に基づいて説明する。図
1には、本願のランプの発光特性検査装置1の側面視図
が、図2には、ランプ2側から見た装置1に備えられる
仕切り板3の状態が示されている。図1・図2に示すよ
うに、装置1は、検査対象のランプ2から照射される照
射光を透過可能な複数の透過孔4を備えた仕切り板3
と、この仕切り板3に対してランプ2が配設される側と
は反対側の位置に、前記透過孔4を透過してくる照射光
を受光可能な複数の受光孔5を備えた受光板6とを備え
て構成されている。前述の仕切り板3は、回転装置7か
ら延出される回転軸8に連結された構成とされ、受光板
6は、この回転軸8に対して同軸に構成されているが、
固定構成(回転しない)とされている。従って、仕切り
板3と受光板6とは、同軸に構成されるとともに、前者
3のみが所定の回転軸芯A回りに回転可能とされてい
る。Embodiments of the present application will be described with reference to the drawings. FIG. 1 is a side view of a lamp light emission characteristic inspection device 1 of the present application, and FIG. 2 shows a state of a partition plate 3 provided in the device 1 as viewed from the lamp 2 side. As shown in FIGS. 1 and 2, the device 1 includes a partition plate 3 having a plurality of transmission holes 4 capable of transmitting the irradiation light emitted from the lamp 2 to be inspected.
And a light receiving plate having a plurality of light receiving holes 5 at the position opposite to the side where the lamp 2 is arranged with respect to the partition plate 3 and capable of receiving the irradiation light transmitted through the transmission hole 4. 6 is provided. The partition plate 3 described above is configured to be connected to the rotary shaft 8 extended from the rotating device 7, and the light receiving plate 6 is configured to be coaxial with the rotary shaft 8.
It has a fixed configuration (does not rotate). Therefore, the partition plate 3 and the light receiving plate 6 are configured coaxially, and only the former 3 is rotatable about a predetermined rotation axis A.
【0008】前記仕切り板3に備えられる前記複数の透
過孔4と、前記受光板6に備えられる前記複数の受光孔
5との配設関係について説明すると、これらの孔4、5
は、前記回転軸芯Aに直角な二次元平面内である夫々対
応する板3、6上に、二次元的に分散して配置されると
ともに、前記透過孔4と前記受光孔5との相対位置関係
において、任意の回転姿勢で、前記回転軸芯A沿った方
向において特定単一の前記透過孔4aと特定単一の前記
受光孔5aのみが互いに重なる位置関係に設定されてい
る。図2に示す破線丸が、受光板6に備えられる複数の
受光孔5の配置構成を示しており、受光孔5は放射状に
分散された径方向位置で、中心軸側から外周部位に向か
って適当な密度で分散配置されている。同図において、
中心軸側から二段目と三段目の孔は、二段目のものが周
方向で一個飛ばしとなっている。一方、仕切り板3に配
設される透過孔4の配置状態を同図に示す実線丸で示し
ている。この孔4は特定単一の径方向のみに、所定の間
隔で周方向にシフトされて配設されている。同図2にお
いては、中心軸側から同図上方に二段目に位置する透過
孔4aと受光孔5aとの位置のみが合致している。この
合致する特定の孔は、仕切り板の回転に伴って、その位
置を異にする。The arrangement relationship between the plurality of transmission holes 4 provided in the partition plate 3 and the plurality of light receiving holes 5 provided in the light receiving plate 6 will be described below.
Are arranged two-dimensionally on the corresponding plates 3 and 6 in a two-dimensional plane perpendicular to the rotation axis A, and the relative distance between the transmission hole 4 and the light receiving hole 5 is In the positional relationship, only a specific single transmission hole 4a and a specific single light receiving hole 5a are set to overlap each other in an arbitrary rotation posture in a direction along the rotation axis A. The broken line circles shown in FIG. 2 indicate the arrangement configuration of the plurality of light receiving holes 5 provided in the light receiving plate 6. The light receiving holes 5 are radially distributed radial positions from the central axis side toward the outer peripheral portion. It is distributed at an appropriate density. In the figure,
Regarding the holes on the second and third stages from the central axis side, one on the second stage is skipped in the circumferential direction. On the other hand, the arrangement state of the transmission holes 4 arranged in the partition plate 3 is shown by a solid line circle shown in FIG. The holes 4 are circumferentially shifted and arranged at predetermined intervals only in a specific single radial direction. In FIG. 2, only the positions of the transmission hole 4a and the light receiving hole 5a, which are located in the second stage from the central axis side to the upper side of FIG. The matching specific holes are different in position as the partition plate rotates.
【0009】さらに、この装置には、単一の受光素子9
を備えた受光部10が備えられ、この受光素子9により
受光部10に到達する光量が検出可能である。そして、
前述の受光板6に備えられる複数の受光孔5と前記受光
部10とは、夫々、個別に光ファイバー11で接続され
ている。従って、前記受光孔5に受光される照射光は、
各別に光ファイバー11で構成される光導入手段によっ
て受光部10に導かれて、受光素子9により到達する光
量が検出される。In addition, this device includes a single light receiving element 9
The light receiving section 10 having the above is provided, and the light receiving element 9 can detect the amount of light reaching the light receiving section 10. And
The plurality of light receiving holes 5 provided in the light receiving plate 6 and the light receiving section 10 are individually connected by the optical fiber 11. Therefore, the irradiation light received by the light receiving hole 5 is
The amount of light that is guided to the light receiving unit 10 by the light introducing unit composed of the optical fiber 11 and is reached by the light receiving element 9 is detected.
【0010】前記回転軸芯A回りの前記仕切り板3と前
記受光板6との相対回転位置関係を検出する回転位置検
出手段12が備えられ、仕切り板3と受光板6との相対
回転位置関係が検出可能となっている。さらに、前記回
転位置検出手段12により検出される仕切り板3の回転
位置(回転角度)と、前記受光部10で得られる素子出
力とから、予め記憶されている回転位置関係に対応する
前記透過孔4と前記受光孔5とが軸方向で一致する特定
単一の孔の組み合わせ位置(これは実質上、特定単一の
受光孔5の位置)と、前記素子出力との対応を取って、
ランプに発光特性を導出する演算処理手段(実質上はコ
ンピュータ)13が備えられている。即ち、図3に示す
ように、回転軸芯Aに対して直交する二次元平面(X−
Y平面)内における光量分布が導出される。Rotational position detecting means 12 for detecting the relative rotational positional relationship between the partition plate 3 and the light receiving plate 6 around the rotation axis A is provided, and the relative rotational positional relationship between the partition plate 3 and the light receiving plate 6 is provided. Can be detected. Further, from the rotational position (rotation angle) of the partition plate 3 detected by the rotational position detection means 12 and the element output obtained by the light receiving unit 10, the transmission hole corresponding to the rotational position relationship stored in advance. 4 and the light receiving hole 5 correspond to the combined position of the specific single holes (this is substantially the position of the specific single light receiving hole 5) in the axial direction, and the element output,
An arithmetic processing unit (substantially a computer) 13 for deriving the light emission characteristic of the lamp is provided. That is, as shown in FIG. 3, a two-dimensional plane (X-
The light amount distribution in the Y plane) is derived.
【0011】以下、この装置1の作動について説明す
る。ランプ2に発光特性の検査にあたっては、前述の回
転装置7の働きにより、仕切り板3が所定のタイミング
で回転操作される。そして、この回転状態にあって、上
記の回転位置検出手段12により、受光板6に対する仕
切り板3の相対回転位置関係が検出される。上述のよう
に、特定任意の回転姿勢において、回転軸8に沿った方
向で透過孔4と受光孔5とが位置的に並ぶ組み合わせ
は、単一しかないため、前記相対回転位置関係が検出さ
れると、受光部10で素子9が検出している光の位置が
特定される。そして、前述の演算処理手段13が回転軸
8に直角な二次元平面上での受光量分布をランプ2の発
光特性として導出する。この出力の例を、図3に示し
た。図3は、前記二次元平面(X−Y平面)上で、夫々
光量が同一となる等高線を表している。さらに、このよ
うな発光特性としては、二次元的な位置座標とその座標
上における光量を表す数値を、数値表としても出力す
る。結果、例えば、従来から分光分析装置に使用されて
きたランプの発光特性と似通ったランプを選択して、装
置に使用することにより、信頼性の高い検出を行えるよ
うになった。The operation of the device 1 will be described below. When inspecting the emission characteristics of the lamp 2, the partition plate 3 is rotated at a predetermined timing by the operation of the rotating device 7 described above. Then, in this rotating state, the relative rotational position relationship of the partition plate 3 with respect to the light receiving plate 6 is detected by the rotational position detecting means 12 described above. As described above, since there is only one combination in which the transmission hole 4 and the light receiving hole 5 are lined up in the direction along the rotation axis 8 in a specific arbitrary rotational posture, the relative rotational positional relationship is detected. Then, the position of the light detected by the element 9 in the light receiving unit 10 is specified. Then, the above-mentioned arithmetic processing means 13 derives the received light amount distribution on the two-dimensional plane perpendicular to the rotation axis 8 as the light emission characteristic of the lamp 2. An example of this output is shown in FIG. FIG. 3 shows contour lines having the same light amount on the two-dimensional plane (XY plane). Further, as such a light emission characteristic, two-dimensional position coordinates and numerical values representing the light amount on the coordinates are also output as a numerical table. As a result, for example, it is possible to perform highly reliable detection by selecting a lamp that is similar to the emission characteristics of a lamp that has been conventionally used in a spectroscopic analysis device and using it in the device.
【0012】〔別実施例〕上記の実施例においては、受
光部に受光素子を設けることにより、二次元的な光量分
布を求めて発光特性の特定に役立てたが、前記受光部に
凹面回折格子、プリズム等を備えるとともに、これらの
ものにより分光された分光光をアレイ型受光素子(上記
の実施例の受光素子9に対応する)で受光する構成とす
ると、ランプの発光特性を指向性のみならず波長特性の
面からも評価可能となる。この構成を取ると、分光分析
装置側でランプを選択する場合に、光量、指向性、分光
特性の面で似通ったランプを選択的に採用して、例えば
分光分析装置を良好に働かせることができる。さらに上
記の発光特性検査装置においては、演算処理手段を備え
て、受光部で検出している光の位置(実質上は受光孔の
位置)と受光光量との関係を自動的に対応付けを行った
が、これは、例えば受光孔位置を示す表等を用意してお
き、回転位置検出手段によって検出される位置に従っ
て、受光孔の位置を特定し、対応付けて、発光特性表と
して操作者が作成できるようにしておいてもよい。[Other Embodiments] In the above embodiment, the light receiving element is provided in the light receiving portion to obtain the two-dimensional light amount distribution to help identify the light emission characteristics. When the array type light receiving element (corresponding to the light receiving element 9 in the above embodiment) is used to receive the spectral light dispersed by these elements and the prism, the light emission characteristics of the lamp are not limited to directivity. Instead, it can be evaluated in terms of wavelength characteristics. With this configuration, when a lamp is selected on the spectroscopic analysis device side, a lamp similar in light amount, directivity, and spectroscopic characteristics can be selectively used, and for example, the spectroscopic analysis device can work well. . Further, in the above-mentioned light emission characteristic inspection device, a calculation processing means is provided, and the relationship between the position of the light detected by the light receiving portion (substantially the position of the light receiving hole) and the received light amount is automatically associated. However, for this, for example, a table showing the positions of the light receiving holes is prepared, and the positions of the light receiving holes are specified according to the positions detected by the rotational position detecting means, and the positions are associated with each other, so that the operator can use them as a light emission characteristic table. You may be able to create it.
【0013】尚、特許請求の範囲の項に図面との対照を
便利にするために符号を記すが、該記入により本発明は
添付図面の構成に限定されるものではない。It should be noted that reference numerals are given in the claims for convenience of comparison with the drawings, but the present invention is not limited to the configurations of the accompanying drawings by the entry.
【図1】ランプの発光特性検査装置の側面視図FIG. 1 is a side view of a lamp emission characteristic inspection device.
【図2】ランプ側から見た仕切り板の状態を示す図FIG. 2 is a diagram showing a state of a partition plate viewed from the lamp side.
【図3】ランプの発光特性の検査結果を示す図FIG. 3 is a diagram showing inspection results of light emission characteristics of a lamp.
2 ランプ 3 仕切り板 4 透過孔 5 受光孔 6 受光板 9 受光素子 10 受光部 11 光導入手段 12 回転位置検出手段 A 回転軸芯 2 Lamp 3 Partition plate 4 Transmission hole 5 Light receiving hole 6 Light receiving plate 9 Light receiving element 10 Light receiving part 11 Light introducing means 12 Rotation position detecting means A Rotation axis core
Claims (1)
照射光を透過可能な複数の透過孔(4)を備えた仕切り
板(3)を、所定の回転軸芯(A)回りに回転可能に備
え、 前記仕切り板(3)に対して前記ランプ(2)が配設さ
れる側とは反対側の位置に、前記透過孔(4)を透過し
てくる前記照射光を受光可能な複数の受光孔(5)を備
えた受光板(6)を、前記仕切り板(3)と同軸に固定
して備え、 到達する光量を検出可能な単一の受光素子(9)を備え
た受光部(10)と、前記受光孔(5)に入射する前記
照射光を、各別に前記受光部(10)に導く光導入手段
(11)とを備え、 前記回転軸芯(A)回りの前記仕切り板(3)と前記受
光板(6)との相対回転位置関係を検出する回転位置検
出手段(12)を備え、 前記仕切り板(3)に備えられる前記複数の透過孔
(4)と前記受光板(6)に備えられる前記複数の受光
孔(5)とが、夫々対応する板上で、前記回転軸芯
(A)に直角な二次元平面内で二次元的に分散して配置
されるとともに、前記透過孔(4)と前記受光孔(5)
との相対位置関係において、任意の回転姿勢夫々で、前
記回転軸芯(A)に沿った方向において特定単一の前記
透過孔と対応する特定単一の前記受光孔のみが互いに重
なる位置関係に配設されているランプの発光特性検査装
置。1. A partition plate (3) having a plurality of transmission holes (4) capable of transmitting irradiation light emitted from a lamp (2) to be inspected is rotated around a predetermined rotation axis (A). It is possible to receive the irradiation light transmitted through the transmission hole (4) at a position opposite to the side where the lamp (2) is arranged with respect to the partition plate (3). A light receiving plate (6) having a plurality of light receiving holes (5) fixedly provided coaxially with the partition plate (3), and having a single light receiving element (9) capable of detecting the amount of light reaching it. A part (10) and a light introducing means (11) for individually guiding the irradiation light incident on the light receiving hole (5) to the light receiving part (10), and the light source around the rotation axis (A). The partition plate (3) is provided with a rotational position detecting means (12) for detecting a relative rotational position relationship between the light receiving plate (6), The plurality of transmission holes (4) provided in (3) and the plurality of light receiving holes (5) provided in the light receiving plate (6) are provided on the corresponding rotary plate cores (A) on their corresponding plates. The transmission holes (4) and the light receiving holes (5) are arranged in a two-dimensional plane at right angles so as to be dispersed two-dimensionally.
In a relative positional relationship with the above, the positional relationship in which only the specific single light receiving hole corresponding to the specific single transmission hole in the direction along the rotation axis (A) overlaps each other in any rotational postures A device for inspecting the emission characteristics of the lamps installed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6194983A JP3041201B2 (en) | 1994-08-19 | 1994-08-19 | Lamp light emission characteristic inspection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6194983A JP3041201B2 (en) | 1994-08-19 | 1994-08-19 | Lamp light emission characteristic inspection device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0862093A true JPH0862093A (en) | 1996-03-08 |
JP3041201B2 JP3041201B2 (en) | 2000-05-15 |
Family
ID=16333594
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6194983A Expired - Lifetime JP3041201B2 (en) | 1994-08-19 | 1994-08-19 | Lamp light emission characteristic inspection device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3041201B2 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101039652B1 (en) | 2010-03-22 | 2011-06-09 | 엘지이노텍 주식회사 | Method for moving test apparatus of light emitting diode lamp |
US8705023B2 (en) | 2010-03-22 | 2014-04-22 | Lg Innotek Co., Ltd. | Testing apparatus and method for testing light emitting diode lamp |
KR101020489B1 (en) | 2010-03-22 | 2011-03-09 | 엘지이노텍 주식회사 | Apparatus and method for testing light emitting diode lamp |
-
1994
- 1994-08-19 JP JP6194983A patent/JP3041201B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP3041201B2 (en) | 2000-05-15 |
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