JPH08201600A - X-ray microscope - Google Patents
X-ray microscopeInfo
- Publication number
- JPH08201600A JPH08201600A JP7027509A JP2750995A JPH08201600A JP H08201600 A JPH08201600 A JP H08201600A JP 7027509 A JP7027509 A JP 7027509A JP 2750995 A JP2750995 A JP 2750995A JP H08201600 A JPH08201600 A JP H08201600A
- Authority
- JP
- Japan
- Prior art keywords
- plate
- ray
- zone plate
- zone
- microscope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明はコンデンサー用光学素子
としてゾーンプレートを用いたX線顕微鏡に関し、詳し
くはゾーンプレートから発生する迷光の遮断に関するも
のである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an X-ray microscope using a zone plate as an optical element for a condenser, and more particularly to blocking stray light generated from the zone plate.
【0002】[0002]
【従来の技術】X線顕微鏡は生物試料を未処理で高分解
能観察できるため注目されている。コンデンサーとして
ゾーンプレートを用いたX線顕微鏡では、所望の波長の
X線を分光して取り出すためにゾーンプレートの焦点位
置にピンホールを設置している。ここで、ピンホールを
開いた部材を絞り板と呼ぶ。X線顕微鏡は通常軟X線を
使用していることから、光源、光学系、検出器は真空槽
中に設置されている。また絞り板は光軸調整を容易にす
るため、光軸方向及び光軸に垂直でかつ直交する2方向
の計3軸の移動機構に保持されている。2. Description of the Related Art X-ray microscopes have been attracting attention because they can observe biological samples untreated and with high resolution. In an X-ray microscope using a zone plate as a condenser, a pinhole is installed at the focal position of the zone plate in order to disperse and extract X-rays of a desired wavelength. Here, the member having the pinholes is called a diaphragm plate. Since an X-ray microscope usually uses soft X-rays, the light source, optical system, and detector are installed in a vacuum chamber. Further, the diaphragm plate is held by a moving mechanism of a total of three axes in the optical axis direction and two directions perpendicular to and orthogonal to the optical axis in order to facilitate the adjustment of the optical axis.
【0003】[0003]
【発明が解決しようとする課題】非単色光源を使用する
場合、所望の波長と異なるX線のコンデンサー用ゾーン
プレートでの回折光は絞り板上で大きな広がりを形成す
る。また、所望の波長であっても所望の回折次数以外の
X線は絞り板上で広がりを形成する。一方、絞り板は移
動機構に保持され、かつ、真空槽中に設置されているた
め、必然的に真空槽の内壁との間に間隙を有し、この結
果絞り板の外部を完全に遮光することができず、像に迷
光が混入してしまうという問題点があった。したがって
本発明は、コンデンサー用光学素子としてゾーンプレー
トを用いたX線顕微鏡において、ゾーンプレートから発
生する迷光を遮断することを目的とする。When a non-monochromatic light source is used, the diffracted light of the X-ray different from the desired wavelength on the condenser zone plate forms a large spread on the diaphragm plate. Further, even at a desired wavelength, X-rays other than the desired diffraction order form a spread on the diaphragm plate. On the other hand, since the diaphragm plate is held by the moving mechanism and installed in the vacuum chamber, it necessarily has a gap with the inner wall of the vacuum chamber, and as a result, the outside of the diaphragm plate is completely shielded from light. However, there was a problem that stray light was mixed in the image. Therefore, an object of the present invention is to block stray light generated from a zone plate in an X-ray microscope using the zone plate as an optical element for condenser.
【0004】[0004]
【課題を解決するための手段】本発明は上記目的を達成
するためになされたものであり、すなわち、X線源から
発生したX線をゾーンプレートによって集光し、中心に
ピンホールを有し光軸方向とこれに直交する平面方向と
に移動自在に形成した絞り板をゾーンプレートの後方に
配置して必要とするX線を取り出し、該絞り板の後方に
試料を配置して該試料にピンホールを通過したX線を照
射し、結像光学系によって試料のX線像を像面上に結像
するX線顕微鏡において、ゾーンプレートと像面との間
に、中心に開口を有する遮光板を配置して、絞り板の外
部を通過するX線が像面に到達するのを遮断したことを
特徴とするX線顕微鏡である。The present invention has been made to achieve the above object, that is, X-rays generated from an X-ray source are condensed by a zone plate and have a pinhole at the center. A diaphragm plate movably formed in the optical axis direction and a plane direction orthogonal to the optical axis direction is arranged behind the zone plate to take out necessary X-rays, and a sample is arranged behind the diaphragm plate to obtain the sample. In an X-ray microscope that irradiates X-rays that have passed through a pinhole and forms an X-ray image of a sample on an image plane by an imaging optical system, a light shield that has an opening at the center between the zone plate and the image plane The X-ray microscope is characterized in that a plate is arranged to block X-rays passing through the outside of the diaphragm plate from reaching the image plane.
【0005】[0005]
【作用】本発明では遮光板を設置しているため、絞り板
で遮断されずに像面へ進む光を遮断することができる。In the present invention, since the light shielding plate is installed, it is possible to block the light that advances to the image plane without being blocked by the diaphragm plate.
【0006】[0006]
【実施例】本発明を図面によって説明する。図1は本発
明の一実施例のX線顕微鏡を示し、真空槽8内にはX線
源1、コンデンサー用ゾーンプレート2、遮光板7、絞
り板3、試料4、対物用光学素子5及び検出器6がその
順に同軸に配置されている。絞り板3の中心にはピンホ
ール3aが開口しており、絞り板3は、光軸方向zとそ
れに垂直な直交する2軸x及びyに移動可能なステージ
(不図示)に取り付けられている。また遮光板7の中心
には絞り板3の外径よりも小径の開口7aが設けられて
おり、遮光板7の外周面は真空槽8の内面に固定されて
いる。本実施例は以上のように形成されており、X線源
1より発生したX線は、コンデンサー用ゾーンプレート
2によって集光され、不用な波長、不用な回折次数のも
のが絞り板3で遮られ、所望の波長の所望の回折次数の
X線のみがピンホール3aを通過して試料4に照射され
る。試料4のX線像は、対物用光学素子5によって検出
器6上に結像する。The present invention will be described with reference to the drawings. FIG. 1 shows an X-ray microscope according to an embodiment of the present invention. In a vacuum chamber 8, an X-ray source 1, a condenser zone plate 2, a light shielding plate 7, a diaphragm plate 3, a sample 4, an objective optical element 5 and The detectors 6 are arranged coaxially in that order. A pinhole 3a is opened in the center of the diaphragm plate 3, and the diaphragm plate 3 is attached to a stage (not shown) that is movable in the optical axis direction z and two axes x and y perpendicular to and perpendicular to the optical axis direction z. . An opening 7a having a diameter smaller than the outer diameter of the diaphragm plate 3 is provided at the center of the light shield plate 7, and the outer peripheral surface of the light shield plate 7 is fixed to the inner surface of the vacuum chamber 8. The present embodiment is formed as described above, and the X-ray generated from the X-ray source 1 is condensed by the condenser zone plate 2 and the diaphragm plate 3 blocks unnecessary wavelengths and unnecessary diffraction orders. Then, only the X-ray of a desired diffraction order of a desired wavelength passes through the pinhole 3a and is irradiated on the sample 4. The X-ray image of the sample 4 is formed on the detector 6 by the objective optical element 5.
【0007】しかしてX線源1から発生し、コンデンサ
ー用ゾーンプレート2で回折されたX線の内、不用な波
長、不用な回折次数のX線は、絞り板3上で広がりを形
成するが、絞り板3の外部を通過しようとするX線は、
遮光板7で遮断されて検出器6に到達しない。したがっ
てゾーンプレート2から発生する迷光は遮断されて、鮮
明な画像を得ることができる。なお上記効果を得るため
には遮光板7は、絞り板3の移動を妨げない程度に十分
に絞り板3に接近して配置することが好ましい。また本
実施例では遮光板7をゾーンプレート2と絞り板3との
間に配置した場合を示したが、試料4の背後に遮光板7
を配置して、ゾーンプレート2から発生する迷光を遮断
することもできる。Therefore, among the X-rays generated from the X-ray source 1 and diffracted by the condenser zone plate 2, X-rays having an unnecessary wavelength and an unnecessary diffraction order form a spread on the diaphragm plate 3. , X-rays trying to pass through the outside of the diaphragm plate 3
It is blocked by the light shield 7 and does not reach the detector 6. Therefore, stray light generated from the zone plate 2 is blocked and a clear image can be obtained. In order to obtain the above effect, it is preferable that the light shield plate 7 is arranged sufficiently close to the diaphragm plate 3 so as not to hinder the movement of the diaphragm plate 3. In addition, although the case where the light shielding plate 7 is arranged between the zone plate 2 and the diaphragm plate 3 is shown in this embodiment, the light shielding plate 7 is provided behind the sample 4.
Can also be arranged to block stray light generated from the zone plate 2.
【0008】[0008]
【発明の効果】以上のように本発明によれば、ピンホー
ル以外から像面に到達する光を完全に遮断することがで
きるから、ゾーンプレートでの回折による迷光を遮断す
ることができ、またその他の迷光をも遮断することがで
きるから、鮮明な画像を得ることができるX線顕微鏡で
ある。As described above, according to the present invention, it is possible to completely block the light that reaches the image plane from other than the pinhole, so that it is possible to block the stray light due to the diffraction at the zone plate. The X-ray microscope can obtain clear images because it can also block other stray light.
【図面の簡単な説明】[Brief description of drawings]
【図1】本発明の一実施例の光学配置の模式図である。
1…X線源 2…コンデンサー用ゾーンプ
レート 3…絞り板 3a…ピンホール 4
…試料 5…対物用光学素子 6…検出器 7
…遮光板 7a…開口 8…真空槽FIG. 1 is a schematic diagram of an optical arrangement according to an embodiment of the present invention.
1 ... X-ray source 2 ... Condenser zone plate 3 ... Aperture plate 3a ... Pinhole 4
… Sample 5… Objective optical element 6… Detector 7
... Light-shielding plate 7a ... Opening 8 ... Vacuum chamber
Claims (2)
によって集光し、中心にピンホールを有し光軸方向とこ
れに直交する平面方向とに移動自在に形成した絞り板を
前記ゾーンプレートの後方に配置して必要とするX線を
取り出し、該絞り板の後方に試料を配置して該試料に前
記ピンホールを通過した前記X線を照射し、結像光学系
によって前記試料のX線像を像面上に結像するX線顕微
鏡において、 前記ゾーンプレートと像面との間に、中心に開口を有す
る遮光板を配置して、前記絞り板の外部を通過するX線
が前記像面に到達するのを遮断したことを特徴とするX
線顕微鏡。1. A zone plate which collects X-rays generated from an X-ray source by a zone plate and has a pinhole at the center thereof and is movable in an optical axis direction and a plane direction orthogonal to the zone. The necessary X-ray is taken out by arranging it behind the plate, the sample is arranged behind the diaphragm plate, the sample is irradiated with the X-ray that has passed through the pinhole, and an imaging optical system is used to In an X-ray microscope that forms an X-ray image on an image plane, a light-shielding plate having an opening at the center is arranged between the zone plate and the image plane, and X-rays passing outside the diaphragm plate are X, characterized in that it is blocked from reaching the image plane
Line microscope.
との間に配置した、請求項1記載のX線顕微鏡。2. The X-ray microscope according to claim 1, wherein the light shielding plate is arranged between the zone plate and the diaphragm plate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7027509A JPH08201600A (en) | 1995-01-24 | 1995-01-24 | X-ray microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7027509A JPH08201600A (en) | 1995-01-24 | 1995-01-24 | X-ray microscope |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH08201600A true JPH08201600A (en) | 1996-08-09 |
Family
ID=12223111
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7027509A Pending JPH08201600A (en) | 1995-01-24 | 1995-01-24 | X-ray microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH08201600A (en) |
-
1995
- 1995-01-24 JP JP7027509A patent/JPH08201600A/en active Pending
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