JPH08266996A - Rotary coating method - Google Patents

Rotary coating method

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Publication number
JPH08266996A
JPH08266996A JP7434295A JP7434295A JPH08266996A JP H08266996 A JPH08266996 A JP H08266996A JP 7434295 A JP7434295 A JP 7434295A JP 7434295 A JP7434295 A JP 7434295A JP H08266996 A JPH08266996 A JP H08266996A
Authority
JP
Japan
Prior art keywords
substrate
stage
resist
temperature
rotary stage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7434295A
Other languages
Japanese (ja)
Inventor
Takashi Ueno
隆 上野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toppan Inc
Original Assignee
Toppan Printing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toppan Printing Co Ltd filed Critical Toppan Printing Co Ltd
Priority to JP7434295A priority Critical patent/JPH08266996A/en
Publication of JPH08266996A publication Critical patent/JPH08266996A/en
Pending legal-status Critical Current

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  • Application Of Or Painting With Fluid Materials (AREA)
  • Coating Apparatus (AREA)

Abstract

PURPOSE: To eliminate coating irregularity or inferiority and to enhance film thickness uniformity by individually controlling respective surface temps. measured by dividing the surfaces of a stage and a rotary stage in a matrix state and controlling the temp. of a dripping resist soln. and air in a spin cup. CONSTITUTION: The surfaces of a stage 1 and a rotary stage 10 are divided into respective matrix sections and the surface temps. of the respective sections are measured to individually control the respective sections by a control part to uniformize the surface temps., for example, to 25 deg.C. A substrate 9 to be coated is once placed on the substrate stage 1 and the surface temp. thereof is uniformized to 25 deg.C and this substrate 9 is placed and fixed on the rotary stage 10 of which the surface temp. is uniformized to 25 deg.C within a rotary coating apparatus. Subsequently, a necessary amt. of a resist 13 of which the temp. is regulated to 25 deg.C is dripped on the substrate 9 to be coated from a nozzle 12 and, after a lid 14 is allowed to fall to cover the rotary stage 10, the rotary stage 10 is rotated at a predetermined speed. At this time, air of which the temp. is regulated to 23 deg.C is supplied into a spin cup 11 to be discharged.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、カラーフィルター用ガ
ラス板等の板状基板表面に対して感光性樹脂等の塗布膜
を形成するコーティング方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a coating method for forming a coating film of a photosensitive resin or the like on the surface of a plate-shaped substrate such as a glass plate for a color filter.

【0002】[0002]

【従来の技術】液晶表示装置用カラーフィルター等の製
造プロセスにおける感光性着色レジストのコーティング
方法のうち、回転塗布法が広く用いられている。すなわ
ち、被塗布基板を回転ステージ上に固定し、基板上にレ
ジストを滴下後、被塗布基板の載った回転ステージを覆
うスピンカップと共に被塗布基板の載った回転ステージ
を回転させることにより、基板上に滴下されたレジスト
を被塗布基板表面に塗り広げる塗布方法である。この回
転塗布法においては従来、塗布膜厚均一性、すなわち同
一基板上における塗布膜厚のばらつきは5%程度が一般
的とされている。しかしながら、基板、回転塗布法に用
いる装置の各部分、レジスト及び雰囲気温度等の間の温
度差により、基板上のレジストの粘性率に部位による差
異が生じるものである。このため塗布膜厚均一性が5%
以内であっても、例えば平均塗布膜厚が1.2μmのと
き、膜厚1.18μmの領域と膜厚1.23μmの領域が近接す
るというように急峻な塗布膜厚のばらつきによって塗布
ムラとして視認される不良がしばしば発生していた。
2. Description of the Related Art Of the methods for coating a photosensitive colored resist in the manufacturing process of color filters for liquid crystal display devices, the spin coating method is widely used. That is, by fixing the substrate to be coated on the rotating stage, dropping the resist onto the substrate, and then rotating the rotating stage on which the substrate to be coated is rotated together with the spin cup covering the rotating stage on which the substrate to be coated is placed, It is a coating method of spreading the resist dropped onto the surface of the substrate to be coated. In the spin coating method, it has been generally known that the uniformity of the coating film thickness, that is, the variation of the coating film thickness on the same substrate is about 5%. However, due to the temperature difference between the substrate, each part of the apparatus used in the spin coating method, the resist, the ambient temperature, etc., the viscosity coefficient of the resist on the substrate varies from part to part. Therefore, the coating thickness uniformity is 5%
Even within the range, for example, when the average coating film thickness is 1.2 μm, the unevenness in the coating film thickness is visually recognized as the coating unevenness due to the steep variation in the coating film thickness such that the region with the film thickness of 1.18 μm and the region with the film thickness of 1.23 μm are close to each other. Defects often occurred.

【0003】この問題に対しては既に、塗布するレジス
トの温度調節や、被塗布基板の加温および冷却による温
度調節等は個別には実施されてきてはいるものの、総合
的な温度調節は為されていない。このため感光性レジス
ト、特に着色レジストの如くチキソトロピー(所謂チキ
ソ性)、すなわち外力によりゲルの内部結合が一部また
は全部破壊されて流動性のゾルに変わり、これを放置し
ておくと再び粒子間の結合が再現されてゲルになるとい
う性質を有する塗布液を用いる回転塗布方法において
は、塗布液〜被塗布基板間で微小な温度差が生じてお
り、これが膜厚不均一を生じる原因となっていた。
For this problem, although the temperature control of the resist to be coated, the temperature control of the substrate to be coated by heating and cooling, etc. have already been individually carried out, a comprehensive temperature control is necessary. It has not been. For this reason, like a photosensitive resist, especially a colored resist, thixotropy (so-called thixotropic property), that is, the internal bond of the gel is partially or completely destroyed by an external force to be changed to a fluid sol, and when it is left as it is, the interparticles are regenerated. In the spin coating method using a coating liquid having a property that the bond of is reproduced and becomes a gel, a minute temperature difference occurs between the coating liquid and the substrate to be coated, which causes uneven film thickness. Was there.

【0004】[0004]

【発明が解決しようとする課題】本発明は、上記のよう
な塗布ムラ不良の発生を無くし、膜厚均一性を高めた塗
布方法を提供しようとするものである。
SUMMARY OF THE INVENTION An object of the present invention is to provide a coating method which eliminates the above-mentioned defective coating unevenness and improves the film thickness uniformity.

【0005】[0005]

【課題を解決するための手段】本発明は、基板搬送手段
より板状の基板を受け、基板を戴置するステージと、前
記ステージより搬送された基板を受け戴置固定する回転
ステージと、ノズルより前記回転ステージ上の基板にレ
ジストを滴下するレジスト供給手段と、前記回転ステー
ジの回転時に回転ステージを覆い、前記回転ステージと
共に回転するスピンカップとからなる回転塗布装置を用
い、回転ステージを回転させることにより基板上に滴下
されたレジストを均一膜厚にて基板表面に塗り広げる回
転塗布方法において、前記ステージおよび回転ステージ
表面を各々マトリックス状の区画に分け、各区画の表面
温度を測定する手段と、該各区画の表面温度を別個に制
御する手段と、前記ノズルより滴下されるレジスト液の
温度を制御する手段と、前記スピンカップ内に所望する
温度の空気を供給しつつスピンカップ内空気を排気する
手段とを具備することを特徴とする回転塗布方法であ
る。
SUMMARY OF THE INVENTION According to the present invention, a stage for receiving a plate-shaped substrate from a substrate transfer unit and mounting the substrate thereon, a rotary stage for mounting and fixing the substrate transferred from the stage, and a nozzle. The rotating stage is rotated by using a spin coater including a resist supply unit that drops the resist onto the substrate on the rotating stage, and a spin cup that covers the rotating stage when the rotating stage rotates and rotates together with the rotating stage. In the spin coating method in which the resist dropped on the substrate is spread on the substrate surface with a uniform film thickness, the stage and the rotary stage surface are each divided into matrix-shaped sections, and a means for measuring the surface temperature of each section is provided. A means for controlling the surface temperature of each section separately and a means for controlling the temperature of the resist solution dropped from the nozzle. When a spin coating method characterized by comprising a means for evacuating the spin cup air while supplying the desired temperature of the air in the spin cup.

【0006】また本発明は、前記の回転塗布装置をサー
マルチャンバーで覆い、サーマルチャンバー内の雰囲気
温度を制御する手段を具備することを特徴とする回転塗
布方法である。また本発明は、前記のステージおよび回
転ステージ表面のマトリックス状の区画を3×3以上と
することを特徴とする回転塗布方法である。
Further, the present invention is a spin coating method characterized in that the above spin coating apparatus is covered with a thermal chamber, and means for controlling the ambient temperature in the thermal chamber is provided. Further, the present invention is the spin coating method, characterized in that the matrix-shaped sections on the surface of the stage and the rotary stage are set to 3 × 3 or more.

【0007】すなわち本発明者らは上記課題に鑑み鋭意
検討を行い、以下に示すような4つの要素に対策を講じ
ることにより、基板、塗布液及び雰囲気温度に対し温度
調節を行った回転塗布法を提案するものである。 <1>基板接触部温度制御 図1および図2に示すように、基板ステージ1表面を例
えばマトリックス状に複数の区画に分割する。ここで分
割した各区画毎のステージ表面温度を測定するものであ
る。この温度測定手段として、例えばサーミスタ2を各
区画毎に設ける、または、サーモグラフィーを用い、各
区画の温度を測定する等があげられる。次いで図1に示
すように、温度測定手段により測定された各表面温度デ
ータは制御部に送られる。次いで、制御部は、受けた各
表面の温度データに相違があった場合、各表面温度を均
一にすべく各区画へ温度調節の指令を出す。図1の例で
は冷却の場合、冷却管用の指令を出し、加温の場合ヒー
ター用の指令を出している。ここで図2の例に示すよう
に、各区画毎に設けられたヒーター4および冷却管5
を、各々受けた指示をもとに作動させることで、各区画
表面の温度を一定にすべく制御を行う。これにより基板
ステージ1表面における温度のバラツキをなくすこと
で、基板ステージ1上に戴置される基板の表面温度のバ
ラツキをなくすものである。また必要に応じ、スピンカ
ップ内の回転ステージ10のガラス基板保持用バキュー
ムチャックに上記と同様の温度測定手段および制御手段
を装備する。
That is, the inventors of the present invention have made intensive studies in view of the above problems, and have taken countermeasures against the following four elements to make a spin coating method in which the temperature is adjusted with respect to the substrate, coating solution, and ambient temperature. Is proposed. <1> Temperature Control of Substrate Contact Portion As shown in FIGS. 1 and 2, the surface of the substrate stage 1 is divided into a plurality of sections, for example, in a matrix. The stage surface temperature is measured for each of the divided sections. As the temperature measuring means, for example, a thermistor 2 may be provided for each section, or thermography may be used to measure the temperature of each section. Next, as shown in FIG. 1, each surface temperature data measured by the temperature measuring means is sent to the controller. Next, when there is a difference in the received temperature data of each surface, the control unit issues a temperature adjustment command to each section in order to make each surface temperature uniform. In the example of FIG. 1, a command for the cooling pipe is issued in the case of cooling, and a command for the heater is issued in the case of heating. Here, as shown in the example of FIG. 2, a heater 4 and a cooling pipe 5 provided for each section
Is operated based on the respective instructions received, so that the temperature of each section surface is controlled to be constant. As a result, variations in the temperature of the surface of the substrate stage 1 are eliminated, and variations in the surface temperature of the substrate placed on the substrate stage 1 are eliminated. If necessary, the glass substrate holding vacuum chuck of the rotary stage 10 in the spin cup is equipped with the same temperature measuring means and control means as described above.

【0008】<2>レジスト ノズル12より基板上に滴下されるレジスト13液の温
度を調節する手段として、例えば図3に示すように、内
部温度を所望する温度に調節したレジストタンク6と導
管内をレジスト13が常時還流する構造とし、これによ
りレジスト13を所望する温度に保つ。次いでレジスト
13塗布時には必要量のレジスト13を切り替え弁7よ
り分流させてノズル12に引き込む。ここでレジスト1
3がノズル12内を通過するときの温度変化を防ぐた
め、ノズル12は温調ジャケットで覆われており、これ
によりレジスト13液を所望する温度にて基板上に滴下
することが可能となる。
<2> As means for adjusting the temperature of the resist 13 liquid dropped from the resist nozzle 12 onto the substrate, for example, as shown in FIG. 3, the resist tank 6 and the conduit in which the internal temperature is adjusted to a desired temperature are provided. The resist 13 has a structure in which the resist 13 constantly returns to maintain the resist 13 at a desired temperature. Next, when the resist 13 is applied, a necessary amount of the resist 13 is diverted from the switching valve 7 and drawn into the nozzle 12. Resist here 1
In order to prevent the temperature change when 3 passes through the inside of the nozzle 12, the nozzle 12 is covered with a temperature control jacket, which allows the resist 13 solution to be dripped onto the substrate at a desired temperature.

【0009】<3>コーティング装置内 図4に示すように回転ステージ10を覆うスピンカップ
11内に、所望の温度に温度調節した空気を供給しつつ
スピンカップ11内の空気を排気する構造の温度制御手
段を備える。 <4>サーマルチャンバー 図4に示すように、回転塗布装置全体を温度調節された
サーマルチャンバー8で覆うことにより、チャンバー内
の雰囲気温度を一定に制御する。以上<3>と<4>
は、回転塗布装置の置かれたクリーンルーム内の温度調
節だけでは一定化しきれない回転塗布装置周辺及び装置
内部の雰囲気温度の制御を補うため、さらに2段階を加
え厳密に調節するものである。
<3> Inside coating apparatus As shown in FIG. 4, the temperature of the structure in which the air inside the spin cup 11 is exhausted while the air whose temperature is adjusted to a desired temperature is supplied into the spin cup 11 that covers the rotary stage 10. A control means is provided. <4> Thermal Chamber As shown in FIG. 4, by covering the entire spin coating apparatus with a temperature-controlled thermal chamber 8, the atmospheric temperature in the chamber is controlled to be constant. Above <3> and <4>
In order to supplement the control of the ambient temperature inside and around the spin coating apparatus, which cannot be made constant only by adjusting the temperature in the clean room where the spin coating apparatus is placed, two more stages are added to strictly control.

【0010】[0010]

【作用】上記<1>〜<4>の総合的な温度調節によ
り、基板表面の温度は、部位によるバラツキなく全面を
所望する温度にすることができ、また、レジスト液の温
度も常に所望の温度に保たれる。これにより、塗布時の
基板表面およびレジスト液の温度差をなくすことで塗布
膜厚の均一化を図り、塗布ムラ不良の発生をなくす。
By the comprehensive temperature control of <1> to <4> described above, the temperature of the substrate surface can be set to a desired temperature on the entire surface without variation due to the site, and the temperature of the resist solution is always desired. Kept at temperature. As a result, the temperature difference between the substrate surface and the resist solution during coating is eliminated, so that the coating film thickness is made uniform and the occurrence of coating unevenness is eliminated.

【0011】[0011]

【実施例】本発明の実施例を図面を用いて説明する。カ
ラーフィルター用ガラス板等の板状基板表面に対して感
光性樹脂等を塗布形成する工程においてはまず、基板搬
送手段(図示せず)より受けた板状の被塗布基板9は、
図4に示すように基板ステージ1上に一旦戴置されるも
のである。この際、基板ステージ1は、図2に示すよう
にその表面を4×4個のマトリックス状の区画に分け、
表面にサーミスタ2を配置し、その中心部にあるプロー
ブ3により各区画の表面温度を測定する。ここで測定さ
れた各区画毎の温度データを、図1に示すように制御部
に伝達し、この制御部からの制御により加熱または冷却
手段、すなわち図2に示す、サーミスタ2の直下に各区
画毎に設置されたヒーター4および冷却管5を作動さ
せ、各区画表面を別個に加熱または冷却した。これによ
り、基板ステージ1の表面温度を25℃に均一化するとと
もに、基板ステージ1上の被塗布基板9の表面温度も25
℃に均一化された。
Embodiments of the present invention will be described with reference to the drawings. In the step of applying and forming a photosensitive resin or the like on the surface of a plate-shaped substrate such as a glass plate for a color filter, first,
As shown in FIG. 4, it is temporarily placed on the substrate stage 1. At this time, the substrate stage 1 has its surface divided into 4 × 4 matrix-shaped sections as shown in FIG.
The thermistor 2 is arranged on the surface, and the surface temperature of each section is measured by the probe 3 at the center thereof. The temperature data of each section measured here is transmitted to the control section as shown in FIG. 1, and the section is arranged directly under the thermistor 2 shown in FIG. The heater 4 and the cooling pipe 5 installed for each of them were operated to individually heat or cool the surface of each compartment. As a result, the surface temperature of the substrate stage 1 is made uniform to 25 ° C., and the surface temperature of the substrate 9 to be coated on the substrate stage 1 is also 25 ° C.
Homogenized to ° C.

【0012】次いで、基板ステージ1より搬送された被
塗布基板9は、図4に示すように回転塗布装置内の回転
ステージ10上に戴置固定される。ここで回転ステージ
10の基板保持用バキュームチャックにも前記の基板ス
テージ1同様の温度制御手段を装備しており基板温度の
均一化を図った。
Next, the substrate 9 to be coated conveyed from the substrate stage 1 is placed and fixed on the rotary stage 10 in the rotary coating apparatus as shown in FIG. Here, the vacuum chuck for holding the substrate of the rotary stage 10 is also equipped with the same temperature control means as the above-mentioned substrate stage 1, so that the substrate temperature is made uniform.

【0013】次いで、図3に示すようなレジスト13供
給手段、すなわち25℃に温度調節したレジストタンク6
と導管内をレジスト13が還流する構造であって、レジ
スト13塗布時には必要量のレジスト13を切り替え弁
7より分流させてノズル12に引き込む構造のレジスト
温度調節システムより供給されるレジスト13、例えば
フジハント社製顔料分散フォトレジスト、商品名「CR-2
000」を、図4に示すように回転ステージ10上の被塗
布基板9表面に滴下した。
Next, the resist 13 supply means as shown in FIG. 3, that is, the resist tank 6 whose temperature is adjusted to 25.degree.
A resist 13 is supplied from a resist temperature control system having a structure in which the resist 13 circulates in the conduit and a structure in which a necessary amount of the resist 13 is diverted from the switching valve 7 and drawn into the nozzle 12 when the resist 13 is applied, for example, Fuji Hunt. Pigment dispersion photoresist, trade name "CR-2"
000 ”was dropped on the surface of the substrate 9 to be coated on the rotary stage 10 as shown in FIG.

【0014】次いで蓋15が降下してスピンカップ11
と一体になることで回転ステージ10を覆った後、スピ
ンカップ11は800rpm、10秒間の条件で前記回転ステー
ジ10、被塗布基板9と共に回転する。この回転により
被塗布基板9上に滴下されたレジスト13を均一膜厚に
て被塗布基板9表面に塗布した。
Next, the lid 15 descends and the spin cup 11
After covering the rotary stage 10 by being integrated with the spin cup 11, the spin cup 11 rotates together with the rotary stage 10 and the substrate 9 to be coated under the condition of 800 rpm for 10 seconds. By this rotation, the resist 13 dropped on the substrate 9 to be coated was coated on the surface of the substrate 9 to be coated with a uniform film thickness.

【0015】なお図4に示すように、コーターのスピン
カップ11内に23℃に温度調節した空気を供給しつつス
ピンカップ11内の空気を排気する構造の温度制御手段
が備えられ、かつ、この回転塗布装置全体は、サーマル
チャンバー8で覆われ、チャンバー内全体の雰囲気温度
が23℃に制御されている。
As shown in FIG. 4, temperature control means having a structure for exhausting the air in the spin cup 11 while supplying the air whose temperature is adjusted to 23 ° C. to the spin cup 11 of the coater is provided. The entire spin coater is covered with a thermal chamber 8 and the ambient temperature inside the chamber is controlled to 23 ° C.

【0016】[0016]

【発明の効果】本発明の構成による総合的な温度調節に
より塗布膜厚の均一化を図り、塗布ムラ発生の問題を解
消する。また、本発明の構成によれば、大型のカラーフ
ィルター基板にも容易に対応でき、有効である。また、
プレベーク後の冷却は、本発明の積極的な温調を利用す
れば自然放熱による冷却に比べ冷却時間を短縮できるの
で、スループットの向上が期待できる。
EFFECTS OF THE INVENTION By the comprehensive temperature control according to the present invention, the coating film thickness is made uniform, and the problem of coating unevenness is solved. Further, according to the configuration of the present invention, it is possible to easily cope with a large-sized color filter substrate and it is effective. Also,
Cooling after prebaking can be expected to improve throughput because the cooling time can be shortened as compared with cooling by natural heat dissipation by utilizing the positive temperature control of the present invention.

【0017】[0017]

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の主要部を構成する基板温度制御システ
ムの実施例を示す平面説明図である。
FIG. 1 is an explanatory plan view showing an embodiment of a substrate temperature control system which constitutes a main part of the present invention.

【図2】本発明の主要部を構成する基板温度制御ユニッ
トの実施例を示す斜視説明図である。
FIG. 2 is a perspective explanatory view showing an embodiment of a substrate temperature control unit which constitutes a main part of the present invention.

【図3】本発明を構成するレジスト供給システムの実施
例を示す説明図である。
FIG. 3 is an explanatory diagram showing an embodiment of a resist supply system that constitutes the present invention.

【図4】本発明を構成する温度調節対策の各要素を示す
説明図である。
FIG. 4 is an explanatory diagram showing each element of the temperature control measure that constitutes the present invention.

【符号の説明】[Explanation of symbols]

1 基板ステージ 2 サーミスタ 3 プローブ 4 ヒーター 5 冷却管 6 レジストタンク 7 切り替え弁 8 サーマルチャンバー 9 被塗布基板 10 回転ステージ 11 スピンカップ 12 ノズル 13 レジスト 14 蓋 15 導管 1 substrate stage 2 thermistor 3 probe 4 heater 5 cooling pipe 6 resist tank 7 switching valve 8 thermal chamber 9 substrate to be coated 10 rotating stage 11 spin cup 12 nozzle 13 resist 14 lid 15 conduit

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】基板搬送手段より板状の基板を受け、基板
を戴置するステージと、前記ステージより搬送された基
板を受け戴置固定する回転ステージと、ノズルより前記
回転ステージ上の基板にレジストを滴下するレジスト供
給手段と、前記回転ステージの回転時に回転ステージを
覆い、前記回転ステージと共に回転するスピンカップと
からなる回転塗布装置を用い、回転ステージを回転させ
ることにより基板上に滴下されたレジストを均一膜厚に
て基板表面に塗り広げる回転塗布方法において、前記ス
テージおよび回転ステージ表面を各々マトリックス状の
区画に分け、各区画の表面温度を測定する手段と、該各
区画の表面温度を別個に制御する手段と、前記ノズルよ
り滴下されるレジスト液の温度を制御する手段と、前記
スピンカップ内に所望する温度の空気を供給しつつスピ
ンカップ内空気を排気する手段とを具備することを特徴
とする回転塗布方法。
1. A stage for receiving a plate-shaped substrate from a substrate transfer means and mounting the substrate thereon, a rotary stage for mounting and fixing the substrate transferred from the stage, and a substrate on the rotary stage from a nozzle. Using a spin coater consisting of a resist supply means for dropping the resist and a spin cup that covers the rotary stage when the rotary stage rotates and rotates with the rotary stage, the rotary stage is rotated to drop the resist on the substrate. In a spin coating method of spreading a resist on a substrate surface with a uniform film thickness, the stage and the rotary stage surface are each divided into matrix-shaped sections, and means for measuring the surface temperature of each section and the surface temperature of each section are Means for controlling separately, means for controlling the temperature of the resist solution dropped from the nozzle, and the inside of the spin cup. Spin coating method characterized by comprising a means for evacuating the spin cup air while supplying the temperature of the air Nozomu.
【請求項2】回転塗布装置をサーマルチャンバーで覆
い、サーマルチャンバー内の雰囲気温度を制御する手段
を具備することを特徴とする請求項1記載の回転塗布方
法。
2. The spin coating method according to claim 1, further comprising means for covering the spin coating device with a thermal chamber and controlling the atmospheric temperature in the thermal chamber.
【請求項3】ステージおよび回転ステージ表面のマトリ
ックス状の区画を3×3以上とすることを特徴とする請
求項1または2記載の回転塗布方法。
3. The spin coating method according to claim 1, wherein the matrix-like divisions on the surface of the stage and the rotary stage are 3 × 3 or more.
JP7434295A 1995-03-31 1995-03-31 Rotary coating method Pending JPH08266996A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7434295A JPH08266996A (en) 1995-03-31 1995-03-31 Rotary coating method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7434295A JPH08266996A (en) 1995-03-31 1995-03-31 Rotary coating method

Publications (1)

Publication Number Publication Date
JPH08266996A true JPH08266996A (en) 1996-10-15

Family

ID=13544363

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7434295A Pending JPH08266996A (en) 1995-03-31 1995-03-31 Rotary coating method

Country Status (1)

Country Link
JP (1) JPH08266996A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012040501A (en) * 2010-08-19 2012-03-01 Seiko Epson Corp Drawing apparatus, and drawing method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012040501A (en) * 2010-08-19 2012-03-01 Seiko Epson Corp Drawing apparatus, and drawing method

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