JPH082624Y2 - 試験装置 - Google Patents

試験装置

Info

Publication number
JPH082624Y2
JPH082624Y2 JP11135288U JP11135288U JPH082624Y2 JP H082624 Y2 JPH082624 Y2 JP H082624Y2 JP 11135288 U JP11135288 U JP 11135288U JP 11135288 U JP11135288 U JP 11135288U JP H082624 Y2 JPH082624 Y2 JP H082624Y2
Authority
JP
Japan
Prior art keywords
circuit
pll
frequency
voltage
pll circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP11135288U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0232078U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
良造 藤原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP11135288U priority Critical patent/JPH082624Y2/ja
Publication of JPH0232078U publication Critical patent/JPH0232078U/ja
Application granted granted Critical
Publication of JPH082624Y2 publication Critical patent/JPH082624Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
JP11135288U 1988-08-24 1988-08-24 試験装置 Expired - Lifetime JPH082624Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11135288U JPH082624Y2 (ja) 1988-08-24 1988-08-24 試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11135288U JPH082624Y2 (ja) 1988-08-24 1988-08-24 試験装置

Publications (2)

Publication Number Publication Date
JPH0232078U JPH0232078U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1990-02-28
JPH082624Y2 true JPH082624Y2 (ja) 1996-01-29

Family

ID=31349319

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11135288U Expired - Lifetime JPH082624Y2 (ja) 1988-08-24 1988-08-24 試験装置

Country Status (1)

Country Link
JP (1) JPH082624Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6400129B1 (en) * 1999-02-16 2002-06-04 Advantest Corporation Apparatus for and method of detecting a delay fault in a phase-locked loop circuit
JP4567974B2 (ja) * 2002-01-18 2010-10-27 株式会社アドバンテスト 試験装置

Also Published As

Publication number Publication date
JPH0232078U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1990-02-28

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