JPH08245755A - Epoxy resin composition and sealed device of electronic part - Google Patents

Epoxy resin composition and sealed device of electronic part

Info

Publication number
JPH08245755A
JPH08245755A JP10994495A JP10994495A JPH08245755A JP H08245755 A JPH08245755 A JP H08245755A JP 10994495 A JP10994495 A JP 10994495A JP 10994495 A JP10994495 A JP 10994495A JP H08245755 A JPH08245755 A JP H08245755A
Authority
JP
Japan
Prior art keywords
epoxy resin
resin composition
titanium white
weight
crystalline silica
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10994495A
Other languages
Japanese (ja)
Inventor
Masahiko Ito
昌彦 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Chemical Corp
Original Assignee
Toshiba Chemical Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Chemical Corp filed Critical Toshiba Chemical Corp
Priority to JP10994495A priority Critical patent/JPH08245755A/en
Publication of JPH08245755A publication Critical patent/JPH08245755A/en
Pending legal-status Critical Current

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  • Compositions Of Macromolecular Compounds (AREA)
  • Epoxy Resins (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Abstract

PURPOSE: To provide a sealed device of electronic parts, having a high whiteness degree and reliability and excellent in thermal conductivity. CONSTITUTION: This epoxy resin composition consists essentially of (A) an epoxy resin, (B) a phenol resin, (C) an obtuse-angled crystalline silica powder and a microspherical alumina powder as an inorganic filler, (D) a curing accelerator and (E) titanium white. The amounts of the components based on the whole resin composition are 25-90wt.% inorganic filter of the component (C) and 5-50wt.% titanium white of the component (E). This sealed device of electronic parts is prepared by sealing the electronic parts with a cured product of the epoxy resin composition.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、白色度が高く、熱伝導
性、成形性に優れたエポキシ樹脂組成物、および白色度
が要求される例えばフォトカプラ等の、電子部品封止装
置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an epoxy resin composition having high whiteness, excellent thermal conductivity and moldability, and an electronic component sealing device such as a photocoupler which requires whiteness.

【0002】[0002]

【従来の技術】従来、白色度が求められないダイオー
ド、トランジスタ、コンデンサー、集積回路等の半導体
装置では、熱硬化性樹脂を用いて封止する方法が行われ
てきた。この樹脂封止は、ガラス、金属、セラミックを
用いたハーメチックシール方式に比較して経済的に有利
なため、広く実用化されている。封止樹脂としては、熱
硬化性樹脂の中でも信頼性および価格の点から、エポキ
シ樹脂が最も一般的に用いられている。エポキシ樹脂に
は、酸無水物、芳香族アミン、ノボラック型フェノール
樹脂等の硬化剤が用いられるが、これらの中でもノボラ
ック型フェノール樹脂を硬化剤としたエポキシ樹脂は、
他の硬化剤を使用したものに比べて、成形性、耐湿性に
優れ、毒性がなく、かつ安価であるため、封止用樹脂と
して広く使用されている。
2. Description of the Related Art Conventionally, a semiconductor device such as a diode, a transistor, a capacitor or an integrated circuit which is not required to have whiteness has been sealed with a thermosetting resin. This resin encapsulation is economically advantageous as compared with the hermetic sealing method using glass, metal, and ceramic, and is therefore widely put into practical use. Among thermosetting resins, epoxy resins are most commonly used as the sealing resin from the viewpoints of reliability and price. The epoxy resin, acid anhydrides, aromatic amines, hardeners such as novolac type phenolic resins are used, but among these, epoxy resins with novolac type phenolic resins as hardeners,
Compared to those using other curing agents, it is widely used as a sealing resin because it has excellent moldability and moisture resistance, is nontoxic, and is inexpensive.

【0003】[0003]

【発明が解決しようとする課題】近年、半導体部品等の
高密度化、大電力化に伴い熱放散性のよい、低応力の封
止用樹脂が要望されてきた。こうしたことから、熱伝導
率の高い充填剤として、結晶性シリカやアルミナ等が使
用されているが、これらの無機充填剤は硬度が高く樹脂
組成物製造の際に、混合機、混練機、粉砕機等を摩耗
し、チタンホワイト等の白色着色剤を添加しても満足な
白色度の樹脂組成物が得られなかった。
In recent years, there has been a demand for a low-stress encapsulating resin having a good heat dissipation property as the density and power of semiconductor parts are increased. For this reason, crystalline silica, alumina, etc. are used as a filler having a high thermal conductivity, but these inorganic fillers have a high hardness and a mixer, a kneader, a pulverizer during the production of the resin composition. Even when the machine was worn out and a white colorant such as titanium white was added, a resin composition having a satisfactory whiteness could not be obtained.

【0004】本発明は、上記の欠点を解消するためにな
されたもので、白色度が高く、熱伝導性、成形性に優れ
たエポキシ樹脂組成物、および白色度の高い、例えばフ
ォトカプラ等の電子部品封止装置を提供しようとするも
のである。
The present invention has been made in order to solve the above-mentioned drawbacks, and an epoxy resin composition having a high degree of whiteness, excellent thermal conductivity and moldability, and a high degree of whiteness, such as a photocoupler, are used. An electronic component sealing device is provided.

【0005】[0005]

【課題を解決するための手段】本発明者は、上記の目的
を達成しようと鋭意研究を重ねた結果、無機質充填剤と
して鈍角結晶性シリカ粉末および微細球状アルミナ粉末
を併用させることによって、製造装置の摩耗を抑制し、
白色度が高く、熱伝導性、成形性に優れた樹脂組成物が
得られることを見いだし、本発明を完成したものであ
る。
Means for Solving the Problems As a result of intensive studies aimed at achieving the above-mentioned object, the present inventor has found that an obtuse angle crystalline silica powder and a fine spherical alumina powder are used together as an inorganic filler to produce a production apparatus. Wear of the
The present invention has been completed by finding that a resin composition having high whiteness and excellent thermal conductivity and moldability can be obtained.

【0006】即ち、本発明は、(A)エポキシ樹脂、
(B)フェノール樹脂、(C)無機質充填剤として鈍角
結晶性シリカ粉末及び微細球状アルミナ粉末、(D)硬
化促進剤および(E)チタンホワイトを必須成分とし、
全体の樹脂組成物に対して前記(C)の無機質充填剤を
25〜90重量%、(E)のチタンホワイトを 5〜50重量%
の割合で含有してなることを特徴とするエポキシ樹脂組
成物である。また、このエポキシ樹脂組成物の硬化物に
よって、電子部品が封止されてなることを特徴とする電
子部品封止装置である。
That is, the present invention relates to (A) epoxy resin,
(B) phenol resin, (C) obtuse-angle crystalline silica powder and fine spherical alumina powder as inorganic filler, (D) hardening accelerator and (E) titanium white as essential components,
The inorganic filler (C) is added to the entire resin composition.
25 to 90% by weight, (E) titanium white 5 to 50% by weight
The epoxy resin composition is characterized in that it is contained at a ratio of. Moreover, the electronic component sealing device is characterized in that an electronic component is sealed with a cured product of the epoxy resin composition.

【0007】以下、本発明を詳細に説明する。The present invention will be described in detail below.

【0008】本発明に用いる(A)エポキシ樹脂として
は、その分子中にエポキシ基を少なくとも 2個有する化
合物であるかぎり、分子量、構造式等に特に制限される
ことはなく、一般封止材用として用いられているものが
広く使用することができる。例えばビスフェノール型の
芳香族系、シクロヘキサン誘導体等の脂環族系、さらに
次の一般式で示されるエポキシノボラック系等のエポキ
シ樹脂が挙げられる。
The epoxy resin (A) used in the present invention is not particularly limited in molecular weight and structural formula as long as it is a compound having at least two epoxy groups in the molecule, and it is used for general encapsulating materials. Those used as can be widely used. Examples thereof include epoxy resins such as bisphenol-type aromatic compounds, alicyclic compounds such as cyclohexane derivatives, and epoxy novolac compounds represented by the following general formula.

【0009】[0009]

【化1】 (但し、式中R1 は水素原子、ハロゲン原子又はアルキ
ル基を、R2 は水素原子又はアルキル基を、n は 1以上
の整数をそれぞれ表す) これらのエポキシ樹脂は単独又は 2種以上混合して使用
することができる。
Embedded image (In the formula, R 1 represents a hydrogen atom, a halogen atom or an alkyl group, R 2 represents a hydrogen atom or an alkyl group, and n represents an integer of 1 or more.) These epoxy resins may be used alone or in combination of two or more. Can be used.

【0010】本発明に用いる(B)フェノール樹脂とし
ては、フェノール、アルキルフェノール等のフェノール
類とホルムアルデヒド或いはパラホルムアルデヒドを反
応させて得られるノボラック型フェノール樹脂、および
これらの変性樹脂例えば、エポキシ化もしくはブチル化
ノボラック型フェノール樹脂等が挙げられ、これらは単
独又は 2種以上混合して使用することができる。フェノ
ール樹脂の配合割合は、前述した(A)エポキシ樹脂の
エポキシ基(a )と(B)フェノール樹脂のフェノール
性水酸基(b )とのモル比[(a )/(b )]が 0.1〜
10の範囲内であることが望ましい。このモル比が 0.1未
満もしくは10を超えると耐湿性、成形作業性、及び硬化
物の電気特性が悪くなりいずれの場合も好ましくない。
Examples of the (B) phenol resin used in the present invention include novolac type phenol resins obtained by reacting phenols such as phenol and alkylphenol with formaldehyde or paraformaldehyde, and modified resins thereof such as epoxidized or butylated. Examples include novolac type phenolic resins, which can be used alone or in combination of two or more. The mixing ratio of the phenol resin is such that the molar ratio [(a) / (b)] of the epoxy group (a) of the (A) epoxy resin and the phenolic hydroxyl group (b) of the (B) phenol resin is 0.1 to
It is desirable to be within the range of 10. If this molar ratio is less than 0.1 or exceeds 10, the moisture resistance, the molding workability, and the electrical properties of the cured product deteriorate, which is not preferable in any case.

【0011】本発明に用いる(C)無機質充填剤として
の鈍角結晶性シリカ粉末および微細球状アルミナ粉末と
しては、不純物濃度が低く、製造装置の摩耗を防止する
ため鋭利な「カド」をもたない鈍角のものが使用され
る。最も重要なことは鈍角結晶性シリカ粉末と微細球状
アルミナ粉末が併用されることである。鈍角結晶性シリ
カ粉末の平均粒径は10〜50μm が望ましく、10μm 未満
又は50μm を超えると流動性、作業性が悪くなり好まし
くない。微細球状アルミナ粉末の平均粒径は 1μm 以下
のものが望ましく、鈍角結晶性シリカ粉末に対して10〜
50重量%の範囲内で配合することが好ましい。この範囲
が10重量%未満では十分な流動性が得られず、また50重
量%を超えると充填剤全体の比表面積が増加し、流動性
が低下するため好ましくない。鈍角結晶性シリカ粉末と
微細球状アルミナ粉末の無機質充填剤の他にも、製造装
置を摩耗させないものであれば使用することもできる。
鈍角結晶性シリカ粉末および微細球状アルミナ粉末の配
合割合は、全体の樹脂組成物に対して25〜90重量%含有
するように配合することが好ましい。その割合が25重量
%未満では熱膨張係数が大きくなると共に、熱伝導率が
小さくなり好ましくない。また、90重量%を超えるとか
さばりが大きくなり、成形性が悪く実用に適さない。
The obtuse crystalline silica powder and the fine spherical alumina powder used as the inorganic filler (C) in the present invention have a low impurity concentration and do not have a sharp "cadm" in order to prevent abrasion of the manufacturing equipment. An obtuse angle is used. Most importantly, the obtuse angle crystalline silica powder and the fine spherical alumina powder are used together. The obtuse crystalline silica powder preferably has an average particle size of 10 to 50 μm, and if it is less than 10 μm or exceeds 50 μm, the fluidity and workability are deteriorated, which is not preferable. It is desirable that the average particle size of fine spherical alumina powder is 1 μm or less.
It is preferable to mix within the range of 50% by weight. If this range is less than 10% by weight, sufficient fluidity cannot be obtained, and if it exceeds 50% by weight, the specific surface area of the entire filler increases and the fluidity decreases, which is not preferable. In addition to the obtuse-angle crystalline silica powder and the fine spherical alumina powder as the inorganic filler, any one can be used as long as it does not abrade the manufacturing apparatus.
The blending ratio of the obtuse crystalline silica powder and the fine spherical alumina powder is preferably 25 to 90% by weight based on the total resin composition. If the proportion is less than 25% by weight, the coefficient of thermal expansion increases and the thermal conductivity decreases, which is not preferable. On the other hand, if it exceeds 90% by weight, the bulkiness becomes large and the moldability is poor and it is not suitable for practical use.

【0012】本発明に用いる(D)硬化促進剤として
は、リン系硬化促進剤、イミダゾール系硬化促進剤、D
BU系硬化促進剤、その他の硬化促進剤等が広く使用す
ることができる。これらは単独又は 2種以上併用するこ
とができる。硬化促進剤の配合割合は、全体の樹脂組成
物に対して 0.01 〜5 重量%含有するように配合するこ
とが望ましい。その割合が 0.01 重量%未満では樹脂組
成物のゲルタイムが長く、硬化特性も悪くなり、また、
5 重量%を超えると極端に流動性が悪くなって成形性に
劣り、さらに電気特性も悪くなり耐湿性に劣り好ましく
ない。
As the curing accelerator (D) used in the present invention, a phosphorus curing accelerator, an imidazole curing accelerator, D
BU-based curing accelerators and other curing accelerators can be widely used. These may be used alone or in combination of two or more. It is desirable that the curing accelerator is blended in an amount of 0.01 to 5% by weight based on the total resin composition. If the proportion is less than 0.01% by weight, the gel time of the resin composition will be long and the curing characteristics will be poor.
If it exceeds 5% by weight, the fluidity is extremely deteriorated, the moldability is deteriorated, the electric characteristics are deteriorated, and the moisture resistance is deteriorated, which is not preferable.

【0013】本発明に用いる(E)チタンホワイトとし
ては、不純物濃度が低い酸化チタンが用いられ、その結
晶形はアナタース形、ルチル形のいずれでもよい。チタ
ンホワイトの配合割合は、全体の樹脂組成物に対して 5
〜50重量%の割合で含有することが望ましい。その割合
が 5重量%未満では十分な白色度が得られず、また、50
重量%を超えると成形性が低下し好ましくない。
Titanium oxide having a low impurity concentration is used as (E) titanium white used in the present invention, and its crystal form may be either anatase type or rutile type. The compounding ratio of titanium white is 5 with respect to the total resin composition.
It is desirable to contain it in a proportion of up to 50% by weight. If the proportion is less than 5% by weight, sufficient whiteness cannot be obtained.
If it exceeds 5% by weight, the moldability is deteriorated, which is not preferable.

【0014】本発明のエポキシ樹脂組成物は、前述した
エポキシ樹脂、フェノール樹脂、鈍角結晶性シリカ粉末
および微細球状アルミナ粉末、硬化促進剤およびチタン
ホワイトを必須成分とするが、本発明の目的に反しない
限度において、また必要に応じて例えば、天然ワックス
類、合成ワックス類、直鎖脂肪族の金属塩、酸アミド、
エステル類、パラフィン等の離型剤、三酸化アンチモン
等の難燃剤、シランカップリング剤、ゴム系やシリコー
ン系の低応力付与剤等を適宜添加配合することができ
る。
The epoxy resin composition of the present invention contains the above-mentioned epoxy resin, phenol resin, obtuse angle crystalline silica powder and fine spherical alumina powder, a curing accelerator and titanium white as essential components, but does not meet the purpose of the present invention. To the extent that it does not occur, and if necessary, for example, natural waxes, synthetic waxes, linear aliphatic metal salts, acid amides,
A release agent such as an ester or paraffin, a flame retardant such as antimony trioxide, a silane coupling agent, a rubber-based or silicone-based low stress imparting agent, and the like can be appropriately added and blended.

【0015】本発明のエポキシ樹脂組成物を成形材料と
して調製する場合の一般的方法は、前述したエポキシ樹
脂、フェノール樹脂、鈍角結晶性シリカ粉末および微細
球状アルミナ粉末、硬化促進剤およびチタンホワイトそ
の他の成分を配合し、ミキサー等によって十分均一に混
合した、さらに熱ロールによる溶融混合処理またはニー
ダ等による混合処理を行い、次いで冷却固化させ適当な
大きさに粉砕して成形材料とすることができる。こうし
て得られた成形材料は、半導体装置をはじめとする電子
部品、被覆、絶縁等に適用すれば優れた特性と信頼性を
付与させることができる。
When the epoxy resin composition of the present invention is prepared as a molding material, the general method is to prepare the above-mentioned epoxy resin, phenol resin, obtuse angle crystalline silica powder and fine spherical alumina powder, hardening accelerator and titanium white and the like. The components can be blended and sufficiently mixed with a mixer or the like, and further subjected to melt mixing treatment with a hot roll or mixing treatment with a kneader or the like, and then cooled and solidified to be pulverized to an appropriate size to obtain a molding material. When the molding material thus obtained is applied to electronic parts such as semiconductor devices, coating, insulation, etc., excellent characteristics and reliability can be imparted.

【0016】また、本発明の電子部品封止装置は、上述
の成形材料を用いて電子部品を封止することにより容易
に製造することができる。封止を行う電子部品としては
例えば、集積回路、大規模集積回路、トランジスタ、サ
イリスタ、ダイオード、コンデンサー等で特に限定され
るものではない。封止の最も一般的な方法としては、低
圧トランスファー成形法があるが、射出成形、圧縮成
形、注形等による封止も可能である。成形材料で封止後
加熱して硬化させ、最終的にはこの硬化物によって封止
された電子部品封止装置が得られる。加熱による硬化
は、170 ℃に加熱して硬化させることが望ましい。
The electronic component sealing device of the present invention can be easily manufactured by sealing the electronic component using the above-mentioned molding material. The electronic component to be sealed is not particularly limited to, for example, an integrated circuit, a large-scale integrated circuit, a transistor, a thyristor, a diode, a capacitor and the like. The most common method of sealing is a low-pressure transfer molding method, but sealing by injection molding, compression molding, casting or the like is also possible. After sealing with a molding material, it is heated and cured, and finally an electronic component sealing device sealed with this cured product is obtained. The curing by heating is preferably carried out by heating to 170 ° C.

【0017】[0017]

【作用】本発明のエポキシ樹脂組成物および電子部品封
止装置は、エポキシ樹脂、フェノール樹脂、鈍角結晶性
シリカ粉末および微細球状アルミナ粉末、硬化促進剤、
チタンホワイトを用いることによって、鈍角結晶性シリ
カ粉末の角は微細球状アルミナ粉末によって丸められ、
製造装置の摩耗を抑制し白色度が高く、熱伝導性、成形
性の優れたものとすることができた。
The epoxy resin composition and the electronic component sealing device of the present invention include an epoxy resin, a phenol resin, an obtuse angle crystalline silica powder and a fine spherical alumina powder, a curing accelerator,
By using Titanium White, the corners of obtuse crystalline silica powder are rounded by fine spherical alumina powder,
It was possible to suppress abrasion of the manufacturing apparatus, to have high whiteness, and to have excellent thermal conductivity and moldability.

【0018】[0018]

【実施例】次に本発明を実施例によって説明するが、本
発明はこれらの実施例よって限定されるものではない。
以下の実施例および比較例において「%」とは「重量
%」を意味する。
EXAMPLES The present invention will now be described with reference to examples, but the present invention is not limited to these examples.
In the following examples and comparative examples, “%” means “% by weight”.

【0019】実施例1 o-クレゾールノボラック型エポキシ樹脂 7%、テトラブ
ロモビスフェノールA型エポキシ樹脂 1.5%、ノボラッ
ク型フェノール樹脂 3.5%、鈍角結晶性シリカ粉末(平
均粒径20μm )35%、微細球状アルミナ粉末(平均粒径
0.5μm )10%、溶融シリカ(平均粒径20μm )25%、
チタンホワイト(ルチル形)15%、硬化促進剤 0.5%、
カルナバワックス類 0.3%、三酸化アンチモン 1.8%お
よびシランカップリング剤 0.4%を常温で混合し、さら
に90〜95℃で混練冷却した後、粉砕して成形材料(A)
製造した。
Example 1 o-Cresol Novolak type epoxy resin 7%, tetrabromobisphenol A type epoxy resin 1.5%, novolac type phenol resin 3.5%, obtuse angle crystalline silica powder (average particle size 20 μm) 35%, fine spherical alumina Powder (average particle size
0.5 μm) 10%, fused silica (average particle size 20 μm) 25%,
Titanium white (rutile type) 15%, hardening accelerator 0.5%,
Carnauba wax 0.3%, antimony trioxide 1.8% and silane coupling agent 0.4% are mixed at room temperature, further kneaded and cooled at 90 to 95 ° C, and then crushed to form molding material (A).
Manufactured.

【0020】実施例2 o-クレゾールノボラック型エポキシ樹脂 7%、テトラブ
ロモビスフェノールA型エポキシ樹脂 1.5%、ノボラッ
ク型フェノール樹脂 3.5%、鈍角結晶性シリカ粉末(平
均粒径20μm )25%、微細球状アルミナ粉末(平均粒径
0.5μm )20%、溶融シリカ粉末(平均粒径20μm )25
%、チタンホワイト(ルチル形)15%、硬化促進剤 0.5
%、カルナバワックス類 0.3%、三酸化アンチモン 1.8
%およびシランカップリング剤 0.4%を常温で混合し、
さらに90〜95℃で混練冷却した後、粉砕して成形材料
(B)を製造した。
Example 2 o-cresol novolac type epoxy resin 7%, tetrabromobisphenol A type epoxy resin 1.5%, novolac type phenol resin 3.5%, obtuse angle crystalline silica powder (average particle size 20 μm) 25%, fine spherical alumina Powder (average particle size
0.5 μm) 20%, fused silica powder (average particle size 20 μm) 25
%, Titanium white (rutile type) 15%, hardening accelerator 0.5
%, Carnauba wax 0.3%, antimony trioxide 1.8%
% And silane coupling agent 0.4% at room temperature,
After further kneading and cooling at 90 to 95 ° C., the mixture was pulverized to produce a molding material (B).

【0021】比較例1 o-クレゾールノボラック型エポキシ樹脂 7%、テトラブ
ムモビスフェノールA型エポキシ樹脂 1.5%、ノボラッ
ク型フェノール樹脂 3.5%、微細球状アルミナ粉末(平
均粒径 0.5μm )10%、溶融シリカ粉末(平均粒径20μ
m )25%、結晶シリカ粉末(平均粒径20μm 鋭利な破砕
形)35%、チタンホワイト(ルチル形)15%、硬化促進
剤 0.5%、カルナバワックス類 0.3%、三酸化アンチモ
ン 1.8%およびシランカップリング剤 0.4%を常温で混
合し、さらに90〜95℃で混練冷却した後、粉砕して成形
材料(C)を製造した。
Comparative Example 1 o-Cresol Novolak type epoxy resin 7%, Tetrabummobisphenol A type epoxy resin 1.5%, Novolac type phenol resin 3.5%, Fine spherical alumina powder (average particle size 0.5 μm) 10%, fused silica Powder (average particle size 20μ
m) 25%, crystalline silica powder (average particle size 20 μm sharp crushed type) 35%, titanium white (rutile type) 15%, hardening accelerator 0.5%, carnauba wax 0.3%, antimony trioxide 1.8% and silane cup. A ring material (0.4%) was mixed at room temperature, further kneaded and cooled at 90 to 95 ° C., and then pulverized to produce a molding material (C).

【0022】比較例2 o-クレゾールノボラック型エポキシ樹脂 7%、テトラブ
ロモビスフェノールA型エポキシ樹脂 1.5%、ノボラッ
ク型フェノール樹脂 3.5%、微細球状アルミナ粉末(平
均粒径 0.5μm )10%、溶融シリカ粉末(平均粒径20μ
m )25%、アルミナ粉末(平均粒径20μm 破砕形)35
%、チタンホワイト(ルチル形)15%、硬化促進剤 0.5
%、カルナバワックス類 0.3%、三酸化アンチモン 1.8
%およびシランカッフリング剤 0.4%を常温で混合し、
さらに90〜95℃で混練冷却した後、粉砕して成形材料
(D)を製造した。
Comparative Example 2 o-Cresol novolac type epoxy resin 7%, tetrabromobisphenol A type epoxy resin 1.5%, novolac type phenol resin 3.5%, fine spherical alumina powder (average particle size 0.5 μm) 10%, fused silica powder (Average particle size 20μ
m) 25%, alumina powder (average particle size 20 μm crushed type) 35
%, Titanium white (rutile type) 15%, hardening accelerator 0.5
%, Carnauba wax 0.3%, antimony trioxide 1.8%
% And silane cuffing agent 0.4% at room temperature,
Further, after kneading and cooling at 90 to 95 ° C., it was pulverized to produce a molding material (D).

【0023】比較例3 o-クレゾールノボラック型エポキシ樹脂 7%、テトラブ
ロモビスフェノールA型エポキシ樹脂 1.5%、ノボラッ
ク型フェノール樹脂 3.5%、微細球状アルミナ粉末(平
均粒径 0.5μm )70%、チタンホワイト(ルチル形)15
%、硬化促進剤0.5%、カルナバワックス類 0.3%、三
酸化アンチモン 1.8%およびシランカップリング剤 0.4
%を常温で混合し、さらに90〜95℃で混練冷却した後、
粉砕して成形材料(E)を製造した。
Comparative Example 3 o-Cresol Novolak type epoxy resin 7%, tetrabromobisphenol A type epoxy resin 1.5%, novolac type phenol resin 3.5%, fine spherical alumina powder (average particle size 0.5 μm) 70%, titanium white ( Rutile) 15
%, Curing accelerator 0.5%, carnauba wax 0.3%, antimony trioxide 1.8% and silane coupling agent 0.4
% At room temperature, then kneading and cooling at 90-95 ° C,
The material was crushed to produce a molding material (E).

【0024】こうして製造した成形材料(A)〜(E)
を用いて170 ℃に加熱した金型内にトランスファー注
入、フォトカプラーを封止し硬化させて電子部品封止装
置を製造した。これらの成形材料および電子部品封止装
置について、諸試験を行ったのでその結果を表1に示し
たが、本発明のエポキシ樹脂組成物および電子部品封止
装置は、いずれも優れた特性を示し、本発明の顕著な効
果を確認することができた。
Molding materials (A) to (E) thus produced
Was used to transfer transfer into a mold heated to 170 ° C., and the photocoupler was sealed and cured to manufacture an electronic component sealing device. Various tests were carried out on these molding materials and electronic component sealing devices, and the results are shown in Table 1. The epoxy resin composition and electronic component sealing device of the present invention both show excellent characteristics. The remarkable effect of the present invention could be confirmed.

【0025】[0025]

【表1】 *1 :175 ℃,80kg/cm2 ,2 分間トランスフアー成形により得られた試験片を 分光光度計によって測定、標準球(硫酸バリウム)=100 とし、サンプル/標準 球=100 で反射率を算出した。 80%以上…○、 65〜80%未満…△、 65%未満…×。 *2 :φ 100,25mm 厚の成形品をつくり、熱伝導率計を用いて測定した。 1.5 (W/m ・K)以上…○、 1.0〜 1.5(W/m ・K)未満…△、 1.0( W/m ・K)未満…×。 *3 :成形材料をDIP16pin 成形金型により170 ℃,2 分間トランスファー成 形し、充填性を評価した。優秀…○、良好…△、不良…×。 *4 :成形材料を用いて、 2本のアルミニウム配線を有する半導体チップを、17 0 ℃,3 分間トランスファー成形した後、さらに8 時間エイジングさせた。この 半導体封止装置 100個について、120 ℃の高温水蒸気中で耐湿性試験を行い、ア ルミニウム腐蝕による50%断線(不良発生)の起こる時間を評価した。 200 h 以上…○、 200 h 未満…×。[Table 1] * 1: Measured with a spectrophotometer on a test piece obtained by transfer molding at 175 ° C, 80 kg / cm 2 for 2 minutes, the standard sphere (barium sulfate) = 100, and the reflectance is calculated using the sample / standard sphere = 100 did. 80% or more ... ○, 65 to less than 80% ... △, less than 65% ... x. * 2: Measured using a thermal conductivity meter by making a molded product with a diameter of 100,25 mm. 1.5 (W / m.K) or more ... ○, 1.0 to less than 1.5 (W / m.K) ... △, less than 1.0 (W / m.K) ... x. * 3: The molding material was transfer molded with a DIP 16pin molding die at 170 ° C for 2 minutes, and the filling property was evaluated. Excellent ... ○, Good ... △, Poor ... * 4: Using a molding material, a semiconductor chip with two aluminum wires was transfer molded at 170 ° C for 3 minutes and then aged for 8 hours. A moisture resistance test was performed on 100 semiconductor encapsulation devices in high-temperature steam at 120 ° C to evaluate the time at which 50% disconnection (defect occurrence) due to aluminum corrosion occurred. More than 200 h… ○, less than 200 h… ×.

【0026】[0026]

【発明の効果】以上の説明および表1から明らかなよう
に、本発明エポキシ樹脂組成物および電子部品封止装置
は、白色度が高く、熱伝導性、成形性に優れ、長期間に
わたって信頼性を保証することができるものである。
As is apparent from the above description and Table 1, the epoxy resin composition of the present invention and the electronic component sealing device have high whiteness, excellent thermal conductivity and moldability, and long-term reliability. Is something that can be guaranteed.

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 H01L 23/29 H01L 23/30 R 23/31 ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 6 Identification code Internal reference number FI Technical indication H01L 23/29 H01L 23/30 R 23/31

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 (A)エポキシ樹脂、(B)フェノール
樹脂、(C)無機質充填剤として鈍角結晶性シリカ粉末
及び微細球状アルミナ粉末、(D)硬化促進剤および
(E)チタンホワイトを必須成分とし、全体の樹脂組成
物に対して前記(C)の無機質充填剤を25〜90重量%、
(E)のチタンホワイトを 5〜50重量%の割合で含有し
てなることを特徴とするエポキシ樹脂組成物。
1. An essential component comprising (A) an epoxy resin, (B) a phenol resin, (C) an obtuse angle crystalline silica powder and a fine spherical alumina powder as an inorganic filler, (D) a curing accelerator and (E) titanium white. And 25 to 90% by weight of the inorganic filler (C) with respect to the entire resin composition,
An epoxy resin composition comprising (E) titanium white in an amount of 5 to 50% by weight.
【請求項2】 (A)エポキシ樹脂、(B)フェノール
樹脂、(C)無機質充填剤として鈍角結晶性シリカ粉末
及び微細球状アルミナ粉末、(D)硬化促進剤および
(E)チタンホワイトを必須成分とし、全体の樹脂組成
物に対して前記(C)の無機質充填剤を25〜90重量%、
(E)のチタンホワイトを 5〜50重量%の割合で含有し
たエポキシ樹脂組成物の硬化物によって、半導体チップ
が封止されてなることを特徴とする電子部品封止装置。
2. An essential component comprising (A) an epoxy resin, (B) a phenol resin, (C) an obtuse angle crystalline silica powder and a fine spherical alumina powder as an inorganic filler, (D) a hardening accelerator and (E) titanium white. And 25 to 90% by weight of the inorganic filler (C) with respect to the entire resin composition,
An electronic component encapsulating device, wherein a semiconductor chip is encapsulated with a cured product of an epoxy resin composition containing (E) titanium white in an amount of 5 to 50% by weight.
JP10994495A 1995-03-13 1995-03-13 Epoxy resin composition and sealed device of electronic part Pending JPH08245755A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10994495A JPH08245755A (en) 1995-03-13 1995-03-13 Epoxy resin composition and sealed device of electronic part

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10994495A JPH08245755A (en) 1995-03-13 1995-03-13 Epoxy resin composition and sealed device of electronic part

Publications (1)

Publication Number Publication Date
JPH08245755A true JPH08245755A (en) 1996-09-24

Family

ID=14523079

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JPH08245755A (en)

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JP2001329145A (en) * 2000-05-22 2001-11-27 Sumitomo Bakelite Co Ltd Epoxy resin molding material for sealing semiconductor, and semiconductor device
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JP2001329145A (en) * 2000-05-22 2001-11-27 Sumitomo Bakelite Co Ltd Epoxy resin molding material for sealing semiconductor, and semiconductor device
JP2007031514A (en) * 2005-07-25 2007-02-08 Kyocera Chemical Corp White epoxy resin composition and electronic part
JP2013062519A (en) * 2005-10-07 2013-04-04 Hitachi Chemical Co Ltd Thermosetting resin composition for light reflection, optical semiconductor mounting substrate using the same, method of manufacturing the optical semiconductor mounting substrate, and optical semiconductor device
JP2007129173A (en) * 2005-10-07 2007-05-24 Hitachi Chem Co Ltd Thermosetting light reflecting resin composition, optical semiconductor mounting substrate using same, method for manufacturing same, and optical semiconductor device
JP2014159600A (en) * 2005-10-07 2014-09-04 Hitachi Chemical Co Ltd Thermosetting resin composition for light reflection, optical semiconductor mounting substrate using the same, method of manufacturing the optical semiconductor mounting substrate, and optical semiconductor device
JP2008050573A (en) * 2006-07-25 2008-03-06 Hitachi Chem Co Ltd Thermosetting resin composition for reflecting light, substrate for loading optical semiconductor element using the same, method for producing the same and optical semiconductor device
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US20100140638A1 (en) * 2006-11-15 2010-06-10 Hitachi Chemical Co., Ltd. Thermosetting resin composition for light reflection, method for manufacturing the resin composition and optical semiconductor element mounting substrate and optical semiconductor device using the resin composition
US9387608B2 (en) 2006-11-15 2016-07-12 Hitachi Chemical Company, Ltd. Thermosetting resin composition for light reflection, method for manufacturing the resin composition and optical semiconductor element mounting substrate and optical semiconductor device using the resin composition
US10381533B2 (en) 2006-11-15 2019-08-13 Hitachi Chemical Company, Ltd. Optical semiconductor element mounting substrate and optical semiconductor device using thermosetting resin composition for light reflection
JP2022007193A (en) * 2020-06-25 2022-01-13 パナソニックIpマネジメント株式会社 Epoxy resin composition and optical semiconductor device
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