JPH075199A - Anisotropic conductor and method for inspecting lighting of liquid crystal display panel - Google Patents

Anisotropic conductor and method for inspecting lighting of liquid crystal display panel

Info

Publication number
JPH075199A
JPH075199A JP14452693A JP14452693A JPH075199A JP H075199 A JPH075199 A JP H075199A JP 14452693 A JP14452693 A JP 14452693A JP 14452693 A JP14452693 A JP 14452693A JP H075199 A JPH075199 A JP H075199A
Authority
JP
Japan
Prior art keywords
lcd panel
conductor
anisotropic
lighting
liquid crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14452693A
Other languages
Japanese (ja)
Inventor
Toshiki Naito
俊樹 内藤
Masakazu Sugimoto
正和 杉本
Naoharu Morita
尚治 森田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nitto Denko Corp
Original Assignee
Nitto Denko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Priority to JP14452693A priority Critical patent/JPH075199A/en
Publication of JPH075199A publication Critical patent/JPH075199A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To prevent malfunction of LCD(Liquid Crystal Display) by abutting an anisotropic conductive rubber indirectly on a conductor layer through an anisotropic conductor, thereby preventing foreign matters, e.g. silicon contained in the anisotropic conductive rubber, from adhering to the conductive layer. CONSTITUTION:An anisotropic conductor 1 for inspecting the lighting of an LCD panel is mounted on an inspection unit 10 which is then aligned with an LCD panel 15. When the LCD panel 15 is shifted in the direction of an arrow A, a first bump 4 on the anisotropic conductor 1 abuts on a conductor layer 16 and a second bump 5 abuts on an anisotropic conductive rubber 14. Since the first and second bumps 4, 5 are conducted through a conduction path 3, a signal having a specific frequency for inspecting the lighting of the LCD panel 15 is inputted through the anisotropic conductive rubber 14 and the anisotropic conductor 1 to the conductive layer 16 and the LCD panel 15 is checked for lighting.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、液晶表示(以下「LC
D」という。)パネルの点灯を検査する際に用いられる
異方導電体および液晶表示パネルの点灯検査方法に関す
る。
BACKGROUND OF THE INVENTION The present invention relates to a liquid crystal display (hereinafter referred to as "LC
"D". ) An anisotropic conductor used when inspecting lighting of a panel and a method of inspecting lighting of a liquid crystal display panel.

【0002】[0002]

【従来の技術】従来は、LCDパネルの点灯検査におい
て、LCDパネルと該LCDパネルの点灯を検査する装
置とを直接接触させて検査を行っている。通常、LCD
パネル点灯検査装置の検査子は、突起状の異方導電性ゴ
ムが使用されており、該異方導電性ゴムをLCDパネル
の導電体に当接させて検査を行うと、異方導電性ゴムに
含まれているシリコンなどの異物が、LCDパネルに付
着して、LCDパネルの不良の発生原因となる。
2. Description of the Related Art Conventionally, in the lighting inspection of an LCD panel, the LCD panel and a device for inspecting the lighting of the LCD panel are in direct contact with each other for the inspection. Usually LCD
An inspector of the panel lighting inspection device uses a projection-shaped anisotropic conductive rubber. When the anisotropic conductive rubber is brought into contact with the conductor of the LCD panel to perform the inspection, the anisotropic conductive rubber is used. Foreign matter such as silicon contained in the liquid crystal adheres to the LCD panel and causes a defect in the LCD panel.

【0003】[0003]

【発明が解決しようとする課題】本発明の目的は、LC
Dパネルの点灯検査において、LCDパネル点灯検査装
置の検査子である異方導電性ゴムに含まれているシリコ
ンなどの異物が、LCDパネルに転写されるのを防止す
ることができるLCDパネル点灯検査用異方導電体、お
よび該異方導電体を用いたLCDパネル点灯検査方法を
提供することである。
The object of the present invention is to provide LC
In the D panel lighting inspection, an LCD panel lighting inspection capable of preventing foreign matter such as silicon contained in the anisotropic conductive rubber, which is the inspector of the LCD panel lighting inspection device, from being transferred to the LCD panel. An anisotropic conductor, and an LCD panel lighting inspection method using the anisotropic conductor.

【0004】[0004]

【課題を解決するための手段】そこで、本発明者らは上
記目的を達成するために鋭意検討を重ねた結果、LCD
パネル点灯検査において、LCDパネルとLCDパネル
点灯検査装置との間に異方導電体を介在させることによ
って、LCDパネル点灯検査装置の検査子である異方導
電性ゴムに含まれているシリコンなどの異物が、被検査
体であるLCDパネルに転写されないことを見いだし、
本発明を発明するに至った。
The inventors of the present invention have made extensive studies to achieve the above object, and as a result, LCD
In the panel lighting inspection, by interposing an anisotropic conductor between the LCD panel and the LCD panel lighting inspection device, silicon or the like contained in the anisotropic conductive rubber that is the inspector of the LCD panel lighting inspection device We found that foreign matter was not transferred to the LCD panel, which is the object to be inspected.
The present invention was invented.

【0005】すなわち、本発明のLCDパネル点灯検査
用異方導電体は、LCDパネルの導電体に当接する第1
接触部と、該LCDパネルの点灯を検査する装置の検査
子に当接する第2接触部とが、絶縁体層の両面に相互に
導通してそれぞれ形成されていることを特徴とする。
That is, the anisotropic conductive material for LCD panel lighting inspection of the present invention is the first conductive material for contacting the conductive material of the LCD panel.
The contact portion and the second contact portion that comes into contact with the inspector of the device for inspecting the lighting of the LCD panel are formed on both surfaces of the insulating layer so as to be electrically connected to each other.

【0006】また、本発明のLCDパネル点灯検査方法
は、LCDパネルの導電体と、LCDパネルの点灯を検
査する装置の検査子との間に上記のLCDパネル点灯検
査用異方導電体を介在させて、該異方導電体の第1接触
部を該導電体に当接させ、該異方導電体の第2接触部を
該検査子に当接させることを特徴とする。
Further, in the LCD panel lighting inspection method of the present invention, the above-mentioned anisotropic conductor for LCD panel lighting inspection is interposed between the conductor of the LCD panel and the inspector of the device for inspecting the lighting of the LCD panel. Then, the first contact portion of the anisotropic conductor is brought into contact with the conductor, and the second contact portion of the anisotropic conductor is brought into contact with the probe.

【0007】[0007]

【作用】本発明のLCDパネル点灯検査用異方導電体に
よれば、LCDパネルの点灯を検査するために、LCD
パネルの導電体と、LCDパネルの点灯を検査する装置
の検査子とを当接させる際、該異方導電体を該導電体と
該検査子との間に介在させることによって、該異方導電
体の第1接触部が該導電体に当接し、該異方導電体の第
2接触部が該検査子に当接する。該第1および第2接触
部は、絶縁体層の両面に相互に導通してそれぞれ形成さ
れているので、該検査子と該導電体とは、該第1および
第2接触部を介して導通し、LCDパネルの点灯を検査
することができる。また、該検査子は該異方導電体を介
して間接的に該導電体に当接するので、該検査子に含ま
れているシリコンなどの異物が、該導電体に付着せず、
LCDパネルの不良発生を防止することができる。
According to the anisotropic conductor for inspecting the LCD panel lighting of the present invention, the LCD panel is inspected for the lighting of the LCD panel.
When the conductor of the panel and the inspector of the device for inspecting the lighting of the LCD panel are brought into contact with each other, the anisotropic conductor is interposed between the conductor and the inspector so that The first contact portion of the body contacts the conductor, and the second contact portion of the anisotropic conductor contacts the probe. Since the first and second contact portions are formed on both surfaces of the insulator layer so as to be electrically connected to each other, the probe and the conductor are electrically connected to each other via the first and second contact portions. Then, the lighting of the LCD panel can be inspected. Also, since the probe contacts the conductor indirectly via the anisotropic conductor, foreign matter such as silicon contained in the probe does not adhere to the conductor,
It is possible to prevent the occurrence of defects in the LCD panel.

【0008】本発明のLCDパネル点灯検査方法によれ
ば、上記のLCDパネル点灯検査用異方導電体をLCD
パネルの導電体と、LCDパネルの点灯を検査する装置
の検査子との間に介在させて、該第1接触部を該導電体
に当接させ、該第2接触部を該検査子に当接させるの
で、該検査子と該導電体とは、該第1および第2接触部
を介して導通し、LCDパネルの点灯を検査することが
できる。また、上記と同様に、該検査子は該異方導電体
を介して間接的に該導電体に当接するので、LCDパネ
ルの不良発生を防止することができる。
According to the LCD panel lighting inspection method of the present invention, the above-mentioned anisotropic conductive material for LCD panel lighting inspection is displayed on the LCD.
The first contact portion is brought into contact with the conductor and the second contact portion is brought into contact with the probe by interposing it between the conductor of the panel and the probe of the device for inspecting the lighting of the LCD panel. Since they are brought into contact with each other, the inspection element and the conductor are electrically connected to each other through the first and second contact portions, and the lighting of the LCD panel can be inspected. Further, similarly to the above, since the inspection element indirectly contacts the conductor via the anisotropic conductor, it is possible to prevent the occurrence of defects in the LCD panel.

【0009】本発明において「接触部」とは、LCDパ
ネルの導電体またはLCDパネル点灯検査装置の検査子
に当接することにより導通する導電体をいい、その形状
は特に限定されず、三角形、正方形、長方形、台形、平
行四辺形、その他の多角形、円形などの平面、あるいは
角柱、円柱、球体、錐体(円錐、角錐)などの立体であ
ってもよく、また、必ずしも絶縁体層の表面よりも外方
向に突出するように形成される必要はなく、導電体およ
び検査子のレイアウトや形状などによって任意に設定す
ることができる。
In the present invention, the "contact portion" refers to a conductor that conducts when it comes into contact with the conductor of the LCD panel or the inspection element of the LCD panel lighting inspection device, and the shape thereof is not particularly limited, and is triangular or square. It may be a flat surface such as a rectangle, a trapezoid, a parallelogram, another polygon, or a circle, or a solid such as a prism, a cylinder, a sphere, a cone (cone, a pyramid), or the surface of an insulator layer. It does not need to be formed so as to project more outward than the above, and can be arbitrarily set depending on the layout and shape of the conductor and the probe.

【0010】[0010]

【実施例】以下、本発明を詳細に説明するため実施例を
挙げるが、本発明はこれら実施例によって何ら限定され
るものではない。
EXAMPLES Examples will be given below to explain the present invention in detail, but the present invention is not limited to these examples.

【0011】図1は、本発明のLCDパネル点灯検査用
異方導電体の一実施例を示す断面図である。図1に示さ
れるLCDパネル点灯検査用異方導電体1には、絶縁体
層である絶縁体フィルム2の一方表面21から他方表面
22まで連通する導通路3が形成されている。導通路3
は、絶縁体フィルム2の表面21,22よりも外方向に
突出して形成された第1および第2接点部であるところ
のリベット状の金属突出物(以下単に「バンプ」とい
う。)4,5にそれぞれ接続されており、第1バンプ4
は、導通路3を介して第2バンプ5に導通されている。
FIG. 1 is a sectional view showing an embodiment of an anisotropic conductor for LCD panel lighting inspection according to the present invention. The LCD panel lighting inspection anisotropic conductor 1 shown in FIG. 1 is provided with a conduction path 3 that communicates from one surface 21 to the other surface 22 of the insulator film 2 that is an insulator layer. Continuity path 3
Are rivet-shaped metal protrusions (hereinafter, simply referred to as “bumps”) 4, 5 which are first and second contact portions formed so as to protrude outward from the surfaces 21, 22 of the insulator film 2. Connected to each of the first bumps 4
Are electrically connected to the second bump 5 via the conduction path 3.

【0012】なお、本発明では、上記のように接点部が
リベット状に盛り上がらず、絶縁体フィルム2の表面2
1,22と同一平面上まで導通路3が形成され、その端
部が接点部となる態様をも包含することはいうまでもな
い。
In the present invention, the contact portion does not rise like a rivet as described above, and the surface 2 of the insulator film 2 is not formed.
It goes without saying that it also includes a mode in which the conduction path 3 is formed on the same plane as the Nos. 1 and 22 and the end portion thereof serves as the contact portion.

【0013】絶縁体フィルム2の素材は、バンプを安定
して支持し、電気絶縁特性を有するものであれば特に限
定されない。具体的には、例えばポリエステル系樹脂、
エポキシ系樹脂、ウレタン系樹脂、ポリスチレン系樹
脂、ポリエチレン系樹脂、ポリアミド系樹脂、ポリイミ
ド系樹脂、アクリロニトリル−ブタジエン−スチレン
(ABS)共重合体樹脂、ポリカーボネート系樹脂、シ
リコーン系樹脂などの熱硬化性樹脂または熱可塑性樹脂
が挙げられ、これらのうち、耐熱性および機械的強度に
優れるポリイミド系樹脂が特に好適に使用される。
The material of the insulator film 2 is not particularly limited as long as it can stably support the bumps and has electric insulation properties. Specifically, for example, polyester resin,
Thermosetting resin such as epoxy resin, urethane resin, polystyrene resin, polyethylene resin, polyamide resin, polyimide resin, acrylonitrile-butadiene-styrene (ABS) copolymer resin, polycarbonate resin, silicone resin Alternatively, a thermoplastic resin may be used, and among these, a polyimide resin having excellent heat resistance and mechanical strength is particularly preferably used.

【0014】絶縁体フィルム2の厚さは、特に限定され
ないが、十分な機械的強度や可撓性を有することが好ま
しく、2〜200μm、特に10〜100μmに設定す
るのが好ましい。
The thickness of the insulator film 2 is not particularly limited, but preferably has sufficient mechanical strength and flexibility, and is preferably set to 2 to 200 μm, particularly 10 to 100 μm.

【0015】導通路3を構成する材料としては、導電性
を有するものであれば特に限定されず、公知の金属材料
が使用できるが、例えば金、銀、銅、白金、鉛、錫、ニ
ッケル、コバルト、インジウム、ロジウム、クロム、タ
ングステン、ルテニウムなどの単独金属、またはこれら
を成分とする各種合金、例えば、半田、ニッケル−錫、
金−コバルトなどの導電性材料が挙げられる。バンプ
4,5を構成する材料は、導通路3を導電性物質と同一
の物質であっても別の物質であってもよいが、通常は同
一の物質を使用し、またこの場合、導通路3とバンプ
4,5とは一体的に形成されることが好ましい。
The material forming the conducting path 3 is not particularly limited as long as it has conductivity, and known metal materials can be used. For example, gold, silver, copper, platinum, lead, tin, nickel, Single metals such as cobalt, indium, rhodium, chromium, tungsten, and ruthenium, or various alloys containing these as components, for example, solder, nickel-tin,
A conductive material such as gold-cobalt may be used. The material forming the bumps 4 and 5 may be the same as or different from the conductive material of the conductive path 3, but normally the same material is used. 3 and the bumps 4 and 5 are preferably formed integrally.

【0016】バンプ4,5の高さは特に限定されるもの
ではないが、数ミクロン〜数十ミクロンとすることが好
ましい。またバンプ4,5は、図1に示すようなリベッ
ト状の他、半球状、マッシュルーム状(傘状)などの形
状に形成される。
The height of the bumps 4 and 5 is not particularly limited, but it is preferably several microns to several tens of microns. Moreover, the bumps 4 and 5 are formed in a hemispherical shape, a mushroom shape (umbrella shape), or the like in addition to the rivet shape shown in FIG.

【0017】図2は、導通路およびバンプの他の実施例
を示す部分断面図である。図2において、絶縁体フィル
ム2に穿設された微細貫通孔23には、銅などの安価な
金属物質を充填してなる導通路3aが形成され、第1お
よび第2バンプ4,5の表層4a,5aは、接続信頼性
の高い金などの金属物質が用いられている。該表層4
a,5aと該導通路3aとの間には、金属物質の相互反
応を防止するためのバリアー性金属物質としてニッケル
などからなる中間層4b,5bが形成されている。さら
に、上記3種類の導電性物質を用いた構造に限定するも
のではなく、4種類以上の導電性物質を用いて形成して
もよい。
FIG. 2 is a partial sectional view showing another embodiment of the conductive path and the bump. In FIG. 2, a conductive path 3a filled with an inexpensive metal substance such as copper is formed in the fine through hole 23 formed in the insulator film 2, and the surface layer of the first and second bumps 4 and 5 is formed. 4a and 5a are made of a metal material such as gold having high connection reliability. The surface layer 4
Intermediate layers 4b and 5b made of nickel or the like as a barrier metal substance for preventing mutual reaction of metal substances are formed between a and 5a and the conduction path 3a. Furthermore, the structure is not limited to the above-described three kinds of conductive materials, and four or more kinds of conductive materials may be used.

【0018】図3は、本発明のLCDパネル点灯検査用
異方導電体(以下「異方導電体」と略すこともある。)
の製造工程を示す断面図であり、例えば以下のようにし
て製造することができる。
FIG. 3 shows an anisotropic conductor for LCD panel lighting inspection according to the present invention (hereinafter sometimes abbreviated as "anisotropic conductor").
FIG. 4 is a cross-sectional view showing the manufacturing process of, and can be manufactured as follows, for example.

【0019】まず、図3(a)に示されるように、絶縁
体フィルム2と導電性物質層6とが積層されて形成され
た積層基材7を用意する。絶縁体フィルム2の表面への
導電性物質層7の形成方法としては、メッキ法、スパッ
タリング法、CVD法などが挙げられる。また、導電性
物質層6として導電体箔を用い、該導電体箔上に絶縁体
フィルム2をラミネートする方法、あるいは導電体箔上
に絶縁体を塗布して固化させ、導電性物質層6の表面に
絶縁体フィルム2を形成する方法が挙げられる。積層基
材7は、絶縁体フィルム2と導電性物質層6とが直接積
層された2層状基材だけに限らず、例えば絶縁体フィル
ム2と導電性物質層6との間に接着剤層を介した3層状
基材であってもよい。
First, as shown in FIG. 3A, a laminated base material 7 formed by laminating the insulating film 2 and the conductive material layer 6 is prepared. Examples of the method for forming the conductive material layer 7 on the surface of the insulator film 2 include a plating method, a sputtering method, a CVD method and the like. In addition, a conductive foil is used as the conductive material layer 6, and the insulating film 2 is laminated on the conductive foil, or an insulating material is applied and solidified on the conductive foil to form the conductive material layer 6. A method of forming the insulator film 2 on the surface may be mentioned. The laminated base material 7 is not limited to a two-layered base material in which the insulating film 2 and the conductive material layer 6 are directly laminated, and for example, an adhesive layer is provided between the insulating film 2 and the conductive material layer 6. It may be a three-layered base material that is interposed.

【0020】次いで、図3(b)に示されるように、絶
縁体フィルム2の所定の領域に、厚さ方向に複数の微細
貫通孔23(図3においては6孔)を穿孔する。該微細
貫通孔23の穿孔は、パンチングなどの機械的穿孔方
法、プラズマ加工、レーザー加工、フォトリソグラフィ
ー加工、または絶縁体フィルム2と耐薬品性の異なるレ
ジストなどを用いた化学エッチング、ファインピッチ化
に対応するためには微細加工が可能なレーザー加工など
の方法により行うことができ、なかでもパルス数または
エネルギー量を制御したエキシマレーザーの照射による
開口加工が好ましい。なお、該微細貫通孔23は、絶縁
体フィルム2のみを貫通させるようにし、その底部にお
いて下層の導電性物質層6が露出するようにする。微細
貫通孔23の大きさは、5〜200μm、好ましくは8
〜10μm程度とする。
Next, as shown in FIG. 3B, a plurality of fine through holes 23 (six holes in FIG. 3) are formed in a predetermined area of the insulator film 2 in the thickness direction. The fine through holes 23 are formed by mechanical punching such as punching, plasma processing, laser processing, photolithography processing, or chemical etching using a resist having different chemical resistance from the insulating film 2 and fine pitching. In order to deal with this, a method such as laser processing capable of fine processing can be performed, and among them, opening processing by irradiation of an excimer laser whose pulse number or energy amount is controlled is preferable. The fine through holes 23 are formed so as to penetrate only the insulating film 2, and the lower conductive material layer 6 is exposed at the bottom thereof. The size of the fine through holes 23 is 5 to 200 μm, preferably 8
It is about 10 μm.

【0021】さらに、該導電性物質層6の露出部分をエ
ッチングして、図3(c)に示されるようなリベット状
の凹部61を形成する。
Further, the exposed portion of the conductive material layer 6 is etched to form a rivet-shaped recess 61 as shown in FIG. 3 (c).

【0022】次に、図3(d)に示されるように、導電
性物質層6の外表面62にレジスト層8を形成して絶縁
した後、図3(e)に示されるように、該微細貫通孔2
3および該凹部61内に導電性物質を充填して導通路
3、第1バンプ4および第2バンプ5を形成する。
Next, as shown in FIG. 3D, a resist layer 8 is formed on the outer surface 62 of the conductive material layer 6 to insulate it, and then, as shown in FIG. Fine through hole 2
3 and the recess 61 are filled with a conductive material to form the conductive path 3, the first bump 4 and the second bump 5.

【0023】導通路3、第1バンプ4および第2バンプ
5の形成は、物理的に導電性物質を微細貫通孔23内に
埋め込む方法、CVD法、電解メッキや無電解メッキな
どのメッキ法、上記工程により得られた構造物を導電性
物質の溶融浴に浸漬し引き上げて導電性物質を析出させ
る化学的方法などにより行うことができる。したがっ
て、本発明において導電性物質の充填とは、物理的に導
電性物質を埋め込むことだけでなく、上記化学的析出な
どによるものも含む広い概念のことである。
The conductive paths 3, the first bumps 4, and the second bumps 5 are formed by physically embedding a conductive material in the fine through holes 23, a CVD method, a plating method such as electrolytic plating or electroless plating, It can be performed by a chemical method in which the structure obtained by the above steps is immersed in a molten bath of a conductive substance and pulled up to deposit the conductive substance. Therefore, in the present invention, the filling of the conductive substance is a broad concept including not only the physical filling of the conductive substance but also the above-mentioned chemical deposition.

【0024】次いで、図3(f)に示されるように、導
電性物質層6およびレジスト層6を化学的エッチング液
または電解腐食により除去して、異方導電体1を得る。
なお、第1バンプ3の形成は、(f)の工程後に行って
も良い。
Then, as shown in FIG. 3 (f), the conductive substance layer 6 and the resist layer 6 are removed by a chemical etching solution or electrolytic corrosion to obtain the anisotropic conductor 1.
The formation of the first bump 3 may be performed after the step (f).

【0025】以下、本発明の異方導電体のより具体的な
製造例を示す。
A more specific production example of the anisotropic conductor of the present invention will be shown below.

【0026】厚さ35μmの銅箔上にポリアミド酸を塗
工し、乾燥、硬化させ、厚さ13μmのポリイミド層を
形成して、銅箔とポリイミドフィルムの2層基材を作製
した。
Polyamic acid was applied onto a copper foil having a thickness of 35 μm, dried and cured to form a polyimide layer having a thickness of 13 μm, to prepare a two-layer base material of a copper foil and a polyimide film.

【0027】次に、ポリイミドフィルム表面に発振波長
248nmのKrFエキシマレーザー光をマスクを通して
照射してドライエッチングを施し、ポリイミドフィルム
に25μmφ,ピッチ50μmの微細貫通孔を100cm
2 の領域に設けた。
Next, the surface of the polyimide film is irradiated with KrF excimer laser light having an oscillation wavelength of 248 nm through a mask to perform dry etching, and the polyimide film has fine through holes of 25 μmφ and a pitch of 50 μm of 100 cm.
Provided in the area of 2 .

【0028】次に、該微細貫通孔の底部において露出す
る銅箔表面をエッチングして、図3(c)に示されるよ
うなリベット状の凹部を形成した。
Next, the surface of the copper foil exposed at the bottom of the fine through hole was etched to form a rivet-shaped recess as shown in FIG. 3 (c).

【0029】次いで、銅箔表面にレジストを塗工し硬化
させて絶縁し、化学研磨液中に50℃で2分間浸漬し
た。これらを水洗した後、銅箔部を電極に接続して60
℃のシアン化金メッキ浴に浸漬し、銅箔をマイナス極と
して該2層基材の微細貫通孔およびリベット状凹部内に
金メッキを成長させ、このメッキがポリイミドフィルム
表面から金結晶がやや突出したとき(突出高さ約15μ
m)、メッキ処理を中断した。
Next, a resist was applied to the surface of the copper foil and cured to insulate it, and then immersed in a chemical polishing liquid at 50 ° C. for 2 minutes. After washing these with water, connect the copper foil part to the electrode and
When a gold crystal is slightly projected from the polyimide film surface by immersing it in a gold cyanide plating bath at ℃, and using the copper foil as a negative electrode to grow gold plating in the fine through holes and rivet-shaped recesses of the two-layer substrate. (Projection height approx. 15μ
m), the plating process was interrupted.

【0030】次に、塗工した該レジスト層を剥離し、該
2層基材の銅箔を塩化第二銅で溶解除去し、異方導電性
フィルムを得た。
Next, the coated resist layer was peeled off, and the copper foil of the two-layer substrate was dissolved and removed with cupric chloride to obtain an anisotropic conductive film.

【0031】図4は、本発明のLCDパネル点灯検査方
法を示す断面図である。図4において、LCDパネル点
灯検査装置10は、図示しないテスターTに接続される
配線回路11と、配線回路11を挟んで積層される一対
のガラスエポキシ基板12,13と、配線回路11に導
通し、ガラスエポキシ基板12を厚さ方向に貫通して突
起する異方導電性ゴム14とを含んで構成されている。
FIG. 4 is a sectional view showing the LCD panel lighting inspection method of the present invention. In FIG. 4, the LCD panel lighting inspection device 10 is electrically connected to a wiring circuit 11 connected to a tester T (not shown), a pair of glass epoxy substrates 12 and 13 laminated with the wiring circuit 11 interposed therebetween, and the wiring circuit 11. , And an anisotropic conductive rubber 14 penetrating the glass epoxy substrate 12 in the thickness direction and protruding.

【0032】LCDパネル15の点灯検査を行うに際し
て、LCDパネル点灯検査装置10とLCDパネル15
との間に本発明の異方導電体1を介在させ、異方導電性
ゴム14が露出しないように、異方導電体1をLCDパ
ネル点灯検査装置10上に載置し、LCDパネル点灯検
査装置10とLCDパネル15との位置合わせを行う。
LCDパネル15を矢符A方向に変移させると、異方導
電性ゴム14は、ガラスエポキシ基板12の表面よりも
外方向に突出しているので、異方導電体1は、異方導電
性ゴム14とLCDパネル15の表面に形成された導電
体層16とによって、挟持される。このとき、異方導電
体1の第1バンプ4は導電体層16に当接し、第2バン
プ5は異方導電性ゴム14に当接する。
When performing the lighting inspection of the LCD panel 15, the LCD panel lighting inspection device 10 and the LCD panel 15
The anisotropic conductive material 1 of the present invention is interposed between the anisotropic conductive material 1 and the anisotropic conductive rubber 14, so that the anisotropic conductive material 1 is placed on the LCD panel lighting inspection device 10 and the LCD panel lighting inspection is performed. The device 10 and the LCD panel 15 are aligned with each other.
When the LCD panel 15 is displaced in the direction of the arrow A, the anisotropic conductive rubber 14 projects outward from the surface of the glass epoxy substrate 12, so that the anisotropic conductive material 1 is made into the anisotropic conductive rubber 14. And the conductor layer 16 formed on the surface of the LCD panel 15 to be sandwiched. At this time, the first bumps 4 of the anisotropic conductor 1 contact the conductor layer 16, and the second bumps 5 contact the anisotropic conductive rubber 14.

【0033】第1バンプ4と第2バンプ5とは、導通路
3を介して導通しているので、LCDパネル15を点灯
検査するための特定周波数の信号が、テスターTから配
線回路11、異方導電性ゴム14および異方導電体1を
介して、導電体層16に入力され、LCDパネル15の
点灯検査が行われる。
Since the first bump 4 and the second bump 5 are conducted through the conduction path 3, a signal of a specific frequency for inspecting the lighting of the LCD panel 15 is transmitted from the tester T to the wiring circuit 11 to the wiring circuit 11. It is input to the conductor layer 16 through the anisotropic conductive rubber 14 and the anisotropic conductor 1, and the lighting inspection of the LCD panel 15 is performed.

【0034】[0034]

【発明の効果】本発明のLCDパネル点灯検査用異方導
電体によれば、LCDパネル点灯検査装置の検査子は該
異方導電体を介して間接的にLCDパネルの導電体に当
接するので、該検査子に含まれているシリコンなどの異
物が、該導電体に付着せず、LCDパネルの不良発生を
防止することができる。
According to the anisotropic conductor for LCD panel lighting inspection of the present invention, the inspector of the LCD panel lighting inspection device indirectly contacts the conductor of the LCD panel through the anisotropic conductor. A foreign substance such as silicon contained in the inspection element does not adhere to the conductor, so that it is possible to prevent a defect from occurring in the LCD panel.

【0035】また、本発明のLCDパネル点灯検査方法
によれば、上記のLCDパネル点灯検査用異方導電体を
用いているので、上記の理由からLCDパネルの不良発
生が防止される。
Further, according to the LCD panel lighting inspection method of the present invention, since the above LCD panel lighting inspection anisotropic conductor is used, the occurrence of a defect in the LCD panel is prevented for the above reasons.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明のLCDパネル点灯検査用異方導電体の
一実施例を示す断面図である。
FIG. 1 is a sectional view showing an embodiment of an anisotropic conductor for LCD panel lighting inspection of the present invention.

【図2】導通路およびバンプの他の実施例を示す部分断
面図である。
FIG. 2 is a partial cross-sectional view showing another example of the conductive path and the bump.

【図3】本発明のLCDパネル点灯検査用異方導電体の
製造工程を示す断面図である。
FIG. 3 is a cross-sectional view showing a manufacturing process of an anisotropic conductor for LCD panel lighting inspection of the present invention.

【図4】本発明のLCDパネル点灯検査方法を示す断面
図である。
FIG. 4 is a sectional view showing an LCD panel lighting inspection method of the present invention.

【符号の説明】[Explanation of symbols]

1 LCDパネル点灯検査用異方導電体 2 絶縁体フィルム 3 導通路 4 第1バンプ 5 第2バンプ 10 LCDパネル点灯検査装置 14 異方導電性ゴム14 15 LCDパネル 16 導電体層 1 Anisotropic Conductor for LCD Panel Lighting Inspection 2 Insulator Film 3 Conducting Path 4 First Bump 5 Second Bump 10 LCD Panel Lighting Inspection Device 14 Anisotropic Conductive Rubber 14 15 LCD Panel 16 Conductor Layer

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 液晶表示パネルの導電体に当接する第1
接触部と、該液晶表示パネルの点灯を検査する装置の検
査子に当接する第2接触部とが、絶縁体層の両面に相互
に導通してそれぞれ形成されていることを特徴とする液
晶表示パネル点灯検査用異方導電体。
1. A first unit for contacting a conductor of a liquid crystal display panel
A liquid crystal display characterized in that a contact portion and a second contact portion that comes into contact with an inspector of an apparatus for inspecting lighting of the liquid crystal display panel are formed on both surfaces of an insulating layer so as to be electrically connected to each other. Anisotropic conductor for panel lighting inspection.
【請求項2】 液晶表示パネルの導電体と、液晶表示パ
ネルの点灯を検査する装置の検査子との間に請求項1記
載の液晶表示パネル点灯検査用異方導電体を介在させ
て、該異方導電体の第1接触部を該導電体に当接させ、
該異方導電体の第2接触部を該検査子に当接させること
を特徴とする液晶表示パネル点灯検査方法。
2. The anisotropic conductor for liquid crystal display panel lighting inspection according to claim 1, which is interposed between the conductor of the liquid crystal display panel and an inspector of an apparatus for inspecting lighting of the liquid crystal display panel. The first contact portion of the anisotropic conductor is brought into contact with the conductor,
A method for inspecting lighting of a liquid crystal display panel, wherein a second contact portion of the anisotropic conductor is brought into contact with the probe.
JP14452693A 1993-06-16 1993-06-16 Anisotropic conductor and method for inspecting lighting of liquid crystal display panel Pending JPH075199A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14452693A JPH075199A (en) 1993-06-16 1993-06-16 Anisotropic conductor and method for inspecting lighting of liquid crystal display panel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14452693A JPH075199A (en) 1993-06-16 1993-06-16 Anisotropic conductor and method for inspecting lighting of liquid crystal display panel

Publications (1)

Publication Number Publication Date
JPH075199A true JPH075199A (en) 1995-01-10

Family

ID=15364382

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14452693A Pending JPH075199A (en) 1993-06-16 1993-06-16 Anisotropic conductor and method for inspecting lighting of liquid crystal display panel

Country Status (1)

Country Link
JP (1) JPH075199A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6275056B1 (en) 1997-02-25 2001-08-14 International Business Machines Corporation Prober device having a specific linear expansion coefficient and probe pitch and method of probing thereof
US7961902B2 (en) 2005-05-25 2011-06-14 Pioneer Corporation Speaker apparatus and manufacturing method thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6275056B1 (en) 1997-02-25 2001-08-14 International Business Machines Corporation Prober device having a specific linear expansion coefficient and probe pitch and method of probing thereof
US7961902B2 (en) 2005-05-25 2011-06-14 Pioneer Corporation Speaker apparatus and manufacturing method thereof

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