JPH0821844B2 - Semiconductor integrated circuit - Google Patents
Semiconductor integrated circuitInfo
- Publication number
- JPH0821844B2 JPH0821844B2 JP61125996A JP12599686A JPH0821844B2 JP H0821844 B2 JPH0821844 B2 JP H0821844B2 JP 61125996 A JP61125996 A JP 61125996A JP 12599686 A JP12599686 A JP 12599686A JP H0821844 B2 JPH0821844 B2 JP H0821844B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- circuit
- control signal
- semiconductor integrated
- integrated circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/15—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Semiconductor Integrated Circuits (AREA)
- Communication Control (AREA)
- Debugging And Monitoring (AREA)
- Logic Circuits (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、クロック信号を用いることなく入,出力
すべき信号を入,出力する非同期バス型の半導体集積回
路に関し、特に2種類の制御信号を1本の端子に割り付
けることによって端子数を減らすことを可能とした半導
体集積回路に関するものである。Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an asynchronous bus type semiconductor integrated circuit for inputting and outputting a signal to be input / output without using a clock signal, and particularly to two types of control signals. The present invention relates to a semiconductor integrated circuit in which the number of terminals can be reduced by allocating each to one terminal.
〔従来の技術〕 非同期バス型半導体集積回路において、2種類の制御
信号を1本の端子に割り付けようとする場合、例えば第
3図に示したような回路が考えられる。[Prior Art] In an asynchronous bus type semiconductor integrated circuit, when two types of control signals are to be assigned to one terminal, for example, a circuit as shown in FIG. 3 can be considered.
図において、1はチップ選択用のチップセレクト信号
CSが入力されるチップセレクト端子、2は第1および第
2の論理レベルの期間が、それぞれ本半導体集積回路を
して第1および第2の回路動作を行わしめる1つの第1
の制御信号A/を受け取る1つの制御端子、4,3はチッ
プセレクト信号と第1の制御信号に基づいて生成され
た、本半導体集積回路をして第1,第2の回路動作を行わ
しめる第2,第3の制御信号A′,B′を伝達する内部制御
信号線、8は第1の制御信号とチップセレクト信号の論
理積をとり第2の制御信号A′を生成するANDゲート、1
0は第1の制御信号を反転するインバータ、7はインバ
ータ10の出力、すなわち第1の制御信号の反転信号とチ
ップセレクト信号の論理積をとり第3の制御信号B′を
生成するANDゲートである。In the figure, 1 is a chip select signal for chip selection
The chip select terminal 2 to which CS is input has two first and second logic level periods, which are one of the first and second circuit operations that cause the semiconductor integrated circuit to perform the first and second circuit operations, respectively.
One control terminal for receiving the control signal A / of 4 and 3 is generated based on the chip select signal and the first control signal, and the semiconductor integrated circuit of the present invention performs the first and second circuit operations. An internal control signal line for transmitting the second and third control signals A'and B ', an AND gate 8 for ANDing the first control signal and the chip select signal to generate a second control signal A', 1
0 is an inverter that inverts the first control signal, 7 is an output of the inverter 10, that is, an AND gate that ANDs the inverted signal of the first control signal and the chip select signal to generate the third control signal B ′. is there.
第4図は第3図の回路のタイミング例を示したもので
ある。FIG. 4 shows an example of the timing of the circuit of FIG.
第4図に示すように内部制御信号A′をアクティブに
するには、チップセレクト端子1と制御端子2とを共に
“H"にすればよい。As shown in FIG. 4, in order to activate the internal control signal A ', both the chip select terminal 1 and the control terminal 2 may be set to "H".
ところが、内部制御信号A′をアクティブにしようと
した時、チップセレクト端子1入力CSが、第4図に示す
ように制御端子2の入力A/期間t1よりも長かった場
合、内部制御信号線3出力B′にt2,t3期間エラーが生
じる。このエラーは、外部からは、内部制御信号線4出
力A′のみをアクティブにしようとしている時に、間違
って内部制御信号線3出力B′に“H"信号が出力される
のであるから致命的なエラーである。However, when the input CS of the chip select terminal 1 is longer than the input A / period t1 of the control terminal 2 as shown in FIG. 4 when the internal control signal A'is made active, the internal control signal line 3 The output B'has an error during the t2 and t3 periods. This error is fatal because the "H" signal is erroneously output to the output B'of the internal control signal line 3 when only the output A'of the internal control signal line 4 is activated from the outside. It is an error.
このような問題があったために、従来は非同期バス型
半導体集積回路においては、2本の制御信号を1本の端
子に割り付けることは不可能であった。Due to such a problem, conventionally, in the asynchronous bus type semiconductor integrated circuit, it was impossible to allocate two control signals to one terminal.
この発明は上記のような従来のものの問題点を解決す
るためになされたもので、非同期バス型であるにもかか
わらず、2本の制御信号を1本の端子に割り付けること
ができ、端子数の削減が可能となる半導体集積回路を得
ることを目的とする。The present invention has been made in order to solve the problems of the conventional ones described above. Even though it is an asynchronous bus type, it is possible to allocate two control signals to one terminal. It is an object of the present invention to obtain a semiconductor integrated circuit capable of reducing
この発明に係る半導体集積回路は、第1および第2の
論理レベルの期間が、それぞれ本半導体集積回路をして
第1および第2の回路動作を行わしめる1つの第1の制
御信号を受け取る1つの制御端子と、第1の論理レベル
で有意になるチップ選択用のチップセレクト信号と前記
第1の制御信号との論理積をとり、第1の論理レベルの
期間が、本半導体集積回路をして第1の回路動作を行わ
しめる第2の制御信号を生成する第1のアンドゲート
と、前記第1の制御信号を所定時間遅延する遅延回路
と、前記第1の制御信号と前記遅延回路の出力信号との
ノア信号を生成するノア回路と、前記ノア回路の出力信
号と前記チップセレクト信号との論理積をとり、第1の
論理レベルの期間が、本半導体集積回路をして第2の回
路動作を行わしめる第3の制御信号を生成する第2のア
ンドゲートとを備え、前記チップセレクト信号が有意で
あり、かつ前記第1の回路動作から第2の回路動作に切
り替わった時に前記第2の回路動作を行わせる前記第3
の制御信号に偽信号が生成するのを禁止するようにした
ものである。The semiconductor integrated circuit according to the present invention receives one first control signal for causing the semiconductor integrated circuit to perform the first and second circuit operations during the periods of the first and second logic levels, respectively. A logical product of two control terminals, a chip select signal for chip selection that becomes significant at the first logic level, and the first control signal is obtained, and a period of the first logic level causes the semiconductor integrated circuit to operate. A first AND gate for generating a second control signal for performing the first circuit operation, a delay circuit for delaying the first control signal for a predetermined time, and a first control signal and the delay circuit. A NOR circuit that generates a NOR signal with the output signal is ANDed with the output signal of the NOR circuit and the chip select signal. Third to perform circuit operation A second AND gate for generating a control signal, wherein the second circuit operation is performed when the chip select signal is significant and the first circuit operation is switched to the second circuit operation. Third
The control signal is forbidden from generating a false signal.
この発明においては、上述のように構成したことによ
り、チップセレクト信号が有意であり、かつ前記第1の
回路動作から第2の回路動作に切り替わった時に前記第
2の回路動作を行わせる前記第3の制御信号に偽信号を
生成してしまうのが禁止され、回路の誤動作を伴うこと
なく、1つの第1の制御信号から第2の制御信号および
第2の制御信号を分離でき、2本の制御信号を1本の端
子に割りつけることが可能になる。According to the present invention, the configuration as described above allows the second circuit operation to be performed when the chip select signal is significant and the first circuit operation is switched to the second circuit operation. It is prohibited to generate a false signal in the control signal of No. 3, and the second control signal and the second control signal can be separated from one first control signal without causing a malfunction of the circuit. It becomes possible to assign the control signal of 1 to one terminal.
以下、この発明の一実施例を図について説明する。第
1図はこの発明の一実施例による半導体集積回路を示
し、この実施例は第4図における期間t3における誤動作
を禁止するようにしたものである。第1図において、1
はチップ選択用のチップセレクト信号CSが入力されるチ
ップセレクト端子、2は第1および第2の論理レベルの
期間が、それぞれ本半導体集積回路をして第1および第
2の回路動作を行わしめる1つの第1の制御信号A/を
受け取る1つの制御端子、4,3はチップセレクト信号と
第1の制御信号に基づいて生成された、本半導体集積回
路をして第1,第2の回路動作を行わしめる第2,第3の制
御信号A′,B′を伝達する内部制御信号線、8は第1の
制御信号とチップセレクト信号の論理積をとり第2の制
御信号A′を生成するANDゲート、5は第1の制御信号
を所定時間遅延する遅延回路、6は第1の制御信号と遅
延回路5の出力とのNOR信号を生成するNORゲート、7は
NORゲート6の出力とチップセレクト信号との論理積を
とり第3の制御信号B′を生成するANDゲートである。An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 shows a semiconductor integrated circuit according to an embodiment of the present invention. This embodiment prohibits malfunctions during a period t3 in FIG. In FIG. 1, 1
Is a chip select terminal to which a chip select signal CS for chip selection is input, and 2 is a semiconductor integrated circuit that performs the first and second circuit operations during the periods of the first and second logic levels, respectively. One control terminal for receiving one first control signal A /, 4 and 3 are the first and second circuits which are generated based on the chip select signal and the first control signal. An internal control signal line for transmitting the second and third control signals A'and B'for carrying out the operation, 8 is a logical product of the first control signal and the chip select signal to generate the second control signal A '. AND gate, 5 is a delay circuit that delays the first control signal for a predetermined time, 6 is a NOR gate that generates a NOR signal between the first control signal and the output of the delay circuit 5, and 7 is
It is an AND gate that produces the third control signal B ′ by taking the logical product of the output of the NOR gate 6 and the chip select signal.
また第2図は第1図の回路のタイミングを示したもの
である。FIG. 2 shows the timing of the circuit of FIG.
次に動作について説明する。前述したように、信号
B′はCS信号とA/B信号との間にタイミングのずれが起
こるとエラーを生じるが、本実施例ではそのエラーは、
信号A/が遅延回路5を通った後の信号aとA/信号そ
のものとのNORを取ったものbとCS信号とのANDを取るこ
とにより第2図のようにリジェクトされる。遅延回路の
時定数はシステム上起こり得るCS信号のずれの最大値
と、制御信号A/のパルス幅との兼合いで決定すればよ
い。このように、上記実施例によれば、チップをセレク
ト状態とするためのチップセレクト信号、および該チッ
プセレクト信号のアクティブ状態におけるその論理高レ
ベルおよび論理低レベルがそれぞれ第1,第2の内部論理
信号のアクティブ状態に対応する1つの論理信号を入力
とし、このチップセレクト信号と論理信号の論理積をと
って第1の内部論理信号を生成し、かつ論理信号を所定
時間遅延したものと元の論理信号の論理和を論理反転
し、これをさらにチップセレクト信号と論理積をとって
第2の内部論理信号を生成し、この第1,第2の内部論理
信号によりその制御を行うようにしたので、非同期バス
型半導体集積回路の端子を減らすことができ、コストを
低減することができる。また、空いたピンに他の機能を
割り付けることも可能となり、半導体集積回路の機能,
性能を向上することができる。Next, the operation will be described. As described above, the signal B ′ causes an error when the timing shift occurs between the CS signal and the A / B signal. In this embodiment, the error is
The signal a / after passing through the delay circuit 5 is rejected as shown in FIG. 2 by taking the NOR of the signal a and the A / signal itself, and the AND of the signal b and the CS signal. The time constant of the delay circuit may be determined in consideration of the maximum value of the CS signal shift that can occur in the system and the pulse width of the control signal A /. As described above, according to the above-described embodiment, the chip select signal for bringing the chip into the selected state, and its logic high level and logic low level in the active state of the chip select signal are respectively the first and second internal logics. One logic signal corresponding to the active state of the signal is input, the logical product of this chip select signal and the logic signal is taken to generate the first internal logic signal, and the logic signal is delayed for a predetermined time and the original The logical sum of the logical signals is logically inverted, and the logical product is further ANDed with the chip select signal to generate the second internal logical signal, and the control is performed by the first and second internal logical signals. Therefore, the number of terminals of the asynchronous bus type semiconductor integrated circuit can be reduced, and the cost can be reduced. It is also possible to assign other functions to the vacant pins,
The performance can be improved.
以上のように、この発明に係る半導体集積回路によれ
ば、第1および第2の論理レベルの期間が、それぞれ本
半導体集積回路をして第1および第2の回路動作を行わ
しめる1つの第1の制御信号を受け取る1つの制御端子
と、第1の論理レベルで有意になるチップ選択用のチッ
プセレクト信号と前記第1の制御信号との論理積をと
り、第1の論理レベルの期間が、本半導体集積回路をし
て第1の回路動作を行わしめる第2の制御信号を生成す
る第1のアンドゲートと、前記第1の制御信号を所定時
間遅延する遅延回路と、前記第1の制御信号と前記遅延
回路の出力信号とのノア信号を生成するノア回路と、前
記ノア回路の出力信号と前記チップセレクト信号との論
理積をとり、第1の論理レベルの期間が、本半導体集積
回路をして第2の回路動作を行わしめる第3の制御信号
を生成する第2のアンドゲートとを備えるようにしたの
で、前記チップセレクト信号が有意であり、かつ前記第
1の回路動作から第2の回路動作に切り替わった時に前
記第2の回路動作を行なわせる前記第3の制御信号に偽
信号が生成してしまうのを禁止することができ、回路の
誤動作を伴うことなく、1つの第1の制御信号から第2
の制御信号および第2の制御信号を分離でき、2本の制
御信号を1本の端子に割りつけることが可能になる効果
がある。As described above, according to the semiconductor integrated circuit of the present invention, one of the first and second logic level periods causes the present semiconductor integrated circuit to perform the first and second circuit operations, respectively. One control terminal for receiving a control signal of 1 and a chip select signal for chip selection which becomes significant at the first logic level and the first control signal are logically ANDed, and a period of the first logic level is A first AND gate for generating a second control signal for causing the present semiconductor integrated circuit to perform a first circuit operation; a delay circuit for delaying the first control signal for a predetermined time; A NOR circuit that generates a NOR signal between the control signal and the output signal of the delay circuit is ANDed with the output signal of the NOR circuit and the chip select signal, and the period of the first logic level is the present semiconductor integrated circuit. Circuit and second circuit The chip select signal is significant, and the second circuit operation is switched from the first circuit operation to the second AND gate for generating the third control signal for performing the operation. Occasionally, it is possible to prevent a false signal from being generated in the third control signal that causes the second circuit operation to be performed.
The control signal and the second control signal can be separated, and there is an effect that two control signals can be assigned to one terminal.
第1図はこの発明の一実施例による半導体集積回路を示
す図、第2図は第1図の回路のタイミングチャート図、
第3図は従来の半導体集積回路を示す図、第4図は第3
図のタイミングチャート図である。 図において、1はチップセレクト端子、2は制御端子、
3は内部制御信号、4は内部制御信号、5は遅延回路、
6はNORゲート、20は禁止回路、7及び8はANDゲート、
CSはチップセレクト端子入力、A/Bは制御端子入力、a
は遅延回路出力、bはNOR回路出力、A′,B′は内部制
御信号である。 なお図中同一符号は同一又は相当部分を示す。1 is a diagram showing a semiconductor integrated circuit according to an embodiment of the present invention, FIG. 2 is a timing chart diagram of the circuit of FIG. 1,
FIG. 3 is a diagram showing a conventional semiconductor integrated circuit, and FIG.
It is a timing chart figure of a figure. In the figure, 1 is a chip select terminal, 2 is a control terminal,
3 is an internal control signal, 4 is an internal control signal, 5 is a delay circuit,
6 is a NOR gate, 20 is a prohibition circuit, 7 and 8 are AND gates,
CS is chip select terminal input, A / B is control terminal input, a
Is a delay circuit output, b is a NOR circuit output, and A'and B'are internal control signals. The same reference numerals in the drawings indicate the same or corresponding parts.
Claims (1)
れぞれ本半導体集積回路をして第1および第2の回路動
作を行わしめる1つの第1の制御信号を受け取る1つの
制御端子と、 第1の論理レベルで有意になるチップ選択用のチップセ
レクト信号と前記第1の制御信号との論理積をとり、第
1の論理レベルの期間が、本半導体集積回路をして第1
の回路動作を行わしめる第2の制御信号を生成する第1
のアンドゲートと、 前記第1の制御信号を所定時間遅延する遅延回路と、 前記第1の制御信号と前記遅延回路の出力信号とのノア
信号を生成するノア回路と、 前記ノア回路の出力信号と前記チップセレクト信号との
論理積をとり、第1の論理レベルの期間が、本半導体集
積回路をして第2の回路動作を行わしめる第3の制御信
号を生成する第2のアンドゲートとを備え、 前記チップセレクト信号が有意であり、かつ前記第1の
回路動作から第2の回路動作に切り替わった時に前記第
2の回路動作を行なわせる前記第3の制御信号に偽信号
が生成するのを禁止することを特徴とする半導体集積回
路。1. A control terminal for receiving a first control signal for causing the semiconductor integrated circuit to perform a first and a second circuit operation, respectively, during a period of the first and second logic levels. , A logical product of a chip select signal for chip selection which becomes significant at the first logic level and the first control signal is obtained, and a period of the first logic level causes the semiconductor integrated circuit
For generating a second control signal for performing the circuit operation of
An AND gate, a delay circuit that delays the first control signal for a predetermined time, a NOR circuit that generates a NOR signal of the first control signal and the output signal of the delay circuit, and an output signal of the NOR circuit. And a chip select signal, and a second AND gate for generating a third control signal for causing the semiconductor integrated circuit to perform the second circuit operation during the period of the first logic level. And a false signal is generated in the third control signal that causes the second circuit operation when the chip select signal is significant and the first circuit operation is switched to the second circuit operation. A semiconductor integrated circuit characterized by prohibiting
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61125996A JPH0821844B2 (en) | 1986-05-30 | 1986-05-30 | Semiconductor integrated circuit |
DE19873715159 DE3715159A1 (en) | 1986-05-30 | 1987-05-07 | IC SEMICONDUCTOR DEVICE |
US07/054,851 US4760291A (en) | 1986-05-30 | 1987-05-27 | Synchronous bus type semiconductor circuit wherein two control signals share common terminal |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61125996A JPH0821844B2 (en) | 1986-05-30 | 1986-05-30 | Semiconductor integrated circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62281615A JPS62281615A (en) | 1987-12-07 |
JPH0821844B2 true JPH0821844B2 (en) | 1996-03-04 |
Family
ID=14924138
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61125996A Expired - Lifetime JPH0821844B2 (en) | 1986-05-30 | 1986-05-30 | Semiconductor integrated circuit |
Country Status (3)
Country | Link |
---|---|
US (1) | US4760291A (en) |
JP (1) | JPH0821844B2 (en) |
DE (1) | DE3715159A1 (en) |
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JPH0198313A (en) * | 1987-10-09 | 1989-04-17 | Nec Corp | Synchronizing circuit |
JP2534757B2 (en) * | 1988-07-06 | 1996-09-18 | 株式会社東芝 | Refresh circuit |
US5032740A (en) * | 1989-11-06 | 1991-07-16 | Eastman Kodak Company | Voltage level conversion of a clock signal |
JP2946663B2 (en) * | 1990-07-10 | 1999-09-06 | 住友電気工業株式会社 | Semiconductor device for driving light emitting elements |
KR930009704B1 (en) * | 1991-09-07 | 1993-10-08 | 재단법인 한국전자통신연구소 | Semiconductor device with chip select pair |
JPH05102831A (en) * | 1991-10-09 | 1993-04-23 | Mitsubishi Electric Corp | Output circuit for semiconductor integrated circuit |
US5566112A (en) * | 1994-08-10 | 1996-10-15 | Sgs-Thomson Microelectronics, Inc. | Apparatus and method for enabling a bus driver when a data signal is valid |
JP3492792B2 (en) * | 1994-12-22 | 2004-02-03 | 株式会社アドバンテスト | Waveform shaping circuit for semiconductor test equipment |
US6338103B1 (en) | 1999-03-24 | 2002-01-08 | International Business Machines Corporation | System for high-speed data transfer using a sequence of overlapped global pointer signals for generating corresponding sequence of non-overlapped local pointer signals |
US6140855A (en) * | 1999-03-30 | 2000-10-31 | International Business Machines Corporation | Dynamic-latch-receiver with self-reset pointer |
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DE1228303B (en) * | 1965-04-23 | 1966-11-10 | Philips Patentverwaltung | Device for the synchronization of counting signals with a clock pulse frequency |
DE2607000C3 (en) * | 1976-02-20 | 1978-11-02 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Digital / digital converter |
JPS5314412A (en) * | 1976-07-24 | 1978-02-09 | Kunimasa Ooide | Method of suspending duct pipe* etc* with steel tape |
US4317053A (en) * | 1979-12-05 | 1982-02-23 | Motorola, Inc. | High speed synchronization circuit |
JPS58136129A (en) * | 1982-02-08 | 1983-08-13 | Nippon Telegr & Teleph Corp <Ntt> | Waveform conversion circuit |
JPS60144022A (en) * | 1983-12-30 | 1985-07-30 | Hitachi Ltd | Differential or circuit |
US4691121A (en) * | 1985-11-29 | 1987-09-01 | Tektronix, Inc. | Digital free-running clock synchronizer |
-
1986
- 1986-05-30 JP JP61125996A patent/JPH0821844B2/en not_active Expired - Lifetime
-
1987
- 1987-05-07 DE DE19873715159 patent/DE3715159A1/en active Granted
- 1987-05-27 US US07/054,851 patent/US4760291A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS62281615A (en) | 1987-12-07 |
US4760291A (en) | 1988-07-26 |
DE3715159A1 (en) | 1987-12-03 |
DE3715159C2 (en) | 1988-04-28 |
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