JPH08321368A - Ic socket - Google Patents

Ic socket

Info

Publication number
JPH08321368A
JPH08321368A JP8176270A JP17627096A JPH08321368A JP H08321368 A JPH08321368 A JP H08321368A JP 8176270 A JP8176270 A JP 8176270A JP 17627096 A JP17627096 A JP 17627096A JP H08321368 A JPH08321368 A JP H08321368A
Authority
JP
Japan
Prior art keywords
contact
pin
point
lead
contact pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8176270A
Other languages
Japanese (ja)
Other versions
JP2746869B2 (en
Inventor
Toshihiko Sekiguchi
俊彦 関口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Enplas Corp
Original Assignee
Enplas Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Enplas Corp filed Critical Enplas Corp
Priority to JP8176270A priority Critical patent/JP2746869B2/en
Publication of JPH08321368A publication Critical patent/JPH08321368A/en
Application granted granted Critical
Publication of JP2746869B2 publication Critical patent/JP2746869B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Connecting Device With Holders (AREA)

Abstract

PURPOSE: To allow easy manufacture and ensure an easy slide motion in a state of pressed contact with an IC lead for the improvement of electrical contact by providing a contact pin mounting section detachably and loosely in an IC socket body. CONSTITUTION: A leg 1a engaged and fixed to a socket body 2 and a leg 1b with a spring section are formed on a contact pin 1 used for electrically connecting an IC lead 7a to a conductive pattern 5 formed on a wiring board 4, respectively as integral part of the pin 1. Also, the leg 1a is detachably and loosely engaged to a gap between a socket body inner frame 2a and outer frame 2b, and the leg 1b is fastened to an engagement section C at the inner surface upper corner of the outer frame 2b. When the lead 7a is placed on the contact point A of the pin 1 and an IC package is pressed with a pressing member 8, a contact point B comes in pressed contact with the conductive pattern 5, while sliding thereon, due to the elasticity of the pin 1. Also, the contact points A and B, and the engagement section C respectively act as a point for the application of a force, a support point and a point of application, thereby properly connecting the lead 7a and the pattern 5 to each other electrically.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はICパッケージ等電気部
品の接続用ICソケットにおいて、特に高い周波数の電
気信号を印加するのに好適なICソケットに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an IC socket for connecting an electric component such as an IC package, and more particularly to an IC socket suitable for applying an electric signal of high frequency.

【0002】[0002]

【従来の技術】高周波の電気信号を使用する場合、コン
タクトピンの長さに起因するインダクタンスがICパッ
ケージの試験結果に影響を及ぼしてしまうので、高周波
用ICソケットの場合、コンタクトピンの長さを短くす
る必要がある。このため特開平3−37983号のよう
に、平たい形状のコンタクトピンを用いることで、リー
ドと配線基板との距離を短くすることが考えられてい
た。しかしこの特開平3−37983号の発明は図8に
示すように、コンタクトピン1を配線基板4に設けられ
た部材4aに圧入によって固定したものである。或い
は、図9に示すようにコンタクトピン1をICソケット
本体2と配線基板4の間で、三点支持によって固定した
ものである。
2. Description of the Related Art When a high frequency electric signal is used, the inductance resulting from the length of the contact pin affects the test result of the IC package. Need to be short. Therefore, it has been considered to reduce the distance between the lead and the wiring board by using a contact pin having a flat shape as in JP-A-3-37983. However, in the invention of Japanese Patent Laid-Open No. 3-37983, as shown in FIG. 8, the contact pin 1 is fixed to the member 4a provided on the wiring board 4 by press fitting. Alternatively, as shown in FIG. 9, the contact pin 1 is fixed between the IC socket body 2 and the wiring board 4 by three-point support.

【0003】[0003]

【発明が解決しようとする課題】しかし、図8に示す装
置の場合、コンタクトピン1を一々圧入によって配線基
板4に取付けるので、取付けが大変で、しかも、コンタ
クトピン1が折れたり、破損したりして、交換しければ
ならない場合に、交換が大変である。また、図9の装置
の場合ICソケット本体2と配線基板4を分離すると、
コンタクトピン1がはずれてしまう。したがって、IC
ソケット本体2と配線基板4を別々に作り、使用する時
に配線基板4にICソケット本体2を取付けることがで
きない。本発明はかかる欠点を除去するもので前記コン
タクトピン取付け部をICソケット本体内に着脱可能で
かつ遊嵌状態にして取付けたICソケットを提供するも
のである。
However, in the case of the device shown in FIG. 8, since the contact pins 1 are attached to the wiring board 4 by press-fitting one by one, the attachment is difficult and the contact pins 1 are broken or damaged. Then, when it has to be replaced, the replacement is difficult. In the case of the device of FIG. 9, when the IC socket body 2 and the wiring board 4 are separated,
Contact pin 1 comes off. Therefore, IC
It is impossible to attach the IC socket body 2 to the wiring board 4 when the socket body 2 and the wiring board 4 are separately manufactured and used. The present invention eliminates such drawbacks, and provides an IC socket in which the contact pin mounting portion is detachably mounted in the IC socket body in a loosely fitted state.

【0004】[0004]

【課題を解決するための手段】上述の課題を解決するた
めに、ICリード7aと導電パターン5間に介在して略
直線的な導通路によって圧接状態で相互間を接続するよ
うにしたコンタクトピン1を有するICソケットにおい
て、上記導通路部からは嵌合固定用の第一の足1aとI
Cパッケージ7のリード7aとの間に弾性接触圧を出さ
せるためのばね部からなる第二の足1bとが一体に形成
され、第一の足1aはICソケット本体2に着脱可能に
遊嵌固定され、第二の足1bの端部はICソケット本体
2と係合する。また、配線基板4には、上記導電パター
ン5と電気的接続をするコネクターピン9を取付け、さ
らに、上記コンタクトピン1の接触点Bと摺動接触可能
な面を有するプラグ10を前記コネクターピン9に圧着
挿入した構成からなり、上記導電パターン5と、前記プ
ラグ10を介して電気的接続を行うことを特徴とする。
In order to solve the above-mentioned problems, a contact pin which is interposed between the IC lead 7a and the conductive pattern 5 and is connected to each other in a pressure contact state by a substantially linear conduction path. In the IC socket having 1, the first foot 1a for fitting and fixing and I
A second leg 1b formed of a spring portion for generating an elastic contact pressure is integrally formed with the lead 7a of the C package 7, and the first leg 1a is removably fitted and fixed to the IC socket body 2. The end portion of the second foot 1b engages with the IC socket body 2. A connector pin 9 for electrically connecting to the conductive pattern 5 is attached to the wiring board 4, and a plug 10 having a surface capable of sliding contact with the contact point B of the contact pin 1 is attached to the connector pin 9. It is characterized in that it is crimped and inserted into and is electrically connected to the conductive pattern 5 through the plug 10.

【0005】[0005]

【作用】コンタクトピン1の導通路部とリード7aとの
接触点A、導電パターン5との摺動可能な接触点B、第
二の足1bの係合部Cとがそれぞれコンタクトピン1の
力点、支点、作用点をなす。
The contact point A between the conductive path portion of the contact pin 1 and the lead 7a, the slidable contact point B with the conductive pattern 5, and the engaging portion C of the second foot 1b are the force point and the fulcrum of the contact pin 1, respectively. , Make the point of action.

【0006】[0006]

【実施例】図1、図2は本発明の第1実施例を示すもの
で、1は平板状のコンタクトピン、2は多数のコンタク
トピン1,1・・・を絶縁隔離壁3を介して並列に収容
するICソケット本体、4はそのICソケット本体2を
取付けることによって、ICパッケージの性能試験を行
うための配線基板である。5はその配線基板4に設けら
れた導電パターンである。
1 and 2 show a first embodiment of the present invention, in which 1 is a flat contact pin, 2 is a large number of contact pins 1, 1 ... The IC socket main bodies 4 accommodated in parallel are wiring boards for performing the performance test of the IC package by mounting the IC socket main bodies 2. Reference numeral 5 is a conductive pattern provided on the wiring board 4.

【0007】コンタクトピン1の取付け用のすなわち嵌
合固定用の第一の足1aは、上方に延長してソケット本
体内枠2aと外枠2bの間の空間内に遊嵌し、ビス等で
ソケット本体内枠2aと外枠2bの両端部分を取り外し
可能に固定する。コンタクトピン1のばね性を有する第
二の足1bは外枠2b内の空間を斜上方に延長してその
上外隅角部にある係合部Cに係合する。
The first leg 1a for mounting the contact pin 1, that is, for fitting and fixing, extends upward and is loosely fitted in the space between the inner frame 2a of the socket body and the outer frame 2b, and is screwed or the like. Both end portions of the socket body inner frame 2a and the outer frame 2b are detachably fixed. The spring-like second leg 1b of the contact pin 1 extends obliquely upward in the space inside the outer frame 2b and engages with the engaging portion C at the upper outer corner portion thereof.

【0008】図2はICソケット本体2を上から見た平
面図である。6はボルトで、これによってICソケット
本体2を配線基板4に固定する。
FIG. 2 is a plan view of the IC socket body 2 as seen from above. 6 is a bolt, by which the IC socket body 2 is fixed to the wiring board 4.

【0009】次に図3につきこの装置の動作を説明す
る。図3に示すようにICパッケージ7のリード7aを
コンタクトピン1の接触点A上に載置し、押圧部材8に
よってICパッケージ7を下方向に押圧すると、コンタ
クトピン1のばね部である第二の足1bが上方に向かっ
て弓状にたわみ、その下端の接触点Bが導電パターン5
上をわずかに摺動して圧接し、リード7aよりコンタク
トピン1を介して導電パターン5への略直線的な導通路
による電気的接続が行われる。この際、コンタクトピン
1の導通路部とリード7aとの接触点A、導電パターン
5との摺動可能な接触点B、第二の足1bの係合部Cと
がそれぞれコンタクトピン1の力点、支点、作用点をな
す。
Next, the operation of this device will be described with reference to FIG. As shown in FIG. 3, when the lead 7a of the IC package 7 is placed on the contact point A of the contact pin 1 and the IC package 7 is pressed downward by the pressing member 8, the second leg, which is the spring portion of the contact pin 1, is pressed. 1b bends upward in a bow shape, and the contact point B at the lower end thereof is the conductive pattern 5
A slight sliding motion is performed on the top to make a pressure contact, and an electrical connection is made from the lead 7a to the conductive pattern 5 via the contact pin 1 by a substantially linear conduction path. At this time, the contact point A between the conductive path portion of the contact pin 1 and the lead 7a, the slidable contact point B with the conductive pattern 5, and the engaging portion C of the second foot 1b are the force point and the fulcrum of the contact pin 1, respectively. , Make the point of action.

【0010】図4は本発明の第2実施例を示すもので、
コンタクトピン1の取付け部の第一の足1aの上端は略
トランプのダイヤのような形状のグロメットを形成し、
ICソケット本体2の穴2c内に嵌入することで、コン
タクトピン1をソケット本体2に対して揺動可能に取付
ける。もし、使用中にコンタクトピン1が折れたり、破
損したりして交換の必要な場合は、逆にコンタクトピン
1を引っ張って抜く。
FIG. 4 shows a second embodiment of the present invention.
The upper end of the first foot 1a of the mounting portion of the contact pin 1 forms a grommet having a shape like a diamond of a playing card,
The contact pin 1 is swingably attached to the socket body 2 by being fitted into the hole 2c of the IC socket body 2. If the contact pin 1 is broken or damaged during use and needs to be replaced, on the contrary, pull the contact pin 1 out.

【0011】図5,図6は本発明の第3実施例を示し、
図5はその要部の縦断面図で、図6は、コネクターピン
9とプラグ10の斜視図である。配線基板4にコネクタ
ーピン9を導電パターン5と接続状態となるように取付
け、コネクターピン9の上穴内にプラグ10を挿入す
る。プラグ10の上の面10a上に、前記コンタクトピ
ン1を載置するものである。この実施例では導電パター
ン5とコンタクトピン1とが直接擦れ合わないので、導
電パターン5を傷める心配がない。
5 and 6 show a third embodiment of the present invention,
FIG. 5 is a vertical cross-sectional view of the main part thereof, and FIG. 6 is a perspective view of the connector pin 9 and the plug 10. The connector pin 9 is attached to the wiring board 4 so as to be connected to the conductive pattern 5, and the plug 10 is inserted into the upper hole of the connector pin 9. The contact pin 1 is placed on the upper surface 10a of the plug 10. In this embodiment, since the conductive pattern 5 and the contact pin 1 do not directly rub against each other, there is no fear of damaging the conductive pattern 5.

【0012】上記実施例では、Jベント型リードを有す
るICパッケージについてのみ説明したが、本発明はそ
れに限定するものではなく、コンタクトピン1のリード
7aとの接触部と押圧部材8の形状を変えることで、例
えば図7に示すガルウイング型のリードを有するICパ
ッケージや、或いはストレート型のリードを有するIC
パッケージなどにも適用できる。
In the above embodiment, only the IC package having the J-vent type lead has been described. However, the present invention is not limited to this, and the contact portion of the contact pin 1 with the lead 7a and the shape of the pressing member 8 are changed. Thus, for example, an IC package having a gull-wing type lead shown in FIG. 7 or an IC having a straight type lead
It can also be applied to packages.

【0013】[0013]

【発明の効果】以上のように本発明では、コンタクトピ
ンの取付け部をICソケット本体内に着脱可能でかつ遊
嵌状態にして取付けているので、従来の圧入によってコ
ンタクトピンを固定するものより製造が容易で、しか
も、コンタクトピンの交換も楽であり、更に、コンタク
トピンを遊嵌状態にしてあるので、コンタクトピンが動
きやすく、ICリードを押圧接触した場合に摺動接触的
な作動が無理なく行われ、コンタクトピン,またはIC
パッケージのリードに付着した酸化被膜を破壊するワイ
ピング効果が大きいので接触が良好である。
As described above, according to the present invention, since the mounting portion of the contact pin is removably mounted in the IC socket body and is mounted in a loosely fitted state, it is manufactured by a conventional press-fitting method. It is easy to replace the contact pin, and the contact pin is easy to move. Since the contact pin is loosely fitted, the contact pin is easy to move and sliding contact operation is impossible when the IC lead is pressed and contacted. Done without contact pins, or IC
A good wiping effect that destroys the oxide film attached to the leads of the package is good, and therefore good contact is obtained.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1実施例の要部の縦断面図である。FIG. 1 is a vertical cross-sectional view of a main part of a first embodiment of the present invention.

【図2】その平面図である。FIG. 2 is a plan view thereof.

【図3】その動作説明図である。FIG. 3 is an explanatory diagram of its operation.

【図4】本発明の第2実施例の要部の縦断面図である。FIG. 4 is a longitudinal sectional view of a main part of a second embodiment of the present invention.

【図5】本発明の第3実施例の要部の縦断面図である。FIG. 5 is a vertical cross-sectional view of the essential parts of a third embodiment of the present invention.

【図6】そのプラグ10とコネクターピン9の斜視図で
ある。
FIG. 6 is a perspective view of the plug 10 and the connector pin 9.

【図7】本発明の第4実施例の要部の縦断面図である。FIG. 7 is a vertical cross-sectional view of a main part of a fourth embodiment of the present invention.

【図8】従来の装置を示す縦断面図である。FIG. 8 is a vertical cross-sectional view showing a conventional device.

【図9】従来の装置の他の例を示す縦断面図である。FIG. 9 is a vertical cross-sectional view showing another example of the conventional device.

【符号の説明】[Explanation of symbols]

1 コンタクトピン 1a 第一の足 1b 第二の足 2 ICソケット本体 5 導電パターン 7 ICパッケージ 7a ICリード 9 コネクターピン 10 プラグ 1 Contact Pin 1a First Foot 1b Second Foot 2 IC Socket Body 5 Conductive Pattern 7 IC Package 7a IC Lead 9 Connector Pin 10 Plug

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 ICリードと配線基板間に介在して略直
線的な導通路によって圧接状態で相互間を接続するよう
にしたコンタクトピンを有するICソケットにおいて、
上記導通路部からは嵌合固定用の第一の足とICパッケ
ージのリードとの間に弾性接触圧を出させるためのばね
部からなる第二の足とが一体に形成され、第一の足はI
Cソケット本体に着脱可能に遊嵌固定され、第二の足の
端部はICソケット本体と係合するようにして、コンタ
クトピンの導通路部とリードとの接触点A、導電パター
ンとの摺動可能な接触点B、第二の足の係合部Cとがそ
れぞれコンタクトピンの力点、支点、作用点をなすよう
に構成したICソケット。
1. An IC socket having a contact pin which is interposed between an IC lead and a wiring board and which is connected to each other in a pressure contact state by a substantially linear conduction path,
A first foot for fitting and fixing and a second foot made of a spring portion for generating elastic contact pressure are integrally formed from the conduction path portion between the lead of the IC package and the first foot. I
It is detachably fitted and fixed to the C socket body, and the end of the second leg engages with the IC socket body so that the contact point A of the contact pin and the lead can slide and the conductive pattern can slide. An IC socket configured such that the contact point B and the engagement portion C of the second foot form a force point, a fulcrum point, and an action point of the contact pin, respectively.
【請求項2】 上記配線基板には、上記導電パターンと
電気的接続をするコネクターピンを取付け、さらに、上
記コンタクトピンの接触点Bと摺動接触可能な面を有す
るプラグを前記コネクターピンに圧着挿入した構成から
なり、上記導電パターンと、前記プラグを介して電気的
接続を行うことを特徴とする請求項1のICソケット。
2. A connector pin for electrically connecting to the conductive pattern is attached to the wiring board, and a plug having a surface capable of sliding contact with a contact point B of the contact pin is crimped to the connector pin. The IC socket according to claim 1, wherein the IC socket has an inserted structure and is electrically connected to the conductive pattern through the plug.
JP8176270A 1996-07-05 1996-07-05 IC socket Expired - Fee Related JP2746869B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8176270A JP2746869B2 (en) 1996-07-05 1996-07-05 IC socket

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8176270A JP2746869B2 (en) 1996-07-05 1996-07-05 IC socket

Publications (2)

Publication Number Publication Date
JPH08321368A true JPH08321368A (en) 1996-12-03
JP2746869B2 JP2746869B2 (en) 1998-05-06

Family

ID=16010643

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8176270A Expired - Fee Related JP2746869B2 (en) 1996-07-05 1996-07-05 IC socket

Country Status (1)

Country Link
JP (1) JP2746869B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1126125A (en) * 1997-07-01 1999-01-29 Japan Aviation Electron Ind Ltd Ic socket
JPH1131566A (en) * 1997-02-10 1999-02-02 Micronics Japan Co Ltd Auxiliary device for testing material to be inspected
JPH11162605A (en) * 1997-11-25 1999-06-18 Micronics Japan Co Ltd Electric connecting device
WO2012118026A1 (en) * 2011-03-01 2012-09-07 日本発條株式会社 Contact probe and probe unit
WO2012169831A2 (en) * 2011-06-08 2012-12-13 수도겐조 Probe apparatus for testing chips

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0337983A (en) * 1989-07-04 1991-02-19 Yamaichi Electric Mfg Co Ltd Contact

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0337983A (en) * 1989-07-04 1991-02-19 Yamaichi Electric Mfg Co Ltd Contact

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1131566A (en) * 1997-02-10 1999-02-02 Micronics Japan Co Ltd Auxiliary device for testing material to be inspected
JPH1126125A (en) * 1997-07-01 1999-01-29 Japan Aviation Electron Ind Ltd Ic socket
JPH11162605A (en) * 1997-11-25 1999-06-18 Micronics Japan Co Ltd Electric connecting device
WO2012118026A1 (en) * 2011-03-01 2012-09-07 日本発條株式会社 Contact probe and probe unit
WO2012169831A2 (en) * 2011-06-08 2012-12-13 수도겐조 Probe apparatus for testing chips
WO2012169831A3 (en) * 2011-06-08 2013-03-07 수도겐조 Probe apparatus for testing chips

Also Published As

Publication number Publication date
JP2746869B2 (en) 1998-05-06

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