JPH08338858A - Inspection equipment for circuit board - Google Patents

Abstract

PURPOSE: To obtain an inspection equipment for circuit board in which various inspections are carried out with high time efficiency for circuit boards having different width dimensions while using the main part of inspection jig commonly and the preliminary works can be carried out in a short time. CONSTITUTION: The inspection equipment for circuit board comprises a carrying mechanism 10, an upper side inspection jig 70, and a lower side inspection jig 20. The carrying mechanism 10 is disposed movably within the movable range thereof and the lower side inspection jig 20 comprises a board side connector 30, a tester side connector 50 and an intermediary pin unit 40. The board side connector 30 is disposed separably from the intermediary pin unit 40 having a large number of conductive pins 41 and a supporting mechanism 43 therefor. The conductive pins 41 in the region directly under the movable range of carrying mechanism are supported detachably by the supporting mechanism 43 and the intermediary pin unit 40 is disposed such that it can be replaced with respect to the tester side connector 50. The conductive pins 41 in a selected region are removed and mounted on the tester side connector 50 while forming a space for containing the carrying mechanism 10.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention conveys a circuit board to be inspected to an inspection area by a conveyance mechanism and clamps both sides of the circuit board by an upper inspection jig and a lower inspection jig. The present invention relates to an inspection device for a circuit board, in which conductive contact portions on both surfaces of the board are electrically connected to a tester, thereby inspecting an electrically connected state of the circuit board.

[0002]

2. Description of the Related Art Generally, for a printed circuit board on which an integrated circuit or the like is mounted, it is necessary to confirm that the wiring pattern of the circuit board has desired performance before mounting the integrated circuit or the like. For that reason, the electrical characteristics thereof are inspected. As an inspection apparatus for inspecting such a circuit board, there is known an inspection apparatus including a transfer mechanism that transfers a circuit board to be inspected to be inspected to an inspection area.

FIG. 10 is an explanatory view showing the basic construction of an example of a conventional circuit board inspection apparatus. In this circuit board inspection device, the circuit board 1 to be inspected is
In this figure, a transport mechanism 90 for transporting to the inspection area is provided along a transport path extending in the horizontal direction perpendicular to the paper surface. The transport mechanism 90 of this example includes one transport member 91 provided on one side of the transport passage and another transport member 92 provided on the other side of the transport passage.
1 is constituted by one guide rail 93 having an L-shaped cross section that guides one side edge of the circuit board 1 to be inspected, and one conveyor belt 94 that runs with one side edge of the circuit board 1 to be inspected, The other transport member 92 has another L-shaped guide rail 95 for guiding the other side edge of the circuit board 1 to be inspected,
The other side edge of the circuit board 1 to be inspected is placed on the one conveyor belt 94 and the other conveyor belt 96 that travels integrally.

The one carrying member 91 and the other carrying member 92 are provided so as to be movable in a horizontal direction perpendicular to the carrying direction of the circuit board 1 to be inspected and in a direction in which they are in contact with each other. Thus, each of the transport members 91 and 92 can be displaced to a position outside the inspected circuit board 1 in order to put the inspected circuit board 1 in a free state for inspection. It is in a state in which it is possible to move to a traveling position corresponding to the circuit boards to be inspected having different width dimensions.

In the inspection area, the conveyed inspection target circuit board 1 is detached from the transfer mechanism 90 to be in a free state, and the lower inspection jig for further pinching the inspection target circuit board 1 from the vertical direction. 97 and upper inspection jig 9
8 are arranged, and these are connected to an inspection circuit (not shown) of the tester.

In the circuit board inspection apparatus having such a configuration, the circuit board 1 to be inspected to be inspected is conveyed to the inspection area by one conveyance member 91 and the other conveyance member 92 of the conveyance mechanism 90 and stopped. After that, for example, when the lower side inspection jig 97 rises, the circuit board 1 to be inspected is pushed upward and separated from the transfer mechanism 90, while one transfer member 91 and the other transfer member in the transfer mechanism 90 are removed. When 92 is displaced outward in the width direction of the inspected circuit board 1 to the position outside the lower side inspection jig 97, the inspected circuit board 1 becomes free and the lower side inspection jig 97 is further raised. By doing so, the circuit board 1 to be inspected is pinched between the lower inspection jig 97 and the upper inspection jig 98, and the conductive contact portions on both sides of the inspected circuit board 1 are the inspection circuits of the tester. Electrically accomplished connected state, the tester in this state, the circuit board 1 to be inspected
Inspection is performed.

In the above, if one of the conveying members 91 and the other conveying member 92 are not displaced outward,
Due to these obstacles, the circuit board 1 to be inspected cannot be pinched by the lower inspection jig 97 and the upper inspection jig 98.

According to such a circuit board inspection apparatus,
Since the circuit board 1 to be inspected can be quickly placed in the inspection area by the transport mechanism 90, the time required for setting the circuit board 1 to be inspected for inspection is short, and a large number of circuit boards to be inspected can be obtained. Can be performed with high time efficiency.

Thus, in practice, the type of circuit board to be inspected is not limited to one type having a constant width dimension. For this reason,
The lower side inspection jig 97 and the upper side inspection jig 98 need to cover an inspection area having a width corresponding to the circuit board to be inspected having the maximum width dimension.

[0010]

However, when inspecting a circuit board to be inspected having a width dimension smaller than the widths of the inspection regions of the lower side inspection jig 97 and the upper side inspection jig 98, one of Since it is necessary to displace the conveying member 91 and the other conveying member 92 to both outsides of the lower side inspection jig 97 and the upper side inspection jig 98, respectively, the displacement distance between them becomes large. It takes a long time to complete the displacement of the transport member 91 and the other transport member 92, which causes a problem of low time efficiency.

Further, in the conventional inspection apparatus, since the lower inspection jig 97 and the upper inspection jig 98 are constructed exclusively for the specific circuit board 1 to be inspected, the wiring patterns are different. In order to inspect the circuit board to be inspected, there is a problem that it is necessary to change the entire inspection jig corresponding to the circuit board to be inspected.

The present invention has been made based on the above circumstances. A first object of the present invention is to perform a high inspection time for each circuit board having different width dimensions. It is an object of the present invention to provide a circuit board inspection device that can be achieved with high efficiency. A second object of the present invention is to provide a circuit board inspecting apparatus which can commonly use a main part of an inspection jig even for different types of circuit boards. A third object of the present invention is to provide a circuit board inspection apparatus capable of performing a preparatory work necessary for the inspection of the circuit board in a short time even when inspecting circuit boards having different width dimensions. To provide.

[0013]

A circuit board inspection apparatus of the present invention has a transfer mechanism for transferring a circuit board to be inspected to an inspection area, and an upper side inspection jig and a lower side inspection jig are provided in the inspection area. A circuit board inspecting device for pinching both sides of a circuit board by means of a tool, wherein the transfer mechanism is provided so as to be movable in a horizontal direction perpendicular to the transfer direction of the circuit board in a movable range of the transfer mechanism. The lower side inspection jig is provided below the lower board side connector and the lower board side connector that is in contact with the lower surface of the circuit board.
A tester-side connector electrically connected to the tester, and an intermediary pin device for electrically connecting the lower board-side connector and the tester-side connector to electrically connect each other. The board-side connector is separable from the intermediary pin device,
The intermediary pin device includes a large number of conductive pins and a conductive pin support mechanism that supports these conductive pins so as to extend in the vertical direction. Of the plurality of conductive pins, at least a region immediately below the movable range of the transport mechanism. All of the conductive pins in the above are detachably supported by the conductive pin support mechanism, and the intermediary pin device is provided so as to be replaceable with respect to the tester-side connector, and the conductive pin of the detachable conductive pins is It is characterized in that the conductive pin in the selected region is detached to be attached to the tester side connector in a state where the accommodation space of the transport mechanism is formed.

[0014]

According to the above construction, by removing the detachable conductive pin in the intermediary pin device, the accommodating space for the transfer mechanism can be formed in the intermediary pin device.
Moreover, since all the conductive pins in the area immediately below the movable range of the transfer mechanism of the transfer mechanism are detachably provided,
The position of the accommodating space can be arbitrarily selected within the region directly below the movable range of the transport mechanism. Therefore, it is possible to favorably cope with circuit boards having various width dimensions, and in order to inspect circuit boards having different width dimensions, the width direction of the transport mechanism can be adjusted according to the width dimensions. Even when the position is changed, by selecting the position forming the accommodation space as the position adjacent to the region where the inspection is performed, the displacement distance required to detach the transfer mechanism from the circuit board is always maintained. Can be made smaller.
As a result, in a very short time after the circuit board arrives at the inspection area, the circuit board can reach an inspection ready state in which the circuit board is pinched by the upper inspection jig and the lower inspection jig. Therefore, high time efficiency can be obtained in the inspection of the circuit board.

Further, since the lower board side connector is provided so as to be separable from the intermediary pin device, in the lower side inspection jig, when inspecting a circuit board having a different wiring pattern, only the lower board side connector is used. Can be replaced with one corresponding to the wiring pattern of the circuit board, so that the intermediate pin device and the lower tester-side connector, which are the main parts of the lower inspection jig, can be used in common.

Since the intermediary pin device is provided so as to be replaceable with respect to the connector on the tester side, only the intermediary pin device can be replaced with another intermediary pin device having a similar basic structure. It can be easily replaced. Therefore, even if the circuit board to be inspected next has a different width dimension, the detachable conductive pin is removed in advance according to the width dimension of the next circuit board to accommodate the space for accommodating the transfer mechanism. By preparing the intermediary pin device for replacement in which the above is formed, the preparatory work required for the inspection of the next circuit board can be performed in a short time.

[0017]

Embodiments of the circuit board inspection apparatus of the present invention will be described below. FIG. 1 is an explanatory sectional view showing a configuration of a main part in an example of a circuit board inspection apparatus according to the present invention. The circuit board inspection apparatus is provided with a transfer mechanism 10 for transferring the circuit board 1 to be inspected to the inspection area along a transfer path extending in the horizontal direction perpendicular to the paper surface of FIG. A lower side inspection jig 20 and an upper side inspection jig 70 that pinch both surfaces of the conveyed circuit board 1 to be inspected in the vertical direction are arranged in the area.

The carrying mechanism 10 in the illustrated example comprises one carrying member 11 provided on one side of the carrying passage and another carrying member 12 provided on the other side of the carrying passage. Reference numeral 11 denotes one guide rail 13 having an L-shaped cross-section that guides one side edge of the circuit board 1 to be inspected, and one conveyor belt 1 that runs with one side edge of the circuit board 1 to be inspected.
4, the other conveying member 12 mounts the other guide rail 15 having an L-shaped cross section for guiding the other side edge of the circuit board 1 to be inspected, and the other side edge of the circuit board 1 to be inspected. It is composed of one conveyor belt 14 and the other conveyor belt 16 that travels integrally.

The position (hereinafter, referred to as "travel position") when traveling for conveying one of the conveying members 11 in the width direction of the circuit board 1 to be inspected is referred to as "travel position" by the other conveying member 12 by an appropriate moving mechanism. With reference to the traveling position of, the movable member can be moved in a direction in which it separates from or comes into contact with the other transport member 12. The movable range K of the traveling position of one of the transport members 11 is the distance between the transport member 12 and the other transport member 12 of the circuit board to be inspected having the smallest width dimension among the circuit boards to be inspected. From the closest position having a size corresponding to the width dimension, the separation distance from the other transport member 12 corresponds to the width dimension of the circuit board to be inspected having the largest width dimension among the circuit boards to be inspected to be inspected. The range is up to the most separated position (shown by the broken line), which is the size of the width of the test circuit board 1. Thus, the circuit board 1 to be inspected having different width dimensions can be accommodated.

Each of the one carrying member 11 and the other carrying member 12 is, for example, the above-mentioned one carrying member 11.
With the moving mechanism for moving the traveling position of the circuit board, the traveling position is used as a reference, and the moving mechanism is moved to a position outside each side edge of the circuit board 1 to be inspected in a horizontal direction perpendicular to the transport direction of the circuit board 1 to be inspected. It is possible to move up to.

In the inspection area, a lower inspection jig 20 is arranged below the transport passage. In the lower inspection jig 20 in the illustrated example, one outer edge of the lower conveyance jig 1 is the other conveyance member 1 whose traveling position is not moved in the conveyance mechanism 10.
It is provided along the line 2. This lower side inspection jig 20
Is a lower board-side connector 30 having a width equivalent to the width d of the circuit board 1 to be inspected, and a lower tester-side connector 50 connected to a tester inspection circuit (not shown).
And a lower substrate side connector 30 and a lower tester side connector 50, and an intermediate pin device 40 for electrically connecting the contact points of the both, and the lower substrate side connector 30 and the intermediate pin device 40. Are separable.

As shown in FIG. 2, the lower board side connector 30 includes a first anisotropic conductive sheet 35 having elasticity and arranged on the lower surface side of the circuit board 1 to be inspected, and a pitch conversion board 31. The second anisotropic conductive sheet 36 having elasticity arranged on the lower surface side of the pitch conversion board 31 is stacked in this order.

On the upper surface of the pitch conversion board 31 facing the inspected circuit board 1, the upper surface electrodes 32 are formed according to the pattern corresponding to the arrangement of the inspected electrodes 2 on the lower surface of the inspected circuit board 1, and the pitch conversion is performed. On the lower surface of the opposite side of the board 31, the lower surface electrodes 33 electrically connected to the upper surface electrodes 32 in a corresponding relationship are arranged in a standardized lattice point position, that is, in a so-called universal arrangement state. Has been done.

Each of the first anisotropic conductive sheet 35 and the second anisotropic conductive sheet 36 has a conductive path forming portion for forming a conductive path only in the thickness direction thereof. Here, the first anisotropic conductive sheet 35 or the second anisotropic conductive sheet 35
As the anisotropic conductive sheet 36, it is preferable that each conductive path forming portion is formed in a projection shape in the thickness direction on at least one surface thereof in order to exhibit high electrical contact stability.

A plurality of positioning pins 37 are provided on the lower board connector 30 so as to penetrate the first anisotropic conductive sheet 35, the pitch conversion board 31, and the second anisotropic conductive sheet 36, respectively. It is slidable.

The lower tester-side connector 50 has a third anisotropic conductive sheet 61 having elasticity, and an electrode branching distribution plate 55 arranged on the lower surface side of the third anisotropic conductive sheet 61. A fourth anisotropic conductive sheet 62 having elasticity, which is disposed on the lower surface side of the electrode branch distribution plate 55, and the fourth anisotropic conductive sheet 62.
And an inspection electrode plate device 51 disposed on the lower surface side of the anisotropic conductive sheet 62. In this example, as shown in FIG. 3, the lower tester-side connector 50 has one side (the left side in FIGS. 1 and 3) in which the movable range K of the one transport member 11 whose traveling position is moved is expanded. In addition, the circuit board 1 is arranged so as to cover a region having a total width D of 2d, which is widened by a width equivalent to the width d of the circuit board 1 to be inspected.

As shown in FIG. 4, the lower surface electrodes 3 of the pitch conversion board 31 are provided on the upper surfaces of the electrode branching / distributing plates 55, respectively.
3, the upper surface connecting electrodes 56 are formed in a state of being arranged in a grid pattern corresponding to 3, that is, all the grid point positions, and the upper surface connecting electrodes 56 are formed on the lower surface of the electrode branching / distributing plate 55.
The lower surface connection electrode 57 is formed in the same state as. In the electrode branch distribution plate 55, as will be described later, 2
Corresponding pair of upper connection electrodes 56 in one functional area
Is formed in a multi-layered structure for using as a common electrode, the upper surface connection electrode 56 and the lower surface connection electrode 57 are electrically connected in a specific relationship.

FIG. 5 is an explanatory view showing a connecting electrode element 60 used as the electrode branching / distributing plate 55. The connection electrode element 60 is formed by forming connection electrodes p at standard grid point positions arranged in the vertical and horizontal directions on one surface of a rectangular plate-shaped insulating substrate according to a so-called universal arrangement. The connecting electrode element 60 has two functional areas A and B each having a rectangular shape, the area on one surface of which is divided into two, as shown by the chain line, and each width is d. A and functional area B
In each of the above, the connection electrodes p are arranged vertically and horizontally in the same pattern arrangement.

Now, in each of the functional areas A and B,
In order to specify the connection electrodes p arranged in m rows in the vertical direction and n columns in the horizontal direction at specific positions, the address display of the connection electrodes p in the position of the m-th row and the n-th column is (m, n), and When the functional area is specified, symbols A and B indicating the functional area are added to the head of the address display. For example, the connection electrode at the first row and first column in the functional area A is represented by A (1,1).

The connection electrodes p at corresponding positions in each of the functional areas A and B of the connection electrode element 60 are electrically connected to each other by a connection member. That is, although the connection electrode p having the same address display (m, n) exists in each of the functional regions A and B, the two connection electrodes p having the same address display are electrically connected to each other. . This connection electrode electrically connected to each other is referred to as "common electrode" in this specification, and P
It will be represented by (m, n). Therefore, a certain common electrode P (m, n) is connected to the connection electrodes A (m, n) and B as two branched terminals that are electrically connected.
(M, n). The connection electrode p of the connection electrode element 60 forms the upper surface connection electrode 56 of the electrode branching / distributing plate 55. Further, in the illustrated example, the lower substrate side connector 30 is arranged at a position corresponding to the functional region B of the electrode branching / distributing plate 55.

As shown in FIG. 6, the inspection electrodes 52 are formed on the upper surface of the inspection electrode plate device 51 in a state of being arranged at all the lattice point positions corresponding to the lower surface connection electrodes 57 of the electrode branching distribution plate 55. This inspection electrode 52 is connected to an external lead terminal portion 54 formed at one end of the inspection electrode plate device 51 by a wiring circuit 53, and each terminal of the external lead terminal portion 54 is detachably connected. Connector 6
It is connected via 5 to a tester inspection circuit (not shown).

Each of the third anisotropic conductive sheet 61 and the fourth anisotropic conductive sheet 62 has a conductive path forming portion for forming a conductive path only in the thickness direction thereof. Similar to the anisotropic conductive sheet 36 of No. 2, it is preferable that the conductive path forming portion is formed in a projection shape in the thickness direction on at least one surface thereof.

Reference numeral 65 is a pressing plate for pressing the inspection electrode plate device 51 of the lower inspection jig 20 upward to raise it, which is detachably provided in a pressing mechanism (not shown).
Further, it is preferable that the pressing plate 65 is provided so that the reference level in the pressing direction, that is, the reference level at which the pressing operation is not started, can be adjusted.

As shown in FIG. 7, the intermediate pin device 40 includes a large number of conductive pins 41 and a large number of these conductive pins 41.
Each of the above is constituted by a conductive pin support mechanism 43 for supporting each of them so as to extend in the vertical direction in a state of being arranged at the lattice point position corresponding to the lower surface electrode 33 of the pitch conversion board 31. The intermediary pin device 40 in this example is arranged so as to cover an area of 2d which is twice the width d of the circuit board 1 to be inspected.

The conductive pin support mechanism 43 is provided with a horizontal base end side support plate 44 through which each of the conductive pins 41 is inserted and supported at a base end portion below the base end side support plate 4.
A horizontal central support plate 43 is provided above each of the pins 4 to support each conductive pin 41 at its central portion.

Then, at least one of all the conductive pins 41 in the region directly below the movable range K of the transport member 11 is inserted into the through holes of the base end side support plate 44 and the center support plate 45 from above. It is mounted so that it can be removed by pulling it up from the through hole. The other conductive pins 41 may be fixed to the conductive pin support mechanism 43 or may be detachable.

The center support plate 45 is connected to the base end side support plate 44 by an appropriate compressed spring mechanism 46. For example, the center support plate 45 is supported from the raised position near the center of the conductive pin 41 to the base end side support. It is provided in a lowered position close to the plate 44 so that it can be pressed against the spring force.

The intermediary pin device 40 is provided so as to be separated from the lower tester-side connector 50 and replaceable. Specifically, a plurality of cylindrical positioning protrusions 47 protruding downward are formed on the lower surface of the base end side support plate 44 of the conductive pin support mechanism 43, while the lower tester side connector 50 has a base end side. Each of the positioning protrusions 4 has a plurality of positioning holes 64 that match the positioning protrusions 47 of the side support plate 44.
It is formed corresponding to 7. And the intermediary pin device 4
0 is arranged on the lower tester side connector 50 in a state where each positioning protrusion 47 of the base end side support plate 44 is fitted into the corresponding positioning hole 64 of the lower tester side connector 50, A predetermined positional relationship with respect to the tester-side connector 50, specifically, the lower base end of each conductive pin 41 in the intermediary pin device 40 is the upper connection electrode of the electrode branching distribution plate 55 in the lower tester-side connector 50. Mounted in a relationship positioned above each of the 56.

In each of the conductive pins 41 in the illustrated example, a spherical locking portion 42 having a diameter larger than the through hole of the central support plate 45 is formed above the portion through which the central support plate 45 is inserted. The conductive pin 41 is held by the central support plate 45 so that the conductive pin 41 does not drop downward when the conductive pin support mechanism 43 is lifted and removed from the lower tester-side connector 50.

Each of the conductive pins 41 of the intermediary pin device 40 has its lower base end abutted on the upper surface of the third anisotropic conductive sheet 61 in the lower tester-side connector 50, and these multiple conductive pins 41 are connected to each other. Regarding the conductive pins 41 in the region of the conductive pins 41 facing the lower board-side connector 30 (hereinafter, referred to as “inspection execution region”), the tip of the upper side is an anisotropic conductive sheet in the lower board-side connector 30. The lower surface of 36 is abutted.

Further, in the illustrated example, a horizontal tip side having a width equivalent to the width d of the circuit board 1 to be inspected is provided at a level slightly lower than the upper tip of the conductive pin 41 in the inspection execution area. A support plate 48 is provided so as to support the conductive pin 41 through the support plate 48.
Is provided so as to be separable from other members in the intermediary pin device 40, and is coupled to the lower board side connector 30 by, for example, a positioning pin 37.

In the inspection area, an upper inspection jig 70 is arranged above the transport passage. This upper side inspection jig 70 has a structure substantially corresponding to the lower side inspection jig 20, and has an upper board side connector 71 having a width similar to the width d of the circuit board 1 to be inspected and a tester inspection. An intermediary pin device 8 for electrically connecting the contacts of the upper tester side connector 75 connected to the circuit, the upper board side connector 71 and the upper tester side connector 75 to each other.
It is composed of 0 and.

The upper board side connector 71 is provided with an elastic first anisotropic conductive sheet 72 disposed on the upper surface side of the circuit board 1 to be inspected, a pitch conversion board 74, and an upper surface of the pitch conversion board 74. The second anisotropic conductive sheet 73 disposed on the side is stacked in this order from the bottom. These correspond to the first anisotropic conductive sheet 35, the pitch conversion board 31, and the second anisotropic conductive sheet 36 in the lower board side connector 30, respectively.

The intermediary pin device 80 includes a large number of conductive pins 81.
And a conductive pin support mechanism 82 for supporting the large number of conductive pins 81 so as to extend in the vertical direction, and a horizontal tip side for inserting and supporting each conductive pin 81, which is provided at a tip end portion below each conductive pin 81. The conductive pin support mechanism 82 is composed of a support plate 84, and the conductive pin support mechanism 82 has a horizontal base end side support plate 82 that inserts and supports each conductive pin 81 at its upper base end portion and each conductive pin 81 at its central portion. It is composed of a horizontal central support plate 83 that supports the central support plate 83. They are,
These correspond to the conductive pin 41, the conductive pin support mechanism 43, and the tip side support plate 48 in the intermediary pin device 40 of the lower inspection jig 20, respectively.

As shown in FIG. 8, each conductive pin 81 of the intermediary pin device 80 has a spherical engagement with a diameter larger than the through hole 86 of the central support plate 84 at the upper part of the portion through which the central support plate 84 is inserted. The portion 87 is formed, so that the conductive pin 81 is formed.
Are held by the central support plate 84 so as not to drop downward. Further, the tip side support plate 85 is provided with all the conductive pins 81.
Is provided so as to be inserted and supported.

The upper tester-side connector 75 is provided with a third anisotropic conductive sheet 76 having elasticity and arranged at the base end of the conductive pin 81 in the intermediary pin device 80, and the third anisotropic conductive sheet 76. The electrode branching / distributing plate 77 disposed on the upper surface of the electrode, the fourth anisotropic conductive sheet 78 having elasticity disposed on the upper surface of the electrode branching / distributing plate 77, and the fourth anisotropic conductive sheet 78.
The inspection electrode plate device 79 is provided on the upper surface of the anisotropic conductive sheet 78, and the connector 88 is provided at one end of the inspection electrode plate device 79. These correspond to the third anisotropic conductive sheet, the electrode branch distribution plate 55, the fourth anisotropic conductive sheet 62 and the inspection electrode plate device 51 in the lower tester side connector 50, respectively.

The above-mentioned upper inspection jig 70 may be fixed to a fixed base, and like the lower inspection jig 20, the inspection electrodes of the upper inspection jig 70 may be fixed. The plate device 79 may be provided with a pressing plate for pressing the plate device 79 downward to lower the plate device 79 so that the plate device 79 can be lowered.

In the circuit board inspecting apparatus having the above-mentioned structure, the part of the conductive pins 41 of the intermediary pin device 40 in the lower inspection jig 20 is preliminarily set in a part of the area adjacent to the inspection execution area. By removing the conductive pin 41 in a region larger than the width of the one transport member 11, the accommodation space S for accommodating the one transport mechanism 11 is formed. This work is easy because the intermediary pin device 40 can be removed from the lower tester-side connector 50 and performed at an appropriate place. Then, the intermediary pin device 40 in which the accommodation space S is formed is attached to the lower tester-side connector 50, thereby completing the preparatory work for the inspection, and inspecting the circuit board 1 to be inspected as follows. Is done.

The inspected circuit board 1 to be inspected is the transport mechanism 1.
When transferred to the inspection area by 0, the intermediary pin device 4
When the central support plate 45 at 0 is in the lowered position, the inspection plate plate device of the lower tester side connector 50 is pressed upward by the pressing plate 65 and the lower side inspection jig 20 is raised, whereby the circuit under test is inspected. Board 1 is positioning pin 3
7 is pushed upward in a state of being positioned with respect to the lower board side connector 30, and in synchronization with this, both the one transport member 11 and the other transport member 12 of the transport mechanism 10 are moved from their running positions to both sides. It is displaced so that one of the transport members 11 and the other of the transport members 12 are located outside the circuit board 1 to be inspected. This allows
The circuit board 1 to be inspected is separated from the transport mechanism 10 and is in a free state in which it can be pinched by the lower side inspection jig 20 and the upper side inspection jig 70. Then, the circuit board 1 to be inspected is pinched between the lower side inspection jig 20 and the upper side inspection jig 70 by further raising the lower side inspection jig 20.
At this time, one transport member 11 in the transport mechanism 10
Are relatively accommodated in the accommodating space S of the ascending intermediary pin device 40.

In this way, each of the electrodes to be inspected on both the lower surface and the upper surface of the circuit board 1 to be inspected is inspected by the inspection electrode 52 of the inspection electrode plate device 51 and the inspection electrode plate device 78 in the lower tester side connector 50. By being electrically connected to the electrodes, a state of being electrically connected to the test circuit of the tester is achieved, and a desired test is performed in this state.

According to the circuit board inspection apparatus of the above-described embodiment, in the intermediate pin device 40 of the lower inspection jig 20,
The accommodating space S for one of the transport members 11 of the transport mechanism 10 can be formed in a region adjacent to the inspection execution region defined by the width dimension of the circuit board 1 to be inspected, and one transport Within the region immediately below the movable range K of the member 11, the position of the accommodation space S can be arbitrarily selected. Therefore, it is possible to always favorably cope with any of the circuit boards 1 to be inspected having various width dimensions, and one conveyance member for inspecting the circuit boards 1 to be inspected having different width dimensions. Even when the traveling position of 11 is changed, the displacement distance required to separate the one transport member 11 from the circuit board 1 to be inspected can be always sufficiently small.

Further, since the lower board side connector 30 is provided so as to be separable from the intermediary pin device 40, in the lower side inspection jig 20, when inspecting a circuit board to be inspected having a different wiring pattern, Lower board side connector 3
Since only 0 should be replaced with one corresponding to the wiring pattern of the circuit board to be inspected, the intermediate pin device 40 and the lower tester side connector 50, which are the main parts of the lower inspection jig 20, can be used in common. .

Since the intermediary pin device 40 is provided so as to be replaceable with respect to the lower tester-side connector 50, the intermediary pin device 40 can be prepared by preparing another intermediary pin device having the same basic structure. Only device 40 can be easily replaced with another intermediary pin device. Therefore, when the circuit board to be inspected to be inspected next has a different width dimension, it can be freely attached and detached according to the width dimension of the next circuit board to be inspected in another intermediary pin device prepared separately in advance. If the conductive pin is removed to form the accommodation space for the one transport member 11, the preparation work required for the next inspection of the circuit board to be inspected can be performed in a short time.

Also, the electrode branching / distributing plate 55 of the above-mentioned embodiment.
In the above, the upper surface connecting electrodes 56 are formed in the same arrangement state in the two functional regions, and the upper surface connecting electrodes 56 at corresponding positions in each functional region are electrically connected to each other by the wiring circuit 53. Since it is connected to the lower surface connection electrode 57 in the state of being used as a common electrode, the upper surface connection electrode 56 that is electrically connected to the conductive pin 41 in a certain intermediary pin device 40 exists in each of the functional regions, and accordingly the conductive area Electrical connection between the pin 41 and the inspection electrode 52 of the inspection electrode plate device 51 can be performed with a large degree of freedom. As a result, even if the electrode 2 to be inspected on the circuit board 1 to be inspected is formed in a very high-density state at a specific location, a common electrode of a functional region separated from the location is provided. By utilizing, that is, by using, so to speak, the connection electrodes at positions dispersed by the common electrode, it is possible to easily achieve the required electrical connection and perform a highly reliable test. You can

Further, in the illustrated example, since the pitch conversion boards 31 and 74, which are themselves rigid, and the electrode branching / distributing devices 55 and 77 are provided with elastic anisotropically conductive sheets on both sides, these are used. As a result, the warp and the distortion caused by the deformation are absorbed, and as a result, the pressing force applied to the lower inspection jig 20 and the upper inspection jig 70 by the pressing plate 66 can be relaxed.

When inspecting a circuit board using the above-mentioned inspection device, in the intermediary pin device 40, for example, the conductive pin in a region having a size corresponding to the width dimension of the one transport member 11 itself in the transport mechanism 10. 41 is removed to form the accommodating space S, but the conductive pin 41 in the region outside this region is left as it is, and a pinching force is applied to the tip of the remaining conductive pin 41. It is preferable to arrange and inspect the spacer 38 having a thickness equivalent to the sum of the thickness of the lower board side connector 30 and the thickness of the upper board side connector 71 in this state.

According to this structure, when the inspection device for the circuit board is used, all the conductive pins 41 in the area other than the accommodating space S in the intermediary pin device 40 are evenly contacted with each other. The clamping force applied to the inspected circuit board 1 by the side inspection jig 20 and the upper inspection jig 70 can be a pressure distribution averaged over the entire area in which the conductive pins 41 are present. Therefore, the circuit board 1 to be inspected is pinched by the pressure distribution averaged over the whole, and as a result, the circuit board 1 to be inspected can be inspected with high reliability.

In the above embodiment, the traveling position of the other conveying member 12 of the conveying mechanism 10 is set as the reference position, and one conveying member 11 is movable within its movable range K.
One outer edge of each of the lower side inspection jig 20 and the upper side inspection jig 70 is arranged according to the reference position, but in the present invention, as shown in FIG. The center position, that is, the center position between the one transport member 11 and the other transport member 12 in the transport mechanism 10 is set as a reference position, and both the one transport member 11 and the other transport member 12 are in movable ranges K1 and K2, respectively. It may be movable in the direction away from and in contact with the reference position, and the centers of the lower inspection jig 20 and the upper inspection jig 70 may be arranged in accordance with the reference position.

In such a case, the lower inspection jig 20
Regarding the accommodation space in the intermediary pin device 40, the lower inspection jig 20 is formed by forming the accommodation space S2 for accommodating the other transport member 12 in addition to the accommodation space S1 for the one transport member 11. When one is raised, the one conveying member 11 and the other conveying member 12 are accommodated, respectively, so that the displacement distances of the one conveying member 11 and the other conveying member 12 can be made short.

Further, the accommodation space S1 and the accommodation space S
By leaving the conductive pins 41 in the regions on the outer side of each of the two, the lower side inspection jig 2
0 and the clamping force applied to the circuit board 1 to be inspected by the upper side inspection jig 70 can be a pressure distribution averaged over the entire area where the conductive pin 41 exists.
As a result, high reliability can be obtained in the inspection of the circuit board.

In the circuit board inspection apparatus of the present invention,
The transport mechanism is not limited to the transport mechanism shown in the above embodiment, and various types can be used. For example, the carrier mechanism may be a carrier that moves on one of the guide rails and on the other of the guide rails while holding the circuit board 1 to be inspected at both side edges, or may have another configuration. . Further, in order to mount the intermediary pin device 40 at a predetermined position with respect to the lower tester side connector 50, the intermediary pin device 40 does not have to be directly fixed to the lower tester side connector 50, but is fixed to the pressing plate 65, for example. It may have been done.

[0062]

According to the circuit board inspection apparatus of the present invention,
By removing the detachable conductive pin of the transfer pin device, a space for accommodating the transfer mechanism can be formed in the transfer pin device, and moreover, all the conductive pins in the region immediately below the transfer mechanism movable range of the transfer mechanism can be attached and detached. Since it is provided freely, the position of the accommodating space can be arbitrarily selected within the region directly below the movable range of the transport mechanism. Therefore, it is possible to favorably cope with circuit boards having various width dimensions, and in order to inspect circuit boards having different width dimensions, the width direction of the transport mechanism can be adjusted according to the width dimensions. Even when the position is changed, by selecting the position forming the accommodation space as the position adjacent to the region where the inspection is performed, the displacement distance required to detach the transfer mechanism from the circuit board is always maintained. Can be made smaller. As a result, in a very short time after the circuit board arrives at the inspection area, the circuit board can reach an inspection ready state in which the circuit board is pinched by the upper inspection jig and the lower inspection jig. Therefore, high time efficiency can be obtained in the inspection of the circuit board.

Further, since the lower board side connector is provided so as to be separable from the intermediate pin device, in the lower side inspection jig, when inspecting a circuit board having a different wiring pattern, only the lower board side connector is used. Can be replaced with one corresponding to the wiring pattern of the circuit board, so that the intermediate pin device and the lower tester-side connector, which are the main parts of the lower inspection jig, can be used in common.

Further, since the intermediary pin device is provided so as to be replaceable with respect to the connector on the tester side, only the intermediary pin device can be easily prepared as an intermediary pin device having a similar basic structure. Can be exchanged. Therefore, even if the circuit board to be inspected next has a different width dimension, the detachable conductive pin is removed in advance according to the width dimension of the next circuit board to accommodate the space for accommodating the transfer mechanism. By preparing the intermediary pin device for exchange in which the parts are formed, the preparation work necessary for the inspection of the circuit board can be performed in a short time.

[Brief description of drawings]

FIG. 1 is an explanatory sectional view showing a configuration of a main part in an example of a circuit board inspection apparatus of the present invention.

FIG. 2 is an explanatory cross-sectional view showing the configuration of an example of a lower board side connector.

FIG. 3 is an explanatory diagram showing a positional relationship among a circuit board to be inspected, a lower board side connector, and a lower tester side connector.

FIG. 4 is an explanatory cross-sectional view showing the configuration of an example of an electrode branch distribution plate.

FIG. 5 is an explanatory diagram of an inspection electrode element used as an electrode branch distribution plate.

FIG. 6 is an explanatory cross-sectional view showing the configuration of an example of an inspection electrode plate device.

FIG. 7 is an explanatory cross-sectional view showing the configuration of an example of a transfer pin device in the lower inspection jig.

FIG. 8 is an explanatory cross-sectional view showing an example of a conductive pin of the intermediary pin device in the upper inspection jig.

FIG. 9 is an explanatory sectional view showing a configuration of a main part in another example of the circuit board inspection apparatus of the present invention.

FIG. 10 is an explanatory diagram showing a basic configuration of an example of a conventional circuit board inspection device.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Inspected circuit board 2 Inspected electrode 10 Transport mechanism 11 One transport member 12 The other transport member 13 One guide rail 14 One transport belt 15 The other guide rail 16 The other transport belt 20 Lower side inspection jig 30 Lower part Board side connector 31 Pitch conversion board 32 Upper surface electrode 33 Lower surface electrode 35 First anisotropic conductive sheet 36 Second anisotropic conductive sheet 37 Positioning pin 38 Spacer 40 Mediation pin device 41 Conductive pin 42 Locking part 43 Conductive pin Support mechanism 44 Base end side support plate 45 Central support plate 46 Spring mechanism 47 Positioning protrusion 48 Tip side support plate 50 Lower tester side connector 51 Inspection electrode plate device 52 Inspection electrode 53 Wiring circuit 54 External extraction end 55 Electrode branching distribution plate 56 upper surface connecting electrode 57 lower surface connecting electrode 58 wiring circuit 60 contact Continued electrode element 61 Third anisotropic conductive sheet 62 Fourth anisotropic conductive sheet 63 Connector 64 Positioning hole 65 Pressing plate 70 Upper inspection jig 71 Upper board side connector 72 First anisotropic conductive sheet 73 Second anisotropic conductive sheet 74 Pitch conversion board 75 Upper tester side connector 76 Third anisotropic conductive sheet 77 Electrode branching / distributing plate 78 Fourth anisotropic conductive sheet 79 Inspection electrode plate device 80 Mediation pin device 81 conductive pin 82 conductive pin support mechanism 83 base end side support plate 84 center support plate 85 front end side support plate 86 through hole 87 locking portion 88 connector K, K1, K3 movable range S, S1, S2 accommodation space p connection electrode

Claims (1)

[Claims] 1. A circuit having a transfer mechanism for transferring a circuit board to be inspected to an inspection area, in which both sides of the circuit board are pressed by an upper inspection jig and a lower inspection jig in the inspection area. A board inspection apparatus, wherein the transfer mechanism is provided so as to be movable in a horizontal direction perpendicular to a transfer direction of the circuit board in a transfer mechanism movable range, and the lower side inspection jig is a lower surface of the circuit board. Between the lower board-side connector that is electrically connected to the tester, the tester-side connector that is provided below the lower board-side connector and that is electrically connected to the tester, and the lower board-side connector and the tester-side connector. And an intermediary pin device for electrically connecting the intermediary pin device to each other. The lower board-side connector is provided so as to be separable from the intermediary pin device. Includes a large number of conductive pins and a conductive pin support mechanism that supports the conductive pins so as to extend in the vertical direction. Of the plurality of conductive pins, at least all of the conductive pins in a region immediately below the transport mechanism movable range. Each of the conductive pins
The conductive pin support mechanism is detachably supported, and the intermediary pin device is provided so as to be replaceable with respect to the tester-side connector. An inspection device for a circuit board, wherein the inspection device is attached to the tester-side connector in a state where a space for accommodating a transfer mechanism is formed by being removed.