JPH08148755A - Plane emitting laser device and its manufacture - Google Patents

Plane emitting laser device and its manufacture

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Publication number
JPH08148755A
JPH08148755A JP29112894A JP29112894A JPH08148755A JP H08148755 A JPH08148755 A JP H08148755A JP 29112894 A JP29112894 A JP 29112894A JP 29112894 A JP29112894 A JP 29112894A JP H08148755 A JPH08148755 A JP H08148755A
Authority
JP
Japan
Prior art keywords
emitting laser
semiconductor substrate
laser device
photomask
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP29112894A
Other languages
Japanese (ja)
Inventor
Takeshi Kawakami
威 川上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP29112894A priority Critical patent/JPH08148755A/en
Publication of JPH08148755A publication Critical patent/JPH08148755A/en
Pending legal-status Critical Current

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Abstract

PURPOSE: To provide a plane emitting laser device which allows the reduction of non-linearity (kink) of the light output/inrush current characteristics, its manufacture and a photomask to be used for it, since plane emitting laser devices permit the reflection light from the substrate rear side, from which light is taken, to re-inrush into the oscillator and cause kinks. CONSTITUTION: A p-type semiconductor multilayer film 3 and an n-type semiconductor multilayer film 7 compose a pair of reflection mirror for the laser resonator of a plane emitting laser oscillator. An active layer 5 is arranged between a pair of multilayer films. A laser oscillator 10, which has a pair of semiconductor multilayer films as a reflection mirror, is laminated on a semiconductor substrate 11 and the plane emitting laser is formed. On the rear side of the substrate, from which output light 14 is to be taken, a recessed structure 15 that has a reflection plane is provided.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明,光伝送や光情報処理に用
いられる垂直共振器型面発光レーザ装置に関し,特に,
戻り光に起因する応答の非線形性や不安定性を低減した
面発光レーザ装置,及びその製造方法及びそれに用いる
フォトマスクに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a vertical cavity surface emitting laser device used for optical transmission and optical information processing, and in particular,
The present invention relates to a surface emitting laser device in which nonlinearity and instability of response due to returning light are reduced, a manufacturing method thereof, and a photomask used therefor.

【0002】[0002]

【従来の技術】従来の垂直共振器型面発光レーザ装置の
構造は,例えば,エレクトロニクス・レターズ(Elctro
n. Lett.)の25巻,20号,1989年の1377〜
1378頁に記載されている面発光レーザ装置に準じて
いる。
2. Description of the Related Art The structure of a conventional vertical cavity surface emitting laser device is described in, for example, Electronics Letters (Elctro).
n. Lett.), Vol. 25, No. 20, 1377-1989.
This is based on the surface emitting laser device described on page 1378.

【0003】従来の垂直共振器型面発光レーザ装置の断
面構造を図5に示す。この面発光レーザ装置は,半導体
基板11の表面(図では上側面)に,電源1の一端に接
続されたn側電極8と,電源の他端に接続された半導体
積層構造体からなる面発光レーザ発振器10(以下,単
にレーザ発振器と呼ぶ)とを有する。図示のように,レ
ーザ発振器10は,活性層5をクラッド層4,6で挾ん
でダブルヘテロ構造を形成し,このダブルヘテロ構造を
含む半導体層を中間層9とし,レーザ共振器の反射鏡を
構成するp型半導体多層膜3及びn型半導体多層膜7と
の間に中間層9を配置して構成している。
A cross-sectional structure of a conventional vertical cavity surface emitting laser device is shown in FIG. This surface-emitting laser device is a surface-emitting device including an n-side electrode 8 connected to one end of a power supply 1 and a semiconductor laminated structure connected to the other end of the power supply 1 on the surface (upper side surface in the figure) of a semiconductor substrate 11. It has a laser oscillator 10 (hereinafter, simply referred to as a laser oscillator). As shown in the figure, the laser oscillator 10 sandwiches the active layer 5 with the cladding layers 4 and 6 to form a double hetero structure. The semiconductor layer including this double hetero structure is used as the intermediate layer 9 and the reflection mirror of the laser resonator is formed. An intermediate layer 9 is arranged between the constituent p-type semiconductor multilayer film 3 and the constituent n-type semiconductor multilayer film 7.

【0004】このように面発光レーザ装置は,半導体基
板11上にレーザ発振器10を搭載した構成では,半導
体基板11上に,各積層面が基板表面に平行と成り,且
つ垂直方向に順に重ね合わされて共振器が積層された構
造となっており,この面発光レーザ装置における出力光
14は,レーザ発振器10を搭載した面とは反対側の裏
面から取り出される。
As described above, in the surface emitting laser device having the structure in which the laser oscillator 10 is mounted on the semiconductor substrate 11, the respective laminated surfaces are parallel to the substrate surface on the semiconductor substrate 11 and are sequentially stacked in the vertical direction. In this surface emitting laser device, the output light 14 is extracted from the back surface opposite to the surface on which the laser oscillator 10 is mounted.

【0005】[0005]

【発明が解決しようとする課題】このような構造の面発
光レーザ装置においては,レーザ出力光の一部が基板裏
面と空気との界面から反射し,戻り光として再度レーザ
発振器に注入される。その結果,レーザの光出力−注入
電流特性の非線形性(キンク)や,雑音やモード不安定
性に起因するレーザ出力の揺らぎが生ずる。この戻り光
を低減するためには,基板裏面にARコート膜を施す必
要があるが,十分な基板−空気界面の反射率の低減は容
易ではない。
In the surface emitting laser device having such a structure, a part of the laser output light is reflected from the interface between the back surface of the substrate and the air and is again injected into the laser oscillator as return light. As a result, non-linearity (kink) in the optical output-injection current characteristics of the laser and fluctuations in the laser output due to noise and mode instability occur. In order to reduce this return light, it is necessary to apply an AR coat film to the back surface of the substrate, but it is not easy to sufficiently reduce the reflectance at the substrate-air interface.

【0006】そこで,本発明の技術的課題は,レーザ発
振器への戻り光を低減できる簡単な構造の面発光レーザ
装置及びその製造方法とそれに用いるフォトマスクとを
提供することにある。
Therefore, a technical object of the present invention is to provide a surface emitting laser device having a simple structure capable of reducing the return light to the laser oscillator, a manufacturing method thereof and a photomask used for the same.

【0007】[0007]

【課題を解決するための手段】前述の課題を解決するた
めに,本発明の面発光レーザ装置では,表裏をなす2面
を有する半導体基板と,前記半導体基板の一面上に形成
された半導体積層構造体を備え,前記半導体基板の前記
一面に対向する他面からレーザ光を取り出す面発光レー
ザ装置において,前記他面には,前記半導体基板を透過
する前記レーザ光を乱反射させるための構造物を有する
ことを特徴としている。
In order to solve the above problems, in a surface emitting laser device of the present invention, a semiconductor substrate having two front and back surfaces, and a semiconductor laminated layer formed on one surface of the semiconductor substrate are provided. In a surface emitting laser device comprising a structure and extracting laser light from the other surface of the semiconductor substrate facing the one surface, a structure for irregularly reflecting the laser light passing through the semiconductor substrate is provided on the other surface. It is characterized by having.

【0008】ここで,本発明においては,前記構造物
は,前記半導体積層構造体の積層された一面において平
行な平面ではない透過反射面を有することが好ましく
い。また,この透過反射面は,前記半導体基板に形成さ
れた凹面からなるか,又は,前記半導体層構造体の積層
された一面において平行な平面に対して交差する傾斜面
からなることがより好ましい。
Here, in the present invention, it is preferable that the structure has a transmissive / reflecting surface that is not a parallel plane on one surface of the laminated semiconductor structure. Further, it is more preferable that the transmissive / reflecting surface is a concave surface formed on the semiconductor substrate or an inclined surface that intersects a plane parallel to the stacked one surface of the semiconductor layer structure.

【0009】また,本発明のフォトマスクは,半導体基
板の一面に,エッチングによって構造物を形成するため
のフォトマスクであって,前記フォトマスクは,ガラス
基板と,前記ガラス基板の一面上に積層した透過光調整
のための多層薄膜層とを備え,前記多層薄膜層が前記構
造物のパターンに対応した層数を有することを特徴とし
ている。ここで,本発明のフォトマスクにおいて,前記
薄膜は,所定波長の光を反射する反射膜からなることが
好ましい。
The photomask of the present invention is a photomask for forming a structure on one surface of a semiconductor substrate by etching. The photomask is laminated on a glass substrate and one surface of the glass substrate. And a multilayer thin film layer for adjusting transmitted light, wherein the multilayer thin film layer has the number of layers corresponding to the pattern of the structure. Here, in the photomask of the present invention, it is preferable that the thin film is a reflective film that reflects light having a predetermined wavelength.

【0010】さらに,本発明の面発光レーザ装置の製造
方法では,表裏をなす2面を有する半導体基板の一面上
に,面発光レーザ発振器をなす半導体積層構造体を設け
た前記半導体基板の前記一面に対向する他面に前記半導
体基板を透過する前記レーザ光を乱反射させる構造物を
形成する方法であって,前記他面をエッチングすること
により,前記構造物を形成することを特徴としている。
Further, according to the method of manufacturing a surface emitting laser device of the present invention, the semiconductor substrate having the semiconductor laminated structure forming the surface emitting laser oscillator is provided on the one surface of the semiconductor substrate having two front and back surfaces. Is a method of forming a structure that diffusely reflects the laser light that has passed through the semiconductor substrate on the other surface facing the other surface, wherein the structure is formed by etching the other surface.

【0011】[0011]

【作用】本発明では,半導体基板の一面上に面発光レー
ザ発振器の半導体積層構造体を形成してなる面発光レー
ザ装置において,出力光を取り出す半導体基板の他面
に,前記半導体積層構造体の積層された一面に平行な平
面でない透過反射面を有する構造物を設ける。このと
き,前記構造物により,基板−空気界面で反射光を乱反
射させることにより,前記反射光が戻り光としてレーザ
発振器に再度注入されることを回避することかが可能と
なる。
According to the present invention, in a surface emitting laser device in which a semiconductor laminated structure of a surface emitting laser oscillator is formed on one surface of a semiconductor substrate, the semiconductor laminated structure is formed on the other surface of the semiconductor substrate from which output light is extracted. A structure having a transmissive / reflecting surface that is not a plane parallel to the stacked one surface is provided. At this time, it is possible to prevent the reflected light from being re-injected into the laser oscillator as return light by diffusing the reflected light at the substrate-air interface by the structure.

【0012】このようにレーザ発振器への戻り光を低減
することにより,レーザ光出力−注入電流特性の非線形
性(キンク)や,雑音やモード不安定性に起因するレー
ザ出力の揺らぎを低減することができる。
By thus reducing the return light to the laser oscillator, it is possible to reduce the nonlinearity (kink) of the laser light output-injection current characteristic and the fluctuation of the laser output due to noise and mode instability. it can.

【0013】[0013]

【実施例】以下,本発明の実施例について,図面を参照
して説明する。
Embodiments of the present invention will be described below with reference to the drawings.

【0014】図1は,本発明の第1実施例による面発光
レーザ装置を示す概念断面図である。図1に示すよう
に,活性層5をクラッド層4,6で挾んでダブルヘテロ
構造が構成されている。このダブルヘテロ構造を有する
中間層9が,レーザ発振器の反射鏡を構成するp型半導
体多層膜3及びn型半導体多層膜7との間に配置されて
いる。p型半導体多層膜3上にはp側電極2が設けてあ
る。これら,符号3〜7で示す層でなる半導体多層構造
体が,面発光レーザ発振器10を構成し,半導体基板1
1上に積層されている。
FIG. 1 is a conceptual sectional view showing a surface emitting laser device according to a first embodiment of the present invention. As shown in FIG. 1, the active layer 5 is sandwiched by the cladding layers 4 and 6 to form a double hetero structure. The intermediate layer 9 having this double hetero structure is arranged between the p-type semiconductor multilayer film 3 and the n-type semiconductor multilayer film 7 which form the reflecting mirror of the laser oscillator. A p-side electrode 2 is provided on the p-type semiconductor multilayer film 3. The semiconductor multi-layer structure composed of these layers 3 to 7 constitutes the surface-emission laser oscillator 10, and the semiconductor substrate 1
1 is stacked on top.

【0015】本実施例では,半導体基板上に垂直共振器
を形成した従来の面発光レーザ装置の構造に加えて,出
力光14を取り出す側である基板裏面に,乱反射のため
の透過反射面を備えた凹状構造物15が設けられてい
る。レーザ発振器10から発光した光は,半導体−空気
界面において反射されるが,この前記凹状構造物15を
設けることにより,反射光13の方向をレーザ発振器1
0に戻らないように偏向させることができる。そのた
め,裏面に施すARコート膜12の条件を緩和すること
ができる。また,前記凹状構造物15を,空気レンズと
して作用させることも可能である。このとき,形状を適
当に設計することにより,本来ダイバージェンスを有す
るレーザ出力光を,目的に応じてコリメートしたり,集
光したりすることができる。
In this embodiment, in addition to the structure of a conventional surface emitting laser device in which a vertical resonator is formed on a semiconductor substrate, a transmission / reflection surface for irregular reflection is provided on the back surface of the substrate on which the output light 14 is extracted. The concave structure 15 provided is provided. The light emitted from the laser oscillator 10 is reflected at the semiconductor-air interface, but by providing the concave structure 15, the direction of the reflected light 13 is changed.
It can be deflected so as not to return to zero. Therefore, the conditions of the AR coat film 12 applied to the back surface can be relaxed. It is also possible to make the concave structure 15 act as an air lens. At this time, by appropriately designing the shape, it is possible to collimate or focus the laser output light, which originally has divergence, according to the purpose.

【0016】図2は,本発明の第2実施例に係る面発光
レーザ装置を示す概念断面図である。本発明の第2実施
例においては,半導体基板11上に,所定の間隔をおい
て配置されたレーザ発振器10を有しており,このレー
ザ発振器10の位置に対応して半導体基板11の裏面に
レーザ発振器10の価格に対応した間隔で乱反射のため
の透過反射面を備えたテーパ状構造物16を設けてい
る。ここで,レーザ発振器10の間隔は,レーザ光の波
長に対して十分に大きいものであれば良く,複数のレー
ザ発振器を含むことも可能であるが,この場合,例え
ば,半導体基板11の裏面全体を斜めに研磨すると,基
板両端での厚さが大きく異なることになる。そのため基
板の場所に寄って基板の吸収による出力光強度の相違や
ビームダイバージェンスによるビーム径の相違が生じて
しまう。尚,本発明の第2実施例の様にレーザ発振器と
裏面構造物を1対1対応とすることにより,基板の光学
長を各素子に対して均一にできるため上述の場所に依存
する問題を回避することができる。
FIG. 2 is a conceptual sectional view showing a surface emitting laser device according to a second embodiment of the present invention. In the second embodiment of the present invention, the laser oscillator 10 is arranged on the semiconductor substrate 11 at a predetermined interval, and the laser oscillator 10 is provided on the back surface of the semiconductor substrate 11 corresponding to the position of the laser oscillator 10. The tapered structure 16 having a transmission / reflection surface for irregular reflection is provided at intervals corresponding to the price of the laser oscillator 10. Here, the spacing between the laser oscillators 10 may be sufficiently large with respect to the wavelength of the laser light, and it is possible to include a plurality of laser oscillators. In this case, for example, the entire back surface of the semiconductor substrate 11 is included. If it is polished obliquely, the thickness at both ends of the substrate will be greatly different. Therefore, a difference in the output light intensity due to the absorption of the substrate and a difference in the beam diameter due to the beam divergence occur near the location of the substrate. In addition, since the optical length of the substrate can be made uniform with respect to each element by making the laser oscillator and the back surface structure have a one-to-one correspondence as in the second embodiment of the present invention, the problem depending on the above-mentioned location is solved. It can be avoided.

【0017】図1及び図2に示したような,基板裏面の
反射方向転換構造物の作製方法としては,集束荷電粒子
ビームによる直描エッチング等が挙げられる。しかし,
直描的な手法では,作製に時間を要し,2次元集積化デ
バイスへの適応を考慮すると現実的ではない。そこで,
本発明の実施例においては,基板内においてレーザ光を
乱反射させることができる前記構造物を簡便に作製する
ことができるフォトマスクについて,以下に説明する。
As a method for manufacturing the reflection direction changing structure on the back surface of the substrate as shown in FIGS. 1 and 2, direct drawing etching with a focused charged particle beam and the like can be mentioned. However,
The direct drawing method requires a long time for fabrication, and is not realistic in consideration of adaptation to a two-dimensional integrated device. Therefore,
In the embodiments of the present invention, a photomask which can easily manufacture the structure capable of irregularly reflecting the laser light in the substrate will be described below.

【0018】図3は,本発明の第3実施例によるフォト
マスクの断面図を示す。この実施例においては,凹状構
造物を作製するためにガラス基板17上に同心円上に異
なった径の開口を有する反射薄膜層18を設けている。
このような,反射薄膜層18を順次積層することによ
り,任意の透過光強度分布を得ることができる。さら
に,反射薄膜層18の材料として,例えば,低反射クロ
ム(CrOx )や高反射クロム(Cr)を組み合わせて
用いることにより,より理想的な透過光強度分布を与え
るフォトマスクを得ることが可能となる。
FIG. 3 is a sectional view of a photomask according to the third embodiment of the present invention. In this embodiment, a reflective thin film layer 18 having openings of different diameters is concentrically formed on a glass substrate 17 in order to manufacture a concave structure.
An arbitrary transmitted light intensity distribution can be obtained by sequentially stacking such reflective thin film layers 18. Furthermore, by using, for example, a combination of low reflection chromium (CrO x ) and high reflection chromium (Cr) as the material of the reflective thin film layer 18, it is possible to obtain a photomask that gives a more ideal transmitted light intensity distribution. Becomes

【0019】図4は,図3のフォトマスクを用いて第1
実施例で述べた凹状構造物15を製作する過程を表す概
念図である。図4(a)に示すように,フォトマスクを
通常の紫外線20を用いた露光プロセスと同様に,パタ
ーン転写に用いると,ポジ型のフォトレジスト19を用
いた場合,適当な条件においては図4(b)に示すレジ
スト形状が形成される。これを,反応性プラズマエッチ
ング等の手法によりエッチングすることにより,図4
(c)に示すような凹状構造物15を基板裏面に形成す
ることができる。
FIG. 4 shows a first photomask using the photomask of FIG.
It is a conceptual diagram showing the process of manufacturing the concave structure 15 described in the Example. As shown in FIG. 4A, when a photomask is used for pattern transfer in the same manner as in an exposure process using ordinary ultraviolet rays 20, when a positive photoresist 19 is used, the photomask is not exposed under appropriate conditions. The resist shape shown in (b) is formed. By etching this with a method such as reactive plasma etching,
The concave structure 15 as shown in (c) can be formed on the back surface of the substrate.

【0020】このように本フォトマスクを用いることに
より,通常の露光プロセスと同様に簡便に基板裏面に凹
状構造物を形成することができる。さらに,本フォトマ
スクにおいて,所望の透過光強度分布を与えることによ
り,上記したような必要な構造物を形成することができ
る。
By using the present photomask in this way, it is possible to easily form a concave structure on the back surface of the substrate as in the case of a normal exposure process. Further, in the present photomask, the necessary structure as described above can be formed by giving a desired transmitted light intensity distribution.

【0021】[0021]

【発明の効果】以上,説明したように,本発明における
面発光レーザ装置及びフォトマスクにおいては,きわめ
て簡単な構造及び製造方法で,戻り光に起因するレーザ
出力−注入電流の非線形性(キンク)や,雑音,モード
不安定性を低減することができる。したがって,本発明
の面発光レーザ装置は,線形な応答が必要とされる高速
変調動作等の応用にも適している。
As described above, in the surface emitting laser device and the photomask according to the present invention, the nonlinearity (kink) of the laser output-injection current caused by the returning light is obtained by the extremely simple structure and manufacturing method. In addition, noise and mode instability can be reduced. Therefore, the surface emitting laser device of the present invention is also suitable for applications such as high-speed modulation operation that requires a linear response.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1の実施例に係る面発光レーザ装置
を示す概念断面図である。
FIG. 1 is a conceptual cross-sectional view showing a surface emitting laser device according to a first embodiment of the present invention.

【図2】本発明の第2の実施例である面発光レーザ装置
を示す概念断面図である。
FIG. 2 is a conceptual cross-sectional view showing a surface emitting laser device according to a second embodiment of the present invention.

【図3】本発明の第3の実施例であるフォトマスクを示
す概念断面図である。
FIG. 3 is a conceptual sectional view showing a photomask which is a third embodiment of the present invention.

【図4】(a),(b)及び(c)は図3のフォトマス
クを用いた面発光レーザ製造工程の一例を示す概念図で
ある。
4 (a), (b) and (c) are conceptual diagrams showing an example of a surface emitting laser manufacturing process using the photomask of FIG.

【図5】従来の面発光レーザの断面構造を示す概念図で
ある。
FIG. 5 is a conceptual diagram showing a cross-sectional structure of a conventional surface emitting laser.

【符号の説明】[Explanation of symbols]

1 電流源 2 p側電極 3 p型半導体多層膜 4,6 クラッド層 5 活性層 7 n型半導体多層膜 8 n側電極 9 中間層 10 レーザ発振器 11 半導体基板 12 ARコート膜 13 反射光 14 出力光 15 凹状構造物 16 テーパ状構造物 17 ガラス基板 18 反射薄膜層 19 フォトレジスト 20 紫外線 1 current source 2 p-side electrode 3 p-type semiconductor multilayer film 4,6 clad layer 5 active layer 7 n-type semiconductor multilayer film 8 n-side electrode 9 intermediate layer 10 laser oscillator 11 semiconductor substrate 12 AR coating film 13 reflected light 14 output light 15 Concave Structure 16 Tapered Structure 17 Glass Substrate 18 Reflective Thin Film Layer 19 Photoresist 20 Ultraviolet

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】 表裏をなす2面を有する半導体基板と,
前記半導体基板の一面上に形成された半導体積層構造体
を備え,前記半導体基板の前記一面に対向する他面から
レーザ光を取り出す面発光レーザ装置において,前記他
面には,前記半導体基板を透過する前記レーザ光を乱反
射させるための構造物を有することを特徴とする面発光
レーザ装置。
1. A semiconductor substrate having two front and back surfaces,
A surface emitting laser device comprising a semiconductor laminated structure formed on one surface of the semiconductor substrate and extracting laser light from the other surface of the semiconductor substrate facing the one surface, wherein the other surface transmits the semiconductor substrate. A surface emitting laser device having a structure for diffusely reflecting the laser light.
【請求項2】 請求項1記載の面発光レーザ装置におい
て,前記構造物は,前記半導体積層構造体の積層された
一面において平行な平面でない透過反射面を有すること
を特徴とする面発光レーザ装置。
2. The surface emitting laser device according to claim 1, wherein the structure has a transmissive / reflecting surface which is not parallel to one surface on which the semiconductor laminated structure is laminated. .
【請求項3】 請求項2記載の面発光レーザ装置におい
て,前記透過反射面は,前記半導体基板に形成された凹
面からなることを特徴とする面発光レーザ装置。
3. The surface emitting laser device according to claim 2, wherein the transmissive / reflecting surface is a concave surface formed on the semiconductor substrate.
【請求項4】 請求項2記載の面発光レーザ装置におい
て,前記透過反射面は,前記半導体層構造体の積層され
た一面において平行な平面に対して交差する傾斜面から
なることを特徴とする面発光レーザ装置。
4. The surface emitting laser device according to claim 2, wherein the transmissive / reflecting surface is an inclined surface that intersects a plane parallel to one surface on which the semiconductor layer structures are stacked. Surface emitting laser device.
【請求項5】 半導体基板の一面に,エッチングによっ
て構造物を形成するためのフォトマスクであって,前記
フォトマスクは,ガラス基板と,前記ガラス基板の一面
上に積層した透過光調整のための多層薄膜層とを備え,
前記多層薄膜層が前記構造物のパターンに対応した層数
を有することを特徴とするフォトマスク。
5. A photomask for forming a structure on one surface of a semiconductor substrate by etching, wherein the photomask is a glass substrate and a transmitted light adjustment layer laminated on the one surface of the glass substrate for adjusting transmitted light. With a multi-layer thin film layer,
The photomask, wherein the multilayer thin film layer has a number of layers corresponding to the pattern of the structure.
【請求項6】 請求項5記載のフォトマスクにおいて,
前記薄膜は,所定波長の光を反射する反射膜からなるこ
とを特徴とするフォトマスク。
6. The photomask according to claim 5, wherein
The photomask, wherein the thin film is a reflective film that reflects light of a predetermined wavelength.
【請求項7】 表裏をなす2面を有する半導体基板の一
面上に,面発光レーザ発振器をなす半導体積層構造体を
設けた前記半導体基板の前記一面に対向する他面に前記
半導体基板を透過する前記レーザ光を乱反射させる構造
物を形成する方法であって,前記他面をエッチングする
ことにより,前記構造物を形成することを特徴とする面
発光レーザ装置の製造方法。
7. A semiconductor substrate having a front surface and a back surface, which has two surfaces, and a semiconductor laminated structure forming a surface emitting laser oscillator provided on one surface of the semiconductor substrate. The semiconductor substrate is transmitted to the other surface opposite to the one surface. A method of forming a structure that diffusely reflects the laser light, wherein the structure is formed by etching the other surface.
JP29112894A 1994-11-25 1994-11-25 Plane emitting laser device and its manufacture Pending JPH08148755A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29112894A JPH08148755A (en) 1994-11-25 1994-11-25 Plane emitting laser device and its manufacture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29112894A JPH08148755A (en) 1994-11-25 1994-11-25 Plane emitting laser device and its manufacture

Publications (1)

Publication Number Publication Date
JPH08148755A true JPH08148755A (en) 1996-06-07

Family

ID=17764822

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29112894A Pending JPH08148755A (en) 1994-11-25 1994-11-25 Plane emitting laser device and its manufacture

Country Status (1)

Country Link
JP (1) JPH08148755A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011078196A1 (en) * 2009-12-21 2011-06-30 Ricoh Company, Ltd. Optical device capable of minimizing output variation due to feedback light, optical scanning apparatus, and image forming apparatus
WO2022254770A1 (en) * 2021-06-01 2022-12-08 ソニーグループ株式会社 Semiconductor light emitting element and method for manufacturing semiconductor light emitting element

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55164803A (en) * 1979-06-12 1980-12-22 Fujitsu Ltd Coupling method of semiconductor laser and optical fiber
JPS59128540A (en) * 1983-01-13 1984-07-24 Fujitsu Ltd Photomask
JPS59169190A (en) * 1983-03-16 1984-09-25 Hitachi Ltd Light emitting semiconductor device
JPS62172767A (en) * 1986-01-24 1987-07-29 Mitsubishi Electric Corp Optical semiconductor device
JPH04221874A (en) * 1990-12-21 1992-08-12 Nec Corp Microscopic resonator light emitting element
JPH04301625A (en) * 1991-03-29 1992-10-26 Furukawa Electric Co Ltd:The Optical function element
JPH05235474A (en) * 1992-02-21 1993-09-10 Rohm Co Ltd Semiconductor laser
JPH06314846A (en) * 1993-04-30 1994-11-08 Nec Corp Narrow banding surface light-emitting laser

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55164803A (en) * 1979-06-12 1980-12-22 Fujitsu Ltd Coupling method of semiconductor laser and optical fiber
JPS59128540A (en) * 1983-01-13 1984-07-24 Fujitsu Ltd Photomask
JPS59169190A (en) * 1983-03-16 1984-09-25 Hitachi Ltd Light emitting semiconductor device
JPS62172767A (en) * 1986-01-24 1987-07-29 Mitsubishi Electric Corp Optical semiconductor device
JPH04221874A (en) * 1990-12-21 1992-08-12 Nec Corp Microscopic resonator light emitting element
JPH04301625A (en) * 1991-03-29 1992-10-26 Furukawa Electric Co Ltd:The Optical function element
JPH05235474A (en) * 1992-02-21 1993-09-10 Rohm Co Ltd Semiconductor laser
JPH06314846A (en) * 1993-04-30 1994-11-08 Nec Corp Narrow banding surface light-emitting laser

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011078196A1 (en) * 2009-12-21 2011-06-30 Ricoh Company, Ltd. Optical device capable of minimizing output variation due to feedback light, optical scanning apparatus, and image forming apparatus
US8803936B2 (en) 2009-12-21 2014-08-12 Ricoh Company, Ltd. Optical device capable of minimizing output variation due to feedback light, optical scanning apparatus, and image forming apparatus
WO2022254770A1 (en) * 2021-06-01 2022-12-08 ソニーグループ株式会社 Semiconductor light emitting element and method for manufacturing semiconductor light emitting element

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