JPH0783901A - Tester of data processing device - Google Patents

Abstract

PURPOSE:To evaluate the accuracy and reproducibility for calculating the height. area, etc., of the peak of a detection signal. CONSTITUTION:A signal generation part 12 generates a test signal St where a Gauss distribution type peak with a height Hr and an area Ar is repeated at a period of Tr according to parameters input externally. A statistical processing part 14 inputs a height Hi, an area Ai, and a peak time ti of each peak of the signal St calculated by a data processing device 20. thus calculating the average value and the fluctuation coefficient of Hi, Ai, ti-ti-l.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection device for inspecting the operation of a data processing device for inputting a detection signal output from a detector in a chromatograph and processing the data.

[0002]

2. Description of the Related Art In a chromatograph, each component of a sample is separated in a column and eluted from the column outlet. An elution curve called a chromatogram is obtained by detecting each component eluted from the column outlet with a detector and drawing a graph with the detected value on the vertical axis and the time on the horizontal axis. In this chromatogram, peaks corresponding to the respective components separated by the column appear.

A data processing device in a chromatograph inputs a detection signal (voltage signal output from a detector) representing such a chromatogram, and the height of each peak of the detection signal corresponding to each component of the sample. -Calculate the area and retention time (the time from when the sample is injected until the peak appears in the detection signal).

In such a data processing apparatus, a test signal (voltage signal) is input to check the operation of the data processing apparatus. Conventionally, as the test signal, a constant voltage signal is input for inspection. For this reason,
In the conventional inspection, it is only possible to confirm whether or not the height of the signal waveform calculated by the data processing device matches the voltage value of the input signal, and the actual analysis is performed by the data processing device. It was not possible to evaluate the accuracy and reproducibility of the calculation of peak height / area and retention time (amount related to the time axis).

[0005]

Therefore, in the present invention, it is possible to evaluate the accuracy and reproducibility of the data processing (calculation of peak height, area, etc.) performed by the data processing device in the actual analysis by the chromatograph. An object is to provide an inspection device.

[0006]

According to the present invention, which has been made to solve the above-mentioned problems, the output signal of a detector for detecting each component of a sample separated by a column of a chromatograph is inputted to input the sample In an inspection device that inspects the operation of a data processing device that calculates the height and area of the peak of the output signal corresponding to each component, when the height and area are input, a Gaussian distribution waveform having the height and area is repeated. And a statistical processing means for performing statistical calculation on a plurality of heights and areas calculated by a data processing device to which the test signal is input.

[0007]

When the height and area are input, the signal generating means outputs a test signal in which a Gaussian distribution waveform having the height and area is repeated. When this test signal is input to the data processing device, the data processing device calculates the height and area of each Gaussian distribution waveform (Gaussian distribution peak) included in the test signal. The statistical processing means performs statistical calculation on these data (collected values of height and area of each Gaussian distribution type peak) calculated by the data processing device, and averages the height and area of the Gaussian distribution type peak. Calculate values and coefficient of variation.

Each peak in the signal output from the detector when a chromatographic analysis is actually performed generally has a shape close to a Gaussian distribution. Therefore, the above-described inspection operation allows the data processing apparatus to be inspected in more detail than before in a state close to a normal operation (operation during analysis).

That is, by comparing the average values of the height and the area calculated by the statistical processing means with the height and the area input to the signal generating means in the above-mentioned operation, respectively, the accuracy of the data processing by the data processing device is improved. Can be evaluated. Further, since the signal input from the signal generating means to the data processing device is a repetition of the Gaussian distribution waveform of the same shape, the reproducibility of the data processing depends on the coefficient of variation in height and area calculated by the statistical processing means. Can be evaluated.

[0010]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a block diagram showing a state in which an inspection apparatus 10 according to an embodiment of the present invention is connected to a liquid chromatograph data processing apparatus 20. First, the operation of the liquid chromatograph and its data processing device 20 will be described. As shown in FIG. 1, in a liquid chromatograph, a liquid 51 as a mobile phase contained in a container 50 is supplied to a column 54 through a injector 53 at a predetermined flow rate by a liquid feed pump 52 and passed through the column 54. After that, it is discharged through the detector 55. The sample is instantaneously injected from the injector 53, and each component thereof is separated while passing through the column 54 and sent to the detector 55. The detector 55 is a column 54
The concentrations of various components appearing in the above are detected, and the detection signal Sd is generated. This detection signal Sd represents a chromatogram as described above, and has peaks corresponding to the respective components separated by the column 54. Data processing device 20
Is the input of this detection signal Sd, and the height Hi and area Ai of each peak in this signal Sd and the retention time of each component corresponding to each peak (the peak in the detection signal Sd after the sample is injected from the injector 53) Time until appears) Ti
Is calculated (where i = 1, 2, ..., M, and M is the number of peaks).

The inspection apparatus 10 of this embodiment has a data processing apparatus 20 prior to the analysis by the liquid chromatograph.
It is to check whether or not the operation of is correctly performed, and as shown in FIG. 1, it is composed of a signal generating section 12 and a statistical processing section 14. The signal generator 12 is provided with three types of parameters Hr, Ar, which are input from the outside (operator).
As shown in FIG. 2, a test signal St in which Gaussian distribution-shaped peaks of height Hr and area Ar are repeated in a period Tr is generated according to Tr, and is supplied to the data processing device 20. In addition,
The Gaussian distribution type peak of height Hr and area Ar is expressed by the following equation. g (t) = Hr · exp {-π · Hr ² · (t−ti) ² / A
r ² } However, ti is the time when the peak apex appears in the test signal St (hereinafter referred to as “peak time”), and corresponds to the retention time Ti of each component of the sample in the analysis.

In the above-mentioned analysis by the liquid chromatograph, each peak (peak corresponding to each component of the sample) in the detection signal Sd output from the detector 55 generally has a shape close to a Gaussian distribution. Therefore, by the following inspection operation using the above-mentioned test signal St, the data processing device 20 can be operated in a state close to a normal operation (operation during analysis).
It can be inspected in more detail than before.

That is, first, as in the case where the data processing device 20 performs the above-described analysis (as in the normal operation), the height Hi, the area Ai, and the area Ai of each Gaussian distribution-type peak in the test signal St. A peak time ti corresponding to the holding time Ti is calculated (where i = 1, 2, ..., N, and N is the number of Gaussian distribution type peaks in the test signal St). The calculated height Hi, area Ai, and peak time ti are input to the statistical processing unit 14. The statistical processing unit 14 performs statistical calculation on the N pieces of input data using the following equation to obtain a peak generation interval Δti = corresponding to the height Hi, the area Ai, and the input parameter Tr =
The average values Hm, Am, Δtm and the coefficient of variation Hcv, Acv, Δtcv for ti-ti-1 are calculated. Hm = (1 / N) .SIGMA. (I = 1, N) Hi Am = (1 / N) .SIGMA. (I = 1, N) Ai .DELTA.tm = {1 / (N-1)}. SIGMA. (I = 2, N) Δti Hcv = (1 / Hm) {Σ (i = 1, N) (Hi-Hm) ² / (N
−1)} ^1/2 Acv = (1 / Am) {Σ (i = 1, N) (Ai-Am) ² / (N
−1)} ^1/2 Δtcv = (1 / Δtm) {Σ (i = 2, N) (Δti−Δtm) ²
/ (N-2)} ^1/2 However, Σ (i = I1, I2) is i =
It means to take the total sum from I1 to i = I2.

The average values Hm, A obtained as described above
m and Δtm are the parameters H input to the signal generator 12.
The accuracy of data processing in the data processing device 20 can be evaluated by making a comparison with r, Ar, and Tr, respectively. Also, the coefficient of variation H obtained as described above
The reproducibility of data processing can be evaluated by cv, Acv and Δtcv. When it is desired to evaluate not only one kind of value for the parameters Hr, Ar, and Tr but also the accuracy of data processing for the entire numerical range targeted by the data processing device 20, the data is input to the signal generator 12. The values of the parameters Hr, Ar, and Tr may be changed to calculate the above-mentioned average values Hm, Am, and Δtm for various values within the target numerical range, and these may be compared with the corresponding input values.

In the above embodiment, the statistical processing unit 14 is provided separately from the data processing device 20 (see FIG. 1), but when the data processing device 20 has a program function, it is used for statistical processing. The statistical processing unit 14 can be realized in the data processing device 20 by creating software. In this case, as shown in FIG. 3, only the existing signal generator 32 capable of generating a signal having a Gaussian peak is connected to the data processing device 20, and the operation of the data processing device 20 is the same as that of the above embodiment. Similar tests can be performed.

Further, although the inspection apparatus 10 of the above-mentioned embodiment inspects the data processing apparatus 20 in the liquid chromatograph, the present invention is not limited to this.
It can also be applied to the inspection of data processing devices for other chromatographs such as gas chromatographs.

[0017]

According to the present invention, since a signal having a Gaussian distribution peak is used as a test signal, it is possible to inspect a data processing device in a chromatograph in a state close to a normal operation (operation during analysis). You can Also,
Since it is possible to evaluate the accuracy and reproducibility of the calculation of the height and area (amount related to the time axis) of the Gaussian distribution type peak, the operation of the data processing device can be inspected in more detail than before. As a result, the reliability of chromatographic analysis is also improved.

[Brief description of drawings]

FIG. 1 is a block diagram showing a state in which an inspection apparatus according to an embodiment of the present invention is connected to a liquid chromatograph data processing apparatus.

FIG. 2 is a diagram showing a waveform of a test signal output from the inspection device.

FIG. 3 is a perspective view showing another embodiment of the present invention.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 10 ... Inspection apparatus 12 ... Signal generation part (signal generation means) 14 ... Statistical processing part (statistical processing means) 54 ... Column 55 ... Detector Sd ... Detection signal St ... Test signal Hr ... Height (input value) Ar ... Area (Input value) Tr ... Repeating cycle (input value) Hi ... Height (calculated value) Ai ... Area (calculated value) Ti ... Retention time (calculated value) ti ... Peak time (calculated value)

Claims (1)

[Claims] 1. The height and area of the peak of the output signal corresponding to each component of the sample are calculated by inputting the output signal of the detector that detects each component of the sample separated by the chromatographic column. In an inspection device for inspecting the operation of a data processing device, when a height and an area are inputted, a signal generating means for outputting a test signal in which a Gaussian distribution waveform having the height and the area is repeated, and data to which the test signal is inputted. An inspection apparatus for a data processing apparatus, comprising: statistical processing means for statistically calculating a plurality of heights and areas calculated by the processing apparatus.