JPH0752431A - Substrate for edge face type thermal head - Google Patents

Substrate for edge face type thermal head

Info

Publication number
JPH0752431A
JPH0752431A JP16206193A JP16206193A JPH0752431A JP H0752431 A JPH0752431 A JP H0752431A JP 16206193 A JP16206193 A JP 16206193A JP 16206193 A JP16206193 A JP 16206193A JP H0752431 A JPH0752431 A JP H0752431A
Authority
JP
Japan
Prior art keywords
face
thermal head
main surface
substrate
ceramic substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16206193A
Other languages
Japanese (ja)
Other versions
JP3045213B2 (en
Inventor
Tsumoru Nagira
積 梛良
Mitsuru Suda
充 須田
Tadashi Betsumune
正 別宗
Hiroshi Ishii
石井  博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Materials Corp
Original Assignee
Mitsubishi Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Materials Corp filed Critical Mitsubishi Materials Corp
Priority to JP16206193A priority Critical patent/JP3045213B2/en
Publication of JPH0752431A publication Critical patent/JPH0752431A/en
Application granted granted Critical
Publication of JP3045213B2 publication Critical patent/JP3045213B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To attain the high printing efficiency when a thermal head is completed and generate no color shading, drawing and the like at the time of printing by improving the flatness on the surface of a glazed layer. CONSTITUTION:A substrate for an edge face type thermal head comprises a ceramic substrate 15 having a couple of main faces 11 facing each other and edge faces 13 formed successively to the main faces in the protruding curved face shape and a glass glazed layer 14 formed on the edge faces, and the angle thetaformed by the tangent 21 to the edge faces at an intersection 17 of the main faces with edge faces of the ceramic substrate 15 is at least 25 deg.. Also it is desirable to make a section A including the intersection 17 curving in the range of 20-100mum with the intersection as a center and connecting smoothly the main faces with edge faces.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、熱転写プリンタのサー
マルヘッド用基板に関する。更に詳しくはセラミック基
板の端面にグレーズ層が形成された端面型サーマルヘッ
ド用基板に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thermal head substrate for a thermal transfer printer. More specifically, it relates to an end face type thermal head substrate in which a glaze layer is formed on the end face of a ceramic substrate.

【0002】[0002]

【従来の技術】この種の基板を用いたサーマルヘッド
は、発熱抵抗体の形成面が基板端面であるため、発熱抵
抗体部分の平坦度が向上し、プラテンローラ上の記録紙
に対してヘッドが均一に接触する。この結果、この種の
サーマルヘッドは、グレーズ層の蓄熱作用と放熱作用も
加わって、普通紙のような粗い紙やカード等の硬い用紙
に対しても良好に印字でき、かつ記録部を小型軽量化す
ることができる。従来、印字品質を更に高めて印刷の効
率を向上させるために、端面型サーマルヘッド用基板の
端面を凸状曲面にしたものが知られている。図3に示す
ように、この端面型サーマルヘッド用基板はセラミック
基板5の相対向する一対の主面1及び2に続く端面3を
凸状曲面に形成して、端面3に形成されるグレーズ層4
の曲率半径を小さくする工夫がなされている。
2. Description of the Related Art In a thermal head using a substrate of this type, since the surface on which the heating resistor is formed is the end face of the substrate, the flatness of the heating resistor portion is improved, and the head is used for recording paper on a platen roller. Contact evenly. As a result, this type of thermal head is able to print well on rough paper such as plain paper and hard paper such as cards, with the addition of heat storage and heat dissipation of the glaze layer, and the recording unit is compact and lightweight. Can be converted. Conventionally, in order to further improve the printing quality and improve the printing efficiency, it is known that the end surface of the end face type thermal head substrate has a convex curved surface. As shown in FIG. 3, this end face type thermal head substrate has a glaze layer formed on the end face 3 by forming an end face 3 following a pair of opposing main faces 1 and 2 of a ceramic substrate 5 into a convex curved surface. Four
Has been devised to reduce the radius of curvature of.

【0003】[0003]

【発明が解決しようとする課題】しかし、上記従来のサ
ーマルヘッド用基板では、凸状曲面の端面3にガラスペ
ーストを塗布し、これを焼成してグレーズ層4を形成し
ているときに、端面境界部であるエッジ7から主面1又
は2に溶融したガラスが部分的に流下し易い。その結
果、主面1又は2に溶融ガラスの流下した箇所6に相応
するグレーズ層4の頂部の厚さは小さくなり、抵抗体が
形成されるグレーズ層頂部付近のうねりの一因になって
いる。うねりを生じたグレーズ層に発熱抵抗体を形成し
たサーマルヘッドで印刷すると、抵抗体から発生した熱
をグレーズ層に均一に蓄熱できず、また印字する際の放
熱も不均一になり、色むらや線びき等の不具合を生じ
る。このためグレーズ層頂部のうねりは1μm以下であ
ることが要求される。本発明の目的は、グレーズ層表面
の平坦度をより高くして、印刷の効率が高く、印刷時に
色むらや線びき等を生じない端面型サーマルヘッド用基
板を提供することにある。
However, in the above conventional thermal head substrate, when the glass paste is applied to the end face 3 of the convex curved surface and the glass paste is baked to form the glaze layer 4, the end face is not formed. The glass melted on the main surface 1 or 2 from the edge 7 which is the boundary portion easily flows down partially. As a result, the thickness of the top of the glaze layer 4 corresponding to the portion 6 where the molten glass flows down on the main surface 1 or 2 becomes small, which contributes to the undulation near the top of the glaze layer where the resistor is formed. . When printing with a thermal head in which a heating resistor is formed on the swelled glaze layer, the heat generated by the resistor cannot be stored uniformly in the glaze layer, and the heat dissipation during printing becomes uneven, resulting in uneven colors. Problems such as line sticking occur. Therefore, the waviness at the top of the glaze layer is required to be 1 μm or less. An object of the present invention is to provide a substrate for an end face type thermal head, which has a higher flatness on the surface of the glaze layer, has high printing efficiency, and does not cause color unevenness or line spread during printing.

【0004】[0004]

【課題を解決するための手段】上記目的を達成するため
に、本発明の構成を図1及び図2に基づいて説明する。
本発明は、相対向する一対の主面11,12とこれらの
主面に続いて凸状曲面に形成された端面13とを有する
セラミック基板15と、前記端面に形成されたガラスグ
レーズ層14とを備えた端面型サーマルヘッド用基板の
改良である。その特徴ある構成は、前記セラミック基板
の前記主面と前記端面との交線17における前記端面に
対する接線21と前記主面とのなす角度θが少なくとも
25度であることにある。また本発明において、セラミ
ック基板15の主面11,12と端面13との交線17
を含む部分Aを交線17を中心に20〜100μmの範
囲で曲面化して、前記主面と前記端面とのつながりを滑
らかにすることが望ましい。
In order to achieve the above object, the structure of the present invention will be described with reference to FIGS. 1 and 2.
The present invention relates to a ceramic substrate 15 having a pair of main surfaces 11 and 12 facing each other and an end surface 13 formed on the convex surface following the main surfaces, and a glass glaze layer 14 formed on the end surface. This is an improvement of a substrate for an end face type thermal head provided with. The characteristic structure is that the angle θ formed by the tangent line 21 to the end face and the main face at the intersection line 17 between the main face and the end face of the ceramic substrate is at least 25 degrees. Further, in the present invention, a line 17 of intersection between the main surfaces 11 and 12 and the end surface 13 of the ceramic substrate 15
It is desirable to make the portion A including a curved surface in the range of 20 to 100 μm around the intersection line 17 to smooth the connection between the main surface and the end surface.

【0005】[0005]

【作用】セラミック基板15の主面11,12と端面1
3との交線17における前記端面に対する接線21と前
記主面とのなす角度θを25度以上にすると、焼成時に
生じる溶融ガラスの前記端面から前記主面への流れが減
少するため、グレーズ層14頂部付近のうねりも低減す
る。しかし前記角度θが25度を越えてあまりに大きく
なりすぎると前記主面と前記端面とのつながり部分に相
当する交線17近傍が鋭角的に形成されて滑らかさが失
われるため、後に配線をグレーズ層14から前記主面に
連続して形成した場合に、断線等の不具合を生じる恐れ
がある。そのため前記主面と前記端面との交線17を含
む部分Aを交線17を中心に20〜100μmの範囲で
曲面化して、前記主面と前記端面とのつながりを滑らか
にすることが望ましい。
[Function] The main surfaces 11 and 12 and the end surface 1 of the ceramic substrate 15
If the angle θ between the tangent line 21 to the end face at the intersection line 17 with 3 and the main surface is set to 25 degrees or more, the flow of the molten glass from the end face to the main surface at the time of firing is reduced, so that the glaze layer 14 Waviness near the top is also reduced. However, when the angle θ exceeds 25 degrees and becomes too large, the vicinity of the intersection line 17 corresponding to the connecting portion between the main surface and the end surface is formed at an acute angle, and smoothness is lost, so that the wiring is glazeed later. When it is formed continuously from the layer 14 to the main surface, there is a possibility that problems such as disconnection may occur. Therefore, it is desirable that the portion A including the intersection line 17 between the main surface and the end surface be curved around the intersection line 17 in the range of 20 to 100 μm to smooth the connection between the main surface and the end surface.

【0006】[0006]

【実施例】以下、実施例により本発明を図面に基づいて
詳細に説明する。本発明はこの実施例により制限される
ものではない。 <実施例1>長さ200mm、幅10mm、厚さ2mm
のアルミナ含有量96%のセラミック基板15を用意し
た。図1及び図2に示すように、この基板15の長さ方
向の平坦な端面全体を研削により凸状曲面である端面1
3を形成した。この例ではセラミック基板15の端面1
3の中央部1.5mmの範囲について、曲率半径1.2
mmの曲面に形成した。また端面13の残りの両端部分
のそれぞれ0.25mmについては曲率半径を次のよう
に決定した。即ち、セラミック基板15の主面11と端
面13との交線17における前記端面に対する接線21
と前記主面とのなす角度θが25度になるように端面1
3の残りの両端部分の0.25mmの範囲を研磨加工し
た。なお、主面11と端面13との交線17を含む部分
Aは特別に研磨せず曲面化しなかった。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described in detail below with reference to the accompanying drawings. The invention is not limited by this example. <Example 1> Length 200 mm, width 10 mm, thickness 2 mm
A ceramic substrate 15 having an alumina content of 96% was prepared. As shown in FIGS. 1 and 2, the entire flat end face in the length direction of the substrate 15 is ground to form a convex curved end face 1.
Formed 3. In this example, the end surface 1 of the ceramic substrate 15
The radius of curvature of 1.2 in the range of 1.5 mm in the center of 3
It was formed on a curved surface of mm. Further, the radius of curvature was determined as follows for each of the remaining both end portions of the end surface 13 of 0.25 mm. That is, the tangent 21 to the end face at the intersection line 17 between the main surface 11 and the end face 13 of the ceramic substrate 15
The end face 1 so that the angle θ between the main surface and
The remaining 0.25 mm area of both end portions of 3 was polished. The portion A including the line 17 of intersection of the main surface 11 and the end surface 13 was not specially polished and was not curved.

【0007】ガラス粉末[GA−1、日本電気硝子
(株)製]とエチルセルロースとテレピオネールとを混
合して得られたガラスペーストをスプレーにより前記セ
ラミック基板15の前記端面13に塗布した。その後、
塗布されたガラスペーストを150℃で乾燥した後、9
50℃で60分間焼成した。このようにして端面13に
形成されたグレーズ層14上にスパッタリングにより金
を付着させ、フォトエッチングにより線幅60μm、線
間隔30μmを有する配線を形成し、サーマルヘッド用
基板を作製した。
A glass paste obtained by mixing glass powder [GA-1, manufactured by Nippon Electric Glass Co., Ltd.], ethyl cellulose and terepionel was applied to the end surface 13 of the ceramic substrate 15 by spraying. afterwards,
After drying the applied glass paste at 150 ° C,
It was baked at 50 ° C. for 60 minutes. Gold was adhered to the glaze layer 14 thus formed on the end face 13 by sputtering, and wiring having a line width of 60 μm and a line interval of 30 μm was formed by photoetching to prepare a thermal head substrate.

【0008】<実施例2>主面11と端面13との交線
17の部分Aを交線17を中心に60μmの範囲で研磨
により曲面化して、前記主面と前記端面とのつながりを
滑らかにした作業を実施したことを除いては実施例1と
同じ方法を繰り返して、サーマルヘッド用基板を作製し
た。
<Embodiment 2> A portion A of an intersection line 17 between the main surface 11 and the end surface 13 is curved by polishing within a range of 60 μm centering on the intersection line 17 to smooth the connection between the main surface and the end surface. A thermal head substrate was prepared by repeating the same method as in Example 1 except that the above work was performed.

【0009】<比較例1>セラミック基板15の主面1
1と端面13との交線17における前記端面に対する接
線21と前記主面とのなす角度θが20度になるように
端面13の残りの両端部分の0.25mmの範囲を研磨
加工したことを除いては実施例1と同じ方法を繰り返し
て、サーマルヘッド用基板を作製した。
<Comparative Example 1> Main surface 1 of ceramic substrate 15
The 0.25 mm range of the remaining both end portions of the end face 13 was polished so that the angle θ between the tangent line 21 to the end face and the main surface at the intersection line 17 between 1 and the end face 13 was 20 degrees. The same method as in Example 1 was repeated except that a thermal head substrate was prepared.

【0010】<比較例2>セラミック基板15の主面1
1と端面13との交線17における前記端面に対する接
線21と前記主面とのなす角度θが20度になるように
端面13の残りの両端部分の0.25mmの範囲を研磨
加工し、かつ主面11と端面13との交線17を含む部
分Aを交線17を中心に60μmの範囲で研磨により曲
面化して、前記主面と前記端面とのつながりを滑らかに
した作業を実施したことの2点を除いては実施例1と同
じ方法を繰り返して、サーマルヘッド用基板を作製し
た。
<Comparative Example 2> Main surface 1 of ceramic substrate 15
The range of 0.25 mm at the remaining end portions of the end face 13 is ground so that the angle θ between the tangent line 21 to the end face and the main surface at the intersection line 17 between 1 and the end face 13 is 20 degrees, and A part A including an intersection line 17 between the main surface 11 and the end surface 13 was curved by polishing around the intersection line 17 within a range of 60 μm, and a work for smoothing the connection between the main surface and the end surface was performed. A thermal head substrate was prepared by repeating the same method as in Example 1 except for the above two points.

【0011】<実施例3>セラミック基板15の主面1
1と端面13との交線17における前記端面に対する接
線21と前記主面とのなす角度θが30度になるように
端面13の残りの両端部分の0.25mmの範囲を研磨
加工し、かつ主面11と端面13との交線17を含む部
分Aを交線17を中心に60μmの範囲で研磨により曲
面化して、前記主面と前記端面とのつながりを滑らかに
した作業を実施したことの2点を除いては実施例1と同
じ方法を繰り返して、サーマルヘッド用基板を作製し
た。
<Embodiment 3> Main surface 1 of ceramic substrate 15
The range of 0.25 mm at the remaining both ends of the end face 13 is ground so that the angle θ between the tangent line 21 to the end face and the main surface at the intersection line 17 between 1 and the end face 13 is 30 degrees, and A part A including an intersection line 17 between the main surface 11 and the end surface 13 was curved by polishing around the intersection line 17 within a range of 60 μm, and a work for smoothing the connection between the main surface and the end surface was performed. A thermal head substrate was prepared by repeating the same method as in Example 1 except for the above two points.

【0012】<比較例3>セラミック基板15の主面1
1と端面13との交線17における前記端面に対する接
線21と前記主面とのなす角度θが30度になるように
端面13の残りの両端部分の0.25mmの範囲を研磨
加工したことを除いては実施例1と同じ方法を繰り返し
て、サーマルヘッド用基板を作製した。
<Comparative Example 3> Main surface 1 of ceramic substrate 15
The range of 0.25 mm of the remaining both end portions of the end face 13 was polished so that the angle θ between the tangent line 21 to the end face and the main surface at the intersection line 17 between 1 and the end face 13 was 30 degrees. The same method as in Example 1 was repeated except that a thermal head substrate was prepared.

【0013】<実施例4>セラミック基板15の主面1
1と端面13との交線17における前記端面に対する接
線21と前記主面とのなす角度θが40度になるように
端面13の残りの両端部分の0.25mmの範囲を研磨
加工し、かつ主面11と端面13との交線17を含む部
分Aを交線17を中心に60μmの範囲で研磨により曲
面化して、前記主面と前記端面とのつながりを滑らかに
した作業を実施したことの2点を除いては実施例1と同
じ方法を繰り返して、サーマルヘッド用基板を作製し
た。
<Embodiment 4> Main surface 1 of ceramic substrate 15
The 0.25 mm range of the remaining both end portions of the end face 13 is polished so that the angle θ between the tangent line 21 to the end face and the main surface at the intersection line 17 between 1 and the end face 13 is 40 degrees, and A part A including an intersection line 17 between the main surface 11 and the end surface 13 was curved by polishing around the intersection line 17 within a range of 60 μm, and a work for smoothing the connection between the main surface and the end surface was performed. A thermal head substrate was prepared by repeating the same method as in Example 1 except for the above two points.

【0014】<比較例4>セラミック基板15の主面1
1と端面13との交線17における前記端面に対する接
線21と前記主面とのなす角度θが40度になるように
端面13の残りの両端部分の0.25mmの範囲を研磨
加工したことを除いては実施例1と同じ方法を繰り返し
て、サーマルヘッド用基板を作製した。
<Comparative Example 4> Main surface 1 of ceramic substrate 15
The range of 0.25 mm of the remaining both end portions of the end surface 13 was polished so that the angle θ between the tangent line 21 to the end surface and the main surface at the intersection line 17 between 1 and the end surface 13 was 40 degrees. The same method as in Example 1 was repeated except that a thermal head substrate was prepared.

【0015】<測定と評価>実施例1〜4及び比較例1
〜4の各サーマルヘッド用基板について、グレーズ層形
成時の主面へのガラスの流れの有無、グレーズ層形成後
の端面頂部のうねりの程度及び配線の断線等の不具合の
有無をそれぞれ調べた。端面頂部のうねりの程度は表面
粗さ計により、その他は目視により測定した。これらの
結果を表1に示す。
<Measurement and Evaluation> Examples 1 to 4 and Comparative Example 1
For each of the thermal head substrates Nos. 4 to 4, the presence or absence of glass flow to the main surface during glaze layer formation, the degree of undulation at the top of the end face after glaze layer formation, and the presence or absence of defects such as wiring breakage were examined. The degree of waviness at the top of the end face was measured by a surface roughness meter, and the others were visually measured. The results are shown in Table 1.

【0016】[0016]

【表1】 [Table 1]

【0017】表1から明かなように、角度θが25度に
なるように端面13の両端部分を研磨加工した実施例1
及び2の端面型サーマルヘッド用基板の場合には、溶融
したガラスが主面11に流れ落ちることがないため、グ
レーズ層の頂部表面のうねりは1μmより小さい。また
交線17を含む部分Aを研磨により曲面化する作業の実
施の有無に関係なく、配線の断線等の不具合も生じな
い。これに対して、角度θが20度になるように端面1
3の両端部分を研磨加工した比較例1及び2の端面型サ
ーマルヘッド用基板の場合には、配線の断線等の不都合
は生じないが、交線17を含む部分Aを研磨により曲面
化する作業の実施の有無に関係なく、溶融したガラスが
主面11に流れ落ちるため、グレーズ層表面のうねりは
2μmより大きくなる欠点が生じる。
As is clear from Table 1, Example 1 in which both end portions of the end face 13 were polished so that the angle θ was 25 degrees
In the case of the end face type thermal head substrate of No. 2 and No. 2, since the molten glass does not flow down to the main surface 11, the waviness of the top surface of the glaze layer is smaller than 1 μm. Further, regardless of whether or not the work for making the portion A including the intersecting line 17 into a curved surface by polishing is performed, a problem such as disconnection of wiring does not occur. On the other hand, the end surface 1 is adjusted so that the angle θ becomes 20 degrees.
In the case of the end face type thermal head substrates of Comparative Examples 1 and 2 in which both end portions of No. 3 are polished, there is no inconvenience such as disconnection of wiring, but the work of making the portion A including the intersecting line 17 into a curved surface by polishing Regardless of whether or not the above is performed, since the molten glass flows down to the main surface 11, the waviness of the glaze layer surface becomes larger than 2 μm.

【0018】実施例3と比較例3とは角度θが30度で
あり、また実施例4と比較例4とは角度θが40度であ
って、いずれも25度を越えているため、溶融したガラ
スが主面11に流れ落ちることがなく、グレーズ層頂部
表面のうねりは1μmより小さい。しかし主面11と端
面13との交線17を含む部分Aを交線17を中心に6
0μmの範囲で研磨により曲面化して、前記主面と前記
端面とのつながりを滑らかにする作業が追加実施されて
いる実施例3及び4の場合には、断線等の配線の不具合
は生じないが、前記主面と前記端面とのつながりを滑ら
かにする作業が実施されていない比較例3及び4の場合
には、断線等の配線の不具合を生じる。
The angle θ of Example 3 and Comparative Example 3 was 30 degrees, and the angle θ of Example 4 and Comparative Example 4 was 40 degrees, both of which exceeded 25 degrees, so that melting occurred. The glass thus formed does not flow down to the main surface 11, and the waviness on the top surface of the glaze layer is smaller than 1 μm. However, the portion A including the intersection line 17 between the main surface 11 and the end surface 13 is 6
In the case of Examples 3 and 4 in which the work of making the curved surface by polishing in the range of 0 μm and smoothing the connection between the main surface and the end surface is additionally performed, wiring problems such as disconnection do not occur. In the case of Comparative Examples 3 and 4 in which the work for smoothing the connection between the main surface and the end surface is not performed, wiring problems such as disconnection occur.

【0019】[0019]

【発明の効果】以上述べたように、本発明によれば、セ
ラミック基板の主面と端面との交線における前記端面に
対する接線と前記主面とのなす角度θを25度以上にし
たので、溶融ガラスの前記端面から前記主面への流れが
減少し、グレーズ層の頂部表面のうねりが低減する。こ
の結果、グレーズ層の蓄熱及び放熱作用が均一に行われ
るので、熱転写印刷時の色むらや線びき等の印字不良が
解消される。
As described above, according to the present invention, the angle θ between the main surface and the tangent to the end surface at the intersection of the main surface and the end surface of the ceramic substrate is set to 25 degrees or more. The flow of the molten glass from the end face to the main face is reduced, and the waviness of the top surface of the glaze layer is reduced. As a result, heat storage and heat dissipation of the glaze layer are performed uniformly, so that printing defects such as color unevenness and line spread during thermal transfer printing are eliminated.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の端面型サーマルヘッド用基板の要部拡
大断面図。
FIG. 1 is an enlarged sectional view of an essential part of a substrate for an end surface type thermal head according to the present invention.

【図2】その要部斜視図。FIG. 2 is a perspective view of a main part thereof.

【図3】従来例の端面型サーマルヘッド用基板の要部斜
視図。
FIG. 3 is a perspective view of a main part of a substrate for an end surface type thermal head of a conventional example.

【符号の説明】[Explanation of symbols]

11,12 セラミック基板の主面 13 セラミック基板の端面 14 グレーズ層 15 セラミック基板 17 セラミック基板の主面と端面との交線 21 交線における端面に対する接線 θ 接線と主面とのなす角度 A 交線を含む部分 11, 12 main surface of ceramic substrate 13 end surface of ceramic substrate 14 glaze layer 15 ceramic substrate 17 intersection line between main surface and end surface of ceramic substrate 21 tangent to end surface at intersection line θ angle between tangent line and main surface A intersection line Part containing

───────────────────────────────────────────────────── フロントページの続き (72)発明者 別宗 正 埼玉県秩父郡横瀬町大字横瀬2270番地 三 菱マテリアル株式会社セラミックス研究所 内 (72)発明者 石井 博 埼玉県秩父郡横瀬町大字横瀬2270番地 三 菱マテリアル株式会社セラミックス研究所 内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Masamune Betsumune 2270 Yokoze, Yokoze-cho, Chichibu-gun, Saitama Sanritsu Materials Co., Ltd. Ceramics Research Laboratory (72) Hiroshi Ishii 2270 Yokose, Yokose-cho, Chichibu-gun, Saitama Bamboo Sanryo Materials Co., Ltd. Ceramics Laboratory

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 相対向する一対の主面(11,12)とこれら
の主面に続いて凸状曲面に形成された端面(13)とを有す
るセラミック基板(15)と、 前記端面に形成されたガラスグレーズ層(14)とを備えた
端面型サーマルヘッド用基板において、 前記セラミック基板の前記主面と前記端面との交線(17)
における前記端面に対する接線(21)と前記主面とのなす
角度(θ)が少なくとも25度であることを特徴とする端
面型サーマルヘッド用基板。
1. A ceramic substrate (15) having a pair of main surfaces (11, 12) facing each other and an end surface (13) formed on the main surface in a convex curved surface, and formed on the end surface. In the end face type thermal head substrate provided with the glass glaze layer (14), the line of intersection (17) between the main surface and the end face of the ceramic substrate.
An end face type thermal head substrate, wherein an angle (θ) formed by the tangent line (21) to the end face and the main surface is at least 25 degrees.
【請求項2】 セラミック基板(15)の主面(11,12)と端
面(13)との交線(17)を含む部分(A)が交線(17)を中心に
20〜100μmの範囲で曲面化され、前記主面と前記
端面とのつながりを滑らかにした請求項1記載の端面型
サーマルヘッド用基板。
2. The portion (A) including the intersecting line (17) between the main surface (11, 12) and the end face (13) of the ceramic substrate (15) is in the range of 20 to 100 μm around the intersecting line (17). The end face type thermal head substrate according to claim 1, wherein the end face type thermal head substrate is curved to make the connection between the main surface and the end face smooth.
JP16206193A 1993-06-30 1993-06-30 Substrate for thermal head Expired - Lifetime JP3045213B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16206193A JP3045213B2 (en) 1993-06-30 1993-06-30 Substrate for thermal head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16206193A JP3045213B2 (en) 1993-06-30 1993-06-30 Substrate for thermal head

Publications (2)

Publication Number Publication Date
JPH0752431A true JPH0752431A (en) 1995-02-28
JP3045213B2 JP3045213B2 (en) 2000-05-29

Family

ID=15747352

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16206193A Expired - Lifetime JP3045213B2 (en) 1993-06-30 1993-06-30 Substrate for thermal head

Country Status (1)

Country Link
JP (1) JP3045213B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6605868B2 (en) * 1998-12-10 2003-08-12 Kabushiki Kaisha Toshiba Insulating substrate including multilevel insulative ceramic layers joined with an intermediate layer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6605868B2 (en) * 1998-12-10 2003-08-12 Kabushiki Kaisha Toshiba Insulating substrate including multilevel insulative ceramic layers joined with an intermediate layer

Also Published As

Publication number Publication date
JP3045213B2 (en) 2000-05-29

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