JPH0836191A - Display device, method for inspecting display device and inspection apparatus - Google Patents

Display device, method for inspecting display device and inspection apparatus

Info

Publication number
JPH0836191A
JPH0836191A JP6169650A JP16965094A JPH0836191A JP H0836191 A JPH0836191 A JP H0836191A JP 6169650 A JP6169650 A JP 6169650A JP 16965094 A JP16965094 A JP 16965094A JP H0836191 A JPH0836191 A JP H0836191A
Authority
JP
Japan
Prior art keywords
terminal
display device
substrate
terminal electrode
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6169650A
Other languages
Japanese (ja)
Inventor
Osamu Yamashita
修 山下
Masanori Tamura
雅則 田村
Atsunori Inamura
篤紀 稲村
Kazutoshi Tabuchi
一十志 田渕
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Sanyo Electric Co Ltd
Sanyo Electric Co Ltd
Original Assignee
Tokyo Sanyo Electric Co Ltd
Tottori Sanyo Electric Co Ltd
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Sanyo Electric Co Ltd, Tottori Sanyo Electric Co Ltd, Sanyo Electric Co Ltd filed Critical Tokyo Sanyo Electric Co Ltd
Priority to JP6169650A priority Critical patent/JPH0836191A/en
Publication of JPH0836191A publication Critical patent/JPH0836191A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/321Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/36Assembling printed circuits with other printed circuits
    • H05K3/361Assembling flexible printed circuits with other printed circuits

Landscapes

  • Liquid Crystal (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To enable stable inspection of terminal junctures at a high speed by forming the terminal electrodes of a display as laminates of transparent electrodes and metallic films and providing these terminal electrodes with the exposed parts of the transparent electrodes. CONSTITUTION:A substrate 11 consists of a glass substrate and the terminal electrodes 12 consist of the transparent electrodes of an indium system. The terminal electrodes 12 may be provided with the metallic thin films consisting of single materials, such as gold, nickel, aluminum and chromium or their alloys on the transparent electrodes in addition to the transparent electrodes alone at need. Anisotropic conductive adhesives 3 held between the substrate 11 and driving substrate 2 of the display 1 consist of adhesives 32 into which conductive particles 31 are incorporated. The conductive particles 31 in the conductive adhesives 3 existing between the terminal parts 12 and 22 are crushed in such a manner that the particle shapes have the shapes larger than the outside shapes of the particles before use by pressurizing the substrate 11, 24, by which connection is effected. Whether the connecting condition is good or not is judged by viewing through the junctures of the display device or stereoscopically observing the junctures to this terminal electrodes.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はいわゆる異方性導電接着
剤を用いた、とりわけ100〜40μmピッチのファイ
ンパターン多数端子の接続に好適な、表示装置及び表示
装置の検査方法並びに表示装置の検査装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention uses a so-called anisotropic conductive adhesive, and is particularly suitable for connecting a large number of fine pattern terminals having a pitch of 100 to 40 .mu.m. Regarding the device.

【0002】[0002]

【従来の技術】近年液晶表示器などの基板を利用した表
示器においては、その表示器の駆動素子を接続するに当
って表示器基板の端子電極と駆動基板の端子部を異方性
導電接着剤で接続しており、それは例えば特開昭53−
35194号公報や特開平3−96921号公報などに
開示されている。
2. Description of the Related Art In recent years, in a display device using a substrate such as a liquid crystal display device, when connecting a drive element of the display device, a terminal electrode of the display substrate and a terminal portion of the drive substrate are anisotropically conductively bonded. They are connected by a chemical agent, which is disclosed in, for example, Japanese Patent Laid-Open No. 53-
It is disclosed in Japanese Patent No. 35194, Japanese Patent Laid-Open No. 3-96921, and the like.

【0003】係る表示装置においては表示密度が高くな
るにしたがって端子数と端子密度が高くなり、それに伴
って接続不良を生じることが多くなった。そこでこの様
子を検討した結果、特開平5−273571号公報に示
されるように、導電粒子は端子接続部において略円形状
で接しており、接続不良部分においては点接触もしくは
非接触の粒子が多数存在し、これによって接触抵抗が大
きくなっていることが判明した。そして導電粒子が溶解
するほどの高い温度で加圧すれば接触面積は多くなるが
表示基板の電極などが損傷したり、液晶などの表示媒体
が劣化し、また十分大きな圧力で加圧すると導電粒子が
粉砕され、むしろ接触不良が多くなることも分かった。
そこでこのような検討結果を基に、100〜70μmピ
ッチのファインパターン端子の接続に使用可能な異方性
導電接着剤とその加圧/加熱の条件が検討され、実用化
されつつある。
In such a display device, as the display density increases, the number of terminals and the terminal density also increase, which often causes connection failure. Therefore, as a result of studying this state, as shown in Japanese Patent Laid-Open No. 5-273571, the conductive particles are in contact with each other in a substantially circular shape at the terminal connection portion, and a large number of particles are point-contacted or non-contacted in the connection failure portion. It was found that this increased contact resistance. If the pressure is high enough to dissolve the conductive particles, the contact area will increase, but the electrodes of the display substrate will be damaged and the display medium such as liquid crystal will deteriorate. It was also found that the powder was crushed, and the poor contact was rather increased.
Therefore, based on the results of such studies, anisotropic conductive adhesives that can be used for connection of fine pattern terminals having a pitch of 100 to 70 μm and conditions for pressurization / heating thereof have been studied and are being put into practical use.

【0004】[0004]

【発明が解決しようとする課題】ところがこのような駆
動素子付き表示器においては、接続不良があると目立つ
ので接続作業後に検査する必要がある。つまり、表示器
においては表示内容を判読しようとして画面を注視する
ので、通常では見逃しがちな数十μmの幅の電極1本で
も点灯不良があると、その部分に視線が集まって画面全
体の品位を著しく低いものとされてしまう。
However, in such a display device with a driving element, it is conspicuous that there is a poor connection, and it is necessary to inspect it after the connection work. In other words, since the display gazes at the screen in an attempt to decipher the display contents, if even one electrode with a width of several tens of μm, which is usually overlooked, has a lighting failure, the line of sight will gather at that part and the quality of the entire screen will be degraded. Will be markedly low.

【0005】そこで接続作業終了後に接続状態の検査が
必要となるが、肉眼では幅の広いものを一度に目視検査
し易く、例えば120μmピッチで端子数が1360
本、A4版程度の表示装置に1枚に対して、2分以内で
検査できる。しかし100μmよりも精細なピッチにな
ると拡大鏡を使っても目視検査は困難である。そこで自
動的に検査しようとすると、端子部分の幅が約1500
μm、使用する異方性導電接着剤中の導電粒子が8〜4
μmと桁が異なり過ぎ視野と分解能のバランスが取り難
く、また画像認識の速度は一般に1画面0.2秒程度と
長いので、表示装置の複数の端縁部を走査し検査すると
単純計算でも5分以上を必要とし不都合である。また駆
動素子の端子部と表示器の端子電極は概ね材料が異な
り、両者の積層部が異方性導電接着剤とどういう関係に
あれば接続良好と判断してよいかが不明瞭であった。
Therefore, it is necessary to inspect the connection state after the connection work is completed, but it is easy to visually inspect a wide one at a time with the naked eye. For example, the number of terminals is 1360 at a pitch of 120 μm.
One sheet can be inspected within 2 minutes for a book or A4 size display device. However, if the pitch is finer than 100 μm, visual inspection is difficult even with a magnifying glass. When I tried to inspect it automatically, the width of the terminal part was about 1500.
μm, the conductive particles in the anisotropic conductive adhesive used are 8 to 4
Since the digit is different from μm, it is difficult to balance the field of view and the resolution, and the speed of image recognition is generally as long as about 0.2 seconds per screen. It takes more than a minute and is inconvenient. In addition, the terminal portion of the driving element and the terminal electrode of the display are made of different materials, and it was unclear what the relationship between the laminated portion of the driving element and the anisotropic conductive adhesive should be if the connection is good.

【0006】[0006]

【課題を解決するための手段】本発明は上述の点を考慮
して、基板上に端子電極を有する表示器と、駆動素子に
接続された端子部を有する駆動基板と、表示器の端子電
極と駆動素子の端子部との間に位置し導電粒子を含んだ
異方性導電接着剤とを有する接続部分の検査を対象とし
て成されたものである。
In view of the above points, the present invention has an indicator having a terminal electrode on a substrate, a driving substrate having a terminal portion connected to a driving element, and a terminal electrode of the indicator. And an anisotropic conductive adhesive containing conductive particles, which is located between the drive device and the terminal portion of the drive element.

【0007】まず本発明は、表示装置の接続部を透視も
しくは立体観察することにより、少なくとも接続部の輪
郭または外形を認識することで接続状況の良否を判断す
るものであり、またはその端子接続部を整列方向に向か
って駆動基板毎に走査し接続部の映像を受像する受像手
段と、受像した映像から少なくとも端子電極部分に位置
する導電粒子の輪郭処理を行って接続の良否を判断する
ものであり、更には、表示器の端子電極と駆動素子の端
子部との間に位置し粒子外形が使用前の粒子外形よりも
大きい導電粒子を複数含んでいることを接続良否判定の
基準とした表示装置の検査方法にある。
First, the present invention is to judge the quality of the connection status by observing at least the contour or outer shape of the connection portion by observing or stereoscopically observing the connection portion of the display device, or its terminal connection portion. An image receiving unit that scans each drive substrate in the alignment direction to receive an image of the connection portion, and a contour processing of the conductive particles located at least at the terminal electrode portion from the received image to determine the quality of the connection. Yes, moreover, an indication based on the connection quality judgment that a plurality of conductive particles located between the terminal electrode of the display and the terminal portion of the driving element and having a particle outer shape larger than the particle outer shape before use are included It is in the inspection method of the device.

【0008】次いで本発明は、その端子接続部に落射照
明を与える照明手段と、端子接続部の映像を受像する受
像手段と、受像した映像から輪郭認識をし、端子電極の
損傷と端子電極部分に位置する導電粒子の数もしくは面
積等を演算する処理手段とを有したものであり、または
その端子接続部を整列方向に向かって互いに異なる観察
領域の大きさで走査し接続部の映像を受像する複数の受
像手段と、受像した映像から少なくとも端子電極部分に
位置する導電粒子の数もしくは面積等を演算する処理手
段とを有したものであり、あるいはまた、その端子接続
部を整列方向に向かって端子電極の異なる観察領域を対
象として走査し接続部の映像を受像する複数の受像手段
と、受像した映像から少なくとも端子電極部分に位置す
る導電粒子の数もしくは面積等を演算する処理手段とを
有し表示装置の検査装置である。
Next, according to the present invention, an illuminating means for giving an epi-illumination to the terminal connecting portion, an image receiving means for receiving an image of the terminal connecting portion, a contour recognition from the received image, damage of the terminal electrode and a terminal electrode portion. And a processing means for calculating the number or area of the conductive particles located at, or the terminal connection portion is scanned in different observation region sizes in the alignment direction to receive the image of the connection portion. A plurality of image receiving means and a processing means for calculating at least the number or area of the conductive particles located in the terminal electrode portion from the received image, or the terminal connecting portion is directed in the alignment direction. A plurality of image receiving means for scanning the observation areas of the terminal electrodes different from each other and receiving the image of the connection portion, and the number of conductive particles located at least in the terminal electrode portion from the received image. Ku is the inspection device for a display device and a processing means for calculating the area and the like.

【0009】本発明は、また、その端子接続部を整列方
向に向かって表示面に近い観察領域のみ走査し接続部の
映像を受像する受像手段と、受像した映像から少なくと
も端子電極部分に位置する導電粒子の数もしくは面積等
を演算する処理手段とを有した表示装置の検査装置であ
り、又は端子接続部の映像を受像する受像手段と、受像
した映像の輝度信号もしくは色信号に基づいて端子電極
の損傷の判定または端子電極部分に位置する導電粒子の
数もしくは面積等を演算する処理手段とを有した装置で
あり、または、その端子接続部の1つの駆動基板に対す
る複数の個所に同軸落射照明を行う照明手段と、その照
明された端子接続部を駆動基板毎に走査し接続部の映像
を受像する受像手段と、受像した映像から少なくとも端
子電極部分に位置する導電粒子の数もしくは面積等を演
算する処理手段とを有した表示装置の検査装置である。
According to the present invention, an image receiving means for receiving the image of the connecting portion by scanning the terminal connecting portion only in the observation area near the display surface in the alignment direction, and at least the terminal electrode portion from the received image. An inspection device for a display device having a processing means for calculating the number or area of conductive particles, or an image receiving means for receiving an image of a terminal connecting portion, and a terminal based on a luminance signal or a color signal of the received image. A device having a processing means for judging the damage of the electrode or for calculating the number or area of the conductive particles located at the terminal electrode portion, or the device having the terminal connection portion coaxially radiated onto a plurality of positions with respect to one drive substrate. Illuminating means for illuminating, image receiving means for scanning the illuminated terminal connecting portion for each drive substrate and receiving an image of the connecting portion, and a position of at least a terminal electrode portion from the received image An inspection device for a display device having a processing means for calculating the number or area of Rushirubeden particles.

【0010】そしてまた本発明は、その表示装置の第1
の端子電極部分を特定しワークエリアに搬送する搬送手
段と、そのワークエリアにおいてその端子接続部に落射
照明を与える照明手段と、照明手段の照明を受けて端子
接続部の映像を受像する受像手段と、ワークエリアの表
示装置を反転させて他の端子電極部分を特定しワークエ
リアに搬送する反転手段と、受像した映像から輪郭認識
をし、端子電極の損傷と端子電極部分に位置する導電粒
子の数もしくは面積等を演算する処理手段とを有する
か、もしくは、その表示装置の表裏からその端子接続部
を照明する照明手段と、端子接続部において、透明な前
記基板側からの照明を選択する照明選択手段と、照明手
段の照明を受けて端子接続部の映像を受像する受像手段
と、受像した映像から輪郭認識をし、端子電極の損傷と
端子電極部分に位置する導電粒子の数もしくは面積等を
演算する処理手段とを有したものである。
The present invention also provides a first display device thereof.
Means for specifying the terminal electrode portion of the terminal and conveying it to the work area, illuminating means for giving epi-illumination to the terminal connecting part in the work area, and image receiving means for receiving the image of the terminal connecting part upon receiving the illumination of the illuminating means. And a reversing means for reversing the display device in the work area to identify the other terminal electrode portion and transporting it to the work area, and contour recognition from the received image, damage to the terminal electrode and conductive particles located in the terminal electrode portion. Or a lighting means for illuminating the terminal connection part from the front and back of the display device and a transparent lighting from the substrate side in the terminal connection part. Illumination selecting means, image receiving means for receiving the image of the terminal connection portion by receiving the illumination of the illuminating means, contour recognition from the received image, damage to the terminal electrode and position on the terminal electrode portion It is obtained and a processing means for calculating the number or area of Rushirubeden particles.

【0011】また本発明はこれらの検査に当って、表示
器の端子電極は、透明電極と金属膜の積層体からなり、
透明電極の露出部分を設けたもので、その露出部分を駆
動基板毎に設けた場合には、その端子接続部を整列方向
に向かって駆動基板毎に走査し、駆動基板毎に予め設け
られた端子電極の金属膜除去部分より透明電極からなる
接続部の映像を受像する受像手段と、受像した映像から
導電粒子の輪郭処理を行う処理手段とを設けた表示装置
の検出装置を提供するものである。
According to the present invention, in these inspections, the terminal electrode of the display is made of a laminated body of a transparent electrode and a metal film,
When the exposed portion of the transparent electrode is provided, and the exposed portion is provided for each drive substrate, the terminal connection portion is scanned for each drive substrate in the alignment direction and is provided in advance for each drive substrate. To provide a detection device for a display device provided with image receiving means for receiving an image of a connection portion composed of a transparent electrode from a portion where a metal film is removed from a terminal electrode, and processing means for carrying out contour processing of conductive particles from the received image. is there.

【0012】[0012]

【作用】これにより端子接続部での接続状態が受像、演
算処理によって判断することができ、全数検査において
も抜き取り検査においても極めて効率よく検査すること
ができる。
As a result, the connection state at the terminal connection portion can be judged by the image reception and arithmetic processing, and the inspection can be performed very efficiently in both the 100% inspection and the sampling inspection.

【0013】[0013]

【実施例】図1は本発明実施例の表示装置の要部平面図
であり、図2はそのA−A断面図であり、図3は、いわ
ゆる異方性導電接着剤の中の粒子の説明図である。図に
おいて、1は基板11上に端子電極12を有する表示器
で、液晶表示器を例示しており、基板11はガラス基
板、端子電極12はインジウム系透明電極からなる。そ
してこの端子電極12はこの様な透明電極のみのほか、
必要に応じて、その透明電極の上に金、ニッケル、アル
ミニウム、クロム等の単一材料若しくは合金からなる金
属薄膜を設けてもよい。
FIG. 1 is a plan view of a main part of a display device according to an embodiment of the present invention, FIG. 2 is a sectional view taken along line AA, and FIG. 3 shows particles in a so-called anisotropic conductive adhesive. FIG. In the figure, reference numeral 1 denotes a display having a terminal electrode 12 on a substrate 11, which is an example of a liquid crystal display. The substrate 11 is a glass substrate and the terminal electrode 12 is an indium-based transparent electrode. And this terminal electrode 12 is not only such a transparent electrode,
If necessary, a metal thin film made of a single material such as gold, nickel, aluminum, or chromium or an alloy may be provided on the transparent electrode.

【0014】2は、駆動素子21に接続された端子部2
2を有する駆動基板で、銅、錫鍍金銅などからなる薄膜
状のリード箔23を表面に有する、ポリイミドシート等
の可撓性基板24を用いた、いわゆるテープオートメー
ティッドボンディングの駆動基板であるがこれに限られ
るものではなく、例えば駆動素子を複数個載置した長尺
な基板であってもよいし、これらの基板を顧問配線基板
25で支持・配線しておいてもよい。またこの端子部2
2は可撓性基板24に裏打ちされているが、リード箔2
3の端子部22の部分や折曲げを行う部分においては、
可撓性基板24を除去したり、可撓性基板24にスリッ
トを設けていてもよい。
Reference numeral 2 is a terminal portion 2 connected to the driving element 21.
2, which is a drive substrate for so-called tape automated bonding using a flexible substrate 24 such as a polyimide sheet having a thin film lead foil 23 made of copper, tin-plated copper or the like on its surface. The present invention is not limited to this, and may be, for example, a long substrate on which a plurality of driving elements are mounted, or these substrates may be supported and wired by the advisory wiring substrate 25. Also, this terminal part 2
2 is lined with a flexible substrate 24, but the lead foil 2
In the portion of the terminal portion 22 of 3 and the portion to be bent,
The flexible substrate 24 may be removed or the flexible substrate 24 may be provided with a slit.

【0015】3は、表示器1の基板11と駆動基板2の
間に挟まれた異方性導電接着剤で、導電粒子31が混入
された接着剤32からなり、例えばエポキシ樹脂SEB
S樹脂混合物のような半熱硬化性樹脂、もしくはポリエ
ステル系、ポリアミド・エポキシ系の樹脂が利用でき、
また導電粒子31としては、直径が2〜10μmの、表
面を金属鍍金されたポリスチレン、ABS等の導電性樹
脂ビーズのもの、もしくは半田、スズ、金、クロムなど
の金属粒子を単独もしくは混合して用いることができ
る。これらの導電粒子31は接着剤32にできるだけ均
一に分散されていることが望ましい。
An anisotropic conductive adhesive 3 is sandwiched between the substrate 11 of the display 1 and the drive substrate 2, and is composed of an adhesive 32 in which conductive particles 31 are mixed. For example, an epoxy resin SEB is used.
Semi-thermosetting resin such as S resin mixture, polyester type, polyamide / epoxy type resin can be used,
As the conductive particles 31, conductive resin beads such as polystyrene and ABS having a diameter of 2 to 10 μm and having a surface plated with metal, or metal particles such as solder, tin, gold, and chrome are used alone or mixed. Can be used. It is desirable that these conductive particles 31 are dispersed in the adhesive 32 as uniformly as possible.

【0016】そしてこの基板11、24を加圧すること
により、端子部12、22との間に位置する導電性接着
剤3の中の導電粒子31が、その粒子形状が使用前の粒
子外形よりも大きい形をなすようにつぶされて接続を行
っている。この場合の粒子形状は、加圧が少ないと図3
aの斜線部に示される様に点接触となる。また加圧が多
すぎると同図cに示されるように導電粒子が粉砕され
る。従って導電粒子31の粒子形状が使用前の粒子外形
よりも大きい形をなすように、一部亀裂が入ることによ
り外周が一回り大きくなり、同図bの如く、いわゆる蓮
の葉状の投影面形状が得られるようにして接続を行うの
が最も好ましい。図3に従ってロット当りの接続不良を
説明すると、70μmピッチの端子部に直径5μmの導
電粒子を使用する場合において、aの状態では接触部分
の直径が概ね2μm以下となり不良率50〜95%、b
の状態で5〜20μmの接触面積で1〜20%、cの状
態で0〜1μmで60〜100%であった。
By pressing the substrates 11 and 24, the conductive particles 31 in the conductive adhesive 3 located between the terminals 12 and 22 have a particle shape smaller than that of the particle shape before use. It is crushed to make a big shape and connected. The particle shape in this case is as shown in FIG.
As shown by the hatched portion of a, point contact occurs. If the pressure is too much, the conductive particles are crushed as shown in FIG. Therefore, the outer circumference of the conductive particle 31 is enlarged by a partial crack so that the particle shape of the conductive particle 31 becomes larger than the particle shape before use. As shown in FIG. Most preferably, the connection is made so that The defective connection per lot will be described with reference to FIG.
In the state of 1 to 20% at a contact area of 5 to 20 μm, and in the state of c, 60 to 100% at 0 to 1 μm.

【0017】このような端子接続部に対して、本発明で
は表示装置の接続部を透視もしくは立体観察することに
より、少なくとも接続部の輪郭または外形を認識するこ
とで接続状況の良否を判断するものである。以下本発明
を具体的に説明する。
According to the present invention, the quality of the connection state is judged by observing at least the contour or the outer shape of the connection portion by observing the connection portion of the display device with respect to such a terminal connection portion. Is. The present invention will be specifically described below.

【0018】図4は、本発明実施例の表示装置の検査装
置の平面図で、表示装置Dの供給マガジン51、作業台
50、良品排出マガジン53、不良品排出マガジン54
を有している。そしてハンガー55は供給マガジン51
から2枚の基板11の各々の端縁部に端子電極12を有
する表示器1と、駆動素子21に接続された端子部22
を有する駆動基板2とを、異方性導電接着剤3で接続し
た表示装置Dを、第1の基板に設けられたセグメント側
の端子電極部分を特定しワークエリア52に搬送する搬
送手段であり、ハンガー56はワークエリア52の表示
装置Dを反転させて他の端子電極部分である第2の基板
に設けられたコモン側の端子電極部分を特定しワークエ
リア52に搬送する反転手段で、ハンガー57は検査の
終了した表示装置Dを、判定結果に基づいて排出マガジ
ン53、54に送り出すものであり、いずれもいわゆる
移載ロボットアームで構成されている。このワークエリ
ア52は例えば透明な無反射ステージを有する移動量
X、Yとも300〜600mmのXYテーブルを有して
いる。
FIG. 4 is a plan view of an inspection device for a display device according to an embodiment of the present invention. The display device D has a supply magazine 51, a workbench 50, a non-defective product ejection magazine 53, and a defective product ejection magazine 54.
have. And the hanger 55 is the supply magazine 51.
To the display 1 having the terminal electrodes 12 on the respective edge portions of the two substrates 11 and the terminal portion 22 connected to the driving element 21.
And a drive substrate 2 having a drive substrate 2 connected by an anisotropic conductive adhesive 3 is a transporting unit that transports to a work area 52 by identifying a segment-side terminal electrode portion provided on the first substrate. The hanger 56 is a reversing means for reversing the display device D in the work area 52 to identify the common-side terminal electrode portion provided on the second substrate, which is another terminal electrode portion, and conveys it to the work area 52. Reference numeral 57 denotes a display device D that has been inspected, and sends it out to the ejection magazines 53 and 54 based on the determination result, both of which are so-called transfer robot arms. The work area 52 has, for example, an XY table having a movement amount X and Y of 300 to 600 mm having a transparent non-reflection stage.

【0019】6はそのワークエリア52において同軸の
落射照明を行う照明手段で、例えばハロゲンランプを光
源にし、コンデンサレンズやプリズムにより同軸光を得
ており、必要に応じて表示装置Dの表・裏面から照明す
ることができ、その切り替えや強度調整が可能となって
いる。この場合、基板11の内面露出部分である個所に
設けられた端子電極12を上側に向け駆動基板2を接続
し、そのまま表示装置Dを搬送してくると、セグメント
部ではワークエリア52の裏向きに基板1、表向きに駆
動基板2が位置することとなる。これを不必要に触れな
いでそのままの状態で検査するのが好ましく、裏面側に
基板11がくるように表示装置Dをワークエリアに載置
し、裏面からの落射照明を強くし、表面からの照明を無
くするか弱くして端子接続部をモニターするのが好まし
い。そして表面からの照明を同軸光にする必要がない場
合もあるが、表示装置Dはセグメント側が上を向いて取
りつけられていればコモン側は別の基板に下向きに設け
られているので、後述するように、反転手段56を用い
ないで、端子接続部において、基板がどちら向きに置か
れていても基板側からの照明を選択する照明選択手段を
設け、端子接続部の映像を受像することもできる。
Reference numeral 6 denotes an illumination means for performing coaxial epi-illumination in the work area 52. For example, a halogen lamp is used as a light source, and coaxial light is obtained by a condenser lens or a prism. It is possible to illuminate from, and it is possible to switch and adjust the intensity. In this case, when the drive substrate 2 is connected with the terminal electrode 12 provided at a portion that is an exposed portion of the inner surface of the substrate 11 facing upward, and the display device D is conveyed as it is, the segment portion faces down the work area 52. The substrate 1 and the drive substrate 2 face up. It is preferable to inspect it as it is without touching it unnecessarily. The display device D is placed in the work area so that the substrate 11 is on the back surface side, the epi-illumination from the back surface is strengthened, and It is preferable to turn off or turn off the lighting to monitor the terminal connections. In some cases, it is not necessary to use illumination from the surface as coaxial light. However, if the display device D is mounted with the segment side facing upward, the common side is provided downward on another substrate, which will be described later. As described above, without using the reversing unit 56, it is possible to provide an illumination selecting unit that selects the illumination from the substrate side in the terminal connecting unit regardless of the orientation of the substrate in order to receive the image of the terminal connecting unit. it can.

【0020】7は、照明手段6の照明を受けて端子接続
部の映像を受像する受像手段で、光学顕微鏡とCCD内
蔵モニターカメラ及びモニターテレビからなり、好まし
くはカメラ即ち撮像部を落射照明の平行光線を最も受光
しやすい同軸上に設置しておき、モニターテレビは不要
としてもよい。カメラは例えばモノクロ256階調、6
20×540画素、データ保存用メモリ付きのものを用
いる事ができる。このような仕様でなく、階調無しのス
レシホールド可変型2値モニターでもよいし、後述する
ようにカラーモニターを用いてもよい。8は、受像手段
7で受像した映像から輪郭認識をし、端子電極の損傷と
端子電極部分に位置する導電粒子の数もしくは面積等を
演算する処理手段で、16ビットCPUと画像認識シス
テムを搭載した高速画像処理装置である。この処理手段
は、より好ましくは、あらかじめ定められた各判定項目
毎の判定基準にしたがって検査している表示装置Dを判
定し、その判定結果に基づいて排出マガジン53,54
に表示装置Dを排出する様ハンガー57に制御信号を出
力する。また同様に、マガジンやその他のハンガーある
いはXYテーブルや受像手段に対する制御も、処理手段
8で行ってもよく、検査装置全体を制御する制御手段を
別途設けてもよい。
Reference numeral 7 is an image receiving means for receiving the image of the terminal connection portion upon receiving the illumination of the illumination means 6, and comprises an optical microscope, a monitor camera with a built-in CCD and a monitor television, and preferably the camera, that is, the image capturing portion, is parallel to the epi-illumination. It may be installed on the same axis where the light rays are most easily received, and the monitor TV may be unnecessary. The camera has, for example, monochrome 256 gradations and 6
It is possible to use one having 20 × 540 pixels and a memory for storing data. Instead of such specifications, a threshold variable binary monitor without gradation may be used, or a color monitor may be used as described later. Reference numeral 8 is a processing means for recognizing the contour from the image received by the image receiving means 7 and calculating the damage of the terminal electrode and the number or area of the conductive particles located in the terminal electrode portion, which is equipped with a 16-bit CPU and an image recognition system. It is a high-speed image processing device. More preferably, the processing means determines the display device D being inspected according to a predetermined determination criterion for each determination item, and discharge magazines 53, 54 based on the determination result.
Then, a control signal is output to the hanger 57 so that the display device D is discharged. Similarly, the processing means 8 may control the magazine or other hangers, the XY table, or the image receiving means, or a control means for controlling the entire inspection apparatus may be separately provided.

【0021】このような構成の表示装置の検出装置にお
いて、照明手段と判定基準がプリセットされている場合
の標準的な動作手順を説明する。まず供給マガジン51
の搬送に基づき、ハンガー55は表示装置のセグメント
側端子接続部分が中央に位置するようにワークエリア5
2に表示装置Dをセットする。次いで受像手段7の映像
に基づいてまたは別途設けた位置合わせ用カメラを用い
て、表示装置にあらかじめ設けた位置合わせ用ターゲッ
トマークを認識して、表示装置Dの位置合わせを行う。
このようなターゲットマークは、例えば表示器の基板1
1の端子電極12の列の端部に、透明電極などを利用し
た四角形やモザイクバターンで形成すればよい。次いで
受像手段7で端子電極パターンや端子部パターン(以後
リードパターンということもある)を撮像し、そこで得
られたCCDの映像信号を処理手段8に送る。この時の
映像は、例えば図5に示すように、端子電極12と端子
部22と導電粒子31が異なるトーンで表示される。処
理手段8はこの映像信号を基に輪郭処理を行いリードパ
ターンを抽出する。これにより例えば図6に示すよう
に、リードパターン輪郭の損傷(イ)や、端子電極に密
着しこれからはみ出した導電粒子固まり(ロ)も輪郭処
理によって現れるので、電極損傷や隣接端子との短絡も
判定することが可能である。
In the detection device of the display device having such a configuration, a standard operation procedure when the illumination means and the determination standard are preset will be described. First, supply magazine 51
On the basis of the transportation of the hanger 55, the hanger 55 moves the work area 5 so that the segment-side terminal connection portion of the display device is located at the center.
The display device D is set to 2. Then, based on the image of the image receiving means 7 or using a separately provided alignment camera, the alignment target mark previously provided in the display device is recognized to align the display device D.
Such a target mark is, for example, the substrate 1 of the display.
It may be formed at the end of the row of one terminal electrode 12 by a square or a mosaic pattern using a transparent electrode or the like. Then, the image receiving means 7 captures an image of the terminal electrode pattern or the terminal portion pattern (hereinafter also referred to as a lead pattern), and the image signal of the CCD obtained there is sent to the processing means 8. In the image at this time, for example, as shown in FIG. 5, the terminal electrode 12, the terminal portion 22, and the conductive particles 31 are displayed in different tones. The processing means 8 performs contour processing based on this video signal to extract a lead pattern. As a result, for example, as shown in FIG. 6, the lead pattern contour damage (a) and conductive particle clusters (b) that adhere to the terminal electrodes and stick out from the lead electrodes also appear due to the contour processing, so electrode damage and short-circuit with adjacent terminals are also prevented. It is possible to judge.

【0022】リードパターンの抽出が終わった後は、パ
ターンずれ検査、気泡有無検査、導電粒子接合度検査、
異物かみこみ検査、端子接合度検査などを行い、そのつ
ど、若しくはその検査終了後に総合的に、接続の良否判
定を行う。これらの検査並びに判定においては、映像を
階調処理できる場合、その輝度信号の強さの相対比較に
よって行うことができ、これが自動的に行い難い場合で
も、テストサンプルをもって端子、気泡、導電粒子外
形、導電粒子接合部などの濃度階調と背景濃度を与えた
り、ニューラルネットワークを用いていくつかのテスト
サンプルを基に処理手段8に学習させることで、照明手
段6の条件毎にこれらを判定させることができる。
After the lead patterns have been extracted, a pattern shift inspection, a bubble presence / absence inspection, a conductive particle bonding degree inspection,
A foreign matter biting inspection, a terminal bonding degree inspection, and the like are performed, and each time, or after the inspection is completed, a comprehensive determination of connection quality is performed. In these inspections and judgments, if the image can be gradation processed, it can be performed by relative comparison of the intensity of the luminance signal. Even if it is difficult to do this automatically, with the test sample, the terminals, bubbles, conductive particle outlines , By giving density gradation and background density of the conductive particle joint or the like, or by making the processing means 8 learn based on some test samples using a neural network, these are judged for each condition of the lighting means 6. be able to.

【0023】また、受像手段7としてモノクロ256階
調のもので説明したが、カラーモニターを用いて検査判
断するとより好ましい。この場合、例えば電極のない部
分は薄い茶色、端子電極(透明電極)のある部分は明る
い灰色若しくは黒、端子部は白っぽい薄茶色、導電端子
はつぶれたものは輪郭が金色で全体が白、つぶれていな
いものは黒点または白点等、照明手段6の光の当て方や
照度によってかなり色合いに差が出るものの、物質によ
って積層されていても明白に識別できる。従って処理手
段8に於ては、この色合いや明度を考慮し、各部材を受
像した映像の輝度信号もしくは色信号に基づいて識別
し、より好ましくは輪郭処理し、識別にしたがって端子
電極の損傷の判定または端子電極部分に位置する導電粒
子の数もしくは面積等を演算することにより、接続状態
の良否が判定できることとなる。
Although the image receiving means 7 has a monochrome 256 gradations, it is more preferable to make an inspection judgment using a color monitor. In this case, for example, the part without electrodes is light brown, the part with terminal electrodes (transparent electrodes) is light gray or black, the terminal part is whitish light brown, and the crushed conductive terminals have a golden outline and are white and crushed. Those that do not exist have a considerable difference in color tone depending on the way of illuminating the illumination means 6 and the illuminance, such as black spots or white spots, but they can be clearly identified even if they are laminated depending on the substance. Therefore, in the processing means 8, in consideration of the hue and lightness, each member is identified based on the luminance signal or the color signal of the image received, and more preferably the contour processing is performed, and the damage of the terminal electrode is performed according to the identification. The quality of the connection state can be determined by the determination or by calculating the number or area of the conductive particles located in the terminal electrode portion.

【0024】またこの場合、画素毎に濃度分布を直接判
定させ当該領域を検査決定する方法と、輪郭処理を行っ
て当該領域の検査決定する場合があり、いずれの場合で
も比較的正確な判定を導くことができる。しかし図7に
示すように、導電粒子はその姿が一様の濃さ若しくは色
合いで受像できるわけではない。そこで、濃度差に基づ
いて輪郭判定した後、判定濃度差レベルを変化させなが
ら先に判定した輪郭を延長するように物体の輪郭を補足
推定するなどの、輪郭処理をするほうが正解確率が高か
った。また導電粒子と接続状態の検査においては、少な
くとも端子電極部分に位置する導電粒子の数もしくは面
積を基にして、一定粒子数若しくは一定累積面積以上を
接続の良否判定の基準とするのが接続状態を正しく認定
できるので好ましい。いいかえると、その包絡線の長
さ、もしくは閉曲線により囲まれた画素数等を数値解析
しながら一つ一つの導電粒子の接続面積を演算し、端子
接続部に複数の導電粒子が存在するので、包絡線長さ、
面積などに予め閾値を設けておき、閾値を越えた導電粒
子の数、総面積、周囲長などが所定の範囲内であれば接
続良好と見做してもよい。またこの様な接続演算におい
て、気泡面積は接続不良要因として加えて判断すればよ
り好ましい。
Further, in this case, there are a method of directly determining the density distribution for each pixel to inspect and determine the area, and a method of performing contour processing to inspect and determine the area. In either case, a relatively accurate determination can be made. I can guide you. However, as shown in FIG. 7, the conductive particles cannot receive an image with a uniform density or color. Therefore, after the contour judgment based on the density difference, the contour processing has a higher correct answer probability, such as supplementary estimation of the contour of the object so as to extend the previously judged contour while changing the judgment density difference level. . In addition, in the inspection of the connection state with the conductive particles, the connection state is based on the number or area of the conductive particles located at least in the terminal electrode portion, and a certain number of particles or a certain cumulative area or more is used as a criterion for connection quality. Is preferable because it can be correctly certified. In other words, the connection area of each conductive particle is calculated while numerically analyzing the length of the envelope, or the number of pixels surrounded by the closed curve, etc., so that there are multiple conductive particles in the terminal connection part. Envelope length,
A threshold may be set in advance for the area and the like, and the connection may be regarded as good if the number of conductive particles exceeding the threshold, the total area, the perimeter, etc. are within predetermined ranges. In addition, in such a connection calculation, it is more preferable that the bubble area is additionally determined as a factor of poor connection.

【0025】しかし、図3で説明した内容を基に、表示
器の端子電極と駆動素子の端子部との間に位置し粒子外
形が使用前の粒子外形よりも大きい導電粒子を所定の数
または面積に対して複数含んでいか否かを基にして接続
の良否判定の基準とすると、概括的ではあるがそれ程の
判断誤りもなく、検査判定の速度が高くなって好まし
い。そして、その包絡線の長さ、もしくは閉曲線により
囲まれた画素数等を数値解析しながら面積を計算し予め
統計を取っておき、蓮の葉状の歪な形になれば接続良好
というような方法も可能である。
However, based on the contents described with reference to FIG. 3, a predetermined number of conductive particles located between the terminal electrode of the display and the terminal portion of the driving element and having a particle shape larger than that of the particle shape before use are used. It is preferable to use a criterion for connection quality judgment based on whether or not a plurality of areas are included, because it is general, but there are no such judgment errors and the inspection judgment speed is high. Then, the area can be calculated in advance by numerically analyzing the length of the envelope or the number of pixels surrounded by a closed curve, and if the lotus-leaf-like distorted shape is used, a good connection method is also possible. Is.

【0026】さてこの様な検査判定において、接続部の
透視若しくは立体観察を行う場合、駆動基板2のリード
箔23は銅とかニッケル、クロムなどの金属であるか
ら、基板11と端子電極12が透明であれば、その基板
11側から同軸落射照明することによりその観察が正確
に行える。従って、表示器1の対向する辺にセグメント
端子電極、直交する他の辺にコモン端子電極を各々有し
ている場合、これらの端子電極12は基本的に2枚の積
層された電極の各々の対向する内面に設けられるもので
あるから、例えば図1において、右側にある縦方向配列
の電極端子や駆動素子がセグメント側であれば紙面の裏
側から観察し、図の下側のもの(端子接続部は基板の裏
側になって表示されていない)はコモン側になるのでこ
れは紙面の表側から観察するのが好ましい。このため例
えば一方の端子電極部分を検査した後は、前述のワーク
エリア52の表示装置Dを反転させて他の端子電極部分
特定しワークエリア52に搬送する反転手段56で検査
するのが最も好ましい。この様な反転手段56を用いな
いとすれば、同軸の落射照明を表示装置Dの表・裏面か
ら照明するように構成し、その切り替えや強度調整を可
能とする照明選択手段を設け、透明な基板側から照明を
行うこととし、端子接続部の映像を受像すればよい。こ
の場合CCDは表裏面の照明筒に組み込み、その信号を
一つのモニター部に導いてもよい。
In the above inspection / judgment, when the connection portion is to be seen or stereoscopically observed, the lead foil 23 of the drive substrate 2 is made of copper, a metal such as nickel or chrome, and the substrate 11 and the terminal electrode 12 are transparent. If so, the observation can be accurately performed by performing coaxial epi-illumination from the substrate 11 side. Therefore, when the display device 1 has the segment terminal electrodes on the opposite sides and the common terminal electrodes on the other sides orthogonal to each other, these terminal electrodes 12 are basically each of the two stacked electrodes. Since it is provided on the inner surfaces facing each other, for example, in FIG. 1, if the electrode terminals and driving elements in the vertical direction on the right side are segment sides, they are observed from the back side of the paper, and those on the lower side of the figure (terminal connection It is preferable to observe this from the front side of the paper because the part is on the back side of the substrate and not displayed) is on the common side. Therefore, for example, after inspecting one terminal electrode portion, it is most preferable to invert the display device D in the work area 52 described above to identify the other terminal electrode portion and inspect it by the inversion means 56 that conveys it to the work area 52. . If such a reversing means 56 is not used, coaxial epi-illumination is configured to illuminate from the front and back surfaces of the display device D, and an illumination selecting means capable of switching and adjusting the intensity thereof is provided to make it transparent. It suffices to illuminate from the board side and receive the image of the terminal connection portion. In this case, the CCD may be incorporated in the illumination cylinders on the front and back surfaces and the signal thereof may be guided to one monitor unit.

【0027】そして課題として述べた全範囲を検査する
点について、両端子部の接続長さ(異方性導電接着剤の
幅)はおよそ1500μmにわたり、他方端子ピッチは
100〜40μmであるから端子の幅は80〜20μm
となる。受像手段7の縦横比を考慮すると、接続長さ全
体にわたって検査するには端子接続部の幅は余りにも細
く、又使用されている導電粒子の大きさも余りに小さ
い。一方導電粒子の大きさを基準に検査をしようとする
と端子接続部の全長を検査することはできない。
Regarding the point of inspecting the entire range described as the problem, the connection length (width of the anisotropic conductive adhesive) of both terminal portions is about 1500 μm, and the terminal pitch is 100 to 40 μm, so that the terminal pitch is 100 to 40 μm. Width is 80 to 20 μm
Becomes Considering the aspect ratio of the image receiving means 7, the width of the terminal connecting portion is too thin and the size of the conductive particles used is also too small for inspection over the entire connection length. On the other hand, if it is attempted to inspect based on the size of the conductive particles, the entire length of the terminal connecting portion cannot be inspected.

【0028】そこで好ましくは、例えば3台の受像手段
7を斜めに配置し、各々接続長さの1/5程度を受像す
ることとすればよい。即ち、第1の受像手段は端子部の
基板端縁側を観察しながら端子接続部を整列方向に向か
って端子電極の第1の観察領域を対象として走査し、第
2の受像手段は第1の受像手段より走査方向のおよそ9
00μm後方を端子接続部の中央部を観察しながら整列
方向に向かって端子電極の異なる観察領域を対象として
走査し、第3の受像手段はさらに第2の受像手段より走
査方向のおよそ900μm後方を端子接続部の表示面側
を整列方向に向かって走査し、各々接続部の映像を受像
すると、各受像手段は約310μm幅で走査することと
なり、概ね全数検査をすることができる。即ち、端子接
続部を整列方向に向かって端子電極の異なる観察領域を
対象として走査し接続部の映像を受像する複数の受像手
段と、受像した映像から少なくとも端子電極部分に位置
する導電粒子の数もしくは面積等を演算する処理手段と
を備えれば、全ての端子部を検査することができる。
Therefore, preferably, for example, three image receiving means 7 are obliquely arranged so that each of them receives about 1/5 of the connection length. That is, the first image receiving means scans the terminal connection portion toward the first observation region of the terminal electrode in the alignment direction while observing the substrate end edge side of the terminal portion, and the second image receiving means the first image receiving means. About 9 in the scanning direction from the image receiving means
While observing the central portion of the terminal connection portion, the third image receiving unit is further scanned about 900 μm behind the second image receiving unit in the alignment direction while observing the central portion of the terminal connection portion. When the display surface side of the terminal connection portion is scanned in the alignment direction and the image of each connection portion is received, each image receiving means scans with a width of about 310 μm, and thus it is possible to perform a 100% inspection. That is, the plurality of image receiving means for scanning the terminal connection portion in the alignment direction with respect to different observation regions of the terminal electrode to receive the image of the connection portion, and the number of the conductive particles located at least in the terminal electrode portion from the received image. Alternatively, if a processing means for calculating the area etc. is provided, all the terminal parts can be inspected.

【0029】しかしながら一方で、3台の受像手段を1
列に整列できないことに基づき、互いの端子の接続を確
認するに於て、1本の端子の総接続面積を演算する場合
に演算ミスを発生することがある。例えば第n番目の端
子の表示面側の接続面積と、第n+2番目の端子の基板
端縁側の接続面積を加算してしまう可能性が生じる。そ
こでもっとも効率の良い方法として、表示面側での接続
面積若しくは接続に寄与した導電粒子の数が所定の量、
例えば端子として必要な接続面積の1/2とか異方性導
電接着剤の平均導電粒子の平均密度の9/10の数に相
当する数が接続に寄与しているとか、によって接続状態
がよいと見做すことができる。端子の基板端縁側ではこ
の様な見做しは接続抵抗の大きさや表示側と端縁側の接
続確率の統計から問題が多い。即ち、端子接続部を整列
方向に向かって表示面に近い観察領域のみ走査し接続部
の映像を受像する受像手段と、受像した映像から少なく
とも端子電極部分に位置する導電粒子の数もしくは面積
等を演算する処理手段とを設けることによって、極めて
高速に検査判定でき、誤判定も比較的少ない。前述のよ
うに受像手段などを何台も設けることを考えると、表示
面側の1/6〜1/2を検査して、不良の確率があるも
のについてのみ全幅検査を行えばもっと効率がよくな
る。
On the other hand, however, three image receiving means are provided as one.
Due to the fact that the terminals cannot be arranged in a row, a calculation error may occur when calculating the total connection area of one terminal in confirming the connection of the terminals. For example, there is a possibility that the connection area of the nth terminal on the display surface side and the connection area of the n + 2th terminal on the substrate edge side are added. Therefore, as the most efficient method, the connection area on the display surface side or the number of conductive particles contributing to the connection is a predetermined amount,
For example, the connection state is good because, for example, 1/2 of the connection area required as a terminal or 9/10 of the average density of the average conductive particles of the anisotropic conductive adhesive contributes to the connection. Can be considered. On the edge side of the board of the terminal, such a view is often problematic due to the size of the connection resistance and statistics of the connection probability between the display side and the edge side. That is, the image receiving means for receiving the image of the connecting part by scanning the terminal connecting part only in the observation area close to the display surface in the alignment direction, and the number or area of the conductive particles located at least in the terminal electrode part from the received image are shown. By providing the processing means for calculating, the inspection determination can be performed at extremely high speed, and the erroneous determination is relatively small. Considering that a number of image receiving means and the like are provided as described above, it is more efficient to inspect 1/6 to 1/2 on the display surface side and perform full width inspection only for those having a defect probability. .

【0030】さらに、この様に端子幅の一部分のみ全端
子接続部を観察検査する場合においても、その観察検査
のみで済ますのではなく、より広い領域を観察しながら
所定の領域を詳細に観察するのがより好ましい。即ち、
端子接続部を整列方向に向かって互いに異なる観察領域
の大きさで走査し接続部の映像を受像する複数の受像手
段と、受像演算する処理手段とを設けるもので、例えば
第1の受像手段は倍率40倍の光学顕微鏡を有して表示
面側の端子列を走査し、その走査方向の後方において倍
率10倍の光学顕微鏡を有し端子は幅の略全幅を観察す
る第2の受像手段が端子列を走査し、処理手段において
は両者の相関を取りながら、例えば第1の受像手段の映
像においては導電粒子の面積と数を判定し、第2の受像
手段の映像からは導電粒子の数のみを判定するなどし
て、一方では個別的詳細な接続判断を、他方では包括的
概括的な接続判断をするのが好ましい。この様に疎密判
定を行う場合、電極端子と端子部の重なりパターンず
れ、異物かみ、気泡かみ、並びに圧着幅を、先行して、
倍率の低い受像手段で観察して映像処理し、その結果の
うちの圧着幅を基にして、高倍率の受像手段により、1
パターン当りの圧着粒子数、圧着粒子の接合面積を受像
し演算処理するのが効率的で、最も好ましい。
Further, even in the case of observing and inspecting all terminal connection parts only in a part of the terminal width in this way, not only the observing inspection is necessary, but a predetermined region is observed in detail while observing a wider region. Is more preferable. That is,
A plurality of image receiving means for receiving the image of the connection portion by scanning the terminal connection portion in the size of the observation regions different from each other in the alignment direction, and a processing means for performing the image receiving calculation are provided. For example, the first image receiving means is A second image receiving means for scanning the terminal row on the display surface side with an optical microscope having a magnification of 40 times, and having an optical microscope having a magnification of 10 times behind the scanning direction and observing substantially the entire width of the terminals is provided. The area of the conductive particles is determined, for example, in the image of the first image receiving means by scanning the terminal row and correlating the two in the processing means, and the number of the conductive particles is detected in the image of the second image receiving means. It is preferable to make an individual detailed connection determination on the one hand and a comprehensive general connection determination on the other hand, for example, by making only the determination. When performing the sparse / dense determination in this manner, the overlapping pattern displacement between the electrode terminal and the terminal portion, foreign matter biting, bubble biting, and crimping width are set in advance.
The image is processed by observing it with an image receiving means having a low magnification, and based on the pressure bonding width of the result, the
It is efficient and most preferable to receive and process the number of pressure-bonded particles per pattern and the bonding area of the pressure-bonded particles.

【0031】またこれらの実施例においては何らかの形
で全ての端子接続部を検査するものとして説明したが、
これに限られるものではなく、例えば2〜数本おきに検
査するなどしてもよい。しかし一部を検査する場合に
は、もっとも効率的なのは、駆動基板毎に検査を行うこ
とである。即ち、一つの駆動素子は概ね80〜240の
出力端子をもっており、表示器の1辺に複数の駆動基板
が接続され、これら駆動基板毎に接続がなされるので、
その端子接続部を整列方向に向かって駆動基板毎に走査
し接続部の映像を受像することとし、受像した映像から
少なくとも端子電極部分に位置する導電粒子の輪郭処理
を行って接続の良否を判断する。即ち、全数検査すると
きでも、一つの駆動基板のうち複数箇所のみ検査すると
きでも、駆動基板毎に同じ接続特性を有する場合が多い
ので、駆動基板毎に受像・処理すると好ましい。
Further, in these embodiments, it is explained that all the terminal connection parts are inspected in some way.
It is not limited to this, and for example, inspection may be performed every 2 to several lines. However, when inspecting a part, the most efficient method is to inspect each drive substrate. That is, one drive element has approximately 80 to 240 output terminals, and a plurality of drive substrates are connected to one side of the display, and connection is made for each of these drive substrates.
The terminal connection is scanned for each drive substrate in the alignment direction to receive the image of the connection, and the contour of the conductive particles located at least at the terminal electrode portion is processed from the received image to determine the quality of the connection. To do. That is, since it is often the case that each drive board has the same connection characteristics whether it is inspected for all or a plurality of locations on one drive board, it is preferable to receive and process images for each drive board.

【0032】そしてこの様な駆動素子毎に検査する場
合、図8a、bに示すように、ハーフミラーやプリズム
などを照明筒に組み込み、筒横にランプハウスを、筒頭
にCCDカメラを各々配置することで、その端子接続部
の1つの駆動基板に対する複数の個所を観察検査するこ
とができる。この場合、同軸落射照明を行う照明手段6
0を設け、1〜50mmより好ましくは10mm程度は
なれた個所、例えば一つの駆動基板2の両端近傍を同時
に照明する。そして、その照明された端子接続部を駆動
基板毎に走査し接続部の映像を受像する1台もしくは複
数台の受像手段70を照明筒先頭部に配置する。その受
像した映像から少なくとも端子電極部分に位置する導電
粒子の数もしくは面積等を演算すればよい。とりわけ図
8bの方法においては、もともと端子電極ピッチに比較
して接続幅が広いので、例えば整列した端子接続部の駆
動基板両端3〜5本ずつ等を一画面で同時に観察検査判
定することができ、好ましい。
When inspecting each such driving element, as shown in FIGS. 8A and 8B, a half mirror, a prism and the like are incorporated in an illumination tube, a lamp house is arranged beside the tube, and a CCD camera is arranged at the cylinder head. By doing so, it is possible to observe and inspect a plurality of portions of the terminal connection portion with respect to one drive substrate. In this case, illumination means 6 for performing coaxial incident illumination
0 is provided to illuminate a portion separated by 1 to 50 mm, preferably about 10 mm, for example, both ends of one drive substrate 2 at the same time. Then, one or a plurality of image receiving means 70 which scans the illuminated terminal connecting portion for each drive substrate and receives an image of the connecting portion is arranged at the leading portion of the illumination tube. From the received image, at least the number or area of the conductive particles located in the terminal electrode portion may be calculated. In particular, in the method of FIG. 8b, since the connection width is originally wider than the terminal electrode pitch, it is possible to simultaneously observe and judge, for example, 3 to 5 ends of the drive substrate of the aligned terminal connection portions on one screen. ,preferable.

【0033】さらにこの様に一部の端子接続部を観察検
査する場合、表示器の端子電極として透明電極と金属膜
の積層体を用いる場合、図9に示すように、検査の対象
となる端子電極120には金属膜121に窓を設けて透
明電極122の露出部分を設けると好ましい。即ち、透
明電極122と金属膜121の積層体からなる端子電極
120は、異方性導電接着剤3が両面、金属で挾持され
ることとなるので、光の照射では判別が困難になりやす
い。そこでX線発生器とモニターカメラを組み込み、X
線で分析してもよいが、X線解析は一般に分解能が低い
ので、落射照明の様に一方向からの観察ではパターン認
識が不十分である。そこで、X線発生器とモニターカメ
ラの対を端子接続部を中心に回転させ、複数方向からの
映像を解析するようにすべきである。しかしながら、こ
の様な観察、演算は極めて煩雑になりやすいので、上述
のように端子接続部若しくは前述したターゲットマーク
に四角形などの透明電極の露出部を設けて、その部分で
観察検査すればよい。これは一般に、TFT液晶表示器
など、透明電極122の上に積層された金属膜121が
抵抗値を下げるための薄膜であることから可能になるの
で、金属膜が厚く、導電粒子の直径の1/2等のように
大きな段差を生じる場合には、透明電極を露出しても測
定できない。従って、この様な金属膜積層端子電極を有
する表示装置の高速検査においては、その端子接続部を
整列方向に向かって駆動基板毎に走査し、駆動基板毎に
予め設けられた端子電極の金属膜除去部分より透明電極
からなる接続部の映像を受像する受像手段と、受像した
映像から導電粒子の輪郭処理を行う処理手段とを設ける
のが効率的で好ましい。
Further, in the case of observing and inspecting a part of the terminal connection portion as described above, when a laminated body of a transparent electrode and a metal film is used as a terminal electrode of a display, as shown in FIG. The electrode 120 is preferably provided with a window in the metal film 121 to provide an exposed portion of the transparent electrode 122. That is, since the anisotropic conductive adhesive 3 is sandwiched by the metal on both sides of the terminal electrode 120 composed of the laminated body of the transparent electrode 122 and the metal film 121, it is easy to make a distinction by irradiation with light. Therefore, the X-ray generator and the monitor camera were installed, and X
Although X-ray analysis is generally low in resolution, X-ray analysis is insufficient in pattern recognition by observation from one direction like epi-illumination. Therefore, it is necessary to rotate the pair of the X-ray generator and the monitor camera around the terminal connecting portion so as to analyze the images from a plurality of directions. However, since such observation and calculation tend to be extremely complicated, it is only necessary to provide the exposed portion of the transparent electrode such as a quadrangle on the terminal connection portion or the above-described target mark as described above, and observe and inspect at that portion. This is generally possible because the metal film 121 laminated on the transparent electrode 122, such as a TFT liquid crystal display, is a thin film for reducing the resistance value. Therefore, the metal film is thick and the diameter of the conductive particles is 1 When a large step difference such as / 2 is generated, measurement cannot be performed even if the transparent electrode is exposed. Therefore, in a high-speed inspection of a display device having such a metal film laminated terminal electrode, the terminal connection portion is scanned in the alignment direction for each drive substrate, and the metal film of the terminal electrode provided in advance for each drive substrate is scanned. It is efficient and preferable to provide an image receiving means for receiving an image of the connection portion composed of the transparent electrode from the removed portion, and a processing means for performing contour processing of the conductive particles from the received image.

【0034】[0034]

【発明の効果】本発明は上述のようにファインピッチの
接続技術は進んでも検査工程を省略できず、しかし拡大
鏡を用いた目眼検査はファインピッチでは限界であり、
従来のパターン認識では検査時間がかかり過ぎることに
鑑み、導電粒子の形状と接続不良との関係に着目して、
照明手段、走査方法、信号処理手段など多くの検討を重
ね安定して高速で端子接続部の検査を行うことができた
ものである。
As described above, according to the present invention, even if the fine pitch connection technology is advanced, the inspection process cannot be omitted, but the eye inspection using the magnifying glass is limited at the fine pitch.
Considering that the inspection time is too long in the conventional pattern recognition, focusing on the relationship between the shape of the conductive particles and the connection failure,
It was possible to perform stable and high-speed inspection of the terminal connection portion after repeated studies such as illumination means, scanning method, and signal processing means.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の対象となる表示装置の要部平面図であ
る。
FIG. 1 is a plan view of a main part of a display device which is an object of the present invention.

【図2】図1のA−A断面図である。FIG. 2 is a sectional view taken along line AA of FIG.

【図3】異方性導電接着剤の中の粒子の説明図である。FIG. 3 is an explanatory diagram of particles in an anisotropic conductive adhesive.

【図4】本発明実施例の表示装置の検査装置の平面図で
ある。
FIG. 4 is a plan view of an inspection device for a display device according to an embodiment of the present invention.

【図5】映像パターンの例を示す図である。FIG. 5 is a diagram showing an example of a video pattern.

【図6】パターン認識の例を示す図である。FIG. 6 is a diagram showing an example of pattern recognition.

【図7】パターン認識の例を示す図である。FIG. 7 is a diagram showing an example of pattern recognition.

【図8】本発明の他の実施例の構成図である。FIG. 8 is a configuration diagram of another embodiment of the present invention.

【図9】表示装置の要部断面図である。FIG. 9 is a cross-sectional view of a main part of a display device.

【符号の説明】[Explanation of symbols]

1 表示器 11 基板 12 端子電極 2 駆動基板 21 駆動素子 22 端子部 3 異方性導電接着剤 31 導電粒子 32 接着剤 DESCRIPTION OF SYMBOLS 1 indicator 11 substrate 12 terminal electrode 2 drive substrate 21 drive element 22 terminal part 3 anisotropic conductive adhesive 31 conductive particles 32 adhesive

───────────────────────────────────────────────────── フロントページの続き (72)発明者 稲村 篤紀 鳥取県鳥取市南吉方3丁目201番地 鳥取 三洋電機株式会社内 (72)発明者 田渕 一十志 鳥取県鳥取市南吉方3丁目201番地 鳥取 三洋電機株式会社内 ─────────────────────────────────────────────────── ─── Continuation of front page (72) Inventor Atsunori Inamura 3-201 Minamiyoshikata, Tottori City, Tottori Prefecture Tottori Sanyo Electric Co., Ltd. Sanyo Electric Co., Ltd.

Claims (13)

【特許請求の範囲】[Claims] 【請求項1】 透明な基板上に端子電極を有する表示器
と、駆動素子に接続された端子部を有する駆動基板と、
表示器の端子電極と駆動素子の端子部との間に位置し導
電粒子を含んだ異方性導電接着剤とを具備した表示装置
において、前記表示器の前記端子電極は、透明電極と金
属膜の積層体からなり、透明電極の露出部分を有してい
ることを特徴とする表示装置。
1. A display device having a terminal electrode on a transparent substrate, and a drive substrate having a terminal portion connected to a drive element,
In a display device comprising an anisotropic conductive adhesive containing conductive particles and located between the terminal electrode of the display and the terminal portion of the driving element, the terminal electrode of the display is a transparent electrode and a metal film. And a transparent electrode exposed portion.
【請求項2】 基板上に端子電極を有する表示器の端子
電極と駆動素子に接続された端子部を有する駆動基板の
端子部とを導電粒子を含んだ接着剤で接続した表示装置
の接続部を透視もしくは立体観察することにより、少な
くとも接続部の輪郭または外形を認識することで接続状
況の良否を判断することを特徴とする表示装置の検査方
法。
2. A connecting portion of a display device in which a terminal electrode of a display device having a terminal electrode on a substrate and a terminal portion of a driving substrate having a terminal portion connected to a driving element are connected by an adhesive containing conductive particles. A method for inspecting a display device, wherein the quality of the connection state is determined by observing at least the contour or outer shape of the connection portion by observing or stereoscopically observing.
【請求項3】 基板上に端子電極を有する表示器の端子
電極と駆動素子に接続された端子部を有する駆動基板の
端子部とを導電粒子を含んだ接着剤で接続された表示装
置に対して、その端子接続部に落射照明を与える照明手
段と、端子接続部の映像を受像する受像手段と、受像し
た映像から輪郭認識をし、端子電極の損傷と端子電極部
分に位置する導電粒子の数もしくは面積を演算する処理
手段とを具備したことを特徴とする表示装置の検査装
置。
3. A display device in which a terminal electrode of a display device having a terminal electrode on a substrate and a terminal portion of a driving substrate having a terminal portion connected to a driving element are connected by an adhesive containing conductive particles. The illumination means for giving epi-illumination to the terminal connection portion, the image receiving means for receiving the image of the terminal connection portion, the contour recognition from the received image, the damage of the terminal electrode and the conductive particles located in the terminal electrode portion. An inspection device for a display device, comprising: a processing unit for calculating the number or area.
【請求項4】 2枚の基板の各々の端縁部に端子電極を
有する表示器の当該端子電極と、駆動素子に接続された
端子部を有する駆動基板の端子部とを、導電粒子を含ん
だ接着剤で接続した表示装置に対して、その表示装置の
第1の端子電極部分を特定しワークエリアに搬送する搬
送手段と、そのワークエリアにおいて照明手段の照明を
受けて端子接続部の映像を受像する受像手段と、ワーク
エリアの表示装置を反転させて他の端子電極部分を特定
しワークエリアに搬送する反転手段と、受像した映像か
ら輪郭認識をし、端子電極の損傷と端子電極部分に位置
する導電粒子の数もしくは面積等を演算する処理手段と
を具備したことを特徴とする表示装置の検査装置。
4. The conductive particles are included in the terminal electrode of the display device having a terminal electrode at each edge of the two substrates and the terminal portion of the driving substrate having the terminal portion connected to the driving element. With respect to the display device connected with the adhesive, a transporting unit that identifies the first terminal electrode portion of the display unit and transports it to the work area, and an image of the terminal connecting portion that is illuminated by the illumination unit in the work area Image receiving means, an inverting means for inverting the display device in the work area to identify another terminal electrode portion and transporting it to the work area, and a contour recognition from the received image to identify damage to the terminal electrode and the terminal electrode portion. An inspection apparatus for a display device, comprising: a processing unit that calculates the number or area of the conductive particles located at
【請求項5】 基板上に整列した端子電極を有する表示
器の端子電極と駆動素子に接続された端子部を有する駆
動基板の端子部とを導電粒子を含んだ接着剤で接続され
た表示装置に対して、その端子接続部を整列方向に向か
って互いに異なる観察領域の大きさで走査し接続部の映
像を受像する複数の受像手段と、受像した映像から少な
くとも端子電極部分に位置する導電粒子の数もしくは面
積等を演算する処理手段とを具備したことを特徴とする
表示装置の検査装置。
5. A display device in which a terminal electrode of a display device having terminal electrodes aligned on a substrate and a terminal portion of a driving substrate having a terminal portion connected to a driving element are connected by an adhesive containing conductive particles. A plurality of image receiving means for receiving the image of the connection part by scanning the terminal connection part in the size of the observation regions different from each other in the alignment direction, and the conductive particles located at least in the terminal electrode part from the received image. And a processing means for calculating the number, area, or the like of the display device.
【請求項6】 基板上に整列した所定長さの端子電極を
有する表示器の端子電極と駆動素子に接続された端子部
を有する駆動基板の端子部とを導電粒子を含んだ接着剤
で接続された表示装置に対して、その端子接続部を整列
方向に向かって端子電極の異なる観察領域を対象として
走査し接続部の映像を受像する複数の受像手段と、受像
した映像から少なくとも端子電極部分に位置する導電粒
子の数もしくは面積等を演算する処理手段とを特徴とす
る表示装置の検査装置。
6. A terminal electrode of a display having terminal electrodes of a predetermined length aligned on a substrate and a terminal portion of a driving substrate having a terminal portion connected to a driving element are connected by an adhesive containing conductive particles. A plurality of image receiving means for receiving the image of the connecting portion by scanning the terminal connecting portion of the display device in the alignment direction with respect to different observation regions of the terminal electrodes, and at least the terminal electrode portion from the received image. An inspection apparatus for a display device, comprising: a processing unit that calculates the number, area, or the like of the conductive particles located at the position.
【請求項7】 基板上に整列した所定の長さの端子電極
を有する表示器の端子電極と駆動素子に接続された端子
部を有する駆動基板の端子部とを導電粒子を含んだ接着
剤で接続された表示装置に対して、その端子接続部を整
列方向に向かって表示面に近い観察領域のみ走査し接続
部の映像を受像する受像手段と、受像した映像から少な
くとも端子電極部分に位置する導電粒子の数もしくは面
積等を演算する処理手段とを具備したことを特徴とする
表示装置の検査装置。
7. An adhesive containing conductive particles for a terminal electrode of a display having terminal electrodes of a predetermined length aligned on a substrate and a terminal portion of a driving substrate having a terminal portion connected to a driving element. With respect to the connected display device, an image receiving unit that receives the image of the connection unit by scanning the terminal connection unit only in the observation region close to the display surface in the alignment direction, and at least the terminal electrode portion from the received image. An inspection apparatus for a display device, comprising: a processing unit that calculates the number or area of conductive particles.
【請求項8】 基板上に整列した端子電極を有する表示
器の端子電極と駆動素子に接続された端子部を有する複
数の駆動基板の端子部とを導電粒子を含んだ接着剤で接
続された表示装置に対して、その端子接続部を整列方向
に向かって駆動基板毎に走査し接続部の映像を受像する
受像手段と、受像した映像から少なくとも端子電極部分
に位置する導電粒子の輪郭処理を行って接続の良否を判
断する表示装置の検査方法。
8. A terminal electrode of a display having terminal electrodes aligned on a substrate and a plurality of driving substrate terminals having terminal portions connected to driving elements are connected by an adhesive containing conductive particles. The display device is provided with an image receiving unit that scans the terminal connection portion of each drive substrate in the alignment direction and receives an image of the connection portion, and a contour processing of the conductive particles located at least in the terminal electrode portion from the received image. A method of inspecting a display device to determine whether the connection is good or bad.
【請求項9】 基板上に端子電極を有する表示器と、駆
動素子に接続された端子部を有する駆動基板と、表示器
の端子電極と駆動素子の端子部との間に位置し粒子外形
が使用前の粒子外形よりも大きい導電粒子を複数含んで
いることを接続良否判定の基準としたことを特徴とする
表示装置の検査方法。
9. A display device having a terminal electrode on a substrate, a drive substrate having a terminal portion connected to a drive element, and a particle outer shape located between the terminal electrode of the display device and the terminal portion of the drive element. A method for inspecting a display device, wherein a criterion for connection quality judgment is that a plurality of conductive particles larger than the particle outline before use is included.
【請求項10】 透明な2枚の基板の各々の端縁部に端
子電極を有する表示器の当該端子電極と、駆動素子に接
続された端子部を有する駆動基板の端子部とを、導電粒
子を含んだ接着剤で接続した表示装置に対して、その表
示装置の表裏からその端子接続部を照明する照明手段
と、端子接続部において、透明な前記基板側からの照明
を選択する照明選択手段と、照明手段の照明を受けて端
子接続部の映像を受像する受像手段と、受像した映像か
ら輪郭認識をし、端子電極の損傷と端子電極部分に位置
する導電粒子の数もしくは面積等を演算する処理手段と
を具備したことを特徴とする表示装置の検査装置。
10. A conductive particle comprising: a display device having a terminal electrode at each edge of two transparent substrates; and a terminal portion of a driving substrate having a terminal portion connected to a driving element. Illumination device for illuminating the terminal connection portion from the front and back of the display device, and an illumination selection means for selecting transparent illumination from the substrate side in the terminal connection portion for a display device connected with an adhesive containing And image receiving means for receiving the image of the terminal connection portion under the illumination of the illuminating means, and contour recognition from the received image to calculate the damage of the terminal electrode and the number or area of the conductive particles located in the terminal electrode portion. An inspection device for a display device, comprising:
【請求項11】 基板上に整列して設けられた透明電極
と金属膜の積層体からなる端子電極を有する表示器と、
駆動素子に接続された端子部を有する複数の駆動基板
と、表示器の端子電極と駆動基板の端子部とを導電粒子
を含んだ異方性導電接着剤で接続した表示装置に対し
て、その端子接続部を整列方向に向かって駆動基板毎に
走査し、駆動基板毎に予め設けられた端子電極の金属膜
除去部分より透明電極からなる接続部の映像を受像する
受像手段と、受像した映像から導電粒子の輪郭処理を行
う処理手段とを具備したことを特徴とする表示装置の検
出装置。
11. A display device having a terminal electrode composed of a laminated body of a transparent electrode and a metal film arranged on a substrate in alignment,
A plurality of drive substrates having terminal portions connected to drive elements, and a display device in which the terminal electrodes of the display and the terminal portions of the drive substrate are connected by an anisotropic conductive adhesive containing conductive particles, An image receiving unit that scans the terminal connection portion in the alignment direction for each drive substrate, and receives an image of the connection portion formed of the transparent electrode from the metal film removal portion of the terminal electrode provided in advance for each drive substrate, and the received image. And a processing unit that performs contour processing of the conductive particles.
【請求項12】 基板上に端子電極を有する表示器の該
端子電極と駆動素子に接続された端子部を有する駆動基
板の当該端子部とを導電粒子を含んだ接着剤で接続した
表示装置に対して、その端子接続部に落射照明を与える
照明手段と、端子接続部の映像を受像する受像手段と、
受像した映像の輝度信号もしくは色信号に基づいて端子
電極の損傷の判定または端子電極部分に位置する導電粒
子の数もしくは面積等を演算する処理手段とを具備した
ことを特徴とする表示装置の検査装置。
12. A display device in which the terminal electrode of a display device having a terminal electrode on a substrate and the terminal portion of a driving substrate having a terminal portion connected to a driving element are connected by an adhesive containing conductive particles. On the other hand, an illuminating means for applying epi-illumination to the terminal connecting portion, and an image receiving means for receiving an image of the terminal connecting portion,
Inspection of a display device, comprising: a processing unit for judging damage to a terminal electrode or calculating the number or area of conductive particles located at the terminal electrode portion based on a luminance signal or a color signal of an image received. apparatus.
【請求項13】 基板上に整列した端子電極を有する表
示器の端子電極と駆動素子に接続された端子部を有する
複数の駆動基板の端子部とを導電粒子を含んだ異方性導
電接着剤で接続された表示装置に対して、その端子接続
部の1つの駆動基板に対する複数の個所に同軸落射照明
を行う照明手段と、その照明された端子接続部を駆動基
板毎に走査し接続部の映像を受像する受像手段と、受像
した映像から少なくとも端子電極部分に位置する導電粒
子の数もしくは面積等を演算する処理手段とを具備した
ことを特徴とする表示装置の検査装置。
13. An anisotropic conductive adhesive containing conductive particles for a terminal electrode of a display device having terminal electrodes aligned on a substrate and a plurality of driving substrate terminals having terminal portions connected to driving elements. For the display device connected by the above, the illuminating means for performing coaxial epi-illumination at a plurality of portions of the terminal connecting portion with respect to one driving substrate, and the illuminated terminal connecting portion are scanned for each driving substrate to connect the connecting portions. An inspection device for a display device, comprising: an image receiving means for receiving an image and a processing means for calculating the number or area of the conductive particles located at least in the terminal electrode portion from the received image.
JP6169650A 1994-07-21 1994-07-21 Display device, method for inspecting display device and inspection apparatus Pending JPH0836191A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6169650A JPH0836191A (en) 1994-07-21 1994-07-21 Display device, method for inspecting display device and inspection apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6169650A JPH0836191A (en) 1994-07-21 1994-07-21 Display device, method for inspecting display device and inspection apparatus

Publications (1)

Publication Number Publication Date
JPH0836191A true JPH0836191A (en) 1996-02-06

Family

ID=15890411

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6169650A Pending JPH0836191A (en) 1994-07-21 1994-07-21 Display device, method for inspecting display device and inspection apparatus

Country Status (1)

Country Link
JP (1) JPH0836191A (en)

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Publication number Priority date Publication date Assignee Title
WO2001026079A1 (en) * 1999-10-06 2001-04-12 Seiko Epson Corporation Electrooptic device, method for manufacturing electrooptic device, and electronic apparatus
JP2005030850A (en) * 2003-07-10 2005-02-03 Chi Mei Electronics Corp Noncontact method and apparatus for inspecting electrical connection part
KR100476525B1 (en) * 1997-10-15 2005-08-29 삼성전자주식회사 Liquid Crystal Display Device Module with Tap Eye
KR20060093574A (en) * 2005-02-22 2006-08-25 삼성전자주식회사 Display panel
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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100476525B1 (en) * 1997-10-15 2005-08-29 삼성전자주식회사 Liquid Crystal Display Device Module with Tap Eye
WO2001026079A1 (en) * 1999-10-06 2001-04-12 Seiko Epson Corporation Electrooptic device, method for manufacturing electrooptic device, and electronic apparatus
US6646708B1 (en) 1999-10-06 2003-11-11 Seiko Epson Corporation Electrooptic device, manufacturing method therefor with visual confirmation of compression bonding to terminals and electronic apparatus
JP2005030850A (en) * 2003-07-10 2005-02-03 Chi Mei Electronics Corp Noncontact method and apparatus for inspecting electrical connection part
JP4586124B2 (en) * 2003-07-10 2010-11-24 奇美電子股▲ふん▼有限公司 Non-contact inspection method and non-contact inspection device for electrical connection
KR20060093574A (en) * 2005-02-22 2006-08-25 삼성전자주식회사 Display panel
WO2007013528A1 (en) * 2005-07-26 2007-02-01 Tohoku Pioneer Corporation Display device, display device inspecting method and display device manufacturing method
JP2019168293A (en) * 2018-03-22 2019-10-03 芝浦メカトロニクス株式会社 Inspection device and inspection method

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