JPH08101251A - Ic tester/ic handler system - Google Patents

Abstract

PURPOSE: To provide an IC tester/IC handler system which cannot be classified and housed by mistake due to the difference in an IC socket number. CONSTITUTION: In an IC handler 1, an IC supply means 1E supplies an IC to be tested and an IC contact means 1F allows the IC to be tested to contact the contact pin of an IC socket. In an IC tester 2, an IC measurement means 2E measures the IC to be tested on the IC socket. Then, when initializing the IC handier 1, the IC socket number is received from the IC tester 2 by a communication means 1D and is written at the address set by the socket number of the storage means 1C. Also, the IC handler 1 receives the measurement result from the IC tester 2 and classifies and houses the IC to be tested after measurement by an IC housing means 1G based on the IC socket number setting written to the storage means 1C.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an IC tester / IC handler system used for testing an IC under test.

[0002]

2. Description of the Related Art A general configuration example of an IC tester / IC handler system will be described with reference to FIG. In FIG. 4, 11 is an IC handler, 11A is an IC supply unit, and 11B.
Is an IC contact portion, and 11C is an IC housing portion. Further, 12 is an IC tester, 12A is a test station, 12B is a contact board, and 12C is an IC socket. 13 is a communication cable.

In this IC tester / IC handler system, the test station 12A is previously docked to the IC handler 11. Then, in the IC handler 11, the IC supply section 11A supplies the IC under test to the IC contact section 11B, and the IC contact section 11B causes the supplied IC under test to contact the contact pin of the IC socket 12C on the contact board 12A. At the same time, the measurement position information is sent to the IC tester 12 through the communication cable 13.
Send to.

Further, when the IC tester 12 receives the above-mentioned measurement position information, the IC tester 12 receives a test I on the IC socket 12C.
Start measuring C. Then, after the measurement is completed, the measurement result information is transmitted to the IC handler 11 through the communication cable 13.

Further, in the IC handler 11, the measured ICs under test are sorted and stored in the IC storage section 11C according to the received measurement result information.

[0006]

However, in the conventional IC tester / IC handler system, if the IC socket number of the IC tester and the IC socket number of the IC handler are different, classification / accommodation error of the IC under test may occur. There is a problem that occurs.

An example of such an error occurrence will be described with reference to FIG. FIG. 6 shows an example of the above contact boat.
Four IC sockets B, C and D are mounted. Then, the IC socket numbers of the IC tester are 01, 0 in order.
2, 03, 04 and the IC socket numbers of the IC handlers are 01, 03, 02, 04 in order.

Then, for example, for the IC under test supplied to the IC socket of B, the measurement position information is provided so that the IC handler measures the IC socket number 03 (that is, the IC socket of B) with respect to the IC tester. Suppose you have communicated to an IC tester. In this case, the IC socket numbers 01 to 04 of the IC tester for the IC sockets A, B, C and D on the contact board and the IC of the IC handler
It is assumed that the correspondence with the socket numbers 01 to 04 is different. In this case, the IC tester measures, for example, the IC socket number 03 (IC socket of C), and transmits the measurement result of the IC socket number 03 (IC socket of C) to the IC handler after the measurement is completed. I will end up. Then, the IC handler determines from the received measurement result that the IC socket number 03
It happens that the IC to be tested in (B IC socket) is classified and accommodated. In this way, the IC to be tested on the IC socket of B is classified and accommodated according to the measurement result of the IC to be tested on the IC socket of C, so that an error in classification and accommodation of the IC under test occurs. I will end up.

An object of the present invention is to provide an IC tester / IC handler system in which a classification / accommodation error due to a difference in IC socket number between an IC tester and an IC handler does not occur.

[0010]

In order to achieve the above object, in the first invention, an IC supply means for supplying an IC under test to an IC socket and an IC accommodation means for classifying and accommodating the IC under test after measurement. And an IC handler having a predetermined setting value and measurement result storage means, an IC measuring means for measuring the IC under test, and an IC tester having a predetermined setting value and measurement result storage means. In an IC tester / IC handler system including means for communicating information between an IC handler and the IC tester, the I
The C handler stores the IC socket number received from the IC tester via the communication means in the storage means,
The IC supply means supplies the IC under test to the IC socket, and the measurement position information of each IC under test based on the IC socket number written in the storage means is transmitted to the IC tester through the communication means. Further, the IC tester transmits the measurement result information of each IC under test on the IC socket measured by the IC measuring means based on the measurement position information to the IC handler via the communication means, and further, IC The handler is configured to classify and house the IC under test by the IC housing means according to the measurement result information based on the measurement position information.

In the second invention, the IC to be tested is
An IC supplying means for supplying to the socket, an IC accommodating means for classifying and accommodating the IC under test after measurement, and an IC handler having a storage means for storing predetermined set values and measurement results;
An IC tester / IC having an IC measuring unit for measuring C, and an IC tester having a storage unit for storing a predetermined set value and a measurement result, and further having a communication unit for information between the IC handler and the IC tester. In the handler system, the IC handler compares the IC socket number received from the IC tester via the communication unit with the IC socket number stored in the storage unit, and determines that these two IC socket numbers are the same. In some cases, the I
The IC under test is supplied to the IC socket by the C supply means,
Transmitting the measurement position information of each IC under test based on the IC socket number to the IC tester via the communication means,
Further, the IC tester transmits the measurement result information of each IC under test on the IC socket measured by the IC measuring means based on the measurement position information to the IC handler via the communication means, and further, IC The handler, based on the measurement position information, according to the measurement result information, the I
The IC to be tested is classified and accommodated by the C accommodation means. Here, when the two IC socket numbers are different, an alarm is displayed on the display means.

[0012]

In the IC tester / IC handler system according to the first aspect of the invention, the IC handler and the IC tester perform processing based on the measurement position information of each IC under test based on the IC socket number transmitted from the IC tester. ,
Since the IC tester and the IC handler have the same IC socket number, the IC under test is not classified or accommodated incorrectly.

Further, in the IC tester / IC handler system of the second aspect of the invention, since the processing is performed when the IC socket numbers of the IC tester and the IC handler are the same, an error in classifying / accommodating the IC under test may occur. Absent. In the second invention, when the IC socket numbers of the IC tester and the IC handler are different, the IC socket number setting stored on the IC handler side is set to the IC on the IC tester side.
It is rewritten to be the same as the socket number setting.

[0014]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the IC tester / IC handler system of the present invention will be described below.

(Embodiment 1) IC tester I of the first invention
The configuration of the embodiment of the C handler system is shown in FIG. In this IC tester / IC handler system, the IC handler 1 includes a control unit 1A, a display unit 1B, and a storage unit 1.
C, communication means 1D, IC supply means 1E, IC contact means 1F, and IC accommodation means 1G. Also IC
The tester 2 includes a control unit 2A, a display unit 2B, and a storage unit 2.
C, communication means 2D, IC measuring means 2E.

Then, when the IC to be tested is tested, when the IC handler 1 is initialized, for example, GP
-The communication means 1D receives the IC socket number from the IC tester 2 by communication such as IB or RS232C or parallel I / O interface. This IC tester 2
The IC socket number of is written and stored in the address of the IC socket number setting of the storage unit 1C configured by, for example, a RAM.

The control means 1A of the IC handler 1 is composed of a CPU, for example. This control means 1A controls the I to be tested.
Control the handling of C. Specifically, when the IC supply means 1E supplies the IC under test to the IC contact portion,
The IC contact means 1F connects the IC under test to the IC socket 1
In addition to controlling the contact with the contact pin of 2C, the supply position of the IC under test is measured and recognized by setting the IC socket number written in advance in the storage unit 1C, and the communication unit 1D also uses this measurement position information. Is transmitted to the IC tester 2.

The control means 2A of the IC tester 2 is, for example, C
Composed of PU. The control means 2A controls the IC measuring means 2E to measure the IC under test on the IC socket, and controls the communication means 2D to transmit the measurement result information to the IC handler 1 after the measurement is completed.

Then, the IC handler 1 recognizes the measurement position of the IC under test by setting the IC socket number written in the storage means 1C in advance. In addition, the IC accommodating means 1G classifies and accommodates the IC under test after the measurement based on the measurement result information received from the IC tester 2.

Here, the IC supply means 1E is the same as the IC supply portion 11A in FIG. 4, the IC contact means 1F is the same IC contact portion 11B, the IC housing means 1G is the same IC housing portion 11C, and the IC measuring means 2E is the same. Each corresponds to the test station 12A. Further, as the display unit 1B, specifically, a CRT, a liquid crystal, a plasma display or the like is used. 8 and 9 show display examples on the display means 1B.

The operation of the system of the embodiment having the above configuration will be described with reference to the flowchart of FIG.

First, in step S1, the IC handler 1
The IC handler 1 is initialized by starting up or changing settings. Next, in step S2, the communication means 1D
Receives the IC socket number of IC tester 2 from IC tester 2. Here, the communication format of the received IC socket number is determined by determining the address of each IC socket on the contact board 12B and communicating the IC socket number for that address.

For example, for each IC socket on the contact board 12B in FIG. 5, the address of the IC socket at position A is 11, the address of the IC socket at position B is 12,
The address of the IC socket at position C is 21, the IC at position D is
The address of the socket is 22. At this time, the IC socket number at position A of the IC tester is 01, the IC socket number at position B is 02, the IC socket number at position C is 03, and D is
Assuming that the IC socket number at the position is 04, for example, in GP-IB, from the IC tester to the IC handler, I
CNO 11: 01/12: 02/21/03: 22:
04 <CR><LF> IC socket number information is communicated.

Although FIG. 5 shows an example of the contact board 12B used when simultaneously measuring four ICs, other contact boards 12B used when simultaneously measuring, for example, 64 ICs are used. An example is shown in FIG. The number of ICs to be simultaneously measured can be appropriately adjusted by increasing or decreasing the number of digits of the address of the IC socket used in the system. In fact, increasing the number of digits of the address eliminates the limitation of the number of simultaneous measurements.

In step S3, the address of the IC socket number setting in the storage means 1C of the IC handler 1 is set to
Write the received IC socket number of the IC tester 2.
FIG. 8 shows a display example of the IC socket number setting. This display example corresponds to the IC socket numbers shown in the IC sockets in FIG.

In step S4, the IC under test is supplied to the IC contact portion by the supply means 1E of the IC handler 1. Further, in step S5, the IC to be tested is brought into contact with the contact pin of the IC socket by the IC contact means 1F. Further, in step S6, the supply position of the IC to be tested is recognized by the IC socket number setting previously stored in the storage means 1C, and the communication means 1 is used.
The measurement position information is transmitted to the IC tester 2 by D.

In step S7, the measuring means 2E of the IC tester measures the IC under test on the IC socket. Also,
In step 8, the measurement result information is transmitted to the IC handler 1 by the communication means 2D after the measurement is completed.

Further, in step S9, the IC handler 1
In the above, the measurement position of the IC under test is recognized by the IC socket number setting written in advance in the storage means 1C, and the IC housing means 1G measures the IC under test after the measurement result information received from the IC tester 2. Classify and store.

(Second Embodiment) Next, a second embodiment according to the second invention will be described. Here, since the components themselves of the IC tester / IC handler system in this embodiment are the same as those in the embodiment shown in FIG. 1, the description thereof will be omitted for convenience. The second embodiment is different from the above-described embodiment in the operation of each component in the system including the components of FIG. Then, the operation of the second embodiment will be specifically described with reference to the flowchart of FIG.

First, in step S11, the IC handler 1 is started up or the setting is changed to change the IC handler 1
Is initialized. Next, in step S12, the communication unit 1D receives the IC socket number of the IC tester 2 from the IC tester 2. The communication format of the received IC socket number and the like are the same as in the first embodiment.

In step S13, the control means 1A compares the IC socket number setting previously written in the storage means 1C of the IC handler 1 with the IC socket number received from the IC tester 2. And step S
14, the IC socket number of IC handler 1 and I
If the IC socket number received from the C tester 2 is different, the process proceeds to step S15. IC like this
An example of the contact board 12B when the socket numbers are different is shown in FIG.

In step S15, an alarm is displayed on the display means 1B. FIG. 9 shows an example of a display screen displaying an alarm. When the alarm is displayed in this manner, for example, the operator changes the IC socket number setting on the display screen shown in FIG. 8 in step S16. This setting change is performed by writing the IC socket number of the IC tester 2 in the address of the IC socket number setting in the storage unit 1C. Such writing may be automatically performed by the control means 1A. Then, the process returns to step S13, and the IC socket number setting whose setting has been changed and the IC socket number received from the IC tester 2 are compared again.

If the IC socket number of the IC handler 1 and the IC socket number received from the IC tester 2 are the same in step S14, step S1
Proceed to 7. In step S17, the IC under test is supplied to the IC contact portion by the supply means 1E of the IC handler 1. In step S18, the IC contact means 1F contacts the IC under test with the contact pin of the IC socket.
In step S19, the IC handler 1 recognizes and measures the supply position of the IC under test by setting the IC socket number written in advance in the storage unit 1C, and the communication unit 1D transmits this measurement position information to the IC tester 2. To do.

In step S20, the measuring means 2E of the IC tester measures the IC under test on the IC socket. In step 21, after the measurement of the IC under test is completed, the communication means 2D transmits the measurement result information to the IC handler 1.

In step S22, the IC handler 1 recognizes the measurement position of the IC under test by setting the IC socket number written in the storage means 1C in advance, and stores the IC according to the measurement result information received from the IC tester 2. The IC under test after measurement is sorted and accommodated by the means 1G.

[0036]

According to the present invention, since the IC socket number of the IC tester and the IC socket number of the IC handler are treated as the same, it is possible to prevent the IC under test from being classified / accommodated incorrectly due to the difference in the IC socket numbers. As a result,
The reliability in IC classification of the IC tester / IC handler system can be improved.

[Brief description of drawings]

FIG. 1 is a block diagram showing a configuration of an embodiment of an IC tester / IC handler system of the present invention.

FIG. 2 is an IC tester / IC of the first embodiment according to the first invention.
6 is a flowchart showing the operation of the handler system.

FIG. 3 is an IC tester / IC of a second embodiment according to the second invention.
6 is a flowchart showing the operation of the handler system.

FIG. 4 is a perspective view of an embodiment of an IC tester / IC handler system of the present invention.

FIG. 5 is an explanatory diagram showing a contact board according to the first embodiment.

FIG. 6 is an explanatory diagram showing a contact board according to a second embodiment.

FIG. 7 is an explanatory diagram showing an example of a contact board used in Examples.

FIG. 8 is an explanatory diagram showing an example of a display screen in the embodiment.

FIG. 9 is an explanatory diagram illustrating an example of a display screen according to the second embodiment.

[Explanation of symbols]

 1 IC Handler 1A Control Means 1B Display Means 1C Storage Means 1D Communication Means 1E IC Supply Means 1F IC Contact Means 1G IC Housing Means 2 IC Testers 2A Control Means 2B Display Means 2C Storage Means 2D Communication Means 2E IC Measuring Means

Claims (5)

[Claims] 1. I for supplying an IC under test to an IC socket
An IC handler (1) having a C supplying means (1E), an IC accommodating means (1G) for classifying and accommodating the IC under test after measurement, and a first storage means (1C) for storing predetermined set values and measurement results; It has an IC measuring means (2E) for measuring an IC under test and an IC tester (2) having a second storage means (2C) for storing predetermined set values and measurement results, and further has an IC handler (1) and an IC. In an IC tester / IC handler system equipped with information communication means (1D, 2D) with the tester (2), the IC handler (1) is transferred from the IC tester (2) via the communication means (1D, 2D). The received IC socket number is stored in the first storage means (1C), the IC under test is supplied to the IC socket by the IC supply means (1E), and the IC socket is written in the first storage means (1C). The measurement position information of each IC under test based on the number is transmitted to the IC tester (2) via the communication means (1D, 2D), The IC tester (2) transmits the measurement result information of each IC under test on the IC socket measured by the IC measuring means (2E) based on the measurement position information via the communication means (1D, 2D) to the IC handler (1 ) To the IC handler (1) based on the measurement position information and according to the measurement result information by the IC accommodation means (1G).
IC tester / IC characterized by classifying and accommodating C
Handler system. 2. An IC handler (1) or an IC tester (2)
2. The IC tester / IC handler system according to claim 1, wherein at least one of them has a display means (1B) for displaying various set values and measurement results. 3. An IC to be tested for supplying to an IC socket I
An IC handler (1) having a C supplying means (1E), an IC accommodating means (1G) for classifying and accommodating the IC under test after measurement, and a first storage means (1C) for storing predetermined set values and measurement results; An IC tester provided with an IC measuring means (2E) for measuring an IC under test, and a second storage means (2C) for storing predetermined set values and measurement results.
(2), and further has an IC handler (1) and an IC tester (2)
In an IC tester / IC handler system having means (1D, 2D) for communicating information with the IC socket, the IC handler (1) is an IC socket received from the IC tester (2) via the means (1D, 2D) for communication. The number and the IC socket number stored in the first storage means (1C) are compared, and if these two IC socket numbers are the same, I
The IC under test is supplied to the IC socket by the C supply means (1E), and the measurement position information of each IC under test based on the IC socket number is transmitted to the IC tester (2) through the communication means (1D, 2D). The IC tester (2) transmits the measurement result information of each IC under test on the IC socket measured by the IC measuring means (2E) based on the measurement position information to the IC handler (1D, 2D) via the communication means (1D, 2D). 1), and the IC handler (1) uses the IC receiving means (1G) in accordance with the measurement result information based on the measurement position information to test the I.
IC tester / IC characterized by classifying and accommodating C
Handler system. 4. An IC handler (1) or an IC tester (2)
4. The IC tester / IC handler system according to claim 3, wherein at least one of them has a display means (2B) for displaying various set values and measurement results. 5. The IC tester / IC handler system according to claim 4, wherein when the two IC socket numbers are different, an alarm is displayed on the display means (1B).