JPH076570Y2 - 光式碍子汚損量測定装置 - Google Patents
光式碍子汚損量測定装置Info
- Publication number
- JPH076570Y2 JPH076570Y2 JP1761790U JP1761790U JPH076570Y2 JP H076570 Y2 JPH076570 Y2 JP H076570Y2 JP 1761790 U JP1761790 U JP 1761790U JP 1761790 U JP1761790 U JP 1761790U JP H076570 Y2 JPH076570 Y2 JP H076570Y2
- Authority
- JP
- Japan
- Prior art keywords
- insulator
- optical
- optical waveguide
- light
- measuring device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000003287 optical effect Effects 0.000 title claims description 69
- 239000012212 insulator Substances 0.000 title claims description 48
- 238000011109 contamination Methods 0.000 title description 2
- 239000013307 optical fiber Substances 0.000 claims description 23
- 230000005540 biological transmission Effects 0.000 claims description 20
- 239000000126 substance Substances 0.000 claims description 11
- 239000000356 contaminant Substances 0.000 claims description 2
- 150000003839 salts Chemical class 0.000 description 15
- 239000003344 environmental pollutant Substances 0.000 description 4
- 231100000719 pollutant Toxicity 0.000 description 4
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Insulators (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1761790U JPH076570Y2 (ja) | 1990-02-23 | 1990-02-23 | 光式碍子汚損量測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1761790U JPH076570Y2 (ja) | 1990-02-23 | 1990-02-23 | 光式碍子汚損量測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03109225U JPH03109225U (en, 2012) | 1991-11-11 |
| JPH076570Y2 true JPH076570Y2 (ja) | 1995-02-15 |
Family
ID=31520803
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1761790U Expired - Lifetime JPH076570Y2 (ja) | 1990-02-23 | 1990-02-23 | 光式碍子汚損量測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH076570Y2 (en, 2012) |
-
1990
- 1990-02-23 JP JP1761790U patent/JPH076570Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH03109225U (en, 2012) | 1991-11-11 |
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